CN115982050A - Multifunctional test system and method for IO-Link master station - Google Patents
Multifunctional test system and method for IO-Link master station Download PDFInfo
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Abstract
The invention discloses a multifunctional test system and a multifunctional test method for an IO-Link master station, belongs to the field of the IO-Link master station, and relates to a multifunctional test technology; the system comprises a multifunctional testing device, an IO-Link master station and an upper computer configuration module; the multifunctional testing device is provided with one or more IO-Link interfaces and is connected with IO-Link ports of the IO-Link master station through a plurality of the set IO-Link interfaces; the method can be used for testing different types of IO-Link equipment in analog connection with a single IO-Link port of the IO-Link master station, can also be used for concurrently testing a plurality of ports, can more comprehensively and visually reflect the capability of the IO-Link master station in the process of multi-port communication, and solves the defect that the current IO-Link master station can only test fixed type equipment or only can test a single port when testing.
Description
Technical Field
The invention belongs to the field of IO-Link master stations, relates to a multifunctional test technology, and particularly relates to a multifunctional test system and method for an IO-Link master station.
Background
The IO-Link is bidirectional point-to-point communication, is independent of any field bus, and is provided with an independent open communication interface. The IO-Link is used as an I/O communication mode, is suitable for industrial communication of bottom layer equipment (sensors and actuators) in industrial control, and can enhance the communication capacity among all connected equipment in an industrial bus network. Parameters, diagnostic information, process data and the like of bottom layer equipment (sensors and actuators) can be transmitted to an upper network system through IO-Link communication, and the problem of communication of the bottommost layer in an automatic system is solved.
The IO-Link Master station test is necessary to determine whether the IO-Link Master station meets the IO-Link standard and whether the performance is stable. In order to realize the test of the IO-Link main station, part of IO-Link ports or all of the IO-Link ports of the IO-Link main station can be connected with IO-Link equipment of the same type or different types for testing, but the method has limitation and cannot comprehensively test the functions of the IO-Link main station.
Therefore, the invention provides a multifunctional test system and a method for an IO-Link master station.
Disclosure of Invention
The multifunctional test system and the multifunctional test method for the IO-Link master station are provided, the multifunctional test is provided with one or more IO-Link interfaces, the single IO-Link port of the IO-Link master station can be subjected to simulation connection with different types of IO-Link equipment for testing, the multiple ports of the IO-Link master station can be subjected to concurrent test, the capability of the IO-Link master station in dealing with multi-port communication can be comprehensively and visually reflected, and the defect that the current IO-Link master station can only test fixed types of equipment or only can test a single port when the current IO-Link master station is used for testing is overcome.
In order to achieve the purpose, the application provides a multifunctional test system for an IO-Link main station, which comprises a multifunctional test device, the IO-Link main station and an upper computer configuration module for performing function configuration on the multifunctional test device;
the multifunctional testing device is provided with one or more IO-Link interfaces and is connected with IO-Link ports of the IO-Link master station through a plurality of the set IO-Link interfaces;
the upper computer configuration module is used for configuring the functions of the IO-Link interfaces of the multifunctional test device, so that each IO-Link interface simulates one type of IO-Link equipment;
the multifunctional testing device comprises a control unit, an isolation unit, an IO-Link receiving and transmitting unit, a display unit and a storage unit;
the control unit is internally provided with an IO-Link equipment stack, one end of the control unit is connected with the isolation unit, the other end of the control unit is connected with the IO-Link receiving and sending unit, and the storage unit is used for storing IO-Link equipment type parameters;
the control unit is further used for controlling switching of IO-Link device types, the control unit obtains IO-Link device type parameters stored in the storage unit, divides the IO-Link device types into n types according to the IO-Link device type parameters, and marks the IO-Link device type parameters of the n types as a parameter data set i, wherein i represents an IO-Link device type number, i =1,2 8230, v 8230n;
and the control unit sets different test time Ti according to different IO-Link equipment types.
The setting mode of the test time Ti is as follows:
after the IO-Link device i executes the test, acquiring a time point T1 when the IO-Link master station transmits a first message to the IO-Link device i;
acquiring a time point T2 when the next message transmitted by the IO-Link master station reaches the IO-Link equipment i;
determining a time difference between the T2 and the T1 as a cycle time;
simultaneously acquiring the required test quantity of the IO-Link equipment i;
the product of the period time and the required test quantity of the IO-Link equipment i is the test time Ti of the IO-Link equipment i;
preferably, when the number of the IO-Link ports of the IO-Link master station is larger than that of the IO-Link interfaces equipped on a single multifunctional test device, a plurality of multifunctional test devices are adopted.
Preferably, the IO-Link device type parameters include a communication rate, an operation mode, a pre-operation mode, a minimum cycle time, and a device runtime.
Preferably, the multifunctional test device comprises two modes of operation: an online mode and an offline mode;
and (3) online mode: the multifunctional testing device is connected with the upper computer and transmits a testing result to the upper computer software in real time for displaying;
an off-line mode: the test device is not connected with the upper computer, the test result is stored in a storage unit of the multifunctional test device, and a user reads the test result through the upper computer or reads the test result through the IO-Link master station.
Preferably, the mode switching is performed in the mode of an upper computer configuration or a dial switch.
Preferably, the process of controlling and switching the IO-Link device type by the control unit includes:
after the multifunctional testing device is powered on, the control unit reads a set parameter data set i from the storage unit, configures the parameter data set i into a corresponding IO-Link equipment type i through the upper computer configuration module, and communicates with the IO-Link master station to be tested;
when the preset test time Ti is reached, the multifunctional test device does not respond to the IO-Link master station to be tested, and the communication is disconnected;
the control unit reads the set parameter data set i +1 from the storage unit, then configures the parameter data set into corresponding IO-Link equipment i +1 and communicates with the IO-Link master station to be tested.
Preferably, when the multifunctional testing device is in communication with the IO-Link master station, the multifunctional testing device acquires a current communication data message, processes and judges the data content, and transmits error information to the upper computer through the USB interface to be displayed or stored in the storage unit when the data is fault-tolerant.
Preferably, the multifunctional test method for the IO-Link master station comprises the following steps:
after the multifunctional testing device is powered on, the control unit reads a set parameter data set i from the storage unit, configures the parameter data set i into a corresponding IO-Link equipment type i through the upper computer configuration module, and communicates with the IO-Link master station to be tested;
when the preset test time Ti is reached, the multifunctional test device does not respond to the IO-Link master station to be tested, and the communication is disconnected;
when the multifunctional testing device is communicated with the IO-Link master station, the multifunctional testing device acquires a current communication data message, processes and judges the data content, and transmits error information to an upper computer through a USB interface to be displayed or stored in a storage unit when the data is error-tolerant;
the control unit reads the set parameter data set i +1 from the storage unit, then configures the parameter data set into corresponding IO-Link equipment i +1 and communicates with the IO-Link master station to be tested.
Compared with the prior art, the invention has the beneficial effects that:
1. the IO-Link multifunctional testing device can be configured and automatically switched to IO-Link equipment of different types, the defect that only fixed equipment can be tested when the current IO-Link master station tests is solved, and the testing efficiency is improved;
2. the IO-Link multifunctional test device can provide more than one IO-Link interface and can communicate simultaneously, and one device can test part or all ports of an IO-Link master station, so that the device is simple and convenient.
3. The IO-Link multifunctional testing device can configure the running time of each set IO-Link device, the running times of different types of IO-Link devices have different influences on the communication of the IO-Link master station to be tested, and a faster testing effect can be realized;
4. the IO-Link multifunctional testing device can store the testing result in the data storage unit or transmit the testing result to the computer end for real-time display, can read or export the testing result, and is more favorable for the analysis of the later testing result.
5. The invention not only can be used as an IO-Link multifunctional test device, but also can be used as a tool for testing the ultimate performance of the IO-Link master station due to the characteristic of multi-port configuration, for example, 8 ports can work at a COM3 rate simultaneously, and the condition of the master station packet loss in a certain time can be checked by adopting a TYPE _2_V M sequence TYPE. And the master station works under the conditions of high and low temperature, and the condition that the master station loses packets in the test is checked.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed in the prior art and the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.
FIG. 1 is a block diagram of a multifunctional test system for an IO-Link master station according to the present invention;
FIG. 2 is a block diagram of the multifunctional testing device of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some embodiments of the present application, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
The IO-Link master station is an industrial communication gateway, one end of the IO-Link master station is connected with an industrial Ethernet or a field bus, and the other end of the IO-Link master station is connected with IO-Link equipment. The controller is positioned on the upper layer of the IO-Link equipment, is in point-to-point connection with the IO-Link equipment, and is a controller of the IO-Link equipment.
The IO-Link master station generally has 1 or more than 1 IO-Link port and supports connection of 1 or more IO-Link devices. Different IO-Link devices may operate at COM1 (4.8 Kbps), COM2 (38.4 Kbps), or COM3 (230.4 Kbps) communication rates. Different IO-Link devices adopt different M sequence types to communicate with the IO-Link master station. According to the IO-Link interface and System Specification, M sequence TYPEs include ten TYPEs, such as TYPE _0, TYPE _1_1, TYPE _1_2, TYPE _1_V (8 OD), TYPE _1_V (32 OD), TYPE _2_1, TYPE _2_2, TYPE _2_3, TYPE _2_4, TYPE _2_5, TYPE _2_V, and TYPE _2_V (8 OD). Each IO-Link device has its own specific function, such as whether to support an ISDU function, whether to support an SIO function, whether to support a data storage function, whether to support a block parameter function, whether to support an event function, and the like. The IO-Link master station must accommodate all the different types of IO-Link devices to properly communicate with the IO-Link devices to which it is connected. In the actual use scene of the IO-Link master station, more IO-Link device combinations of different types are connected. How to ensure the communication stability of the IO-Link master station and different IO-Link devices is an important problem which must be considered by IO-Link master station manufacturers. Therefore, the invention provides a multifunctional test system for an IO-Link master station.
Referring to fig. 1 in particular, a multifunctional test system for an IO-Link master station includes a multifunctional test apparatus and an upper computer configuration module for performing function configuration on the multifunctional test apparatus;
in the application, the upper computer configuration module is used for performing function configuration on the multifunctional testing device through upper computer software, so that the multifunctional testing device works in various modes;
in one embodiment, the multifunctional testing device is provided with one or more IO-Link interfaces, the multifunctional testing device is connected with IO-Link ports of an IO-Link master station through a plurality of set IO-Link interfaces, and the function of the IO-Link interfaces of the multifunctional testing device is configured through the upper computer configuration module, so that each IO-Link interface simulates one type of IO-Link equipment;
in a specific embodiment, the multifunctional testing device is provided with 8 IO-Link interfaces, each IO-Link interface simulates one type of IO-Link equipment when the upper computer configuration module performs function configuration on the IO-Link interfaces of the multifunctional testing device, and when the IO-Link master station is tested, each IO-Link interface of the multifunctional testing device is connected with the IO-Link port of the IO-Link master station, concurrent testing is performed, the application scene of the IO-Link master station is restored more truly, and the testing result is more authentic.
Preferably, when the number of the IO-Link ports of the IO-Link master station is less than 8, the IO-Link interfaces of the unnecessary multifunctional testing device can be closed through the upper computer configuration module of the multifunctional testing device before testing;
when the number of IO-Link ports of the IO-Link master station is more than 8 (usually not more than 16, and 8 IO-Link ports are the most common), 2 multifunctional test devices or a plurality of multifunctional test devices can be used for testing.
In the present application, referring to fig. 2 specifically, as shown in fig. 2, the multifunctional testing apparatus includes a power conversion unit, a USB interface unit, an isolation unit, a control unit, an IO-Link transceiving unit, a display unit, and a storage unit;
the power supply conversion unit is used for converting the voltage of the upper computer and supplying power to the USB interface unit, the isolation unit, the control unit, the display unit and the storage unit;
it should be noted that the power supply of the IO-Link transceiving unit in the present application is from an IO-Link master station;
in a specific embodiment, if the voltage of the upper computer is 5V, the power conversion unit is used for converting the 5V voltage into 3.3V, and the 3.3V supplies power to the USB interface unit, the isolation unit, the control unit, the display unit and the storage unit;
the USB interface unit adopts FTDI FT232 or Microchip MCP2210 and other chips, and mainly has the function of converting data sent by an upper computer through a USB interface into SPI data and then sending the SPI data to the control unit through the isolation unit.
The isolation unit usually adopts high-voltage-resistant isolation chips to isolate the power supply of the upper computer from the power supply of the multifunctional testing device, so that the situation that the upper computer or the multifunctional testing device is burnt out due to potential difference of the power supplies in different power supply domains is avoided.
The control unit adopts an ARM M4 series single chip microcomputer, an IO-Link equipment stack is arranged in the control unit, one end of the control unit is connected with the isolation unit, the other end of the control unit is connected with the IO-Link transceiving unit, the control unit can perform IO-Link message interaction with an IO-Link master station to be tested, and COM1, COM2 and COM3 rates are supported. And the display unit can be driven to display the working state of the IO-Link master station, error alarm information and the like.
The IO-Link transceiver unit comprises an IO-Link device transceiver chip, which can be a chip of an OS8110ES model, a MAX14827A model, a MAX22513 model, a TIOL1115 model or an L6364 model.
The control unit is connected with the plurality of IO-Link receiving and transmitting units and is used for realizing communication with different IO-Link interfaces.
In one embodiment, the control unit is set according to the number of the IO-Link transceiver units, optionally, a plurality of IO-Link transceiver units are connected to the same control unit or a plurality of IO-Link transceiver units are connected to a plurality of control units, that is, the number of the control units is the same as that of the IO-Link transceiver units;
the display unit uses LEDs for displaying, including but not limited to red, yellow, green, etc. The multifunctional testing device is used for displaying the power state, the working state and the testing result of the multifunctional testing device.
The storage unit is used for storing necessary nonvolatile data information, and exchanges data with the control unit by adopting an I2C interface or an SPI interface, and the capacity of the storage unit is 2K Byte.
In the present application, the storage unit is further configured to store IO-Link device type parameters, where the IO-Link device type parameters include, but are not limited to, a communication rate, an operation mode, a pre-operation mode, a minimum cycle time, and a device runtime;
the multifunctional testing device comprises two working modes: an online mode and an offline mode;
the online mode is as follows: the multifunctional testing device is connected with the upper computer and transmits the testing result to the upper computer software in real time for displaying.
The off-line mode is as follows: the test device is not connected with the upper computer, the test result is stored in a storage unit of the multifunctional test device, and the user is connected with the upper computer to read the test result or read the test result through the IO-Link master station as required.
The mode switching can be performed in the modes of upper computer configuration or dial switch.
In an embodiment of the invention, the control unit is further configured to control switching of the IO-Link device types, the control unit obtains IO-Link device type parameters stored in the storage unit, divides the IO-Link device types into n types according to the IO-Link device type parameters, and marks the IO-Link device type parameters of the n types as a parameter data set i, where i represents an IO-Link device type number, i =1,2 ...n;
the control unit sets different test time Ti according to different IO-Link equipment types;
preferably, the setting mode of the test time Ti in the present application is:
after the IO-Link equipment i executes the test, acquiring a time point T1 when the IO-Link master station transmits a first message to the IO-Link equipment i;
acquiring a time point T2 when the next message transmitted by the IO-Link master station reaches the IO-Link equipment i;
determining a time difference between the T2 and the T1 as a cycle time;
simultaneously acquiring the required test quantity of the IO-Link equipment i;
the product of the cycle time and the required test quantity of the IO-Link equipment i is the test time Ti of the IO-Link equipment i;
specifically, the process of controlling and switching the IO-Link device types by the control unit includes:
after the multifunctional testing device is powered on, the control unit reads a set parameter data set i from the storage unit, configures the parameter data set i into a corresponding IO-Link device type i through the upper computer configuration module, and communicates with the IO-Link master station to be tested;
when the preset test time Ti is reached, the multifunctional test device does not respond to the IO-Link master station to be tested, and the communication is disconnected;
the control unit reads the set parameter data set i +1 from the storage unit, then configures the parameter data set into corresponding IO-Link equipment i +1 and communicates with the IO-Link master station to be tested.
In the application, when the multifunctional testing device is communicated with the IO-Link master station, the multifunctional testing device acquires a current communication data message, processes and judges the data content, and transmits error information to an upper computer through a USB interface to be displayed or stored in a storage unit when fault tolerance occurs in data.
In this application, the process of processing and determining the data content by the multifunctional testing device includes:
and acquiring the time for acquiring the data content by the multifunctional testing device, sequentially connecting the receiving time intervals, and indicating that the data content is wrong when the receiving time intervals are inconsistent.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present application. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the application. Thus, the present application is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (10)
1. A multifunctional test system for an IO-Link master station is characterized by comprising a multifunctional test device, the IO-Link master station and an upper computer configuration module for performing function configuration on the multifunctional test device;
the multifunctional testing device is provided with one or more IO-Link interfaces and is connected with IO-Link ports of the IO-Link master station through a plurality of the set IO-Link interfaces;
the upper computer configuration module is used for configuring the functions of the IO-Link interfaces of the multifunctional test device, so that each IO-Link interface simulates one type of IO-Link equipment;
the multifunctional testing device comprises a control unit, an isolation unit, an IO-Link receiving and transmitting unit, a display unit and a storage unit;
the control unit is internally provided with an IO-Link equipment stack, one end of the control unit is connected with the isolation unit, the other end of the control unit is connected with the IO-Link receiving and sending unit, and the storage unit is used for storing IO-Link equipment type parameters;
the control unit is further used for controlling switching of IO-Link device types, the control unit obtains IO-Link device type parameters stored in the storage unit, divides the IO-Link device types into n types according to the IO-Link device type parameters, and marks the IO-Link device type parameters of the n types as a parameter data set i, wherein i represents an IO-Link device type number, i =1,2 8230, v 8230n;
and the control unit sets different test time Ti according to different IO-Link equipment types.
2. The multifunctional test system for the IO-Link master station as recited in claim 1, wherein the plurality of multifunctional test apparatuses are used when the number of IO-Link ports of the IO-Link master station is greater than the number of IO-Link interfaces provided for a single multifunctional test apparatus.
3. The multifunctional test system for an IO-Link Master station of claim 2, wherein the IO-Link device type parameters comprise communication rate, operating mode, pre-operating mode, minimum cycle time, and device runtime.
4. The multifunctional test system for an IO-Link master station of claim 3, wherein the multifunctional test apparatus comprises two modes of operation: an online mode and an offline mode;
an online mode: the multifunctional testing device is connected with the upper computer and transmits a testing result to the upper computer software in real time for displaying;
an off-line mode: the test device is not connected with the upper computer, the test result is stored in the storage unit of the multifunctional test device, and the user reads the test result through the upper computer or reads the test result through the IO-Link master station.
5. The multifunctional test system for the IO-Link master station as recited in claim 4, wherein the switching of the modes is performed in a form of configuration of an upper computer or a dial switch.
6. The multifunctional test system for the IO-Link master station of claim 5, wherein the process of the control unit controlling the switching of the IO-Link device types comprises:
after the multifunctional testing device is powered on, the control unit reads a set parameter data set i from the storage unit, configures the parameter data set i into a corresponding IO-Link equipment type i through the upper computer configuration module, and communicates with the IO-Link master station to be tested;
when the preset test time Ti is reached, the multifunctional test device does not respond to the IO-Link master station to be tested, and the communication is disconnected;
the control unit reads the set parameter data set i +1 from the storage unit, then configures the parameter data set into corresponding IO-Link equipment i +1 and communicates with the IO-Link master station to be tested.
7. The multifunctional test system for the IO-Link master station as claimed in claim 6, wherein when the multifunctional test device communicates with the IO-Link master station, the multifunctional test device obtains a current communication data message, processes and judges the data content, and when the data has an error tolerance, transmits the error information to the upper computer through the USB interface to be displayed or stored in the storage unit.
8. The method for testing the multifunctional test system of the IO-Link master station as recited in any one of claims 1 to 7, comprising the steps of:
after the multifunctional testing device is powered on, the control unit reads a set parameter data set i from the storage unit, configures the parameter data set i into a corresponding IO-Link equipment type i through the upper computer configuration module, and communicates with the IO-Link master station to be tested;
when the preset test time Ti is reached, the multifunctional test device does not respond to the IO-Link master station to be tested, and the communication is disconnected;
when the multifunctional testing device is communicated with the IO-Link master station, the multifunctional testing device acquires a current communication data message, processes and judges the data content, and transmits error information to an upper computer through a USB interface to be displayed or stored in a storage unit when the data is error-tolerant;
the control unit reads the set parameter data set i +1 from the storage unit, then configures the parameter data set into corresponding IO-Link equipment i +1 and communicates with the IO-Link master station to be tested.
9. An electronic device comprising a processor, a memory, and a computer program stored in the memory; the processor, when executing the computer program, executes a multifunctional test method for an IO-Link master station as recited in claim 8.
10. A readable storage medium, having stored thereon a computer program which, when executed by a processor, performs the steps of the method of multifunctional test testing for an IO-Link master station of claim 8.
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| CN117354392A (en) * | 2023-10-17 | 2024-01-05 | 广东思谷智能技术有限公司 | IO-Link system supporting self-adaption multiple industrial Ethernet protocols |
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| CN117354392A (en) * | 2023-10-17 | 2024-01-05 | 广东思谷智能技术有限公司 | IO-Link system supporting self-adaption multiple industrial Ethernet protocols |
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