CN115993182A - Spectral imaging chip structure - Google Patents

Abstract

The invention provides a spectrum imaging chip structure which comprises a pixel photosensitive unit, a narrow-band filter film, a transition layer and a cut-off filter film, wherein the pixel photosensitive unit is used for realizing image acquisition and data reading, the narrow-band filter film is integrally deposited and grown on the pixel photosensitive unit, the narrow-band filter film is used for realizing the adjustability of the central wavelength of a required wave band, the transition layer is integrally deposited and grown on the narrow-band filter film, the cut-off filter film is integrally deposited and grown on the transition layer, the cut-off filter film is used for cutting off an interference wave band, and the transition layer is used for transiting two film systems of the narrow-band filter film and the cut-off filter film. By applying the technical scheme of the invention, the technical problems of low spectral transmittance and low quantum efficiency caused by a cut-off filter film attaching mode in the prior art are solved.

Description

Spectral imaging chip structure

Technical Field

The invention relates to the technical field of spectrum imaging, in particular to a spectrum imaging chip structure.

Background

The hyperspectral imaging system (Hyper Spectral Imaging, HSI for short) can obtain a three-dimensional spectrum image with a characteristic of 'map unification' formed by two-dimensional space image information and one-dimensional spectrum information, and can observe the space information of two-dimensional distribution and the spectrum information on each pixel point.

The image space information reflects external characteristics such as the size, shape, defects and the like of the target object, and the spectrum information can reflect physical and chemical components of the target object. Therefore, physical and chemical information such as material, components and the like can be identified by analyzing and processing the spectrum information, and related positions and ranges can be identified rapidly and intuitively by the space information of the image.

In a classical HSI system, because the system is based on a single discrete device, in order to ensure spatial resolution and spectral resolution, optical devices such as an objective lens, a diaphragm, a collimator, various lenses and the like must be introduced, and focusing and collimation problems among various devices must be considered, so that the complexity, the volume and the cost of the traditional HSI system are high, and the application range is greatly limited.

Furthermore, in order to complete the filtering out of the target characteristic spectrum segment, the target distinction is realized, and the narrow-band filter film is integrated on the spectrum imaging chip, so that the tunable filtering at the center of the required wave band can be realized (as shown in fig. 10, the center wavelength of the narrow-band filter film is tunable within a certain range). However, due to the limitation of the refractive index of the existing high-low materials, the spectral bandwidth range cannot cover the full spectrum (as shown in fig. 10, the cut-off bandwidth is less than 200 nm), and the interference of signals with other wave bands exists as shown in fig. 11, and other wave band influences are caused besides the required wave band. An external cut-off filter is required (as shown in fig. 12) to cut off the interference band. The existing external cut-off filter film is coated separately and then attached to the image sensor, so that the spectral transmittance is reduced, the quantum efficiency is reduced, and the imaging effect is affected.

Disclosure of Invention

The invention provides a spectrum imaging chip structure which can solve the technical problems of low spectrum transmittance and low quantum efficiency caused by a cut-off filter film attaching mode in the prior art.

The invention provides a spectrum imaging chip structure, which comprises: the pixel photosensitive unit is used for realizing image acquisition and data reading; the narrow-band filter film is integrally deposited and grown on the pixel photosensitive unit and is used for realizing the tunability of the central wavelength of a required wave band; the transition layer is integrally deposited and grown on the narrow-band filter film; the cut-off filter film is integrally deposited and grown on the transition layer, the cut-off filter film is used for cutting off an interference wave band, and the transition layer is used for transiting the narrow-band filter film and the two film systems of the cut-off filter film.

Further, the film system structure of the spectrum imaging chip structure is Sub|H (LH) ≡S ₁ 2nL(HL)^S ₁ H L n ₁ (W1)^S ₂ n ₂ (W2)^S ₃ n ₃ (W3)^S ₄ |Air，H(LH)^S ₁ 2nL(HL)^S ₁ H is a film system structure of a narrow-band filter film, L is a film system structure of a transition layer, W1, W2 and W3 all comprise a high-refractive-index material and a low-refractive-index material, and n ₁ (W1)^S ₂ n ₂ (W2)^S ₃ n ₃ (W3)^S ₄ Is a film structure of a cut-off filter film, H is a high refractive index material, L is a low refractive index material, S ₁ 、S ₂ 、S ₃ And S is ₄ For the number of overlapping times, n is the film thickness adjustment coefficient of the narrow-band filter film, n ₁ 、n ₂ And n ₃ The film thickness of the cut-off filter film is adjusted by a coefficient.

Further, in the film system structure of the cut filter film, W1, W2, and W3 each include (0.5LH0.5L) or (0.5HL0.5H).

Further, the cut-off filter film is prepared by alternately depositing a high refractive index material and a low refractive index material, and the high refractive index material of the cut-off filter film comprises Ta ₂ O ₅ 、Ti ₃ O ₅ 、TiO ₂ 、Si ₃ N ₄ Or Nb (Nb) ₂ O ₅ The low refractive index material of the cut-off filter film comprises SiO ₂ 、MgF ₂ And Al ₂ O ₃ At least one of them.

Further, the narrow-band filter film comprises a plurality of FP cavity structures, the plurality of FP cavity structures are formed at one time by adopting a semiconductor process, any one FP cavity structure comprises a first reflecting mirror, a light-transmitting layer and a second reflecting mirror which are sequentially overlapped from bottom to top, the plurality of FP cavity structures are distributed in a mosaic mode, the heights of the light-transmitting layers of the plurality of FP cavity structures along any one row of narrow-band filter film are different, and the heights of the light-transmitting layers of the plurality of FP cavity structures along any one row of narrow-band filter film are different; or the plurality of FP cavity structures are distributed in a line scanning mode, the heights of the light transmission layers of the plurality of FP cavity structures along any one row of narrow-band filter films are identical, and the heights of the light transmission layers of the plurality of FP cavity structures along any one row of narrow-band filter films are different.

Further, the spectral imaging chip structure is a line scan chip in a range from 400nm to 510nm, the film system structure of the spectral imaging chip structure is sub|H (LH) ≡5 nL (HL) ≡5H L1.28 (0.5LH0.5L) ≡10.6 (0.5LH0.5L) ≡10.99 (0.5LH0.5L) ≡air, wherein H (LH) ≡5 nL (HL) ≡5H is the film system structure of a narrow-band filter film, n=0.573-1.344, L is the film system structure of a transition layer, 1.28 (0.5LH0.5L) ≡10.6 (0.5LH0.5L) ≡10.99 (0.5LH0.5L) ≡10 is the film system structure of a cut-off filter film; or, the spectral imaging chip structure is a line scan chip in the range of 510nm to 630nm, the film system structure of the spectral imaging chip structure is sub|H (LH) ≡5 nL (HL) ≡5H L0.79 (0.5HL0.5H) ≡10.3 (0.5LH0.5L) ≡10.6 (0.5LH0.5L) ≡air, wherein H (LH) ≡5 nL (HL) ≡5H is the film system structure of a narrow-band filter film, n=0.64-1.336, L is the film system structure of a transition layer, and 0.79 (0.5HL0.5H) ≡10.3 (0.5LH0.5L) ≡10.6 (0.5LH0.5L) ≡10 is the film system structure of a cut-off filter film.

Further, the spectral imaging chip structure is a line scan chip in a range from 640nm to 810nm, the film system structure of the spectral imaging chip structure is sub|H (LH) ≡5 nL (HL) ≡5H 1.25 (0.5LH0.5L) ≡10.8 (0.5HL0.5H) ≡10.63 (0.5HL0.5H) ≡air, wherein H (LH) ≡5 nL (HL) ≡5H is the film system structure of a narrow-band filter film, n=0.588-1.238, L is the film system structure of a transition layer, and 1.25 (0.5LH0.5L) ≡10.8 (0.5HL0.5H) ≡10.63 (0.5HL0.5H) 10 is the film system structure of a cut-off filter film; or a linear scanning chip with a film structure in a range of 800nm to 1000nm, wherein the film structure of the spectral imaging chip structure is sub|H (LH)/(5 nL (HL)/(5H L0.81 (0.5HL0.5H)/(10.64 (0.5HL0.5H)/(10.505 (0.5HL0.5H)/(10|air), H (LH)/(5 nL (HL)/(5H) is a film structure of a narrow-band filter film, n=0.851-1.5356, L is a film structure of a transition layer, and 0.81 (0.5HL0.5H)/(10.64 (0.5HL0.5H)/(10.505 (0.5HL0.5H)) is a film structure of a cut-off filter film.

Further, the film thickness adjustment coefficient can be obtained according to the following steps: determining a to-be-cut-off spectrum section of a cut-off filter film; calculating and obtaining the central wavelength of the spectrum segment to be cut according to the first boundary threshold value and the second boundary threshold value of the spectrum segment to be cut; and determining a film thickness adjustment coefficient of the cut-off filter film according to the center wavelength of the to-be-cut-off spectrum and the center wavelength of the narrow-band filter film.

Further, the center wavelength of the spectrum to be cut-off can be determined according to

To obtain; alternatively, the center wavelength of the spectral band to be cut-off may be determined according to +.>

Is obtained by, wherein lambda ₀ Lambda is the center wavelength of the spectrum to be cut off ₁ For a first boundary threshold, lambda, of the spectral band to be cut-off ₂ Is a second boundary threshold for the portion of spectrum to be cut off.

Further, the film thickness adjustment coefficient n of the cut-off filter film can be determined according to

Wherein lambda is the center of the narrow band filterWavelength, n=n ₁ 、n ₂ Or n ₃ 。

By applying the technical scheme of the invention, the spectrum imaging chip structure is provided, the narrow-band filter film is integrally deposited and grown on the pixel photosensitive unit, the transition layer is integrally deposited and grown on the narrow-band filter film, the cut-off filter film is integrally deposited and grown on the transition layer, no gap exists among the cut-off filter film, the transition layer, the narrow-band filter film and the pixel photosensitive unit, the spectrum transmittance is high, the energy loss is reduced, the spectrum imaging chip structure is integrally formed by one-step preparation technology, the spectrum imaging chip structure is free from external environment pollution, has better firmness, and higher preparation efficiency and integration level. In addition, as the equivalent refractive indexes of the narrow-band filter film and the cut-off filter film are different, the peak transmittance can be influenced by direct superposition, and the peak transmittance of the spectrum imaging chip structure can be effectively improved by arranging the transition layer between the narrow-band filter film and the cut-off filter film. Compared with the external attaching cut-off filter film in the prior art, the spectrum imaging chip structure provided by the invention integrates the cut-off filter film and the narrow-band filter film in the spectrum imaging chip structure, and the cut-off filter film is integrally deposited and grown on the narrow-band filter film, so that the spectrum transmittance is high, and the quantum efficiency and the spectrum transmittance are greatly improved; and a transition layer is arranged between the narrow-band filter film and the cut-off filter film, so that the peak transmittance of the spectrum imaging chip structure is effectively improved.

Drawings

The accompanying drawings, which are included to provide a further understanding of embodiments of the invention and are incorporated in and constitute a part of this specification, illustrate embodiments of the invention and together with the description serve to explain the principles of the invention. It is evident that the drawings in the following description are only some embodiments of the present invention and that other drawings may be obtained from these drawings without inventive effort for a person of ordinary skill in the art.

Fig. 1 shows a schematic diagram of a partial structure of a spectral imaging chip structure (narrowband filter shows only one FP cavity structure) provided according to a specific embodiment of the present invention;

FIG. 2 shows a schematic filtering diagram of a narrow band filter of a line sweep chip in the 400 nm-510 nm range provided in accordance with a specific embodiment of the present invention;

FIG. 3 shows a schematic filtering diagram of a narrow band filter plus a cut-off filter of a line sweep chip in the 400nm to 510nm range provided in accordance with a specific embodiment of the present invention;

FIG. 4 shows a schematic filtering diagram of a narrow band filter of a line sweep chip in the range of 510nm to 630nm provided in accordance with a specific embodiment of the present invention;

FIG. 5 shows a schematic diagram of a narrow band filter plus a cut-off filter of a line sweep chip in the range of 510nm to 630nm according to an embodiment of the present invention;

FIG. 6 shows a schematic diagram of filtering a narrow band filter of a line sweep chip in the 640nm to 810nm range provided in accordance with a specific embodiment of the present invention;

FIG. 7 shows a schematic diagram of a narrow band filter plus a cut-off filter of a line sweep chip in the 640nm to 810nm range provided in accordance with an embodiment of the present invention;

FIG. 8 shows a schematic filtering diagram of a narrow band filter of a line sweep chip in the 800nm to 1000nm range provided in accordance with a specific embodiment of the present invention;

FIG. 9 shows a schematic diagram of a narrow band filter plus a cut-off filter of a line sweep chip in the 800nm to 1000nm range provided in accordance with a specific embodiment of the present invention;

FIG. 10 shows a schematic filtering diagram of a narrow band filter provided in accordance with a specific embodiment of the present invention;

FIG. 11 is a schematic diagram showing filtering of a narrow band filter film with other band signal interference according to an embodiment of the present invention;

fig. 12 shows a schematic filtering diagram of a cut-off filter provided in accordance with a specific embodiment of the present invention;

FIG. 13 shows a schematic filtering diagram of a narrow band filter plus cut-off filter provided in accordance with a specific embodiment of the present invention;

fig. 14 is a diagram showing a filtering effect of a spectral imaging chip structure without a cut-off filter film in the first comparative example provided according to the fifteenth embodiment of the present invention;

fig. 15 is a diagram showing a filtering effect of a spectral imaging chip structure in which a cut-off filter film determined by a film thickness adjustment coefficient determination method according to the present invention is added to a second comparative example provided according to a fifteenth embodiment of the present invention;

fig. 16 is a diagram showing a filtering effect of a spectral imaging chip structure of a cut-off filter film randomly determined by adding a film thickness adjustment coefficient in a third comparative example provided in accordance with a fifteenth embodiment of the present invention.

Wherein the above figures include the following reference numerals:

10. a pixel light sensing unit; 20. a narrow band filter film; 30. cut-off filter film.

Detailed Description

It should be noted that, in the case of no conflict, the embodiments and features in the embodiments may be combined with each other. The following description of the embodiments of the present invention will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present invention, but not all embodiments. The following description of at least one exemplary embodiment is merely exemplary in nature and is in no way intended to limit the invention, its application, or uses. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention.

It is noted that the terminology used herein is for the purpose of describing particular embodiments only and is not intended to be limiting of example embodiments in accordance with the present application. As used herein, the singular is also intended to include the plural unless the context clearly indicates otherwise, and furthermore, it is to be understood that the terms "comprises" and/or "comprising" when used in this specification are taken to specify the presence of stated features, steps, operations, devices, components, and/or combinations thereof.

The relative arrangement of the components and steps, numerical expressions and numerical values set forth in these embodiments do not limit the scope of the present invention unless it is specifically stated otherwise. Meanwhile, it should be understood that the sizes of the respective parts shown in the drawings are not drawn in actual scale for convenience of description. Techniques, methods, and apparatus known to one of ordinary skill in the relevant art may not be discussed in detail, but should be considered part of the specification where appropriate. In all examples shown and discussed herein, any specific values should be construed as merely illustrative, and not a limitation. Thus, other examples of the exemplary embodiments may have different values. It should be noted that: like reference numerals and letters denote like items in the following figures, and thus once an item is defined in one figure, no further discussion thereof is necessary in subsequent figures.

As a first embodiment of the present invention, as shown in fig. 1, there is provided a spectral imaging chip structure according to a specific embodiment of the present invention, the spectral imaging chip structure including a pixel light sensing unit 10, a narrow band filter film 20, a transition layer 40, and a cut-off filter film 30, the pixel light sensing unit 10 being used to implement image acquisition and data readout, the narrow band filter film 20 being integrally deposited and grown on the pixel light sensing unit 10, the narrow band filter film 20 being used to implement tunability at a center wavelength of a desired band, the transition layer 40 being integrally deposited and grown on the narrow band filter film 20, the cut-off filter film 30 being integrally deposited and grown on the transition layer 40, the cut-off filter film 30 being used to cut-off an interference band, the transition layer 40 being used to transition between the narrow band filter film 20 and the cut-off filter film 30.

In the first embodiment of the invention, the spectrum imaging chip structure is formed by integrally depositing and growing the narrow-band filter film on the pixel photosensitive unit, integrally depositing and growing the transition layer on the narrow-band filter film, integrally depositing and growing the cut-off filter film on the transition layer, and the cut-off filter film, the transition layer, the narrow-band filter film and the pixel photosensitive unit have no gap, so that the spectrum imaging chip structure has high spectral transmittance, reduces energy loss, is integrally formed by one-step preparation process, is not polluted by external environment, has better firmness, and has higher preparation efficiency and integration level. In addition, as the equivalent refractive indexes of the narrow-band filter film and the cut-off filter film are different, the peak transmittance can be influenced by direct superposition, and the peak transmittance of the spectrum imaging chip structure can be effectively improved by arranging the transition layer between the narrow-band filter film and the cut-off filter film. Compared with the external attaching cut-off filter film in the prior art, the spectrum imaging chip structure provided by the invention integrates the cut-off filter film and the narrow-band filter film in the spectrum imaging chip structure, and the cut-off filter film is integrally deposited and grown on the narrow-band filter film, so that the spectrum transmittance is high, and the quantum efficiency and the spectrum transmittance are greatly improved; and a transition layer is arranged between the narrow-band filter film and the cut-off filter film, so that the peak transmittance of the spectrum imaging chip structure is effectively improved.

As a second embodiment of the present invention, there is provided a spectral imaging chip structure further defined by a film system structure of the spectral imaging chip structure based on the first embodiment, in which the film system structure of the spectral imaging chip structure is configured as sub|h (LH) ≡s ₁ 2nL(HL)^S ₁ H L n ₁ (W1)^S ₂ n ₂ (W2)^S ₃ n ₃ (W3)^S ₄ |Air，H(LH)^S ₁ 2nL(HL)^S ₁ H is the film structure of the narrow band filter film 20, L is the film structure of the transition layer (40), W1, W2 and W3 each comprise a high refractive index material and a low refractive index material, n ₁ (W1)^S ₂ n ₂ (W2)^S ₃ n ₃ (W3)^S ₄ In order to form the film structure of the cut-off filter film 30, H is a high refractive index material, L is a low refractive index material, S ₁ 、S ₂ 、S ₃ And S is ₄ For the number of overlapping times, n is the film thickness adjustment coefficient of the narrow-band filter film, n ₁ 、n ₂ And n ₃ The coefficient is adjusted for the thickness of the cut-off filter film 30. In the second embodiment of the present invention, by configuring a specific model structure of the optical imaging chip structure, tunable filtering at the center of a desired band and prevention of stray light interference can be achieved. In the present invention, the film thickness adjustment coefficient n of the cut-off filter film ₁ 、n ₂ And n ₃ There are two methods of determination, the first is by software emulationIndeed, this approach may be achieved by software simulation of various filter curves, with the most preferred film thickness adjustment coefficients being determined by the differences in performance of tuned filter graphs obtained by different parameters. The second way is by determining the band to be cut off of the cut-off filter; calculating and obtaining the central wavelength of the spectrum segment to be cut according to the first boundary threshold value and the second boundary threshold value of the spectrum segment to be cut; the film thickness adjusting coefficient of the cut-off filter film is determined according to the center wavelength of the spectrum to be cut-off and the center wavelength of the narrow-band filter film, and the film thickness adjusting coefficient is obtained in a numerical calculation mode, so that the calculation mode is simple, and the effective cut-off of a specific wave band can be realized. In the actual application process, the selection can be performed according to actual needs.

As a third embodiment of the present invention, there is provided a spectral imaging chip structure that is identical to that of the second embodiment. In the spectral imaging chip structure, S ₁ ＝5-7，S ₂ ,S ₃ ,S ₄ ＝8-13，n ₁ ,n ₂ ,n ₃ =0.5-2.5. Wherein Sub is a substrate Si, air is Air, H represents a high refractive index material Ta ₂ O ₅ 、Ti ₃ O ₅ 、TiO ₂ 、Si ₃ N ₄ 、Nb ₂ O ₅ One of them; l represents a low refractive index material SiO ₂ 、MgF ₂ Al and ₂ O ₃ one or a mixture thereof.

As a fourth embodiment of the present invention, there is provided a spectral imaging chip structure which is further defined by the cut-off filter film on the basis of the first to third embodiments. In this embodiment, the cut-off filter film is integrally deposited on the narrow band filter film using a semiconductor process, and in the film system structure of the cut-off filter film 30, W1, W2, and W3 each include (0.5LH0.5L) or (0.5HL0.5H).

As a fifth embodiment of the present invention, there is provided a spectral imaging chip structure which is further defined by the cut-off filter film on the basis of the first to fourth embodiments. In this embodimentIn the method, the cut-off filter film is integrally deposited and grown on the narrow-band filter film by a semiconductor process, and the cut-off filter film is made of a material compatible with the semiconductor process, so that the spectral transmittance can be further improved, and the energy loss is reduced. The cut-off filter film is prepared by alternately depositing a high refractive index material and a low refractive index material. The high refractive index material of the cut-off filter film 30 includes Ta ₂ O ₅ 、Ti ₃ O ₅ 、TiO ₂ 、Si ₃ N ₄ Or Nb (Nb) ₂ O ₅ The low refractive index material of the cut-off filter film 30 includes SiO ₂ 、MgF ₂ And Al ₂ O ₃ At least one of them.

As a sixth embodiment of the present invention, there is provided a spectral imaging chip structure, which is further defined in terms of the structure of the narrow-band filter film on the basis of the first to fifth embodiments. In this embodiment, the narrow-band filter film 20 includes a plurality of FP cavity structures, each of the FP cavity structures is formed by a semiconductor process at one time, any FP cavity structure includes a first mirror, a light-transmitting layer, and a second mirror that are sequentially stacked from bottom to top, the FP cavity structures are distributed in a mosaic shape, heights of the light-transmitting layers of the FP cavity structures along any one column of the narrow-band filter film 20 are different, and heights of the light-transmitting layers of the FP cavity structures along any one row of the narrow-band filter film 20 are different. Alternatively, other types of structures may be adopted for the narrow-band filter film, specifically, the FP cavity structures are distributed in a line scan manner, the heights of the light-transmitting layers of the FP cavity structures along any one column of the narrow-band filter film 20 are the same, and the heights of the light-transmitting layers of the FP cavity structures along any one row of the narrow-band filter film 20 are different. In the present invention, the narrow band filter may take various forms without limitation.

In the sixth embodiment of the present invention, by arranging the structure of the narrow-band filter film, the structural complexity of the chip structure can be effectively reduced, the structural volume can be reduced, and the cost can be reduced. The narrow-band filter film comprises a plurality of FP cavity structures, the pixel photosensitive unit comprises a plurality of pixel photosensitive parts, the plurality of FP cavity structures are arranged in one-to-one correspondence with the plurality of pixel photosensitive parts, any FP cavity structure comprises a first reflecting mirror, a light passing layer and a second reflecting mirror which are sequentially overlapped from bottom to top, the plurality of FP cavity structures are distributed in a mosaic mode or line sweeping mode, the plurality of FP cavity structures are formed in one step by adopting a semiconductor technology, and the first reflecting mirror, the light passing layer, the second reflecting mirror and the pixel photosensitive parts are made of materials compatible with the semiconductor technology and are strictly aligned in the longitudinal direction without later-stage lamination. In the mode, the traditional light splitting system is directly processed on the pixel photosensitive unit of the photoelectric sensor by means of advanced semiconductor (CMOS) process technology, stray light is reduced due to tight connection, photon utilization rate is improved, and therefore speed can reach hundred frames per second, and a spectrum video function is realized; the volume and the weight are not different from those of a common RGB chip, and an imaging system with the size of a finger is realized; CMOS technology provides an unparalleled level of integration for the spectral imaging chip structure, and can be connected with any circuit with high integration, such as embedded in a mobile phone.

As a seventh embodiment of the present invention, there is provided a spectral imaging chip structure, in which the integrally grown narrow-band filter film is further defined by the first mirror and the second mirror on the basis of the first to sixth embodiments. In this embodiment, the first mirror is a lower mirror, the second mirror is an upper mirror, and the upper mirror is made of multiple layers of high-reflectivity materials and multiple layers of low-reflectivity materials alternately to form a bragg mirror, which are overlapped with each other for multiple times, and the reflectivity reaches over 99% as a cavity mirror of an FP cavity structure. The lower reflector has the same structure and material as the upper reflector, and is positioned between the light transmitting layer and the pixel photosensitive part, and has high reflection effect.

As an eighth embodiment of the present invention, there is provided a spectral imaging chip structure in which the chip structure in the range of 400 to 510nm of a specific wavelength band is defined on the basis of the first to seventh embodiments. The spectral imaging chip structure is a line scanning chip in the range of 400-510 nm, fig. 2 shows a filtering schematic diagram of a narrow-band filter film, and fig. 3 shows a filtering schematic diagram of an integrated growth cut-off filter film on the narrow-band filter film. In this embodiment, the spectral imaging chip structure is a line scan chip in the range of 400nm to 510nm, the film structure of the spectral imaging chip structure is sub|H (LH)/(5 nL) (HL)/(5H L1.28 (0.5LH0.5L)/(10.6 (0.5LH0.5L)/(10.99 (0.5LH0.5L)/(10|air), where H (LH)/(52 nL (HL)/(5H) is the film structure of the narrow band filter film 20, L is the film structure of the transition layer 40, 1.28 (0.5LH0.5L)/(10.6 (0.5LH0.5L)/(10.1.99 (0.5LH0.5L)) is the film structure of the cut-off filter film 30. The central wavelength of the spectrum imaging chip structure is 460nm, n=0.573-1.344, the thickness of the narrow-band spacer layer is 90nm-211nm, and the narrow-band peak value is tunable in 407nm-507 nm. In this embodiment, the film thickness adjustment coefficient of the cut-off filter film is obtained by means of software simulation. Alternatively, as other embodiments of the present invention, the film thickness adjustment coefficient of the cut-off filter film may be determined according to the center wavelength of the to-be-cut-off spectrum and the center wavelength of the narrow-band filter film, which is not limited herein, and may be determined in other manners.

As a ninth embodiment of the present invention, there is provided a spectral imaging chip structure in which the chip structure in the range of 510nm to 630nm of a specific wavelength band is defined on the basis of the first to seventh embodiments. The spectral imaging chip structure is a line scanning chip in the range of 510nm to 630nm, fig. 4 shows a schematic filtering diagram of a narrow-band filter film, and fig. 5 shows a schematic filtering diagram of an integrated growth cut-off filter film on the narrow-band filter film. In this embodiment, the spectral imaging chip structure is a line scan chip in the range of 510nm to 630nm, the film structure of the spectral imaging chip structure is sub|H (LH)/(5 nL (HL)/(5H L0.79 (0.5HL0.5H)/(10.3 (0.5LH0.5L)/(10.6 (0.5LH0.5L)/(10|air)), where H (LH)/(52 nL (HL)/(5H) is the film structure of the narrow band filter film 20, L is the film structure of the transition layer 40, and 0.79 (0.5HL0.5H)/(10.3 (0.5LH0.5L)/(10.6 (0.5LH0.5L)) 10 is the film structure of the cut-off filter film 30. The central wavelength of the spectrum imaging chip structure is 570nm, n=0.64-1.336, the thickness of the narrow-band spacing layer is 125nm-261nm, and the narrow-band peak value is tunable within 513nm-622 nm. In this embodiment, the film thickness adjustment coefficient of the cut-off filter film is obtained by means of software simulation. Alternatively, as other embodiments of the present invention, the film thickness adjustment coefficient of the cut-off filter film may be determined according to the center wavelength of the to-be-cut-off spectrum and the center wavelength of the narrow-band filter film, which is not limited herein, and may be determined in other manners.

As a tenth embodiment of the present invention, there is provided a spectral imaging chip structure in which a chip structure in a specific wavelength range of 640nm to 810nm is defined on the basis of the first to seventh embodiments. The spectral imaging chip structure is a line scanning chip in the range of 640nm to 810nm, fig. 6 shows a schematic filtering diagram of a narrow-band filter film, and fig. 7 shows a schematic filtering diagram of an integrated growth cut-off filter film on the narrow-band filter film. In this embodiment, the spectral imaging chip structure is a line scan chip in the range of 640nm to 810nm, the film structure of the spectral imaging chip structure is sub|H (LH) ≡52nL (HL) ≡5H L1.25 (0.5LH0.5L) ≡10.8 (0.5HL0.5H) ≡10.63 (0.5HL0.5H) ≡air, where H (LH) ≡52nL (HL) ≡5H is the film structure of the narrow band filter 20, L is the film structure of the transition layer 40, and 1.25 (0.5LH0.5L) ≡10.8 (0.5HL0.5H) ≡10.63 (0.5HL0.5H) ≡10 is the film structure of the cut-off filter 30. The center wavelength of the spectrum imaging chip structure is 717nm, n=0.588-1.238, the thickness of the narrow-band spacer layer is 145-305 nm, and the narrow-band peak is 651-769 nm and is tunable. In this embodiment, the film thickness adjustment coefficient of the cut-off filter film is obtained by means of software simulation. Alternatively, as other embodiments of the present invention, the film thickness adjustment coefficient of the cut-off filter film may be determined according to the center wavelength of the to-be-cut-off spectrum and the center wavelength of the narrow-band filter film, which is not limited herein, and may be determined in other manners.

As an eleventh embodiment of the present invention, there is provided a spectral imaging chip structure in which a chip structure in a specific wavelength band of 800nm to 1000nm is defined on the basis of the first to seventh embodiments. The spectral imaging chip structure is a line scanning chip in the range of 800nm to 1000nm, fig. 8 shows a schematic filtering diagram of a narrow-band filter film, and fig. 9 shows a schematic filtering diagram of an integral growth cut-off filter film on the narrow-band filter film. In this embodiment, the film structure of the spectral imaging chip structure is a line scan chip in the range of 800nm to 1000nm, the film structure of the spectral imaging chip structure is sub|H (LH)/(5 nL) 2nL (HL)/(5H L0.81 (0.5HL0.5H)/(10.64 (0.5HL0.5H)/(10.505 (0.5HL0.5H)/(10|air), where H (LH)/(5 2nL (HL)/(5H) is the film structure of the narrow band filter film 20, L is the film structure of the transition layer 40, 0.81 (0.5HL0.5H)/(10.64 (0.5HL0.5H)/(10.505 (0.5HL0.5H)) 10 is the film structure of the cut-off filter film 30. The center wavelength of the spectrum imaging chip structure is 870nm, the thickness of the narrow-band spacer layer is 255nm-460nm, n=0.851-1.5356, and the narrow-band peak is 825nm-976 nm. In this embodiment, the film thickness adjustment coefficient of the cut-off filter film is obtained by means of software simulation. Alternatively, as other embodiments of the present invention, the film thickness adjustment coefficient of the cut-off filter film may be determined according to the center wavelength of the to-be-cut-off spectrum and the center wavelength of the narrow-band filter film, which is not limited herein, and may be determined in other manners.

As a twelfth embodiment of the present invention, there is provided a spectral imaging chip structure in which the film thickness adjustment coefficient of the cut-off filter film is further defined on the basis of the above-described embodiment. This embodiment describes in detail a second acquisition method of the film thickness adjustment coefficient of the cut-off filter film. In this embodiment, the film thickness adjustment coefficient may be obtained according to the following steps: determining a to-be-cut-off spectrum section of a cut-off filter film; calculating and obtaining the central wavelength of the spectrum segment to be cut according to the first boundary threshold value and the second boundary threshold value of the spectrum segment to be cut; and determining a film thickness adjustment coefficient of the cut-off filter film according to the center wavelength of the to-be-cut-off spectrum and the center wavelength of the narrow-band filter film.

In the twelfth embodiment of the invention, the filter film is optimally designed, namely, the film thickness adjustment coefficient of the filter film is designed, specifically, the center wavelength of the to-be-cut-off spectrum is obtained through calculation according to the first boundary threshold value and the second boundary threshold value of the to-be-cut-off spectrum, and the film thickness adjustment coefficient of the filter film is determined through the center wavelength of the to-be-cut-off spectrum and the center wavelength of the narrow-band filter film, so that when the filter film with the film thickness adjustment coefficient is integrally deposited on the narrow-band filter film, light leakage outside the free spectrum range can be greatly inhibited, cut-off of an interference band is completed, the side mode inhibition ratio of spectrum filtering is greatly improved, and the spectrum imaging performance of the spectrum imaging chip structure is improved.

As a thirteenth embodiment of the present invention, there is provided a spectral imaging chip structure that defines a center wavelength of a band to be cut off on the basis of the above-described embodiments. In this embodiment, the center wavelength of the spectral band to be cut-off may be based on

To obtain; alternatively, the center wavelength of the spectral band to be cut-off may be determined according to +.>

Is obtained by, wherein lambda ₀ Lambda is the center wavelength of the spectrum to be cut off ₁ For a first boundary threshold, lambda, of the spectral band to be cut-off ₂ Is a second boundary threshold for the portion of spectrum to be cut off. The above are two methods for obtaining the center wavelength of the spectrum to be cut off, wherein +.>

The center wavelength of the spectrum to be cut off is obtained, the calculation accuracy is higher, and the suppression of light leakage outside the free spectrum range (compared with the formula +.>

The center wavelength of the band to be cut off is obtained).

As a fourteenth embodiment of the present invention, there is provided a spectral imaging chip structure in which the film thickness adjustment coefficient of the cut-off filter film is defined on the basis of the above-described embodiments. In this embodiment, the film thickness adjustment coefficient n of the cut-off filter film can be determined according to

To obtain the data of the part to be processed,wherein λ is the center wavelength of the narrow-band filter film, n=n ₁ 、n ₂ Or n ₃ . By adopting the method to determine the film thickness adjustment coefficient of the cut-off filter film, light leakage outside the free spectrum range can be greatly inhibited, cut-off of interference wave bands is completed, the side mode inhibition ratio of spectrum filtering is greatly improved, and the spectrum imaging performance of the spectrum imaging chip structure is improved.

As a fifteenth embodiment of the present invention, there is provided a spectral imaging chip structure which exemplifies the effect of the film thickness adjustment coefficient determination method on suppressing light leakage on the basis of the foregoing embodiments. Taking the lambda as the 650nm center wavelength as an example, the first comparative example is that a cut-off filter film is not added, and the obtained filter effect is shown in fig. 14, it can be seen that narrow-band filtering is realized only in the range of 575nm to 740nm, and the light leakage phenomena are very serious in the two spectral ranges of 500nm to 575nm and 750nm to 900nm, which is very serious for responding to the 500nm to 900nm spectral range SI-based detector, and the two spectral ranges need to be suppressed.

In the second comparative example of the fifteenth embodiment, it is designed that two layers of cut-off filter films are integrally deposited on the narrow-band filter film according to the light leakage spectrum of 500nm to 575nm and 750nm to 900nm, one of which is for suppressing light leakage in the range of 500nm to 575nm, and the center wavelength is

Determining the central wavelength as 534.88nm; corresponding film thickness adjustment coefficient alpha ₁ 534.88nm/650 nm=0.82; similarly, another layer suppresses light leakage in the range of 750nm to 900nm with a center wavelength of +.>

Determining the central wavelength as 818.18nm; corresponding film thickness adjustment coefficient alpha ₂ 818.18nm/650 nm=1.26.

In the third comparative example, the difference from the second comparative example is only for the coefficient α ₁ And alpha ₂ Taking 0.7 and 1.4 respectively, and randomly acquiring the coefficients, namely not according to the method of the embodiment of the inventionDetermining a film thickness adjustment coefficient.

Fig. 15 is a diagram showing a filtering effect of a spectral imaging chip structure provided by the second comparative example, and fig. 16 is a diagram showing a filtering effect of a spectral imaging chip structure provided by the third comparative example, where it can be seen that the light leakage outside the free spectral range can be greatly suppressed by determining the film thickness adjustment coefficient by using the embodiment of the present invention. On the contrary, if the film thickness adjustment coefficient is not determined according to the method of the embodiment of the invention, although the cut-off filter film is added and the coefficient difference is small, the light leakage outside the free spectrum range is difficult to be well inhibited, and even the light leakage problem cannot be solved.

Spatially relative terms, such as "above … …," "above … …," "upper surface at … …," "above," and the like, may be used herein for ease of description to describe one device or feature's spatial location relative to another device or feature as illustrated in the figures. It will be understood that the spatially relative terms are intended to encompass different orientations in use or operation in addition to the orientation depicted in the figures. For example, if the device in the figures is turned over, elements described as "above" or "over" other devices or structures would then be oriented "below" or "beneath" the other devices or structures. Thus, the exemplary term "above … …" may include both orientations of "above … …" and "below … …". The device may also be positioned in other different ways (rotated 90 degrees or at other orientations) and the spatially relative descriptors used herein interpreted accordingly.

In addition, the terms "first", "second", etc. are used to define the components, and are only for convenience of distinguishing the corresponding components, and the terms have no special meaning unless otherwise stated, and therefore should not be construed as limiting the scope of the present invention.

The above description is only of the preferred embodiments of the present invention and is not intended to limit the present invention, but various modifications and variations can be made to the present invention by those skilled in the art. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims (10)

1. A spectral imaging chip structure, the spectral imaging chip structure comprising:

the pixel photosensitive unit (10), the said pixel photosensitive unit (10) is used for realizing the image acquisition and data readout;

the narrow-band optical filter film (20), the narrow-band optical filter film (20) is integrally deposited and grown on the pixel photosensitive unit (10), and the narrow-band optical filter film (20) is used for realizing the tunability of the central wavelength of a required wave band;

a transition layer (40), the transition layer (40) being integrally deposited on the narrow band filter film (20);

the cut-off filter film (30), the cut-off filter film (30) is integrally deposited and grows on the transition layer (40), the cut-off filter film (30) is used for cutting off an interference wave band, and the transition layer (40) is used for transiting the narrow-band filter film (20) and the cut-off filter film (30).

2. The spectral imaging chip structure of claim 1, wherein the film system structure of the spectral imaging chip structure is sub|h (LH) ≡s ₁ 2nL(HL)^S ₁ H Ln ₁ (W1)^S ₂ n ₂ (W2)^S ₃ n ₃ (W3)^S ₄ |Air，H(LH)^S ₁ 2nL(HL)^S ₁ H is the film structure of the narrow band filter film (20), L is the film structure of the transition layer (40), W1, W2 and W3 each comprise a high refractive index material and a low refractive index material, n ₁ (W1)^S ₂ n ₂ (W2)^S ₃ n ₃ (W3)^S ₄ Is a film structure of the cut-off filter film (30), H is a high refractive index material, L is a low refractive index material, S ₁ 、S ₂ 、S ₃ And S is ₄ For the number of overlapping times, n is the film thickness adjustment coefficient of the narrow-band filter film, n ₁ 、n ₂ And n ₃ The film thickness of the cut-off filter film is adjusted by a coefficient.

3. The spectral imaging chip structure according to claim 2, wherein in the film system structure of the cut-off filter film (30), W1, W2 and W3 each include (0.5LH0.5L) or (0.5HL0.5H).

4. A spectral imaging chip structure according to any of claims 1-3, characterized in that the cut-off filter film is prepared by alternating deposition of a high refractive index material and a low refractive index material, the high refractive index material of the cut-off filter film (30) comprising Ta ₂ O ₅ 、Ti ₃ O ₅ 、TiO ₂ 、Si ₃ N ₄ Or Nb (Nb) ₂ O ₅ The low refractive index material of the cut-off filter film (30) comprises SiO ₂ 、MgF ₂ And Al ₂ O ₃ At least one of them.

5. The spectral imaging chip structure according to claim 1, wherein the narrow-band filter film (20) comprises a plurality of FP cavity structures, the FP cavity structures are formed at one time by a semiconductor process, any FP cavity structure comprises a first mirror, a light-transmitting layer and a second mirror which are sequentially stacked from bottom to top, the FP cavity structures are distributed in a mosaic shape, heights of the light-transmitting layers of the FP cavity structures along any column of the narrow-band filter film (20) are different, and heights of the light-transmitting layers of the FP cavity structures along any row of the narrow-band filter film (20) are different; or a plurality of FP cavity structures are distributed in a line scanning mode, the heights of the light transmission layers of the FP cavity structures along any one row of the narrow-band filter film (20) are identical, and the heights of the light transmission layers of the FP cavity structures along any one row of the narrow-band filter film (20) are different.

6. The spectral imaging chip structure of claim 2, wherein the spectral imaging chip structure is a line scan chip in a range of 400nm to 510nm, the film system structure of the spectral imaging chip structure is sub|h (LH)/(5.2nl (HL)/(5H L1.28 (0.5LH0.5L)/(10.6 (0.5LH0.5L)/(101.99 (0.5LH0.5L)/(10|air), wherein H (LH)/(5 2nl (HL)/(5H) is the film system structure of the narrow band filter film (20), n = 0.573-1.344, L is the film system structure of the transition layer (40), 1.28 (0.5 LH 0.5L)/(101.6 (0.5 LH 0.5L)/(101.99 (0.5 LH 0.5L)/(10) is the film system structure of the cut-off filter film (30); or, the spectral imaging chip structure is a line scan chip in a range from 510nm to 630nm, the film system structure of the spectral imaging chip structure is sub|H (LH)/(52 nL) (HL)/(5H L0.79 (0.5HL0.5H)/(101.3 (0.5LH0.5L)/(101.6 (0.5LH0.5L)/(10|air), wherein H (LH)/(52 nL (HL)/(5H) is the film system structure of the narrow-band filter film (20), n=0.64-1.336, L is the film system structure of the transition layer (40), and 0.79 (0.5HL0.5H)/(101.3 (0.5LH0.5L)/(101.6 (0.5LH0.5L)/(10) is the film system structure of the cut-off filter film (30).

7. The spectral imaging chip structure of claim 2, wherein the spectral imaging chip structure is a line scan chip in the range of 640nm to 810nm, and the film system structure of the spectral imaging chip structure is sub|H (LH)/(52 nL) (HL)/(5 HL 1.25 (0.5LH0.5L)/(100.8 (0.5HL0.5H)/(10)

0.63 (0.5HL0.5H) 10|air, wherein H (LH) 52nL (HL) 5H is the film structure of the narrow-band filter film (20), n=0.588-1.238, L is the film structure of the transition layer (40),

1.25 (0.5LH0.5L)/(100.8 (0.5HL0.5H)/(100.63 (0.5HL0.5H)/(10)) is the film system structure of the cut-off filter film (30); or the film system structure of the spectrum imaging chip structure is a line scanning chip in the range of 800nm to 1000nm, the film system structure of the spectrum imaging chip structure is sub|H (LH)/(52 nL (HL)/(5H L0.81 (0.5HL0.5H)/(100.64 (0.5HL0.5H)/(100.505) (0.5HL0.5H)/(10|air), wherein H (LH)/(52 nL (HL)/(5H) is the film system structure of the narrow-band filter film (20), n=0.851-1.5356, L is the film system structure of the transition layer (40), and 0.81 (0.5HL0.5H)/(100.64 (0.5HL0.5H)/(100.505) (0.5HL0.5H)) 10 is the film system structure of the cut-off filter film (30).

8. The spectral imaging chip structure of claim 2, wherein the film thickness adjustment factor is obtained according to the steps of: determining a to-be-cut-off spectrum section of the cut-off filter film; calculating and obtaining the center wavelength of the spectrum segment to be cut according to the first boundary threshold value and the second boundary threshold value of the spectrum segment to be cut; and determining a film layer thickness adjustment coefficient of the cut-off filter film according to the central wavelength of the to-be-cut-off spectrum and the central wavelength of the narrow-band filter film.

9. The spectral imaging chip structure according to claim 8, wherein the center wavelength of the spectral band to be cut-off is determined by

To obtain; alternatively, the center wavelength of the spectrum to be cut-off may be according to +.>

Is obtained by, wherein lambda ₀ Lambda is the center wavelength of the spectrum to be cut-off ₁ For a first boundary threshold, lambda, of the spectral band to be cut ₂ And a second boundary threshold value of the spectrum segment to be cut off.

10. The spectral imaging chip structure according to claim 8 or 9, wherein the film thickness adjustment coefficient n of the cut-off filter film is dependent on

Wherein λ is the center wavelength of the narrow band filter, n=n ₁ 、n ₂ Or n ₃ 。/>

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