CN115754661A - Chip circuit testing device and chip testing system - Google Patents
Chip circuit testing device and chip testing system Download PDFInfo
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- CN115754661A CN115754661A CN202211076320.6A CN202211076320A CN115754661A CN 115754661 A CN115754661 A CN 115754661A CN 202211076320 A CN202211076320 A CN 202211076320A CN 115754661 A CN115754661 A CN 115754661A
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- 238000012360 testing method Methods 0.000 title claims abstract description 101
- 230000006870 function Effects 0.000 claims description 12
- 230000006386 memory function Effects 0.000 claims description 3
- 238000010998 test method Methods 0.000 claims description 3
- 238000001514 detection method Methods 0.000 abstract description 5
- 230000005855 radiation Effects 0.000 description 2
- 230000004075 alteration Effects 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000007547 defect Effects 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
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Abstract
The invention provides a chip circuit testing device and a chip testing system, and relates to the technical field of chip circuit testing. This chip circuit testing arrangement, the on-line screen storage device comprises a base, equal fixedly connected with side direction backup pad on the outer wall of base both sides, two side direction backup pad up end is close to the equal cover of front and back position department and is equipped with the cylinder, is located both sides cylinder up end difference fixedly connected with support frame and No. two support frames, fixed regulation spout and the spacing spout of having seted up respectively on the relative one side outer wall of support frame and No. two support frames, it is connected with accommodate the lead screw to rotate between the inner wall around the regulation spout, the spacing slide bar of fixedly connected with between the inner wall around the spacing spout, adjusting the lead screw outer wall goes up the screw thread and has cup jointed adjust the slider, slide and cup jointed limit slider on the spacing slide bar outer wall. The device overall structure reasonable in design, convenient to use not only can carry out high-efficient comprehensive detection to the chip circuit, can conveniently detect moreover and finish the back workman and take off the chip, reduces intensity of labour, saves time.
Description
Technical Field
The invention relates to the technical field of chip circuit testing, in particular to a chip circuit testing device and a chip testing system.
Background
In brief, chip testing is to use a special Automatic Test Equipment (ATE) to check whether the manufactured chip meets certain requirements for its functions and performance. Therefore, chip testing can include many contents, which can be divided into dc parameter testing, functional testing, and mixed signal parameter testing, and different types of chips have different requirements for testing.
The conventional test is generally carried out manually, the manual test is easy to omit under the condition of more passages, the broken circuit point is not easy to find, in addition, after the chip test, the chip is troublesome to take down due to the fact that pins are inserted into pin slots, and based on the chip test device and the chip test system, the chip circuit test device and the chip test system are provided.
Disclosure of Invention
Technical problem to be solved
Aiming at the defects of the prior art, the invention provides a chip circuit testing device and a chip testing system, which solve the problems of low efficiency, low accuracy and high chip removal difficulty in manual detection.
(II) technical scheme
In order to achieve the purpose, the invention is realized by the following technical scheme: a chip circuit testing device comprises a base, wherein lateral supporting plates are fixedly connected to outer walls of two sides of the base, air cylinders are sleeved on the upper end faces of the two lateral supporting plates close to the front end and the rear end of the two lateral supporting plates, the upper end faces of the air cylinders positioned on two sides are fixedly connected with a first supporting frame and a second supporting frame respectively, an adjusting chute and a limiting chute are fixedly formed in the outer wall of one side of the first supporting frame and the second supporting frame opposite to the first supporting frame respectively, an adjusting screw rod is rotatably connected between the front inner wall and the rear inner wall of the adjusting chute, a limiting slide rod is fixedly connected between the front inner wall and the rear inner wall of the limiting chute, an adjusting slider is sleeved on the outer wall of the adjusting screw rod in a threaded manner, a limiting slider is slidably sleeved on the outer wall of the limiting slide rod, a truss is fixedly connected between the adjusting slider and the limiting slider, a transverse chute is fixedly formed in the inner walls of two sides of the transverse chute, limiting wheel grooves are fixedly formed in the upper end faces of the sliding supporting plates close to the front and the two sides, supporting plates, supporting pulleys are all provided with supporting pulleys, transverse shafts are fixedly sleeved on the inner ends of the two supporting frames, transverse shafts are fixedly connected with a hanger, two transverse shaft detectors, and two transverse detectors are fixedly connected with the transverse shafts respectively;
the improved multifunctional testing platform comprises a base and is characterized in that a testing platform is fixedly connected to the upper end face of the base, a groove is fixedly formed in the middle of the upper end face of the testing platform, a placing platform is movably arranged in the groove, rectangular sliding grooves are fixedly formed in the two sides of the lower end face of the groove, a rectangular sliding block is slidably sleeved at the inner ends of the rectangular sliding grooves, a lifting lead screw is sleeved at the inner end of the rectangular sliding block in a threaded manner, a T-shaped rotating shaft is fixedly connected to the lower end face of the lifting lead screw, gear grooves are fixedly formed in the inner ends of the testing platform, driving rods are rotatably connected between the inner walls of the two sides of the gear grooves, driving gears are fixedly sleeved on the outer walls of the two sides of the driving rods, and a signal parameter testing circuit, a storage function testing circuit and a chip testing terminal device are fixedly arranged on the base respectively.
Preferably, the rear end faces of the two hangers are fixedly connected with driving motors, the output ends of the driving motors are fixedly connected with a driving gear, the rear end of the transverse shaft penetrates through the hangers and is fixedly connected with a driven gear, and the driven gear is meshed with the driving gear.
Preferably, the lower ends of the two T-shaped rotating shafts penetrate through the gear groove and are fixedly connected with two driven gears, the two driven gears are respectively meshed with the two driving gears, and one end of the driving rod penetrates through the test platform and is fixedly connected with a rocker.
Preferably, a plurality of pin grooves are fixedly formed in the upper end face of the test platform.
Preferably, the rear end face of the first support frame is fixedly connected with an adjusting motor, and the output end of the adjusting motor penetrates through the adjusting chute and is fixedly connected with the adjusting screw rod.
Preferably, the signal parameter testing circuit and the storage function testing circuit are both electrically connected with the chip testing terminal device.
Preferably, the rectangular sliding block is in sliding fit with the rectangular sliding groove.
A chip test system comprises the following test procedures:
s1, firstly, driving an adjusting screw rod to rotate through an adjusting motor, so as to drive an adjusting slide block to move, and further driving a truss to move back and forth;
s2, driving a first driving gear to rotate through a driving motor, further driving a first driven gear to rotate, driving a supporting pulley to rotate through a cross shaft, further driving a mounting frame to move through a hanging frame, further driving an ultrasonic detector and a ray detector to integrally scan a chip, and finding out a circuit breaking point;
and S3, connecting the chip testing terminal equipment through the signal parameter testing circuit and the storage function testing circuit to test the chip signal and the storage function.
(III) advantageous effects
The invention provides a chip circuit testing device and a chip testing system. The method has the following beneficial effects:
1. the invention provides a chip circuit testing device and a chip testing system, wherein the device further drives a driven gear to rotate by driving a driving gear to rotate by adopting a driving motor, further drives a cross shaft to rotate, further drives a supporting pulley to rotate, further enables an ultrasonic detector and a ray detector to move, drives a truss to move by matching with an adjusting motor, realizes integral scanning of a chip circuit board, feeds the chip circuit board back to a terminal, can test the open circuit position, can quickly judge the qualified condition of the circuit board, and simultaneously utilizes a chip testing terminal device to test a signal parameter testing circuit and a storage function testing circuit, thereby greatly improving the detection efficiency.
2. The invention provides a chip circuit testing device and a chip testing system, wherein after a chip circuit board is tested, a driving rod can be driven to rotate by utilizing a rocker, a second driving gear is further driven to rotate, a second driven gear is further driven to rotate, and a lifting lead screw is further driven to rotate through a T-shaped rotating shaft, so that a rectangular sliding block is driven to move up and down, pins of a chip can be driven to be disengaged from pin grooves by lifting a placing platform, the chip can be conveniently taken down after the chip is detected, and the chip testing device is very convenient.
3. The invention provides a chip circuit testing device and a chip testing system, the device has reasonable integral structure design and convenient use, not only can carry out efficient and comprehensive detection on a chip circuit, but also can facilitate workers to take off the chip after the detection is finished, thereby reducing the labor intensity and saving the time.
Drawings
FIG. 1 is a schematic diagram of the main structure of the present invention;
FIG. 2 is a schematic front sectional view of a partial structure of the present invention;
FIG. 3 is an enlarged view of the structure at A in FIG. 2;
FIG. 4 is a side view of a portion of the support plate of the present invention;
FIG. 5 is a top plan view of the upper end of the base of the present invention;
fig. 6 is a schematic view of a bottom connection part of the placement platform of the present invention.
Wherein, 1, a base; 2. a lateral support plate; 3. a cylinder; 4. a first support frame; 5. a second support frame; 6. adjusting the sliding chute; 7. a limiting chute; 8. adjusting the screw rod; 9. a limiting slide bar; 10. adjusting the slide block; 11. a limiting slide block; 12. a truss; 13. a transverse chute; 14. a sliding support plate; 15. a limiting wheel groove; 16. a support pulley; 17. a horizontal axis; 18. a hanger; 19. a mounting frame; 20. an ultrasonic detector; 21. a ray detector; 22. a first driven gear; 23. a drive motor; 24. a first driving gear; 25. a test platform; 26. a groove; 27. placing a platform; 28. a rectangular chute; 29. a rectangular slider; 30. a lifting screw rod; 31. a T-shaped rotating shaft; 32. a gear groove; 33. a second driven gear; 34. a drive rod; 35. a second driving gear; 36. a rocker; 37. a lead groove; 38. a signal parameter test circuit; 39. a memory function test circuit; 40. chip test terminal equipment; 41. the motor is regulated.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Example (b):
as shown in FIGS. 1-6, the embodiment of the invention provides a chip circuit testing device, which comprises a base 1, lateral supporting plates 2 are fixedly connected on the outer walls of two sides of the base 1, cylinders 3 are sleeved on the upper end surfaces of the two lateral supporting plates 2 near the front and rear positions, a first supporting frame 4 and a second supporting frame 5 are fixedly connected on the upper end surfaces of the cylinders 3 at two sides, an adjusting chute 6 and a limiting chute 7 are fixedly arranged on the outer wall of one side of the first supporting frame 4 and the second supporting frame 5 opposite to each other, an adjusting screw 8 is rotatably connected between the front and rear inner walls of the adjusting chute 6, a limiting slide bar 9 is fixedly connected between the front and rear inner walls of the limiting chute 7, an adjusting slide block 10 is sleeved on the outer wall of the adjusting screw bar 8 in a threaded manner, a limiting slide block 11 is sleeved on the outer wall of the limiting slide bar 9 in a sliding manner, a truss 12 is fixedly connected between the adjusting slide block 10 and the limiting slide block 11, and a transverse chute 13 is fixedly arranged on the lower end surface of the truss 12, a sliding support plate 14 is fixedly connected between the inner walls of two sides of the transverse sliding chute 13, limiting wheel grooves 15 are fixedly arranged on the upper end surface of the sliding support plate 14 near the front and back of the two sides, supporting pulleys 16 are arranged in the four limiting wheel grooves 15, transverse shafts 17 are fixedly connected to the inner ends of the two supporting pulleys 16 positioned on the same side, hangers 18 are rotatably sleeved on the front and back ends of the two transverse shafts 17, mounting frames 19 are fixedly connected to the lower ends of the two hangers 18, an ultrasonic detector 20 and a radiation detector 21 are respectively fixedly connected to the lower end surfaces of the two mounting frames 19, a driving motor 23 is used for driving a driving gear 24 to rotate and further driving a driven gear 22 to rotate, the supporting pulleys 16 are driven to rotate by the transverse shafts 17, the mounting frames 19 are further driven to move by the hangers 18, and further driving the ultrasonic detector 20 and the radiation detector 21 to transversely move is realized, the adjusting motor 41 is matched to drive the adjusting screw rod 8 to rotate, so that the adjusting slide block 10 is driven to move, the truss 12 is further driven to move back and forth, and the chip is integrally scanned.
The upper end face of the base 1 is fixedly connected with a test platform 25, a groove 26 is fixedly formed in the middle of the upper end face of the test platform 25, a placement platform 27 is movably arranged in the groove 26, rectangular sliding grooves 28 are fixedly formed in two sides of the lower end face of the groove 26, rectangular sliding blocks 29 are slidably sleeved at the inner ends of the rectangular sliding grooves 28, lifting screw rods 30 are sleeved at the inner ends of the rectangular sliding blocks 29 in a threaded manner, a T-shaped rotating shaft 31 is fixedly connected to the lower end face of the lifting screw rods 30, gear grooves 32 are fixedly formed in the inner ends of the two sides of the test platform 25, driving rods 34 are rotatably connected between the inner walls of the two sides of the gear grooves 32, two driving gears 35 are fixedly sleeved on the outer walls of the two sides of the driving rods 34, the driving rods 34 are driven to rotate through rocking rods 36, the two driving gears 35 are further driven to rotate, the T-shaped rotating shaft 31 is further driven to rotate, the lifting screw rods 30 are further controlled to ascend the rectangular sliding blocks 29, the placement platform 27 is driven to ascend and jack up a chip circuit board, an auxiliary chip is separated from the pin grooves, and a signal parameter test circuit 38, a storage function test circuit 39 and a chip test terminal device 40 are fixedly arranged on the base 1 respectively.
Equal fixedly connected with driving motor 23 on two gallows 18 rear end faces, driving motor 23 output end fixedly connected with driving gear 24 No. one, 17 rear ends of cross axle run through gallows 18 and fixedly connected with driven gear 22 No. one, driven gear 22 and driving gear 24 meshing No. one drive gear, drive driven gear 22 through driving motor 23 and rotate No. one, further drive driving gear 24 and rotate, further drive cross axle 17 and rotate.
Two T type pivot 31 lower extremes all run through gear groove 32 and No. two driven gear 33 of fixedly connected with, and two No. two driven gear 33 mesh with two No. two driving gear 35 respectively, and test platform 25 and fixedly connected with rocker 36 are run through to actuating lever 34 one end, utilize rocker 36 can drive actuating lever 34 to rotate, and rocker 36 can adopt servo motor to replace into electric operation in addition.
The upper end face of the test platform 25 is fixedly provided with a plurality of pin grooves 37, and the pin grooves 37 are distributed on the side position of the test platform 25.
No. 4 support frame rear end face fixedly connected with adjusting motor 41, adjusting motor 41 output run through adjusting chute 6 and with accommodate the lead screw 8 fixed connection, utilize adjusting motor 41 to drive accommodate the lead screw 8 and rotate and can drive adjusting block 10 and remove.
The signal parameter test circuit 38 and the memory function test circuit 39 are both electrically connected to the chip test terminal device 40.
The rectangular sliding block 29 and the rectangular sliding groove 28 are arranged in a sliding fit mode, and the shaking situation when the rectangular sliding block 29 moves along with the lifting screw rod 30 is avoided.
The chip test system comprises the following test procedures:
s1, firstly, driving an adjusting screw rod 8 to rotate through an adjusting motor 41, so as to drive an adjusting slide block 10 to move, and further driving a truss 12 to move back and forth;
s2, driving a first driving gear 24 to rotate through a driving motor 23, further driving a first driven gear 22 to rotate, driving a supporting pulley 16 to rotate through a transverse shaft 17, further driving a mounting frame 19 to move through a hanging frame 18, further driving an ultrasonic detector 20 and a ray detector 21 to integrally scan a chip, and finding out a circuit breaking point;
and S3, connecting the chip testing terminal equipment 40 through the signal parameter testing circuit 38 and the storage function testing circuit 39 to test the chip signal and the storage function.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
Claims (8)
1. A chip circuit testing device comprises a base (1) and is characterized in that lateral supporting plates (2) are fixedly connected to outer walls of two sides of the base (1), cylinders (3) are sleeved on positions, close to the front and rear ends, of upper end faces of the two lateral supporting plates (2), the upper end faces of the cylinders (3) located on two sides are fixedly connected with a first supporting frame (4) and a second supporting frame (5) respectively, an adjusting sliding groove (6) and a limiting sliding groove (7) are fixedly arranged on the outer wall of one side, opposite to the first supporting frame (4) and the second supporting frame (5), an adjusting screw rod (8) is rotatably connected between the front inner wall and the rear inner wall of the adjusting sliding groove (6), a limiting sliding rod (9) is fixedly connected between the front inner wall and the rear inner wall of the limiting sliding groove (7), an adjusting sliding block (10) is sleeved on the outer wall of the adjusting screw rod (8) in a threaded manner, a limiting sliding block (11) is sleeved on the outer wall of the limiting sliding rod (9), trusses (12) are fixedly connected between the adjusting sliding block (10) and the trusses (11), a transverse sliding groove (13) is fixedly connected with lower end face of the truss (12), a fixing wheel groove (14) is arranged on the inner wall of the front and rear sliding groove (14) and the supporting plate, supporting pulleys (16) are arranged in the four limiting wheel grooves (15), the inner ends of the two supporting pulleys (16) positioned on the same side are fixedly sleeved with transverse shafts (17), the front ends and the rear ends of the two transverse shafts (17) are rotatably sleeved with hanging frames (18), the lower ends of the two hanging frames (18) are fixedly connected with mounting frames (19), and the lower end faces of the two mounting frames (19) are respectively and fixedly connected with an ultrasonic detector (20) and a ray detector (21);
base (1) up end fixedly connected with test platform (25), test platform (25) up end middle part is fixed sets up fluted (26), recess (26) internalization is provided with place the platform (27), terminal surface both sides are all fixed has seted up rectangle spout (28) under recess (26), rectangle spout (28) inner slip cap is equipped with rectangle slider (29), rectangle slider (29) inner end screw thread has cup jointed lift lead screw (30), terminal surface fixedly connected with T type pivot (31) under lift lead screw (30), gear groove (32) have been seted up to test platform (25) inner fixed, it is connected with actuating lever (34) to rotate between gear groove (32) both sides inner wall, all fixed No. two driving gears (35) of having cup jointed on actuating lever (34) both sides outer wall, fixed signal parameter test circuit (38), memory function test circuit (39) and chip test terminal equipment (40) of being provided with respectively on base (1).
2. The chip circuit testing device of claim 1, wherein: the rear end faces of the two hanging brackets (18) are fixedly connected with driving motors (23), output ends of the driving motors (23) are fixedly connected with driving gears (24), the rear end of the transverse shaft (17) penetrates through the hanging brackets (18) and is fixedly connected with driven gears (22), and the driven gears (22) are meshed with the driving gears (24).
3. The chip circuit testing device of claim 1, wherein: two T type pivot (31) lower extreme all runs through gear groove (32) and No. two driven gear (33) of fixedly connected with, two driven gear (33) mesh with two driving gear (35) No. two respectively, test platform (25) and fixedly connected with rocker (36) are run through to actuating lever (34) one end.
4. The chip circuit testing device of claim 1, wherein: the upper end face of the test platform (25) is fixedly provided with a plurality of pin grooves (37).
5. The apparatus of claim 1, wherein: no. one support frame (4) rear end face fixedly connected with accommodate motor (41), accommodate motor (41) output run through adjust spout (6) and with accommodate the lead screw (8) fixed connection.
6. The apparatus of claim 1, wherein: the signal parameter testing circuit (38) and the storage function testing circuit (39) are both electrically connected with the chip testing terminal device (40).
7. The apparatus of claim 1, wherein: the rectangular sliding block (29) is in sliding fit with the rectangular sliding groove (28).
8. A chip test system is characterized by comprising the following test procedures:
s1, firstly, driving an adjusting screw rod (8) to rotate through an adjusting motor (41), so as to drive an adjusting slide block (10) to move, and further driving a truss (12) to move back and forth;
s2, driving a first driving gear (24) to rotate through a driving motor (23), further driving a first driven gear (22) to rotate, driving a supporting pulley (16) to rotate through a transverse shaft (17), further driving a mounting rack (19) to move through a hanging bracket (18), further driving an ultrasonic detector (20) and a ray detector (21) to integrally scan a chip, and finding out a circuit breaking point;
and S3, connecting the chip testing terminal equipment (40) through the signal parameter testing circuit (38) and the storage function testing circuit (39) to test the chip signal and the storage function.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211076320.6A CN115754661A (en) | 2022-09-05 | 2022-09-05 | Chip circuit testing device and chip testing system |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211076320.6A CN115754661A (en) | 2022-09-05 | 2022-09-05 | Chip circuit testing device and chip testing system |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN115754661A true CN115754661A (en) | 2023-03-07 |
Family
ID=85349608
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202211076320.6A Withdrawn CN115754661A (en) | 2022-09-05 | 2022-09-05 | Chip circuit testing device and chip testing system |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN115754661A (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116930568A (en) * | 2023-09-14 | 2023-10-24 | 成都圣芯集成电路有限公司 | Millimeter wave chip test platform |
-
2022
- 2022-09-05 CN CN202211076320.6A patent/CN115754661A/en not_active Withdrawn
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116930568A (en) * | 2023-09-14 | 2023-10-24 | 成都圣芯集成电路有限公司 | Millimeter wave chip test platform |
| CN116930568B (en) * | 2023-09-14 | 2023-12-19 | 成都圣芯集成电路有限公司 | Millimeter wave chip test platform |
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Application publication date: 20230307 |