CN115704854A

CN115704854A - Mainboard, terminal equipment, test system, test method and test device

Info

Publication number: CN115704854A
Application number: CN202110883970.0A
Authority: CN
Inventors: 梁磊
Original assignee: Beijing Xiaomi Mobile Software Co Ltd
Current assignee: Beijing Xiaomi Mobile Software Co Ltd
Priority date: 2021-08-03
Filing date: 2021-08-03
Publication date: 2023-02-17

Abstract

The disclosure relates to a mainboard, a terminal device, a test system, a test method and a test device, wherein the mainboard is provided with a detection circuit, and the detection circuit comprises: a first test point and a second test point. The first end of the first voltage dividing branch is connected with the first test point, the second end of the first voltage dividing branch is connected with the first end of the second voltage dividing branch, and the second end of the second voltage dividing branch is connected with the ground; the second test point is connected between the first voltage division branch and the second voltage division branch, and the voltage division information of the second voltage division branch is related to the number of the battery cells adaptive to the mainboard; the first test point is used for inputting detection voltage, and the second test point is used for outputting a detection signal corresponding to the partial pressure information. The number of the adaptive battery cores is different, and after the detection voltage is input to the first test point, the detection signals output by the second test point are different. The subsequent external test fixture can conveniently identify the mainboard according to the detection signal, and the adaptive power supply voltage can be more conveniently determined.

Description

Mainboard, terminal equipment, test system, test method and test device

Technical Field

The present disclosure relates to the field of terminal testing, and in particular, to a motherboard, a terminal device, a testing system, a testing method, and a testing apparatus.

Background

In the production process of terminal equipment such as a mobile phone, a mainboard needs to be subjected to function test, and the terminal equipment can leave a factory after the test is passed. In the factory testing process, an external testing fixture needs to be provided to supply power to the mainboard of the terminal device, and the testing process of the mainboard is completed.

When the charging power of the terminal device is small, the battery of the terminal device usually adopts a single-cell structure. For the mainboard matched with the single-cell battery, the test fixture provides 4V power supply voltage to meet the test requirement. Along with the technical development, the required charging power of the terminal equipment is larger and larger, and in order to meet the charging requirement, the battery structure of the terminal equipment can adopt a double-battery-core series connection structure. For the mainboard matched with the dual-cell battery, the test fixture needs to provide 8V power supply voltage.

In the related art, when a factory test process is performed, it is necessary to manually determine whether a current motherboard to be tested corresponds to a single-core structure or a dual-core structure, and then manually control and determine a corresponding power supply voltage. The testing efficiency and accuracy of manual control are low.

Disclosure of Invention

In order to overcome the problems in the related art, the present disclosure provides a motherboard, a terminal device, a test system, a test method, and a test apparatus.

According to a first aspect of the embodiments of the present disclosure, a motherboard provided with a detection circuit is provided, the detection circuit including:

a first test point and a second test point;

the first end of the first voltage dividing branch is connected with the first test point, the second end of the first voltage dividing branch is connected with the first end of the second voltage dividing branch, and the second end of the second voltage dividing branch is connected with the ground;

the second test point is connected between the first voltage division branch and the second voltage division branch, and the voltage division information of the second voltage division branch is related to the number of the battery cores adapted to the mainboard; the first test point is used for inputting detection voltage, and the second test point is used for outputting a detection signal corresponding to the partial pressure information.

In some embodiments, the first voltage divider circuit comprises a first voltage divider element and the second voltage divider circuit comprises a second voltage divider element.

In some embodiments, the first voltage dividing element is a first resistor and the second voltage dividing element is a second resistor; the resistance value of the first resistor is a set value, and the resistance value of the second resistor corresponds to the number of the battery cores matched with the mainboard.

In some embodiments, when the number of the battery cells adapted to the motherboard is a single battery cell, the resistance of the second resistor is greater than that of the first resistor; when the number of the battery cells matched with the mainboard is double battery cells, the resistance value of the second resistor is smaller than that of the first resistor.

In some embodiments, the first resistor has a resistance of 10 kilo-ohms;

when the number of the battery cells matched with the mainboard is a single battery cell, the resistance value of the second resistor is 100 kilo-ohms; when the number of the battery cores matched with the mainboard is double battery cores, the resistance value of the second resistor is 0 ohm.

According to a second aspect of an embodiment of the present disclosure, a terminal device is provided, which includes the main board described in any one of the above.

According to a third aspect of the embodiments of the present disclosure, a test system is provided, which includes a test fixture and the motherboard of any one of the above descriptions;

the test fixture comprises an output port and a sampling port, the output port is connected with a first test point of the mainboard, and the sampling port is connected with a second test point of the mainboard;

the test fixture is configured to: outputting a detection voltage to the first test point, and determining a power supply voltage for supplying power to the mainboard according to a detection signal of the second test point; the detection signal is used for representing voltage division information of the second voltage division circuit, and the voltage division information is related to the number of the battery cells adaptive to the mainboard.

According to a fourth aspect of the embodiments of the present disclosure, a testing method is provided, which is applied to the testing system described above, and the method includes:

responding to the connection state of the test fixture and the mainboard, and outputting detection voltage to a first test point of the mainboard;

acquiring a detection signal output by a second test point; the detection signal is used for representing voltage division information of a second voltage division circuit, and the voltage division information is related to the number of battery cells adapted to the mainboard;

and determining a power supply voltage according to the detection signal, and supplying power to the mainboard by using the power supply voltage.

In some embodiments, said determining a supply voltage from said detection signal comprises:

determining the number of the battery cores adapted to the mainboard according to the detection signal;

and determining the corresponding power supply voltage according to the number of the battery cores.

In some embodiments, the determining, according to the detection signal, the number of battery cells adapted to the motherboard includes:

in response to the fact that the detection signal is a high-level signal, determining that the number of the battery cores matched with the mainboard is a single battery core;

and determining the number of the electric cores matched with the mainboard to be double electric cores in response to the fact that the detection signal is a low level signal.

In some embodiments, the determining, according to the number of battery cells, a corresponding supply voltage includes:

determining that the power supply voltage is a first voltage in response to the number of the battery cells being the single battery cells;

determining that the power supply voltage is a second voltage in response to the number of the electric cores being double electric cores;

wherein the first voltage is less than the second voltage.

According to a fifth aspect of the embodiments of the present disclosure, a testing apparatus is provided, which is applied to the testing system, and includes:

the output module is used for outputting the detection voltage to a first test point of the mainboard;

the acquisition module is used for acquiring the detection signal output by the second test point; the detection signal is used for representing the voltage division information of the second voltage division circuit;

and the determining module is used for determining the power supply voltage according to the detection signal and supplying power to the mainboard by using the power supply voltage.

The technical scheme provided by the embodiment of the disclosure can have the following beneficial effects: in the mainboard structure disclosed by the invention, a first test point and a second test point which can be connected are reserved for an external test fixture. After the detection voltage is input to the first test point, the partial pressure of the second partial pressure branch is different for the main boards adaptive to different battery cell numbers, so that the detection signals output by the second test point are different. The subsequent external test fixture can conveniently identify the mainboard structure according to the detection signal, and the adaptive power supply voltage can be more conveniently determined.

It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the disclosure.

Drawings

The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the invention and together with the description, serve to explain the principles of the invention.

Fig. 1 is a schematic structural diagram of a motherboard according to an exemplary embodiment.

FIG. 2 is a schematic diagram of a test system shown in accordance with an exemplary embodiment.

FIG. 3 is a flow chart illustrating a method according to an example embodiment.

FIG. 4 is a flowchart illustrating a method in accordance with an example embodiment.

Fig. 5 is a block diagram illustrating an apparatus according to an example embodiment.

FIG. 6 is a block diagram of an electronic device shown in accordance with an example embodiment.

Detailed Description

Reference will now be made in detail to the exemplary embodiments, examples of which are illustrated in the accompanying drawings. When the following description refers to the accompanying drawings, like numbers in different drawings represent the same or similar elements unless otherwise indicated. The embodiments described in the following exemplary embodiments do not represent all embodiments consistent with the present invention. Rather, they are merely examples of apparatus and methods consistent with certain aspects of the invention, as detailed in the appended claims.

The problems of low efficiency and low accuracy of manual control testing exist in the factory testing process of the terminal equipment in the related technology. In addition, once the manual judgment is made, the main board is easily damaged, for example, the main board matched with the single electric core is provided with 8V voltage, so that the main board is damaged by overvoltage.

In the factory test process of the related technology, the test efficiency depending on manual control is low. And, still can't effectively discern single electric core mainboard and two electric core mainboards to the adaptation provides supply voltage. In the process of identifying different mainboards, an external test fixture is required to interact with the mainboard, and the mainboard can only rely on the external test fixture to supply power in the factory test process, so that the mainboard cannot send a corresponding communication instruction and needs to rely on the identification of the external test fixture.

The following identification methods exist in the related art: the two-dimensional code identification is silk-printed on the mainboard, and the camera is arranged on an external test fixture to identify the identification on the mainboard. And determining the power supply voltage according to the identification result. In this method, at least the following problems occur:

first, for a motherboard:

the sign on the mainboard can occupy the space of mainboard to the setting position of sign restricts more, needs to be convenient for aim at with the camera. In addition, although the main board is provided with the mark, the mark position still needs to be found by a manual auxiliary camera. Identifying the location of the tag is difficult.

Second, for external test fixtures:

a camera needs to be separately installed, and the cost is increased. And the camera has higher requirements on ambient light in the process of collecting and identifying images, and increases environmental restriction conditions. In addition, the external test fixture also needs to perform image processing and integrate an image recognition algorithm, so that the requirements on the test fixture are improved, and the complexity of the test process of the test fixture is increased.

In order to solve the problem in the related art, the embodiment of the present disclosure provides a motherboard, which is provided with a detection circuit, where the detection circuit includes: a first test point and a second test point; the first end of the first voltage division branch is connected with the first test point, the second end of the first voltage division branch is connected with the first end of the second voltage division branch, and the second end of the second voltage division branch is connected with the ground; the second test point is connected between the first voltage division branch and the second voltage division branch, and the voltage division information of the second voltage division branch is related to the number of the battery cells adaptive to the mainboard; the first test point is used for inputting detection voltage, and the second test point is used for outputting a detection signal corresponding to the partial pressure information. In the mainboard structure disclosed by the invention, a first test point and a second test point which can be connected are reserved for an external test fixture. After the detection voltage is input to the first test point, the partial pressure of the second partial pressure branch is different for the main boards adaptive to different battery cell numbers, so that the detection signals output by the second test point are different. The subsequent external test fixture can conveniently identify the mainboard structure according to the detection signal, and the adaptive power supply voltage can be more conveniently determined.

In an exemplary embodiment, as shown in fig. 1, the main board 1 in the present embodiment is provided with a detection circuit. The detection circuit includes: a first test point 11, a second test point 12, a first voltage dividing branch 13 and a second voltage dividing branch 14.

As shown in fig. 1, a first end of the first voltage-dividing branch 13 is connected to the first test point 11, a second end of the first voltage-dividing branch 13 is connected to a first end of the second voltage-dividing branch 14, and a second end of the second voltage-dividing branch 14 is connected to ground. The second test point 12 is connected between the first voltage-dividing branch 13 and the second voltage-dividing branch 14, and the voltage-dividing information of the second voltage-dividing branch 14 is related to the number of the battery cells adapted to the motherboard 1; the first test point 11 is used for inputting a test voltage, and the second test point 12 is used for outputting a test signal corresponding to the voltage division information.

In this embodiment, as shown in fig. 1 to fig. 2, the first test point 11 and the second test point 12 may be solder points or contacts disposed on the motherboard 1, and are used for connecting with the external test fixture 2. For example, the external test fixture 2 may input a detection voltage at the first test point 11 and collect a detection signal output from the second test point 12.

The voltage division information of the second voltage division branch 14 is related to the number of battery cells adapted to the motherboard, and may be, for example: the battery cores of the mainboard 1 are different in number and different in partial pressure information. The number of the battery cells and the voltage division information have a mapping corresponding relationship, for example, for a motherboard 1 adapted to a single battery cell (the number of the battery cells is 1), the voltage division information corresponding to the second voltage division branch 14 may be voltage division information a; for the motherboard 1 adapted to the dual-cell (the number of the cells is 2), the voltage division information corresponding to the second voltage division branch 14 may be the voltage division information B.

In this embodiment, the first voltage dividing branch 13 and the second voltage dividing branch 14 are connected in series to realize a voltage dividing effect. One end of the second voltage division branch 14 is connected to the second test point 12, and the other end is connected to ground, and the detection signal output by the second test point 12 can represent the voltage division information of the second voltage division branch 14. Based on the correlation between the voltage dividing information of the second voltage dividing branch 14 and the number of the battery cells adapted to the main board 1, in the production process of the terminal device and the main board, the main board adapted to different battery cells is adapted, and the voltage dividing information of the second voltage dividing branch 14 is different. Therefore, in the factory test process, the external test fixture 2 can provide detection voltage and autonomously identify and distinguish the number of the battery cells matched with the mainboard according to the voltage division information. Further, a corresponding power supply voltage is supplied, and factory test is performed on the motherboard 1. The process that the external test fixture 2 identifies the number of the battery cells matched with the mainboard 1 and the process of providing the power supply voltage do not need to electrify the mainboard 1. The detection circuit is simple in structure, the cost of the mainboard 1 is not greatly increased, and the layout of the mainboard 1 is not affected.

In an exemplary embodiment, as shown in fig. 1, the first voltage dividing circuit 13 includes a first voltage dividing element, and the second voltage dividing circuit 14 includes a second voltage dividing element.

In this embodiment, the first voltage dividing element and the second voltage dividing element may be, for example: a voltage dividing element having impedance such as a resistor or a capacitor. The first voltage division element and the second voltage division element are connected in series for voltage division, and the detection signal of the second voltage division branch 14 obtained by sampling at the second test point 12 can effectively reflect the voltage division information of the second voltage division element.

In an exemplary embodiment, as shown in fig. 1, the first voltage dividing element is a first resistor R1 and the second voltage dividing element is a second resistor R2. The resistance value of the first resistor R1 may be a set value, and the resistance value of the second resistor R2 corresponds to the number of battery cells adapted to the motherboard 1. The first resistor forms a pull-up resistor, and the grounded second resistor forms a pull-down resistor.

In one example, the resistance of the first resistor R1 is a fixed value of 10 kilo-ohms. When the number of the battery cells matched with the mainboard 1 is a single battery cell, the resistance value of the second resistor R2 is 100 kilo-ohms. When the number of the battery cells matched with the main board 1 is two battery cells, the resistance value of the second resistor R2 is 0 ohm.

In this example, if the external test fixture inputs a fixed detection voltage (for example, 3.3V) at the first test point 11, for the motherboard 1 adapted to a single cell, the second resistor R2 may be set to 100 kohms, and the divided voltage is: 3.3 × 100/(100 + 10) =3V. Correspondingly, the detection signal sampled by the external test fixture at the second test point 12 will be a high level signal. For the motherboard 2 adapted to the dual-cell, the second resistor R2 may be set to 0 ohm, and the divided voltage is 0V. Correspondingly, the detection signal sampled by the external test fixture at the second test point 12 will be a low level signal.

According to the present example, the external test fixture 2 can accurately determine whether the main board 1 to be tested is adapted to a single electric core or a double electric core according to the collected detection signal.

In another example, when the number of the battery cells is a single battery cell, the resistance value of the second resistor is greater than that of the first resistor, and the ratio of the resistance values of the second resistor and the first resistor is, for example, 10. When the number of the battery cells is double, the resistance value of the second resistor is smaller than that of the first resistor.

In this example, a large difference between the resistance values of the first resistor and the second resistor is maintained, so that the difference of the divided voltage of the second resistor can be improved, and the sensitivity of the sampling detection signal can be improved.

In this embodiment, for the main board adapted to the terminal devices with different numbers of battery cells, the resistance values of the corresponding second resistors R2 are also different. The voltage division information generated by the second resistor R2 is different according to the resistance value, and the external test fixture 2 can identify the number of the corresponding battery cells according to the difference of the detection signals adopted at the second test point 12.

In an exemplary embodiment, an embodiment of the present disclosure further provides a terminal device, including the main board in the foregoing embodiment.

In an exemplary embodiment, the embodiment of the present disclosure also provides a test system. As shown in fig. 2, the test system of the present embodiment includes: the test fixture 2 and the motherboard 1 according to the above embodiments.

The test fixture 2 includes an output port 21 and a sampling port 22. The output port 21 is connected to a first test point 11 of the motherboard 1, and the sampling port 22 is connected to a second test point 12 of the motherboard. The test fixture 2 is configured to: and outputting the detection voltage to the first test point, and determining the power supply voltage for supplying power to the mainboard 1 according to the detection signal of the second test point 12. The detection signal is used for representing voltage division information of the second voltage division circuit 14, and the voltage division information is related to the number of battery cells adapted to the mainboard.

In this embodiment, the output port 21 and the sampling port 22 may be configured as a signal thimble structure, the output port 21 may be in contact connection with the first test point 11, and the sampling port 22 is in contact connection with the second test point 12.

Before the terminal equipment leaves factory for testing, the battery cell number adapted to the main board 1 is determined through the testing jig 2. The test fixture 2 inputs a fixed detection voltage (for example, 3.3V) to the first test point 11 through the output port 21, collects a detection signal at the second test point 12 through the sampling port 22, and determines the number of battery cells adapted to the motherboard 1 according to the detection signal. Wherein, the detection voltage (such as 3.3V) is provided from the test fixture 2, and the mainboard 1 does not need to be electrified; the type of the motherboard is actively recognized when the motherboard 1 is not powered on.

After the number of the battery cores matched with the mainboard 1 is determined, the test fixture 2 supplies power to the mainboard 1 to perform the function test of the mainboard 1. The number of the battery cores adapted to the mainboard 1 is different, and the power supply voltage is different. For example, the main board 1 is adapted to a single battery cell, and the power supply voltage may be 4V. Or, the main board 1 is adapted to dual cells, and the power supply voltage may be 8V. It can be understood that, when the test fixture 2 supplies power to the motherboard 1, the input port for supplying power may be located at another position on the motherboard 1 than the detection circuit. So that the present embodiment can provide the motherboard 1 with a suitable supply voltage.

In the test system in this embodiment, the test fixture 2 can be used to simply, quickly and inexpensively identify whether the mobile phone motherboard 1 is adapted to a single battery cell or a double battery cell, and then provide a corresponding power supply voltage, thereby avoiding the safety problem caused by the volatile errors of the test fixtures shared by different types of motherboards in an artificial management and control mode. The test fixture 2 autonomously identifies the type of the mainboard 1, the scheme is convenient and easy to realize, and great change and cost burden can not be caused to the existing test fixture 2.

In an exemplary embodiment, the embodiment of the present disclosure further provides a testing method applied to the testing system of the above embodiment. As shown in fig. 3, the method of the present embodiment may include the following steps:

and S110, responding to the connection state of the test fixture and the mainboard, and outputting the detection voltage to a first test point of the mainboard.

And S120, acquiring a detection signal output by the second test point.

And S130, determining a power supply voltage according to the detection signal, and supplying power to the mainboard by using the power supply voltage.

The method of the present embodiment may be executed, for example, by a processor or a control module of a test fixture.

In step S110, referring to fig. 1 to fig. 2, when the test fixture 2 is connected to the motherboard 1, for example, the output port 21 of the test fixture 2 is connected to the first test point 11 of the motherboard 1, and the sampling port 22 is connected to the second test point 12.

In this step, after the processor of the test fixture 2 determines that the test fixture is in the connection state, the processor can output the detection voltage to the first test point 11 through the output port 21. The detection voltage may be a set value, such as 3.3V. The detection voltage provided by the test fixture 2 is only used for identifying the detection signal of the motherboard 1, and is not used for supplying power for the functional test of the motherboard 1.

In step S120, the detection signal is used to represent voltage division information of the second voltage division branch 13, where the voltage division information is related to the number of battery cells adapted to the motherboard 1. For example, the following may be: the electric core quantity of 1 adaptation of mainboard is different, and partial pressure information is different, and detected signal is different.

In this step, the sampling port 22 of the test fixture 2 collects the detection signal output by the second test point 12, and the processor obtains the detection signal.

In step S130, with reference to the foregoing embodiment, the processor of the test fixture 2 may determine the number of the battery cells adapted to the motherboard 1 according to the detection signal, and further determine the power supply voltage. And providing power supply voltage for the mainboard so as to facilitate the factory test of the mainboard.

In an exemplary embodiment, as shown in fig. 4, step S130 in this embodiment may include the following steps:

and S1301, determining the number of the battery cores matched with the main board according to the detection signal.

And S1302, determining the corresponding power supply voltage according to the number of the battery cores.

In step S1301, the processor of the test fixture determines the number of the battery cells adapted to the motherboard according to different detection signals.

For example, in the structure of the main board 1 shown in fig. 2, the resistance of the first resistor R1 is 10 kilo-ohms. When the number of the battery cells matched with the mainboard 1 is a single battery cell, the resistance value of the second resistor R2 is 100 kilo-ohms. When the number of the battery cells matched with the main board 1 is two battery cells, the resistance value of the second resistor R2 is 0 ohm. The test fixture inputs a fixed detection voltage (e.g., 3.3V) at the first test point 11.

In one example, in response to the detection signal being a high level signal, the number of battery cells adapted to the main board is determined to be a single battery cell.

In this example, when the detection signal is a high-level signal, it indicates that the voltage division of the second resistor is large, the resistance of the second resistor is also large, and the number of the adapted battery cells is a single battery cell.

In another example, the number of battery cells adapted to the main board is determined to be two battery cells in response to the detection signal being a low level signal.

In this example, when the detection signal is a low level signal, it indicates that the divided voltage of the second resistor is small, the resistance of the second resistor is very small (for example, 0), and the number of the adapted battery cells is two battery cells.

In step S1302, the test fixture may determine, in combination with the number of battery cells determined in step S1301, a corresponding obtained power supply voltage.

For example, in response to the number of cells being a single cell, the supply voltage is determined to be a first voltage. Or, in response to the number of the electric cores being the double electric cores, determining the power supply voltage to be the second voltage. Wherein the first voltage is less than the second voltage. The first voltage is, for example, 4V and the second voltage is, for example, 8V.

In the embodiment of the present disclosure, the test fixture 2 actively identifies the number of the battery cells adapted to the motherboard 1 by providing the detection voltage. Therefore, the corresponding power supply voltage is determined again, and the power supply voltage is provided for factory test of the mainboard 1. The efficiency of discernment is higher more convenient.

In an exemplary embodiment, the present disclosure further provides a testing apparatus, which is applied to the testing system of the foregoing embodiment. As shown in fig. 5, the apparatus of the present embodiment includes: an output module 110, an acquisition module 120, and a determination module 130. The apparatus of the present embodiment is used to implement the method as shown in fig. 3. The output module 110 is configured to output a detection voltage to a first test point of a motherboard. The obtaining module 120 is configured to obtain a detection signal output by the second test point; the detection signal is used for representing the voltage division information of the second voltage division circuit. The determining module 130 is configured to determine a power supply voltage according to the detection signal, and supply power to the motherboard with the power supply voltage.

In an exemplary embodiment, still referring to fig. 5, the apparatus in this embodiment comprises: an output module 110, an acquisition module 120, and a determination module 130. The apparatus of the present embodiment is used to implement the method as shown in fig. 4. Wherein the determining module 130 is further configured to: determining the number of battery cores adapted to the mainboard according to the detection signal; and determining the corresponding power supply voltage according to the number of the battery cores.

In this embodiment, the determining module 130 is further configured to: in response to the fact that the detection signal is a high-level signal, determining that the number of the battery cores matched with the mainboard is a single battery core; and determining the number of the battery cores matched with the mainboard as double battery cores in response to the detection signal being a low level signal. The determining module 130 is further configured to: determining that the power supply voltage is a first voltage in response to the number of the electric cores being a single electric core; determining that the power supply voltage is a second voltage in response to the number of the electric cores being double electric cores; wherein the first voltage is less than the second voltage.

Fig. 6 is a block diagram of an electronic device. The present disclosure also provides for an electronic device, for example, the device 500 may be a mobile phone, a computer, a digital broadcast terminal, a messaging device, a game console, a tablet device, a medical device, an exercise device, a personal digital assistant, and the like.

Device 500 may include one or more of the following components: a processing component 502, a memory 504, a power component 506, a multimedia component 508, an audio component 511, an input/output (I/O) interface 512, a sensor component 514, and a communication component 516.

The processing component 502 generally controls overall operation of the device 500, such as operations related to display, telephone calls, data communications, camera operations, and recording operations. The processing component 502 may include one or more processors 512 to execute instructions to perform all or a portion of the steps of the methods described above. Further, the processing component 502 can include one or more modules that facilitate interaction between the processing component 502 and other components. For example, the processing component 502 can include a multimedia module to facilitate interaction between the multimedia component 508 and the processing component 502.

The memory 504 is configured to store various types of data to support operation at the device 500. Examples of such data include instructions for any application or method operating on device 500, contact data, phonebook data, messages, pictures, videos, and so forth. The memory 504 may be implemented by any type or combination of volatile and non-volatile storage devices, such as Static Random Access Memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic memory, flash memory, magnetic or optical disks.

Power component 506 provides power to the various components of device 500. The power components 506 may include a power management system, one or more power sources, and other components related to generating, managing, and distributing power for the apparatus 500.

The multimedia component 508 includes a screen that provides an output interface between the device 500 and the user. In some embodiments, the screen may include a Liquid Crystal Display (LCD) and a Touch Panel (TP). If the screen includes a touch panel, the screen may be implemented as a touch screen to receive an input signal from a user. The touch panel includes one or more touch sensors to sense touch, slide, and gestures on the touch panel. The touch sensor may not only sense the boundary of a touch or slide action, but also detect the duration and pressure associated with the touch or slide operation. In some embodiments, the multimedia component 508 includes a front facing camera and/or a rear facing camera. The front camera and/or the rear camera may receive external multimedia data when the device 500 is in an operational mode, such as a shooting mode or a video mode. Each front camera and rear camera may be a fixed optical lens system or have a focal length and optical zoom capability.

The audio component 511 is configured to output and/or input an audio signal. For example, the audio component 511 includes a Microphone (MIC) configured to receive external audio signals when the device 500 is in an operational mode, such as a call mode, a recording mode, and a voice recognition mode. The received audio signal may further be stored in the memory 504 or transmitted via the communication component 516. In some embodiments, audio component 511 further comprises a speaker for outputting audio signals.

The I/O interface 512 provides an interface between the processing component 502 and peripheral interface modules, which may be keyboards, click wheels, buttons, etc. These buttons may include, but are not limited to: a home button, a volume button, a start button, and a lock button.

The sensor assembly 514 includes one or more sensors for providing various aspects of status assessment for the device 500. For example, the sensor component 514 may detect an open/closed state of the device 500, the relative positioning of components, such as a display and keypad of the device 500, the sensor component 514 may detect a change in position of the device 500 or a component of the device 500, the presence or absence of user contact with the device 500, orientation or acceleration/deceleration of the device 500, and a change in temperature of the apparatus 500. The sensor assembly 514 may include a proximity sensor configured to detect the presence of a nearby object in the absence of any physical contact. The sensor assembly 514 may also include a light sensor, such as a CMOS or CCD image sensor, for use in imaging applications. In some embodiments, the sensor assembly 514 may also include an acceleration sensor, a gyroscope sensor, a magnetic sensor, a pressure sensor, or a temperature sensor.

The communication component 516 is configured to facilitate communications between the device 500 and other devices in a wired or wireless manner. The device 500 may access a wireless network based on a communication standard, such as WiFi,2G or 3G, or a combination thereof. In an exemplary embodiment, the communication component 516 receives a broadcast signal or broadcast related information from an external broadcast management system via a broadcast channel. In an exemplary embodiment, the communication component 516 further includes a Near Field Communication (NFC) module to facilitate short-range communications. For example, the NFC module may be implemented based on Radio Frequency Identification (RFID) technology, infrared data association (IrDA) technology, ultra Wideband (UWB) technology, bluetooth (BT) technology, and other technologies.

In an exemplary embodiment, the device 500 may be implemented by one or more Application Specific Integrated Circuits (ASICs), digital Signal Processors (DSPs), digital Signal Processing Devices (DSPDs), programmable Logic Devices (PLDs), field Programmable Gate Arrays (FPGAs), controllers, micro-controllers, microprocessors or other electronic components for performing the above-described methods.

A non-transitory computer readable storage medium, such as the memory 504 including instructions executable by the processor 512 of the device 500 to perform the method, is provided in another exemplary embodiment of the present disclosure. For example, the computer readable storage medium may be a ROM, a Random Access Memory (RAM), a CD-ROM, a magnetic tape, a floppy disk, an optical data storage device, and the like. The instructions in the storage medium, when executed by a processor of the electronic device, enable the electronic device to perform the above-described method.

Other embodiments of the invention will be apparent to those skilled in the art from consideration of the specification and practice of the invention disclosed herein. This application is intended to cover any variations, uses, or adaptations of the invention following, in general, the principles of the invention and including such departures from the present disclosure as come within known or customary practice within the art to which the invention pertains. It is intended that the specification and examples be considered as exemplary only, with a true scope and spirit of the invention being indicated by the following claims.

It will be understood that the invention is not limited to the precise arrangements described above and shown in the drawings and that various modifications and changes may be made without departing from the scope thereof. The scope of the invention is limited only by the appended claims.

Claims

1. A motherboard, characterized in that, is provided with a detection circuit, the detection circuit includes:

a first test point and a second test point;

2. The motherboard of claim 1, wherein the first voltage-dividing circuit comprises a first voltage-dividing element and the second voltage-dividing circuit comprises a second voltage-dividing element.

3. The motherboard of claim 2, wherein the first voltage-dividing element is a first resistor and the second voltage-dividing element is a second resistor; the resistance value of the first resistor is a set value, and the resistance value of the second resistor corresponds to the number of the battery cores matched with the mainboard.

4. The main board according to claim 3, wherein when the number of cells adapted to the main board is a single cell, the resistance of the second resistor is greater than that of the first resistor; when the number of the battery cells matched with the mainboard is double battery cells, the resistance value of the second resistor is smaller than that of the first resistor.

5. The motherboard of claim 3, wherein the first resistor has a resistance of 10 kilo-ohms;

when the number of the battery cells matched with the mainboard is a single battery cell, the resistance value of the second resistor is 100 kilo-ohm; when the battery cell quantity of mainboard adaptation is two battery cells, the resistance of second resistance is 0 ohm.

6. A terminal device, characterized in that it comprises a main board according to any one of claims 1 to 5.

7. A test system, comprising a test fixture and the main board of any one of claims 1 to 5;

8. A test method applied to the test system of claim 7, the method comprising:

acquiring a detection signal output by a second test point; the detection signal is used for representing the voltage division information of the second voltage division circuit, and the voltage division information is related to the number of the battery cells adaptive to the mainboard;

9. The method of claim 8, wherein determining a supply voltage based on the detection signal comprises:

determining the number of battery cells adapted to the mainboard according to the detection signal;

10. The testing method according to claim 9, wherein the determining the number of battery cells adapted to the motherboard according to the detection signal includes:

and determining the number of the electric cores adapted to the mainboard to be double electric cores in response to the detection signal being a low level signal.

11. The testing method of claim 10, wherein determining the corresponding supply voltage according to the number of the cells comprises:

determining that the power supply voltage is a first voltage in response to the number of the electric cores being a single electric core;

wherein the first voltage is less than the second voltage.

12. A test apparatus, applied to the test system of claim 7, the apparatus comprising: