CN115822564B - Sleeve thickness measuring method and device, electronic equipment and computer storage medium - Google Patents
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Abstract
The invention discloses a sleeve thickness measuring method, a sleeve thickness measuring device, electronic equipment and a computer storage medium, and relates to the technical field of wellbore integrity evaluation in oil and gas exploration and development. Wherein the method comprises the following steps: acquiring ultrasonic pulse echo data of a sleeve at a preset azimuth of a preset depth point in a preset depth interval of a well hole, determining a frequency search interval and a group delay curve according to the ultrasonic pulse echo data, performing frequency scanning on the group delay curve in the frequency search interval to determine the resonance frequency of the sleeve, and determining the thickness of the sleeve according to the resonance frequency, so that a noise frequency point and a frequency doubling point can be eliminated, the real sleeve resonance frequency is acquired, and the thickness calculation accuracy of the sleeve is improved.
Description
Technical Field
The invention relates to the technical field of wellbore integrity evaluation in oil and gas exploration and development, in particular to a casing thickness measuring method, a casing thickness measuring device, electronic equipment and a computer storage medium.
Background
In the development and production process of oil and gas fields, a casing is generally configured in a borehole to protect the borehole from the influence of formation pressure, prevent borehole collapse and support the borehole wall. In addition, the device is also a channel for conveying oil gas, and ensures the normal operation of the whole oil-gas field production. Under the action of ground stress, the sleeve is influenced by complex stress such as pressure, pulling, torsion and the like, so that the sleeve is deformed; in addition, the casing may be corroded due to chemical effects in the fluids inside and outside the well. Once the casing itself is damaged for some reason, it may lead to a reduction in production of the whole well, even to rejection. Thus, evaluating and monitoring corrosion of casing is an important tool to maintain casing integrity, and thickness measurements of casing provide an important basis for casing integrity and well abandonment.
As shown in FIG. 1, an ultrasonic pulse reflection method well logging schematic diagram is shown, wherein a well hole, a sleeve, a cement sheath and a stratum are sequentially arranged from inside to outside, and a probe, namely a scanning head, of an ultrasonic pulse reflection echo well logging instrument is positioned in the center of the well hole. When the ultrasonic pulse reflection echo logging instrument works, the transmitting transducer transmits a probe to excite an ultrasonic pulse signal, and the ultrasonic pulse signal propagates in the fluid and then enters the inner wall of the casing. Wherein most of the sound wave energy is reflected back and received by the transmitting transducer, namely the reflected wave signal of the inner wall of the sleeve. The remaining sonic energy enters the casing, and sonic signals are reflected multiple times at the casing/cement sheath interface and received by the transmitting transducer, which is the casing resonant wave signal. The casing thickness can be estimated using the casing resonant frequency and the longitudinal wave propagation velocity of the acoustic wave in the casing.
As shown in fig. 2, the reflected echo signal of the ultrasonic pulse is normal, as can be seen from fig. 2, for the reflected echo signal of the ultrasonic pulse emitted by the noise-free or narrowband emitting transducer, the signal in the time interval T1-T2 is the reflected wave signal of the inner wall of the casing, and the signal in the time interval T2-T3 is the casing resonance wave signal. In fig. 3, the spectrum of the ultrasonic pulse reflected wave and the resonance wave is analyzed, and it can be seen that only one type of the resonance wave signal of the sleeve in the frequency range is matched with the frequency corresponding to the recess of the full wave spectrum. The frequency dip in the full wave represents the casing into which a portion of the energy of the ultrasonic wave enters, resulting in energy loss. Since the resonant wave signal mode is single, the casing thickness can be calculated from the resonant frequency and the longitudinal wave velocity.
Whereas for the ultrasonic pulse reflection echo shown in fig. 4, the sleeve range that can be measured is wider due to the influence of noise signals in actual measurement or the wider frequency band of the transmitting transducer. However, in this case, the resonant mode of the sleeve may not be uniform, and not only the fundamental frequency resonant wave but also the frequency multiplication resonant wave signal may be obtained, so that a plurality of recesses may be observed in the full-wave spectrum, and the sleeve resonant wave frequency spectrum of the echo signal may have a plurality of peaks, so that it is difficult to find the true fundamental frequency sleeve resonant wave, and thus it is difficult to calculate the thickness of the sleeve by the above method.
Disclosure of Invention
The present invention has been made in view of the above-mentioned problems, and provides a sleeve thickness measuring method, apparatus, electronic device, and computer storage medium that overcome or at least partially solve the above-mentioned problems.
According to an aspect of the present invention, there is provided a sleeve thickness measuring method comprising:
acquiring ultrasonic pulse echo data of a casing at a preset azimuth of a preset depth point in a preset depth interval of a borehole;
determining a frequency search interval and a group delay curve according to the ultrasonic pulse echo data;
frequency scanning the group delay curve in the frequency searching interval to determine the resonance frequency of the sleeve;
and determining the thickness of the sleeve according to the resonance frequency.
According to another aspect of the present invention, there is provided a sleeve thickness measuring device comprising:
the ultrasonic data acquisition module is used for acquiring ultrasonic pulse echo data of the casing at a preset azimuth of a preset depth point in a preset depth interval of the well;
the frequency interval and group delay curve determining module is used for determining a frequency searching interval and a group delay curve according to the ultrasonic pulse echo data;
the frequency scanning module is used for carrying out frequency scanning on the group delay curve in the frequency searching interval to determine the resonance frequency of the sleeve;
and the thickness determining module is used for determining the thickness of the sleeve according to the resonance frequency.
According to another aspect of the present invention, there is provided an electronic apparatus including: the device comprises a processor, a memory, a communication interface and a communication bus, wherein the processor, the memory and the communication interface complete communication with each other through the communication bus;
the memory is used for storing at least one executable instruction, and the executable instruction enables the processor to execute the operation corresponding to the sleeve thickness measuring method.
According to another aspect of the present invention, there is provided a computer storage medium having stored therein at least one executable instruction for causing a processor to perform operations corresponding to the sleeve thickness measurement method of the present invention.
According to the casing thickness measuring method, the electronic equipment and the computer storage medium disclosed by the invention, through acquiring ultrasonic pulse echo data of the casing at the preset azimuth of the preset depth point in the preset depth interval of the well, determining a frequency searching interval and a group delay curve according to the ultrasonic pulse echo data, performing frequency scanning on the group delay curve in the frequency searching interval to determine the resonance frequency of the casing, and determining the thickness of the casing according to the resonance frequency, thereby eliminating noise frequency points and frequency doubling points, acquiring real casing resonance frequency and further improving the thickness calculating accuracy of the casing.
The foregoing description is only an overview of the present invention, and is intended to be implemented in accordance with the teachings of the present invention in order that the same may be more clearly understood and to make the same and other objects, features and advantages of the present invention more readily apparent.
Drawings
Various other advantages and benefits will become apparent to those of ordinary skill in the art upon reading the following detailed description of the preferred embodiments. The drawings are only for purposes of illustrating the preferred embodiments and are not to be construed as limiting the invention. Also, like reference numerals are used to designate like parts throughout the figures. In the drawings:
FIG. 1 shows a schematic diagram of an ultrasonic pulse reflectometry well logging provided in accordance with the prior art of the present invention;
FIG. 2 shows a schematic diagram of a normal ultrasonic pulse reflection echo signal provided in accordance with the prior art of the present invention;
FIG. 3 is a schematic diagram of an ultrasonic pulse reflection echo signal and resonant wave frequency spectrum provided according to the prior art of the present invention;
FIG. 4 is a schematic diagram of a broadband ultrasonic pulse reflection echo signal provided in accordance with the prior art of the present invention;
FIG. 5 is a schematic flow chart of a method for measuring thickness of a sleeve according to a first embodiment of the invention;
fig. 6 is a schematic diagram showing a spectrum of an ultrasonic pulse reflection echo signal of an inner wall of a casing in a method for measuring thickness of a casing according to a first embodiment of the present invention;
fig. 7 is a schematic diagram of a full-wave spectrum and a group delay curve of an ultrasonic pulse reflection echo signal of a casing inner wall in a casing thickness measurement method according to a first embodiment of the present invention;
fig. 8 is a schematic flow chart of a method for measuring thickness of a sleeve according to a second embodiment of the present invention;
fig. 9 shows a thickness imaging schematic diagram of a sleeve in a preset depth interval in a sleeve thickness measurement method according to a second embodiment of the present invention;
fig. 10 is a schematic structural view of a sleeve thickness measuring device according to a third embodiment of the present invention;
fig. 11 is a schematic structural diagram of an electronic device according to a fifth embodiment of the present invention.
Detailed Description
Exemplary embodiments of the present invention will be described in more detail below with reference to the accompanying drawings. While exemplary embodiments of the present invention are shown in the drawings, it should be understood that the present invention may be embodied in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the invention to those skilled in the art.
Example 1
Fig. 5 shows a flowchart of a method for measuring thickness of a sleeve according to a first embodiment of the present invention. The execution main body of the embodiment is the casing thickness measuring device provided by the embodiment of the invention, the device can be realized by software or hardware, and the device can be integrated in an ultrasonic pulse reflection method logging instrument. As shown in fig. 5, the method includes:
and S11, acquiring ultrasonic pulse echo data of the casing at a preset azimuth of a preset depth point in a preset depth interval of the well.
The preset depth interval is a measurement interval of a well hole position, for example, a measurement interval of 500-2000 meters in the well hole, the preset depth point is a specific position in the well hole, for example, a position of 600 meters in the well hole, ultrasonic pulse echo data of the casing at a plurality of positions can be obtained by scanning the well logging instrument for one circle at the position, the ultrasonic pulse echo data of the casing at any position is obtained and is taken as the ultrasonic pulse echo data of the casing at the preset position, and the ultrasonic pulse echo data is specifically the ultrasonic pulse echo signal.
Step S12, determining a frequency search interval and a group delay curve according to the ultrasonic pulse echo data.
Specifically, the ultrasonic pulse echo data is subjected to spectrum analysis, and a frequency search interval is determined according to the obtained spectrum curve, wherein the frequency search interval comprises a sampling frequency corresponding to the maximum amplitude of the waveform and also comprises a resonance frequency corresponding to the resonance wave signal of the sleeve.
Performing discrete Fourier transform on the ultrasonic pulse echo data, and determining a group delay curve according to the discrete Fourier transform result, wherein the group delay curve represents the time delay of the ultrasonic pulse echo signal passing through the amplitude envelope of each sinusoidal component of the well casing, is a function of each frequency component and also represents the quantity of the speed degree of the phase change along with the frequency change.
And S13, frequency scanning is carried out on the group delay curve in the frequency searching interval to determine the resonance frequency of the sleeve.
The group delay curve may include frequency multiplication and fundamental frequency, and the fundamental frequency is selected as the resonance frequency of the sleeve by frequency scanning the group delay curve in the frequency search interval.
Step S14, determining the thickness of the sleeve according to the resonance frequency.
Specifically, after the resonance frequency is determined, the longitudinal wave speed of the ultrasonic pulse signal propagating in the sleeve is further obtained, and the thickness of the sleeve is determined according to the resonance frequency and the longitudinal wave speed. For example, the thickness CaseThk of the sleeve is calculated using the following formula:
CaseThk= CaseV/(2
A)
wherein CaseV is the propagation velocity of longitudinal waves in the casing, generally 5700m/s, is a constant, and A is the resonant frequency. For example, frequency scanning is performed on the group delay curve in a frequency search interval determined according to the ultrasonic pulse echo data, a frequency F corresponding to the maximum amplitude in the group delay curve is determined, when the frequency F is smaller than a preset frequency, a is the frequency F, when the frequency F is greater than or equal to the preset frequency and an amplitude peak exists in a preset range of F/2 frequency, a is the frequency F' corresponding to the amplitude peak.
Therefore, according to the embodiment, the ultrasonic pulse echo data of the sleeve at the preset azimuth position of the preset depth point in the preset depth interval of the well hole are obtained, the frequency search interval and the group delay curve are determined according to the ultrasonic pulse echo data, the group delay curve is subjected to frequency scanning in the frequency search interval to determine the resonance frequency of the sleeve, and the thickness of the sleeve is determined according to the resonance frequency, so that the noise frequency point and the frequency doubling point can be eliminated, the real sleeve resonance frequency is obtained, and the thickness calculation accuracy of the sleeve is improved.
In an alternative embodiment, step S12 specifically includes:
step S121, determining the sampling time corresponding to the maximum amplitude of the waveform according to the ultrasonic pulse echo data.
Step S122, determining the start time and the end time of the ultrasonic pulse signal according to the sampling time and the duration of the ultrasonic pulse signal transmitted by the ultrasonic pulse reflection echo logging instrument.
Step S123, determining a frequency searching interval according to the frequency spectrum curve of the ultrasonic pulse echo signal in the time period between the starting time and the ending time.
Firstly, determining the sampling time corresponding to the maximum amplitude of the waveform as T_max=max (x (i)), and knowing that the duration of the pulse signal transmitted by the logging instrument is DurTime, determining the starting time of the received ultrasonic pulse echo signal as TS=T_max-DurTime/2 and the ending time of the ultrasonic pulse signal on the inner wall of the casing as TE=TS+DurTime. Then, the spectrum analysis is performed on the ultrasonic pulse echo signal with the time interval of TS-TE to obtain a spectrum curve, for example, as shown in fig. 6, the spectrum curve corresponding to ultrasonic pulse echo data of the ultrasonic pulse echo signal with the time interval of TS-TE is obtained, and the frequency range corresponding to the half of the maximum amplitude of the waveform, namely, the 0.5 bandwidth, is found and marked as F1 and F2, so that F1-F2 is determined as the frequency search interval.
In an alternative embodiment, step S12 specifically includes:
step S124, performing discrete fourier transform on the ultrasonic pulse echo data.
Step S125, determining a group delay curve according to the imaginary part data and the real part data after the discrete fourier transform.
And performing signal processing on the ultrasonic pulse echo data by adopting discrete Fourier transform, and calculating a group delay curve of the ultrasonic pulse echo data. The specific formula is as follows:
wherein R is k 、I k Representing the real and imaginary parts, respectively, of the discrete fourier transform.
In an alternative embodiment, step S13 specifically includes:
step S131, frequency scanning is performed on the group delay curve in the frequency search interval, and the frequency F corresponding to the maximum amplitude in the group delay curve is determined.
Step S132, when the frequency F is smaller than the preset frequency, the frequency F is the resonance frequency of the sleeve; or when the frequency F is larger than or equal to the preset frequency and the amplitude peak exists in the preset range of the F/2 frequency, the frequency corresponding to the amplitude peak is the resonance frequency of the sleeve.
The preset frequency can be determined according to the standard thickness of the casing and the longitudinal wave speed of an ultrasonic pulse signal transmitted by the ultrasonic pulse reflection echo logging instrument and propagated in the casing. Specifically, a standard thickness of the sleeve is obtainedIs a known parameter, and is marked as CaseTh, the longitudinal wave speed of ultrasonic pulse signals propagating in the sleeve is CaseV, and is generally 5700m/s, and the standard resonance wave frequency of the sleeve can be obtained as FCase=CaseV/(2)
caseTh), a predetermined frequency can be determined from the standard resonant frequency, for example, a predetermined frequency of 1.5 +>
FCase。
As shown in fig. 7, the group delay curve is scanned in the frequency search interval F1-F2, the frequency F corresponding to the largest peak value, i.e. the maximum amplitude value, in the group delay amplitude spectrum is searched, and whether the frequency F is smaller than 1.5 is determined
FCase, if less than 1.5 +.>
FCase, the frequency corresponding to the peak value cannot be multiplied, but can be fundamental frequency, and the thickness of the sleeve is casethk=casev/(2 +.>
F) A. The invention relates to a method for producing a fibre-reinforced plastic composite If greater than or equal to 1.5->
FCase, then around (F/2) frequency (e.g., [ -20k,20 k)]) If there is also a peak (greater than both sides and not the peak if on the window side), if there is a fundamental frequency corresponding to the peak frequency F', the sleeve thickness is casethk=casev/(2 ×)>
F'). If not, it shows that F is not multiplied, F is fundamental frequency, and the calculated result of the sleeve thickness is returned, caseThk=CaseV/(2 +.>
F)。
Example two
Fig. 8 is a schematic flow chart of a method for measuring thickness of a sleeve according to a second embodiment of the invention. The present embodiment describes the present invention based on ultrasonic pulse echo data of all preset depth points in the entire preset depth interval. As shown in fig. 8, the method includes:
step S21, acquiring ultrasonic pulse echo data in a preset depth interval of a borehole; the ultrasonic pulse echo data comprise N ultrasonic pulse echo signals of all preset depth points.
Specifically, the ultrasonic pulse reflection method logging instrument is adopted to conduct rotary scanning measurement on a cased well, the number of ultrasonic pulse echo signal waveforms acquired by each depth point is N, the number of acquisition points of each ultrasonic pulse echo signal waveform is lwf, and the acquired ultrasonic pulse echo signal waveforms are marked as x (1), x (2) and x (3) … x (N). The number of ultrasonic pulse echo signal waveforms actually collected can be set according to the circumferential resolution requirement. For example, 60 ultrasonic pulse echo signals may be measured for each one-revolution of the depth point tool of this example.
Step S22, selecting an ultrasonic pulse echo signal, and preprocessing the ultrasonic pulse echo signal to obtain a frequency search interval.
For example, the waveform in fig. 4 is one of the ultrasonic pulse echo signals measured, and the time position where the amplitude of the waveform is maximum is acquired, for example, t_max=36.8 ms. The tool transmits an ultrasonic pulse signal for a duration durtime=15 ms, the duration of the signal typically being related to the frequency of the transducer. The start time of the received ultrasonic pulse echo signal is ts=t_max-DurTime/2=29.3 ms, and the end time of the intra-casing ultrasonic pulse echo signal is te=ts+durtime=44.3 ms. And performing spectrum analysis on the ultrasonic pulse reflected echo signal with the time interval TS-TE to obtain a spectrum curve of the ultrasonic pulse reflected echo signal, as shown in figure 6. The frequency range f1=230 kHz, f2=516 kHz corresponding to the signal-6 dB bandwidth was found.
Step S23, performing group delay calculation on the selected ultrasonic pulse echo signals to obtain a group delay curve.
Performing discrete Fourier transform on the ultrasonic pulse echo signal to obtain a new complex sequence as follows:
R k 、I k representing the real and imaginary parts, X, respectively, after Fourier transformation k For the amplitude of the preprocessed waveform signal, the time is n=0, 1, …, and the waveform amplitude value of N-1, N is the number of sampling points of the signal measured by the current azimuth of the logging instrument, and k represents the wave number.
The phase is a function of wave number, namely:
group delay profile
For the phase->
The speed degree of the conversion along with the frequency conversion is:
step S24, frequency searching is carried out on the group delay curve in the frequency searching interval, and the fundamental frequency of the group delay curve is obtained.
The wave resonance frequency of the standard casing is first acquired. Since the standard thickness of the casing is a known parameter, and is caseTh=12mm, the longitudinal wave velocity of an ultrasonic pulse signal transmitted by the ultrasonic pulse reflection echo logging instrument and propagated in the casing is caseV, generally 5700m/s, and thus the standard resonance wave frequency of the casing is FCase=caseV/(2)
CaseTh)=237.50kHz。
Then, the frequency scanning is carried out on the group delay curve in the frequency interval of F1-F2 (230 kHz-516 kHz) calculated above, the frequency F=499 kHz corresponding to the largest peak value in the group delay amplitude spectrum is searched, and whether the frequency is smaller than 1.5 is judged
FCase, due to F>1.5/>
FCase, so go to the next step;
at (F/2), i.e., around 249.5kHz frequency [ -20k,20k []If there is also a peak (greater than both sides and not the peak if on the window side), if there is a frequency F' =239 kHz for the fundamental frequency, the actual sleeve thickness is casethk=casev/(2)
F’)=11.9mm。
Step S25, determining the thickness of the sleeve according to the fundamental frequency of the group delay curve.
Step S26, determining whether the processing of the ultrasonic pulse echo data in the preset depth interval is finished.
If the processing is completed, executing step S27; if not, step S22 is performed.
Step S27, generating an imaging result of the thickness of the sleeve in the preset depth interval.
As shown in fig. 9, the imaging result is the thickness of the sleeve that ultimately generates the preset depth interval.
Example III
Fig. 10 shows a schematic structural view of a sleeve thickness measuring device according to a third embodiment of the present invention. As shown in fig. 10, the apparatus includes: an ultrasonic data acquisition module 31, a frequency interval and group delay curve determination module 32, a frequency scanning module 33 and a thickness determination module 34; wherein, the liquid crystal display device comprises a liquid crystal display device,
the ultrasonic data acquisition module 31 is used for acquiring ultrasonic pulse echo data of the casing at a preset azimuth of a preset depth point in a preset depth interval of the well;
the frequency interval and group delay curve determining module 32 is configured to determine a frequency search interval and a group delay curve according to the ultrasonic pulse echo data;
a frequency sweep module 33 is configured to frequency sweep the group delay profile within the frequency search interval to determine a resonant frequency of the casing;
the thickness determination module 34 is configured to determine a thickness of the sleeve based on the resonant frequency.
Further, the frequency interval and group delay curve determining module 32 is specifically configured to: determining sampling time corresponding to the maximum amplitude of the waveform according to the ultrasonic pulse echo data; determining the starting time and the ending time of the ultrasonic pulse signal according to the sampling time and the duration time of the ultrasonic pulse signal transmitted by the ultrasonic pulse reflection echo logging instrument; and determining a frequency searching interval according to the frequency spectrum curve of the ultrasonic pulse echo signal in the time period between the starting time and the ending time.
Further, the frequency interval and group delay curve determining module 32 is specifically configured to: performing discrete Fourier transform on the ultrasonic pulse echo data; a group delay curve is determined from the discrete Fourier transformed imaginary and real data.
Further, the frequency scanning module 33 is specifically configured to: frequency scanning is carried out on the group delay curve in the frequency searching interval, and the frequency F corresponding to the maximum amplitude in the group delay curve is determined; when the frequency F is smaller than a preset frequency, the frequency F is the resonance frequency of the sleeve; or when the frequency F is larger than or equal to a preset frequency and an amplitude peak exists in a preset range of F/2 frequency, the frequency corresponding to the amplitude peak is the resonance frequency of the sleeve.
Further, the device further comprises: a preset frequency determination module 35; wherein, the liquid crystal display device comprises a liquid crystal display device,
the preset frequency determining module 35 is configured to determine the preset frequency according to a standard thickness of the casing and a longitudinal wave speed of an ultrasonic pulse signal transmitted by an ultrasonic pulse reflection echo logging instrument propagating in the casing.
Further, the thickness determining module 34 is specifically configured to: and determining the thickness of the sleeve according to the resonance frequency and the longitudinal wave speed of the ultrasonic pulse signal propagating in the sleeve.
Further, the thickness determining module 34 is specifically configured to: the thickness CaseThk of the sleeve is calculated using the following formula:
CaseThk= CaseV/(2
A)
wherein CaseV is longitudinal wave velocity and A is resonant frequency.
The working principle of the sleeve thickness measuring device according to the present embodiment for executing the sleeve thickness measuring method according to the first embodiment is similar to the technical effects, and will not be repeated here.
Example IV
A fourth embodiment of the present invention provides a non-volatile computer storage medium storing at least one executable instruction for performing the method for measuring thickness of a casing according to any of the above method embodiments.
Example five
Fig. 11 is a schematic structural diagram of an electronic device according to a fifth embodiment of the present invention. The specific embodiments of the present invention are not limited to specific implementations of electronic devices.
As shown in fig. 11, the electronic device may include: a processor 502, a communication interface 504, a memory 506, and a communication bus 508.
Wherein: processor 502, communication interface 504, and memory 506 communicate with each other via communication bus 508. A communication interface 504 for communicating with network elements of other devices, such as clients or other servers. The processor 502 is configured to execute the program 510, and may specifically perform relevant steps in the method embodiments described above.
In particular, program 510 may include program code including computer-operating instructions.
The processor 502 may be a central processing unit CPU, or an application specific integrated circuit ASIC, or one or more integrated circuits configured to implement embodiments of the present invention. The one or more processors included in the electronic device may be the same type of processor, such as one or more CPUs; but may also be different types of processors such as one or more CPUs and one or more ASICs.
A memory 506 for storing a program 510. Memory 506 may comprise high-speed RAM memory, and may also include non-volatile memory, such as at least one disk memory.
Program 510 may be specifically configured to cause processor 502 to perform the sleeve thickness measurement method of any of the method embodiments described above.
The algorithms or displays presented herein are not inherently related to any particular computer, virtual system, or other apparatus. Various general-purpose systems may also be used with the teachings herein. The required structure for a construction of such a system is apparent from the description above. In addition, embodiments of the present invention are not directed to any particular programming language. It will be appreciated that the teachings of the present invention described herein may be implemented in a variety of programming languages, and the above description of specific languages is provided for disclosure of enablement and best mode of the present invention.
In the description provided herein, numerous specific details are set forth. However, it is understood that embodiments of the invention may be practiced without these specific details. In some instances, well-known methods, structures and techniques have not been shown in detail in order not to obscure an understanding of this description.
Similarly, it should be appreciated that in the above description of exemplary embodiments of the invention, various features of the embodiments of the invention are sometimes grouped together in a single embodiment, figure, or description thereof for the purpose of streamlining the disclosure and aiding in the understanding of one or more of the various inventive aspects. However, the disclosed method should not be construed as reflecting the intention that: i.e., the claimed invention requires more features than are expressly recited in each claim. Rather, as the following claims reflect, inventive aspects lie in less than all features of a single foregoing disclosed embodiment. Thus, the claims following the detailed description are hereby expressly incorporated into this detailed description, with each claim standing on its own as a separate embodiment of this invention.
Those skilled in the art will appreciate that the modules in the apparatus of the embodiments may be adaptively changed and disposed in one or more apparatuses different from the embodiments. The modules or units or components of the embodiments may be combined into one module or unit or component and, furthermore, they may be divided into a plurality of sub-modules or sub-units or sub-components. Any combination of all features disclosed in this specification (including any accompanying claims, abstract and drawings), and all of the processes or units of any method or apparatus so disclosed, may be used in combination, except insofar as at least some of such features and/or processes or units are mutually exclusive. Each feature disclosed in this specification (including any accompanying claims, abstract and drawings), may be replaced by alternative features serving the same, equivalent or similar purpose, unless expressly stated otherwise.
Furthermore, those skilled in the art will appreciate that while some embodiments herein include some features but not others included in other embodiments, combinations of features of different embodiments are meant to be within the scope of the invention and form different embodiments. For example, in the following claims, any of the claimed embodiments can be used in any combination.
Various component embodiments of the invention may be implemented in hardware, or in software modules running on one or more processors, or in a combination thereof. Those skilled in the art will appreciate that some or all of the functionality of some or all of the components according to embodiments of the present invention may be implemented in practice using a microprocessor or Digital Signal Processor (DSP). The present invention can also be implemented as an apparatus or device program (e.g., a computer program and a computer program product) for performing a portion or all of the methods described herein. Such a program embodying the present invention may be stored on a computer readable medium, or may have the form of one or more signals. Such signals may be downloaded from an internet website, provided on a carrier signal, or provided in any other form.
It should be noted that the above-mentioned embodiments illustrate rather than limit the invention, and that those skilled in the art will be able to design alternative embodiments without departing from the scope of the appended claims. In the claims, any reference signs placed between parentheses shall not be construed as limiting the claim. The word "comprising" does not exclude the presence of elements or steps not listed in a claim. The word "a" or "an" preceding an element does not exclude the presence of a plurality of such elements. The invention may be implemented by means of hardware comprising several distinct elements, and by means of a suitably programmed computer. In the unit claims enumerating several means, several of these means may be embodied by one and the same item of hardware. The use of the words first, second, third, etc. do not denote any order. These words may be interpreted as names. The steps in the above embodiments should not be construed as limiting the order of execution unless specifically stated.
Claims (9)
1. A method of measuring the thickness of a sleeve, comprising:
acquiring ultrasonic pulse echo data of a casing at a preset azimuth of a preset depth point in a preset depth interval of a borehole;
determining a frequency search interval and a group delay curve according to the ultrasonic pulse echo data;
frequency scanning the group delay curve in the frequency searching interval to determine the resonance frequency of the sleeve;
determining the thickness of the sleeve according to the resonance frequency;
wherein the frequency scanning the group delay profile in the frequency search interval to determine the resonant frequency of the casing comprises:
frequency scanning is carried out on the group delay curve in the frequency searching interval, and the frequency F corresponding to the maximum amplitude in the group delay curve is determined;
when the frequency F is smaller than a preset frequency, the frequency F is the resonance frequency of the sleeve; or when the frequency F is larger than or equal to a preset frequency and an amplitude peak exists in a preset range of F/2 frequency, the frequency corresponding to the amplitude peak is the resonance frequency of the sleeve.
2. The method of claim 1, wherein determining a frequency search interval from the ultrasonic pulse echo data comprises:
determining sampling time corresponding to the maximum amplitude of the waveform according to the ultrasonic pulse echo data;
determining the starting time and the ending time of the ultrasonic pulse signal according to the sampling time and the duration time of the ultrasonic pulse signal transmitted by the ultrasonic pulse reflection echo logging instrument;
and determining a frequency searching interval according to the frequency spectrum curve of the ultrasonic pulse echo signal in the time period between the starting time and the ending time.
3. The cannula thickness measurement method of claim 1, wherein determining a group delay profile from the ultrasonic pulse echo data comprises:
performing discrete Fourier transform on the ultrasonic pulse echo data;
a group delay curve is determined from the discrete Fourier transformed imaginary and real data.
4. The sleeve thickness measurement method according to claim 1, further comprising:
and determining the preset frequency according to the standard thickness of the casing and the longitudinal wave speed of an ultrasonic pulse signal transmitted by the ultrasonic pulse reflection echo logging instrument, which propagates in the casing.
5. A sleeve thickness measurement method according to any one of claims 1-4, wherein said determining the thickness of the sleeve from the resonance frequency comprises:
and determining the thickness of the sleeve according to the resonance frequency and the longitudinal wave speed of an ultrasonic pulse signal transmitted by the ultrasonic pulse reflection echo logging instrument, which propagates in the sleeve.
6. The casing thickness measurement method of claim 5, wherein the determining the thickness of the casing based on the resonant frequency and a longitudinal wave velocity of an ultrasonic pulse signal transmitted by an ultrasonic pulse-echo logging tool propagating in the casing comprises:
the thickness CaseThk of the sleeve is calculated using the following formula:
CaseThk= CaseV/(2
A)
wherein CaseV is longitudinal wave velocity and A is resonant frequency.
7. A sleeve thickness measuring device, comprising:
the ultrasonic data acquisition module is used for acquiring ultrasonic pulse echo data of the casing at a preset azimuth of a preset depth point in a preset depth interval of the well;
the frequency interval and group delay curve determining module is used for determining a frequency searching interval and a group delay curve according to the ultrasonic pulse echo data;
the frequency scanning module is used for carrying out frequency scanning on the group delay curve in the frequency searching interval to determine the resonance frequency of the sleeve;
a thickness determination module for determining a thickness of the sleeve according to the resonance frequency;
the frequency scanning module is specifically configured to perform frequency scanning on the group delay curve in the frequency search interval, and determine a frequency F corresponding to a maximum amplitude in the group delay curve; when the frequency F is smaller than a preset frequency, the frequency F is the resonance frequency of the sleeve; or when the frequency F is larger than or equal to a preset frequency and an amplitude peak exists in a preset range of F/2 frequency, the frequency corresponding to the amplitude peak is the resonance frequency of the sleeve.
8. An electronic device, comprising: the device comprises a processor, a memory, a communication interface and a communication bus, wherein the processor, the memory and the communication interface complete communication with each other through the communication bus;
the memory is configured to store at least one executable instruction that causes the processor to perform operations corresponding to the sleeve thickness measurement method according to any one of claims 1-6.
9. A computer storage medium having stored therein at least one executable instruction for causing a processor to perform operations corresponding to the sleeve thickness measurement method of any one of claims 1-6.
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| CN116660997B (en) * | 2023-08-02 | 2023-09-29 | 中海油田服务股份有限公司 | Inversion method and device for acoustic impedance of medium inside and outside sleeve and electronic equipment |
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