CN115825621A - Device and method for testing TR (transmitter-receiver) assembly - Google Patents

Abstract

The invention relates to a TR component testing technology, and discloses a device and a method for testing a TR component. The invention integrates single module power supply and independent temperature control modes, realizes direct current loading of the DUT and independent control of the DUT temperature platform, and reduces the interference between stations as much as possible; the radio frequency output of a plurality of TR components is connected to the same attenuator by adopting a microwave load time-sharing multiplexing technology, and the radio frequency output of each channel of each TR component is detected by a program control mode of a wave control signal, so that the reliability test requirement of low cost and full coverage detection is met.

Description

Device and method for testing TR (transmitter-receiver) assembly

Technical Field

The invention relates to a TR component testing technology, in particular to a device and a method for testing a TR component.

Background

At present, in the field of radio frequency testing, in order to complete the performance test of a single TR component, a test line is established through expensive test instruments or equipment. With the application and popularization of the third generation of semiconductors, the inherent reliability and process improvement of the third generation of semiconductors require a large number of reliability screening tests. In the reliability test, due to the multi-station characteristic, the use of expensive test instruments is not suitable. In order to further reduce the test cost, the invention provides a test circuit with time division multiplexing. .

Disclosure of Invention

The invention provides a device and a method for testing a TR component, aiming at the problem of high cost in testing a radio frequency device in the prior art.

In order to solve the technical problem, the invention is solved by the following technical scheme:

a testing device for a TR component comprises a dot frequency signal source, a power distribution network, a plurality of groups of isolators, a plurality of groups of DUT units, a plurality of groups of combiners, a plurality of groups of input detectors, a plurality of groups of output detectors and a main control module; the isolator, the DUT unit, the combiner and the input detector are mutually corresponding; the device is characterized by also comprising a wave control module;

the dot frequency signal source provides a power supply signal to the power distribution network, the power distribution network performs power equalization on the received signal, and transmits the equalized power to the input detector;

the input detector reads input power, dynamically adjusts the output power of the signal source, and transmits the adjusted signal to the isolator and the main control module;

the isolator carries out isolation protection on input signals and transmits the isolated signals to the DUT unit;

the DUT unit collects and detects data, transmits the detected data to the main control module and the combiner, and simultaneously the wave control module sends a control signal to the DUT unit to control the output of the DUT unit;

the combiner simultaneously receives the signals of the DUT units for attenuation output and transmits the attenuated signals to the output detector;

the output detector reads the output signal source power, outputs the detector and transmits the output power signal to the main control module; the main control module sends a control signal to the wave control module, and the wave control module sends a synchronous signal to the output detector according to the received control signal.

Preferably, the point-frequency signal source and the power distribution network are connected through a SMAJJ radio frequency joint; the isolator is of a SMAJK type and is directly arranged on the input detector; the power distribution network is connected with the input detector and the combiner is connected with the output detector through a high-frequency semi-rigid radio frequency cable assembly; and high-frequency semi-flexible radio frequency cable assemblies are adopted for connection between the isolator and the DUT and between the DUT and the combiner.

Preferably, the wave control module comprises an FPGA unit and a driving module, wherein the FPGA unit is used for generating time sequence control signals of time division multiplexing, and the driving module is used for generating TTL signals and differential signals; and the time sequence control signal, the TTL signal and the differential signal are connected with the TR component and the output detector through a high-speed signal wire harness.

Preferably, the main control module is connected with the dot frequency signal source, the input detector and the output detector in series through a DB9 core plug, and the main control module is connected with the TR component and the DUT unit through high-voltage high-current lines.

Preferably, the dot frequency signal source is a DC3-10 interface, and the communication interface of the dot frequency signal source is RJ485; the communication interface end of the dot frequency signal source is provided with current-limiting resistors R21, R22, R31 and R33, protective TVS tubes V3 and V4 and voltage-stabilizing diodes V7 and V8; the input end of the dot frequency signal source carries out filtering and overshoot suppression through an inductor L2 and a capacitor, a stable power supply is provided through a three-terminal regulator D1, and the output end of the three-terminal regulator is connected with a fuse F1.

Preferably, the DUT unit comprises a VD/VG power supply unit and a heating platform; the VD/VG power supply unit is used for providing power to the DUT unit, the heating platform heats the tested device, and the heating platform comprises a temperature sampling unit, a heating control unit and a heat dissipation control unit; the temperature sampling unit is used for collecting the temperature of the testing device, the heating control unit is used for controlling the heating of the testing device, and the heat dissipation control unit is used for controlling the heat dissipation of the heating platform.

Preferably, the heating platform comprises a temperature sampling unit which is an isolated temperature sampling unit and comprises a DC/DC power supply module and a temperature sampling module, wherein the DC/DC power supply module provides power to the temperature sampling module, and the temperature sampling module is used for collecting temperature; a diode V701 is connected in series with the output end Vout end of the DC/DC power supply module; the other end of the diode V701 is connected to a filter circuit, which includes an inductor L701 and a capacitor C701.

Preferably, the heating control unit comprises a heating resistor control unit, the resistor control unit comprises a triode Q1, a control signal of the main control unit is connected with the base electrode of the triode Q1 through a protective resistor R1 and a filter capacitor C1, the amplification function of the triode Q1 is realized, and a +12V switching control signal is provided; the signal of the triode Q1 is divided by the resistor R3 and the grounding resistor R4, so that the switching work of the low-internal-resistance MOS tube Q2 is realized.

Preferably, the heat dissipation control unit comprises a triode Q3, a control signal of the main control unit is connected with a base electrode of the triode Q3 through a protective resistor R5 and a filter capacitor C3, the amplification function of the triode Q3 is realized, and a +12V switching control signal is provided; the signal of the triode Q3 is divided by the resistor R7 and the grounding resistor R8, so that the switching work of the low-internal-resistance MOS tube Q4 is realized.

In order to solve the above technical problem, the present invention further provides a test method for a TR module, which includes the test apparatus for a TR module, and the implementation method includes:

the master control module receives an aging command;

the TR component carries out direct current power supply;

the TR component is in a time division multiplexing state, and the TR component is in the time division multiplexing state by sending a wave control signal and a control signal to the TR component;

a dot frequency signal source generates a radio frequency signal;

controlling the temperature of the DUT unit through a PID algorithm;

the output and control of the radio frequency is controlled by polling the input detector

The design of the invention achieves the following technical effects:

the invention realizes the low-cost and multi-station reliability test, and the system adopts a dot frequency signal source, a common network, an input/output detector and a wave control module to realize the loading and the test of the radio frequency signal. Meanwhile, the system integrates single module power supply and independent temperature control modes, direct current loading of the DUT and independent control of the DUT temperature platform are achieved, and interference among stations is reduced as much as possible. Each drawer is also provided with a main control module which is responsible for the control and data detection of each module in the unit drawer, and the self-adaptive control of the input power of the device, the loading of direct-current voltage, the temperature control platform, the DUT junction temperature and the wave control signal control of the TR component is realized through the linkage control of programs, so that the test requirements of the DUT in various modes are met. The system adopts a microwave load time-sharing multiplexing technology to realize that the radio frequency outputs of a plurality of TR components are connected to the same attenuator, and simultaneously realizes the detection of the radio frequency output of each channel of each TR component through a program control mode of a wave control signal, thereby realizing the reliability test requirements of low cost and full detection coverage.

The test device is used for the reliability test of the TR component or the power device meeting a certain time sequence control;

the invention is connected with a definable wave control module, meets the control of the DUT work and the time-sharing multiplexing time sequence control, simultaneously outputs a control signal and carries out time-sharing detection on an output wave detector;

the output of the TR component can be simultaneously connected to the same combiner, so that the using number of the combiners is reduced, and the cost is reduced;

the invention realizes test data digitization by connecting the main control module to centralized monitoring software.

Drawings

FIG. 1 is a system block diagram of the present invention;

FIG. 2 is a circuit diagram of the DC/DC power supply module of the present invention;

FIG. 3 is a circuit diagram of a resistance control unit of the present invention;

FIG. 4 is a circuit diagram of a heat dissipation control unit of the present invention;

FIG. 5 is a circuit diagram of a VD/VG power supply unit of the invention;

FIG. 6 is a timing waveform diagram of the present invention;

FIG. 7 is a circuit diagram of the communication interface protection circuit of the dot frequency signal source of the present invention;

FIG. 8 is a circuit diagram of the power supply protection circuit of the dot frequency signal source of the present invention;

FIG. 9 is a circuit diagram of a dot frequency signal source interface of the present invention;

FIG. 10 is a circuit diagram of the output of the wave control signal gate of the wave control module of the present invention;

FIG. 11 is a circuit diagram of the wave control signal output driver of the wave control module of the present invention;

fig. 12 is a circuit diagram of the timing switching of the wave control signal of the present invention.

Wherein, TR: transmitter and Receiver, the transceiver component;

DUT: device Under Test, device Under Test;

SMA: subMiniature Version a, subMiniature class a radio frequency interface;

FPGA: fieldProgrammableGateArray, field programmable gate array;

TTL: transistor-Transistor Logic, two Transistor Logic level;

VDVG: voltage of drain, gate Voltage;

DCDC: direct Current Converter;

PID: proportionality integral derivative;

MOS: metal-Oxide-Semiconductor, metal-Oxide-Semiconductor.

Detailed Description

The present invention will be described in further detail with reference to the accompanying drawings and examples.

Example 1

A testing device for a TR component is shown in figure 1 and comprises a dot frequency signal source, a power distribution network, a plurality of groups of isolators, a plurality of groups of DUT units, a plurality of groups of combiners, a plurality of groups of input detectors, a plurality of groups of output detectors and a main control module; the isolator, the DUT unit, the combiner and the input detector are mutually corresponding; the device is characterized by also comprising a wave control module;

the dot frequency signal source provides a power supply signal to the power distribution network, the power distribution network performs power equalization on the received signal, and transmits the equalized power to the input detector;

the input detector reads input power, dynamically adjusts the output power of the signal source, and transmits the adjusted signal to the isolator and the main control module;

the isolator carries out isolation protection on input signals and transmits the isolated signals to the DUT unit;

the DUT unit collects and detects data, transmits the detected data to the main control module and the combiner, and simultaneously the wave control module sends a control signal to the DUT unit to control the output of the DUT unit;

the combiner simultaneously receives the signals of the DUT units for attenuation output and transmits the attenuated signals to the output detector;

the output detector reads the output signal source power, outputs the detector and transmits the output power signal to the main control module; the main control module sends a control signal to the wave control module, and the wave control module sends a synchronous signal to the output detector according to the received control signal. The point frequency signal source is connected with the power distribution network through the SMAJJ radio frequency joint; the isolator is of a SMAJK type and is directly arranged on the input detector; the power distribution network is connected with the input detector and the combiner is connected with the output detector through a high-frequency semi-rigid radio frequency cable assembly; and high-frequency semi-flexible radio frequency cable assemblies are adopted for connection between the isolator and the DUT and between the DUT and the combiner.

The SMAJK type isolator is selected, the isolator is conveniently and directly installed on the input detector, power loss is reduced, and meanwhile impedance matching degree is improved. The 2 places are connected by adopting high-frequency semi-rigid radio frequency cable components between the power distribution network and the input detector and between the attenuator and the output detector, so that the cost can be reduced while the performance and the assembly process are ensured; high-frequency semi-flexible radio frequency cable assemblies are adopted to connect between the isolator and the DUT and between the DUT and the attenuator in the 2 places, so that the operation of customers is convenient.

Fig. 10 to 12 illustrate a ripple control module including an FPGA unit for generating time-division multiplexed timing control signals, and a driving module for generating TTL signals and differential signals; and the time sequence control signal, the TTL signal and the differential signal are connected with the TR component and the output detector through a high-speed signal wire harness.

The main control module is connected with the dot frequency signal source, the input detector and the output detector in series through a DB9 core plug, and is connected with the TR component and the DUT unit through a high-voltage high-current line.

In fig. 7 to 9, the dot frequency signal source is a DC3-10 interface, and the communication interface of the dot frequency signal source is RJ485; the communication interface end of the dot frequency signal source is provided with current limiting resistors R21, R22, R31 and R33, protective TVS tubes V3 and V4 and voltage stabilizing diodes V7 and V8; the input end of the dot frequency signal source carries out filtering and overshoot suppression through an inductor L2 and a capacitor, a stable power supply is provided through a three-terminal regulator D1, and the output end of the three-terminal regulator is connected with a fuse F1.

Example 2

On the basis of the embodiment 1, the DUT unit of the embodiment comprises a VD/VG power supply unit and a heating platform; the VD/VG power supply unit is used for providing power to the DUT unit, the heating platform heats a tested device, and the heating platform comprises a temperature sampling unit, a heating control unit and a heat dissipation control unit; the temperature sampling unit is used for collecting the temperature of the testing device, the heating control unit is used for controlling the heating of the testing device, and the heat dissipation control unit is used for controlling the heat dissipation of the heating platform.

The heating platform comprises a temperature sampling unit which is an isolated temperature sampling unit and comprises a DC/DC power supply module and a temperature sampling module, wherein the DC/DC power supply module provides power to the temperature sampling module, and the temperature sampling module is used for acquiring temperature in figure 2; a diode V701 is connected in series with the output end Vout end of the DC/DC power supply module; the other end of the diode V701 is connected with a filter circuit, and the filter circuit comprises an inductor L701 and a capacitor C701.

The heating control unit comprises a heating resistor control unit, the resistor control unit in fig. 3 comprises a triode Q1, a control signal of the main control unit is connected with the base electrode of the triode Q1 through a protective resistor R1 and a filter capacitor C1, the amplification function of the triode Q1 is realized, and a +12V switch control signal is provided; the signal of the triode Q1 is divided by the resistor R3 and the grounding resistor R4, so that the switching work of the MOS tube Q2 with low internal resistance is realized.

In fig. 4, the heat dissipation control unit includes a transistor Q3, and a control signal of the main control unit is connected to a base of the transistor Q3 through a protection resistor R5 and a filter capacitor C3, so as to implement an amplification function of the transistor Q3 and provide a +12V switching control signal; the signal of the triode Q3 is divided by the resistor R7 and the grounding resistor R8, so that the switching work of the MOS tube Q4 with low internal resistance is realized.

Example 3

On the basis of the above embodiment, the embodiment is a method for testing a TR component, and the implementation method includes:

after receiving an upper computer software start aging command, the main control module firstly starts direct current power supplies VG, VD, VCC and the like for 4T/R assemblies, then sends a wave control signal and a work control signal to the T/R assemblies, so that the T/R assemblies are in a normal time division multiplexing working state, then sends working frequency and power to a signal source, and outputs correct radio frequency signals. And finally, performing a PID algorithm to provide a constant temperature platform. Since the attenuator and the output detector are common components, the output detector must be controlled for effective range, the rf control of its 4T/R components must satisfy time-staggered control, and the effective range of the output detector is controlled and output rf power read in a round-robin fashion. The waveform diagrams of the wave control signal and the wave detector control signal are shown in FIG. 6.

Claims (10)

1. A testing device for a TR component comprises a dot frequency signal source, a power distribution network, a plurality of groups of isolators, a plurality of groups of DUT units, a plurality of groups of combiners, a plurality of groups of input detectors, a plurality of groups of output detectors and a main control module; the isolator, the DUT unit, the combiner and the input detector are mutually corresponding; the device is characterized by also comprising a wave control module;

the dot frequency signal source provides a power supply signal to the power distribution network, the power distribution network performs power equalization on the received signal, and transmits the equalized power to the input detector;

the input detector reads input power, dynamically adjusts the output power of the signal source, and transmits the adjusted signal to the isolator and the main control module;

the isolator carries out isolation protection on input signals and transmits the isolated signals to the DUT unit;

the DUT unit collects and detects data, transmits the detected data to the main control module and the combiner, and simultaneously the wave control module sends a control signal to the DUT unit to control the output of the DUT unit;

the combiner simultaneously receives the signals of the DUT units for attenuation output and transmits the attenuated signals to the output detector;

the output detector reads the output signal source power, outputs the detector and transmits the output power signal to the main control module; the main control module sends a control signal to the wave control module, and the wave control module sends a synchronous signal to the output detector according to the received control signal.

2. The device for testing the TR component of claim 1, wherein the point frequency signal source and the power dividing network are connected through a SMAJJ radio frequency connector; the isolator is of a SMAJK type and is directly arranged on the input detector; the power distribution network is connected with the input detector and the combiner is connected with the output detector through a high-frequency semi-rigid radio frequency cable assembly; and high-frequency semi-flexible radio frequency cable assemblies are connected between the isolator and the DUT and between the DUT and the combiner.

3. The device for testing the TR component according to claim 1, wherein the wave control module comprises an FPGA unit and a driving module, the FPGA unit is used for generating time-division multiplexed timing control signals, and the driving module is used for generating TTL signals and differential signals; and the time sequence control signal, the TTL signal and the differential signal are connected with the TR component and the output detector through a high-speed signal wire harness.

4. The device for testing the TR module of claim 1 wherein the master control module is connected in series with the dot frequency signal source, the input detector and the output detector through a DB9 plug, and the master control module is connected to the TR module and the DUT unit through high voltage high current lines.

5. The device for testing the TR component as claimed in claim 1, wherein the dot frequency signal source is a DC3-10 interface, and the communication interface of the dot frequency signal source is RJ485; the communication interface end of the dot frequency signal source is provided with current limiting resistors R21, R22, R31 and R33, protective TVS tubes V3 and V4 and voltage stabilizing diodes V7 and V8; the input end of the dot frequency signal source carries out filtering and overshoot suppression through an inductor L2 and a capacitor, a stable power supply is provided through a three-terminal voltage stabilizer D1, and the output end of the three-terminal voltage stabilizer is connected with a fuse F1.

6. The device for testing the TR component of claim 1, wherein the DUT unit comprises a VD/VG power supply unit and a heating platform; the VD/VG power supply unit is used for providing power to the DUT unit, the heating platform heats the tested device, and the heating platform comprises a temperature sampling unit, a heating control unit and a heat dissipation control unit; the temperature sampling unit is used for collecting the temperature of the testing device, the heating control unit is used for controlling the heating of the testing device, and the heat dissipation control unit is used for controlling the heat dissipation of the heating platform.

7. The TR component testing device according to claim 4, wherein the heating platform comprises a temperature sampling unit which is an isolated temperature sampling unit and comprises a DC/DC power supply module and a temperature sampling module, the DC/DC power supply module supplies power to the temperature sampling module, and the temperature sampling module is used for collecting temperature; a diode V701 is connected in series with the output end Vout end of the DC/DC power supply module; the other end of the diode V701 is connected to a filter circuit, which includes an inductor L701 and a capacitor C701.

8. The TR component testing device as claimed in claim 4, wherein the heating control unit comprises a heating resistor control unit, the resistor control unit comprises a triode Q1, a control signal of the main control unit is connected with the base of the triode Q1 through a protection resistor R1 and a filter capacitor C1, the amplification function of the triode Q1 is realized, and a +12V switching control signal is provided; the signal of the triode Q1 is divided by the resistor R3 and the grounding resistor R4, so that the switching work of the MOS tube Q2 with low internal resistance is realized.

9. The device for testing the TR component as claimed in claim 4, wherein the heat dissipation control unit comprises a triode Q3, a control signal of the main control unit is connected with a base electrode of the triode Q3 through a protective resistor R5 and a filter capacitor C3, so that the amplifying function of the triode Q3 is realized, and a +12V switching control signal is provided; the signal of the triode Q3 is divided by the resistor R7 and the grounding resistor R8, so that the switching work of the MOS tube Q4 with low internal resistance is realized.

10. A method for testing a TR module, comprising a device for testing a TR module as claimed in any one of claims 1 to 9, the method comprising:

the master control module receives an aging command;

the TR component carries out direct current power supply;

the TR component is in a time division multiplexing state, and the TR component is in the time division multiplexing state by sending a wave control signal and a control signal to the TR component;

the dot frequency signal source generates a radio frequency signal;

controlling the temperature of the DUT unit through a PID algorithm;

and the radio frequency is output and controlled by polling the input detector.

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