CN115774463A - Method and circuit for digital induction heating temperature control debugging optimization - Google Patents
Method and circuit for digital induction heating temperature control debugging optimization Download PDFInfo
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Abstract
The invention relates to the technical field of induction heating, and discloses a method and a circuit for digital induction heating temperature control debugging and optimization. If the input measured workpiece temperature is received, comparing the measured workpiece temperature with a preset temperature to obtain an error value; calculating to obtain a driving duty ratio according to prestored calculation parameters and the error value; adjusting the output voltage of the temperature control debugging optimization circuit according to the driving duty ratio; and adjusting the output power of the temperature control debugging optimization circuit according to the output voltage so as to realize the temperature control of the temperature control debugging optimization circuit. The invention optimizes the induction heating temperature measurement method and circuit to improve the convenience of the use and operation of users and the stability of the machine operation.
Description
Technical Field
The invention relates to the technical field of induction heating, in particular to a method and a circuit for digital induction heating temperature control debugging and optimization.
Background
In the practical application of induction heating, the temperature of a heated workpiece needs to be controlled frequently, and because induction heating can heat a metal workpiece, a contact temperature measuring device such as a general thermocouple cannot be used, an infrared temperature measuring method is generally used in the field of induction heating temperature measurement.
The infrared temperature measurement signal is generally converted into a current signal and sent into a sampling circuit, the sampling frequency and the control frequency of more than 100K can be realized through a digital chip in the digital circuit control, and the rapid control effect can be realized by adopting a PID control algorithm. However, metal workpieces made of different materials have different magnetic conductivities and sizes, the magnetic conductivities are in direct proportion to the heating speed, and the sizes of the workpieces are in inverse proportion to the heating speed, so that the heating efficiencies of the different workpieces are inconsistent.
In the using process of a user, PID control parameters need to be continuously adjusted, debugging is troublesome, and the PID control parameters are opened for the user, so that error setting is easy to occur, and the machine is abnormal in operation. Therefore, the induction heating temperature measuring method needs to be optimized so as to improve the simplicity of the use and the operation of a user and the stability of the operation of a machine.
Disclosure of Invention
The invention aims to solve the technical problem of optimizing an induction heating temperature measurement method so as to improve the simplicity of use and operation of a user and the stability of machine operation.
In a first aspect, an embodiment of the present invention provides a method for digital induction heating temperature control debugging optimization, where the method for temperature control debugging optimization is applied to a temperature control debugging optimization circuit, and the method includes:
if the input measured workpiece temperature is received, comparing the measured workpiece temperature with a preset temperature to obtain an error value;
calculating to obtain a driving duty ratio according to prestored calculation parameters and the error value;
adjusting the output voltage of the temperature control debugging optimization circuit according to the driving duty ratio;
and adjusting the output power of the temperature control debugging optimization circuit according to the output voltage so as to realize the temperature control of the temperature control debugging optimization circuit.
Preferably, before the calculating the driving duty ratio according to the pre-stored calculation parameter and the error value, the method further includes:
determining a corresponding magnetic conduction type according to basic parameters input by a user; the basic parameters comprise magnetic permeability and effective heating area;
and determining a calculation parameter corresponding to the basic parameter according to a preset parameter configuration table and the magnetic conduction type.
Preferably, the calculating the driving duty ratio according to the pre-stored calculation parameter and the error value includes:
combining a preset proportional control algorithm, an integral control algorithm and a differential control algorithm into an operation model;
and inputting the calculation parameters and the error values into the operation model for operation to obtain the driving duty ratio.
Preferably, the temperature-controlled debugging optimization circuit comprises a control chip and a voltage-reducing circuit, and the output voltage of the temperature-controlled debugging optimization circuit is adjusted according to the driving duty cycle, including:
inputting the continuously varying drive duty cycle to a power drive module of the control chip to modify the power drive duty cycle;
and controlling a power module in the voltage reduction circuit according to the power driving duty ratio so as to regulate the output voltage of the voltage reduction circuit.
Preferably, before determining the corresponding magnetic conduction type according to the basic parameter input by the user, the method includes:
receiving a plurality of groups of debugging data and calculating the plurality of groups of debugging data through a digital signal processing model arranged in the control chip to obtain corresponding control parameters; the debugging data is obtained by testing a plurality of groups of different testing parameters, and the testing parameters comprise testing magnetic permeability and testing effective heating area;
and fitting multiple groups of test parameters and control parameters through a preset linear equation to obtain multiple groups of calculation parameters and form a parameter configuration table.
In a second aspect, an embodiment of the present invention provides a temperature control debugging optimization circuit for digital induction heating, where the temperature control debugging optimization circuit uses the steps of the temperature control debugging optimization method described in any of the embodiments of the first aspect, and the temperature control debugging optimization circuit includes a three-phase power grid, a three-phase uncontrolled rectifying circuit, a power regulating circuit, a high-frequency inverter circuit, and an induction coil;
the three-phase power grid is connected to the three-phase uncontrolled rectifying circuit, the power regulating circuit is respectively connected with the three-phase uncontrolled rectifying circuit and the high-frequency inverter circuit, and the high-frequency inverter circuit is connected with the induction coil;
the power regulating circuit comprises a first switch unit, a seventh diode and an inductor, wherein a first connecting end of the first switch unit is connected with the cathode of the seventh diode to form a first connecting point, a second connecting end of the first switch unit and the anode of the seventh diode are respectively connected into the three-phase uncontrolled rectifying circuit, and two ends of the inductor are respectively connected with the first connecting point and the high-frequency inverter circuit.
Preferably, the three-phase uncontrolled rectifying circuit comprises a first diode, a second diode, a third diode, a fourth diode, a fifth diode and a sixth diode; the anode of the first diode is connected with the cathode of the fourth diode to form a second connection point, the anode of the second diode is connected with the cathode of the fifth diode to form a third connection point, and the anode of the third diode is connected with the cathode of the sixth diode to form a fourth connection point; the cathode of the first diode, the cathode of the second diode and the cathode of the third diode are connected to form a fifth connection point, the fifth connection point is connected with the second connection end of the first switch unit, the anode of the fourth diode and the anode of the fifth diode are connected with the anode of the sixth diode to form a sixth connection point, and the sixth connection point is connected with the anode of the seventh diode; the first output end of the three-phase power grid is connected with the second connection point, the second output end of the three-phase power grid is connected with the third connection point, and the third output end of the three-phase power grid is connected with the fourth connection point.
Preferably, the high-frequency inverter circuit includes a second switch unit, a third switch unit, a fourth switch unit, a fifth switch unit and a high-frequency transformer, and the high-frequency transformer has a first pin, a second pin, a third pin and a fourth pin; the second connection end of the second switch unit and the second connection end of the third switch unit are respectively connected with one end of the inductor to form a seventh connection point, the first connection end of the fourth switch unit and the first connection end of the fifth switch unit are respectively connected with the sixth connection point, the first connection end of the second switch unit is connected with the second connection end of the fourth switch unit to form an eighth connection point, the first pin is connected with the eighth connection point, the first connection end of the third switch unit is connected with the second connection end of the fifth switch unit to form a ninth connection point, the second pin is connected with the ninth connection point, and the third pin and the fourth pin are respectively connected with two ends of the induction coil.
Preferably, the first switch unit includes a freewheeling diode and an IGBT field effect transistor, an emitter of the IGBT field effect transistor is a first connection end of the first switch unit, a collector of the IGBT field effect transistor is a second connection end of the first switch unit, a base of the IGBT field effect transistor is used for connecting a control chip, an anode of the freewheeling diode is connected with an emitter of the IGBT field effect transistor, and a cathode of the freewheeling diode is connected with a collector of the IGBT field effect transistor.
Preferably, the switch further comprises a second polarity capacitor, wherein the positive pole of the second polarity capacitor is connected with the seventh connection point, and the negative pole of the second polarity capacitor is connected with the sixth connection point.
Compared with the prior art, the invention has at least one of the following beneficial technical effects:
the alternating magnetic field is generated by the temperature control debugging optimization circuit to heat the metal workpiece, and the method for temperature control debugging optimization is applied to the temperature control debugging optimization circuit. If the input measured workpiece temperature is received, comparing the measured workpiece temperature with a preset temperature to obtain an error value; calculating to obtain a driving duty ratio according to prestored calculation parameters and the error value; adjusting the output voltage of the temperature control debugging optimization circuit according to the driving duty ratio; and adjusting the output power of the temperature control debugging optimization circuit according to the output voltage so as to realize the temperature control of the temperature control debugging optimization circuit. Therefore, the user only needs to input the magnetic permeability of the metal and the effective heating area of the workpiece, the control chip can receive data input by the user, the current combination is identified through a program preset in the control chip, and then the corresponding calculation parameters are selected. For users, the debugging process of the calculation parameters in the PID controller is greatly simplified, and the simplicity of the use and the operation of the users and the stability of the operation of the machine are improved.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present invention, the drawings required to be used in the description of the embodiments are briefly introduced below, and it is obvious that the drawings in the description below are some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on the drawings without creative efforts.
Fig. 1 is a circuit schematic diagram of a temperature-controlled debugging optimization circuit according to an embodiment of the present invention.
Fig. 2 is a schematic flow chart of a method for temperature control debugging and optimization according to an embodiment of the present invention.
Fig. 3 is a schematic view of an application scenario of the method for temperature control debugging and optimization according to the embodiment of the present invention.
Fig. 4 is a schematic sub-flow chart of a method for temperature control debugging and optimization according to an embodiment of the present invention.
Fig. 5 is another sub-flow diagram of the method for temperature control debugging and optimization according to the embodiment of the present invention.
Fig. 6 is a schematic sub-flow chart of a method for temperature control debugging and optimization according to an embodiment of the present invention.
Fig. 7 is a schematic view of another sub-flow of the method for temperature control debugging and optimization according to the embodiment of the present invention.
Description of reference numerals: n, three-phase power grid; l1, inductance; l2, an induction coil; m1, a first switch unit; m2, a second switch unit; m3, a third switching unit; m4, a fourth switch unit; m5, a fifth switch unit; t, a high-frequency transformer; d1, a first diode; d2, a second diode; d3, a third diode; d4, a fourth diode; d5, a fifth diode; d6, a sixth diode; d7, a seventh diode; c1, a first polarity capacitor; c2, a second polarity capacitor; c3, non-polar capacitance.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, but not all, embodiments of the present invention. All other embodiments, which can be obtained by a person skilled in the art without any inventive step based on the embodiments of the present invention, are within the scope of the present invention.
It will be understood that the terms "comprises" and/or "comprising," when used in this specification and the appended claims, specify the presence of stated features, integers, steps, operations, elements, and/or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and/or groups thereof.
The problem that in the prior art, when a user uses a digital induction heating circuit to heat a workpiece, debugging of PID control parameters is troublesome, and opening of the PID control parameters causes error setting easily for the user, so that the machine runs abnormally is solved. The embodiment of the invention provides a debugging and optimizing circuit for digital induction heating temperature control. Referring to fig. 1, fig. 1 is a schematic circuit diagram of a temperature-controlled debugging optimization circuit according to an embodiment of the present invention.
The temperature control debugging optimization circuit comprises a three-phase power grid N, a three-phase uncontrolled rectifying circuit, a power regulating circuit, a high-frequency inverter circuit and an induction coil L2. The three phases A, B and C of the three-phase power grid N are respectively connected to a three-phase uncontrolled rectifying circuit to output direct current; the power regulating circuit is respectively connected with the three-phase uncontrolled rectifying circuit and the high-frequency inverter circuit, and the high-frequency inverter circuit carries out alternating current action through pulse signals by regulating the output voltage of the three-phase uncontrolled rectifying circuit and outputting the output voltage to the high-frequency inverter circuit so as to regulate the high-frequency alternating current voltage output by the high-frequency inverter circuit; the high-frequency transformer T is connected with the induction coil L2, and high-frequency alternating voltage is output to the induction coil L2 to generate an alternating magnetic field so as to heat the metal workpiece.
Specifically, the power adjusting circuit includes a first switch unit M1, a seventh diode D7, and an inductor L1. The first connection end of the first switch unit M1 is connected with the negative electrode of the seventh diode D7 to form a first connection point, the second connection end of the first switch unit M1 and the positive electrode of the seventh diode D7 are respectively connected to the three-phase uncontrolled rectifying circuit, and the two ends of the inductor L1 are respectively connected with the first connection point and the high-frequency inverter circuit. In this embodiment, the first switch unit M1 includes a freewheeling diode and an IGBT field-effect transistor, an emitter of the IGBT field-effect transistor is a first connection end of the first switch unit M1, a collector of the IGBT field-effect transistor is a second connection end of the first switch unit M1, a base of the IGBT field-effect transistor is used for connecting a control chip to receive a control signal, the freewheeling diode is connected to an emitter of the IGBT field-effect transistor, and a cathode of the freewheeling diode is connected to a collector of the IGBT field-effect transistor.
The three-phase uncontrolled rectifying circuit comprises a first diode D1, a second diode D2, a third diode D3, a fourth diode D4, a fifth diode D5 and a sixth diode D6. The anode of the first diode D1 is connected with the cathode of the fourth diode D4 to form a second connection point, the anode of the second diode D2 is connected with the cathode of the fifth diode D5 to form a third connection point, and the anode of the third diode D3 is connected with the cathode of the sixth diode D6 to form a fourth connection point; the cathode of the first diode D1, the cathode of the second diode D2 and the cathode of the third diode D3 are connected to form a fifth connection point, the fifth connection point is connected with the second connection end of the first switch unit M1, the anode of the fourth diode D4, the anode of the fifth diode D5 and the anode of the sixth diode D6 are connected to form a sixth connection point, and the sixth connection point is connected with the anode of the seventh diode D7. The first output end of the three-phase power grid N is phase A, the phase A is connected with the second connection point, the second output end of the three-phase power grid N is phase B, the phase B is connected with the third connection point, the third output end of the three-phase power grid N is phase C, and the phase C is connected with the fourth connection point.
The high-frequency inverter circuit comprises a second switching unit M2, a third switching unit M3, a fourth switching unit M4, a fifth switching unit M5 and a high-frequency transformer T, wherein the high-frequency transformer T is provided with a first pin, a second pin, a third pin and a fourth pin. Specifically, the second connection end of the second switch unit M2 and the second connection end of the third switch unit M3 are respectively connected to one end of the inductor L1 to form a seventh connection point, the first connection end of the fourth switch unit M4 and the first connection end of the fifth switch unit M5 are respectively connected to the sixth connection point, the first connection end of the second switch unit M2 is connected to the second connection end of the fourth switch unit M4 to form an eighth connection point, and the first pin is connected to the eighth connection point; the first connection end of the third switch unit M3 is connected to the second connection end of the fifth switch unit M5 to form a ninth connection point, the second pin is connected to the ninth connection point, and the third pin and the fourth pin are respectively connected to two ends of the induction coil L2.
In the present embodiment, the second switch unit M2, the third switch unit M3, the fourth switch unit M4 and the fifth switch unit M5 all include a switch diode and a MOS transistor. Wherein, the MOS tube body is a field effect tube enhanced N-MOS; the source electrode of the MOS tube is a first connecting end of each switch unit, the drain electrode of the MOS tube is a second connecting end of each switch unit, the grid electrode of the MOS tube is a control end of each switch unit, and the grid electrode of the MOS tube is used for connecting a control chip to receive a control signal; the anode of the switch diode is connected with the source electrode of the MOS tube, and the cathode of the switch diode is connected with the drain electrode of the MOS tube.
The temperature control debugging optimization circuit further comprises a first polar capacitor C1, a second polar capacitor C2 and a non-polar capacitor C3. The positive electrode of the first polarity capacitor C1 is connected with the fifth connection point, and the negative electrode of the first polarity capacitor C1 is connected with the sixth connection point; the anode of the second polarity capacitor C2 is connected with the seventh connection point, and the cathode of the second polarity capacitor C2 is connected with the sixth connection point; and two ends of the non-polar capacitor C3 are respectively connected with a third pin and a fourth pin of the high-frequency transformer T. Here, the first polar capacitor C1 and the second polar capacitor C2 have a voltage stabilizing and filtering function, respectively, and the non-polar capacitor C3 has a resonance function.
On the other hand, the embodiment of the invention provides a method for debugging and optimizing digital induction heating temperature control, which optimizes the existing induction heating temperature measurement method so as to improve the simplicity of use and operation of a user and the stability of machine operation. Referring to fig. 2 and fig. 3, fig. 2 is a schematic flow chart of a temperature control debugging optimization method according to an embodiment of the present invention, and fig. 3 is a schematic application scenario diagram of the temperature control debugging optimization method according to the embodiment of the present invention.
In this embodiment, the method for temperature control debugging and optimizing is applied to a control chip of a temperature control debugging and optimizing circuit, and a specific implementation process of the method for temperature control debugging and optimizing provided by the embodiment of the present invention is described in detail below. As shown in fig. 2, the method includes steps S110 to S140.
S110, if the input measured workpiece temperature is received, comparing the measured workpiece temperature with a preset temperature to obtain an error value.
In this embodiment, the temperature control is performed by using a PID controller, which is a proportional-integral-derivative controller, and is composed of a proportional unit, an integral unit, and a derivative unit, and is set by using three parameters, namely a proportional parameter (Kp), an integral parameter (Ki), and a derivative parameter (Kd), and the PID controller is mainly suitable for a system in which basic linearity and dynamic characteristics do not change with time. The temperature of the workpiece is measured by an infrared thermometer and compared with a temperature value preset in a control chip to obtain an error value.
Referring to fig. 4 and 5, in an embodiment, the step S110 includes the following steps: s101, the control chip receives a plurality of groups of debugging data, and calculates the plurality of groups of debugging data through a digital signal processing model arranged in the control chip to obtain corresponding control parameters; the debugging data is obtained by testing a plurality of groups of different testing parameters, and the testing parameters comprise testing magnetic permeability and testing effective heating area; s102, fitting multiple groups of test parameters and control parameters through a preset linear equation of two elements to obtain multiple groups of calculation parameters, and forming a parameter configuration table; s111, determining a corresponding magnetic conduction type according to basic parameters input by a user; the basic parameters comprise magnetic permeability and effective heating area; and S112, determining a calculation parameter corresponding to the basic parameter according to a preset parameter configuration table and the magnetic conduction type.
Specifically, in order to obtain accurate control parameters, the present embodiment fits the relationship between the control parameters and the magnetic permeability and the effective heating area through a system of linear equations in two dimensions, where the linear equations in two dimensions are as follows:
Kp＝X*Kxp+Y*Kyp+Bp；
K i＝X*Kxi+Y*Kyi+Bi；
Kd＝X*Kxd+Y*Kyd+Bd；
wherein X is magnetic permeability, and Y is effective heating area. In order to determine the values of Kxp, kyp, kxi, kyi, kxd, kyd, bp, bi, and Bd, multiple experiments are performed by setting different magnetic permeabilities X and different effective heating areas Y to obtain multiple sets of debugging data, specifically, in this embodiment, 30 sets of debugging data are obtained; subsequently, a least square linear fitting method is adopted, and the control parameters are calculated by a digital signal processing model (MATLAB tool) as follows: kxp = -3643.5, kyp =604.3, bp =3457.1; kxi = -47.85, kyi =6.93, bi =43.70; kxd = -47.40, kyd =7.32, bd =45.21.
After the control parameters are determined, in order to improve the convenience of the method for debugging and optimizing the temperature control, a user can set a program preset in a control chip so as to divide the metal into three types according to the magnetic permeability: the first type is metal with magnetic permeability more than 1000, and the value X =1; the second type is metal with magnetic permeability of 250-1000, and the value X =0.5; the third type is a metal with a permeability of 250 or less, and the value X =0.25. In addition, the effective heating area of the workpiece is divided into three types, the first type is that the effective heating area is less than 1 square centimeter, and the value Y =1; the second type is that the effective heating area is 1-6 square centimeters, and the value Y =3; the third type is that the effective heating area is more than 6 square centimeters, and the value Y =6.
Corresponding X and Y values obtained according to the classification mode are input into a linear equation system, nine combinations shown in the following table can be obtained, correspondingly, the workpiece is included in the nine conditions, and a user only needs to select a magnetic permeability category and an effective heating area category to obtain corresponding calculation parameters.
Table (b): setting up a combination form
Further, the magnetic permeability is respectively marked as high, medium and low, and respectively corresponds to a first class, a second class and a third class; the effective heating areas are marked as large, medium and small respectively and correspond to a first type, a second type and a third type respectively. In the setting of the monitoring interface, magnetic permeability 1 corresponds to X =1 (high), 2 corresponds to X =0.5 (medium), and 3 corresponds to X =0.25 (small); the effective heating area 1 corresponds to Y =6 (large), 2 corresponds to Y =3 (medium), and 3 corresponds to Y =1 (small). The user only needs to input the magnetic permeability of the metal and the effective heating area of the workpiece, the control chip can receive data input by the user, and the current combination is identified through a program preset in the control chip, so that the corresponding calculation parameters are selected.
For example, the metal magnetic permeability input by the user on the monitoring interface is 1, the effective heating area of the workpiece is 2, and after the control chip receives the two numerical values, the two numerical values are automatically identified as high and medium combinations, and then are automatically selected: kp =1626, ki =16.644 and Kd =19.78, without adjusting Kp, ki and Kd continuously, to obtain the best heating effect, and greatly simplify the adjusting process of the calculated parameters in the PID controller for users.
And S120, calculating to obtain a driving duty ratio according to a prestored calculation parameter and the error value.
Referring to fig. 6, in an embodiment, step S120 includes the steps of: s121, combining a preset proportional control algorithm, an integral control algorithm and a differential control algorithm into an operation model; and S122, inputting the calculation parameters automatically selected by the control chip according to the numerical values input by the user and the error value obtained by measuring the temperature of the workpiece and the preset temperature into the operation model for operation to obtain the driving duty ratio.
And S130, adjusting the output voltage of the temperature control debugging optimization circuit according to the driving duty ratio.
Referring to fig. 7, in an embodiment, the temperature-controlled debugging optimization circuit includes a voltage-reducing circuit, and step S130 includes the steps of: s131, inputting the continuously changed driving duty ratio to a power driving module of the control chip so as to modify the power driving duty ratio; and S132, controlling a power module in the voltage reduction circuit according to the power driving duty ratio so as to adjust the output voltage of the voltage reduction circuit. In the actual working process, the output voltage of the voltage reduction circuit is adjusted by continuously and real-timely modifying the power drive duty ratio through a plurality of different drive duty ratios.
S140, adjusting the output power of the temperature control debugging optimization circuit according to the output voltage so as to realize the temperature control of the temperature control debugging optimization circuit.
The method and the circuit for digital induction heating temperature control debugging optimization in the embodiment of the invention have the following implementation principles: the alternating magnetic field is generated by the temperature control debugging optimization circuit to heat the metal workpiece, and the temperature control debugging optimization method is applied to the temperature control debugging optimization circuit. If receiving input measured workpiece temperature, comparing the measured workpiece temperature with a preset temperature to obtain an error value; calculating to obtain a driving duty ratio according to prestored calculation parameters and the error value; adjusting the output voltage of the temperature control debugging optimization circuit according to the driving duty ratio; and adjusting the output power of the temperature control debugging optimization circuit according to the output voltage so as to realize the temperature control of the temperature control debugging optimization circuit. Therefore, a user only needs to input the magnetic permeability of the metal and the effective heating area of the workpiece, the control chip can receive data input by the user, the current combination is identified through a program preset in the control chip, and then the corresponding calculation parameters are selected. For a user, the debugging process of the calculation parameters in the PID controller is greatly simplified, and the simplicity of the use and the operation of the user and the stability of the machine operation are improved.
While the invention has been described with reference to specific embodiments, the invention is not limited thereto, and various equivalent modifications and substitutions can be easily made by those skilled in the art within the technical scope of the invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.
Claims (10)
1. A method for digital induction heating temperature control debugging optimization is applied to a temperature control debugging optimization circuit, and is characterized by comprising the following steps:
if the input measured workpiece temperature is received, comparing the measured workpiece temperature with a preset temperature to obtain an error value;
calculating to obtain a driving duty ratio according to prestored calculation parameters and the error value;
adjusting the output voltage of the temperature control debugging optimization circuit according to the driving duty ratio;
and adjusting the output power of the temperature control debugging optimization circuit according to the output voltage so as to realize the temperature control of the temperature control debugging optimization circuit.
2. The method according to claim 1, wherein before calculating the driving duty cycle according to the pre-stored calculation parameters and the error value, the method further comprises:
determining a corresponding magnetic conduction type according to basic parameters input by a user; the basic parameters comprise magnetic permeability and effective heating area;
and determining a calculation parameter corresponding to the basic parameter according to a preset parameter configuration table and the magnetic conduction type.
3. The method according to claim 1, wherein the step of calculating the driving duty cycle according to the pre-stored calculation parameters and the error value comprises:
combining a preset proportional control algorithm, an integral control algorithm and a differential control algorithm into an operation model;
and inputting the calculation parameters and the error values into the operation model for operation to obtain the driving duty ratio.
4. The method according to claim 1, wherein the temperature-controlled debugging and optimizing circuit comprises a control chip and a voltage-reducing circuit, and the adjusting of the output voltage of the temperature-controlled debugging and optimizing circuit according to the driving duty cycle comprises:
inputting the continuously varying drive duty cycle to a power drive module of the control chip to modify the power drive duty cycle;
and controlling a power module in the voltage reduction circuit according to the power driving duty ratio so as to adjust the output voltage of the voltage reduction circuit.
5. The method according to claim 2, wherein before determining the corresponding magnetic permeability type according to the basic parameters input by the user, the method comprises:
receiving a plurality of groups of debugging data and calculating the plurality of groups of debugging data through a digital signal processing model arranged in the control chip to obtain corresponding control parameters; the debugging data is obtained by testing a plurality of groups of different testing parameters, and the testing parameters comprise testing magnetic permeability and testing effective heating area;
and fitting multiple groups of test parameters and control parameters through a preset linear equation to obtain multiple groups of calculation parameters and form a parameter configuration table.
6. A debugging optimization circuit for digital induction heating temperature control, which is characterized in that the debugging optimization circuit for temperature control uses the steps of the method for debugging optimization for temperature control according to any one of claims 1 to 5, and comprises a three-phase power grid, a three-phase non-controlled rectifying circuit, a power regulating circuit, a high-frequency inverter circuit and an induction coil;
the three-phase power grid is connected with the three-phase uncontrolled rectifying circuit, the power regulating circuit is respectively connected with the three-phase uncontrolled rectifying circuit and the high-frequency inverter circuit, and the high-frequency inverter circuit is connected with the induction coil;
the power regulating circuit comprises a first switch unit, a seventh diode and an inductor, wherein a first connecting end of the first switch unit is connected with a negative electrode of the seventh diode to form a first connecting point, a second connecting end of the first switch unit and a positive electrode of the seventh diode are respectively connected to the three-phase uncontrolled rectifying circuit, and two ends of the inductor are respectively connected with the first connecting point and the high-frequency inverter circuit.
7. The debugging and optimizing circuit for digital induction heating temperature control according to claim 6, wherein the three-phase uncontrolled rectifying circuit comprises a first diode, a second diode, a third diode, a fourth diode, a fifth diode and a sixth diode; the anode of the first diode is connected with the cathode of the fourth diode to form a second connection point, the anode of the second diode is connected with the cathode of the fifth diode to form a third connection point, and the anode of the third diode is connected with the cathode of the sixth diode to form a fourth connection point; the cathode of the first diode, the cathode of the second diode and the cathode of the third diode are connected to form a fifth connection point, the fifth connection point is connected with the second connection end of the first switch unit, the anode of the fourth diode and the anode of the fifth diode are connected with the anode of the sixth diode to form a sixth connection point, and the sixth connection point is connected with the anode of the seventh diode; the first output end of the three-phase power grid is connected with the second connection point, the second output end of the three-phase power grid is connected with the third connection point, and the third output end of the three-phase power grid is connected with the fourth connection point.
8. The debugging and optimizing circuit for digital induction heating temperature control according to claim 7, wherein the high-frequency inverter circuit comprises a second switch unit, a third switch unit, a fourth switch unit, a fifth switch unit and a high-frequency transformer, and the high-frequency transformer has a first pin, a second pin, a third pin and a fourth pin; the second connection end of the second switch unit and the second connection end of the third switch unit are respectively connected with one end of the inductor to form a seventh connection point, the first connection end of the fourth switch unit and the first connection end of the fifth switch unit are respectively connected with the sixth connection point, the first connection end of the second switch unit is connected with the second connection end of the fourth switch unit to form an eighth connection point, the first pin is connected with the eighth connection point, the first connection end of the third switch unit is connected with the second connection end of the fifth switch unit to form a ninth connection point, the second pin is connected with the ninth connection point, and the third pin and the fourth pin are respectively connected with two ends of the induction coil.
9. The debugging and optimizing circuit for the digital induction heating temperature control according to claim 6, wherein the first switch unit comprises a freewheeling diode and an IGBT field effect transistor, an emitter of the IGBT field effect transistor is a first connection end of the first switch unit, a collector of the IGBT field effect transistor is a second connection end of the first switch unit, a base of the IGBT field effect transistor is used for connecting a control chip, an anode of the freewheeling diode is connected with an emitter of the IGBT field effect transistor, and a cathode of the freewheeling diode is connected with the collector of the IGBT field effect transistor.
10. The debugging and optimizing circuit for digital induction heating temperature control according to claim 8, further comprising a second polarity capacitor, wherein the positive pole of said second polarity capacitor is connected to said seventh connection point, and the negative pole of said second polarity capacitor is connected to said sixth connection point.
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