CN115932533A

CN115932533A - Circuit detection method and related device

Info

Publication number: CN115932533A
Application number: CN202110993492.9A
Authority: CN
Inventors: 喻陶; 魏新静
Original assignee: Huawei Technologies Co Ltd
Current assignee: Huawei Technologies Co Ltd
Priority date: 2021-08-26
Filing date: 2021-08-26
Publication date: 2023-04-07

Abstract

The embodiment of the invention discloses a circuit detection method and a related device, which are characterized by comprising the following steps: respectively obtaining N first induction signals based on a switching signal of each phase of power supply circuit in the N-phase power supply circuits, wherein one phase of power supply circuit corresponds to one first induction signal; the frequency of a switching signal of each phase of power circuit is the same as that of the corresponding first induction signal; n is an integer greater than 0; determining a frequency abnormal signal in the N first induction signals based on the N first induction signals; determining the ith phase power supply circuit with a fault in the N phase power supply circuits according to the frequency abnormal signal; i is an integer greater than 0. The circuit detection method and the related device provided by the embodiment of the invention can detect the fault in the multi-phase power circuit.

Description

Circuit detection method and related device

Technical Field

The present invention relates to the field of electronic technologies, and in particular, to a circuit detection method and a related apparatus.

Background

In Circuit Test (ICT) is a Test of the electrical performance and electrical connections of electrical components fabricated on a Circuit board. The on-line test mainly checks the resistance, capacitance and other basic quantities of each electrical element and the open and break conditions of each circuit to judge whether the circuit board has production and manufacturing defects and whether the electrical elements are reliable. The on-line test is a standard test for circuit board products, and has the characteristics of simple and quick operation, accurate fault location and the like.

At present, when a multi-phase power circuit in a server circuit board is tested (voltage is provided for the server circuit board) based on the ICT technology, the open and closed circuit conditions of each electronic element in the multi-phase power circuit can be tested through the ICT technology, but whether the electronic element fails in work cannot be determined, so that when the multi-phase power circuit is abnormal after being powered on, which phase circuit fails cannot be determined, and further when high current output is required, the problem that the server circuit board cannot normally work can occur.

Therefore, how to detect the failure of the multi-phase power circuit is an urgent problem to be solved.

Disclosure of Invention

The embodiment of the invention provides a circuit detection method and a related device, which are used for detecting faults in a multi-phase power circuit and improving user experience.

In a first aspect, an embodiment of the present invention provides a circuit detection method, including: respectively obtaining N first induction signals based on a switching signal of each phase of power supply circuit in the N-phase power supply circuits, wherein one phase of power supply circuit corresponds to one first induction signal; the frequency of a switching signal of each phase of power circuit is the same as that of the corresponding first induction signal; n is an integer greater than 0; determining a frequency abnormal signal in the N first induction signals based on the N first induction signals; determining the ith phase power supply circuit with a fault in the N phase power supply circuit according to the frequency abnormal signal; i is an integer greater than 0.

In the embodiment of the present invention, after the N-phase power circuit is powered on, the circuit detection device (which may be understood as a device for detecting a circuit fault) may obtain a corresponding first sensing signal based on a switching signal of each phase of the power circuit. For any phase power circuit, the frequency of the switching signal is the same as that of the first induction signal, so that whether the phase power circuit fails in a working state can be judged by analyzing whether the frequency of the first induction signal is within a preset tolerance interval, and the single-phase power circuit with a fault in the N-phase power circuit can be further determined. By the method provided by the embodiment of the invention, the single-phase power circuit with the fault in the multi-phase power circuit can be stably tested in the working state of the multi-phase power circuit, so that the single-phase circuit with the fault can be intercepted in failure, the product quality is ensured, and the user experience is improved.

In a possible implementation manner, the obtaining N first sensing signals based on a switching signal of each phase power supply circuit in the N-phase power supply circuits respectively includes: sensing a switching signal passing through a capacitor in each phase of power circuit through a sensing piece, and acquiring a signal generated by coupling the sensing piece and the capacitor to obtain a first sensing signal; the induction sheet comprises one or more of a capacitive probe and a magnetic probe.

In the embodiment of the invention, when the multi-phase power supply circuit is in a working state, for any phase power supply circuit, the induction sheet can be placed on the capacitor in the power supply circuit, and the induction sheet induces the switching signal passing through the capacitor, so that the first induction signal with the same frequency as the switching signal is obtained. Because the first induction signal is obtained by a non-contact method in the working state of the multi-phase power supply circuit, a test point is not required to be designed on the multi-phase power supply circuit, and a test needle is not required to stimulate an additional signal. Furthermore, the single-phase power circuit with faults in the N-phase power circuit can be determined by analyzing the frequency of the first induction signal corresponding to each phase of power circuit, and then the single-phase power circuit with faults can be intercepted in a failure mode, so that the product quality is guaranteed, and the user experience is improved.

In a possible implementation manner, the determining, based on the N first sensing signals, a frequency abnormality signal in the N first sensing signals includes: preprocessing the N first induction signals to obtain N second induction signals; and determining the frequency abnormal signal based on the second induction signal.

In the embodiment of the present invention, before performing the frequency analysis on the N first sensing signals, the N first sensing signals may be preprocessed to improve the signal quality, such as enhancing the signal driving, eliminating the inter-phase interference between the N first sensing signals, and the like. Furthermore, frequency analysis is carried out on the preprocessed signals, and the signals with abnormal frequency can be determined more accurately, so that the single-phase power circuit with the fault can be judged more accurately, the single-phase power circuit with the fault can be intercepted in a failure mode, product quality is guaranteed, and user experience is improved.

In one possible implementation, the preprocessing includes: and amplifying the N first sensing signals to enhance the signal drive of each first sensing signal in the N first sensing signals.

In the embodiment of the invention, because the signal may be attenuated before the frequency analysis of the signal, and the frequency analysis result of the signal is further influenced, an amplifying circuit with high bandwidth and high slew rate can be adopted to enhance the signal drive, so that the signal has stronger anti-interference capability, and the signal quality is improved.

In one possible implementation, the preprocessing further includes: and filtering the N first induction signals to eliminate interphase induction interference of each first induction signal in the N first induction signals.

In the embodiment of the invention, because the plurality of inductors in the multiphase power supply circuit are closely arranged in space, and the amplitude value of the switching signal passing through the inductors is high, the induction sheet arranged on the inductor can be coupled to the signal on the inductor beside the inductor, so that the signal can be filtered to eliminate the interphase interference among the signals and improve the signal quality.

In one possible implementation, the preprocessing further includes: and performing impedance matching on the N first sensing signals to eliminate signal reflection interference of each first sensing signal in the N first sensing signals.

In the embodiment of the invention, when the frequency analysis is performed on the signal, the high-frequency signal is accessed to the signal analysis module, and in the process, if the impedance of the signal is greatly transformed, signal reflection may occur, and then the signal entering the signal analysis module has a return channel (an interference signal), so that before the frequency analysis is performed on the signal, the impedance matching can be performed on the signal to eliminate the signal reflection interference, and further, the signal quality is improved.

In a possible implementation manner, the determining the frequency abnormality signal based on the second sensing signal includes: respectively transmitting the N second induction signals to a frequency analyzer through a twisted pair, and respectively carrying out frequency analysis on the N second induction signals through the frequency analyzer; and determining a signal with abnormal frequency in the N second induction signals as the abnormal frequency signal.

In the embodiment of the invention, the preprocessed induction signals have stronger anti-interference capability, and the signals can be transmitted to a measurement channel in a frequency analyzer by using a twisted pair, so that the frequency analyzer performs frequency analysis on the induction signals to realize remote frequency measurement. Because the twisted pair has stronger anti-jamming capability, the interference received in the signal transmission process is smaller, and then the frequency analyzer can accurately analyze the signal with abnormal frequency.

In a possible implementation manner, the determining the frequency abnormality signal based on the second sensing signal includes: respectively sending the N second induction signals to an external detection module, and carrying out frequency analysis on the second induction signals through the external detection module; and determining a signal with abnormal frequency in the N second induction signals as the abnormal frequency signal.

In the embodiment of the invention, the preprocessed induction signals can be directly transmitted to the external frequency measurement module, and the external frequency measurement module carries out frequency analysis on the induction signals so as to realize near-end frequency measurement. Because the frequency of the induction signals is analyzed by the external frequency measuring module at the near end, the problems of signal quality reduction and the like caused by switching of a long line (such as a twisted pair) can be avoided, and the signals with abnormal frequency can be more accurately analyzed.

In a second aspect, the present application provides a circuit detecting device, comprising: the first acquisition unit is used for respectively obtaining N first induction signals based on a switching signal of each phase of power circuit in the N-phase power circuits, wherein one phase of power circuit corresponds to one first induction signal; the frequency of a switching signal of each phase of power circuit is the same as that of the corresponding first induction signal; n is an integer greater than 0; the first processing unit is used for determining a frequency abnormal signal in the N first induction signals based on the N first induction signals; the second processing unit is used for determining the ith phase power supply circuit with a fault in the N phase power supply circuit according to the frequency abnormal signal; i is an integer greater than 0.

In a possible implementation manner, the first acquisition unit is specifically configured to: sensing a switching signal passing through a capacitor in each phase of power circuit through a sensing piece, and acquiring a signal generated by coupling the sensing piece and the capacitor to obtain a first sensing signal; the induction sheet comprises one or more of a capacitive probe and a magnetic probe.

In a possible implementation manner, the first processing unit is specifically configured to: preprocessing the N first induction signals to obtain N second induction signals; and determining the frequency abnormal signal based on the second induction signal.

In a possible implementation manner, the first processing unit is specifically configured to: and amplifying the N first sensing signals to enhance the signal drive of each first sensing signal in the N first sensing signals.

In a possible implementation manner, the first processing unit is specifically configured to: and filtering the N first induction signals to eliminate interphase induction interference of each first induction signal in the N first induction signals.

In a possible implementation manner, the first processing unit is specifically configured to: and performing impedance matching on the N first sensing signals to eliminate signal reflection interference of each first sensing signal in the N first sensing signals.

In a possible implementation manner, the first processing unit is specifically configured to: respectively transmitting the N second induction signals to a frequency analyzer through a twisted pair, and respectively carrying out frequency analysis on the N second induction signals through the frequency analyzer; and determining a signal with abnormal frequency in the N second induction signals as the abnormal frequency signal.

In a possible implementation manner, the first processing unit is specifically configured to: respectively sending the N second induction signals to an external detection module, and carrying out frequency analysis on the second induction signals through the external detection module; and determining a signal with abnormal frequency in the N second induction signals as the abnormal frequency signal.

In a third aspect, the present application provides a computer program comprising instructions which, when executed by a computer, cause the computer to perform the method of any one of the above first aspects.

In a fourth aspect, the present application provides a circuit detection apparatus, comprising a processor and a memory, wherein the memory is configured to store program codes, and the processor is configured to call the program codes stored in the memory to enable the circuit detection apparatus to perform the method of any one of the above first aspects.

In a fifth aspect, the present application provides a terminal device having a function of implementing the method in any one of the above embodiments of the circuit detection method. The function can be realized by hardware, and can also be realized by executing corresponding software by hardware. The hardware or software includes one or more modules corresponding to the functions described above.

In a sixth aspect, an embodiment of the present invention provides a computer program, where the computer program includes instructions, and when the computer program is executed by a computer, the computer may execute the flow in the circuit detection method in any one of the first aspect.

In a seventh aspect, the present application provides a computer-readable storage medium, which stores a computer program, and when the computer program is executed by a processor, the computer program implements the flow of the circuit detection method in any one of the above first aspects.

Drawings

In order to more clearly illustrate the technical solutions in the embodiments or the background art of the present invention, the drawings required to be used in the embodiments or the background art of the present invention will be described below.

Fig. 1A is a schematic system architecture diagram of an application scenario of a circuit detection apparatus according to an embodiment of the present invention.

Fig. 1B is a schematic diagram of a multi-phase power supply circuit according to an embodiment of the invention.

Fig. 2A is a schematic flowchart of a circuit detection method in an embodiment of the present application.

Fig. 2B is a schematic diagram of a circuit detection device according to an embodiment of the present invention.

Fig. 2C is a schematic diagram of phase-to-phase induced interference according to an embodiment of the present invention.

Fig. 2D is an equivalent circuit of an induction model according to an embodiment of the present invention.

Fig. 2E is a schematic diagram of a signal reflection interference according to an embodiment of the present invention.

Fig. 2F is a schematic diagram of another circuit detecting device according to an embodiment of the invention.

Fig. 3A is a schematic diagram of a near-end signal analysis module according to an embodiment of the present invention.

Fig. 3B is a schematic diagram of another circuit detecting device according to an embodiment of the invention.

Fig. 4A is an exemplary flowchart of a circuit testing method based on a capacitive probe according to an embodiment of the present invention.

Fig. 4B is a flowchart of a circuit testing method based on a magnetic probe according to an embodiment of the present invention.

Fig. 4C is a schematic diagram of a first sensing signal obtained based on a magnetic induction probe according to an embodiment of the present invention.

Fig. 4D is a frequency domain diagram of a first sensing signal according to an embodiment of the present invention.

Fig. 5 is a schematic diagram of a circuit detecting device provided in the present application according to an embodiment of the present invention.

Detailed Description

The embodiments of the present invention will be described below with reference to the drawings.

The terms "first," "second," "third," and "fourth," etc. in the description and claims of this application and in the accompanying drawings are used for distinguishing between different objects and not for describing a particular order. Furthermore, the terms "include" and "have," as well as any variations thereof, are intended to cover a non-exclusive inclusion. For example, a process, method, system, article, or apparatus that comprises a list of steps or elements is not limited to only those steps or elements listed, but may alternatively include other steps or elements not listed, or inherent to such process, method, article, or apparatus.

Reference herein to "an embodiment" means that a particular feature, structure, or characteristic described in connection with the embodiment can be included in at least one embodiment of the application. The appearances of the phrase in various places in the specification are not necessarily all referring to the same embodiment, nor are separate or alternative embodiments mutually exclusive of other embodiments. It is explicitly and implicitly understood by one skilled in the art that the embodiments described herein can be combined with other embodiments.

As used in this specification, the terms "component," "module," "system," and the like are intended to refer to a computer-related entity, either hardware, firmware, a combination of hardware and software, or software in execution. For example, a component may be, but is not limited to being, a process running on a processor, an object, an executable, a thread of execution, a program, and/or a computer. By way of illustration, both an application running on a computing device and the computing device can be a component. One or more components can reside within a process and/or thread of execution and a component can be localized on one computer and/or distributed between 2 or more computers. In addition, these components can execute from various computer readable media having various data structures stored thereon. The components may communicate by way of local and/or remote processes such as in accordance with a signal having one or more data packets (e.g., data from two components interacting with another component in a local system, distributed system, and/or across a network such as the internet with other systems by way of the signal).

Embodiments of the present application are described below with reference to the accompanying drawings.

Referring to fig. 1A, fig. 1A is a schematic diagram of a system architecture of an application scenario of a circuit inspection apparatus according to an embodiment of the present invention, and the circuit inspection system 01 may include a circuit 10 to be inspected and a circuit inspection apparatus 20. The circuit detection device 20 is used for detecting a circuit fault of the circuit 10 to be detected, so as to ensure that the circuit 10 to be detected can work normally. Wherein, the detailed description is as follows:

the circuit 10 to be tested may include a multi-phase power circuit, such as a multi-phase buck converter circuit. A multi-phase power supply circuit is a power supply circuit that is widely used in microprocessors. The multiphase power supply is a direct current transformation technology in which a plurality of voltage regulating circuits are connected in parallel to supply power. As shown in fig. 1B, fig. 1B is a schematic diagram of a multi-phase power circuit according to an embodiment of the present invention, where the multi-phase power circuit may be applied to a network device, a communication device, or a wireless device, where the network device may be a router, a server, a switch, or the like, and the embodiment of the present invention is not limited in particular. For example, the router may include a processor, and the multi-phase power supply circuit provided by the embodiment of the invention may provide power for the processor in the router. The multi-phase power circuit provided by the embodiment of the invention can comprise a central controller 101, a plurality of Drmos chips 102, a plurality of inductors 103 and a capacitor. The central controller 101 may adjust a phase difference of output signals of each phase of the power circuit; the Drmos chip can regulate the flow direction of input current; the inductor 103 can temporarily store the electric energy in the form of a magnetic field when the current transformation is blocked, and when the current in the circuit is reduced, the inductor 103 can release the temporarily stored energy; the capacitor can filter the output signal of the whole multiphase power supply circuit so as to reduce noise interference. It should be noted that the output signal of the entire multi-phase power supply circuit is commonly controlled by each phase of power supply circuit, and when any one phase of power supply circuit is abnormal, the signal (i.e., the signal output by the entire multi-phase power supply circuit) is abnormal.

The circuit testing device 20 may be a circuit failure testing device that tests electrical properties and electrical connections of electronic components fabricated on a circuit board. The circuit detection device provided by the embodiment of the invention senses the output signal of each phase of power circuit in the power-on state of the multi-phase power circuit, and analyzes different output signals, thereby detecting which phase of power circuit has a fault. For example, when the multi-phase power circuit shown in fig. 1B is powered on, the circuit detection apparatus 20 provided in the embodiment of the present invention may detect whether the N-phase power circuit included in the multi-phase power circuit fails. Optionally, when any one phase power supply circuit fails, the driving of the phase power supply circuit may be stopped, so as to isolate the phase power supply circuit, and prevent the processor in the router from failing to work normally due to the failure of the phase power supply circuit.

It is understood that a circuit detection device system architecture in fig. 1A is only an exemplary implementation in the embodiments of the present application, and the circuit detection device system in the embodiments of the present application includes, but is not limited to, the above system architecture.

The following describes a specific method architecture on which the embodiments of the present invention are based.

Referring to fig. 2A, fig. 2A is a schematic flowchart of a circuit detection method in an embodiment of the present application, and the circuit detection method in the embodiment of the present application will be described below with reference to fig. 2A and based on the system architecture in fig. 1A. It should be noted that, in order to describe the circuit detection method in the embodiment of the present application in more detail, it is described in the present application that the corresponding execution main bodies are respectively circuit detection devices in each flow step, but this does not mean that the embodiment of the present application can only perform the corresponding method flow through the described execution main bodies.

Step S301: the circuit detection device respectively obtains N first induction signals based on a switching signal of each phase of power supply circuit in the N-phase power supply circuits.

Wherein, a phase power circuit corresponds to a first induction signal; the frequency of a switching signal of each phase of power circuit is the same as that of the corresponding first induction signal; n is an integer greater than 0. Specifically, the N-phase power supply circuit is a circuit to be detected, and may be understood as a dc transformer circuit powered by a plurality of voltage regulating circuits in parallel. It should be noted that each phase of power circuit can regulate and control the output voltage through the charging and discharging process. A switching signal, for example, a switching signal of an i-th phase power supply circuit, may be understood as a signal passing through the i-th phase power supply circuit in an operating state of the multiphase power supply circuit. The first sensing signal, such as the first sensing signal of the i-th phase power supply circuit, may be understood as a signal having the same frequency as the switching signal of the i-th phase power supply circuit.

In one possible implementation manner, the circuit detection device obtains N first sensing signals based on a switching signal of each phase of power supply circuit in N-phase power supply circuits, respectively, and includes: the circuit detection equipment induces a switching signal passing through a capacitor in each phase of power circuit through an induction sheet, and acquires a signal generated by coupling the induction sheet and the capacitor to obtain a first induction signal; the induction sheet comprises one or more of a capacitive probe and a magnetic probe. Specifically, when the multi-phase power supply circuit is in an operating state, for any phase of power supply circuit, the sensing strip can be placed on the capacitor in the power supply circuit, and the sensing strip senses the switching signal passing through the capacitor, so as to obtain a first sensing signal with the same frequency as the switching signal. Because the first induction signal is obtained by a non-contact method in the working state of the multi-phase power supply circuit, a test point is not required to be designed on the multi-phase power supply circuit, and a test needle is not required to stimulate an additional signal. For example, as shown in fig. 1B, when the multi-phase power circuit is in an operating state, the sensing strips can be respectively placed on the inductors 103, and then the sensing strips sense the switching signals flowing through the inductors 103, so as to obtain N first sensing signals. It should be noted that the capacitive probe or the magnetic probe can sense the switching signal flowing through the inductor 103, and thus the sensing piece can be a capacitive probe or a magnetic probe.

Step S302: the circuit detection device determines a frequency abnormal signal in the N first induction signals based on the N first induction signals.

Specifically, for any phase power circuit, since the frequency of the switching signal is the same as that of the first sensing signal, by analyzing whether the frequency of the first sensing signal is within a preset tolerance interval, if the frequency of the first sensing signal is not within the tolerance interval, it may be determined that the signal is a frequency abnormal signal.

In one possible implementation manner, the determining, by the circuit detection device, a frequency abnormality signal in the N first sensing signals based on the N first sensing signals includes: the circuit detection equipment preprocesses the N first induction signals to obtain N second induction signals; and determining the frequency abnormal signal based on the second induction signal. Specifically, before performing frequency analysis on the N first sensing signals, the N first sensing signals may be preprocessed to improve signal quality, such as enhancing signal driving, eliminating inter-phase interference between the N first sensing signals, and the like. Furthermore, the frequency analysis is carried out on the preprocessed signals, and the signals with abnormal frequencies can be more accurately determined, so that the single-phase power circuit with faults can be more accurately judged, the single-phase circuit with faults can be subjected to failure interception, the product quality is guaranteed, and the user experience is improved. For example, as shown in fig. 2B, fig. 2B is a schematic diagram of a circuit detection device according to an embodiment of the present invention, in which the circuit detection device 20 may include a signal acquisition module 201, a signal processing module 202, and a signal analysis module 203, where an induction sheet 2011 is placed on an inductor 103 of a circuit board 10 to be detected, so as to sense a switching signal passing through the inductor 103, and further obtain a first induction signal; next, the signal processing module 202 preprocesses the first sensing signal to obtain a second sensing signal with higher signal quality; finally, the second sensing signal can be analyzed by the signal analysis module 203.

In one possible implementation, the preprocessing includes: and amplifying the N first sensing signals to enhance the signal drive of each first sensing signal in the N first sensing signals. Specifically, before frequency analysis is performed on the signal, the signal may be attenuated, and the frequency analysis result of the signal may be affected, so that the signal may be amplified by using a high-bandwidth and high-voltage slew rate operational amplifier and a high-precision resistor, so as to enhance signal driving, so that the signal has a strong anti-interference capability, and thus the signal quality is improved. For example, with a high bandwidth, high slew rate operational amplifier, and a high precision resistor, a signal can be amplified 10 times, i.e., signal drive enhancement. Meanwhile, a pull-up resistor can be reserved in the signal amplification circuit, and then a signal to be amplified can be coupled to a power supply (a power supply for supplying power to the signal amplification circuit) so as to reduce the number of windings; an up-down pull resistor can also be reserved in the signal amplification circuit to adjust the overall level, for example, the signal is adjusted by dividing the voltage through the resistor, so that the signal meets the signal input condition of the signal analysis module 203.

In one possible implementation, the preprocessing further includes: and filtering the N first induction signals to eliminate interphase induction interference of each first induction signal in the N first induction signals. Specifically, because the spatial arrangement of a plurality of inductors in the multiphase power supply circuit is tighter, and the value of the switching signal amplitude through the inductor is higher, the inductive chip placed on the inductor may be coupled to the signal on the inductor beside the inductor, so that the signal can be filtered to eliminate the inter-phase interference between the signals and improve the signal quality. For example, as shown in fig. 2C, fig. 2C is a schematic diagram of the phase-to-phase induced interference according to the embodiment of the present invention, because the multiple inductors in the multi-phase power circuit are arranged in a compact space and have high amplitude values of switching signals passing through the inductors, the inductive chip disposed on the inductor may be coupled to a signal on a nearby inductor, and as the first inductive signal in fig. 2C is interfered by other signals, the phase-to-phase interference may be eliminated by filtering the first inductive signal, so as to improve the signal strength of the first inductive signal.

Optionally, in order to reduce the amplitude of the sensing signal, as shown in fig. 2D, fig. 2D is an equivalent circuit of the sensing model according to the embodiment of the present invention, in the drawing, a capacitor C1 is an equivalent capacitor formed between an anode of the sensing piece and an inductor 103, a capacitor C2 is an equivalent capacitor between an anode of the sensing piece and a cathode of the sensing piece, and a signal sensed by the sensing piece may be equivalent to a voltage division of a switching signal on the inductor on C2. In the embodiment of the invention, a capacitor with a proper size can be connected in parallel at the position C2, namely, the capacitor with the proper size is connected in parallel when the first induction signal is collected, so that the voltage division is reduced, and the overall amplitude is reduced. On the other hand, the parallel capacitor can filter part of high-frequency components, and the amplitude is further reduced.

In one possible implementation, the preprocessing further includes: and performing impedance matching on the N first sensing signals to eliminate signal reflection interference of each first sensing signal in the N first sensing signals. For example, as shown in fig. 2E, fig. 2E is a schematic diagram of signal reflection interference provided by an embodiment of the present invention, in the diagram, when performing frequency analysis on a signal, a high-frequency signal is connected to a signal analysis module, and in this process, if impedance of the signal is greatly transformed, signal reflection may occur, and further, a signal entering the signal analysis module may return to a groove (an interference signal), so before performing frequency analysis on the signal, impedance matching may be performed on the signal, for example, a 50-ohm resistor is added to ground, so as to eliminate signal reflection interference and improve signal quality.

For example, as shown in fig. 2F, fig. 2F is a schematic diagram of another circuit detection device according to an embodiment of the present invention, in which the circuit detection device 20 may include a signal acquisition module 201, a signal processing module 202, and a signal analysis module 203, where a switch signal passing through an inductor 103 may be sensed by placing an induction sheet 2011 on the inductor 103 of the circuit board 10 to be detected, so as to obtain a first induction signal. Next, the signal processing module 202 preprocesses the first sensing signal to obtain a second sensing signal with higher signal quality, wherein inter-phase inductive interference of the first sensing signal can be reduced, the high-bandwidth amplifying circuit enhances driving, and then impedance matching is performed to obtain the second sensing signal. Finally, the second sensing signal can be analyzed by the signal analysis module 203.

In one possible implementation manner, the determining, by the circuit detection device, the frequency abnormal signal based on the second sensing signal includes: the circuit detection equipment respectively transmits the N second induction signals to a frequency analyzer through a twisted pair, and the frequency analyzer respectively performs frequency analysis on the N second induction signals; and determining a signal with abnormal frequency in the N second induction signals as the abnormal frequency signal. Specifically, the preprocessed sensing signals have strong anti-interference capability, and meanwhile, the signals can be transmitted to a measuring channel inside a frequency analyzer by using a twisted pair, so that the frequency analyzer performs frequency analysis on the sensing signals, and remote frequency measurement is realized. Because the twisted pair has stronger anti-jamming capability, the interference received in the signal transmission process is smaller, and then the frequency analyzer can accurately analyze the signal with abnormal frequency.

In one possible implementation manner, the determining, by the circuit detection device, the frequency abnormal signal based on the second sensing signal includes: the circuit detection equipment respectively sends the N second induction signals to an external detection module, and frequency analysis is carried out on the second induction signals through the external detection module; and determining a signal with abnormal frequency in the N second induction signals as the abnormal frequency signal. Specifically, the preprocessed sensing signals can be directly transmitted to the external frequency measurement module, and the external frequency measurement module performs frequency analysis on the sensing signals to realize near-end frequency measurement. Because the frequency of the induction signals is analyzed by the external frequency measuring module at the near end, the problems of signal quality reduction and the like caused by switching of a long line (such as a twisted pair) can be avoided, and the signals with abnormal frequency can be more accurately analyzed. For example, as shown in fig. 3A, fig. 3A is a schematic diagram of a near-end signal analysis module according to an embodiment of the present invention, in which the signal analysis module 203 (external frequency measurement module) may include an impedance adjustment module, an ADC sampling module, a Flash storage module, and an FPGA/MCU/CPLD module for calculating frequency. Based on the impedance adjusting module, the ADC sampling module and the Flash storage module, the signal waveform can be obtained, and then the waveform can be drawn on a user interface of a client, but the cost of the process is high, so that the signal can be directly transmitted to the frequency calculating module, the frequency calculating module directly carries out digital calculation, and further the calculation of the frequency and even the duty ratio is realized.

For example, as shown in fig. 3B, fig. 3B is a schematic diagram of another circuit detecting device according to an embodiment of the present invention, in which the circuit detecting device 20 may include a signal acquiring module 201, a signal processing module 202, and a signal analyzing module 203, wherein a switch signal passing through an inductor 103 may be sensed by placing an induction sheet 2011 on the inductor 103 of the circuit board 10 to be detected, so as to obtain a first sensing signal. Next, the signal processing module 202 preprocesses the first sensing signal to obtain a second sensing signal with higher signal quality, wherein inter-phase inductive interference of the first sensing signal can be reduced, the high-bandwidth amplifying circuit enhances driving, and then impedance matching is performed to obtain the second sensing signal. Finally, the second sensing signal may be analyzed by the signal analysis module 203, wherein a near-end external frequency measurement module may be selected for frequency analysis, and a far-end frequency test resource (such as a frequency analyzer) may also be selected for frequency analysis.

Step S303: and the circuit detection equipment determines the ith phase power supply circuit with a fault in the N phase power supply circuit according to the frequency abnormal signal.

Specifically, i is an integer greater than 0. For any phase power circuit, whether the phase power circuit fails in the working state can be judged by analyzing whether the frequency of the first induction signal is within a preset tolerance interval, and then the single-phase power circuit with a fault in the N-phase power circuit can be determined. For example, when the induction signal of the first-phase power supply circuit is analyzed, the signal frequency is found to be almost zero, so that the fault of the first-phase power supply circuit can be determined, then the first-phase power supply circuit can be intercepted in a failure mode, and the product quality is guaranteed.

By the method provided by the embodiment of the invention, the single-phase power circuit with the fault in the multi-phase power circuit can be stably tested in the working state of the multi-phase power circuit, so that the single-phase circuit with the fault can be intercepted in failure, the product quality is ensured, and the user experience is improved.

For describing the circuit detection method in the embodiment of the present application in more detail, next, taking the sensing strip as a capacitive probe as an example, please refer to fig. 4A, where fig. 4A is an exemplary flowchart of a circuit testing method based on a capacitive probe according to an embodiment of the present invention, in the diagram, after a single board (e.g., a multi-phase power circuit) is powered on through the capacitive probe 402 (the sensing strip 2011 in fig. 2B), a switching signal passing through an inductor in the multi-phase power circuit is sensed by using a capacitive sensing principle. Because the sensed signal amplitude has weak loading capacity and is greatly attenuated when being transferred to an ICT tester through a long wire, in the embodiment of the invention, the sensing signal can be firstly introduced into the signal processing module 202 through the twisted pair 403, so that the signal driving capability is improved, the signal is amplified, and the signal quality is improved. Then, the preprocessed signals can be connected to an interface pin 405 of a bottom frame of the ICT fixture through a switching pin 404 and a twisted pair 403, and the frequency measurement is performed by introducing test resources (frequency tester) of the ICT tester equipment into the fixture. Due to the fact that the extension line (2-3 m) is needed from the pre-processing of the signal to the introduction of the ICT equipment, the amplitude of the signal is reduced in the transmission process, or noise is more easily introduced. Therefore, in the embodiment of the present invention, an external frequency measurement module may also be reserved, and the preprocessed signal is directly introduced into the external frequency measurement module to complete the near-end frequency measurement, thereby reducing the above-mentioned influence caused by the long line. It should be noted that, in the embodiment of the present invention, it is determined whether the magnitude of the frequency measurement value is within the tolerance interval, and it is determined whether any single phase fails.

For describing the circuit detection method in the embodiment of the present application in more detail, next, taking an induction sheet as an example of a magnetic probe, please refer to fig. 4B, where fig. 4B is a flowchart of a circuit testing method based on a magnetic probe according to an embodiment of the present invention, in which a signal is induced by using the magnetic probe (e.g., a magnetic induction probe) after a single board (e.g., a multiphase power circuit) is powered on. The magnetic induction probe is required to use a probe for shielding an electric field or to use a hall element. Further, the external frequency measurement module directly connected to the upper cover of the fixture after passing through the signal processing module 202 may optionally be directly connected to the external frequency measurement module without passing through the signal processing module. The detailed process is as described above in detail in step S301 to step S303 in fig. 2A, and is not described herein too much.

It should be noted that, the strength of the signal induced by the magnetic probe is relatively high, and the induced interference is also relatively high, as shown in fig. 4C, fig. 4C is a schematic diagram of the first induced signal obtained based on the magnetic induction probe according to the embodiment of the present invention, and as the strength of the signal induced by the magnetic probe is relatively high, the interference that can be induced is also relatively high, and the signal is easily misdetected when directly accessing an ICT tester (frequency analyzer), so that the signal can be accessed to an external frequency measurement module for frequency domain analysis and measurement.

It should be noted that, a frequency domain analysis may be performed on the sensed signal (e.g., the first sensing signal), and for example, a fast fourier transform may be performed on the sensed signal to find a dominant frequency thereof. For example, as shown in fig. 4D, fig. 4D is a schematic frequency domain diagram of a first induction signal according to an embodiment of the present invention, in which the obtained first induction signal may be subjected to fast fourier transform to find a dominant frequency of the signal, and then frequency analysis is performed based on dominant frequency information, so as to determine whether the frequency of the signal is abnormal. Compared with the method for obtaining the first induction signal through the capacitive probe, the embodiment of the invention can acquire the signal without attaching the magnetic probe to a device, and the signal intensity is higher.

By the method provided by the embodiment of the invention, the single-phase power circuit with the fault in the multi-phase power circuit can be stably tested in the working state of the multi-phase power circuit, so that the single-phase circuit with the fault can be intercepted in a failure mode, the product quality is guaranteed, and the user experience is improved.

The method of the embodiments of the present invention is explained in detail above, and the related apparatus of the embodiments of the present invention is provided below.

Referring to fig. 5, fig. 5 is a schematic diagram of a circuit detection device provided by the present application according to an embodiment of the present invention, where the circuit detection device 50 may include a first acquisition unit 501, a first processing unit 502, and a second processing unit 503. Wherein the content of the first and second substances,

the first acquisition unit 501 is configured to obtain N first sensing signals based on a switching signal of each phase of power supply circuit in the N-phase power supply circuits, respectively, where one phase of power supply circuit corresponds to one first sensing signal; the frequency of a switching signal of each phase of power circuit is the same as that of the corresponding first induction signal; n is an integer greater than 0.

A first processing unit 502, configured to determine a frequency abnormal signal in the N first sensing signals based on the N first sensing signals.

A second processing unit 503, configured to determine, according to the frequency abnormality signal, an ith-phase power supply circuit in the N-phase power supply circuit that has a fault; i is an integer greater than 0.

In a possible implementation manner, the first acquisition unit 501 is specifically configured to: sensing a switching signal passing through a capacitor in each phase of power circuit through a sensing piece, and acquiring a signal generated by coupling the sensing piece and the capacitor to obtain a first sensing signal; the induction sheet comprises one or more of a capacitive probe and a magnetic probe.

In a possible implementation manner, the first processing unit 502 is specifically configured to: preprocessing the N first induction signals to obtain N second induction signals; and determining the frequency abnormal signal based on the second induction signal.

In a possible implementation manner, the first processing unit 502 is specifically configured to: and amplifying the N first sensing signals to enhance the signal drive of each first sensing signal in the N first sensing signals.

In a possible implementation manner, the first processing unit 502 is specifically configured to: and filtering the N first induction signals to eliminate interphase induction interference of each first induction signal in the N first induction signals.

In a possible implementation manner, the first processing unit 502 is specifically configured to: and performing impedance matching on the N first sensing signals to eliminate signal reflection interference of each first sensing signal in the N first sensing signals.

In a possible implementation manner, the first processing unit 502 is specifically configured to: respectively transmitting the N second induction signals to a frequency analyzer through a twisted pair, and respectively carrying out frequency analysis on the N second induction signals through the frequency analyzer; and determining a signal with abnormal frequency in the N second induction signals as the abnormal frequency signal.

In a possible implementation manner, the first processing unit 502 is specifically configured to: respectively sending the N second induction signals to an external detection module, and carrying out frequency analysis on the second induction signals through the external detection module; and determining a signal with abnormal frequency in the N second induction signals as the abnormal frequency signal.

It should be noted that, for the functions of each functional unit in the circuit detection apparatus 50 described in the embodiment of the present invention, reference may be made to the related description of step S301 to step S303 in the method embodiment described in fig. 2A, and details are not repeated here.

The present application provides a computer program, wherein the computer program includes instructions that, when executed by a computer, cause the computer to execute the circuit detection method of any one of the above-mentioned method embodiments.

The present application provides a circuit detection apparatus, comprising a processor and a memory, wherein the memory is configured to store program codes, and the processor is configured to call the program codes stored in the memory to enable the circuit detection apparatus to execute the circuit detection method described in any one of the above method embodiments.

The application provides a terminal device, which has the function of realizing the method in any one of the circuit detection method embodiments. The function can be realized by hardware, and can also be realized by executing corresponding software by hardware. The hardware or software includes one or more modules corresponding to the functions described above.

An embodiment of the present invention provides a computer program, which includes instructions that, when executed by a computer, enable the computer to execute the flow in the circuit detection method in any one of the above method embodiments.

The present application provides a computer-readable storage medium, which stores a computer program, when the computer program is executed by a processor, the computer program implements the circuit detection method flow described in any one of the above method embodiments.

In the foregoing embodiments, the descriptions of the respective embodiments have respective emphasis, and for parts that are not described in detail in a certain embodiment, reference may be made to the related descriptions of other embodiments.

It should be noted that for simplicity of description, the above-mentioned embodiments of the method are described as a series of acts, but those skilled in the art should understand that the present application is not limited by the described order of acts, as some steps may be performed in other orders or simultaneously according to the present application. Further, those skilled in the art should also appreciate that the embodiments described in the specification are preferred embodiments and that the acts and modules referred to are not necessarily required in this application.

In the embodiments provided in the present application, it should be understood that the disclosed apparatus may be implemented in other manners. For example, the above-described apparatus embodiments are merely illustrative, and for example, the division of the above-described units is only one type of logical functional division, and other division manners may be possible in actual implementation, for example, a plurality of units or components may be combined or may be integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection of some interfaces, devices or units, and may be an electric or other form.

The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.

In addition, functional units in the embodiments of the present application may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit can be realized in a form of hardware, and can also be realized in a form of a software functional unit.

The integrated unit may be stored in a computer-readable storage medium if it is implemented in the form of a software functional unit and sold or used as a separate product. Based on such understanding, the technical solution of the present application may be substantially implemented or a part of or all or part of the technical solution contributing to the prior art may be embodied in the form of a software product stored in a storage medium, and including several instructions for enabling a computer device (which may be a personal computer, a server, or a network device, and may specifically be a processor in the computer device) to execute all or part of the steps of the above-mentioned method of the embodiments of the present application. The storage medium may include: a U-disk, a removable hard disk, a magnetic disk, an optical disk, a Read-only memory (ROM) or a Random Access Memory (RAM), and other various media capable of storing program codes.

The above embodiments are only used for illustrating the technical solutions of the present application, and not for limiting the same; although the present application has been described in detail with reference to the foregoing embodiments, it should be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present application.

Claims

1. A circuit detection method, comprising:

respectively obtaining N first induction signals based on a switching signal of each phase of power supply circuit in the N-phase power supply circuits, wherein one phase of power supply circuit corresponds to one first induction signal; the switching signal of each phase of power supply circuit has the same frequency as the corresponding first induction signal; n is an integer greater than 0;

determining a frequency abnormal signal in the N first induction signals based on the N first induction signals;

determining the ith phase power supply circuit with a fault in the N phase power supply circuits according to the frequency abnormal signal; i is an integer greater than 0.

2. The method of claim 1, wherein obtaining N first sensing signals based on the switching signal of each of the N-phase power circuits respectively comprises:

sensing a switching signal passing through a capacitor in each phase of power circuit through a sensing piece, and acquiring a signal generated by coupling the sensing piece and the capacitor to obtain a first sensing signal; the induction sheet comprises one or more of a capacitive probe and a magnetic probe.

3. The method of claim 1 or 2, wherein said determining a frequency anomaly signal in said N first inductive signals based on said N first inductive signals comprises:

preprocessing the N first induction signals to obtain N second induction signals;

and determining the frequency abnormal signal based on the second induction signal.

4. The method of claim 3, wherein the pre-processing comprises: and amplifying the N first sensing signals to enhance the signal drive of each first sensing signal in the N first sensing signals.

5. The method of claim 4, wherein the pre-processing further comprises: and filtering the N first induction signals to eliminate interphase induction interference of each first induction signal in the N first induction signals.

6. The method of claim 4 or 5, wherein the pre-processing further comprises: and performing impedance matching on the N first sensing signals to eliminate signal reflection interference of each first sensing signal in the N first sensing signals.

7. The method of any one of claims 3-6, wherein said determining said frequency anomaly signal based on said second induced signal comprises:

respectively transmitting the N second induction signals to a frequency analyzer through a twisted pair, and respectively carrying out frequency analysis on the N second induction signals through the frequency analyzer;

and determining a signal with abnormal frequency in the N second induction signals as the abnormal frequency signal.

8. The method of any one of claims 3-6, wherein said determining the frequency anomaly signal based on the second induced signal comprises:

respectively sending the N second induction signals to an external detection module, and carrying out frequency analysis on the second induction signals through the external detection module;

9. A circuit testing apparatus, comprising:

the first acquisition unit is used for respectively obtaining N first induction signals based on a switching signal of each phase of power circuit in the N-phase power circuits, wherein one phase of power circuit corresponds to one first induction signal; the frequency of a switching signal of each phase of power circuit is the same as that of the corresponding first induction signal; n is an integer greater than 0;

the first processing unit is used for determining a frequency abnormal signal in the N first induction signals based on the N first induction signals;

the second processing unit is used for determining the ith phase power supply circuit with a fault in the N phase power supply circuit according to the frequency abnormal signal; i is an integer greater than 0.

10. The apparatus of claim 9, wherein the first acquisition unit is specifically configured to:

inducing a switching signal passing through a capacitor in each phase of power circuit by an induction sheet, and acquiring a signal generated by coupling the induction sheet and the capacitor to obtain a first induction signal; the induction sheet comprises one or more of a capacitive probe and a magnetic probe.

11. The apparatus according to claim 9 or 10, wherein the first processing unit is specifically configured to:

12. The apparatus as claimed in claim 11, wherein said first processing unit is specifically configured to: and amplifying the N first sensing signals to enhance the signal drive of each first sensing signal in the N first sensing signals.

13. The method of claim 4, wherein the first processing unit is specifically configured to: and filtering the N first induction signals to eliminate interphase induction interference of each first induction signal in the N first induction signals.

14. The method according to claim 4 or 5, wherein the first processing unit is specifically configured to: and performing impedance matching on the N first sensing signals to eliminate signal reflection interference of each first sensing signal in the N first sensing signals.

15. The method according to any of claims 3 to 6, wherein the first processing unit is specifically configured to:

16. The method according to any of claims 3 to 6, wherein the first processing unit is specifically configured to:

17. A computer program, characterized in that the computer program comprises instructions which, when executed by a computer, cause the computer to carry out the method according to any one of claims 1-8.

18. A circuit detection device comprising a processor and a memory, wherein the memory is configured to store program code and the processor is configured to invoke the program code stored by the memory to cause the circuit detection device to perform the method of any of claims 1-8.