CN115993569B - Rapid calibration method and system for LCR tester - Google Patents
Rapid calibration method and system for LCR tester Download PDFInfo
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Abstract
The invention discloses a quick calibration method and a quick calibration system for an LCR tester, wherein the method comprises the following steps: obtaining standard impedance and standard phase value of a standard resistor through a standard LCR tester; writing the standard impedance and the standard phase value of the standard resistor into an EEPROM of the standard resistor; the LCR tester to be calibrated obtains the original impedance and the original phase value of the standard resistor through testing; the terminal obtains standard impedance and standard phase value stored in EEPROM in the standard resistor through the test bottom plate; the terminal carries out polynomial fitting on the standard impedance and the original impedance as well as the standard phase value and the original phase value to obtain a fitting coefficient; the terminal performs impedance and phase calibration according to the fitting coefficient to obtain a calibration coefficient; and writing the calibration coefficient into the LCR tester to be calibrated. According to the invention, the coefficient in the whole frequency range is fitted by measuring the data of partial frequency, so that the calibration efficiency is greatly improved.
Description
Technical Field
The invention belongs to the technical field of electricity, and particularly relates to a rapid calibration method and system for an LCR tester.
Background
LCR is a measuring instrument capable of measuring inductance, capacitance and resistance impedance, and is widely used in various fields such as scientific research, production, metering test and the like.
At present, LCR has quite rapid development and has larger and larger requirements, and the method for calibrating the LCR is particularly important to ensure the measurement accuracy of the LCR.
Existing LCR calibration techniques require the use of commercially available standard capacitors, standard resistors. The standard allowable error of domestic production is big, the frequency characteristic is poor, and the temperature coefficient is big.
The standards produced abroad have small allowable errors, but have narrower working frequency ranges, and the standards have high cost and are inconvenient to realize automatic test.
Disclosure of Invention
Accordingly, the present invention is directed to a method and system for rapid calibration of LCR testers.
In order to achieve the above purpose, the technical scheme of the invention is realized as follows:
the embodiment of the invention provides a rapid calibration method for an LCR tester, which comprises the following steps:
obtaining standard impedance and standard phase value of a standard resistor through a standard LCR tester;
writing the standard impedance and the standard phase value of the standard resistor into an EEPROM of the standard resistor;
the LCR tester to be calibrated obtains the original impedance and the original phase value of the standard resistor through testing;
the terminal obtains standard impedance and standard phase value stored in EEPROM in the standard resistor through the test bottom plate;
the terminal carries out polynomial fitting on the standard impedance and the original impedance as well as the standard phase value and the original phase value to obtain a fitting coefficient;
the terminal performs impedance and phase calibration according to the fitting coefficient to obtain a calibration coefficient;
and writing the calibration coefficient into the LCR tester to be calibrated.
In the above scheme, the standard impedance and the standard phase value of the standard resistor are obtained by the standard LCR tester, specifically: the standard LCR tester acquires standard impedance and standard phase values of a standard resistor at an excitation level of 1 Vrms.
In the above scheme, the to-be-calibrated LCR tester obtains the original impedance and the original phase value of the standard resistor through testing, specifically: and the LCR tester to be calibrated acquires the original impedance and the original phase value of the corresponding standard resistor through testing for a plurality of times, and then determines the average value of the original impedance and the original phase value of the corresponding standard resistor as the original impedance and the original phase value according to the plurality of tests.
In the above scheme, the terminal performs polynomial fitting on the standard impedance and the original impedance, and the standard phase value and the original phase value to obtain a fitting coefficient, specifically: and performing least square fitting on the standard impedance and the original impedance, and the standard phase value and the original phase value under the same excitation frequency according to y=kx+b to obtain a first coefficient k (k 1, k2, k3, … …, kn) and a second coefficient b (b 1, b2, b3, … …, bn), wherein x is the calibrated impedance or impedance, a corresponding fitting curve is determined according to the first coefficient and the second coefficient respectively, and the first coefficient and the second coefficient corresponding to any excitation frequency are determined according to the fitting curve, so that the fitting coefficient is obtained.
In the above scheme, the determining the corresponding fitting curves according to the first coefficient and the second coefficient respectively specifically includes: respectively performing curve fitting on the first coefficient and the second coefficient set to obtain a fitting curve of the first coefficient k Pk ＝c 1 +c 2 f+c 3 f^2+…+c n fitting curve P of fq and second coefficient b b ＝d 1 +d 2 f+d 3 f^2+…+d n f-q, wherein f is the excitation frequency, c is a third coefficient fitted based on a polynomial at the excitation frequency, d is a fourth coefficient fitted based on a polynomial at the excitation frequency, and q+1 is the order of the polynomial.
In the above scheme, the method further comprises evaluating the order of the polynomial according to a Sum of Squares Error (SSE) to obtain an optimal order.
In the above solution, the step of evaluating the order of the polynomial according to the Sum of Squares Error (SSE) to obtain the optimal order is specifically: using Sum of Squares Error (SSE), i.e.Wherein (1)>For the fitted data, yi is the standard value and passes the standardAnd (3) LCR test acquisition, wherein the order of the polynomial is adjusted so that the SSE is the optimal order if the SSE is the minimum.
In the above scheme, the terminal performs impedance and phase calibration according to the fitting coefficient to obtain a calibration coefficient, specifically: fitting a curve according to the first coefficient k Pk ＝c 1 +c 2 f+c 3 f^2+…+c n fitting curve P of fq and second coefficient b b ＝d 1 +d 2 f+d 3 f^2+…+d n f≡q confirm the first coefficient k and second coefficient b corresponding under the arbitrary excitation frequency, and then according to y=kx+b, fit the first coefficient k, second coefficient b and stated primitive impedance or primitive phase value to be calibrated LCR test, get the calibration coefficient.
The embodiment of the invention also provides a rapid calibration system for the LCR tester, and the rapid calibration method for the LCR tester is applied and comprises a terminal, a standard resistor, a test bottom plate, the LCR tester to be calibrated and the standard LCR tester;
the terminal is used for acquiring standard impedance and standard phase value stored in EEPROM in the standard resistor through the testing bottom plate, performing polynomial fitting to acquire fitting coefficients, performing impedance and phase calibration according to the fitting coefficients to acquire calibration coefficients, and transmitting the calibration coefficients to the LCR tester to be calibrated;
the standard resistor is used for providing original impedance and original phase value for the LCR test to be calibrated and providing standard impedance and standard phase value for the standard LCR tester;
the test base plate is used for providing power supply and a communication interface for the standard resistor;
the LCR tester to be calibrated is used for acquiring and writing an original impedance and an original phase value through a test standard resistor;
the standard LCR tester is used for acquiring and writing standard impedance and standard phase value by testing the standard resistor.
Compared with the prior art, the method fits the coefficient in the whole frequency range by measuring the data of partial frequency, and greatly improves the calibration efficiency.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the invention. In the drawings:
FIG. 1 is a flow chart of a method for rapid calibration of an LCR tester according to an embodiment of the present invention;
FIG. 2 is a block diagram of a rapid calibration system for an LCR tester according to an embodiment of the invention.
Detailed Description
The present invention will be described in further detail with reference to the drawings and examples, in order to make the objects, technical solutions and advantages of the present invention more apparent. It should be understood that the specific embodiments described herein are for purposes of illustration only and are not intended to limit the scope of the invention.
The same or similar reference numerals in the drawings of the present embodiment correspond to the same or similar components; in the description of the present invention, it should be understood that the directions or positional relationships indicated by the terms "upper", "lower", "left", "right", "inner", "outer", etc. are based on the directions or positional relationships shown in the drawings, are merely for convenience of describing the present invention and simplifying the description, and are not indicative or implying that the devices or elements being referred to must have specific directions, be constructed and operated in specific directions, so that the terms describing the positional relationships in the drawings are merely for exemplary illustration, are not to be construed as limitations of the present patent, and the specific meanings of the terms described above may be understood by those of ordinary skill in the art according to specific circumstances.
It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, article, or apparatus. Without further limitation, an element defined by the phrase "comprising one … …" does not exclude the presence of other like elements in a process, article or apparatus that comprises the element.
The embodiment of the invention provides a rapid calibration method for an LCR tester, as shown in fig. 1, which is realized by the following steps:
step 101: obtaining standard impedance and standard phase value of a standard resistor through a standard LCR tester;
specifically, the standard LCR tester acquires a standard impedance and a standard phase value of a standard resistor at an excitation level of 1 Vrms.
Step 102: writing the standard impedance and the standard phase value of the standard resistor into an EEPROM of the standard resistor;
step 103: the LCR tester to be calibrated obtains the original impedance and the original phase value of the standard resistor through testing;
specifically, the LCR tester to be calibrated acquires the original impedance and the original phase value of the corresponding standard resistor through testing for a plurality of times, and then determines the average value of the original impedance and the original phase value of the corresponding standard resistor as the original impedance and the original phase value according to the plurality of tests.
Step 104: the terminal obtains standard impedance and standard phase value stored in EEPROM in the standard resistor through the test bottom plate;
step 105: the terminal carries out polynomial fitting on the standard impedance and the original impedance as well as the standard phase value and the original phase value to obtain a fitting coefficient;
and performing least square fitting on the standard impedance and the original impedance, and the standard phase value and the original phase value under the same excitation frequency according to y=kx+b to obtain a first coefficient k (k 1, k2, k3, … …, kn) and a second coefficient b (b 1, b2, b3, … …, bn), wherein x is the calibrated impedance or impedance, a corresponding fitting curve is determined according to the first coefficient and the second coefficient respectively, and the first coefficient and the second coefficient corresponding to any excitation frequency are determined according to the fitting curve, so that the fitting coefficient is obtained.
Said first and second coefficients are respectively based onThe corresponding fitting curve is determined, specifically: respectively performing curve fitting on the first coefficient and the second coefficient set to obtain a fitting curve of the first coefficient k Pk ＝c 1 +c 2 f+c 3 f^2+…+c n fitting curve P of fq and second coefficient b b ＝d 1 +d 2 f+d 3 f^2+…+d n f-q, wherein f is the excitation frequency, c is a third coefficient fitted based on a polynomial at the excitation frequency, d is a fourth coefficient fitted based on a polynomial at the excitation frequency, and q+1 is the order of the polynomial.
Using Sum of Squares Error (SSE), i.e.Wherein (1)>For the fitted data, y i is the standard value and is obtained by standard LCR test, and the order of the polynomial is adjusted so that the SSE is the least and then the optimal order.
In some embodiments, the excitation frequency is selected to be 20, 25, 30, 35, 40, 45, 60, 100, 400, 800, 1000, 10000, 100000, 200000, 300000, 400000, 500000, 600000, 700000, 800000, 900000, 1000000, 1100000, 1200000, 1300000, 1400000, 1500000, 1600000, 1700000, 1800000, 1900000, or 2000000Hz.
Step 106: the terminal performs impedance and phase calibration according to the fitting coefficient to obtain a calibration coefficient;
specifically, a fitted curve according to the first coefficient k Pk ＝c 1 +c 2 f+c 3 f^2+…+c n fitting curve P of fq and second coefficient b b ＝d 1 +d 2 f+d 3 f^2+…+d n f≡q confirm the first coefficient k and second coefficient b corresponding under the arbitrary excitation frequency, and then according to y=kx+b, fit the first coefficient k, second coefficient b and stated primitive impedance or primitive phase value to be calibrated LCR test, get the calibration coefficient.
Step 107: and writing the calibration coefficient into the LCR tester to be calibrated.
According to the invention, the coefficient in the whole frequency range is fitted by measuring the data of partial frequency, so that the calibration efficiency is greatly improved; the method has the advantages of high calibration precision, high efficiency, good stability and high accuracy, and can be expanded to other nonlinear calibration fields.
In addition, the invention calculates the inductance value, the capacitance value and the like through a fixed conversion formula by calibrating only the impedance and the phase, and compared with the calibration method for calibrating other inductance, capacitance and resistance respectively, the efficiency is greatly improved.
The invention is suitable for calibrating various LCRs with impedance measurement ranges of 100mΩ -10 mΩ and test frequency ranges of 20 Hz-2 MHz.
The embodiment of the invention also provides a rapid calibration system for the LCR tester, and the rapid calibration method for the LCR tester is applied, as shown in figure 2, and comprises a terminal, a standard resistor, a test bottom plate, the LCR tester to be calibrated and the standard LCR tester;
the terminal is used for acquiring standard impedance and standard phase value stored in EEPROM in the standard resistor through the testing bottom plate, performing polynomial fitting to acquire fitting coefficients, performing impedance and phase calibration according to the fitting coefficients to acquire calibration coefficients, and transmitting the calibration coefficients to the LCR tester to be calibrated;
the standard resistor is used for providing original impedance and original phase value for the LCR test to be calibrated and providing standard impedance and standard phase value for the standard LCR tester;
the test base plate is used for providing power supply and a communication interface for the standard resistor;
the LCR tester to be calibrated is used for acquiring and writing an original impedance and an original phase value through a test standard resistor;
the standard LCR tester is used for acquiring and writing standard impedance and standard phase value by testing the standard resistor.
The standard resistor is composed of a metal foil resistor, a BNC socket, a PCB, an I2C communication socket, an EEPROM and a sealing cavity.
The metal foil resistor has high precision, high stability and high reliability, the precision can reach 0.01%, the temperature drift coefficient can reach 0.2 ppm/DEG C, the annual stability can reach 5 ppm/year, and the parasitic inductance and parasitic capacitance are very small, the typical value is less than 0.08uH and less than 0.5pF, and the metal foil resistor is particularly suitable for being used as a standard resistor. The nominal resistances of 0.1ohm,1ohm,10ohm,100ohm,800ohm,1Kohm,3Kohm,10Kohm,30Kohm,100Kohm,300Kohm,1Mohm,3Mohm,10Mohm are selected for the scheme, and 14 standard resistors are made to meet the requirements of most LCR calibration.
Because the test interface of general LCR is female seat of BNC, so BNC seat has selected the public seat of BNC that can weld on the PCB board to make they can perfect match, can make LCR calibrate in output terminal plane directly moreover, receive parasitic parameter's influence less with other wiring cable calibration modes.
The PCB is made to be 3.0mm thick, and grooves are cut around the metal foil resistor pads so as to reduce the influence of the deformation of the PCB on the resistance value.
For facilitating automatic testing, an EEPROM is also added for storing impedance values and phase values of the home-made standard resistor measured by a standard instrument at different frequencies.
In order to reduce the influence of air humidity and temperature fluctuation on the metal foil resistance, a PCB of a self-made standard resistor is covered by a sealing cavity made of alloy, and a sealing glue is coated on a gap, so that the metal foil resistance is positioned in a closed space.
In addition, a seat is reserved outside the sealing cavity so that the sealing cavity can be fixed on the conveyor belt, and therefore efficient calibration is achieved.
The foregoing description is only of the preferred embodiments of the present invention, and is not intended to limit the scope of the present invention.
Claims (6)
1. A rapid calibration method for an LCR tester, the method comprising:
obtaining standard impedance and standard phase value of a standard resistor through a standard LCR tester;
writing the standard impedance and the standard phase value of the standard resistor into an EEPROM of the standard resistor;
the LCR tester to be calibrated obtains the original impedance and the original phase value of the standard resistor through testing;
the terminal obtains standard impedance and standard phase value stored in EEPROM in the standard resistor through the test bottom plate;
the terminal performs polynomial fitting on the standard impedance and the original impedance, and the standard phase value and the original phase value to obtain a fitting coefficient, specifically: performing least square fitting on the standard impedance and the original impedance, and the standard phase value and the original phase value respectively under the same excitation frequency according to y=kx+b to obtain a first coefficient k (k 1, k2, k3, … …, kn) and a second coefficient b (b 1, b2, b3, … …, bn), wherein x is the original impedance or the original phase value to be calibrated, a corresponding fitting curve is determined according to the first coefficient and the second coefficient respectively, and the corresponding first coefficient and second coefficient under any excitation frequency are determined according to the fitting curve, namely the fitting coefficient;
the corresponding fitting curves are respectively determined according to the first coefficient and the second coefficient, and specifically: respectively performing curve fitting on the first coefficient and the second coefficient set to obtain a fitting curve P of the first coefficient k k ＝c 1 +c 2 f+c 3 f^2+…+c n fitting curve P of fq and second coefficient b b ＝d 1 +d 2 f+d 3 f^2+…+d n f-q, wherein f is the excitation frequency, c is a third coefficient fitted based on a polynomial at the excitation frequency, d is a fourth coefficient fitted based on the polynomial at the excitation frequency, and q is the order of the polynomial;
the terminal performs impedance and phase calibration according to the fitting coefficient to obtain a calibration coefficient;
and writing the calibration coefficient into the LCR tester to be calibrated.
2. The method for rapid calibration of an LCR tester according to claim 1, wherein the standard impedance and standard phase values of the standard resistor are obtained by the standard LCR tester, specifically: the standard LCR tester acquires standard impedance and standard phase values of a standard resistor at an excitation level of 1 Vrms.
3. The rapid calibration method for LCR testers according to claim 1 or 2, wherein the LCR tester to be calibrated obtains the original impedance and the original phase value of the standard resistor by testing, specifically: and the LCR tester to be calibrated acquires the original impedance and the original phase value of the corresponding standard resistor through testing for a plurality of times, and then determines the average value of the original impedance and the original phase value of the corresponding standard resistor as the original impedance and the original phase value according to the plurality of tests.
4. A method for rapid calibration of an LCR tester according to claim 3, further comprising evaluating the order of the polynomial based on the square error and the SSE to obtain an optimal order.
5. The method according to claim 4, wherein the step of estimating the order of the polynomial according to the square error and the SSE is performed to obtain an optimal order, specifically: evaluation using sum of squares error SSE, i.e.Wherein (1)>To fit the data, y i Is a standard value and is obtained through a standard LCR test, and the order of the polynomial is adjusted so that the SSE is the minimum order which is the optimal order.
6. A rapid calibration system for an LCR tester, applying the rapid calibration method for an LCR tester according to any one of claims 1-5, characterized in that the system comprises a terminal, a standard resistor, a test floor, an LCR tester to be calibrated, a standard LCR tester;
the terminal is used for acquiring standard impedance and standard phase value stored in EEPROM in the standard resistor through the testing bottom plate, performing polynomial fitting to acquire fitting coefficients, performing impedance and phase calibration according to the fitting coefficients to acquire calibration coefficients, and transmitting the calibration coefficients to the LCR tester to be calibrated; the method is specifically used for performing polynomial fitting on the standard impedance and the original impedance, and the standard phase value and the original phase value to obtain fitting coefficients, and specifically comprises the following steps: performing least square fitting on the standard impedance and the original impedance, and the standard phase value and the original phase value respectively under the same excitation frequency according to y=kx+b to obtain a first coefficient k (k 1, k2, k3, … …, kn) and a second coefficient b (b 1, b2, b3, … …, bn), wherein x is the original impedance or the original phase value to be calibrated, a corresponding fitting curve is determined according to the first coefficient and the second coefficient respectively, and the corresponding first coefficient and second coefficient under any excitation frequency are determined according to the fitting curve, namely the fitting coefficient; respectively performing curve fitting on the first coefficient and the second coefficient set to obtain a fitting curve P of the first coefficient k k ＝c 1 +c 2 f+c 3 f^2+…+c n fitting curve P of fq and second coefficient b b ＝d 1 +d 2 f+d 3 f^2+…+d n f-q, wherein f is the excitation frequency, c is a third coefficient fitted based on a polynomial at the excitation frequency, d is a fourth coefficient fitted based on the polynomial at the excitation frequency, and q is the order of the polynomial;
the standard resistor is used for providing original impedance and original phase value for the LCR test to be calibrated and providing standard impedance and standard phase value for the standard LCR tester;
the test base plate is used for providing power supply and a communication interface for the standard resistor;
the LCR tester to be calibrated is used for acquiring and writing an original impedance and an original phase value through a test standard resistor;
the standard LCR tester is used for acquiring and writing standard impedance and standard phase value by testing the standard resistor.
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