CN115808253A - Traceable temperature measurement probe structure and traceable calibration method thereof - Google Patents
Traceable temperature measurement probe structure and traceable calibration method thereof Download PDFInfo
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- CN115808253A CN115808253A CN202111071455.9A CN202111071455A CN115808253A CN 115808253 A CN115808253 A CN 115808253A CN 202111071455 A CN202111071455 A CN 202111071455A CN 115808253 A CN115808253 A CN 115808253A
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Abstract
The invention discloses a traceable temperature measurement probe structure and a traceable calibration method thereof, wherein the structure consists of a probe mechanical structure, a phase-change material, a flexible heating sheet and a platinum resistor; the phase change material is packaged in the hollow cylinder on the probe mechanical structure; the flexible heating sheet is attached to the outer surface of the hollow cylinder on the probe mechanical structure, and the flexible heating sheet is connected with a power supply through two leads to carry out heating operation; the platinum resistor is arranged in a groove right below the hollow cylinder on the probe mechanical structure, and the four-wire method is adopted for temperature measurement operation. The temperature measuring probe structure is suitable for long-term and high-precision application occasions, and has the advantages that the calibration measuring result can be defined according to the international temperature scale, the device does not need to be disassembled, and the drift of the temperature measuring result caused by the performance change of the platinum resistor and the rear-section temperature measuring electronics part is weakened.
Description
The technical field is as follows:
the invention relates to a high-resolution temperature measurement technology, a long-term high-accuracy temperature measurement technology, a temperature traceability technology and the like, in particular to a traceable temperature measurement probe structure which can be widely applied to the field of temperature measurement with long service cycle and high accuracy requirements.
Background art:
the realization of long service cycle and high accuracy temperature measurement has important practical significance for scientific research and industrial control, and due to the influence of aging drift of components on the platinum resistor and the analog signal acquisition circuit board, the temperature measurement result is often large in deviation and needs to be calibrated and calibrated regularly, however, the difficulty of disassembling the temperature measurement element for calibration in application occasions such as tunnels, mines, deep sea, satellites and the like is large, and even calibration cannot be performed. For example, when the temperature of the deep sea structural member is measured, the platinum resistor on the structural member after long-term use may change due to aging, and the temperature measurement result may deviate. At present, no similar technology to the present invention has been found in publicly investigated literature.
The invention content is as follows:
the invention mainly aims to solve the problems of drift and low accuracy of temperature measurement under long service cycle, eliminate the influence of lead resistance and thermoelectric potential of temperature difference on the measurement result by a platinum resistor four-wire connection method, trace the temperature measurement result of a standard platinum resistor by utilizing the international temperature scale definition and the characteristic that the temperature of a phase change material is basically kept constant during phase change, eliminate the drift of the temperature measurement result caused by performance change due to aging without disassembling a device, and realize the temperature measurement under the scenes of long service cycle, high resolution and high accuracy.
The whole traceable temperature measurement probe structure comprises a probe mechanical structure, a phase change material, a flexible heating sheet and a platinum resistor; the phase change material is packaged in the hollow cylinder on the probe mechanical structure; the flexible heating sheet is attached to the outer surface of the hollow cylinder on the probe mechanical structure, and the flexible heating sheet is connected with a power supply through two leads to carry out heating operation; the platinum resistor is arranged in a groove right below the hollow cylinder on the probe mechanical structure, and the four-wire method is adopted for temperature measurement operation. The mechanical structure of the probe of the invention is schematically shown in fig. 2.
When the temperature measurement probe structure is subjected to temperature tracing calibration, the circuit structure model is shown in fig. 3 and 4. Wherein r and E are the resistance and thermoelectric potential of the long wire, I S For exciting a constant current source of platinum resistors, U R The voltage at two ends of the platinum resistor is adopted, U is constant voltage drive on the flexible heating sheet, and the resistance value of the flexible heating sheet is simplified to be R C Pure resistance of (2).
The using method of the invention is as follows:
1. before the temperature measurement probe structure is installed and used, the closest phase change material in the international temperature scale definition is selected according to the temperature measurement range of practical application, and the phase change material is packaged in a hollow cylinder on the probe mechanical structure;
2. constant current source I S Exciting the platinum resistor, and utilizing another group of wires on the platinum resistor to apply a voltage U across the platinum resistor R Measuring, calculating the resistance value R of the platinum resistor and converting the resistance value R into a current measured temperature value t;
3. providing a constant voltage U for the flexible heating sheet, heating the phase-change material, and calibrating the measured temperature T to be the phase-change temperature T of the phase-change material when the temperature data acquired by the platinum resistor has the characteristic of sudden and smooth temperature rise rate, as shown in fig. 4 0 And finishing the temperature tracing calibration of the platinum resistor and the subsequent temperature measurement electronic system.
Because the voltage acquisition device at two ends of the platinum resistor is generally an instrument amplifier, the input impedance of the platinum resistor is very large, and the thermoelectric potential values of the temperature difference on different wires are almost equal, the wire resistor r and the thermoelectric potential E of the temperature difference can be ignored, and the calculation formula of the resistance value of the platinum resistor is as follows:
the conversion formula of the resistance value of the platinum resistor R is as follows:
R＝R Pt0 (1+Tt)
wherein R is Pt0 Is the resistance value of the platinum resistor at 0 ℃, and T is the resistance temperature coefficient of the platinum resistor, which is given by manufacturers and is 3850 ppm/DEG C; substituting into a platinum resistance value conversion formula to obtain a measured temperature value t;
the invention has the advantages that the calibration traceability function of the platinum resistor and the later-stage analog signal acquisition circuit board is realized, devices are not required to be disassembled, the temperature measurement result drift caused by performance change due to aging is eliminated, the platinum resistor four-wire connection method is adopted, the constant-current source excitation type temperature measurement method is supported, the influence of wire resistance and thermoelectric potential of temperature difference on the measurement result can be eliminated, and the temperature measurement method can be applied to the temperature measurement under the scenes with long service cycle, high resolution and high accuracy.
Description of the drawings:
fig. 1 is a schematic longitudinal section of the mechanical structure of a traceable temperature measurement probe.
FIG. 2 is a schematic diagram of a temperature measurement circuit structure when the present invention is used for temperature calibration and tracing.
FIG. 3 is a schematic diagram of a circuit structure of a flexible heating sheet for temperature calibration tracing according to the present invention.
Fig. 4 is a schematic diagram showing the phase change characteristics of the platinum resistor collecting temperature data.
The specific implementation mode is as follows:
according to the traceable temperature measurement probe structure, the structure consists of a probe mechanical structure, a phase change material, a flexible heating sheet and a platinum resistor; the phase change material is packaged in the hollow cylinder on the probe mechanical structure; the flexible heating sheet is attached to the outer surface of the hollow cylinder on the probe mechanical structure, and the flexible heating sheet is connected with a power supply through two leads to carry out heating operation; the platinum resistor is arranged in a groove right below the hollow cylinder on the probe mechanical structure, and the four-wire method is adopted for temperature measurement operation.
The phase change material depends on the actual temperature measuring range, for example: the temperature measurement is designed for a certain system, the temperature variation range of the system is 10-28 ℃, and then gallium materials are selected as phase change materials packaged in the temperature measurement probe according to the fixed point definition in the international temperature standard ITS-90, and the phase change temperature of the gallium materials is 29.76 ℃. When the temperature measuring device is used for normal temperature measurement, the phase change temperature of the phase change material is slightly higher than the temperature change range of a measured system, and the temperature measurement result is not influenced; when the temperature tracing calibration method is used for temperature tracing calibration, the phase change material is heated through the constant voltage at the two ends of the heating sheet, the phase change characteristic of the temperature data acquired by the platinum resistor is presented, the measured temperature is calibrated to the phase change temperature of the phase change material, the calibration of the platinum resistor and the post-stage analog signal acquisition circuit is realized, and the device does not need to be disassembled.
Claims (2)
1. A traceable temperature measurement probe structure comprises a probe mechanical structure, a phase change material, a flexible heating sheet and a platinum resistor; the method is characterized in that: the phase-change material is encapsulated in a hollow cylinder on the mechanical structure of the probe; the flexible heating sheet is attached to the outer surface of the hollow cylinder on the probe mechanical structure, and the flexible heating sheet is connected with a power supply through two leads to carry out heating operation; the platinum resistor is arranged in a groove right below the hollow cylinder on the probe mechanical structure, and the four-wire method is adopted for temperature measurement operation.
2. A temperature traceability calibration method based on the traceable temperature measurement probe structure of claim 1; the method is characterized by comprising the following steps:
firstly, selecting a phase change material closest to an actual temperature measurement range in the international temperature scale definition, and packaging the phase change material in a hollow cylinder on a probe mechanical structure; then, a four-wire platinum resistor temperature measurement method is utilized, and a group of leads gives constant-current excitation I to the platinum resistor S Measuring the voltage U across the platinum resistor through another set of wires R (ii) a Then providing a constant voltage U for the flexible heating sheet so as to heat the phase-change material; finally, calculating to obtain a temperature value t according to the acquired voltage data at the two ends of the platinum resistor, and calibrating a temperature measurement value according to the phase change characteristic of the phase change material; the specific temperature tracing calibration method comprises the following steps:
before the temperature measuring probe structure is installed and used, the closest phase change material in the international temperature scale definition is selected according to the temperature measuring range of practical application, and the closest phase change material is packaged in a hollow cylinder on the probe mechanical structure;
constant current source I S Exciting the platinum resistor, and utilizing another group of wires on the platinum resistor to apply a voltage U across the platinum resistor R The measurement is carried out, and the platinum resistance value is calculated according to the following formula:
the resistance value conversion formula of the platinum resistor R is as follows:
R＝R Pt0 (1+Tt)
wherein R is Pt0 The resistance value of the platinum resistor at 0 ℃, and T is the resistance temperature coefficient of the platinum resistor; substituting into a platinum resistance value conversion formula to obtain a measured temperature value t;
providing a constant voltage U for the flexible heating sheet, and heating the phase change material; when the temperature data collected by the platinum resistor has the characteristic that the temperature rise rate is suddenly slow, the measured temperature T at the moment is calibrated to be the phase change temperature T 0 And finishing the temperature tracing calibration of the platinum resistor and the subsequent temperature measurement electronic system.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111071455.9A CN115808253A (en) | 2021-09-14 | 2021-09-14 | Traceable temperature measurement probe structure and traceable calibration method thereof |
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| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111071455.9A CN115808253A (en) | 2021-09-14 | 2021-09-14 | Traceable temperature measurement probe structure and traceable calibration method thereof |
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| Publication Number | Publication Date |
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| CN115808253A true CN115808253A (en) | 2023-03-17 |
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| CN202111071455.9A Pending CN115808253A (en) | 2021-09-14 | 2021-09-14 | Traceable temperature measurement probe structure and traceable calibration method thereof |
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2021
- 2021-09-14 CN CN202111071455.9A patent/CN115808253A/en active Pending
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