CN115792722A - Detection system and method for superconducting quantum computer line - Google Patents

Abstract

The application discloses a detection system and a detection method for a superconducting quantum computer line.A line controller is arranged in a low-temperature system and is provided with various test lines and corresponding test modes. The terminal equipment is respectively connected with the signal source equipment and the line controller and used for issuing a switching instruction to the line controller when receiving the test instruction and controlling the signal source equipment to output a test signal matched with the test instruction. And the line controller receives a switching instruction transmitted by the terminal equipment and switches the line into a target test line matched with the switching instruction. The line controller carries out line testing according to a target testing mode corresponding to the target testing line; and feeding back the test data to the terminal equipment. And the terminal equipment analyzes the test data to obtain a test result. The actual working environment of the quantum chip can be completely simulated through the detection system, so that the actual detection of the superconducting quantum computer line is realized, and the accuracy of the superconducting quantum computer line detection is improved.

Description

Detection system and method for superconducting quantum computer line

Technical Field

The present application relates to the field of quantum technology, and in particular, to a system and method for detecting a superconducting quantum computer line.

Background

After the basic process detection at room temperature is completed, the superconducting quantum chip needs to acquire signal parameters which resonate with quantum bits in a low-temperature environment, and a proper regulation and control technology is combined to realize quantum logic gates with high fidelity, so that quantum circuits are formed by the quantum logic gates to complete a quantum algorithm. Signals that resonate with qubits are generally divided into three types: 1. qubit read signal, 2 qubit drive signal, 3 qubit control signal. The three signals correspond to three different lines respectively.

In the current scheme for supporting the measurement and control system, a set of driving lines and control lines are generally provided for each qubit, and a set of reading lines are provided for each qubit region. And transmitting a signal by using room temperature measurement and control instrument equipment, transmitting the signal into the refrigerator through a room temperature line, and transmitting the signal into the quantum chip through a low-temperature line in the refrigerator to finish operations such as reading, driving and controlling.

When installing quantum chip, often need reform transform corresponding low temperature circuit, add the filter, need be connected low temperature circuit and chip package box simultaneously. Before the quantum wires are used, the problems of whether the wires are damaged or not, whether signals can reach a quantum chip or not and the like need to be checked. In the traditional mode, instruments such as a vector network analyzer are used for detecting the line, but the implementation mode can only detect the line at room temperature and cannot reflect the problems of whether the line has abnormal insertion loss and the like in a low-temperature environment.

Therefore, how to improve the accuracy of line detection is a problem to be solved by those skilled in the art.

Disclosure of Invention

The embodiment of the application aims to provide a detection system and a detection method for a superconducting quantum computer line, which can improve the accuracy of line detection.

In order to solve the above technical problem, an embodiment of the present application provides a detection system for a superconducting quantum computer line, including a line controller, a signal source device, and a terminal device; various test circuits and corresponding test modes thereof are deployed in the circuit controller; the line controller is arranged in the low-temperature system;

the terminal equipment is respectively connected with the signal source equipment and the line controller and is used for issuing a switching instruction to the line controller under the condition of receiving a test instruction and controlling the signal source equipment to output a test signal matched with the test instruction; analyzing the test data fed back by the line controller to obtain a test result;

the line controller is used for receiving a switching instruction transmitted by the terminal equipment, switching a line into a target test line matched with the switching instruction, and performing line test according to a target test mode corresponding to the target test line; and feeding back the test data to the terminal equipment.

Optionally, the various types of test lines deployed in the line controller include a low-temperature reading test line, a low-temperature driving test line, and a low-temperature control test line.

Optionally, the signal source device includes a vector network analyzer and a dc source table.

Optionally, the terminal device is configured to issue a low-temperature control test line switching instruction to the line controller when the test instruction is a low-temperature control line test instruction; controlling the direct current source meter to provide direct current voltage for the accessed low-temperature control circuit; and controlling the vector network analyzer to transmit a first microwave signal to the low-temperature control circuit.

Optionally, the vector network analyzer is configured to feed back a first microwave signal transmitted to the low-temperature control line and a second microwave signal fed back by the low-temperature control line to the terminal device; the direct current source meter is used for feeding back the acquired current value on the low-temperature control circuit to the terminal equipment;

the terminal device is used for receiving the first microwave signal and the second microwave signal fed back by the vector network analyzer and determining a scattering parameter corresponding to the low-temperature control circuit based on the first microwave signal and the second microwave signal; determining an actual resistance value corresponding to the low-temperature control circuit according to a fixed voltage value corresponding to the direct-current source meter and a current value fed back by the direct-current source meter; and under the condition that the scattering parameter is not matched with the set low-temperature control theoretical parameter or the resistance value is larger than a set threshold value, judging that the low-temperature control circuit is abnormal.

Optionally, the terminal device is configured to issue a low-temperature driving test line switching instruction to the line controller when the test instruction is a low-temperature driving line test instruction; and controlling the vector network analyzer to transmit a third microwave signal to the accessed low-temperature driving circuit.

Optionally, the vector network analyzer is configured to feed back a third microwave signal transmitted to the low-temperature driving circuit and a fourth microwave signal fed back by the low-temperature driving circuit to the terminal device;

the terminal equipment is used for receiving the third microwave signal and the fourth microwave signal fed back by the vector network analyzer and determining scattering parameters corresponding to the low-temperature driving circuit based on the third microwave signal and the fourth microwave signal; and under the condition that the scattering parameter corresponding to the low-temperature driving circuit is not matched with the set low-temperature driving theoretical parameter, judging that the low-temperature driving circuit is abnormal.

Optionally, the low temperature reading test line includes a penetration calibration piece, a reflection calibration piece, a line calibration piece, and a reference calibration piece.

Optionally, in the case that the test command is a low temperature read line test command,

and the line controller is used for sequentially controlling the communication between each calibration piece in the low-temperature reading test line and the accessed low-temperature reading line under the condition of receiving a low-temperature reading line test instruction transmitted by the terminal equipment, and controlling the vector network analyzer to transmit an initial microwave signal to the low-temperature reading line every time the communication is executed.

Optionally, the vector network analyzer is configured to feed back the initial microwave signal transmitted each time and the received target microwave signal fed back by the low-temperature reading line to the terminal device;

the terminal equipment is used for determining scattering parameters corresponding to the low-temperature reading line based on all the initial microwave signals fed back by the vector network analyzer and all the target microwave signals corresponding to the initial microwave signals; and under the condition that the scattering parameter corresponding to the low-temperature reading circuit is not matched with the set low-temperature reading theoretical parameter, judging that the low-temperature control circuit is abnormal.

The embodiment of the application also provides a detection method of the superconducting quantum computer line, which is suitable for the detection system of the superconducting quantum computer line, and the method comprises the following steps:

receiving a switching instruction transmitted by terminal equipment, and switching a line into a target test line matched with the switching instruction; the switching instruction is an instruction issued to a line controller by the terminal equipment under the condition of receiving a test instruction;

performing line testing according to a target testing mode corresponding to the target testing line;

and feeding back the test data to the terminal equipment so that the terminal equipment can analyze the test data to obtain a test result.

Optionally, the line test is performed according to a target test mode corresponding to the target test line; feeding back test data to the terminal device includes:

transmitting a first microwave signal to the low-temperature control circuit under the condition that the test instruction is a low-temperature control circuit test instruction;

feeding back the first microwave signal and a second microwave signal fed back by a low-temperature control circuit to the terminal device, so that the terminal device can determine a scattering parameter corresponding to the low-temperature control circuit based on the first microwave signal and the second microwave signal; determining an actual resistance value corresponding to the low-temperature control circuit according to a fixed voltage value corresponding to a direct-current source meter and a current value fed back by the direct-current source meter; and under the condition that the scattering parameter is not matched with the set low-temperature control theoretical parameter or the resistance value is larger than a set threshold value, judging that the low-temperature control circuit is abnormal.

Optionally, the line test is performed according to a target test mode corresponding to the target test line; feeding back test data to the terminal device comprises:

transmitting a third microwave signal to the low-temperature driving circuit under the condition that the test instruction is a low-temperature driving circuit test instruction;

feeding back the third microwave signal and a fourth microwave signal fed back by a low-temperature driving circuit to the terminal equipment, so that the terminal equipment can determine a scattering parameter corresponding to the low-temperature driving circuit based on the third microwave signal and the fourth microwave signal; and under the condition that the scattering parameter corresponding to the low-temperature driving circuit is not matched with the set low-temperature driving theoretical parameter, judging that the low-temperature driving circuit is abnormal.

Optionally, the performing the line test according to the target test mode corresponding to the target test line includes:

and under the condition that the test instruction is a low-temperature reading line test instruction, sequentially controlling the communication between each calibration piece in the low-temperature reading test line and the accessed low-temperature reading line, and controlling the vector network analyzer to transmit an initial microwave signal to the low-temperature reading line every time the communication is executed.

Optionally, the feeding back the test data to the terminal device includes:

feeding back the initial microwave signals transmitted each time and the received target microwave signals fed back by the low-temperature reading line to the terminal equipment, so that the terminal equipment determines scattering parameters corresponding to the low-temperature reading line based on all the initial microwave signals fed back by a vector network analyzer and all the target microwave signals corresponding to the initial microwave signals; and under the condition that the scattering parameter corresponding to the low-temperature reading circuit is not matched with the set low-temperature reading theoretical parameter, judging that the low-temperature control circuit is abnormal.

According to the technical scheme, the detection system of the superconducting quantum computer line comprises a line controller, signal source equipment and terminal equipment; the line controller is arranged in the low-temperature system, and various test lines and corresponding test modes thereof are deployed in the line controller. The terminal equipment is respectively connected with the signal source equipment and the line controller and used for issuing a switching instruction to the line controller under the condition of receiving the test instruction and controlling the signal source equipment to output a test signal matched with the test instruction. And the line controller receives the switching instruction transmitted by the terminal equipment, and switches the line into a target test line matched with the switching instruction, so that the current test requirement is met. The corresponding test modes of different types of test circuits are different, and the circuit controller can carry out circuit test according to the target test mode corresponding to the target test circuit; and feeding back the test data to the terminal equipment. The terminal equipment can analyze the test data fed back by the line controller, so as to obtain a test result. In the technical scheme, the actual working environment of the quantum chip can be completely simulated through the detection system, so that the actual detection of the superconducting quantum computer line can be realized, and the accuracy of the superconducting quantum computer line detection is improved. The line controller can automatically complete the switching of the lines, and the line damage caused by repeated plugging and unplugging is avoided. And various test circuits and corresponding test modes are deployed in the circuit controller, so that the automatic test requirements of different types of circuits can be met. For the detection of the low-temperature line, after the line to be detected is connected to the line controller and the cooling treatment of the line to be detected is completed, a user can input a test instruction on the terminal device, and at the moment, the terminal device can automatically realize the performance test of the line to be detected in the low-temperature environment through the interaction with the line controller and the signal source device, so that the test efficiency is improved, and especially in the case of a large-scale quantum measurement and control system, all line detection can be completed within an effective time.

Drawings

In order to more clearly illustrate the embodiments of the present application, the drawings needed for the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and that other drawings can be obtained by those skilled in the art without inventive effort.

Fig. 1 is a schematic structural diagram of a detection system of a superconducting quantum computer line according to an embodiment of the present application;

fig. 2 is a schematic structural diagram of a detection system provided with a vector network analyzer and a dc source table according to an embodiment of the present application;

fig. 3 is a structural diagram of a low-temperature reading test circuit according to an embodiment of the present disclosure;

fig. 4 is a flowchart of a method for detecting a superconducting quantum computer line according to an embodiment of the present disclosure.

Detailed Description

The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all the embodiments. All other embodiments obtained by a person of ordinary skill in the art based on the embodiments in the present application without any creative effort belong to the protection scope of the present application.

The terms "including" and "having," and any variations thereof in the description and claims of this application and the above-described drawings, are intended to cover non-exclusive inclusions. For example, a process, method, system, article, or apparatus that comprises a list of steps or elements is not limited to only those steps or elements but may include other steps or elements not expressly listed.

In order that those skilled in the art will better understand the disclosure, the following detailed description is given with reference to the accompanying drawings.

Next, a detection system of a superconducting quantum computer line provided in an embodiment of the present application is described in detail. Fig. 1 is a schematic structural diagram of a detection system of a superconducting quantum computer line provided in an embodiment of the present application, where the system includes a line controller 1, a signal source device 2, and a terminal device 3; various test circuits and corresponding test modes thereof are deployed in the circuit controller 1.

The terminal device 3 is respectively connected with the signal source device 2 and the line controller 1, and is used for issuing a switching instruction to the line controller 1 and controlling the signal source device 2 to output a test signal matched with the test instruction under the condition of receiving the test instruction; and analyzing the test data fed back by the line controller 1 to obtain a test result.

In the embodiment of the present application, the line controller 1 is provided with an interface for connecting with an external line.

In practical applications, the user may access the test line to the interface of the line controller 1 based on actual needs. The line controller 1 can be arranged in a low-temperature system, so that the detection requirement of the test line in a low-temperature environment is met. When the low temperature detection requirement of the test circuit is met, a user can start the low temperature system to perform cooling operation after the test circuit is connected to the interface of the circuit controller 1, so that the test circuit and the circuit controller 1 are operated in a low temperature environment. When the temperature reaches the test requirement, the user can input a test instruction through a human-computer interaction interface provided by the terminal device 3. For convenience of description, a test line operating in a low temperature environment may be referred to as a low temperature line.

After the room-temperature basic process detection is completed, the superconducting quantum chip needs to acquire a signal parameter which resonates with a quantum bit in a low-temperature environment.

In the embodiment of the present application, in order to distinguish different test lines for the terminal device 3, different connection numbers may be set for different test lines. The test instruction input by the user can carry the connection number corresponding to the current test circuit.

The terminal device 3 can determine the type of the current line to be tested according to the received test instruction, and then issue a switching instruction to the line controller 1.

The line controller 1 receives a switching instruction transmitted by the terminal device 3, can switch the line to a target test line matched with the switching instruction, and performs line testing according to a target test mode corresponding to the target test line; the test data is fed back to the terminal device 3. The terminal device 3 analyzes the test data fed back by the line controller 1 to obtain a test result.

The terminal device 3 may control the signal source device 2 to output a test signal matching the test instruction before issuing the switch instruction to the line controller 1, after issuing the switch instruction to the line controller 1, or while issuing the switch instruction to the line controller 1.

After the test of one test line is completed, the next test line can be switched to access the interface of the line controller 1. For the test of the low-temperature line, after the test of one test line is completed, the temperature rise treatment can be executed firstly, after the temperature rises to the room temperature, the next test line can be switched to be connected to the interface of the line controller 1, and then the cooling system is started, so that the test line and the line controller 1 operate in the low-temperature environment. When the temperature reaches the test requirement, the user can input the test instruction through the man-machine interaction interface provided by the terminal device 3. By analogy, the test of all test lines can be completed. In the whole implementation process, a user only needs to access a line to be tested to an interface of the line controller 1 and input a test instruction, and the test flow of the test line is automatically completed by the detection system.

In combination with the common line types in the superconducting quantum computer lines, the various test lines deployed in the line controller 1 may include a low-temperature read test line, a low-temperature drive test line, and a low-temperature control test line.

In order to meet the test signals required for different types of test lines, the signal source device 2 may comprise a vector network analyzer 21 and a dc source table 22.

Fig. 2 is a schematic structural diagram of a detection system provided with a vector network analyzer and a dc source table according to an embodiment of the present application, where the vector network analyzer 21 and the dc source table 22 may be connected to the terminal device 3 respectively. The vector network analyzer 21 may also be connected to the line controller 1, so that when the line controller 1 performs automatic switching of different lines, the vector network analyzer 21 may be automatically triggered to transmit microwave signals.

For a low-temperature control circuit, the frequency band of a quantum bit control signal is generally DC-500MHz, a cable is used as a twisted pair cable, and a plurality of attenuators, filters, DC blockers and signal synthesis modules are added on the cable. The common low-temperature control circuit consists of a twisted pair bearing a direct-current signal channel and a coaxial line bearing a microwave signal channel, and is synthesized by a signal synthesis module. In the low-temperature control line test, a vector network analyzer is required to test scattering parameters of the low-temperature control line. It is also necessary to determine whether or not a short-circuit condition exists by obtaining the converted resistance value of the twisted pair line using the dc source table 22.

Taking the low-temperature control circuit as an example, the terminal device 3 may issue a low-temperature control test circuit switching instruction to the circuit controller 1 when the test instruction is a low-temperature control circuit test instruction; controlling the direct current source meter 22 to provide direct current voltage for the accessed low-temperature control circuit; and controlling the vector network analyzer 21 to transmit a first microwave signal to the low-temperature control circuit.

The vector network analyzer 21 is configured to feed back the first microwave signal emitted to the low-temperature control line and the second microwave signal fed back by the low-temperature control line to the terminal device 3.

The direct current source meter 22 is used for feeding back the acquired current value on the low-temperature control line to the terminal device 3.

And the terminal device 3 is configured to receive the first microwave signal and the second microwave signal fed back by the vector network analyzer 21, and determine a scattering parameter corresponding to the low-temperature control line based on the first microwave signal and the second microwave signal.

The scattering parameters (Scatter parameters, S parameters) describe the frequency domain characteristics of the transmission channel, and when the serial link SI analysis is performed, it is an important link to obtain accurate scattering parameters of the channel, and almost all the characteristics of the transmission channel can be seen through the scattering parameters. Most problems with signal integrity, such as signal reflections, crosstalk, and loss, can be found from the scattering parameters.

The method for determining scattering parameters based on microwave signals belongs to the conventional implementation method, and is not described herein again.

The voltage output from the dc source table 22 is a fixed voltage, and a fixed voltage value corresponding to the dc source table 22 may be recorded in the terminal device 3 in advance. The terminal device 3 determines an actual resistance value corresponding to the low-temperature control circuit according to the fixed voltage value corresponding to the direct-current source meter 22 and the current value fed back by the direct-current source meter 22; when the scattering parameter is not matched with the set low-temperature control theoretical parameter or the resistance value is larger than the set threshold value, the short circuit or the short circuit of the accessed low-temperature control circuit is explained, so that the abnormality of the low-temperature control circuit can be judged.

The low-temperature control theoretical parameter can be a corresponding scattering parameter of the low-temperature control circuit in a normal operation state.

The set threshold value may be a value much larger than a corresponding resistance value in a normal operation state of the low-temperature control line.

In addition to the manner of setting the threshold value, the deviation ratio may be set. The deviation ratio may be a deviation ratio of the calculated resistance value to a resistance value corresponding to the low-temperature control line in a normal operation state, for example, the deviation ratio may be set to 50%, and a deviation of the calculated resistance value from a resistance value corresponding to the low-temperature control line in a normal operation state is greater than 50%, it may be determined that the low-temperature control line is abnormal and needs to be checked before the quantum chip is mounted.

The frequency band of a quantum bit driving signal of the low-temperature driving circuit is generally 4-8GHz, a cable is used as a coaxial cable, and a plurality of attenuators and filters are added on the cable. For the low-temperature driving circuit, only passive devices such as attenuator filters and the like are used on the whole circuit, influence of non-related devices is small, and due to efficiency consideration, detection can be performed according to a penetrating reflection line implementation mode, and detection can be performed by adopting a direct data comparison screening mode, namely, the circuit controller 1 is directly connected with two driving circuits, the vector network analyzer 21 is used for testing scattering parameters of the connecting circuit, and problem circuits are eliminated through cross comparison and data analysis.

Taking the low-temperature driving circuit as an example, the terminal device 3 may issue a low-temperature driving test circuit switching instruction to the circuit controller 1 under the condition that the test instruction is a low-temperature driving circuit test instruction; and controlling the vector network analyzer 21 to transmit a third microwave signal to the accessed low-temperature driving circuit.

The vector network analyzer 21 is configured to feed back the third microwave signal transmitted to the low-temperature driving circuit and the fourth microwave signal fed back by the low-temperature driving circuit to the terminal device 3.

The terminal device 3 is configured to receive the third microwave signal and the fourth microwave signal fed back by the vector network analyzer 21, and determine a scattering parameter corresponding to the low-temperature driving circuit based on the third microwave signal and the fourth microwave signal; and under the condition that the scattering parameter corresponding to the low-temperature driving circuit is not matched with the set low-temperature driving theoretical parameter, judging that the low-temperature driving circuit is abnormal.

For a low-temperature reading circuit, the frequency band of a quantum bit reading signal is generally 4-8GHz, a used cable is a coaxial cable and is divided into a reading signal input cable and a reading signal output cable, a plurality of attenuators and DC blockers are added on the reading signal input cable, and a plurality of circulators, low noise amplifiers and attenuators are added on the reading signal output cable.

In order to represent a reading circuit group completely comprising the amplifier, in the embodiment of the application, the low-temperature reading circuit can be detected by adopting a realization mode of penetrating a reflection line, the realization mode can be used for calibrating non-connection devices manufactured in non-coaxial media, such as a micro-strip, a coplanar waveguide and the like, and the principle is that a vector network analyzer 21 is used for testing scattering parameters of the low-temperature reading circuit to directly read an insertion loss value.

In order to ignore the influence of the non-relevant devices, the low-temperature reading test line included in the line controller 1 may include a penetration calibration piece, a reflection calibration piece, a line calibration piece, and a reference calibration piece. The transmissive collimating element, the reflective collimating element, the line collimating element and the reference collimating element may be arranged in a parallel fashion, the block diagram of which may be seen in fig. 3. Based on three types of calibration pieces of 'penetration', 'reflection' and 'line', 12 equations can be obtained, 12 unknowns are solved, and complete scattering parameters are obtained.

This implementation does not require precise characterization and is therefore well suited for use in low temperature environments where it is difficult to accurately characterize the standard.

Taking the low-temperature reading line as an example, when the test instruction is a low-temperature reading line test instruction, the line controller 1 may sequentially control the communication between each calibration piece in the low-temperature reading test line and the accessed low-temperature reading line when receiving the low-temperature reading line test instruction transmitted by the terminal device 3, and control the vector network analyzer 21 to transmit the initial microwave signal to the low-temperature reading line every time the communication is performed.

The vector network analyzer 21 is configured to feed back the initial microwave signal transmitted each time and the received target microwave signal fed back by the low-temperature reading line to the terminal device 3.

The terminal device 3 is configured to determine scattering parameters corresponding to the low-temperature reading line based on all initial microwave signals fed back by the vector network analyzer 21 and all target microwave signals corresponding to the initial microwave signals; and under the condition that the scattering parameters corresponding to the low-temperature reading circuit are not matched with the set low-temperature reading theoretical parameters, judging that the low-temperature control circuit is abnormal.

In order to simulate a real line environment as much as possible, the detection system provided by the embodiment of the application can customize an interface according to requirements, and is connected with a low-temperature cable by using the same interface scheme as that of the chip packaging box. Before chip testing, connecting a corresponding low-temperature cable to a line controller, and then cooling a system; and connecting the room temperature cable with signal source equipment, opening the narrow-band high electron mobility transistor amplifier, and completely simulating the environment of the quantum chip in real operation. And the terminal equipment is used for controlling the line controller and the signal source equipment to complete signal receiving and sending and corresponding line detection according to the corresponding connection number, and giving a corresponding line integrity report after the detection is completed.

It should be noted that the first, second, third and fourth definitions in this application for microwave signals are only for distinguishing different microwave signals, and no other limitations are made.

According to the technical scheme, the detection system of the superconducting quantum computer line comprises a line controller, signal source equipment and terminal equipment; the line controller is arranged in the low-temperature system, and various test lines and corresponding test modes thereof are deployed in the line controller. The terminal equipment is respectively connected with the signal source equipment and the line controller and used for issuing a switching instruction to the line controller under the condition of receiving the test instruction and controlling the signal source equipment to output a test signal matched with the test instruction. And the line controller receives the switching instruction transmitted by the terminal equipment, and switches the line into a target test line matched with the switching instruction, so that the current test requirement is met. The corresponding test modes of different types of test circuits can have differences, and the circuit controller can carry out circuit test according to the target test mode corresponding to the target test circuit; and feeding back the test data to the terminal equipment. The terminal equipment can analyze the test data fed back by the line controller, so as to obtain a test result. In the technical scheme, the actual working environment of the quantum chip can be completely simulated through the detection system, so that the actual detection of the superconducting quantum computer line can be realized, and the accuracy of the superconducting quantum computer line detection is improved. The line controller can automatically complete the switching of the lines, and avoids the line damage caused by repeated plugging and unplugging. And various test circuits and corresponding test modes are deployed in the circuit controller, so that the automatic test requirements of different types of circuits can be met. For the detection of the low-temperature line, after the line to be detected is connected to the line controller and the cooling treatment of the line to be detected is completed, a user can input a test instruction on the terminal equipment, and at the moment, the terminal equipment can automatically realize the performance test of the line to be detected in the low-temperature environment through the interaction with the line controller and the signal source equipment, so that the test efficiency is improved, and especially in the case of a large-scale quantum measurement and control system, all line detection can be completed within an effective time.

Fig. 4 is a flowchart of a detection method for a superconducting quantum computer line, which is applicable to the detection system for a superconducting quantum computer line, and the method includes:

s401: and receiving a switching instruction transmitted by the terminal equipment, and switching the line into a target test line matched with the switching instruction.

The switching instruction is an instruction issued to the line controller by the terminal device under the condition of receiving the test instruction.

S402: and carrying out line testing according to a target testing mode corresponding to the target testing line.

S403: and feeding back the test data to the terminal equipment so that the terminal equipment can analyze the test data to obtain a test result.

Optionally, performing a line test according to a target test mode corresponding to the target test line; feeding back the test data to the terminal device includes:

transmitting a first microwave signal to the low-temperature control circuit under the condition that the test instruction is a low-temperature control circuit test instruction;

feeding back the first microwave signal and a second microwave signal fed back by the low-temperature control circuit to the terminal equipment so that the terminal equipment can determine a scattering parameter corresponding to the low-temperature control circuit based on the first microwave signal and the second microwave signal; determining an actual resistance value corresponding to the low-temperature control circuit according to a fixed voltage value corresponding to the direct-current source meter and a current value fed back by the direct-current source meter; and judging that the low-temperature control circuit is abnormal under the condition that the scattering parameter is not matched with the set low-temperature control theoretical parameter or the resistance value is larger than a set threshold value.

Optionally, performing line testing according to a target testing mode corresponding to the target testing line; feeding back the test data to the terminal device includes:

transmitting a third microwave signal to the low-temperature driving circuit under the condition that the test instruction is a low-temperature driving circuit test instruction;

feeding the third microwave signal and a fourth microwave signal fed back by the low-temperature driving circuit back to the terminal equipment, so that the terminal equipment can determine a scattering parameter corresponding to the low-temperature driving circuit based on the third microwave signal and the fourth microwave signal; and under the condition that the scattering parameter corresponding to the low-temperature driving circuit is not matched with the set low-temperature driving theoretical parameter, judging that the low-temperature driving circuit is abnormal.

Optionally, the performing the line test according to the target test mode corresponding to the target test line includes:

and under the condition that the test instruction is a low-temperature reading line test instruction, sequentially controlling the communication between each calibration piece in the low-temperature reading test line and the accessed low-temperature reading line, and controlling the vector network analyzer to transmit an initial microwave signal to the low-temperature reading line every time the communication is executed.

Optionally, feeding back the test data to the terminal device includes:

the initial microwave signals transmitted each time and the received target microwave signals fed back by the low-temperature reading line are fed back to the terminal equipment, so that the terminal equipment determines scattering parameters corresponding to the low-temperature reading line based on all the initial microwave signals fed back by the vector network analyzer and all the target microwave signals corresponding to the initial microwave signals; and under the condition that the scattering parameters corresponding to the low-temperature reading circuit are not matched with the set low-temperature reading theoretical parameters, judging that the low-temperature control circuit is abnormal.

The description of the features in the embodiment corresponding to fig. 4 may refer to the related descriptions in the embodiments corresponding to fig. 1 to fig. 3, and is not repeated here.

According to the technical scheme, the detection system of the superconducting quantum computer line comprises a line controller, signal source equipment and terminal equipment; the line controller is arranged in the low-temperature system, and various test lines and corresponding test modes thereof are deployed in the line controller. The terminal equipment is respectively connected with the signal source equipment and the line controller and used for issuing a switching instruction to the line controller under the condition of receiving the test instruction and controlling the signal source equipment to output a test signal matched with the test instruction. And the line controller receives the switching instruction transmitted by the terminal equipment, and switches the line into a target test line matched with the switching instruction, so that the current test requirement is met. The corresponding test modes of different types of test circuits can have differences, and the circuit controller can carry out circuit test according to the target test mode corresponding to the target test circuit; and feeding back the test data to the terminal equipment. The terminal equipment can analyze the test data fed back by the line controller, so as to obtain a test result. In the technical scheme, the actual working environment of the quantum chip can be completely simulated through the detection system, so that the actual detection of the superconducting quantum computer line can be realized, and the accuracy of the superconducting quantum computer line detection is improved. The line controller can automatically complete the switching of the lines, and the line damage caused by repeated plugging and unplugging is avoided. And various test circuits and corresponding test modes are deployed in the circuit controller, so that the automatic test requirements of different types of circuits can be met. For the detection of the low-temperature line, after the line to be detected is connected to the line controller and the cooling treatment of the line to be detected is completed, a user can input a test instruction on the terminal equipment, and at the moment, the terminal equipment can automatically realize the performance test of the line to be detected in the low-temperature environment through the interaction with the line controller and the signal source equipment, so that the test efficiency is improved, and especially in the case of a large-scale quantum measurement and control system, all line detection can be completed within an effective time.

The above provides a detailed description of a system and a method for detecting a superconducting quantum computer line according to embodiments of the present application. The embodiments are described in a progressive manner in the specification, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other. The device disclosed by the embodiment corresponds to the method disclosed by the embodiment, so that the description is simple, and the relevant points can be referred to the method part for description.

Those of skill would further appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, computer software, or combinations of both, and that the various illustrative components and steps have been described above generally in terms of their functionality in order to clearly illustrate this interchangeability of hardware and software. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the implementation. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present application.

The above provides a detailed description of a system and method for detecting a superconducting quantum computer line. The principles and embodiments of the present invention are explained herein using specific examples, which are presented only to assist in understanding the method and its core concepts. It should be noted that, for those skilled in the art, it is possible to make various improvements and modifications to the present invention without departing from the principle of the present invention, and those improvements and modifications also fall within the scope of the claims of the present application.

Claims (11)

1. A detection system of superconducting quantum computer line is characterized by comprising a line controller, signal source equipment and terminal equipment; various test circuits and corresponding test modes thereof are deployed in the circuit controller; the line controller is arranged in the low-temperature system;

the terminal equipment is respectively connected with the signal source equipment and the line controller and is used for issuing a switching instruction to the line controller under the condition of receiving a test instruction and controlling the signal source equipment to output a test signal matched with the test instruction; analyzing the test data fed back by the line controller to obtain a test result;

the line controller is used for receiving a switching instruction transmitted by the terminal equipment, switching a line into a target test line matched with the switching instruction, and performing line test according to a target test mode corresponding to the target test line; and feeding back the test data to the terminal equipment.

2. The system for detection of superconducting quantum computer lines of claim 1, wherein the types of test lines deployed in the line controller include low temperature read test lines, low temperature drive test lines, and low temperature control test lines.

3. The system of claim 2, wherein the signal source device comprises a vector network analyzer and a dc source meter.

4. The system according to claim 3, wherein the terminal device is configured to issue a low-temperature control test line switching instruction to the line controller when the test instruction is a low-temperature control line test instruction; controlling the direct current source meter to provide direct current voltage for the accessed low-temperature control circuit; and controlling the vector network analyzer to transmit a first microwave signal to the low-temperature control circuit.

5. The system of claim 4, wherein the vector network analyzer is configured to feed back a first microwave signal transmitted to the low temperature control circuit and a second microwave signal fed back from the low temperature control circuit to the terminal device; the direct current source meter is used for feeding back the acquired current value on the low-temperature control circuit to the terminal equipment;

the terminal device is used for receiving the first microwave signal and the second microwave signal fed back by the vector network analyzer and determining a scattering parameter corresponding to the low-temperature control circuit based on the first microwave signal and the second microwave signal; determining an actual resistance value corresponding to the low-temperature control circuit according to a fixed voltage value corresponding to the direct-current source meter and a current value fed back by the direct-current source meter; and under the condition that the scattering parameter is not matched with the set low-temperature control theoretical parameter or the resistance value is larger than a set threshold value, judging that the low-temperature control circuit is abnormal.

6. The system according to claim 3, wherein the terminal device is configured to issue a low-temperature driving test line switching instruction to the line controller when the test instruction is a low-temperature driving line test instruction; and controlling the vector network analyzer to transmit a third microwave signal to the accessed low-temperature driving circuit.

7. The superconducting quantum computer line detection system of claim 6, wherein the vector network analyzer is configured to feed back a third microwave signal transmitted to the cryogenic drive line and a fourth microwave signal fed back from the cryogenic drive line to the terminal device;

the terminal equipment is used for receiving the third microwave signal and the fourth microwave signal fed back by the vector network analyzer and determining scattering parameters corresponding to the low-temperature driving circuit based on the third microwave signal and the fourth microwave signal; and under the condition that the scattering parameter corresponding to the low-temperature driving circuit is not matched with the set low-temperature driving theoretical parameter, judging that the low-temperature driving circuit is abnormal.

8. The superconducting quantum computer line inspection system of claim 3, wherein the cryogenic read test line comprises a penetration calibrator, a reflection calibrator, a line calibrator, and a reference calibrator.

9. The system of claim 8, wherein, in the case where the test instructions are low temperature read line test instructions,

the line controller is used for sequentially controlling the communication between each calibration piece in the low-temperature reading test line and the accessed low-temperature reading line under the condition of receiving a low-temperature reading line test instruction transmitted by the terminal equipment, and controlling the vector network analyzer to transmit an initial microwave signal to the low-temperature reading line every time the communication is executed.

10. The system according to claim 9, wherein the vector network analyzer is configured to feed back the initial microwave signal transmitted each time and the received target microwave signal fed back by the cryogenic reading line to the terminal device;

the terminal equipment is used for determining scattering parameters corresponding to the low-temperature reading line based on all the initial microwave signals fed back by the vector network analyzer and all the target microwave signals corresponding to the initial microwave signals; and under the condition that the scattering parameters corresponding to the low-temperature reading circuit are not matched with the set low-temperature reading theoretical parameters, judging that the low-temperature control circuit is abnormal.

11. A method for inspecting a superconducting quantum computer line, which is applied to the inspection system of the superconducting quantum computer line according to any one of claims 1 to 10, the method comprising:

receiving a switching instruction transmitted by terminal equipment, and switching a line into a target test line matched with the switching instruction; the switching instruction is an instruction issued to a line controller by the terminal equipment under the condition of receiving a test instruction;

performing line testing according to a target testing mode corresponding to the target testing line;

and feeding back the test data to the terminal equipment so that the terminal equipment can analyze the test data to obtain a test result.

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