CN115900797A

CN115900797A - Flat sensor detection system and flat sensor detection method

Info

Publication number: CN115900797A
Application number: CN202211076615.3A
Authority: CN
Inventors: 许肇驿; 陈彦宇; 黄正义
Original assignee: AU Optronics Corp
Current assignee: AU Optronics Corp
Priority date: 2022-04-26
Filing date: 2022-09-05
Publication date: 2023-04-04
Also published as: TW202341935A; TWI786016B

Abstract

A flat sensor detection method comprises the following steps: enabling a first driving circuit of the flat panel sensor and disabling a second driving circuit of the flat panel sensor under the condition that the flat panel sensor is irradiated by the light source, wherein the first driving circuit and the second driving circuit are used for providing a plurality of scanning signals to a plurality of scanning lines of a sensing panel of the flat panel sensor; obtaining a first sensing image generated by a sensing panel through a reading circuit; and comparing a plurality of first brightness values of a plurality of first areas in the first sensing image to identify at least one abnormal scanning line in the scanning lines.

Description

Flat sensor detection system and flat sensor detection method

Technical Field

The present disclosure relates to a technique for sensing the intensity of a light source to generate an image, and more particularly, to a system and method for detecting whether the assembly of a flat panel sensor is abnormal.

Background

A Flat panel sensor (Flat panel Detector) is a device that converts X-ray signals into electrical signals by using a photoelectric conversion technique and displays the intensity of the X-ray signals as digital images. Compared with the traditional negative film, the flat sensor has higher sensing degree, can shorten the time of exposing the human body to X-ray and reduce the radiation dose received by the human body. However, if the flat panel sensor is assembled with a deviation, the generated digital image may be erroneous, thereby affecting the interpretation result of the digital image.

Disclosure of Invention

The present disclosure relates to a flat panel sensor detection method, comprising the following steps: enabling a first driving circuit of the flat panel sensor and disabling a second driving circuit of the flat panel sensor under the condition that the flat panel sensor is irradiated by the light source, wherein the first driving circuit and the second driving circuit are used for providing a plurality of scanning signals to a plurality of scanning lines of a sensing panel of the flat panel sensor; obtaining a first sensing image generated by a sensing panel through a reading circuit; and comparing a plurality of first brightness values of a plurality of first areas in the first sensing image to identify at least one abnormal scanning line in the scanning lines.

The present disclosure also relates to a flat panel sensor detection system including a flat panel sensor and a processor. The flat panel sensor includes a sensing panel, a first driving circuit and a second driving circuit. The sensing panel is provided with a plurality of scanning lines. The first driving circuit is electrically connected with the first ends of the scanning lines. The second driving circuit is electrically connected with the second ends of the scanning lines. The processor is electrically connected to the flat panel sensor. Under the condition that the panel sensor is irradiated by the light source, the processor is used for enabling the first driving circuit and disabling the second driving circuit so as to obtain a first sensing image. The processor is further configured to compare a plurality of first luminance values of a plurality of first regions in the first sensing image to identify at least one abnormal scanning line in the plurality of scanning lines.

The present disclosure also relates to a flat panel sensor detection method, comprising the following steps: under the condition that the sensing panel of the flat panel sensor is irradiated by the light source, a first driving circuit of the flat panel sensor is driven to scan a plurality of scanning lines on the sensing panel so as to obtain a first sensing image; under the condition that the flat panel sensor is irradiated by the light source, a second driving circuit of the flat panel sensor is driven to scan the scanning lines on the sensing panel so as to obtain a second sensing image; and comparing the brightness of the first sensing image and the second sensing image to identify at least one abnormal scanning line in the scanning lines.

Therefore, different driving circuits are respectively driven to obtain the sensing image and perform brightness analysis, so that the abnormal position in the sensing image can be accurately identified, and the hardware assembly error on the panel sensor can be found.

Drawings

FIG. 1A is a schematic diagram of a flat panel sensor detection system in accordance with some embodiments of the present disclosure.

FIG. 1B is a schematic diagram of a flat panel sensor detection system in accordance with some embodiments of the present disclosure.

FIG. 2 is a flow chart illustrating steps of a flat panel sensor inspection method according to some embodiments of the present disclosure.

FIG. 3 is a schematic flow chart illustrating a process for generating a sensed image by a flat panel sensor according to some embodiments of the present disclosure.

FIG. 4A is a schematic diagram of a first sensed image generated by a flat panel sensor according to some embodiments of the present disclosure.

FIG. 4B is a schematic diagram of a second sensed image generated by a flat panel sensor according to some embodiments of the present disclosure.

FIGS. 5A-5C are schematic views of sensed images generated by a flat panel sensor according to some embodiments of the present disclosure.

FIG. 6 is a graph of X-ray dose versus image reading value for a flat panel sensor according to some embodiments of the present disclosure.

Detailed Description

In the following description, for purposes of explanation, numerous implementation details are set forth in order to provide a thorough understanding of the various embodiments of the present invention. It should be understood, however, that these implementation details are not to be interpreted as limiting the invention. That is, in some embodiments of the invention, such implementation details are not necessary. In addition, for the sake of simplicity, some conventional structures and elements are shown in the drawings.

When an element is referred to as being "connected" or "coupled," it can be referred to as being "electrically connected" or "electrically coupled. "connected" or "coupled" may also be used to indicate that two or more elements are in a coordinated operation or interaction with each other. Moreover, although terms such as "first," "second," and … are used herein to describe various elements, such terms are used only to distinguish elements or operations that are described in the same technical terms. Unless the context clearly dictates otherwise, the terms do not specifically refer or imply an order or sequence nor are they intended to limit the invention.

Fig. 1A and 1B are schematic diagrams of a flat panel sensor detection system according to some embodiments of the present disclosure. The flat panel sensor detection system includes a light source device L, a flat panel sensor 100, and a processor 200. The light source device L is used to generate a test light (e.g. X-ray) which will irradiate the flat sensor 100 after passing through the object or human body.

The flat panel sensor 100 includes a first driving circuit 110, a second driving circuit 120, a sensing panel 130, a reading circuit 140, and a control circuit 150. The sensing panel 130 has a plurality of rows (row) of scan lines SL and a plurality of columns (column) of data lines DL for driving a plurality of pixel units (not shown) on the sensing panel 130. In one embodiment, the sensing panel 130 may be a Thin Film Transistor image sensor panel (Thin Film Transistor image sensor panel), wherein the Thin Film Transistor may include amorphous silicon (amorphous silicon), low Temperature Polysilicon (LTPS), indium Gallium Zinc Oxide (IGZO), or others, but the disclosure is not limited thereto.

As shown in fig. 1A, in some embodiments, the flat panel sensor 100 further includes a Scintillator 131 (Scintillator). The scintillator 131 is disposed above the sensing panel 130, and is configured to receive the X-rays generated by the light source device L and convert the X-rays into visible light signals. Each pixel unit in the sensing panel 130 can convert a visible light signal into an electrical signal through a photoelectric element (e.g., a photodiode), and then output a sensing signal through a transistor. The sensing signal is used to reflect the intensity of the light source projected to the corresponding pixel unit.

The first driving circuit 110 and the second driving circuit 120 are respectively disposed at two sides of the sensing panel 130 and electrically connected to two ends of the scan line SL. In other words, the first driving circuit 110 is electrically connected to the first end of the scan line SL, and the second driving circuit 120 is electrically connected to the second end of the scan line SL. The first driving circuit 110 and the second driving circuit 120 can transmit scanning signals to sequentially drive each scanning line SL, so that the pixel units on the sensing panel 130 output corresponding sensing signals according to the voltages on the data lines DL and the electrical signals converted from the visible light signals. The "scan signal" may be a gate signal of a gate-on voltage level, such as a gate pulse signal. In the dual driving scheme, the first driving circuit 110 and the second driving circuit 120 provide the same gate pulse signal to both ends of the same scan line SL.

The reading circuit 140 is electrically connected to the data lines DL of the sensing panel 130 to provide voltages to the data lines or receive sensing signals generated by the pixel units of the sensing panel 130.

The control circuit 150 is electrically connected to the first driving circuit 110, the second driving circuit 120, the sensing panel 130 and the reading circuit 140, and is configured to drive the first driving circuit 110 and the second driving circuit 120 and receive the sensing signal through the reading circuit 140. The control circuit 150 may digitize all the sensing signals to generate image data corresponding to the intensity of light projected on the sensing panel 130. Since those skilled in the art can understand the principle of converting X-rays to generate images by the scintillator 131, further description is omitted here.

The processor 300 is electrically connected to the control circuit 150, and is configured to receive the image data, and determine whether there is an abnormality between the components of the flat panel sensor 100 by analyzing the image data. For example, if the bonding process between the first driving circuit 110, the second driving circuit 120 and the sensing panel 130 is not ideal, the image data generated by the flat panel sensor 100 may have noise or false images.

The present disclosure adjusts the detection method so that the flat panel sensor detection system can accurately identify whether the flat panel sensor 100 has a hardware assembly error. Fig. 2 is a flow chart illustrating a flat sensor detection method according to some embodiments of the present disclosure, which is described below with reference to fig. 1 and 2.

In step S201, the light source device L generates a test light (e.g., X-ray) to illuminate the sensing panel 130. In step S202, the control circuit 150 enables/drives the first driving circuit 110, but disables the second driving circuit 120 (or maintains the second driving circuit in a standby state), so that the first driving circuit 110 sequentially provides the scanning signal to each scanning line SL. At this time, the second driving circuit 120 is not driven, but the second driving circuit 120 maintains the scan line SL at a constant voltage according to the internal bias voltage. In other words, the first driving circuit 110 provides an enabling voltage (i.e., a scan signal) to the first ends of the scan lines SL, and the second driving circuit 120 fixes the second ends of the scan lines SL at a fixed voltage.

In step S203, the scan lines SL output sensing signals to the reading circuit 140, and the control circuit 150 receives the sensing signals corresponding to each pixel unit through the reading circuit 140 to generate a first sensing image.

Specifically, please refer to fig. 3, which illustrates a stage diagram of driving the flat panel sensor 130 to generate an image. Before providing the scan signal, the control circuit 125 controls the first driving circuit 121 to output a high voltage to the scan lines SL and then output a low voltage for performing a reset (clean) process P301. Then, the sensing panel 123 is irradiated by the light source in an exposure (exposure) process P302, and the first driving circuit 121 sequentially scans the scan lines SL. After the rest delay (front delay) procedure P303, the read circuit 124 receives the sensing signal to perform a read (Acquire) procedure P304. Finally, the control circuit 125 obtains the sensing signal in the transmission (data transfer) procedure P305 and generates the first sensing image.

In step S204, after the first sensing image is obtained, the control circuit 150 transmits the first sensing image to the processor 200 for analysis. The processor 200 compares the first luminance values of the plurality of first regions in the first sensing image to identify regions with abnormal luminance (e.g., the difference between the luminance and the overall average value is greater than a predetermined value). FIG. 4A is a schematic diagram of a first sensed image F1 according to some embodiments of the present disclosure. In one embodiment, the processor 200 divides a plurality of first regions on the first sensing image F1. For example: the length and the width of the sensing panel 130 are set corresponding to a side (left side of fig. 4A) of the first scanning circuit 110 to capture a plurality of first regions 401 to 404.

Next, the processor 200 compares the difference of each first brightness according to the first brightness of each first region 401 to 404 to find out a first abnormal region in the first region. As shown in fig. 4A, most of the first sensing image F1 has no pattern or line segment like the

first regions

401 and 402, but the

first regions

403 and 404 have black lines and white lines, respectively, so that the brightness of the

first regions

403 and 404 is significantly different from that of the other first regions (e.g., the first regions 401 and 402). Therefore, the processor 200 sets the

first regions

403, 404 as the first exception regions. According to the coordinates or positions of the

first regions

403 and 404 in the first sensing image F1, the processor 200 can further determine that the scan line SL (e.g., the 80 th scan line) at the corresponding position on the sensing panel 130 has an assembly error.

The foregoing steps S201 to S204 drive only the first driving circuit 110 to detect an abnormal scanning line. In other embodiments, in order to check the abnormal scan lines at different angles, the second driving circuit 120 is driven to detect through steps S205 to S207.

In step S205, under the condition that the light source device L also continuously irradiates the sensing panel 130, the control circuit 150 enables the second driving circuit 120, but disables the first driving circuit 110, so that the second driving circuit 120 sequentially provides the scanning signal to each scanning line SL. At this time, the first driving circuit 110 is not driven, but the first driving circuit 110 still maintains the scan line SL at a fixed voltage according to the internal bias voltage.

In step S206, the scan lines SL output the sensing signals to the reading circuit 140, and the control circuit 150 receives the sensing signals corresponding to each pixel unit through the reading circuit 140 to generate a second sensing image.

In step S207, after the second sensing image is obtained, the control circuit 150 transmits the second sensing image to the processor 200 for analysis. The processor 200 compares the second luminance values of the plurality of second regions 405-408 in the second sensing image to identify a region with abnormal luminance. As shown in FIG. 4B, the second area 407 has white lines, the second area 408 has black lines, and the brightness of the white lines is clearly separated from the brightness of the other second areas (e.g., the second areas 405 and 406), so the processor 200 can list the

second areas

407 and 408 as abnormal areas. Similarly, the processor 200 may determine the abnormal scan line according to the coordinates of the abnormal region.

In step S208, the processor 200 may compare the brightness of the first sensing image and/or the second sensing image to determine an abnormal region in the first sensing image and/or the second sensing image, so as to identify an abnormal scanning line. In other words, according to the first abnormal region found in the first sensing image F1 and the second abnormal region found in the second sensing image F2, the processor 200 can determine the abnormal scan line according to the coordinates of the "intersection" or "union" of the first abnormal region and the second abnormal region.

For example, as shown in fig. 4A and 4B, after the first abnormal region and the second abnormal region in the first sensing image F1 and the second sensing image F2 are identified, the processor 200 may determine whether the coordinates of the first abnormal region are the same as the coordinates of the second abnormal region. If the coordinates of the first abnormal region are the same as the coordinates of the second abnormal region (e.g., the first region 403 corresponds to the second region 407, and the first region 404 corresponds to the second region 408), the processor 200 further calculates an abnormal scan line according to the coordinates of the first abnormal region/the second abnormal region.

By driving the first driving circuit 110 and the second driving circuit 120 respectively, different sensing images are generated, and clear images of different sides of the sensing panel 300 can be seen respectively, so as to accurately identify possible assembly errors. FIGS. 5A-5C are actual inspection images according to some embodiments of the present disclosure. As can be clearly seen from the drawings, the first sensing image F1 and the second sensing image F2 have a plurality of regions ER with abnormal brightness respectively. The white line of the first sensing image F1 represents that the side (i.e., the left side) of the sensing panel 130 corresponding to the first scanning circuit 110 has a pressing error. On the other hand, the black line of the first sensing image F1 represents that the side (i.e. the right side) of the sensing panel 130 corresponding to the second scanning circuit 120 has a pressing error, because the second scanning circuit 120 does not provide the scanning signal at this time, and only the scanning line SL is fixed at the fixed voltage, a black line is formed.

In addition, in some embodiments, after the abnormal scan line is identified, the control circuit 150 may also simultaneously enable the first driving circuit 110 and the second driving circuit 120 to obtain a third sensing image through the reading circuit. Since the manner of generating the third sensed image F3 is similar to that of generating the first/second sensed images, it will not be repeated here.

In fig. 5C, the processor 200 compares the third brightness of the plurality of third areas on the third sensing image F3 to find an abnormal area (e.g., the area ER with the vertical white line in fig. 5C) with abnormal brightness, and further identifies the abnormal data line with stitching problem on the sensing panel 130.

Specifically, when comparing the luminance of a plurality of regions in the first sensed image F1, the second sensed image F2, and the third sensed image F3 to determine the region with abnormal luminance, the processor 200 may calculate the average luminance of all the regions as the "determination threshold". If the difference between the brightness of any one area and the threshold value exceeds a set value, the area can be determined to be an abnormal area. In other embodiments, the processor 200 may also set a fixed threshold as the determination threshold and the brightness value of each region for determination. Alternatively, the processor 200 may also use the median of the brightness values of all the regions as the determination threshold to identify the region with abnormal brightness.

In the foregoing embodiment, the flat panel sensor detection system is used for the processor 200 to identify the abnormal region and analyze the abnormal scan line. However, in other embodiments, the processor 200 may be integrated into the flat panel sensor 100. Alternatively, the aforementioned operations can be performed by the control circuit 150 of the flat panel sensor 100 without outputting to the processor 200.

In addition, the flat panel sensor inspection method in the foregoing embodiment is performed in the factory inspection stage of the flat panel sensor 100. In other embodiments, the flat panel sensor inspection method of the present disclosure can also be performed in the pixel inspection phase. In other words, when the flat panel sensor detection method is performed, the flat panel sensor 100 does not need to be provided with a scintillator, and the light source device L can directly project visible light to the sensing panel 130, so that the sensing panel 130 can still generate a corresponding sensing image through the internal optoelectronic devices. In other words, after performing the flat panel sensor detection method and confirming that the flat panel sensor 100 has no pressing or other hardware assembly problems, the manufacturer can mount the scintillator on the sensing panel 130.

Fig. 6 is a graph showing the relationship between the image reading values of the flat panel sensor 100 when the flat panel sensor receives different doses of X-rays (dose). In fig. 6, the curve approaching saturation (reading value about 60000) can be regarded as the highest dose (100%) of X-ray sensing. As shown, in the dose corresponding to the linear operation region LR, the X-ray dose intensity is linearly related to the image reading value. Although the higher the X-ray dose, the clearer the image, the shorter the lifetime of the components in the flat panel sensor 100. In some embodiments, the flat panel sensor detection system of the present disclosure can control the amount of X-ray projected by the light emitting device L (e.g., control the amount of X-ray to be less than 50%), and still clearly identify the abnormal scanning line, thereby achieving both the detection accuracy and the device lifetime.

Various elements, method steps or technical features of the foregoing embodiments may be combined with each other without limiting the order of description or presentation in the drawings.

While the foregoing is directed to embodiments of the present disclosure, other and further embodiments of the disclosure may be devised without departing from the basic scope thereof, and the scope thereof is determined by the claims that follow.

[ notation ] to show

L light source device

100 flat sensor

110 first drive circuit

120: second drive circuit

130 sensing panel

131 scintillator

140 read circuit

150 control circuit

200, processor

401-404 first area

405-408 second region

S201-S208 steps

F1 first sensing image

F2 second sensing image

F3 third sensed image

ER region

DL data line

SL scanning line

LR linear operating region

P301 reset procedure

P302 Exposure procedure

P303 standing delay program

P304 read procedure

P305. Transmission procedure.

Claims

1. A flat panel sensor detection method, comprising:

enabling a first driving circuit of the flat panel sensor and disabling a second driving circuit of the flat panel sensor under the condition that the flat panel sensor is irradiated by a light source, wherein the first driving circuit and the second driving circuit are used for providing a plurality of scanning signals to a plurality of scanning lines of a sensing panel of the flat panel sensor;

obtaining a first sensing image generated by the sensing panel through a reading circuit; and

comparing a plurality of first brightness values of a plurality of first areas in the first sensing image to identify at least one abnormal scanning line in the scanning lines.

2. The method of claim 1, wherein enabling the first driving circuit of the panel sensor and disabling the second driving circuit of the panel sensor comprises:

transmitting at least one enable voltage to a first end of at least one of the scan lines through the enabled first driving circuit; and

a second end of the at least one of the scan lines is fixed at a fixed voltage by the disabled second driving circuit.

3. The flat panel sensor testing method of claim 1, further comprising:

enabling the second driving circuit and disabling the first driving circuit to obtain a second sensing image through the reading circuit; and

comparing a plurality of second brightness values of a plurality of second areas in the second sensing image to identify the at least one abnormal scanning line in the scanning lines.

4. The flat panel sensor detection method of claim 1, further comprising:

an X-ray of the light source is converted into a visible light by a scintillator in the sensing panel.

5. The method of claim 1, wherein the comparing the first luminance values of the first regions in the first sensing image comprises:

comparing the differences among the first brightness values to find out at least one first abnormal area in the first areas;

obtaining a coordinate of the at least one first abnormal region in the first sensing frame to identify the at least one abnormal scanning line.

6. The flat panel sensor testing method of claim 1, further comprising:

enabling the first driving circuit and the second driving circuit at the same time to obtain a third sensing image through the reading circuit; and

comparing a plurality of third luminance values of a plurality of third regions in the third sensing image to identify at least one abnormal data line on the sensing panel.

7. A flat panel sensor detection system, comprising:

a plate sensor, comprising:

a sensing panel having a plurality of scan lines;

the first driving circuit is electrically connected with the first ends of the scanning lines; and

the second driving circuit is electrically connected with the second ends of the scanning lines; and

the processor is electrically connected with the panel sensor, and is used for enabling the first driving circuit and disabling the second driving circuit under the condition that the panel sensor is irradiated by a light source so as to obtain a first sensing image;

the processor is further configured to compare a plurality of first luminance values of a plurality of first regions in the first sensing image to identify at least one abnormal scanning line in the plurality of scanning lines.

8. The flat panel sensor detection system of claim 7, wherein the light source comprises an X-ray and the flat panel sensor further comprises a scintillator for converting the X-ray into a visible light.

9. The flat panel sensor detection system of claim 8, wherein the dose of X-rays is less than or equal to 50%.

10. The flat panel sensor detecting system according to claim 7, wherein the second driving circuit is configured to fix the second ends of the scan lines at a fixed voltage when the processor disables the second driving circuit.

11. The system of claim 7, wherein the processor is configured to compare the differences between the first luminance values to find the at least one first abnormal region in the first regions.

12. The flat panel sensor detecting system according to claim 11, wherein the processor is further configured to enable the second driving circuit and disable the first driving circuit to obtain a second sensing image; the processor is used for identifying the at least one abnormal scanning line in the scanning lines according to the first sensing image and the second sensing image.

13. The flat panel sensor detecting system according to claim 12, wherein the processor is further configured to compare a plurality of second luminance values of a plurality of second regions in the second sensing image to find at least one second abnormal region of the plurality of second regions, and the processor is configured to identify the at least one abnormal scanning line according to the coordinates of the at least one first abnormal region when the coordinates of the at least one first abnormal region are the same as the coordinates of the at least one second abnormal region.

14. A flat panel sensor detection method, comprising:

under the condition that a sensing panel of a flat panel sensor is irradiated by a light source, a first driving circuit of the flat panel sensor is driven to scan a plurality of scanning lines on the sensing panel so as to obtain a first sensing image;

under the condition that the flat panel sensor is irradiated by the light source, a second driving circuit of the flat panel sensor is driven to scan the scanning lines on the sensing panel so as to obtain a second sensing image; and

and comparing the brightness of the first sensing image and the second sensing image to identify at least one abnormal scanning line in the scanning lines.

15. The flat panel sensor testing method of claim 14, further comprising:

disabling the second driving circuit while driving the first driving circuit of the flat panel sensor; and

the first driving circuit is disabled while the second driving circuit of the flat panel sensor is driven.

16. The flat panel sensor detection method of claim 14, wherein the method of comparing the brightness of the first sensing image and the second sensing image comprises:

obtaining a plurality of first brightness values of a plurality of first areas in the first sensing image;

comparing the differences among the first brightness values to find out at least one first abnormal area in the first areas; and

the at least one abnormal scanning line is identified according to a coordinate of the at least one first abnormal region in the first sensing frame.

17. The flat panel sensor detection method of claim 16, wherein the method of comparing the brightness of the first sensing image and the second sensing image further comprises:

obtaining a plurality of second brightness values of a plurality of second areas in the second sensing image;

comparing the differences among the second brightness values to find out at least one second abnormal area in the second areas; and

under the condition that the coordinates of the at least one first abnormal area are the same as the coordinates of the at least one second abnormal area, the at least one abnormal scanning line is identified according to the coordinates of the at least one first abnormal area.

18. The flat panel sensor testing method of claim 14, further comprising:

projecting the light source through a light source device, wherein the light source comprises an X-ray, and the dosage of the X-ray is less than or equal to 50%.

19. The flat panel sensor testing method of claim 18, further comprising:

the X-ray of the light source is converted into a visible light by a scintillator in the sensing panel.

20. The flat panel sensor testing method of claim 14, further comprising:

simultaneously driving the first driving circuit and the second driving circuit;

obtaining a third sensing image generated by the sensing panel; and

comparing a plurality of third brightness values of a plurality of third areas in the third sensing image to identify at least one abnormal data line on the sensing panel.