CN115941079B - Method, device, system and storage medium for testing equipment - Google Patents

Method, device, system and storage medium for testing equipment Download PDF

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Publication number
CN115941079B
CN115941079B CN202210819571.2A CN202210819571A CN115941079B CN 115941079 B CN115941079 B CN 115941079B CN 202210819571 A CN202210819571 A CN 202210819571A CN 115941079 B CN115941079 B CN 115941079B
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test
time period
signal
test item
tool
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CN115941079A (en
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李琨伦
宋玉龙
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Beijing Xiaomi Mobile Software Co Ltd
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Beijing Xiaomi Mobile Software Co Ltd
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Abstract

The disclosure discloses a method, a device, a system and a storage medium for testing equipment, and belongs to the field of antenna testing. The method is applied to a test tool in communication with a communication antenna and a receiving antenna mounted in a shielded enclosure, the shielded enclosure including a first device therein, the method comprising: the test tool sends a test instruction to the first device through the communication antenna, wherein the test instruction is used for triggering the first device to send a signal in a first time period; in the first time period, the testing tool controls the communication antenna to stop working and obtains signal parameters of signals received by the receiving antenna; the test tool determines a signal quality transmitted by the first device based on the signal parameter. The method can avoid wearing the physical interface of the first equipment and improve the test precision.

Description

Method, device, system and storage medium for testing equipment
Technical Field
The present disclosure relates to the field of antenna testing, and in particular, to a method, apparatus, system and storage medium for testing equipment.
Background
The quality of the signal sent by the equipment (such as a mobile phone) needs to be tested before the equipment leaves the factory, and the equipment is allowed to leave the factory when the quality of the signal reaches the standard. For example, the quality of a wireless fidelity (wifi) radio frequency signal sent by the device can be tested, and when the quality of the wifi radio frequency signal meets the standard, the device is allowed to leave the factory.
At present, a data line is used for connecting a testing tool and equipment to be tested, the testing tool controls the equipment to be tested to emit a signal, signal parameters of the signal are measured, and the signal parameters are located in a normal parameter range, so that the quality of the signal sent by the equipment to be tested is determined to be normal.
The data line is connected with the physical interface of the device to be tested, and mechanical abrasion can be generated on the physical interface of the device to be tested. In addition, the data line can generate electromagnetic interference to the environment where the equipment to be tested is located, and the test precision is reduced.
Disclosure of Invention
The embodiment of the application provides a method, a device, a system and a storage medium for testing equipment. The technical scheme is as follows:
according to one aspect of the disclosed embodiments, there is provided a method of testing equipment, the method being applied to a test tool which communicates with a communications antenna and a receiving antenna mounted within a shielded enclosure, the shielded enclosure including first equipment therein, the method comprising:
the test tool sends a test instruction to the first device through the communication antenna, wherein the test instruction is used for triggering the first device to send a signal in a first time period;
in the first time period, the testing tool controls the communication antenna to stop working and obtains signal parameters of signals received by the receiving antenna;
The test tool determines a signal quality transmitted by the first device based on the signal parameter.
According to another aspect of the embodiments of the present disclosure, there is provided a method of testing a device, the method being applied to a first device, the first device being located in a shielded box, the shielded box further having a communication antenna and a receiving antenna therein, the communication antenna and the receiving antenna each being in communication with a test tool, the method comprising:
the first equipment receives a test instruction sent by the test tool through the communication antenna;
the first device determining a first time period based on the test instruction;
the first device transmits a signal in the first time period, wherein the communication antenna stops working in the first time period, and the testing tool is used for determining the signal quality transmitted by the first device based on the signal parameters of the signal received by the receiving antenna in the first time period.
According to another aspect of the disclosed embodiments, there is provided an apparatus for testing a device, the apparatus being in communication with a communication antenna and a receiving antenna mounted within a shielded enclosure, the shielded enclosure including a first device therein, the apparatus comprising:
A transmission module configured to transmit a test instruction to the first device through the communication antenna, the test instruction being for triggering the first device to transmit a signal within a first period of time;
the acquisition module is configured to control the communication antenna to stop working and acquire signal parameters of signals received by the receiving antenna in the first time period;
a determining module configured to determine a signal quality transmitted by the first device based on the signal parameter.
According to another aspect of the disclosed embodiments, there is provided an apparatus for testing equipment, the apparatus being located in a shielded enclosure, the shielded enclosure further having a communication antenna and a receiving antenna, the communication antenna and the receiving antenna each being in communication with a testing tool, the apparatus comprising:
the receiving module is configured to receive a test instruction sent by the test tool through the communication antenna;
a determination module configured to determine a first time period based on the test instruction;
and a transmitting module configured to transmit a signal during the first period, wherein the communication antenna stops working during the first period, and the testing tool is used for determining the signal quality transmitted by the device based on the signal parameter of the signal received by the receiving antenna during the first period.
According to another aspect of embodiments of the present disclosure, there is provided a test tool comprising:
a processor;
a transceiver coupled to the processor;
wherein the processor is configured to execute executable instructions to implement the method of testing a device as described in the various aspects above.
According to another aspect of the disclosed embodiments, there is provided an apparatus comprising:
a processor;
a transceiver coupled to the processor;
wherein the processor is configured to execute executable instructions to implement the method of testing a device as described in the various aspects above.
According to another aspect of the disclosed embodiments, there is provided a computer storage medium having stored therein at least one instruction, at least one program, a set of codes, or a set of instructions, which are loaded and executed by a processor to implement the method of testing a device as described in the above aspects.
According to another aspect of the disclosed embodiments, there is provided a computer program product (or computer program) comprising computer instructions stored in a computer-readable storage medium; a processor of a computer device reads the computer instructions from the computer readable storage medium, the processor executing the computer instructions, causing the computer device to perform the method of testing a device as described in the above aspects.
According to another aspect of embodiments of the present disclosure, there is provided a chip comprising editable logic and/or program instructions for implementing the method of testing a device as described in the above aspects when the chip is running.
The technical scheme provided by the embodiment of the application can comprise the following beneficial effects:
the test tool sends a test instruction to first equipment in the shielding box in a wireless mode, and the test instruction triggers the first equipment to send a signal in a first time period. The test tool obtains signal parameters of a signal transmitted by the first device and determines the quality of the signal transmitted by the first device based on the signal parameters of the signal. Because the wireless mode is adopted to interact with each device, the testing tool does not need to be connected with the first device in a wired way, so that the abrasion of a physical interface of the first device is avoided, the electromagnetic interference generated by the wired connection to the environment in the shielding box is avoided, and the testing precision is improved.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the application.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the application and together with the description, serve to explain the principles of the application.
FIG. 1 is a schematic diagram of a system architecture of a test apparatus, according to an exemplary embodiment;
FIG. 2 is a schematic diagram of a system architecture of another test device, shown in accordance with an exemplary embodiment;
FIG. 3 is a flow chart of a method of testing a device, according to an exemplary embodiment;
FIG. 4 is a flow chart of a method of another test apparatus according to an exemplary embodiment;
FIG. 5 is a flow chart of a method of another test apparatus according to an exemplary embodiment;
FIG. 6 is a flow chart of a method of another test apparatus according to an exemplary embodiment;
FIG. 7 is a flowchart of a method of another test apparatus, according to an example embodiment;
FIG. 8 is a schematic diagram of the apparatus structure of a test device according to an exemplary embodiment;
FIG. 9 is a schematic diagram of an apparatus configuration of another test device, according to an example embodiment;
FIG. 10 is a schematic diagram of a test tool according to an exemplary embodiment;
fig. 11 is a schematic diagram showing a structure of a first apparatus according to an exemplary embodiment.
Specific embodiments thereof have been shown by way of example in the drawings and will herein be described in more detail. These drawings and the written description are not intended to limit the scope of the inventive concepts in any way, but to illustrate the concepts of the present application to those skilled in the art by reference to specific embodiments.
Detailed Description
Reference will now be made in detail to exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, the same numbers in different drawings refer to the same or similar elements, unless otherwise indicated. The implementations described in the following exemplary examples are not representative of all implementations consistent with the present application. Rather, they are merely examples of apparatus and methods consistent with some aspects of the present application as detailed in the accompanying claims.
Before the equipment leaves the factory, the quality of the signal sent by the equipment is often required to be tested, whether the quality of the signal sent by the equipment meets the standard is tested, and if the quality of the signal meets the standard, the equipment is allowed to leave the factory. For example, after a mobile phone manufacturer produces a mobile phone, testing whether the signal quality of a wifi radio frequency signal sent by the mobile phone meets the standard, and allowing the mobile phone to leave the factory when testing that the signal quality of the wifi radio frequency signal sent by the mobile phone meets the standard; and/or testing whether the signal quality of the cellular communication signal sent by the mobile phone meets the standard, and allowing the mobile phone to leave the factory when the signal quality of the cellular communication signal sent by the mobile phone meets the standard. The devices herein may include cell phones, tablet computers, or other wireless communication devices.
For testing a device, referring to fig. 1, an embodiment of the present disclosure provides a system 100 for testing a device, the system 100 comprising: test tool 101, shielded enclosure 102, communication antenna 103, and receiving antenna 104.
Wherein the test tool 101 communicates with a communication antenna 103 and a receiving antenna 104, respectively, the communication antenna 103 and the receiving antenna 104 being mounted in a shielded enclosure 102, the shielded enclosure 102 comprising at least one device to be tested.
Optionally, the shielding case 102 is made of metal, so that electromagnetic signals in the external environment can be shielded, and thus, a separate environment different from the outside is provided in the shielding case 102.
At the start of testing the devices in the shielded enclosure 102, the test tool 101 establishes a wireless connection with each device in the shielded enclosure 102 through the communication antenna 103, and sends test instructions to each device through the wireless connection with each device, respectively.
After the test instruction is transmitted, the test tool 101 controls the communication antenna 103 to stop operating, so that the communication antenna 103 stops transmitting the wireless signal in the shielding box 102.
Each device in the shielded enclosure 102 corresponds to a different time period, and the time periods corresponding to any two devices have no time intersection. For any one of the apparatuses in the shield case 102, for convenience of explanation, the apparatus is referred to as a first apparatus, and a period corresponding to the first apparatus is referred to as a first period. The first device transmits a signal for a first period of time based on the test instruction.
During a first time period, the receive antenna 104 receives a signal from the shielded enclosure transmitted by the first device. The test device 101 obtains a signal parameter of a signal received by the receiving antenna 104 in a first period, determines a first device corresponding to the first period based on the first period, and determines a signal quality sent by the first device based on the signal parameter.
Optionally, the test tool 101 stores normal parameter ranges corresponding to the signal parameters. In the case where the signal parameter is within the normal parameter range, the test tool 101 determines that the signal quality transmitted by the first device is normal. In the case that the signal parameter is outside the normal parameter range, the test tool 101 determines that the signal quality transmitted by the first device is abnormal.
Optionally, referring to fig. 2, the system 100 further comprises a router 105, the test tool 101 is connected to the router 105, and the router 105 is connected to the communication antenna 103. The test tool 101 thus establishes a connection with the communication antenna 103 through the router 105.
Alternatively, the test tool 101 is connected to the router 105 by a cable, or a wireless connection is established between the test tool 101 and the router 105.
Wherein the router 105 is connected to the communication antenna 103 by a cable. Referring to fig. 1 or 2, the communication antenna 103 is fixed to the inner side wall of the shield case 102 and connected to a cable located outside the shield case 102. Since the cable connected to the communication antenna 103 is located outside the shield case 102, the cable does not generate electromagnetic interference with the environment located inside the shield case 102 under the barrier of the shield case 102.
At the beginning of testing the devices in the shielded enclosure 102, the test tool 101 controls the communication antenna 103 to establish a wireless connection with each of the devices in the shielded enclosure 102. Then, the test tool 101 transmits a test instruction to the communication antenna 103, and the communication antenna 103 transmits the test instruction to each device through a wireless connection with each device, respectively.
In this case, since the communication antenna 103 communicates with each device through a wireless connection, the test tool 101 is not connected to each device using a cable, thereby avoiding abrasion of the physical interface of each device.
Optionally, referring to fig. 2, the system 100 further comprises a tester 106, the test tool 101 is connected to the tester 106, and the tester 106 is connected to the receiving antenna 104.
During a first time period, the receive antenna 104 receives a signal transmitted by the first device and transmits the signal to the tester 106. The tester 106 receives the signal and measures a signal parameter of the signal, which is sent to the test tool. The test tool 101 receives the signal parameter and determines the quality of the signal transmitted by the first device based on the signal parameter.
Alternatively, the test tool 101 is connected to the tester 106 by a cable, and the tester 106 is connected to the receiving antenna 104 by a cable. Referring to fig. 1 or 2, the receiving antenna 104 is fixed to the inner side wall of the shield case 102 and connected to a cable located outside the shield case 102. Since the cable connected to the receiving antenna 104 is located outside the shielded enclosure 102, the cable does not cause electromagnetic interference with the environment located inside the shielded enclosure 102 under the barrier of the shielded enclosure 102.
Optionally, the shielding box 102 further includes a tray 107, and the at least one device to be tested is placed on the tray 107.
Alternatively, the test tool 101 comprises a computer or the like, the cable comprising a data line, an optical fiber or coaxial cable or the like, and the tray 107 comprises a non-metallic tray or the like.
Fig. 3 shows a flowchart of a method 300 for testing a device according to an exemplary embodiment of the present disclosure, where the method 300 is applied to the system 100 shown in fig. 1 or fig. 2, and is performed by the test tool 101 in the system 100, and the method 300 includes:
step 301: the method includes sending a test instruction to at least one device in the shielded enclosure via the communication antenna, the at least one device including a first device.
In step 301, a communication antenna is controlled to establish a wireless connection with each device in the shielded enclosure, and a test instruction is sent to the communication antenna. The communication antenna receives the test instruction and sends the test instruction to each device through the wireless connection with each device.
Next, three examples of test instructions are listed, which are the following first, second, and third examples, respectively.
In a first example, the test instruction carries configuration information of a first time period corresponding to the first device.
When a plurality of devices are included in the shielding box, the test instruction also carries configuration information of a first time period corresponding to each device except the first device.
In a first example, a first time period corresponding to each device in the shielding box is determined, a test instruction is generated, the test instruction comprises a first corresponding relation, and each record in the first corresponding relation comprises device information of one device and configuration information of the first time period corresponding to the device. I.e. the first correspondence is used for saving the correspondence between the device information of the device and the configuration information of the first time period.
Optionally, the device information of the first device includes a device identification of the first device, and the like. The configuration information of the first period includes a start time and an end time of the first period, or the configuration information of the first period includes a start time and a time length of the first period, or the configuration information of the first period includes an end time and a time length of the first period.
For two devices that are adjacent in the test sequence, the first time periods for the two devices have no time intersection. Optionally, the two devices are separated by a specified first time length between corresponding first time periods.
For a first device, at least one test item of the first device may need to be tested, and a second time period corresponding to each test item of the first device is determined. The first time period corresponding to the first device comprises a second time period corresponding to each test item of the first device, and the test instruction comprises configuration information of the second time period corresponding to each test item of the first device.
For two test items adjacent to each other in the test sequence, no time intersection exists between the second time periods corresponding to the two test items. Optionally, the two test items correspond to a second time period, and a specified second time length is arranged between the second time periods.
Optionally, the configuration information of the second time period includes a start time and an end time of the second time period, or the configuration information of the second time period includes a start time and a time length of the second time period, or the configuration information of the second time period includes an end time and a time length of the second time period.
Optionally, each record in the first correspondence relationship includes device information of a device, identification information of a test item of the device, and configuration information of a second period corresponding to the test item. Namely, the first correspondence relationship is used for storing the correspondence relationship among the equipment information of the equipment, the identification information of the test item and the configuration information of the second time period.
Optionally, the at least one test item of the first device includes at least one of an antenna of the first device and a frequency band used by the first device, etc.
The first device may include one or more antennas, one antenna being a test item.
The frequency band used by the first device includes one or more frequency bands, one frequency band being a test item. For example, the first device may transmit wifi radio frequency signals using a first frequency band and cellular communication signals using a second frequency band, the first and second frequency bands being two test items of the first device.
Optionally, each device in the shielding box is a device of the same type, the test items to be tested by each device are the same, and the test tool includes a configuration file, where the configuration file includes one or more of a first time length, a second time length, identification information of each test item of the device, and a time length of a second time period corresponding to each test item. Thus, in a first example, the test tool obtains a test order for each device in the shielded enclosure and determines a second time period for each test item for each device based on the test order for each device and the configuration file. Optionally, the configuration file further includes a test order for each test item.
Optionally, each device in the shielding box is not the same type of device and/or the test items that each device needs to test are different, and the configuration file of each device is included in the test tool. The configuration file corresponding to the first device comprises one or more of a first time length, a second time length, identification information of each test item of the first device and a time length of a second time period corresponding to each test item. Thus, in a first example, the test tool obtains the test order of each device in the shielded enclosure and determines a second time period corresponding to each test item of each device based on the test order of each device and the configuration file of each device. Optionally, the configuration file of the first device further comprises a test sequence of each test item of the first device.
Optionally, the configuration file further comprises a signal sequence that the first device is capable of transmitting.
Optionally, the test tool randomly configures the test sequence of each device in the shielded box, or the test tool receives the test sequence of each device entered by the user.
In a second example, the test instructions include a test sequence for each device in the shielded enclosure.
Optionally, a test sequence of each device in the shielding box is acquired, the test instruction is generated, the test instruction comprises a second corresponding relation, and any record in the second corresponding relation comprises device information of a device and the test sequence of the device. That is, the second correspondence is a correspondence of device information of the device and a test order of the device.
Optionally, the operation of obtaining the test sequence of each device is: the test order of each device is assigned or the test order of each device is received as input by the user.
In a second example, each device in the shielded enclosure includes a configuration file.
Optionally, each device in the shielding box is a device of the same type and the test items to be tested are the same for each device, and each device stores an identical configuration file. The configuration file of the first device includes one or more of a first time length, a second time length, a test sequence of each test item of the first device, and a time length of a second time period corresponding to each test item. When the first device receives the test instruction, the test sequence of the first device is obtained from the test instruction, and the first time period corresponding to the first device is determined based on the test sequence and the configuration file. Optionally, the first device determines a second time period corresponding to each test item in the first device based on the test sequence and the configuration file.
Optionally, each device in the shielding box is a different type of device and/or the test items that each device needs to test are different, each device corresponding to a different configuration file. The configuration file of the first device includes one or more of a first time length, a second time length, a test sequence of each test item of the first device, and a time length of a second time period corresponding to each test item. The first device includes configuration files of other devices in addition to the configuration files of the first device. For example, the first device further includes a configuration file of a second device, the second device being a device other than the first device in the shielding box, the configuration file of the second device including a first time length, a second time length, a test sequence of each test item of the second device, and a time length of a second time period corresponding to each test item.
When the first device receives the test instruction, the test sequence of the first device is obtained from the test instruction, and the first time period corresponding to the first device is determined based on the test sequence, the configuration files of the first device and the configuration files of other devices. Optionally, the first device determines a second time period corresponding to each test item in the first device based on the test sequence, the configuration file of the first device, and the configuration files of other devices.
Optionally, for a configuration file in the first device, the configuration file may be stored in the first device when the first device is produced, or after the test tool establishes a connection with the first device, the test tool sends the configuration file of the first device to the first device, or the test tool sends the configuration file of the first device and the configuration files of other devices to the first device.
Optionally, each device in the shielding box corresponds to the same configuration file, the test tool also includes the configuration file, and the test tool also determines the first period of time corresponding to each device based on the test sequence of each device in the shielding box and the configuration file. And/or the testing tool also determines a second time period corresponding to each test item of each device based on the testing sequence of each device in the shielding box and the configuration file.
Optionally, each device in the shielding box corresponds to a different configuration file, the test tool also includes a configuration file corresponding to each device, and the test tool also determines the first period corresponding to each device based on the test sequence of each device in the shielding box and the configuration file corresponding to each device. And/or, the testing tool also determines a second time period corresponding to each test item of each device based on the testing sequence of each device in the shielding box and the configuration file corresponding to each device.
In a third example, the test instruction does not include a test sequence for each device in the shielded enclosure, nor does the test instruction include configuration information for a first time period corresponding to each device.
In a third example, each device in the shielded enclosure includes a respective test sequence. Optionally, for a test sequence of the first device included in the first device, the user inputs the test sequence of the first device to the first device before placing the first device to the shielded enclosure.
In a third example, each device in the shielded enclosure includes a configuration file.
Optionally, each device in the shielding box is a device of the same type and the test items to be tested are the same for each device, and each device stores an identical configuration file. The configuration file of the first device includes one or more of a first time length, a second time length, a test sequence of each test item of the first device, and a time length of a second time period corresponding to each test item. Thus, when the first device receives the test instruction, the first time period corresponding to the first device is determined based on the test sequence of the first device and the configuration file. Optionally, the first device determines a second time period corresponding to each test item in the first device based on the test sequence and the configuration file.
Optionally, each device in the shielding box is a different type of device and/or the test items that each device needs to test are different, each device corresponding to a different configuration file. The configuration file of the first device includes one or more of a first time length, a second time length, a test sequence of each test item of the first device, and a time length of a second time period corresponding to each test item. The first device includes configuration files of other devices in addition to the configuration files of the first device. When the first device receives the test instruction, the first time period corresponding to the first device is determined based on the test sequence of the first device, the configuration files of the first device and the configuration files of other devices. Optionally, the first device determines a second time period corresponding to each test item in the first device based on the test sequence, the configuration file of the first device, and the configuration files of other devices.
Optionally, for a configuration file in the first device, the configuration file may be stored in the first device when the first device is produced, or after the test tool establishes a connection with the first device, the test tool sends the configuration file of the first device to the first device, or the test tool sends the configuration file of the first device and the configuration files of other devices to the first device.
Optionally, each device in the shielding box corresponds to the same configuration file, the test tool also includes the configuration file, the test tool obtains the test sequence of each device, and based on the test sequence of each device in the shielding box and the configuration file, the first time period corresponding to each device is determined. And/or the testing tool determines a second time period corresponding to each test item of each device based on the testing sequence of each device in the shielding box and the configuration file.
Optionally, each device in the shielding box corresponds to a different configuration file, the test tool also includes a configuration file corresponding to each device, the test tool obtains a test sequence of each device, and the first time period corresponding to each device is determined based on the test sequence of each device in the shielding box and the configuration file corresponding to each device. And/or the testing tool determines a second time period corresponding to each test item of each device based on the testing sequence of each device in the shielding box and the configuration file corresponding to each device.
Optionally, the operation of the test tool to obtain the test sequence for each device is: the test tool receives a test sequence for each device entered by the user.
Step 302: after a test instruction is sent, the communication antenna is controlled to stop working, and signal parameters of signals received by the receiving antenna in a first time period corresponding to the first equipment are obtained.
After the test instruction is sent, the test tool controls the communication antenna to stop working, and electromagnetic signals emitted by the communication antenna are not emitted in the shielding box.
And for a first device with a first testing sequence in the shielding box, after receiving the testing instruction, the first device sends a signal in a first time period corresponding to the first device. For a second device with a second test sequence in the shielding box, the second device sends signals in a first time period corresponding to the second device. For other devices in the shielded enclosure, the other devices also transmit signals during their corresponding first time periods.
For a first device in the shielded enclosure, the first device transmits a signal when a first time period corresponding to the first device has arrived. In step 302, in a first period of time corresponding to the first device, the receiving antenna receives a signal sent by the first device, and sends the signal to the tester. The tester receives the signal, measures a signal parameter of the signal, and sends the signal parameter to the test tool. The testing tool receives the signal parameters, determines a first time period in which the testing tool is currently located, determines first equipment corresponding to the first time period, and takes the signal parameters as the signal parameters of signals sent by the first equipment.
Optionally, the first time period includes a second time period corresponding to each test item of the first device, and the first device transmits a signal based on the first test item within the second time period corresponding to the first test item. In step 302, during a second time period corresponding to a first test item of a first device, a receiving antenna receives a signal sent by the first device based on the first test item and sends the signal to a tester. The tester receives the signal, measures a signal parameter of the signal, and sends the signal parameter to the test tool. The testing tool receives the signal parameters, determines a second time period of the current time period, determines a first test item of the first device corresponding to the second time period, and takes the signal parameters as the signal parameters of the signals sent by the first device based on the first test item.
Optionally, the signal parameter of the signal comprises one or more of the strength of the signal and the power of the signal, etc.
Step 303: based on the signal parameters, a signal quality transmitted by the first device is determined.
The testing tool comprises a normal parameter range corresponding to the signal parameter, the signal quality sent by the first equipment is determined to be normal when the signal parameter is located in the normal parameter range, and the signal quality sent by the first equipment is determined to be abnormal when the signal parameter is located outside the normal parameter range.
Optionally, the signal parameters include the strength and power of the signal, and the test tool includes a normal strength range and a normal power range. And determining that the signal quality sent by the first device is normal when the strength of the signal is within the normal strength range and the power of the signal is within the normal power range. And determining that the signal quality transmitted by the first device is abnormal when the strength of the signal is outside the normal strength range and/or the power of the signal is outside the normal power range.
Optionally, the signal is a signal transmitted by the first device based on the first test item. The signal quality of the signal is normal, which means that the signal quality of the signal transmitted by the first device based on the first test item is normal. The signal quality abnormality of the signal refers to the signal quality abnormality of the signal transmitted by the first device based on the first test item.
In summary, according to the method for testing devices provided by the embodiment of the present disclosure, a test tool sends a test instruction to at least one device in a shielding box in a wireless manner, and each device is triggered to send a signal in a first period corresponding to each device by the test instruction. The testing tool obtains signal parameters of signals sent by any device, obtains that the signals are the signals sent by the first device based on a time period in which the signal parameters are obtained, and determines the quality of the signals sent by the first device based on the signal parameters of the signals. Because the wireless mode is adopted to interact with each device, the testing tool does not need to be connected with each device in a wired way, thereby avoiding wearing the physical interface of the device and avoiding electromagnetic interference generated by the wired connection to the environment in the shielding box. In addition, can include a plurality of equipment in the shielding case, test tool can test a plurality of equipment, improves test efficiency.
Fig. 4 shows a flowchart of a method 400 for testing devices according to an exemplary embodiment of the present disclosure, where the method 400 is applied to the system 100 shown in fig. 1 or fig. 2, and at least one device to be tested is included in a shielding box of the system 100, and the at least one device includes a first device. The method 400 is performed by a first device, the method 400 comprising:
step 401: and receiving a test instruction sent by the test tool through the communication antenna.
In step 401, the first device establishes a wireless connection with the communication antenna, through which a test instruction sent by the test tool through the communication antenna is received.
Next, three examples of test instructions are listed, which are the following first, second, and third examples, respectively.
In a first example, the test instruction carries configuration information of a first time period corresponding to the first device.
When a plurality of devices are included in the shielding box, the test instruction also carries configuration information of a first time period corresponding to each device except the first device.
Optionally, the test instruction includes a first correspondence, and each record in the first correspondence includes device information of one device and configuration information of a first period corresponding to the device. I.e. the first correspondence is used for saving the correspondence between the device information of the device and the configuration information of the first time period.
For two devices that are adjacent in the test sequence, the first time periods for the two devices have no time intersection. Optionally, the two devices are separated by a specified first time length between corresponding first time periods.
For the first device, at least one test item of the first device may need to be tested, the first period of time corresponding to the first device includes a second period of time corresponding to each test item of the first device, and the test instruction includes configuration information of the second period of time corresponding to each test item of the first device.
For two test items adjacent to each other in the test sequence, no time intersection exists between the second time periods corresponding to the two test items. Optionally, the two test items correspond to a second time period, and a specified second time length is arranged between the second time periods.
Optionally, each record in the first correspondence relationship includes device information of a device, identification information of a test item of the device, and configuration information of a second period corresponding to the test item. Namely, the first correspondence relationship is used for storing the correspondence relationship among the equipment information of the equipment, the identification information of the test item and the configuration information of the second time period.
In a second example, the test instruction includes a test order for the first device.
Optionally, the test instruction includes a test sequence of each of the other devices in the shielded enclosure in addition to the test sequence of the first device.
Optionally, the test instruction includes a second correspondence, and any record in the second correspondence includes device information of a device and a test sequence of the device. That is, the second correspondence is a correspondence of device information of the device and a test order of the device.
In a third example, the test instruction does not include a test sequence for each device in the shielded enclosure, nor does the test instruction include configuration information for a first time period corresponding to each device.
Step 402: a first time period is acquired based on the test instruction.
In step 402, a second time period corresponding to each test item of the first device is obtained based on the test instruction.
Three examples of the test instruction are listed above, and the test instruction acquisition first period based on each example is described next.
In the first example, the test instruction carries configuration information of a first time period corresponding to the first device. And acquiring configuration information of a first time period corresponding to the first equipment from the test instruction, and determining the first time period based on the configuration information.
Optionally, the test instruction includes a first correspondence, where the first correspondence is used to save a correspondence between device information of the device and configuration information of the first time period. Based on the equipment information of the first equipment, acquiring configuration information of a first time period corresponding to the first equipment from the first corresponding relation. Or,
the first correspondence is used for storing correspondence among equipment information of equipment, identification information of test items and configuration information of a second time period. Based on the equipment information of the first equipment and the identification information of each test item in the first equipment, acquiring the configuration information of a second time period corresponding to each test item in the first equipment. And determining the second time period corresponding to each test item based on the configuration information of the second time period corresponding to each test item. The first time period corresponding to the first device includes a second time period corresponding to each test item in the first device.
In the second example described above, the test instructions include a test sequence of the first device. And acquiring the testing sequence of the first equipment from the testing instruction, and determining a first time period corresponding to the first equipment based on the testing sequence of the first equipment.
Optionally, the test instruction includes a second correspondence, where the second correspondence is used to save a correspondence between device information of the device and a test sequence. And acquiring the testing sequence of the first equipment from the second corresponding relation based on the equipment information of the first equipment.
In a second example, each device in the shielded enclosure includes a configuration file.
Optionally, each device in the shielding box is a device of the same type and the test items to be tested are the same for each device, and each device stores an identical configuration file. The configuration file of the first device includes one or more of a first time length, a second time length, a test sequence of each test item of the first device, and a time length of a second time period corresponding to each test item. When a test instruction is received, the test sequence of the first device is obtained from the test instruction, and a first time period corresponding to the first device is determined based on the test sequence and the configuration file. Optionally, the first device determines a second time period corresponding to each test item in the first device based on the test order and the test order of each test item in the configuration file.
Optionally, each device in the shielding box is a different type of device and/or the test items that each device needs to test are different, each device corresponding to a different configuration file. The configuration file of the first device includes one or more of a first time length, a second time length, a test sequence of each test item of the first device, and a time length of a second time period corresponding to each test item. The first device includes configuration files of other devices in addition to the configuration files of the first device. For example, the first device further includes a configuration file of a second device, the second device being a device other than the first device in the shielded enclosure, the configuration file of the second device including one or more of a first time length, a second time length, a test sequence of each test item of the second device, and a time length of a second time period corresponding to each test item. Thus, when a test instruction is received, the test sequence of the first device is obtained from the test instruction, and the first time period corresponding to the first device is determined based on the test sequence, the configuration files of the first device and the configuration files of other devices. Optionally, the first device determines the second time period corresponding to each test item in the first device based on the test sequence, the test sequence of each test item included in the configuration file of the first device, and the test sequence of each test item included in the configuration file of the other devices.
Optionally, for a configuration file in the first device, the configuration file may be stored in the first device when the first device is produced, or after the test tool establishes a connection with the first device, the configuration file of the first device sent by the test tool is received, or the configuration file of the first device and the configuration files of other devices sent by the test tool are received.
In the third example, the test instruction does not include a test sequence of each device in the shielding box, and does not include configuration information of the first period corresponding to each device. After the test instruction is received, a test sequence of the first device and a configuration file corresponding to the first device are obtained, and a first time period corresponding to the first device is determined based on the test sequence of the first device and the configuration file corresponding to the first device.
Optionally, the first device includes a test sequence of the first device, and after receiving the test instruction, the test sequence stored in the first device is obtained.
Optionally, the user inputs a test order of the first device to the first device before placing the first device into the shielded enclosure, the first device receives and saves the test order.
Optionally, a test sequence of each test item of the first device is obtained, and a second time period corresponding to each test item of the first device is determined based on the test sequence of the first device and the test sequence of each test item of the first device. The first time period corresponding to the first device includes a second time period corresponding to each test item of the first device.
In a third example, each device in the shielded enclosure includes a configuration file.
Optionally, each device in the shielding box is a device of the same type and the test items to be tested are the same for each device, and each device stores an identical configuration file. The configuration file of the first device includes one or more of a first time length, a second time length, a test sequence of each test item of the first device, and a time length of a second time period corresponding to each test item. Thus, when the test instruction is received, a first time period corresponding to the first device is determined based on the test sequence of the first device and the configuration file. Optionally, the second time period corresponding to each test item in the first device is determined based on the test order of the first device and the test order of each test item in the configuration file.
Optionally, each device in the shielding box is a different type of device and/or the test items that each device needs to test are different, each device corresponding to a different configuration file. The configuration file of the first device includes a first time length, a second time length, a test sequence of each test item of the first device, and a time length of a second time period corresponding to each test item. The first device includes configuration files of other devices in addition to the configuration files of the first device. Thus, when the test instruction is received, the first time period corresponding to the first device is determined based on the test sequence of the first device, the configuration file of the first device and the configuration files of other devices. Optionally, the first device determines the second time period corresponding to each test item in the first device based on the test sequence, the test sequence of each test item included in the configuration file of the first device, and the test sequence of each test item included in the configuration file of the other devices.
Optionally, for a configuration file in the first device, the configuration file may be stored in the first device when the first device is produced, or after the connection between the test tool and the first device is established, the configuration file of the first device sent by the test tool is received, or the configuration file of the first device and the configuration files of other devices sent by the test tool are received.
Step 403: a signal is transmitted during a first time period of a first device.
After the test tool sends a test instruction, the communication antenna stops sending signals, and electromagnetic signals emitted by the communication antenna are not emitted in the shielding box.
After transmitting the signal within the first time period of the first device, the receiving antenna is capable of receiving the signal. The testing tool acquires the signal parameters of the signal received by the receiving antenna, determines the first time period in which the signal is currently located, determines the first equipment corresponding to the first time period, and takes the signal parameters as the signal parameters of the signal sent by the first equipment. Based on the signal parameters, a signal quality transmitted by the first device is determined.
Optionally, in a second period of time corresponding to the first test item of the first device, the at least one test item of the first device includes the first test item based on the first test item transmitting a signal. After transmitting the signal within the first time period of the first test item, the receiving antenna is capable of receiving the signal. The testing tool acquires the signal parameters of the signal received by the receiving antenna, determines a second time period where the signal parameters are currently located, determines a first test item of the first device corresponding to the second time period, and takes the signal parameters as the signal parameters of the signal sent by the first device based on the first test item. Based on the signal parameters, a signal quality transmitted by the first device based on the first test item is determined.
In summary, in the method for testing a device provided by the embodiment of the present disclosure, a first device communicates with a testing tool in a wireless manner, receives a testing instruction sent by the testing tool, and sends a signal in a first period corresponding to the first device based on the testing instruction. The testing tool obtains signal parameters of signals sent by the first equipment, obtains that the signals are the signals sent by the first equipment based on a time period in which the signal parameters are obtained, and determines the quality of the signals sent by the first equipment based on the signal parameters of the signals. Because the first device interacts with the testing tool in a wireless manner, the first device does not need to communicate with the testing tool by using a wired connection, thereby avoiding wearing the physical interface of the first device and avoiding electromagnetic interference caused by the wired connection to the environment in the shielding box.
Fig. 5 shows a flowchart of a method 500 for testing devices according to an exemplary embodiment of the present disclosure, the method 500 being applied to the system 100 shown in fig. 1 or fig. 2, the method 500 being performed by a test tool and a first device in the system 100. The method 500 includes:
step 501: the test tool sends a test instruction to the first device through the communication antenna, wherein the test instruction carries configuration information of a first time period corresponding to the first device, and the first device is one device in the shielding box.
In step 501, the test tool determines a first time period corresponding to the first device, controls the communication antenna to establish a wireless connection with each device in the shielding box, and sends a test instruction to the communication antenna, where the test instruction carries configuration information of the first time period corresponding to the first device. The communication antenna receives the test instruction and sends the test instruction to the first equipment through wireless connection with the first equipment.
Alternatively, for at least one test item of the first device, it may be necessary to test the at least one test item of the first device. The test tool obtains the test sequence of each test item in the at least one test item, and obtains the second time period corresponding to each test item based on the test sequence of each test item. The first time period corresponding to the first equipment comprises the second time period corresponding to each test item, and a test instruction is generated, wherein the test instruction comprises configuration information of the second time period corresponding to each test item.
Optionally, the test tool randomly assigns a test order for each of the at least one test item. Alternatively, the test tool includes a configuration file including a test order for each of the at least one test item, and the test tool obtains the test order for each of the at least one test item from the configuration file.
For two test items adjacent to each other in the test sequence, no time intersection exists between the second time periods corresponding to the two test items. Optionally, the two test items correspond to a second time period, and a specified second time length is arranged between the second time periods.
Optionally, the at least one test item of the first device includes at least one of an antenna of the first device and a frequency band used by the first device, etc.
The first device may include one or more antennas, one antenna being a test item.
The frequency band used by the first device includes one or more frequency bands, one frequency band being a test item. For example, the first device may transmit wifi radio frequency signals using a first frequency band and cellular communication signals using a second frequency band, the first and second frequency bands being two test items of the first device.
Optionally, when the shielding box includes a plurality of devices, the test instruction further carries configuration information of a first period corresponding to each device except the first device. Or, the test instruction also carries configuration information of a second time period corresponding to each test item of each device except the first device.
For two devices that are adjacent in the test sequence, the first time periods for the two devices have no time intersection. Optionally, the two devices are separated by a specified first time length between corresponding first time periods.
Optionally, the test instruction includes a first correspondence, any record in the first correspondence includes device information of a device and configuration information of a first period corresponding to the device, or any record in the first correspondence includes device information of a device, identification information of a test item of the device and configuration information of the first period corresponding to the test item.
Optionally, each device in the shielding box is a device of the same type, the test items to be tested for each device are the same, and the test tool includes a configuration file, where the configuration file includes one or more of a first time length, a second time length, and a time length of the first time period. The test tool obtains the test sequence of each device in the shielding box, and determines a first time period corresponding to each device based on the test sequence of each device and the configuration file.
Optionally, the configuration file further includes a time length of the second time period corresponding to each of the at least one test item. The test tool obtains the test sequence of each test item, and determines the second time period corresponding to each test item in each device based on the test sequence of each device and the test sequence of each test item and the time length of the second time period corresponding to each test item. Optionally, the configuration file further includes a test sequence of each test item, and the test tool obtains the test sequence of each test item from the configuration file, or the test tool allocates the test sequence of each test item.
Optionally, each device in the shielding box is not the same type of device and/or the test items that each device needs to test are different, and the configuration file of each device is included in the test tool. The configuration file corresponding to the first device comprises one or more of a first time length, a second time length and a time length of a first time period corresponding to the first device. The testing tool obtains the testing sequence of each device in the shielding box, and determines a first time period corresponding to each device based on the testing sequence of each device and the configuration file of each device.
Optionally, the configuration file corresponding to the first device further includes identification information of each test item of the first device and a time length of the second time period corresponding to each test item. The test tool obtains the test sequence of each device in the shielding box, obtains the test sequence of each test item in each device, and determines a second time period corresponding to each test item of each device based on the test sequence of each device, the test sequence of each test item in each device and the configuration file of each device. Optionally, the configuration file of the first device further includes a test sequence of each test item of the first device, and the test tool obtains the test sequence of each test item of the first device from the configuration file of the first device; alternatively, the test tool assigns a test order for each test item of the first device.
Optionally, the test tool configures the test order of each device in the shielded enclosure, or the test tool receives the test order of each device entered by the user.
After the test instruction is sent, the test tool controls the communication antenna to stop working, and the communication antenna stops sending signals, so that the communication antenna cannot generate electromagnetic interference to the environment in the shielding box.
Step 502: the first device receives the test instruction and obtains a first time period based on the test instruction.
In step 502, a first device establishes a wireless connection with a communication antenna, through which a test instruction sent by a test tool through the communication antenna is received.
The test instruction carries configuration information of a first time period corresponding to the first equipment. And acquiring configuration information of a first time period corresponding to the first equipment from the test instruction, and determining the first time period based on the configuration information.
Optionally, the test instruction includes a first correspondence, where the first correspondence is used to save a correspondence between device information of the device and configuration information of the first time period. The first device obtains configuration information of a first time period corresponding to the first device from the first corresponding relation based on the device information of the first device, and determines the first time period corresponding to the first device based on the configuration information. Or,
The first correspondence is used for storing correspondence among equipment information of equipment, identification information of test items and configuration information of a second time period. The first device obtains configuration information of a second time period corresponding to each test item in the first device based on the device information of the first device and the identification information of each test item in the first device. And determining the second time period corresponding to each test item based on the configuration information of the second time period corresponding to each test item. The first time period corresponding to the first device includes a second time period corresponding to each test item in the first device.
In the case that a plurality of devices are included in the shielded enclosure, after receiving the test instruction, any device in the shielded enclosure performs the operation of step 502 in the same manner as the first device to obtain a first period of time corresponding to the device or obtain a second period of time corresponding to each test item in the device.
Step 503: the first device transmits a signal in a first time period corresponding to the first device.
Wherein, because the communication antenna stops transmitting signals, after the first device transmits signals, the receiving antenna receives signals from the shielding box, the signals are transmitted by the first device, and the signals are transmitted to the tester. The tester receives the signal, measures a signal parameter of the signal, and sends the signal parameter of the signal to the test tool. Optionally, the tester may also send the signal to the test tool.
Optionally, the signal parameters of the signal include one or more of: the strength of the signal or the power of the signal, etc.
Optionally, the at least one test item of the first device includes a first test item, and the first device sends a signal based on the first test item in a second time period corresponding to the first test item.
Optionally, the signal transmitted by the first device is a specified signal sequence.
Optionally, for each test item in the first device, each test item corresponds to a different signal sequence, and the first device sends the signal sequence corresponding to the first test item based on the first test item.
When the shielded enclosure includes a plurality of devices, each device in the shielded enclosure transmits a signal as the first device. For example, assume that the shielded enclosure further includes a second device that transmits a signal for a first period of time corresponding to the second device.
Optionally, each device in the shielded box corresponds to a different signal sequence, and each device transmits a respective corresponding signal sequence.
Step 504: after the test tool sends the test instruction, the communication antenna is controlled to stop sending signals, and signal parameters of signals received by the receiving antenna are obtained.
The test tool receives signal parameters of signals sent by the tester. Optionally, the test tool may also receive the signal sent by the tester.
Step 505: the test tool determines a first device that transmits the signal and determines the quality of the signal transmitted by the first device based on the signal parameter.
Optionally, in step 505, the test tool receives the signal parameter, determines a first time period in which the test tool is currently located, determines a first device corresponding to the first time period, and uses the signal parameter as a signal parameter of a signal sent by the first device. Or the testing tool receives the signal parameter, determines a second time period where the signal parameter is currently located, determines a first test item in the first device corresponding to the second time period, and takes the signal parameter as the signal parameter of the signal sent by the first device based on the first test item.
Optionally, in step 505, the test tool receives the signal and a signal parameter of the signal, determines a first device corresponding to the signal, and uses the signal parameter as a signal parameter of a signal transmitted by the first device. Or the test tool receives the signal and the signal parameter of the signal, determines a first test item in the first device corresponding to the signal, and takes the signal parameter as the signal parameter of the signal sent by the first device based on the first test item.
Optionally, the test tool includes a correspondence between the signal and device information of the device, and the test tool determines the first device corresponding to the signal based on the correspondence between the signal and the device information of the device.
Optionally, the test tool includes a correspondence between the signal and the identification information of the test item and the device information of the device, and the test tool determines the first test item in the first device corresponding to the signal based on the signal and the correspondence between the signal and the identification information of the test item and the device information of the device.
The operation of the test tool to determine the quality of the signal transmitted by the first device based on the signal parameter may be:
the testing tool comprises a normal parameter range corresponding to the signal parameter, the signal quality sent by the first equipment is determined to be normal when the signal parameter is located in the normal parameter range, and the signal quality sent by the first equipment is determined to be abnormal when the signal parameter is located outside the normal parameter range.
Optionally, the signal parameters include the strength and power of the signal, and the test tool includes a normal strength range and a normal power range. And determining that the signal quality sent by the first device is normal when the strength of the signal is within the normal strength range and the power of the signal is within the normal power range. And determining that the signal quality transmitted by the first device is abnormal when the strength of the signal is outside the normal strength range and/or the power of the signal is outside the normal power range.
Optionally, the signal is a signal transmitted by the first device based on the first test item. The signal quality of the signal is normal, which means that the signal quality of the signal transmitted by the first device based on the first test item is normal. The signal quality abnormality of the signal refers to the signal quality abnormality of the signal transmitted by the first device based on the first test item.
In summary, in the method for testing devices provided by the embodiment of the present disclosure, a test tool sends a test instruction to at least one device in a shielding box in a wireless manner, where the test instruction includes configuration information of a first time period corresponding to a first device. The first device receives the test instruction, acquires a first time period based on the test instruction, and sends a signal in the first time period. The test tool obtains signal parameters of a signal transmitted by the first device and determines the quality of the signal transmitted by the first device based on the signal parameters of the signal. Because the wireless mode is adopted to interact with each device, the testing tool does not need to be connected with each device in a wired way, thereby avoiding wearing the physical interface of the device and avoiding electromagnetic interference generated by the wired connection to the environment in the shielding box. In addition, can include a plurality of equipment in the shielding case, test tool can test a plurality of equipment, improves test efficiency.
Fig. 6 shows a flowchart of a method 600 of testing a device provided by an exemplary embodiment of the present disclosure, the method 600 being applied to the system 100 shown in fig. 1 or fig. 2, the method 600 being performed by a test tool and a first device in the system 100. The method 600 includes:
step 601: the test tool sends test instructions to the first device via the communication antenna, the test instructions carrying a test sequence for each device in a shielded enclosure, the shielded enclosure including the first device.
In step 601, the test tool obtains a test order of each device in the shielding box, and generates the test instruction, where the test instruction includes a second correspondence, and any record in the second correspondence includes device information of a device and the test order of the device. That is, the second correspondence is a correspondence of device information of the device and a test order of the device.
Optionally, the operation of obtaining the test sequence of each device is: the test order of each device is assigned or the test order of each device is received as input by the user.
After the test instruction is sent, the test tool controls the communication antenna to stop working, and the communication antenna stops sending signals, so that the communication antenna cannot generate electromagnetic interference to the environment in the shielding box.
Step 602: the first device receives the test instruction and obtains a first time period based on the test instruction.
In step 602, a first device establishes a wireless connection with a communication antenna, through which a test instruction sent by a test tool through the communication antenna is received. Based on the equipment information of the first equipment, acquiring a testing sequence of the first equipment from a second corresponding relation in the testing instruction, and determining a first time period corresponding to the first equipment based on the testing sequence of the first equipment.
Optionally, the first device further obtains a test sequence of each test item in the first device, and determines a second time period corresponding to each test item of the first device based on the test sequence of the first device and the test sequence of each test item. The first time period corresponding to the first device includes a second time period corresponding to each test item.
Wherein each device in the shielded enclosure includes a configuration file.
Optionally, each device in the shielding box is a device of the same type and the test items to be tested are the same for each device, and each device stores an identical configuration file. The configuration file of the first device includes one or more of a first time length, a second time length, a test sequence of each test item of the first device, and a time length of a second time period corresponding to each test item. When a test instruction is received, the test sequence of the first device is obtained from the test instruction, and a first time period corresponding to the first device is determined based on the test sequence and the configuration file. Optionally, the first device determines a second time period corresponding to each test item in the first device based on the test sequence and the configuration file.
Optionally, each device in the shielding box is a different type of device and/or the test items that each device needs to test are different, each device corresponding to a different configuration file. The configuration file of the first device includes one or more of a first time length, a second time length, a test sequence of each test item of the first device, and a time length of a second time period corresponding to each test item. The first device includes configuration files of other devices in addition to the configuration files of the first device. For example, the first device further includes a configuration file of a second device, the second device being a device other than the first device in the shielded enclosure, the configuration file of the second device including one or more of a first time length, a second time length, a test sequence of each test item of the second device, and a time length of a second time period corresponding to each test item. Thus, when a test instruction is received, the test sequence of the first device is obtained from the test instruction, and the first time period corresponding to the first device is determined based on the test sequence, the configuration files of the first device and the configuration files of other devices. Optionally, the first device determines a second time period corresponding to each test item in the first device based on the test sequence, the configuration file of the first device, and the configuration files of other devices.
Optionally, for a configuration file in the first device, the configuration file may be stored in the first device when the first device is produced, or after the test tool establishes a connection with the first device, the configuration file of the first device sent by the test tool is received, or the configuration file of the first device and the configuration files of other devices sent by the test tool are received.
In the case that a plurality of devices are included in the shielded enclosure, after receiving the test instruction, any device in the shielded enclosure performs the operation of step 602 in the same manner as the first device to obtain a first period of time corresponding to the device or obtain a second period of time corresponding to each test item in the device.
Steps 603-605: steps 503-505, which are the same as those described above in fig. 5, are not described in detail herein.
In summary, in the method for testing devices provided in the embodiments of the present disclosure, a test tool sends a test instruction to at least one device in a shielding box in a wireless manner, where the test instruction includes a test sequence of a first device. The first device receives the test instruction, acquires a first time period based on the test instruction, and sends a signal in the first time period. The test tool obtains signal parameters of a signal transmitted by the first device and determines the quality of the signal transmitted by the first device based on the signal parameters of the signal. Because the wireless mode is adopted to interact with each device, the testing tool does not need to be connected with each device in a wired way, thereby avoiding wearing the physical interface of the device and avoiding electromagnetic interference generated by the wired connection to the environment in the shielding box. In addition, can include a plurality of equipment in the shielding case, test tool can test a plurality of equipment, improves test efficiency.
Fig. 7 shows a flowchart of a method 700 of testing a device provided by an exemplary embodiment of the present disclosure, the method 500 being applied to the system 100 shown in fig. 1 or fig. 2, the method 700 being performed by a test tool and a first device in the system 100. The method 700 includes:
step 701: the test tool sends test instructions to the first device, which is one of the devices in the shielded enclosure, via the communication antenna.
The test instructions do not include a test sequence for each device in the shielded enclosure, nor do the test instructions include configuration information for a first time period corresponding to each device.
In step 701, the test tool controls the communication antenna to establish a wireless connection with each device in the shielded enclosure, and sends a test instruction to the communication antenna. The communication antenna receives the test instruction and sends the test instruction to the first equipment through wireless connection with the first equipment.
After the test instruction is sent, the test tool controls the communication antenna to stop working, and the communication antenna stops sending signals, so that the communication antenna cannot generate electromagnetic interference to the environment in the shielding box.
Step 702: the first equipment receives the test instruction, and obtains a test sequence of the first equipment and a configuration file corresponding to the first equipment based on the test instruction.
Optionally, the configuration file includes one or more of a first time length, a second time length, and a time length of a first time period corresponding to the first device. Alternatively, the configuration file includes one or more of a first time length, a second time length, and a time length of a second time period corresponding to each test item of the first device.
In step 702, a first device establishes a wireless connection with a communication antenna, through which a test instruction sent by a test tool through the communication antenna is received.
Optionally, the first device includes a test sequence and a configuration file of the first device, and after receiving the test instruction, the test sequence and the configuration file stored in the first device are obtained.
Optionally, the user inputs a test order of the first device to the first device before placing the first device into the shielded enclosure, the first device receives and saves the test order.
Step 703: the first device determines a first time period corresponding to the first device based on the test sequence and the configuration file of the first device.
Optionally, a test sequence of each test item of the first device is obtained, and a second time period corresponding to each test item of the first device is determined based on the test sequence of the first device and the test sequence of each test item of the first device. The first time period corresponding to the first device includes a second time period corresponding to each test item of the first device.
Each device in the shielded enclosure includes a configuration file.
Optionally, each device in the shielding box is a device of the same type and the test items to be tested are the same for each device, and each device stores an identical configuration file. The configuration file of the first device includes one or more of a first time length, a second time length, a test sequence of each test item of the first device, and a time length of a second time period corresponding to each test item. Thus, when the test instruction is received, a first time period corresponding to the first device is determined based on the test sequence of the first device and the configuration file. Optionally, the second time period corresponding to each test item in the first device is determined based on the test order of the first device and the test order of each test item in the configuration file.
Optionally, each device in the shielding box is a different type of device and/or the test items that each device needs to test are different, each device corresponding to a different configuration file. The configuration file of the first device includes one or more of a first time length, a second time length, a test sequence of each test item of the first device, and a time length of a second time period corresponding to each test item. The first device includes configuration files of other devices in addition to the configuration files of the first device. Thus, when the test instruction is received, the first time period corresponding to the first device is determined based on the test sequence of the first device, the configuration file of the first device and the configuration files of other devices. Optionally, the first device determines the second time period corresponding to each test item in the first device based on the test sequence, the test sequence of each test item included in the configuration file of the first device, and the test sequence of each test item included in the configuration file of the other devices.
Optionally, for a configuration file in the first device, the configuration file may be stored in the first device when the first device is produced, or after the connection between the test tool and the first device is established, the configuration file of the first device sent by the test tool is received, or the configuration file of the first device and the configuration files of other devices sent by the test tool are received.
Steps 704-705: steps 503-504, which are identical to steps 503-504 in fig. 5, are not described in detail herein.
In summary, according to the method for testing equipment provided by the embodiment of the present disclosure, the test tool sends the test instruction to at least one device in the shielding box in a wireless manner. The first device receives the test instruction, acquires a first time period based on the test instruction, and sends a signal in the first time period. The test tool obtains signal parameters of a signal transmitted by the first device and determines the quality of the signal transmitted by the first device based on the signal parameters of the signal. Because the wireless mode is adopted to interact with each device, the testing tool does not need to be connected with each device in a wired way, thereby avoiding wearing the physical interface of the device and avoiding electromagnetic interference generated by the wired connection to the environment in the shielding box. In addition, can include a plurality of equipment in the shielding case, test tool can test a plurality of equipment, improves test efficiency.
Fig. 8 shows a block diagram of an apparatus 800 of a test device provided by an exemplary embodiment of the present disclosure, the apparatus 800 being deployed on a test tool, the apparatus 800 being implemented as part or all of the test tool by software, hardware, or a combination of both. The apparatus 800 communicates with a communication antenna and a receiving antenna mounted within a shielded enclosure, the shielded enclosure including a first device therein, the apparatus 800 comprising:
a transmitting module 801 configured to transmit a test instruction to the first device through the communication antenna, the test instruction being for triggering the first device to transmit a signal within a first period of time;
an obtaining module 802, configured to control the communication antenna to stop working and obtain signal parameters of the signal received by the receiving antenna in the first period;
a determining module 803 configured to determine a signal quality transmitted by the first device based on the signal parameter.
In some embodiments, the determining module 803 is further configured to determine a second time period corresponding to a first test item, the first time period including the second time period, at least one test item of the first device including the first test item, the first device being configured to transmit a signal based on the first test item during the second time period;
A determining module 803 configured to determine, based on the signal parameters acquired during the second period of time, a signal quality transmitted by the first device based on the first test item.
In some embodiments, the test instructions include identification information of the first test item and configuration information of the second time period, the test instructions to trigger the first device to send a signal based on the first test item within the second time period.
In some embodiments, the first test item includes an antenna in the first device and/or a frequency band used by the first device.
In some embodiments, the shielded box includes a plurality of devices to be tested, including the first device.
In some embodiments, the test instructions include a test order of the first device, the test instructions to trigger the first device to determine the first time period based on the test order.
In some embodiments, the determining module 803 is further configured to determine the first period of time based on a test order of the first device, the test instruction including configuration information of the first period of time, the test instruction being for triggering the first device to determine the first period of time based on the configuration information.
In summary, in the method for testing a device provided by the embodiment of the present disclosure, the sending module sends a test instruction to a first device in the shielding box in a wireless manner, and the first device is triggered to send a signal in a first time period by the test instruction. The acquisition module acquires signal parameters of signals transmitted by any device, obtains that the signals are signals transmitted by the first device based on a time period in which the signal parameters are acquired, and the determination module determines the signal quality transmitted by the first device based on the signal parameters of the signals. Because the device is interacted with each device in a wireless mode, the device does not need to be connected with the first device in a wired mode, so that the abrasion of a physical interface of the first device is avoided, the electromagnetic interference generated by the wired connection to the environment in the shielding box is avoided, and the testing precision is improved.
Fig. 9 shows a block diagram of an apparatus 900 for testing a device provided by an exemplary embodiment of the present disclosure, where the apparatus 900 is deployed on a first device, and the apparatus 900 may be implemented as part or all of the first device by software, hardware, or a combination of both. The apparatus 900 is located in a shielded enclosure, and a communication antenna and a receiving antenna are also located in the shielded enclosure, where the communication antenna and the receiving antenna are both in communication with the apparatus 900, and the apparatus 900 includes:
A receiving module 901, configured to receive a test instruction sent by the test tool through the communication antenna;
a determining module 902 configured to determine a first time period based on the test instruction;
a transmitting module 903 configured to transmit a signal during the first period, where the communication antenna stops working during the first period, and the testing tool is configured to determine a signal quality transmitted by the device based on a signal parameter of a signal received by the receiving antenna during the first period.
In some embodiments, the determining module 902 is configured to determine a second time period corresponding to a first test item based on the test instruction, the first time period including the second time period, at least one test item of the apparatus 900 including the first test item;
a transmitting module 903 configured to transmit a signal based on the first test item during the second period, wherein the test tool is configured to determine, based on a signal parameter of a signal received by the receiving antenna during the second period, a signal quality of the signal transmitted by the apparatus 900 based on the first test item.
In some embodiments, the test instructions include identification information for the first test item and configuration information for the second time period,
A determining module 902, configured to determine the second time period corresponding to the first test item based on the identification information of the first test item and the configuration information of the second time period.
In some embodiments, the first test item includes an antenna in the apparatus 900 and/or a frequency band used by the apparatus.
In some embodiments, the shielded enclosure includes a plurality of devices to be tested, including the apparatus 900.
In some embodiments, the test instructions include a test sequence of the first device,
a determination module 902 is configured to determine the first time period based on the test order.
In some embodiments, the test instructions include configuration information for the first time period,
a determining module 902 configured to determine the first time period based on configuration information of the first time period.
In summary, in the device for testing equipment provided by the embodiment of the present disclosure, the receiving module communicates with the testing tool in a wireless manner, receives the testing instruction sent by the testing tool, and the sending module sends a signal in a first period corresponding to the device based on the testing instruction. The test tool is caused to acquire signal parameters of the signal and determine the quality of the signal transmitted by the device based on the signal parameters of the signal. Because the device adopts wireless mode to interact with the test tool, the device does not need to use wired connection to communicate with the test tool, thereby avoiding wearing the physical interface of the device, avoiding the wired connection from generating electromagnetic interference to the environment in the shielding box and improving the test precision.
Fig. 10 shows a schematic structural diagram of a test tool 1000 provided in an exemplary embodiment of the present disclosure, the test tool 1000 including: a processor 1001, a receiver 1002, a transmitter 1003, a memory 1004, and a bus 1005.
The processor 1001 includes one or more processing cores, and the processor 1001 executes various functional applications and information processing by running software programs and modules.
The receiver 1002 and the transmitter 1003 may be implemented as one communication component, which may be a communication chip.
The memory 1004 is connected to the processor 1001 through a bus 1005.
The memory 1004 may be used for storing at least one instruction that the processor 1001 uses to execute to implement the various steps in the method embodiments described above.
Further, the memory 1004 may be implemented by any type of volatile or nonvolatile storage device or combination thereof, including but not limited to: magnetic or optical disks, electrically erasable programmable Read-Only Memory (EEPROM, electrically Erasable Programmable Read Only Memory), erasable programmable Read-Only Memory (EPROM, erasable Programmable Read Only Memory), static Random-Access Memory (SRAM), read Only Memory (ROM), magnetic Memory, flash Memory, programmable Read-Only Memory (PROM, programmable Read Only Memory).
In an exemplary embodiment, a non-transitory computer readable storage medium is also provided, such as a memory, comprising instructions executable by a processor of a UE to perform the method of testing a device described above. For example, the non-transitory computer readable storage medium may be a ROM, a Random-Access Memory (RAM), a Compact Disc-Read Only Memory (CD-ROM), a magnetic tape, a floppy disk, an optical data storage device, and the like.
A non-transitory computer readable storage medium, which when executed by a processor of a test tool 1000, causes the test tool 1000 to perform the method of the test apparatus described above.
Fig. 11 shows a schematic structural diagram of a first device 1100 according to an exemplary embodiment of the present disclosure, where the first device 1100 includes: a processor 1101, a receiver 1102, a transmitter 1103, a memory 1104 and a bus 1105.
The processor 1101 includes one or more processing cores, and the processor 1101 executes various functional applications and information processing by running software programs and modules.
The receiver 1102 and the transmitter 1103 may be implemented as one communication component, which may be a communication chip.
The memory 1104 is connected to the processor 1101 through a bus 1105.
The memory 1104 may be used to store at least one instruction that the processor 1101 uses to execute to implement the various steps of the method embodiments described above.
Further, the memory 1104 may be implemented by any type or combination of volatile or nonvolatile memory devices including, but not limited to: magnetic or optical disks, electrically erasable programmable Read-Only Memory (EEPROM, electrically Erasable Programmable Read Only Memory), erasable programmable Read-Only Memory (EPROM, erasable Programmable Read Only Memory), static Random-Access Memory (SRAM), read Only Memory (ROM), magnetic Memory, flash Memory, programmable Read-Only Memory (PROM, programmable Read Only Memory).
In an exemplary embodiment, a non-transitory computer readable storage medium is also provided, such as a memory, comprising instructions executable by a processor of a UE to perform the method of testing a device described above. For example, the non-transitory computer readable storage medium may be a ROM, a Random-Access Memory (RAM), a Compact Disc-Read Only Memory (CD-ROM), a magnetic tape, a floppy disk, an optical data storage device, and the like.
A non-transitory computer readable storage medium, which when executed by a processor of a test tool 1100, causes a first device 1100 to perform the method of the test device described above.
An exemplary embodiment of the present disclosure also provides a computer readable storage medium having stored therein at least one instruction, at least one program, a set of codes, or a set of instructions, which are loaded and executed by the processor to implement the method of the test device provided by the above-described respective method embodiments.
An exemplary embodiment of the present disclosure also provides a computer program product comprising computer instructions stored in a computer-readable storage medium; the computer instructions are read from the computer readable storage medium by a processor of a computer device, which executes the computer instructions, causing the computer device to perform a method of testing a device as provided by the various method embodiments described above.
It should be understood that references herein to "a plurality" are to two or more. "and/or", describes an association relationship of an association object, and indicates that there may be three relationships, for example, a and/or B, and may indicate: a exists alone, A and B exist together, and B exists alone. The character "/" generally indicates that the context-dependent object is an "or" relationship.
It is further understood that the terms "first," "second," and the like are used to describe various information, but such information should not be limited to these terms. These terms are only used to distinguish one type of information from another and do not denote a particular order or importance. Indeed, the expressions "first", "second", etc. may be used entirely interchangeably. For example, a first message frame may also be referred to as a second message frame, and similarly, a second message frame may also be referred to as a first message frame, without departing from the scope of the present disclosure.
It will further be appreciated that although operations are depicted in the drawings in a particular order, this should not be understood as requiring that such operations be performed in the particular order shown or in sequential order, or that all illustrated operations be performed.
Other embodiments of the disclosure will be apparent to those skilled in the art from consideration of the specification and practice of the disclosure disclosed herein. This disclosure is intended to cover any adaptations, uses, or adaptations of the disclosure following the general principles of the disclosure and including such departures from the present disclosure as come within known or customary practice within the art to which the disclosure pertains. It is intended that the specification and examples be considered as exemplary only, with a true scope and spirit of the disclosure being indicated by the following claims.
It is to be understood that the present disclosure is not limited to the precise arrangements and instrumentalities shown in the drawings, and that various modifications and changes may be effected without departing from the scope thereof. The scope of the present disclosure is limited only by the appended claims.

Claims (18)

1. A method of testing equipment, the method being applied to a test tool that communicates with a communications antenna and a receiving antenna mounted within a shielded enclosure, the shielded enclosure including first equipment therein, the method comprising:
the test tool sends a test instruction to the first device through the communication antenna, wherein the test instruction is used for triggering the first device to send a signal in a first time period;
in the first time period, the testing tool controls the communication antenna to stop working and obtains signal parameters of signals received by the receiving antenna;
the test tool determines a second time period corresponding to a first test item, wherein the first time period comprises the second time period, at least one test item of the first device comprises the first test item, the first device is used for transmitting signals based on the first test item in the second time period, and the at least one test item of the first device comprises at least one of an antenna of the first device and a frequency band used by the first device;
The test tool determines, based on the signal parameters acquired during the second time period, a signal quality transmitted by the first device based on the first test item.
2. The method of claim 1, wherein the test instruction includes identification information of the first test item and configuration information of the second time period, the test instruction to trigger the first device to transmit a signal based on the first test item during the second time period.
3. The method of claim 2, wherein the first test item comprises an antenna in the first device and/or a frequency band used by the first device.
4. A method according to any one of claims 1 to 3, wherein the shielded box comprises a plurality of devices to be tested, including the first device.
5. The method of claim 4, wherein the test instructions comprise a test order for the first device, the test instructions to trigger the first device to determine the first time period based on the test order.
6. The method of claim 4, wherein the method further comprises:
The test tool determines the first time period based on the test sequence of the first device, the test instruction comprises configuration information of the first time period, and the test instruction is used for triggering the first device to determine the first time period based on the configuration information.
7. A method of testing a device, the method being applied to a first device, the first device being located within a shielded enclosure, the shielded enclosure further having a communication antenna and a receiving antenna, the communication antenna and the receiving antenna each in communication with a test tool, the method comprising:
the first equipment receives a test instruction sent by the test tool through the communication antenna, wherein the test instruction is used for triggering the first equipment to send a signal in a first time period;
the first device determines a second time period corresponding to a first test item based on the test instruction, wherein the first time period comprises the second time period, at least one test item of the first device comprises the first test item, and at least one test item of the first device comprises at least one of an antenna of the first device and a frequency band used by the first device;
The first device transmitting a signal based on the first test item during the second period of time;
wherein the communication antenna stops working in the first time period, and the testing tool is used for determining the signal quality sent by the first equipment based on the first test item based on the signal parameters of the signals received by the receiving antenna in the second time period.
8. The method of claim 7, wherein the test instructions include identification information for the first test item and configuration information for the second time period,
the first device determines a second time period corresponding to the first test item based on the test instruction, and the second time period comprises:
the first device determines the second time period corresponding to the first test item based on the identification information of the first test item and the configuration information of the second time period.
9. The method of claim 8, wherein the first test item comprises an antenna in the first device and/or a frequency band used by the first device.
10. The method of any of claims 7 to 9, wherein the shielded box comprises a plurality of devices to be tested, the plurality of devices including the first device.
11. The method of claim 10, wherein the test instructions comprise a test sequence of the first device,
the first device determines a second time period corresponding to the first test item based on the test instruction, and the second time period comprises:
the first device determines a first time period based on the test order, the first time period including the second time period corresponding to the first test item.
12. The method of claim 11, wherein the test instruction includes configuration information for the first time period,
the first device determines a first time period based on the test instruction, comprising:
the first device determines the first time period based on configuration information of the first time period.
13. An apparatus for testing equipment, the apparatus in communication with a communications antenna and a receiving antenna mounted within a shielded enclosure, the shielded enclosure including a first device, the apparatus comprising:
a transmission module configured to transmit a test instruction to the first device through the communication antenna, the test instruction being for triggering the first device to transmit a signal within a first period of time;
the acquisition module is configured to control the communication antenna to stop working and acquire signal parameters of signals received by the receiving antenna in the first time period;
A determining module configured to determine a second time period corresponding to a first test item, the first time period including the second time period, at least one test item of the first device including the first test item, the first device being configured to transmit a signal based on the first test item during the second time period, the at least one test item of the first device including at least one of an antenna of the first device and a frequency band used by the first device;
the determining module is further configured to determine, based on the signal parameters acquired during the second period of time, a signal quality transmitted by the first device based on the first test item.
14. An apparatus for testing equipment, wherein the apparatus is located in a shielded enclosure, and a communication antenna and a receiving antenna are also located in the shielded enclosure, and both communicate with a testing tool, the apparatus comprising:
a receiving module configured to receive a test instruction sent by the test tool through the communication antenna, the test instruction being used to trigger the device to send a signal in a first time period;
a determining module configured to determine a second time period corresponding to a first test item based on the test instruction, the first time period including the second time period, at least one test item of the apparatus including the first test item, the at least one test item of the apparatus including at least one of an antenna of the apparatus and a frequency band used by the apparatus;
A transmission module configured to transmit a signal based on the first test item during the second period of time;
wherein the communication antenna stops working in the first time period, and the testing tool is used for determining the signal quality sent by the device based on the first test item based on the signal parameters of the signals received by the receiving antenna in the second time period.
15. A test tool, the test tool comprising:
a processor;
a transceiver coupled to the processor;
wherein the processor is configured to execute executable instructions to implement the method of testing a device according to any of claims 1 to 6.
16. A test apparatus, the test apparatus comprising:
a processor;
a transceiver coupled to the processor;
wherein the processor is configured to execute executable instructions to implement the method of testing a device according to any of claims 7 to 12.
17. A computer readable storage medium having stored therein at least one instruction, at least one program, code set, or instruction set loaded and executed by a processor to implement a method of a test device according to any one of claims 1 to 6, or a method of a test device according to any one of claims 7 to 12.
18. A system of test equipment, characterized in that the system comprises a test tool for performing the method of any of claims 1 to 6 and a test equipment for performing the method of any of claims 7 to 12.
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