CN115745590A - Preparation method of nano ferrite dielectric property measurement sample - Google Patents
Preparation method of nano ferrite dielectric property measurement sample Download PDFInfo
- Publication number
- CN115745590A CN115745590A CN202211396983.6A CN202211396983A CN115745590A CN 115745590 A CN115745590 A CN 115745590A CN 202211396983 A CN202211396983 A CN 202211396983A CN 115745590 A CN115745590 A CN 115745590A
- Authority
- CN
- China
- Prior art keywords
- sample
- particles
- nano
- mixing
- mixed particles
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Landscapes
- Soft Magnetic Materials (AREA)
Abstract
The invention discloses a preparation method of a sample for measuring the dielectric property of nano ferrite, which utilizes an adhesive to carry out multiple times of adhesive granulation on nano precursor powder to effectively reduce the static friction force among nano precursor particles and improve the fluidity among the particles, thereby leading the sample to be easier to be pressed and formed and avoiding the cracking phenomenon; meanwhile, the nanometer precursor particles can be uniformly distributed by sieving after each gluing granulation, and the phenomenon that the pressing stress is not uniformly distributed due to uneven particle size distribution is avoided, so that the cracking phenomenon in the sample pressing and forming process is avoided, and the support effect is played for accurately measuring the dielectric property of the nanometer ferrite.
Description
Technical Field
The invention relates to a preparation method of a nano ferrite sample, in particular to a preparation method of a nano ferrite dielectric property measurement sample, belonging to the technical field of material forming.
Background
With the rapid development of 5G communication technology, great demand is generated for integrated radio frequency antennas. Magnetoelectric materials play an important role in the field of miniaturized antennas. On the one hand, higher magnetic materialsMaterial miniaturization factor (n = (mu 'epsilon') 1/2 ) The physical size of the antenna can be effectively reduced. On the other hand, in order to obtain good impedance matching characteristics for the antenna, the characteristic impedance of the magnetoelectric material needs to be as close as possible to the free space impedance, i.e., μ '≈ ε'. The continuous improvement of the magnetic permeability of the magnetoelectric material is not only beneficial to obtaining a larger n value, but also beneficial to realizing good impedance matching characteristic. In addition, in order to reduce the attenuation of the material loss to the antenna performance, the magnetoelectric material needs to have lower dielectric loss (tan delta) ε ) And magnetic loss tangent (tan. Delta.) μ ) The value is obtained. Research has shown that refinement of the particle size of the material effectively suppresses domain wall movement, significantly reducing the magnetic loss tangent (Qifan Li, yajie Chen, qifan Li, lezhong Li, kun Qian, vincent G. Harris, stressed domain wall damping in planar BaM hexaferters formation of microwave devices, J. Magn. Mater. 514 (2020) 167172.). Owing to the small particle size of the approximate single domain and the higher ferromagnetic resonance frequency, the nanometer NiZnCo ferrite becomes a miniaturized antenna magnetoelectric material with great potential. In earlier studies, researchers have successfully prepared Ni by chemical coprecipitation and sintering processes 0.5 Zn 0.3 Co 0.2 Fe 1.98 O 4-δ A nano ferrite ring sample was prepared and measured for its high frequency electromagnetic parameters using a vector network analyzer (J. -L. Mattei, E. Le Guen, A. Chevalier. Dense and half-Dense NiZnCo transfer ceramics: thermal responsive removal for anti-decreasing, recording to the dielectric and magnetic properties at microwave effects, J. Appl. Phys. 117 (2015) 084904.). However, since the ferrite sample is subjected to size shrinkage after calcination, the sample cannot completely fill the coaxial test fixture, an air gap exists between the fixture and the annular sample, the dielectric constant measurement result is often lower than a true value, and the accuracy and reliability of the dielectric property measurement are seriously affected. To solve the above problems, we prepared Ni in a wafer form based on the existing research 0.5 Zn 0.3 Co 0.2 Fe 1.98 O 4-δ Nano ferrite sample, impedance analyzer and dielectric constantThe method can effectively avoid the influence of an air gap between the coaxial test fixture and the sample on measurement in the process of measuring the dielectric property of the annular sample by using the vector network analyzer, and obtain a more accurate dielectric constant measurement result. However, ni obtained by coprecipitation 0.5 Zn 0.3 Co 0.2 Fe 1.98 O 4-δ The precursor powder is nano particles, and the specific surface area of the particles is large, so that the static friction force among the particles is large and the fluidity is poor in the compression molding process, and the sample cracking phenomenon is easy to occur when a wafer-shaped sample is compressed by using the traditional molding method.
Disclosure of Invention
The invention aims to provide a preparation method of a nano ferrite dielectric property measurement sample, which aims to solve the problem that a nano ferrite substrate sample is easy to crack in the forming process.
1. Dielectric Property measurement sample preparation
1. Preparation and refinement of nano precursor powder
The total concentration of metal cations was set to 2.0 mol/L, metal salts were weighed in an atomic ratio of Ni, zn, co, fe of 0.5: 0.3: 0.2: 1.98, respectively, and all metal salts were uniformly dissolved in 300 mL of deionized water. The weighed NaOH particles are uniformly dissolved in 350 mL of deionized water, and the NaOH solution is placed in a water bath kettle with the temperature of 90 ℃ for water bath heating. And after the temperature of the NaOH solution reaches 90 ℃, pouring the mixed metal salt solution into the NaOH solution, and continuously stirring for 40min. In the reaction process, a preservative film is required to cover the reaction vessel to prevent the solution from evaporating. Subsequently, the reaction solution was taken out of the water bath, and left to stir at room temperature for additional 1 hour. Subsequently, the suspension after the reaction was centrifuged at 6000 rpm by a high speed centrifuge and washed with deionized water several times until the pH of the supernatant was 7.0. Subsequently, the separated precipitate was placed in an oven at 60 ℃ and dried for 24 hours. Finally, the obtained dry product is ground and crushed to obtain Ni 0.5 Zn 0.3 Co 0.2 Fe 1.98 O 4-δ And (3) precursor powder.
Ni obtained by chemical coprecipitation reaction using planetary ball mill 0.5 Zn 0.3 Co 0.2 Fe 1.98 O 4-δ And thinning the precursor powder. The specific ball milling conditions are as follows: the solvent is absolute ethyl alcohol, zirconia ball milling beads with the diameter of 5mm and 100mL agate ball milling tanks are selected, and the mass ratio of the ball milling beads to the precursor powder in each ball milling tank is 20:1, the ball milling time is 370min, and the ball milling speed is 350 r/min. Subsequently, the ball-milled powder was separated by a centrifuge and dried in an oven at 60 ℃ for 24 hours. Finally, the obtained product is ground and crushed to obtain refined Ni 0.5 Zn 0.3 Co 0.2 Fe 1.98 O 4-δ And (3) precursor powder.
2. Forming of nano precursor powder
(1) Weighing a plurality of ball-milled and refined Ni 0.5 Zn 0.3 Co 0.2 Fe 1.98 O 4-δ The mass ratio of the precursor powder to the adhesive is 12 to 14:1, mixing and grinding for 4 to 6min to obtain primary mixed particles;
(2) Sequentially sieving the primary mixed particles obtained in the step (1), and selecting 20-80 meshes of interlayer particles for later use;
(3) Weighing the bottom layer fine particles smaller than 80 meshes in the step (2), and mixing the bottom layer fine particles with an adhesive according to the mass ratio of 12-14: 1, mixing and grinding for 4-6 min to obtain secondary mixed particles;
(4) Repeating the step (2), sequentially sieving the secondary mixed granules obtained in the step (3), and continuously selecting 20-80 meshes of intermediate layer granules for later use;
(5) Weighing the bottom layer fine particles smaller than 80 meshes in the step (4), and mixing the bottom layer fine particles with an adhesive according to the mass ratio of 12-14: 1, mixing and grinding for 4-6 min to obtain third mixed particles;
(6) Uniformly mixing the intermediate layer particles obtained in the step (2), the intermediate layer particles obtained in the step (4) and the third mixed particles obtained in the step (5) to obtain fourth mixed particles;
(7) And (4) putting the mixed particles obtained in the step (6) in a mould for compression molding, taking out and drying to obtain a nano precursor molded sample.
In the preparation process, the adhesive is a polyvinyl alcohol aqueous solution with the mass concentration of 7-9%.
3. Sintering of nano precursor forming sample
And (3) placing the nano precursor molding sample in a muffle furnace, sintering at 900 ℃ for 9 h at the heating rate of 0.5 ℃/min, and naturally cooling to room temperature along with the furnace after sintering is finished to obtain the dielectric property measurement sample.
2. Dielectric Property measurement sample characterization
The method utilizes the nano precursor forming sample before sintering to characterize the forming effect of the dielectric property measurement sample.
1. Nano precursor molding sample prepared by traditional method
Weighing the refined Ni 0.5 Zn 0.3 Co 0.2 Fe 1.98 O 4-δ 1.67g of precursor powder, weighing 0.13g of polyvinyl alcohol (PVA) aqueous solution with the mass concentration of 8wt%, and grinding in an agate mortar for 5min to obtain mixed particles; then pouring the obtained mixed particles into a die with the inner diameter of 15mm, and pressing for 30min at 1270MPa by using a powder tablet machine to obtain a wafer-shaped sample; subsequently, the wafer-shaped sample was taken out, and the pressed wafer-shaped sample was put into an oven at 60 ℃ and dried for 30 minutes, and then taken out, and the result is shown in fig. 1 a.
2. The nanometer precursor formed sample prepared by the method of the invention
Weighing the refined Ni according to the same proportion 0.5 Zn 0.3 Co 0.2 Fe 1.98 O 4-δ Granulating precursor powder and a polyvinyl alcohol (PVA) aqueous solution with the mass concentration of 8wt% by adopting the method, finally pouring 1.8g of mixed particles for four times into a die with the inner diameter of 15mm, and pressing for 30min at 1270MPa by using a powder tablet machine to obtain a wafer-shaped sample; subsequently, the wafer-shaped sample was taken out, and the pressed wafer-shaped sample was put into an oven at 60 ℃ and dried for 30min, and then taken out, and the result is shown in fig. 1 b.
As can be seen from a comparison of FIGS. 1a and 1b, under the same conditions, ni is present 0.5 Zn 0.3 Co 0.2 Fe 1.98 O 4-δ Precursor body
The powder is nano-particles, the specific surface area of the particles is large, the static friction force between the particles is large, the flowability of the particles is poor, and the sample is seriously cracked in the compression molding process (as shown in figure 1 a). The sample preparation method effectively improves the fluidity among particles, obtains a wafer-shaped sample with a flat surface (as shown in figure 1 b), and effectively avoids the cracking phenomenon of the sample.
3. Dielectric Property measurement sample Performance evaluation
1. Good process stability
Weighing 4.0 g of ball-milled nano precursor powder and 0.3g of PVA aqueous solution (the mass concentration of PVA is 8 wt%) and grinding in an agate mortar for 5min to obtain primary mixed particles; placing a 20-mesh standard sieve mesh on the upper layer, placing an 80-mesh standard sieve mesh on the bottom layer, sequentially sieving the primary mixed particles, and selecting particles in the middle layer for later use; weighing the bottom layer particles after the first sieving, and calculating the mass of the needed PVA aqueous solution (the PVA mass concentration is 8 wt%) according to the 93wt% of the bottom layer particles in the mixed system; mixing the bottom layer particles after the first sieving with the needed PVA aqueous solution, and grinding in an agate mortar for 5min to obtain secondary mixed particles; placing a 20-mesh standard sieve mesh on the upper layer, placing an 80-mesh standard sieve mesh on the bottom layer, sequentially sieving the mixed particles, and selecting middle-layer particles for later use; weighing the bottom layer particles remained after the second sieving, calculating the content of a needed PVA aqueous solution (the PVA mass concentration is 8 wt%) according to the particle proportion of 93.0 wt%, mixing the bottom layer particles remained after the second sieving with the needed PVA aqueous solution, and grinding for 5min in an agate mortar to obtain third mixed particles; and mixing the third mixed particles with the intermediate layer particles obtained after the first sieving and the intermediate layer particles obtained after the second sieving to obtain fourth mixed particles.
Repeating the operation to obtain a plurality of groups of mixed granules for four times, weighing 1.8g of the mixed granules for four times respectively, recording as a sample 1, a sample 2, a sample 3 and a sample 4, pouring the four groups of sample granules into dies with the diameter of 15.0mm respectively, pressing for 30min at 1270MPa by using a powder tablet machine, taking out a wafer-shaped sample, then putting the pressed wafer-shaped sample into an oven at 60 ℃, drying for 30min, and taking out.
And placing the four groups of disk-shaped samples into a muffle furnace, sintering at 900 ℃ for 9 h at the heating rate of 0.5 ℃/min, naturally cooling to room temperature along with the furnace after sintering, and taking out to obtain the dielectric constant measurement sample. Sample shrinkage is shown in table 1:
TABLE 1 dimensional parameters and shrinkage before and after sintering of disk-shaped samples among different samples
Therefore, the wafer-shaped nanometer precursor forming samples prepared by the method all have the size shrinkage phenomenon of different degrees after sintering, and the shrinkage rate is stabilized at about 6 percent, so that the dielectric constant test sample prepared by the method has good repeatability and stability and has little influence on the dielectric characteristic test data of the sample.
2. The dielectric constant measurement data has good accuracy
The dielectric characteristics of the wafer-like sample prepared in the present invention were measured using an impedance analyzer (model: keysight E4991B) and a dielectric constant measuring jig (model: keysight 16453A) at a measuring frequency of 100-1000MHz. The dielectric properties of the existing annular sample were measured using a vector network analyzer (model: agilent PNA-X N5247A) at a measurement frequency of 100-1000MHz.
(1) Dielectric constant measurement of wafer-like samples of the invention
The dielectric characteristics of the sintered samples 1, 2, 3 and 4 were measured, and the results are shown in FIGS. 3a and 3 b.
(2) Dielectric constant measurement of existing toroidal samples
Weighing 0.2g of the four-time mixed particles, pouring the weighed four-time mixed particles into a die with the outer diameter of 7.0 mm and the inner diameter of 3.04 mm, and pressing for 4min by using a powder tablet press under the pressure of 1270MPa in unit area to obtain an annular sample; then putting the pressed annular sample into a drying oven at 60 ℃, drying for 30min and taking out; then placing the annular sample in a muffle furnace, sintering at 900 ℃ for 9 h at the heating rate of 0.5 ℃/min, naturally cooling to room temperature along with the furnace after sintering, and taking out to obtain an annular dielectric constant measurement sample;
the dielectric characteristics of the above ring-shaped dielectric constant measurement sample were measured, and the results are shown in fig. 2a and 2 b.
With reference to FIGS. 2 and 3, dielectric property measurements were taken for disc-shaped samples at 700 MHz and compared to ring-shaped sample measurements, as shown in Table 2;
TABLE 2 dielectric property measurements of disc-shaped samples compared to annular samples at 700 MHz
As can be seen from Table 2, the dielectric characteristics of the disc-shaped samples and the ring-shaped samples prepared under the same process conditions were greatly different. This is because the ferrite shrinks before and after sintering, so that when the dielectric properties of the annular sample are measured, a large air gap exists between the coaxial measuring clamp and the annular sample, so that the measurement result of the real part of the dielectric constant is lower than the true value, and the measurement result of the dielectric loss tangent is higher than the true value.
In conclusion, the invention has the following advantages:
1. the adhesive is added into the nano precursor powder for multiple times of adhesive granulation, so that the static friction force among nano precursor particles can be effectively reduced, and the fluidity among the particles is improved, so that a sample is easier to press and form, and the cracking phenomenon is avoided. Meanwhile, the size distribution of the nanometer precursor particles can be uniform by sieving after each gluing granulation, and the uneven distribution of the pressing stress caused by uneven particle size distribution is avoided, so that the cracking phenomenon in the sample pressing and forming process is avoided;
2. the method for forming the nano ferrite can effectively improve the fluidity among nano precursor particles, solves the problem of sample cracking in the process of press forming, and plays a supporting role in accurately measuring the dielectric property of the nano ferrite.
Drawings
FIG. 1a is a diagram of a sample of a presintered nano precursor obtained by a conventional method;
FIG. 1b is a diagram of a sample of a pre-sintered nano precursor obtained by the method of the present invention;
FIG. 2a is a graph of the real part of the dielectric constant of an annular sample after sintering as a function of frequency measured by a vector network analyzer in the prior art;
FIG. 2b is a graph of dielectric loss tangent versus frequency for a sintered annular sample as measured using a vector network analyzer in the prior art;
FIG. 3a is a graph showing the variation of the real part of the dielectric constant with frequency of a wafer-shaped sample after sintering measured by an impedance analyzer in accordance with an embodiment of the present invention;
FIG. 3b is a graph of dielectric loss tangent versus frequency for a wafer-like sample after sintering as measured using an impedance analyzer in accordance with an embodiment of the present invention.
Detailed Description
The invention is further illustrated by the following examples.
Examples
1. Preparation of nano precursor powder
Weighing NiCl 2 ∙6H 2 O（0.12 mol）：27.85 g，CoCl 2 ∙6H 2 O（0.05 mol）：11.13 g， FeCl 3 ∙6H 2 O（0.46 mol）：125.63 g，ZnCl 2 (0.07 mol): 9.56g were charged together into a beaker, 300 mL of deionized water was added to the beaker and stirring was continued for 40min using a motorized stirrer. 78.0 g (1.95 mol) of solid NaOH is weighed into another beaker, 350 mL of deionized water is added, the beaker with the NaOH solution is placed in a water bath kettle at 90 ℃ and stirring is continued using a motor stirrer until complete dissolution. Then, the mixed salt solution dissolved uniformly was poured into the NaOH solution, and the reaction was continued for 40min. Then, the reactant is filled inThe beaker of (2) was taken out of the water bath, left in a room temperature environment, and stirred continuously for 1 hour using an electric stirrer. Then, the suspension after the reaction was centrifuged at 6000 rpm by a high speed centrifuge for a plurality of times, and washed with deionized water for a plurality of times until the pH of the supernatant was 7.0. Subsequently, the separated precipitate was placed in an oven at 60 ℃ and dried for 24 hours. Finally, the obtained dry product is ground and crushed to obtain Ni 0.5 Zn 0.3 Co 0.2 Fe 1.98 O 4-δ And (3) nano precursor powder.
2. Refinement of nano precursor powder
Taking a plurality of 100mL agate ball milling tanks, and weighing 40.0g zirconia ball milling beads with the diameter of 5mm and 2.0gNi 0.5 Zn 0.3 Co 0.2 Fe 1.98 O 4-δ The nanometer precursor powder is poured into an agate ball milling tank, and absolute ethyl alcohol is fully added into the ball milling tank. And (3) carrying out ball milling by using a planetary ball mill, wherein the ball milling time is set to be 370min, and the rotating speed is set to be 350 r/min. Next, the ball-milled powder was separated using a high-speed centrifuge and dried in an oven at 60 ℃ for 24 hours. Finally, the obtained product is ground and crushed to obtain refined Ni 0.5 Zn 0.3 Co 0.2 Fe 1.98 O 4-δ And (3) nano precursor powder.
3. Forming of nano precursor sample
Weighing 4.0 g of ball-milled Ni 0.5 Zn 0.3 Co 0.2 Fe 1.98 O 4-δ Grinding the nanometer precursor powder and 0.3g of PVA aqueous solution (the mass concentration of PVA is 8 wt%) in an agate mortar for 5min to obtain primary mixed particles; placing a 20-mesh standard sieve mesh on the upper layer, placing an 80-mesh standard sieve mesh on the bottom layer, sequentially sieving the primary mixed particles, and selecting middle-layer particles for later use; weighing the bottom layer particles after the first sieving, and calculating the mass of the needed PVA aqueous solution (the PVA mass concentration is 8 wt%) according to the 93wt% of the bottom layer particles in the mixed system; mixing the bottom layer particles after the first sieving with the needed PVA aqueous solution, and grinding in an agate mortar for 5min to obtain secondary mixed particles; placing a 20-mesh standard sieve net on the upper layer and placing an 80-mesh standard sieve netSequentially sieving the mixed particles at the bottom layer, and selecting middle layer particles for later use; weighing the bottom layer particles remained after the second sieving, calculating the content of a needed PVA aqueous solution (the PVA mass concentration is 8 wt%) according to the particle proportion of 93.0 wt%, mixing the bottom layer particles remained after the second sieving with the needed PVA aqueous solution, and grinding for 5min in an agate mortar to obtain third mixed particles; and mixing the third mixed particles with the intermediate layer particles obtained after the first sieving and the intermediate layer particles obtained after the second sieving to obtain fourth mixed particles.
Weighing 1.8g of mixed particles for four times, pouring the mixed particles into a die with the diameter of 15.0mm, pressing the mixed particles for 30min at 1270MPa by using a powder tablet machine, taking out a wafer-shaped sample, then putting the pressed wafer-shaped sample into a baking oven at 60 ℃, drying the wafer-shaped sample for 30min, and taking out the wafer-shaped sample; the shaping effect is shown in fig. 1 b.
4. Dielectric constant measurement sample preparation
And (3) placing the wafer sample into a muffle furnace, sintering at 900 ℃ for 9 h at the heating rate of 0.5 ℃/min, naturally cooling to room temperature along with the furnace after sintering, and taking out to obtain the dielectric constant measurement sample.
5. Dielectric constant measurement
Four sets of the disk-shaped Ni prepared in this example were measured using an impedance analyzer (model: keysight E4991B) and a dielectric constant measuring jig (model: keysight 16453A) 0.5 Zn 0.3 Co 0.2 Fe 1.98 O 4-δ The dielectric properties of the nano-ferrite samples are shown in fig. 3a and 3 b.
Claims (3)
1. A preparation method of a nano ferrite dielectric property measurement sample is characterized by comprising the following steps:
(1) Weighing a plurality of ball-milled and refined nano precursor powder and an adhesive according to the mass ratio of 12-14: 1, mixing and grinding for 4-6 min to obtain primary mixed particles;
(2) Sequentially sieving the primary mixed particles obtained in the step (1), and selecting intermediate layer particles of 20-80 meshes for later use;
(3) Weighing the bottom layer fine particles smaller than 80 meshes in the step (2), and mixing the bottom layer fine particles with an adhesive according to the mass ratio of 12-14: 1, mixing and grinding for 4-6 min to obtain secondary mixed particles;
(4) Repeating the step (2), sequentially sieving the secondary mixed particles obtained in the step (3), and continuously selecting the intermediate layer particles of 20-80 meshes for later use;
(5) Weighing the bottom layer fine particles smaller than 80 meshes in the step (4), and mixing the bottom layer fine particles with the adhesive according to a mass ratio of 12-14: 1, mixing and grinding for 4-6 min to obtain third mixed particles;
(6) Uniformly mixing the intermediate layer particles obtained in the step (2), the intermediate layer particles obtained in the step (4) and the third mixed particles obtained in the step (5) to obtain fourth mixed particles;
(7) And (4) putting the mixed particles obtained in the step (6) in a mould, pressing and forming, taking out and drying to obtain the nano precursor sample.
2. The method for preparing a sample for measuring dielectric properties of nano ferrite as claimed in claim 1, wherein: the nano precursor powder is Ni 0.5 Zn 0.3 Co 0.2 Fe 1.98 O 4-δ And (3) nano precursor.
3. The method for preparing a sample for measuring dielectric properties of nano ferrite as claimed in claim 1, wherein: the adhesive is a polyvinyl alcohol aqueous solution with the mass concentration of 7-9%.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211396983.6A CN115745590B (en) | 2022-11-09 | 2022-11-09 | Preparation method of nano ferrite dielectric property measurement sample |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211396983.6A CN115745590B (en) | 2022-11-09 | 2022-11-09 | Preparation method of nano ferrite dielectric property measurement sample |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN115745590A true CN115745590A (en) | 2023-03-07 |
| CN115745590B CN115745590B (en) | 2023-05-09 |
Family
ID=85368477
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202211396983.6A Active CN115745590B (en) | 2022-11-09 | 2022-11-09 | Preparation method of nano ferrite dielectric property measurement sample |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN115745590B (en) |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101445259A (en) * | 2008-12-26 | 2009-06-03 | 陕西科技大学 | Method for preparing micro-nano structure alumina particle |
| CN107352992A (en) * | 2017-07-04 | 2017-11-17 | 浙江大学 | A kind of powder size control method of wideband wide-temperature and low-consumption manganese-zinc ferrite |
| CN112159219A (en) * | 2020-09-29 | 2021-01-01 | 成都信息工程大学 | Yttrium-doped nickel-zinc-cobalt ferrite and preparation method thereof |
| WO2021076536A1 (en) * | 2019-10-17 | 2021-04-22 | Rogers Corporation | Nanocrystalline cobalt doped nickel ferrite particles, method of manufacture, and uses thereof |
| CN113045304A (en) * | 2021-03-25 | 2021-06-29 | 桂林电子科技大学 | Ferrite wave-absorbing material with mixed spinel structure and preparation method thereof |
| CN113186418A (en) * | 2021-04-30 | 2021-07-30 | 郑州航空工业管理学院 | Preparation method of aluminum-based composite material |
-
2022
- 2022-11-09 CN CN202211396983.6A patent/CN115745590B/en active Active
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101445259A (en) * | 2008-12-26 | 2009-06-03 | 陕西科技大学 | Method for preparing micro-nano structure alumina particle |
| CN107352992A (en) * | 2017-07-04 | 2017-11-17 | 浙江大学 | A kind of powder size control method of wideband wide-temperature and low-consumption manganese-zinc ferrite |
| WO2021076536A1 (en) * | 2019-10-17 | 2021-04-22 | Rogers Corporation | Nanocrystalline cobalt doped nickel ferrite particles, method of manufacture, and uses thereof |
| CN112159219A (en) * | 2020-09-29 | 2021-01-01 | 成都信息工程大学 | Yttrium-doped nickel-zinc-cobalt ferrite and preparation method thereof |
| CN113045304A (en) * | 2021-03-25 | 2021-06-29 | 桂林电子科技大学 | Ferrite wave-absorbing material with mixed spinel structure and preparation method thereof |
| CN113186418A (en) * | 2021-04-30 | 2021-07-30 | 郑州航空工业管理学院 | Preparation method of aluminum-based composite material |
Also Published As
| Publication number | Publication date |
|---|---|
| CN115745590B (en) | 2023-05-09 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN104446421B (en) | A kind of high magnetic permeability Ni-Zn soft magnetic ferrite material and preparation method | |
| CN101260001A (en) | High-Q microwave dielectric ceramic material and preparing method thereof | |
| TW201943676A (en) | Grain-oriented M-type hexagonal ferrite, article comprising same, method of making same, and wireless power device | |
| JP2021011421A (en) | Preparation method of low loss garnet ferrite material | |
| CN100480187C (en) | Nickel zinc ferrite material and preparation method thereof | |
| CN111499372A (en) | Low-temperature energy-saving preparation of L iMgPO4Method for microwave ceramic material | |
| CN109928753A (en) | A kind of low-k silicon substrate microwave dielectric ceramic materials and preparation method thereof | |
| CN106747435B (en) | A kind of preparation method for the core-shell structure microwave-medium ceramics that temperature is stable | |
| CN108863322A (en) | A kind of low dielectric microwave media ceramic and preparation method thereof | |
| CN111925201A (en) | Sc doped hexagonal Zn2W ferrite material and preparation method thereof | |
| CN108569903B (en) | Low-temperature sintered LTCC microwave dielectric ceramic and preparation method thereof | |
| CN102503393B (en) | Method for preparing high-performance ferrite material with microwave sintering method | |
| CN115745590B (en) | Preparation method of nano ferrite dielectric property measurement sample | |
| CN111377722A (en) | Microwave dielectric ceramic material, microwave dielectric ceramic antenna and preparation method thereof | |
| CN106747392B (en) | Preparation method of Ho/Co composite doped Ni-Zn ferrite ceramic | |
| CN111499375B (en) | High-quality-factor microwave dielectric ceramic material and preparation method thereof | |
| CN105693220B (en) | Positive temperature coefficient silicate microwave dielectric ceramic material and preparation method thereof | |
| CN114409391B (en) | Preparation method of high-valence Ta-doped W-type barium ferrite wave-absorbing material | |
| CN114702310B (en) | Spinel microwave ferrite material with low loss and preparation method thereof | |
| CN104761258A (en) | Method of low-temperature sintering calcium zirconate microwave dielectric ceramic | |
| CN110395976B (en) | Preparation method of lithium-aluminum co-doped nickel-zinc ferrite ceramic material | |
| CN112552686B (en) | Magneto-dielectric composite material with ultrahigh magnetic conductivity and preparation method thereof | |
| CN111112601B (en) | High-temperature-resistant ferromagnetic wave absorbing agent, preparation method thereof and application of high-temperature-resistant ferromagnetic wave absorbing agent in preparation of high-temperature-resistant ferromagnetic wave absorbing material | |
| CN102765933B (en) | High Q*f value microwave ceramic dielectric material and preparation method thereof | |
| CN102276833A (en) | Preparation method of polyaniline-carbonyl iron composite wave-absorbing material |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |