CN115733774A - Throughput testing method and device and master control equipment - Google Patents
Throughput testing method and device and master control equipment Download PDFInfo
- Publication number
- CN115733774A CN115733774A CN202111004430.7A CN202111004430A CN115733774A CN 115733774 A CN115733774 A CN 115733774A CN 202111004430 A CN202111004430 A CN 202111004430A CN 115733774 A CN115733774 A CN 115733774A
- Authority
- CN
- China
- Prior art keywords
- test
- throughput
- tested
- input
- equipment
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 550
- 230000002776 aggregation Effects 0.000 claims abstract description 55
- 238000004220 aggregation Methods 0.000 claims abstract description 55
- 238000000034 method Methods 0.000 claims abstract description 32
- 238000012545 processing Methods 0.000 claims abstract description 25
- 238000007781 pre-processing Methods 0.000 claims description 18
- 238000013507 mapping Methods 0.000 claims description 14
- 238000004590 computer program Methods 0.000 claims description 8
- 102100026396 ADP/ATP translocase 2 Human genes 0.000 description 7
- 101000718417 Homo sapiens ADP/ATP translocase 2 Proteins 0.000 description 7
- 238000010586 diagram Methods 0.000 description 7
- 102100032533 ADP/ATP translocase 1 Human genes 0.000 description 6
- 101000768061 Escherichia phage P1 Antirepressor protein 1 Proteins 0.000 description 6
- 101000796932 Homo sapiens ADP/ATP translocase 1 Proteins 0.000 description 6
- 102100026397 ADP/ATP translocase 3 Human genes 0.000 description 5
- 101000718437 Homo sapiens ADP/ATP translocase 3 Proteins 0.000 description 5
- 102100026400 ADP/ATP translocase 4 Human genes 0.000 description 4
- 101000718447 Homo sapiens ADP/ATP translocase 4 Proteins 0.000 description 4
- 101100476574 Staphylococcus aureus (strain N315) ant5 gene Proteins 0.000 description 4
- 238000004891 communication Methods 0.000 description 4
- 230000006870 function Effects 0.000 description 4
- 238000005516 engineering process Methods 0.000 description 3
- 230000003287 optical effect Effects 0.000 description 2
- 238000013102 re-test Methods 0.000 description 2
- 230000005540 biological transmission Effects 0.000 description 1
- 239000012050 conventional carrier Substances 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 230000002093 peripheral effect Effects 0.000 description 1
Images
Landscapes
- Monitoring And Testing Of Transmission In General (AREA)
- Mobile Radio Communication Systems (AREA)
Abstract
The embodiment of the application provides a throughput testing method, a throughput testing device and a master control device, wherein the method comprises the following steps: acquiring carrier aggregation multiple-input multiple-output test content; carrying out test scene combination classification on the carrier aggregation multi-input multi-output test content; configuring each test instrument according to each test scene combination, controlling each test instrument to generate a corresponding test signal, and issuing the corresponding test signal to the combiner; combining the corresponding test signals through a combining device to obtain combined test signals; the combined test signal is subjected to shunt processing through the power dividing module to obtain a plurality of shunt test signals, and each shunt test signal is input into a test port corresponding to the equipment to be tested; and acquiring a throughput result of the equipment to be tested. Therefore, the operation steps of the throughput testing process of the equipment to be tested are reduced, the testing time consumption is reduced, the automation degree is high, the line changing time is reduced, the manual intervention is not needed, and the labor cost is reduced.
Description
Technical Field
The present application relates to the field of communications technologies, and in particular, to a throughput testing method and apparatus, and a master control device.
Background
The conventional Carrier Aggregation (CA) Multiple Input Multiple Output (MIMO) technology is used to improve the throughput of a communication base station or a mobile terminal. In the existing test technology for CA MIMO throughput of a mobile terminal, a single test instrument and equipment to be tested are generally manually operated, tedious setting needs to be carried out on the single instrument, a test radio frequency cable between the equipment to be tested and the test instrument needs to be replaced, a test result is manually recorded on another control terminal, and whether the throughput result passes or not is judged.
The following describes a related art mobile terminal throughput testing technique with reference to fig. 1. Referring to fig. 1, the test instrument 11 includes a first output port RF1 COM, a second output port RF2 COM, a third output port RF3COM, and a fourth output port RF4 COM, and the mobile terminal (UE) 12 includes a first antenna port ANT1, a second antenna port ANT2, a third antenna port ANT3, a fourth antenna port ANT4, a fifth antenna port ANT5, a sixth antenna port ANT6, and an nth antenna port ANT n. The first output port RF1 COM is connected with the first antenna port ANT1 through a test radio frequency cable; the second antenna port ANT2 is connected with the fourth antenna port ANT4 through a test radio frequency cable; the third output port RF3COM is connected to the second antenna port ANT2 through a test RF cable, and the fourth output port RF4 COM is connected to the third antenna port ANT3 through a test RF cable.
Under the connection relationship shown in fig. 1, throughput tests may be performed on the first antenna port ANT1, the second antenna port ANT2, the third antenna port ANT3, and the fourth antenna port ANT4 of the mobile terminal 12, but throughput tests cannot be performed on other antenna ports of the mobile terminal, and if the throughput tests are performed on other antenna ports, a connection line needs to be reconnected. In summary, the existing process for carrying out throughput testing on the mobile terminal waiting testing equipment has the problems of complex operation steps, long testing time consumption and high labor cost.
Disclosure of Invention
The embodiment of the application provides a throughput testing method, a throughput testing device and a master control device, which can solve the technical problem.
In a first aspect, an embodiment of the present application provides a throughput testing method, which is applied to a main control device, where the main control device is connected to input ends of multiple test instruments, an output end of each test instrument is connected to an input end of a combining device, an output end of the combining device is connected to an input end of a power dividing module, and an output end of the power dividing module is used to connect to a port to be tested corresponding to a device to be tested, respectively, where the method includes:
acquiring carrier aggregation multiple-input multiple-output test content;
carrying out test scene combination classification on the carrier aggregation multi-input multi-output test content;
configuring each test instrument according to each test scene combination, controlling each test instrument to generate a corresponding test signal, and issuing the corresponding test signal to the combining device;
combining the corresponding test signals through the combining device to obtain combined test signals;
the combined test signal is subjected to shunt processing through the power dividing module to obtain a plurality of shunt test signals, and each shunt test signal is input into a test port corresponding to the equipment to be tested;
and acquiring a throughput result of the equipment to be tested.
Optionally, the carrier aggregation mimo test content includes a carrier aggregation combination and a test frequency band combination; the performing test scenario combination classification on the carrier aggregation multiple-input multiple-output test content includes:
and correspondingly dividing all test frequency band combinations belonging to the same type of carrier aggregation combination into a test scene combination.
Optionally, the method further includes:
acquiring the mapping relation between the output end of each test instrument and each port to be tested of the equipment to be tested;
the controlling each test instrument to generate a corresponding test signal includes:
and controlling the output end of each test instrument to generate a test signal matched with the corresponding port to be tested according to the mapping relation.
Optionally, the master control device is further connected to the device to be tested, and the method further includes:
and controlling the device to be tested to execute a test preprocessing operation of switching from a flight mode to an online mode.
Optionally, the method further includes:
and if the throughput result is smaller than a preset throughput test standard, controlling the equipment to be tested to execute the test pretreatment operation for a preset number of times or controlling each test instrument to restart for a preset number of times, and retesting the throughput of the equipment to be tested after each test pretreatment operation or restart.
Optionally, the method further includes:
acquiring a throughput result of the equipment to be tested for a preset number of times;
and if the target throughput result which is greater than or equal to the preset throughput test standard exists in the throughput results of the preset times, determining that the throughput test of the device to be tested is successful.
Optionally, the method further includes:
and if the throughput results of the preset times are all smaller than the preset throughput test standard, determining that the throughput test of the equipment to be tested fails.
In a second aspect, an embodiment of the present application provides a throughput testing apparatus, which is applied to a main control device, where the main control device is connected to input ends of a plurality of test instruments, output ends of the test instruments are connected to an input end of a combiner, an output end of the combiner is connected to an input end of a power dividing module, an output end of the power dividing module is used to connect to-be-tested ports corresponding to-be-tested devices, respectively, and the throughput testing apparatus includes:
the first acquisition module is used for acquiring the carrier aggregation multiple-input multiple-output test content;
the classification module is used for carrying out test scene combination classification on the carrier aggregation multi-input multi-output test content;
the first processing module is used for configuring each test instrument according to various test scene combinations, controlling each test instrument to generate a corresponding test signal and sending the corresponding test signal to the combining device;
the second processing module is used for combining the corresponding test signals through the combining device to obtain combined test signals;
the third processing module is used for carrying out shunt processing on the combined test signal through the power dividing module to obtain a plurality of shunt test signals and inputting each shunt test signal into a test port corresponding to the equipment to be tested;
and the second acquisition module is used for acquiring the throughput result of the equipment to be tested.
Optionally, the carrier aggregation mimo test content includes a carrier aggregation combination and a test frequency band combination; the classification module is further configured to correspondingly divide all test frequency band combinations belonging to the same type of carrier aggregation combination into a test scene combination.
Optionally, the first obtaining module is further configured to obtain a mapping relationship between an output end of each test instrument and each port to be tested of the device to be tested;
and the first processing module is further used for controlling the output end of each test instrument to generate a test signal matched with the corresponding port to be tested according to the mapping relation.
Optionally, the throughput testing apparatus further includes:
and the control module is used for controlling the equipment to be tested to execute test preprocessing operation switched from a flight mode to an online mode.
Optionally, the control module is further configured to control the device to be tested to execute the test preprocessing operation for a predetermined number of times or control each of the test instruments to restart for a predetermined number of times if the throughput result is smaller than a preset throughput test standard, and retest the throughput of the device to be tested after each test preprocessing operation or restart.
Optionally, the control module is further configured to obtain a throughput result of the device to be tested for a predetermined number of times;
and if the target throughput result which is greater than or equal to the preset throughput test standard exists in the throughput results of the preset times, determining that the throughput test of the device to be tested is successful.
Optionally, the control module is further configured to determine that the throughput test of the device under test fails if the throughput results of the predetermined times are all smaller than the preset throughput test standard.
In a third aspect, an embodiment of the present application provides a master device, which includes a memory and a processor, where the memory is used to store a computer program, and the computer program executes the throughput testing method provided in the first aspect when the processor runs.
In a fourth aspect, an embodiment of the present application provides a computer-readable storage medium storing a computer program, which, when executed on a processor, performs the throughput testing method provided in the first aspect.
The throughput testing method, device and main control equipment provided by the application obtain the carrier aggregation multi-input multi-output testing content; carrying out test scene combination classification on the carrier aggregation multi-input multi-output test content; configuring each test instrument according to each test scene combination, controlling each test instrument to generate a corresponding test signal, and issuing the corresponding test signal to the combining device; combining the corresponding test signals through the combining device to obtain combined test signals; the combined test signal is subjected to shunt processing through the power dividing module to obtain a plurality of shunt test signals, and each shunt test signal is input into a test port corresponding to the equipment to be tested; and acquiring a throughput result of the equipment to be tested. Therefore, through one-time line connection, throughput testing can be performed on each testing port of the equipment to be tested, operation steps of the process of performing throughput testing on the equipment to be tested are reduced, testing time consumption is reduced, the automation degree is high, line changing time is reduced, manual intervention is not needed, and the labor cost is reduced.
Drawings
In order to more clearly explain the technical solutions of the present application, the drawings needed to be used in the embodiments are briefly introduced below, and it should be understood that the following drawings only illustrate some embodiments of the present application and therefore should not be considered as limiting the scope of protection of the present application. Like components are numbered similarly in the various figures.
FIG. 1 is a schematic diagram illustrating a connection relationship between a device under test and a test meter;
FIG. 2 is a schematic diagram illustrating a connection relationship of a test system provided in an embodiment of the present application;
FIG. 3 is a diagram illustrating a partial connection relationship of a test system according to an embodiment of the present application;
fig. 4 is a flow chart illustrating a throughput testing method according to an embodiment of the present disclosure;
FIG. 5 is a schematic diagram illustrating a throughput testing display interface provided by an embodiment of the application;
fig. 6 is a schematic flow chart illustrating a throughput testing method according to an embodiment of the present application;
FIG. 7 is a schematic diagram illustrating a structure of a throughput testing apparatus according to an embodiment of the present application;
fig. 8 is a schematic structural diagram illustrating a throughput testing apparatus according to an embodiment of the present application;
fig. 9 shows a schematic structural diagram of a master device according to an embodiment of the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments.
The components of the embodiments of the present application, generally described and illustrated in the figures herein, can be arranged and designed in a wide variety of different configurations. Thus, the following detailed description of the embodiments of the present application, as presented in the figures, is not intended to limit the scope of the claimed application, but is merely representative of selected embodiments of the application. All other embodiments, which can be derived by a person skilled in the art from the embodiments of the present application without making any creative effort, shall fall within the protection scope of the present application.
Hereinafter, the terms "including", "having", and their derivatives, which may be used in various embodiments of the present application, are intended to indicate only specific features, numbers, steps, operations, elements, components, or combinations of the foregoing, and should not be construed as first excluding the existence of, or adding to, one or more other features, numbers, steps, operations, elements, components, or combinations of the foregoing.
Furthermore, the terms "first," "second," "third," and the like are used solely to distinguish one from another, and are not to be construed as indicating or implying relative importance.
Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which the various embodiments of the present application belong. The terms (such as those defined in commonly used dictionaries) should be interpreted as having a meaning that is consistent with their contextual meaning in the relevant art and will not be interpreted in an idealized or overly formal sense unless expressly so defined herein in various embodiments.
Example 1
The embodiment of the disclosure provides a throughput testing method.
The throughput testing method provided by the embodiment of the disclosure is applied to a main control device, the main control device is respectively connected with input ends of a plurality of testing instruments, an output end of each testing instrument is connected with an input end of a combining device, an output end of the combining device is connected with an input end of a power dividing module, and an output end of the power dividing module is used for being respectively connected with a port to be tested corresponding to the device to be tested.
In this embodiment, the main control device may be one computer device, and the main control device may also include two computer devices. The number of the test instruments can be determined according to actual conditions, for example, the test instruments may include 3 or 4 test instruments, in this embodiment, the test instruments are instruments for performing throughput testing on the device to be tested of the mobile terminal, and any instrument that can generate a corresponding test signal and complete throughput testing may be used, and the brand of the test instrument is not limited. In this embodiment, the combining device includes at least two combiners, wherein the combiner may be a 4-in-1 combiner. The power division module comprises a plurality of power dividers.
In this embodiment, the ports to be tested of the device to be tested have the following allocation principles: (1) The four paths of MHB PRX, DRX, MIMO1 and MIMO2 need to be respectively distributed to four ports of a test instrument, and the condition of path conflict can not exist. Similarly, LB PRX and DRX are also respectively allocated to four ports of the test meter, and there cannot be a path collision. (2) The MHB PRX and LB PRX can be assigned to the same port of the test meter unaffected. (3) The number of output ends of the test system composed of the main control device and the combining device is certain, for example, 4 output ends, and MHB and LB can reach 9 when the number of ports to be tested of the device to be tested is at most. The 9 ports to be tested need to be distributed to the output end of the test system composed of the main control device and the combiner through the power divider, and the situation that paths have no conflict is ensured. Where MHB indicates medium-high frequency, LB indicates low frequency, PRX indicates a main set antenna, DRX indicates a diversity antenna, MIMO1 indicates input/output port 1, and MIMO2 indicates input/output port 2.
Specifically, referring to fig. 2, the main Control device includes a first computer device 211 and a second computer device 212, the first computer device 211 and the second computer device 212 are connected via a Local Area Network (LAN), and a first Control port Control1, a second Control port Control 2, and a third Control port Control 3 of the first computer device 211 are respectively connected to a first system synchronization output port SYS SYNC OUT 1 of the first test instrument 221, a second system synchronization output port SYS SYNC OUT 2 of the second test instrument 222, and a third system synchronization output port SYS SYNC OUT 3 of the third test instrument 223. The combiner device includes a first combiner 231 and a second combiner 232, wherein a first input end A1 of the first combiner 231 is connected to a second output end RF2 COM of the third test meter 223; a second input end A2 of the first combiner 231 is connected to a second output end RF2 COM of the first test instrument 221; a fourth input A4 of first combiner 231 is connected to a second output RF2 COM of second test meter 222. The first combiner 231 combines the test signals input from the second output terminal RF2 COM of the third test instrument 223, the second output terminal RF2 COM of the first test instrument 221, and the second output terminal RF2 COM of the second test instrument 222, and inputs the combined test signals to the power dividing module 24 through the first output terminal AC of the first combiner 231.
A fifth input end B1 of the first combiner 231 is connected to a fourth output end RF4 COM of the first test instrument 221; a seventh input terminal B3 of the first combiner 231 is connected to a fourth output terminal RF4 COM of the second test meter 222; an eighth input B4 of the first combiner 231 is connected to a fourth output RF4 COM of the third test meter 223. The first combiner 231 combines the test signals input from the fourth output terminal RF4 COM of the first test instrument 221, the fourth output terminal RF4 COM of the second test instrument 222, and inputs the combined test signals to the power dividing module 24 through the second output terminal BC of the first combiner 231.
A first input end A1 of the second combiner 232 is connected to a first output end RF1 COM of the third test meter 223; a second input A2 of the second combiner 232 is connected to a first output RF1 COM of the second test meter 222; a third input A3 of the second combiner 232 is connected to the first output RF1 COM of the first test meter 221. The second combiner 232 combines the test signals input from the first output terminal RF1 COM of the third test instrument 223, the first output terminal RF1 COM of the second test instrument 222, and the first output terminal RF1 COM of the first test instrument 221, and inputs the test signals to the power dividing module 24 through the first output terminal AC of the second combiner 232.
A fifth input end B1 of the second combiner 232 is connected to a third output end RF3COM of the third test meter 223; a sixth input B2 of the second combiner 232 is connected to a third output RF3COM of the second test meter 222; a seventh input B3 of the second combiner 232 is connected to the third output RF3COM of the first test meter 221. The second combiner 232 combines the test signals input from the third output terminal RF3COM of the third test instrument 223 and the third output terminal RF3COM of the second test instrument 222 and the third output terminal RF3COM of the first test instrument 221, and inputs the combined test signals to the power dividing module 24 through the second output terminal BC of the second combiner 232.
The power dividing module 24 is respectively connected to the first output terminal AC and the second output terminal BC of the first combiner 231, and the first output terminal AC and the second output terminal BC of the second combiner 232.
The common module 24 is connected with a device under test 25, wherein the device under test 25 includes a first antenna port ANT1, a second antenna port ANT2, a third antenna port ANT3, a fourth antenna port ANT4, a fifth antenna port ANT5, a sixth antenna port ANT6, and an nth antenna port ANT. The device under test 25 and the second computer device 212 may be connected by a Universal Serial Bus (USB).
Further, referring to fig. 3, the power dividing module may include a first two power dividers 241, a second two power divider 242, a third two power divider 243, and a four power divider 244. The first two-power divider 241 is connected to the second antenna port ANT2 and the sixth antenna port ANT6 of the device under test 25, and the second two-power divider 242 is connected to the first antenna port ANT1 and the seventh antenna port ANT7 of the device under test 25. The third second power divider 243, and the antenna ports ANT0 and ANT5 of the dut 25. The four power dividers 244 are connected to the third antenna port ANT3, the ninth antenna port ANT9, and the tenth antenna port ANT10 of the device under test 25.
For example, the frequency band information of the antenna port of the device under test may be determined according to table 1 below.
Table 1 frequency band information table of antenna port of device under test
Specifically, referring to fig. 4, the throughput testing method includes:
step S101, obtaining carrier aggregation multiple-input multiple-output test content;
in this embodiment, the main control device may pre-store a Carrier Aggregation (CA) Multiple-In Multiple Out (MIMO) test list, where the test list includes Carrier Aggregation Multiple-In Multiple-Out test contents, and the Carrier Aggregation Multiple-In Multiple-Out test contents may be various test indexes of the device to be tested.
And S102, carrying out test scene combination classification on the carrier aggregation multi-input multi-output test content.
In this embodiment, the test scenario combination refers to test contents in various carrier aggregation combinations, for example, in a 2-carrier aggregation combination scenario, low-frequency test and medium-high frequency test contents in the 2-carrier aggregation combination are divided into a class of test scenario combinations, and it is determined that the class of test scenario combinations can completely test the test contents in the same class of 2-carrier aggregation, for example, the low-frequency test, the medium-high frequency test, and the low-frequency combination test are all completed at one time, and then the class of test is completed, so that the test frequency of a test instrument is reduced.
Optionally, the carrier aggregation mimo test content includes a carrier aggregation combination and a test frequency band combination; step S102, comprising:
and correspondingly dividing all test frequency band combinations belonging to the same type of carrier aggregation combination into a test scene combination.
In this embodiment, the carrier aggregation combination may be a 2-band carrier aggregation combination, a 3-band carrier aggregation combination, and the like, which is not limited herein.
Step S103, configuring each test instrument according to each test scene combination, controlling each test instrument to generate a corresponding test signal, and issuing the corresponding test signal to the combining device;
in this embodiment, each test scenario combination correspondingly has test content to be tested, and can read a corresponding test channel in the carrier aggregation mimo test list, and configure each test instrument according to the test channel, so that the test instrument generates a corresponding test signal.
Referring to fig. 2-3, the first test instrument 221, the second test instrument 222, and the third test instrument 223 are controlled to generate corresponding test signals, and the corresponding test signals are sent to the first combiner 231 and the second combiner 232 through the corresponding output ends of the first test instrument 221, the second test instrument 222, and the third test instrument 223. The first combiner 231 combines the test signals input by the second output terminal RF2 COM of the third test instrument 223, the second output terminal RF2 COM of the first test instrument 221, and the second output terminal RF2 COM of the second test instrument 222 to obtain a first combined test signal, inputs the first combined test signal to the power dividing module 24 through the first output terminal AC of the first combiner 231, and the third power divider 243 of the power dividing module 24 divides the first combined test signal to obtain a first test signal and a second test signal, and inputs the first test signal and the second test signal to the antenna port ANT0 and the fifth antenna port ANT5 of the device under test 25, respectively.
Step S104, combining the corresponding test signals through the combining device to obtain combined test signals;
referring to fig. 2-3 again, the first combiner 231 combines the test signals input from the fourth output terminal RF4 COM of the first test instrument 221, the fourth output terminal RF4 COM of the second test instrument 222, and the fourth output terminal RF4 COM of the second test instrument 222 to obtain a second combined test signal, and inputs the second combined test signal to the power dividing module 24 through the second output terminal BC of the first combiner 231.
The second combiner 232 combines the test signals input from the first output terminal RF1 COM of the third test instrument 223, the first output terminal RF1 COM of the second test instrument 222, and the first output terminal RF1 COM of the first test instrument 221 to obtain a third combined test signal, and inputs the third combined test signal to the power dividing module 24 through the first output terminal AC of the second combiner 232.
The second combiner 232 combines the test signals input from the third output terminal RF3COM of the third test instrument 223 and the third output terminal RF3COM of the second test instrument 222 and the third output terminal RF3COM of the first test instrument 221 to obtain a fourth combined test signal, and inputs the fourth combined test signal to the power dividing module 24 through the second output terminal BC of the second combiner 232.
Step S105, performing a branch processing on the combined test signal through the power dividing module to obtain a plurality of branch test signals, and inputting each branch test signal into a test port corresponding to the device to be tested.
Referring to fig. 2-3 again, the second power divider 242 of the power dividing module 24 performs a branch processing on the second combined test signal to obtain a third test signal and a fourth test signal, and inputs the third test signal and the fourth test signal to the first antenna port ANT1 and the seventh antenna port ANT7 of the device under test 25, respectively.
The fourth power divider 244 of the power dividing module 24 divides the third combined test signal to obtain a fifth test signal, a sixth test signal, and a seventh test signal, and inputs the fifth test signal, the sixth test signal, and the seventh test signal to the third antenna port ANT9, the ninth antenna port ANT9, and the tenth antenna port ANT10 of the device under test 25, respectively.
The first power divider 241 of the power dividing module 24 performs a branch processing on the fourth combined test signal to obtain an eighth test signal and a ninth test signal, and inputs the eighth test signal and the ninth test signal to the second antenna port ANT2 and the sixth antenna port ANT6 of the device under test 25, respectively.
Thus, the corresponding test signal can be input to the test port of the device to be tested.
And step S104, acquiring a throughput result of the equipment to be tested.
In this embodiment, the master control device is connected to the test instrument, and after the test instrument sends the test signal to the device to be tested through the combiner and the common module, the test instrument can obtain the throughput result corresponding to the device to be tested, and the master control device can read the throughput result of the device to be tested from the test instrument, so that the user does not need to manually read the throughput result, and the labor cost can be reduced.
Optionally, the throughput testing method provided in the embodiment of the present disclosure further includes:
acquiring the mapping relation between the output end of each test instrument and each port to be tested of the equipment to be tested;
the controlling each test instrument to generate a corresponding test signal includes:
and controlling the output end of each test instrument to generate a test signal matched with the corresponding port to be tested according to the mapping relation.
In this embodiment, the main control device, the combining device, and the power dividing module form a test system, a connection relationship among the main control device, the combining device, and the power dividing module is related to a function corresponding to a port of the device to be tested, and a mapping relationship between an output end of each test instrument and each port to be tested of the device to be tested may be obtained in advance. And determining a test signal required by each port to be tested according to the working performance of each port to be tested of the equipment to be tested, and controlling the output end of each test instrument to generate a test signal matched with the corresponding port to be tested according to the mapping relation.
Optionally, the throughput testing method provided in the embodiment of the present disclosure further includes:
and controlling the device to be tested to execute a test preprocessing operation of switching from a flight mode to an online mode.
Referring to fig. 2 again, the main control device includes a first computer device 211 and a second computer device 212, the second computer device 212 is connected to the device under test 25, and the second computer device 212 can control the test preprocessing operation of the device under test 25 switching from the flight mode to the online mode, so that the test preprocessing operation can be automatically performed on the device under test, and the operation efficiency can be improved.
Optionally, the throughput testing method provided in the embodiment of the present disclosure further includes:
and if the throughput result is smaller than a preset throughput test standard, controlling the equipment to be tested to execute the test pretreatment operation for a preset number of times or controlling each test instrument to restart for a preset number of times, and retesting the throughput of the equipment to be tested after each test pretreatment operation or restart.
Referring to fig. 5, function buttons are provided on the top of the configuration interface of fig. 5, including exit (Quit), help (Help), frequency band setting (Modifyband), external attenuation (External-attenuation), and About (About), and clicking the corresponding function button can enter a corresponding lower-level sub-menu. A plurality of header contents and operation buttons are displayed below the function buttons, the header contents include a serial number (Line), a carrier aggregation configuration (CA configuration), a bandwidth (Bands), a frequency band (CBW), a protocol specification Test channel (DL channle), a radio Test resource (resource block), a Test entry (Test iterm), a preset throughput Test Standard (Standard), a specific data value (Test value) of a meter Test, a Result (Result), and operation buttons, and the operation buttons include: select test entry (SelectTestCase), configure linear loss (ConfigLineLoss), start test (StartTest), stop test (StopTest), standard float, radio frequency outlet, special radio frequency (special-RF), QPST port, trace (trace), and the like. QPST Port is a bottom layer communication Port that enables data communication between the device under test and the master device.
After clicking the start test (StartTest) button in fig. 5, a corresponding throughput test is performed, and after obtaining a test result, the test result is displayed in the corresponding table content.
In this embodiment, the throughput result is smaller than the predetermined throughput test standard, which indicates a test failure. The preset number may be 3 times, or may be other numbers, and is not limited herein. For example, the device to be tested is controlled to execute 3 test preprocessing operations or each test instrument is controlled to restart for 3 times, the throughput of the device to be tested is retested after each test preprocessing operation or restart, the throughput is repeatedly tested, and the success rate of passing the test of the device to be tested can be improved.
Optionally, referring to fig. 6, the throughput testing method provided in the embodiment of the present disclosure further includes:
step S105, acquiring a throughput result of the equipment to be tested for a preset number of times;
step S106, if the throughput results of the preset times have the target throughput result which is greater than or equal to the preset throughput test standard, determining that the throughput test of the equipment to be tested is successful.
For example, if the throughput result is smaller than the preset throughput test standard, the throughput result of the device to be tested is obtained again for 3 times, and if the throughput result of 3 times has a target throughput result which is greater than or equal to the preset throughput test standard, it is determined that the throughput test of the device to be tested is successful.
The method further comprises the following steps:
optionally, the throughput testing method provided in the embodiment of the present disclosure further includes:
and if the throughput results of the preset times are all smaller than the preset throughput test standard, determining that the throughput test of the equipment to be tested fails.
For example, if the throughput result of 3 times has a throughput standard greater than or equal to a preset throughput test standard, it is determined that the throughput test of the device under test fails.
In this embodiment, the test result of the device under test may also generate a corresponding excel file simultaneously, which facilitates subsequent arrangement. For example, in the display area of the display interface shown in fig. 5. If the test fails, the test needs to be performed for multiple times, generally three times, to automatically control the device to be tested to be switched from the flight mode to the online mode or restart each test instrument. If the throughput test of the device under test still fails, the test result of the device under test is marked red in the test result.
The throughput testing method provided by this embodiment obtains the carrier aggregation multiple-input multiple-output test content; carrying out test scene combination classification on the carrier aggregation multi-input multi-output test content; configuring each test instrument according to each test scene combination, controlling each test instrument to generate a corresponding test signal, and issuing the corresponding test signal to the combining device; combining the corresponding test signals through the combining device to obtain combined test signals; the combined test signal is subjected to shunt processing through the power dividing module to obtain a plurality of shunt test signals, and each shunt test signal is input into a test port corresponding to the equipment to be tested; and acquiring a throughput result of the equipment to be tested. Therefore, through one-time line connection, throughput testing can be performed on each testing port of the equipment to be tested, operation steps of the process of performing throughput testing on the equipment to be tested are reduced, testing time consumption is reduced, the automation degree is high, line changing time is reduced, manual intervention is not needed, and the labor cost is reduced.
Example 2
In addition, the embodiment of the disclosure provides a throughput testing device, which is applied to a main control device, the main control device is respectively connected with input ends of a plurality of testing instruments, an output end of each testing instrument is connected with an input end of a combining device, an output end of the combining device is connected with an input end of a power dividing module, and an output end of the power dividing module is used for being respectively connected with a port to be tested corresponding to a device to be tested.
Specifically, as shown in fig. 7, the throughput testing apparatus 700 includes:
a first obtaining module 701, configured to obtain a carrier aggregation multiple input multiple output test content;
a classification module 702, configured to perform test scenario combination classification on the carrier aggregation mimo test content;
the first processing module 703 is configured to configure each test instrument according to each test scene combination, control each test instrument to generate a corresponding test signal, and issue the corresponding test signal to the combiner device;
a second processing module 704, configured to combine the corresponding test signals by the combining device to obtain a combined test signal;
a third processing module 705, configured to perform branch processing on the combined test signal through the power dividing module to obtain multiple branch test signals, and input each branch test signal to a test port corresponding to the device to be tested;
a second obtaining module 706, configured to obtain a throughput result of the device under test.
Optionally, the carrier aggregation mimo test content includes a carrier aggregation combination and a test frequency band combination; the classifying module 702 is further configured to correspondingly divide all test frequency band combinations belonging to the same type of carrier aggregation combination into a test scene combination.
Optionally, the first obtaining module 701 is further configured to obtain a mapping relationship between an output end of each test instrument and each port to be tested of the device to be tested;
the first processing module 703 is further configured to control the output end of each test instrument to generate a test signal matched with the corresponding port to be tested according to the mapping relationship.
Optionally, referring to fig. 8, the throughput testing apparatus 700 further includes:
and a control module 707, configured to control the device under test to perform a test preprocessing operation of switching from a flight mode to an online mode.
Optionally, the control module 707 is further configured to, if the throughput result is smaller than a preset throughput test standard, control the device to be tested to perform the test preprocessing operation for a predetermined number of times or control each of the test instruments to restart for a predetermined number of times, and retest the throughput of the device to be tested after each test preprocessing operation or restart.
Optionally, the control module 707 is further configured to obtain a throughput result of the device to be tested for a predetermined number of times;
and if the target throughput result which is greater than or equal to the preset throughput test standard exists in the throughput results of the preset times, determining that the throughput test of the equipment to be tested is successful.
Optionally, the control module 707 is further configured to determine that the throughput test of the device to be tested fails if the throughput results of the predetermined times are all smaller than the preset throughput test standard.
The throughput testing apparatus 700 provided in this embodiment may use the throughput testing method shown in embodiment 1, and is not described herein again to avoid redundancy.
The throughput testing device provided by the embodiment acquires the carrier aggregation multiple-input multiple-output testing content; carrying out test scene combination classification on the carrier aggregation multi-input multi-output test content; configuring each test instrument according to each test scene combination, controlling each test instrument to generate a corresponding test signal, and issuing the corresponding test signal to the combining device; combining the corresponding test signals through the combining device to obtain combined test signals; the combined test signal is subjected to shunt processing through the power dividing module to obtain a plurality of shunt test signals, and each shunt test signal is input into a test port corresponding to the equipment to be tested; and acquiring a throughput result of the equipment to be tested. Therefore, through one-time line connection, throughput testing can be performed on each testing port of the equipment to be tested, operation steps in the throughput testing process of the equipment to be tested are reduced, testing time consumption is reduced, the automation degree is high, line changing time is reduced, manual intervention is not needed, and labor cost is reduced.
Example 3
An embodiment of the present disclosure provides a master control device, including a memory and a processor, where the memory stores a computer program, and the computer program executes, when running on the processor, the throughput testing method provided in embodiment 1 of the foregoing method.
Referring to fig. 9, the master device 900 includes: the main control device 900 is connected to the input ends of a plurality of test instruments, the output end of each test instrument is connected to the input end of a combining device, the output end of the combining device is connected to the input end of a power dividing module, and the output end of the power dividing module is used for connecting to the processor 902 with a port to be tested corresponding to a device to be tested, respectively, and is configured to: acquiring carrier aggregation multiple-input multiple-output test content;
carrying out test scene combination classification on the carrier aggregation multi-input multi-output test content;
configuring each test instrument according to each test scene combination, controlling each test instrument to generate a corresponding test signal, and issuing the corresponding test signal to the combining device;
combining the corresponding test signals through the combining device to obtain combined test signals;
the combined test signal is subjected to shunt processing through the power dividing module to obtain a plurality of shunt test signals, and each shunt test signal is input into a test port corresponding to the equipment to be tested;
and acquiring a throughput result of the equipment to be tested.
Optionally, the carrier aggregation mimo test content includes a carrier aggregation combination and a test frequency band combination; the processor 902 is further configured to: and correspondingly dividing all test frequency band combinations belonging to the same type of carrier aggregation combination into a test scene combination.
Optionally, the processor 902 is further configured to: acquiring the mapping relation between the output end of each test instrument and each port to be tested of the equipment to be tested;
and controlling the output end of each test instrument to generate a test signal matched with the corresponding port to be tested according to the mapping relation.
Optionally, the processor 902 is further configured to: and controlling the device to be tested to execute test preprocessing operation switched from a flight mode to an online mode.
Optionally, the processor 902 is further configured to: and if the throughput result is smaller than a preset throughput test standard, controlling the equipment to be tested to execute the test preprocessing operation for a preset number of times or controlling each test instrument to restart for a preset number of times, and retesting the throughput of the equipment to be tested after each test preprocessing operation or restart.
Optionally, the processor 902 is further configured to: acquiring throughput results of the equipment to be tested for a preset number of times;
and if the target throughput result which is greater than or equal to the preset throughput test standard exists in the throughput results of the preset times, determining that the throughput test of the device to be tested is successful.
Optionally, the processor 902 is further configured to: and if the throughput results of the preset times are all smaller than the preset throughput test standard, determining that the throughput test of the equipment to be tested fails.
In this embodiment of the present invention, the main control device 900 further includes: and a memory 903. In fig. 9, the bus architecture may include any number of interconnected buses and bridges, with various circuits representing one or more processors, in particular processor 902, and memory, in particular memory 903, being linked together. The bus architecture may also link together various other circuits such as peripherals, voltage regulators, power management circuits, and the like, which are well known in the art, and therefore, will not be described any further herein. The bus interface provides an interface. The transceiver 901 may be a number of elements including a transmitter and a receiver that provide a means for communicating with various other apparatus over a transmission medium. The processor 902 is responsible for managing the bus architecture and general processing, and the memory 903 may store data used by the processor 902 in performing operations.
The main control device 900 provided in the embodiment of the present invention may execute the throughput testing method in the above method embodiment 1, and is not described again to avoid repetition.
Example 4
The present application also provides a computer-readable storage medium on which a computer program is stored, which, when executed by a processor, implements the throughput testing method provided in embodiment 1.
In this embodiment, the computer-readable storage medium may be a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk or an optical disk.
In this embodiment, the computer-readable storage medium may be implemented by the throughput testing method shown in embodiment 1, and is not described herein again to avoid repetition.
It should be noted that, in this document, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or terminal that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or terminal. Without further limitation, an element defined by the phrases "comprising a component of' 8230; \8230;" does not exclude the presence of additional like elements in the process, method, article, or terminal that comprises the element.
Through the above description of the embodiments, those skilled in the art will clearly understand that the method of the above embodiments can be implemented by software plus a necessary general hardware platform, and certainly can also be implemented by hardware, but in many cases, the former is a better implementation manner. Based on such understanding, the technical solutions of the present application may be embodied in the form of a software product, which is stored in a storage medium (such as ROM/RAM, magnetic disk, optical disk) and includes instructions for enabling a terminal (such as a mobile phone, a computer, a server, an air conditioner, or a network device) to execute the method according to the embodiments of the present application.
While the present embodiments have been described with reference to the accompanying drawings, it is to be understood that the present embodiments are not limited to those precise embodiments, which are intended to be illustrative rather than restrictive, and that various changes and modifications may be effected therein by one skilled in the art without departing from the scope of the appended claims.
Claims (10)
1. The throughput testing method is characterized by being applied to main control equipment, wherein the main control equipment is respectively connected with input ends of a plurality of testing instruments, an output end of each testing instrument is connected with an input end of a combining device, an output end of the combining device is connected with an input end of a power dividing module, and output ends of the power dividing modules are respectively connected with ports to be tested corresponding to the devices to be tested, and the method comprises the following steps:
acquiring carrier aggregation multiple-input multiple-output test content;
carrying out test scene combination classification on the carrier aggregation multi-input multi-output test content;
configuring each test instrument according to each test scene combination, controlling each test instrument to generate a corresponding test signal, and issuing the corresponding test signal to the combining device;
combining the corresponding test signals through the combining device to obtain combined test signals;
the combined test signal is subjected to shunt processing through the power dividing module to obtain a plurality of shunt test signals, and each shunt test signal is input into a test port corresponding to the equipment to be tested;
and acquiring a throughput result of the equipment to be tested.
2. The method of claim 1, wherein the carrier aggregation multiple input multiple output test content comprises a carrier aggregation combination and a test band combination; the performing test scenario combination classification on the carrier aggregation multiple-input multiple-output test content includes:
and correspondingly dividing all test frequency band combinations belonging to the same type of carrier aggregation combination into a test scene combination.
3. The method of claim 1, further comprising:
acquiring the mapping relation between the output end of each test instrument and each port to be tested of the equipment to be tested;
the controlling each test instrument to generate a corresponding test signal includes:
and controlling the output end of each test instrument to generate a test signal matched with the corresponding port to be tested according to the mapping relation.
4. The method of claim 1, wherein the master device is further connected to the device under test, the method further comprising:
and controlling the device to be tested to execute a test preprocessing operation of switching from a flight mode to an online mode.
5. The method of claim 4, further comprising:
and if the throughput result is smaller than a preset throughput test standard, controlling the equipment to be tested to execute the test preprocessing operation for a preset number of times or controlling each test instrument to restart for a preset number of times, and retesting the throughput of the equipment to be tested after each test preprocessing operation or restart.
6. The method of claim 5, further comprising:
acquiring a throughput result of the equipment to be tested for a preset number of times;
and if the target throughput result which is greater than or equal to the preset throughput test standard exists in the throughput results of the preset times, determining that the throughput test of the device to be tested is successful.
7. The method of claim 6, further comprising:
and if the throughput results of the preset times are all smaller than the preset throughput test standard, determining that the throughput test of the equipment to be tested fails.
8. The throughput testing device is applied to a main control device, the main control device is respectively connected with the input ends of a plurality of testing instruments, the output end of each testing instrument is connected with the input end of a combining device, the output end of the combining device is connected with the input end of a power dividing module, the output end of the power dividing module is used for being respectively connected with a port to be tested corresponding to the device to be tested, and the throughput testing device comprises:
the first acquisition module is used for acquiring the carrier aggregation multi-input multi-output test content;
the classification module is used for carrying out test scene combination classification on the carrier aggregation multi-input multi-output test content;
the first processing module is used for configuring each test instrument according to various test scene combinations, controlling each test instrument to generate a corresponding test signal and sending the corresponding test signal to the combining device;
the second processing module is used for combining the corresponding test signals through the combining device to obtain combined test signals;
the third processing module is configured to perform branch processing on the combined test signal through the power splitting module to obtain multiple branch test signals, and input each branch test signal to a test port corresponding to the device to be tested;
and the second acquisition module is used for acquiring the throughput result of the equipment to be tested.
9. A master device comprising a memory and a processor, the memory storing a computer program that, when executed by the processor, performs the throughput testing method of any one of claims 1 to 7.
10. A computer-readable storage medium, characterized in that it stores a computer program which, when run on a processor, performs the throughput testing method of any of claims 1 to 7.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111004430.7A CN115733774B (en) | 2021-08-30 | 2021-08-30 | Throughput testing method and device and master control equipment |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202111004430.7A CN115733774B (en) | 2021-08-30 | 2021-08-30 | Throughput testing method and device and master control equipment |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN115733774A true CN115733774A (en) | 2023-03-03 |
| CN115733774B CN115733774B (en) | 2024-05-28 |
Family
ID=85290950
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202111004430.7A Active CN115733774B (en) | 2021-08-30 | 2021-08-30 | Throughput testing method and device and master control equipment |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN115733774B (en) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116996135A (en) * | 2023-09-27 | 2023-11-03 | 荣耀终端有限公司 | Path configuration device, method, readable medium and apparatus for radio frequency conduction test |
Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20060098670A1 (en) * | 2000-10-16 | 2006-05-11 | Verizon Services Corp. | Congestion and thru-put visibility and isolation |
| US20110103495A1 (en) * | 2009-11-04 | 2011-05-05 | Itt Manufacturing Enterprises, Inc. | Communications link redundancy including multiple input, multiple output architecture |
| CN103763719A (en) * | 2014-01-02 | 2014-04-30 | 工业和信息化部电信研究院 | Simulation drive test method for TD-LTE system |
| CN104427601A (en) * | 2013-08-29 | 2015-03-18 | 中国移动通信集团公司 | Method and device for adjusting channel power in two-channel indoor distribution system |
| CN106559275A (en) * | 2015-09-25 | 2017-04-05 | 中国移动通信集团公司 | A kind of throughput testing approach and device of multiple terminals |
| US9647919B1 (en) * | 2014-12-04 | 2017-05-09 | Amazon Technologies | Automated determination of maximum service throughput |
| US20170230293A1 (en) * | 2016-02-09 | 2017-08-10 | At&T Intellectual Property I, L.P. | Apparatus And Method For Automatic Reconciliation Of Data Throughput |
| CN107682230A (en) * | 2017-11-07 | 2018-02-09 | 太仓市同维电子有限公司 | A kind of WIFI performances and functional tester and its method of testing |
| CN107820268A (en) * | 2016-09-12 | 2018-03-20 | 深圳市新益技术有限公司 | Throughput testing approach and test system based on multi-probe WIFI MIMO equipment |
| US10021429B1 (en) * | 2017-07-18 | 2018-07-10 | Wowza Media Systems, LLC | Selection of a content source based on performance data |
| CN108667693A (en) * | 2018-07-24 | 2018-10-16 | 成都西加云杉科技有限公司 | Testing throughput system and method |
| CN109039486A (en) * | 2018-07-26 | 2018-12-18 | Oppo广东移动通信有限公司 | Multi-user's multiple-input, multiple-output equipment communication performance test macro, method and device |
-
2021
- 2021-08-30 CN CN202111004430.7A patent/CN115733774B/en active Active
Patent Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20060098670A1 (en) * | 2000-10-16 | 2006-05-11 | Verizon Services Corp. | Congestion and thru-put visibility and isolation |
| US20110103495A1 (en) * | 2009-11-04 | 2011-05-05 | Itt Manufacturing Enterprises, Inc. | Communications link redundancy including multiple input, multiple output architecture |
| CN104427601A (en) * | 2013-08-29 | 2015-03-18 | 中国移动通信集团公司 | Method and device for adjusting channel power in two-channel indoor distribution system |
| CN103763719A (en) * | 2014-01-02 | 2014-04-30 | 工业和信息化部电信研究院 | Simulation drive test method for TD-LTE system |
| US9647919B1 (en) * | 2014-12-04 | 2017-05-09 | Amazon Technologies | Automated determination of maximum service throughput |
| CN106559275A (en) * | 2015-09-25 | 2017-04-05 | 中国移动通信集团公司 | A kind of throughput testing approach and device of multiple terminals |
| US20170230293A1 (en) * | 2016-02-09 | 2017-08-10 | At&T Intellectual Property I, L.P. | Apparatus And Method For Automatic Reconciliation Of Data Throughput |
| CN107820268A (en) * | 2016-09-12 | 2018-03-20 | 深圳市新益技术有限公司 | Throughput testing approach and test system based on multi-probe WIFI MIMO equipment |
| US10021429B1 (en) * | 2017-07-18 | 2018-07-10 | Wowza Media Systems, LLC | Selection of a content source based on performance data |
| CN107682230A (en) * | 2017-11-07 | 2018-02-09 | 太仓市同维电子有限公司 | A kind of WIFI performances and functional tester and its method of testing |
| CN108667693A (en) * | 2018-07-24 | 2018-10-16 | 成都西加云杉科技有限公司 | Testing throughput system and method |
| CN109039486A (en) * | 2018-07-26 | 2018-12-18 | Oppo广东移动通信有限公司 | Multi-user's multiple-input, multiple-output equipment communication performance test macro, method and device |
Non-Patent Citations (4)
| Title |
|---|
| ""R2-1907703 Draft reply LS on PDCP end user throughput measurements"", 3GPP TSG_RAN\\WG2_RL2, 3 May 2019 (2019-05-03) * |
| K. RESHMA, ET AL.,: ""Throughput Analysis of Energy Harvesting Enabled Incremental Relaying NOMA System"", 《IEEE COMMUNICATIONS LETTERS》, vol. 24, no. 7, 31 July 2020 (2020-07-31) * |
| ZTE, CHINA MOBILE: "S5-185278 "Discussion paper on UE throughput Measurement"", 3GPP TSG_SA\\WG5_TM, 10 August 2018 (2018-08-10) * |
| 程杨;: "WiFi终端Throughput测试分析及LTE终端Throughput测试研究", 电视技术, no. 03, 17 March 2016 (2016-03-17) * |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116996135A (en) * | 2023-09-27 | 2023-11-03 | 荣耀终端有限公司 | Path configuration device, method, readable medium and apparatus for radio frequency conduction test |
| CN116996135B (en) * | 2023-09-27 | 2023-12-26 | 荣耀终端有限公司 | Path configuration device, method, readable medium and apparatus for radio frequency conduction test |
Also Published As
| Publication number | Publication date |
|---|---|
| CN115733774B (en) | 2024-05-28 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN109413686B (en) | Base station automatic test system, method and device | |
| CN102265664B (en) | Digital communications test system for multiple input, multiple output (MIMO) systems | |
| US7809404B2 (en) | MIMO passive channel emulator | |
| EP3654546A1 (en) | Method and device for antenna switching, antenna system, and storage medium | |
| CN105519042B (en) | Use the system and method for narrow frequency tester testing broad-band data packet signal transceiver | |
| CN104954040A (en) | Method for determining antenna use and electronic equipment | |
| CN113271113A (en) | Radio frequency system, radio frequency assembly and communication equipment | |
| CN210274097U (en) | Passive intermodulation test system of multiband multiaerial | |
| CN115733774B (en) | Throughput testing method and device and master control equipment | |
| CN105681127B (en) | Complete multiport for multiport RF component swears net measuring device and method | |
| CN112383320A (en) | Radio frequency circuit, electronic device and method for transmitting and receiving radio frequency signal | |
| CN105304999B (en) | Coupling device, antenna assembly, electronic equipment and control method | |
| CN110545144A (en) | Passive intermodulation test system of multiband multiaerial | |
| CN110311738B (en) | Radio frequency switching device and system | |
| US8150325B1 (en) | Blanking system | |
| US20090102491A1 (en) | Multiport test-set for switch module in network analyzer | |
| CN208820793U (en) | Base station testing system | |
| CN217010875U (en) | Radio frequency test equipment and system | |
| CN111492600B (en) | Radio frequency channel connection detection method and device | |
| CN114401184B (en) | Network communication equipment and method thereof, electronic equipment and medium | |
| CN112398491B (en) | Electronic device | |
| US20210337407A1 (en) | Mobile terminal test apparatus, mobile terminal test system, and control method for mobile terminal test apparatus | |
| CN114584158A (en) | 5G NR frequency shift double-channel MIMO power self-balancing system | |
| CN112839346A (en) | 5G radio frequency test interface box | |
| EP3396873B1 (en) | Mobile communication device and method |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| GR01 | Patent grant | ||
| GR01 | Patent grant |