CN115801171A - MTIE (maximum Transmission Eviation efficiency index) rapid analysis method and system and MTIE index analysis curve analysis method - Google Patents
MTIE (maximum Transmission Eviation efficiency index) rapid analysis method and system and MTIE index analysis curve analysis method Download PDFInfo
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Abstract
The MTIE rapid analysis method comprises the steps of taking a time error sample xi with t0, defining the length of a sliding window, analyzing the minimum value and the maximum value of time interval error data TIE, respectively putting the minimum value and the maximum value into a cache MinCache and a MaxCache, when N is greater than 1, calling the cache values MinCache [ k ] and MaxCache [ k ] of N-1 to calculate the minimum value and the maximum value of the time interval error data TIE, putting the minimum Cache [ k ] and MaxCache [ k ] into a cache, and substituting the MinCache [ k ] and MaxCache [ k ] obtained by analysis into a formula to calculate MTIE (N) = Max [ k ] { MaxCache [ k ] -MinCache [ k ] }, k =1.. N-N, i = k. + N; and the MTIE index analysis curve analysis method fits all the calculated MTIE values into an index analysis curve and compares the index analysis curve with a corresponding standard MTIE template. The MTIE rapid analysis system comprises an acquisition module for acquiring time error samples xi; the cache module is used for caching MinCache [ k ] and MaxCache [ k ]; the first calculation module, the second calculation module and the third calculation module are used for calculating the MTIE value. The application greatly improves the analysis efficiency.
Description
[ technical field ] A method for producing a semiconductor device
The application relates to the field of time-frequency synchronization of communication technology, in particular to an analysis method of MTIE.
[ background of the invention ]
Modern telecommunication networks require a high degree of synchronization between network transport elements, timing being crucial for all network transport elements in an SDH architecture. However, controlling phase variations in the reference clock frequency of the synchronous network elements may introduce errors at various stages of the network.
One measure of timing Error in synchronous digital transmission systems is the Maximum Time Interval Error (MTIE), which is derived from a set of timing Error samples. In SDH systems, the timing error samples are called "time interval errors" or TIE samples and accordingly define a normalized maximum timing variation metric MTIE. The MTIE is a measure of the time variation of the signal and may also provide information about the frequency offset and phase transients of the signal. The MTIE value is used, along with other parameters, to evaluate the performance of devices and systems, typically to diagnose faults that have developed and impair customer service.
Specific MTIE evaluation formulas have been provided within ITU-T International telecommunication Union Standard ITU-T G.810.
X1, X2, …, xn (X (1.. N)): actually measuring the obtained time error sample data in a measuring period. Specifically, for a given delay error value, sampling is performed with t0 as a sampling interval, and finally, sample data results of { x0, x1, x2, … } samples are sampled at equal intervals.
MTIE (maximum time interval error): in a measurement period, a sliding observation window time n x t0 is given, and then the maximum phase change in the time scale of n x t0 is calculated.
The relationship of MTIE and X (1.. N) can be defined as the following equation:
wherein,
n: total number of samples sampled at t0 time interval
t0: a time error sampling interval;
n: observation sliding window 1 … N-1 series
xi: a time error sample;
when the MTIE formula is directly used, it is found that small data analysis has no problem, but if the sample data volume is large, if the computer processing analysis is implemented only according to the formula, the analysis time is very long, for example, 1000 ten thousand data are analyzed, the processing time of 1 common office computer is more than 30 days, and the time for directly analyzing the formula through the program becomes unacceptable. Once huge data needs to be analyzed, the time cost for analysis is huge, huge resource consumption of a computer is caused, and inconvenience is brought to testing personnel. Therefore, the time-consuming problem of time-frequency instrument data processing and analysis is very necessary to be solved.
[ summary of the invention ]
The application aims to provide an MTIE rapid analysis method, an MTIE index analysis curve analysis method and an MTIE rapid analysis system.
In order to realize the purpose of the application, the following technical scheme is provided:
the application provides a method for rapidly analyzing MTIE, which comprises the following steps:
taking time error samples xi at t0 time intervals to obtain original time interval error data TIE, wherein the original time interval error data TIE refers to the phase difference of a given signal relative to a reference clock at a specific time point;
given a sliding window t = nt0, the maximum time interval error MTIE is calculated from the maximum and minimum values of the time interval error data TIE within said sliding window
N: the total number of samples taken at t0 time intervals,
t0: the time error is sampled at an interval that is,
n: observing the sliding window 1 … N-1 progression,
xi: a time error sample;
setting a cache MinCache and MaxCache,
at n =1, the minimum value of the time interval error data TIE for each analysis is given to MinCache [ k ], the maximum value is given to MaxCache [ k ],
calculating MTIE (1) = Max [ k ] { MaxCache [ k ] -MinCache [ k ] }, k =1.. N-1;
when n is greater than 1, calling the minimum value obtained by further analyzing the previous cache MinCache [ k ] to assign to an intermediate variable MinV, calling the maximum value obtained by further analyzing the previous cache MaxCache [ k ] to assign to an intermediate variable MaxV, caching the MinV obtained by analysis to the MinCache [ k ], caching the MaxV obtained by analysis to the MaxCache [ k ], and facilitating the use of the next k value;
calculating Max [ k ] = MaxV-MinV each time;
calculating MTIE (N) = Max [ k ], k =1.. N-N;
finally, MTIE (N-1) = Max [1], k =1.. N- (N-1) is calculated.
In some embodiments, an MTIE index analysis curve is obtained by fitting all the obtained MTIE values, and comparison analysis with a template can be further performed.
In some embodiments, discrete TIE sampling points of T = N × T0 are fitted to a curve at intervals of T0 as time coordinates, and the MTIE rapid analysis method is a method in which the sliding window slides on the curve, and i discrete TIE points are located in the sliding window T = it 0. Wherein, the phase error of the sampling period it 0: TIE (i) = x (it 0), i =0,1,2, n.
An analysis method of an MTIE index analysis curve, comprising:
comparing the input signal with a reference signal, and taking time error samples xi at t0 time intervals;
then, analyzing the time error sample xi obtained by measurement by adopting the MTIE rapid analysis method to obtain all MTIE values of an index analysis curve;
the index analysis curve is compared with series MTIE templates of corresponding standards G.811, G.812, G.813, G.823, G.8261, G.8262 and G.8273 of ITU-T.
A MTIE fast analysis method, which comprises the following steps:
comparing the input signal with a reference signal, taking time error samples xi at t0 time intervals to obtain original time interval error data TIE,
given a sliding window t = nt0, analyzing the maximum value and the minimum value of the time interval error data TIE for each sliding of the sliding window,
setting a maximum value cache MaxCache and a minimum value cache MinCache, sending the minimum value of time interval error data TIE analyzed each time to the MinCache and the maximum value to the MaxCache,
calculating a maximum time interval error MTIE by using MinCache [ k ] and MaxCache [ k ] when n = 1;
MTIE(1)＝Max[k]{MaxCache[k]-MinCache[k]}，k＝1..N-1；
when n is greater than 1, calling the maximum value obtained by analyzing the previous maximum value cache MaxCache [ k ] and the minimum value cache MinCache [ k ] to assign to the intermediate variable MaxV and cache to the maximum value cache MaxCache [ k ], and assigning the minimum value obtained by analyzing to the intermediate variable MinV and cache to the minimum value cache MinCache [ k ];
calculate MTIE (n) for each time
MTIE(n)＝Max[k]＝Max[k]{MaxV-MinV}，k＝1..N-n；
Finally, MTIE (N-1) = Max [1], k =1.. N- (N-1) is calculated.
N: total number of samples sampled at t0 time interval
t0: a time error sampling interval;
n: observation sliding window 1 … N-1 series
xi: time error samples.
A fast MTIE analyzing method, which adopts MTIE evaluating formula to calculate MTIE value,
n: the total number of samples taken at t0 time intervals,
t0: the time error sampling interval is the interval between the samples,
n: number of sampling intervals in time t, t = n × t0
xi: a time error sample;
given a sliding window t = nt0, analyzing the minimum and maximum values of the time interval error data TIE within each sliding window,
setting a cache MinCache and MaxCache,
n =1, storing the minimum value of time interval error data TIE analyzed each time when N =1 by using a cache MinCache [ k ], storing the minimum value of time interval error data TIE analyzed each time when N =1 by using a cache MaxCache [ k ], and substituting the MinCache [ k ] and MaxCache [ k ] obtained by analysis into a formula to calculate MTIE (t 0), wherein k =1.. N-1, i = k.. N + N;
when n is greater than 1, calling the cache value MinCache [ k ] when n-1 is used for calculating the minimum value of the time interval error data TIE, assigning the minimum value to an intermediate variable MinV, and caching the intermediate variable MinCache [ k ] to the minimum value cache [ k ] at the same time; calling the cache value MaxCache [ k ] in the n-1 state to calculate the maximum value of the time interval error data TIE, assigning the maximum value to an intermediate variable MaxV, and caching the maximum value to a maximum value cache MaxCache [ k ]; and substituting the MinCache [ k ] and MaxCache [ k ] obtained by analysis into a formula to calculate an MTIE (nt 0) value, wherein k =1.. N-N, and i = k.. K + N.
The present application further provides a MTIE rapid analysis system, which includes:
an acquisition module that takes time error samples xi at t0 time intervals; defining the length t = it0 of the sliding window, and enabling the sliding window to slide for sample collection;
the cache module is used for setting a MinCache cache and a MaxCache cache;
the first analysis module is used for analyzing the minimum value and the maximum value of the time interval error data TIE of each sliding window when n =1, and respectively putting the minimum value and the maximum value into a cache MinCache [ k ] and a cache MaxCache [ k ];
the second analysis module calls the cache values MinCache [ k ] and MaxCache [ k ] when n-1 is greater than 1 to respectively analyze the minimum value and the maximum value of the time interval error data TIE, assigns the minimum value and the maximum value to intermediate variables MinV and MaxV, and simultaneously caches the intermediate variables MinCache [ k ] and MaxCache [ k ];
the third analysis module substitutes the MinCache [ k ] and the MaxCache [ k ] obtained by each analysis into a formula to calculate an MTIE value;
MTIE(n)＝Max[k]{MaxCache[k]-MinCache[k]}，k＝1..N-n，i＝k..k+n；
in some embodiments, at least two of the first, second, and third analysis modules are the same analysis module.
Compared with the prior art, the method has the following advantages:
according to the method, time interval error data of a measured time frequency signal is measured on a time frequency instrument, the measured time interval error data is analyzed through the rapid analysis algorithm technology, so that an index analysis curve required by people is obtained, and the index analysis curve is compared with series MTIE templates of ITU-T corresponding standards G.811, G.812, G.813, G.823, G.8261, G.8262, G.8273 and the like to obtain whether a result passes or not.
The optimized fast algorithm in the application obtains the above solution through formula decomposition statistics, and greatly improves the time-consuming problem after practical application. By using the calculation method of the scheme, 30 days of MTIE calculation is originally required, and the actual measurement can be shortened to several hours. This greatly improves the analysis efficiency, making MTIE real-time analysis possible.
[ description of the drawings ]
Fig. 1 is a schematic flow chart of the MTIE rapid analysis method of the present application.
[ detailed description ] embodiments
Exemplary embodiments of the present application will be described in more detail below. While the following description shows illustrative embodiments of the application, it should be understood that the application may be embodied in various forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete, and will fully convey the scope of the disclosure to those skilled in the art.
Referring to fig. 1, the MTIE rapid analysis method of the present application includes:
taking time error samples xi at t0 time intervals to obtain original time interval error data TIE, wherein the original time interval error data TIE refers to the phase difference of a given signal relative to a reference clock at a specific time point;
given a sliding window T = nt0, the maximum time interval error MTIE is calculated from the maximum and minimum values of the time interval error data TIE within said sliding window, i.e. the maximum phase change within all given sliding windows within one measurement period T,
n: the total number of samples taken at t0 time intervals,
t0: the time error is sampled at an interval that is,
n: observing the sliding window 1 … N-1 progression,
xi: a time error sample;
after the formula is decomposed, the Max [ k ] { Max (x [ i ]) -Min (x [ i ]) } of each calculation can be used in the next calculation without recalculation each time. Therefore, the resources of the computer can be greatly saved, and the rapid MTIE analysis can be realized.
Through one-step and one-step processing analysis, the maximum and minimum values between each sample data are placed in the middle caches MinCache and MaxCache as soon as the analysis is started from the first time, and then the MinCache and MaxCache are used for calculating the MTIE (n) value of each time. Coincidently, after calculating the current MTIE (n) value each time, it is found that the cache MinCache and MaxCache to be used by the next MTIE (n + 1) can be simultaneously analyzed and processed for the next MTIE (n + 1) in the analysis process, so that a great amount of analysis practice is saved.
Therefore, by adopting the optimized calculation scheme of the application, the MinCache and the MaxCache are set,
when n =1, the minimum value of the time interval error data TIE for each analysis is given to MinCache [ k ], the maximum value is given to MaxCache [ k ],
calculating MTIE (1) = Max [ k ] { MaxCache [ k ] -MinCache [ k ] }, k =1.. N-1;
when n is greater than 1, calling a minimum value obtained by further analyzing a previous cache MinCache [ k ] to assign to an intermediate variable MinV, calling a maximum value obtained by further analyzing a previous cache MaxCache [ k ] to assign to an intermediate variable MaxV, caching the MinV obtained by analysis to the MinCache [ k ], and caching the MaxV obtained by analysis to the MaxCache [ k ];
calculating Max [ k ] = MaxV-MinV each time;
calculating MTIE (N) = Max [ k ], k =1.. N-N;
finally, MTIE (N-1) = Max [1], k =1.. N- (N-1) is calculated.
The application also provides an analysis method of the MTIE index analysis curve, which comprises the following steps:
comparing the input signal with a reference signal, and taking time error samples xi at t0 time intervals;
then, analyzing the time error sample xi obtained by measurement by adopting the MTIE rapid analysis method to obtain all MTIE values of an index analysis curve;
the index analysis curve is compared with series MTIE templates of corresponding standards G.811, G.812, G.813, G.823, G.8261, G.8262 and G.8273 of ITU-T.
The present application further provides a MTIE rapid analysis system, which includes:
an acquisition module that takes time error samples xi at t0 time intervals; defining the length t = it0 of the sliding window, and enabling the sliding window to slide for sample collection;
the cache module is used for setting a MinCache cache and a MaxCache cache;
the first analysis module is used for analyzing the minimum value and the maximum value of the time interval error data TIE of each sliding window when n =1, and respectively putting the minimum value and the maximum value into a cache MinCache [ k ] and a cache MaxCache [ k ];
the second analysis module calls the cache values MinCache [ k ] and MaxCache [ k ] when n-1 is greater than 1 to respectively analyze the minimum value and the maximum value of the time interval error data TIE, assigns the minimum value and the maximum value to intermediate variables MinV and MaxV, and simultaneously caches the intermediate variables MinCache [ k ] and MaxCache [ k ];
the third analysis module substitutes the MinCache [ k ] and the MaxCache [ k ] obtained by each analysis into a formula to calculate an MTIE value;
MTIE(n)＝Max[k]{MaxCache[k]-MinCache[k]}，k＝1..N-n，i＝k..k+n；
in some embodiments, at least two of the first, second, and third analysis modules are the same analysis module.
The above description is only a preferred embodiment of the present application, and the protection scope of the present application is not limited thereto, and any equivalent changes based on the technical solutions of the present application are included in the protection scope of the present application.
Claims (8)
1. A MTIE fast analysis method is characterized by comprising the following steps:
taking time error samples xi at t0 time interval to obtain original time interval error data TIE,
given a sliding window t = nt0, the maximum time interval error MTIE is calculated from the maximum and minimum values of the time interval error data TIE within said sliding window
N: the total number of samples taken at t0 time intervals,
t0: the time error is sampled at an interval that is,
n: observing the sliding window 1 … N-1 progression,
xi: a time error sample;
setting a cache MinCache and MaxCache,
at n =1, the minimum value of the time interval error data TIE for each analysis is given to MinCache [ k ], the maximum value is given to MaxCache [ k ],
calculating MTIE (1) = Max [ k ] { MaxCache [ k ] -MinCache [ k ] }, k =1.. N-1;
when n is greater than 1, calling the minimum value obtained by further analyzing the previous cache MinCache [ k ] to assign to an intermediate variable MinV, calling the maximum value obtained by further analyzing the previous cache MaxCache [ k ] to assign to an intermediate variable MaxV, caching the MinV obtained by analysis to the MinCache [ k ], caching the MaxV obtained by analysis to the MaxCache [ k ], and facilitating the use of the next k value;
calculating Max [ k ] = MaxV-MinV each time;
calculating MTIE (N) = Max [ k ], k =1.. N-N;
finally, MTIE (N-1) = Max [1], k =1.. N- (N-1) is calculated.
2. The MTIE fast analysis method of claim 1,
and fitting all the obtained MTIE values to obtain an MTIE index analysis curve.
3. The MTIE fast analysis method of claim 1,
phase error of sampling period it 0:
TIE(i)＝x(it0)，i＝0，1，2，N；
fitting discrete TIE sampling points of T = N × T0 to a curve with time coordinates of intervals of T0, wherein the sliding window slides on the curve, and i discrete TIE points are in the sliding window T = it 0.
4. An analysis method of an MTIE index analysis curve, comprising:
comparing the input signal with a reference signal, and taking time error samples xi at t0 time intervals;
the method is characterized in that the time error sample xi obtained by measurement is analyzed by the MTIE fast analysis method as claimed in claim 1 to obtain all MTIE values of an index analysis curve;
the index analysis curve is compared with series MTIE templates of corresponding standards G.811, G.812, G.813, G.823, G.8261, G.8262 and G.8273 of ITU-T.
5. A MTIE rapid analysis method is characterized by comprising
Comparing the input signal with a reference signal, taking time error samples xi at t0 time intervals to obtain original time interval error data TIE,
given a sliding window t = nt0, analyzing the maximum value and the minimum value of the time interval error data TIE for each sliding of the sliding window,
setting a maximum value cache MaxCache and a minimum value cache MinCache, sending the minimum value of time interval error data TIE analyzed each time to the MinCache, sending the maximum value to the MaxCache,
calculating a maximum time interval error MTIE by using MinCache [ k ] and MaxCache [ k ] when n = 1;
MTIE(1)＝Max[k]{MaxCache[k]-MinCache[k]}，k＝1..N-1；
when n is greater than 1, calling the maximum value obtained by analyzing the previous maximum value cache MaxCache [ k ] and the minimum value cache MinCache [ k ] to assign to the intermediate variable MaxV and cache to the maximum value cache MaxCache [ k ], and assigning the minimum value obtained by analyzing to the intermediate variable MinV and cache to the minimum value cache MinCache [ k ];
calculate MTIE (n) for each time
MTIE(n)＝Max[k]＝Max[k]{MaxV-MinV}，k＝1..N-n；
Finally, MTIE (N-1) = Max [1], k =1.. N- (N-1) is calculated;
n: total number of samples sampled at t0 time intervals
t0: a time error sampling interval;
n: observation sliding window 1 … N-1 series
xi: time error samples.
6. A fast MTIE analyzing method, which adopts MTIE evaluating formula to calculate MTIE value,
n: the total number of samples taken at t0 time intervals,
t0: the time error is sampled at an interval that is,
n: number of sampling intervals in time t, t = n × t0
xi: a time error sample;
given a sliding window t = nt0, the minimum and maximum values of the time interval error data TIE within each sliding window are analyzed,
it is characterized in that a cache MinCache and a MaxCache are arranged,
n =1, storing the minimum value of time interval error data TIE analyzed each time when N =1 by using a cache MinCache [ k ], storing the minimum value of time interval error data TIE analyzed each time when N =1 by using a cache MaxCache [ k ], and substituting the analyzed MinCache [ k ] and MaxCache [ k ] into a formula to calculate MTIE (t 0), k =1.. N-1, i = k.. K + N;
when n is greater than 1, calling the cache value MinCache [ k ] when n-1 is used for calculating the minimum value of the time interval error data TIE, assigning the minimum value to an intermediate variable MinV, and caching the minimum value in the minimum value cache MinCache [ k ]; calling the cache value MaxCache [ k ] when n-1 is called to calculate the maximum value assignment of the time interval error data TIE to the intermediate variable MaxV and cache the maximum value assignment to the maximum value cache MaxCache [ k ]; and substituting the MinCache [ k ] and MaxCache [ k ] obtained by analysis into a formula to calculate an MTIE (nt 0) value, wherein k =1.. N-N, and i = k.. K + N.
7. A MTIE rapid analysis system is characterized in that it comprises,
an acquisition module that takes time error samples xi at t0 time intervals; defining the length t = it0 of the sliding window, and enabling the sliding window to slide for sample collection;
the cache module is used for setting a MinCache cache and a MaxCache cache;
the first analysis module is used for analyzing the minimum value and the maximum value of the time interval error data TIE of each sliding window when n =1, and respectively putting the minimum value and the maximum value into a cache MinCache [ k ] and a cache MaxCache [ k ];
the second analysis module calls the cache values MinCache [ k ] and MaxCache [ k ] when n-1 is greater than 1 to respectively analyze the minimum value and the maximum value of the time interval error data TIE, assigns the minimum value and the maximum value to intermediate variables MinV and MaxV, and simultaneously caches the intermediate variables MinCache [ k ] and MaxCache [ k ];
the third analysis module substitutes the MinCache [ k ] and MaxCache [ k ] obtained by each analysis into a formula to calculate an MTIE value;
MTIE(n)＝Max[k]{MaxCache[k]-MinCache[k]}，k＝1..N-n，i＝k..k+n。
8. the MTIE rapid analysis system of claim 7, wherein at least two of the first, second and third analysis modules are the same analysis module.
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