CN115698774A - X-ray imaging apparatus and method - Google Patents

X-ray imaging apparatus and method Download PDF

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Publication number
CN115698774A
CN115698774A CN202180040204.6A CN202180040204A CN115698774A CN 115698774 A CN115698774 A CN 115698774A CN 202180040204 A CN202180040204 A CN 202180040204A CN 115698774 A CN115698774 A CN 115698774A
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module
ray
pencil
rays
pencil beam
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Chinese (zh)
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P·J·罗特希尔德
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Vikon Testing Co
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Vikon Testing Co
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    • G01V5/222
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/04Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/20008Constructional details of analysers, e.g. characterised by X-ray source, detector or optical system; Accessories therefor; Preparing specimens therefor
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/20Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by using diffraction of the radiation by the materials, e.g. for investigating crystal structure; by using scattering of the radiation by the materials, e.g. for investigating non-crystalline materials; by using reflection of the radiation by the materials
    • G01N23/203Measuring back scattering
    • G01V5/22
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/045Investigating materials by wave or particle radiation combination of at least 2 measurements (transmission and scatter)
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/05Investigating materials by wave or particle radiation by diffraction, scatter or reflection
    • G01N2223/053Investigating materials by wave or particle radiation by diffraction, scatter or reflection back scatter
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/10Different kinds of radiation or particles
    • G01N2223/101Different kinds of radiation or particles electromagnetic radiation
    • G01N2223/1016X-ray
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/30Accessories, mechanical or electrical features
    • G01N2223/301Accessories, mechanical or electrical features portable apparatus
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/30Accessories, mechanical or electrical features
    • G01N2223/308Accessories, mechanical or electrical features support of radiation source
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/30Accessories, mechanical or electrical features
    • G01N2223/316Accessories, mechanical or electrical features collimators
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/30Accessories, mechanical or electrical features
    • G01N2223/33Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts
    • G01N2223/3301Accessories, mechanical or electrical features scanning, i.e. relative motion for measurement of successive object-parts beam is modified for scan, e.g. moving collimator
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/40Imaging
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00Investigating materials by wave or particle radiation
    • G01N2223/60Specific applications or type of materials
    • G01N2223/639Specific applications or type of materials material in a container
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/02Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
    • G01N23/06Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
    • G01N23/10Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the material being confined in a container, e.g. in a luggage X-ray scanners

Abstract

An x-ray imaging device comprising: an x-ray source module (1502) configured to output source x-rays; a pencil beam forming module (1506) having input and output ports; and a module engagement interface that enables a user to select aligned and non-aligned configurations of the source module and pencil beam forming module. In the aligned configuration, the pencil beam forming module is aligned with the source module to receive the source x-rays at the input port and output a scanning pencil beam through the output port toward the target. In the unaligned configuration, the pencil beam forming module is not aligned with the x-ray source module to receive the source x-rays, nor output the pencil beam, but rather enables the source x-rays to form a stationary wide area beam directed at the target (1602). Example embodiments may be hand-held, may enable both backscatter imaging and high resolution transmission imaging using the same equipment, and may be used to find and disarm explosive devices.

Description

X-ray imaging apparatus and method
RELATED APPLICATIONS
This application claims the benefit of U.S. provisional application No.63/033,519, filed on day 2, month 6, 2020. The entire teachings of the above application are incorporated herein by reference.
Background
Since the end of the 20 th century, the 80's, X-ray backscatter imaging has been used to detect concealed contraband such as drugs, explosives and weapons. Unlike conventional transmission x-ray imaging, which creates an image by detecting x-rays that penetrate an object, backscatter imaging uses reflected or scattered x-rays to create an image.
Over the past several years, hand-held x-ray backscatter imaging devices have been introduced into the marketplace that enable operators to quickly inspect suspicious vehicles, packages, or other objects. These devices have been designed to be relatively compact and lightweight, making it easier to operate them for long periods of time.
Disclosure of Invention
Backscatter imaging instruments, such as hand-held instruments, can also be used to obtain transmission images of a target object by placing a non-pixilated (i.e., single channel) x-ray detector panel behind the object being imaged. The detector panel intercepts the swept beam after it has passed through the object, allowing a transmission image to be created while the backscatter image is being acquired. However, a limitation of this approach is that the resolution of the transmission image is low, since the imaging resolution is defined by the size of the sweeping pencil beam as it passes through the imaged object.
For bomb disposal or explosive ordnance technicians, high resolution transmission images are a necessary tool to safely disable explosive devices because the precise location and routing of the leads and the location of the initiator must be accurately known. This is not possible using transmission images acquired with pencil beams from a backscatter imager.
Embodiments disclosed herein may also be used to acquire both backscatter and transmission images from the same device. For example, transmission images useful to bomb or EOD treatment technicians may be acquired with sufficient resolution. In one application, the backscatter image may be used to locate the presence of organic explosive materials, and the high resolution transmission image may be used to assist in deactivating the initiating device that may also be present.
In one particular embodiment, an x-ray imaging device includes: an x-ray source module configured to output source x-rays; a pencil beam forming module having an input port and an output port; and a module engagement interface configured to enable a user to select an alignment configuration of the x-ray source module and the pencil beam forming module. In the aligned configuration, the pencil beam forming module is aligned with the x-ray source module to receive source x-rays at an input port of the pencil beam forming module and scan a pencil beam through an output port of the pencil beam forming module toward a target output, the module interface further configured to enable a user to select a non-aligned configuration of the x-ray source module and the pencil beam forming module. In a non-aligned configuration, the pencil beam forming module is not aligned with the x-ray source module to receive source x-rays at the input port and to output neither a scanning pencil beam, the non-aligned configuration enabling the output source x-rays to form a stationary wide area beam directed at the target.
The module engagement interface may include complementary attachment features on the pencil beam forming module and the x-ray source module configured to allow the pencil beam forming module and the x-ray source module to attach to each other in an aligned configuration and detach from each other in a non-aligned configuration. The complementary attachment features may be mechanical latches, straps, snaps, rivets, pins, or hook and loop fastener components. The complementary attachment feature may be a magnet or a magnet and a magnetically sensitive material.
The module engagement interface may include a rotational coupling or a translational coupling between the pencil beam forming module and the x-ray source module. The module engagement interface may also be configured to enable a user to select an aligned or unaligned configuration via manual manipulation of the pencil beam forming module by the user via the module engagement interface. The module engagement interface may include an electromechanical actuator configured to move the pencil beam forming module relative to the x-ray source module in response to a user selection of the aligned or unaligned configuration.
The apparatus may further include: a handle configured to accommodate handheld operation; a robotic platform mounting feature configured to mechanically couple the x-ray source module to a robotic platform for operation; or a drone mounting feature configured to mechanically couple the x-ray source module to a drone for remote airborne operation.
The apparatus may also include a housing that completely or partially encloses the x-ray source module, the pencil beam forming module, or both, the housing including a first housing output port configured to output a scanned pencil beam in the aligned configuration, and the housing including a second housing output port configured to output a stationary wide area beam in the unaligned configuration. The module engagement interface may include a housing and a combination of attachment features that attach the x-ray source module, the pencil beam forming module, or both to the housing.
The apparatus may also include one or more backscatter detectors configured to detect x-rays backscattered from the target from the scanned pencil beam. The backscatter detectors may form part of the pencil beamforming module and may be configured to remain fixedly attached to the pencil beamforming module in the aligned and unaligned configurations.
An x-ray imaging system can include an x-ray imaging apparatus having any of the features described above, and further include a plurality of backscatter detectors having different respective sizes and selectively and interchangeably attachable to the x-ray source module or the pencil beam forming module.
An x-ray imaging system can include an x-ray imaging device having any of the features described above, and can further include a pixelated detector configured to receive x-rays from a stationary wide area beam transmitted through a target.
In another embodiment, an x-ray imaging device includes: a beam forming module configured to selectively output x-rays from an x-ray source forming portion of the beam forming module in a scanning pencil beam format and a stationary wide area beam format.
In another embodiment, an x-ray imaging method includes: selectively forming, at a beam forming module, an x-ray beam in a scanning pencil beam format using x-rays from an x-ray source formation of the beam forming module; and selectively forming an x-ray beam in a stationary wide-area beam format using x-rays from the x-ray source at the beam forming module.
The beam forming module may also include a pencil beam forming module. Selectively forming the x-ray beam in a scanning pencil beam format can include aligning an input port of a pencil beam forming module with the x-ray source to receive source x-rays at the input port. Selectively forming the stationary wide-area beam may include mechanically shifting an input port of the pencil beam forming module relative to the x-ray source such that the input port of the pencil beam forming module is misaligned to receive source x-rays at the input port.
The method may further comprise: scanning an x-ray beam in a scanning pencil beam format over a first target; and illuminating the first target or the second target with an x-ray beam in a stationary wide-area beam format.
In another embodiment, an x-ray imaging device includes: an x-ray source module configured to output source x-rays; a pencil beam shaping module selectively attachable to and detachable from the x-ray source module, the pencil beam shaping module configured to receive source x-rays and output a scanning pencil beam when attached to the x-ray source module; and a safety interlock configured to cause the x-ray source module to stop outputting source x-rays in continuous operation when the pencil beam forming module is separated from the x-ray source module.
In another embodiment, an x-ray imaging device includes: means for selectively forming, at a beam forming module, an x-ray beam in a scanned pencil beam format using x-rays from an x-ray source formation of the beam forming module; and means for selectively forming an x-ray beam in a stationary wide-area beam format using x-rays from the x-ray source at the beam forming module.
In another embodiment, an x-ray imaging device includes: an x-ray source module configured to output source x-rays; and an x-ray beam mode selection interface configured to enable a user to select a scanning pencil beam forming mechanical arrangement configured to form the source x-rays into a scanning pencil beam, and alternatively to select a stationary wide area x-ray beam forming mechanical arrangement configured to form the source x-rays into a stationary wide area x-ray beam.
Drawings
FIG. 1A is a schematic block diagram illustrating an embodiment x-ray imaging device in an aligned configuration, which allows a pencil beam of x-rays to scan a target object.
Fig. 1B is a schematic block diagram of the x-ray imaging device of fig. 1A in a non-aligned configuration, capable of outputting a stationary wide-area beam of x-rays for high resolution transmission imaging.
Fig. 2A is a schematic block diagram illustrating an embodiment device in which a module engagement interface includes a lip and a clip.
Fig. 2B is a schematic block diagram illustrating an embodiment device in which a module engagement interface includes a magnet and a magnetically sensitive material.
Fig. 2C is a schematic block diagram illustrating an embodiment in which the module engagement interface includes a post and a strap.
Fig. 2D is a schematic block diagram illustrating an embodiment in which the module engagement interface includes a bracket and a bolt.
Fig. 2E is a schematic block diagram illustrating an embodiment in which the module engagement interface includes a snap-in tray, the apparatus further including an x-ray backscatter detector.
Fig. 3A-3B are schematic block diagrams illustrating an embodiment device, respectively, wherein the module engagement interface includes a rotational coupling and a translational coupling.
Fig. 3C-3D are schematic diagrams illustrating embodiment apparatuses configured to be mounted to a robotic platform and an Unmanned Aerial Vehicle (UAV), respectively.
Fig. 4A-4C are perspective views illustrating the embodiment apparatus of fig. 1A-1B, further including smaller and larger x-ray backscatter detectors, respectively, that may be selectively and interchangeably attached to the apparatus.
Fig. 5 is a schematic block diagram illustrating an embodiment device including a more general beamforming module configured to selectively output x-rays in a scanned pencil beam format and a stationary wide area beam format.
Fig. 6 is a schematic block diagram illustrating the embodiment device of fig. 5, further including an x-ray beam mode selection interface.
Fig. 7A-7B are schematic block diagrams illustrating portions of the embodiment device of fig. 1A-1B, further including a safety interlock.
FIG. 7C is a schematic block diagram similar to FIGS. 7A-7B, wherein the safety interlock specifically includes an electrical circuit.
FIG. 8 is a flow chart illustrating an x-ray imaging process according to an embodiment method.
FIG. 9 (Prior Art) is a perspective schematic view of a system that may be used for x-ray backscatter imaging.
Figure 10 (prior art) is an image showing a prior hand-held backscatter x-ray imaging instrument manufactured by Viken Detection Corporation, operating at 120kV, with a compact built-in backscatter detector.
FIG. 11 (Prior Art) is an image showing the use of the apparatus of FIG. 10 with a non-pixilated detector in a pencil beam scanning system to acquire a transmission image of a travel bag.
Fig. 12 (prior art) is an image and illustration showing the use of a cone-beam x-ray source in combination with a pixilated detector panel to create a very high resolution transmission image of a travel bag.
FIG. 13 (Prior Art) is an example transmission image created using the pencil beam scanning system shown in FIG. 11.
FIG. 14 (Prior Art) is an example transmission image created with the stationary cone beam system of FIG. 12.
Fig. 15 is a perspective image and schematic diagram showing an embodiment x-ray imaging device, including an x-ray source and a detachable pencil beam forming module.
Figure 16 is a perspective image and illustration showing the x-ray source module of figure 15 with the pencil beam forming module removed therefrom, thus in a non-aligned configuration, wherein the x-ray source module outputs a stationary wide-area x-ray beam using a pixelated transmission detector for a high resolution transmission image.
FIG. 17 is a perspective view of the pencil beam forming module of FIG. 15 mounted with an x-ray backscatter detector in a removable assembly.
Fig. 18 is an image and illustration showing the x-ray imaging device of fig. 15 modified to be mounted on a rotating platform to provide a sweeping pencil beam scan in a vertical plane.
Fig. 19 illustrates the embodiment device of fig. 18 with the addition of a rotary coupling module engagement interface to facilitate robot-based or drone-based remote x-ray inspection.
The foregoing will be apparent from the following more particular description of example embodiments, as illustrated in the accompanying drawings in which like reference characters refer to the same parts throughout the different views. The drawings are not necessarily to scale, emphasis instead being placed upon illustrating embodiments.
Detailed Description
The description of the example embodiments follows.
Fig. 1A is a schematic block diagram illustrating an embodiment x-ray imaging device 100 in an aligned configuration, which allows an x-ray pencil beam 116 to scan a target object 118 in a scanning motion 117. The apparatus 100 includes an x-ray source module 102 configured to output source x-rays 104 from an output port 113 of the x-ray source 102. The apparatus 100 also includes a pencil beam forming module 106 having an input port 108 and an output port 110. The apparatus 100 further comprises a module interface 112 configured to enable a user to select an alignment configuration of the x-ray source module and the pencil beam forming module such that in the alignment configuration the pencil beam forming module is aligned with the x-ray source module 102 to receive the source x-rays 104 at the input port 108 and output a scanning pencil beam 116 through the output port 110 towards the target 118. The enabling of the user selection is indicated by arrow 114. The action of the module engagement interface 112 on the x-ray source module 102 and the pencil beam forming module 106 to achieve the selection of the aligned configuration shown in fig. 1A or the non-aligned configuration shown in fig. 1B is represented by arrow 115.
Fig. 1B is a schematic block diagram of the x-ray imaging device of fig. 1A in a non-aligned configuration of the x-ray source module 102 and the pencil beam forming module 106. In the unaligned configuration, the pencil beam forming module 106 is not aligned with the x-ray source module 102 to receive the source x-rays 104 at the input port 108, nor outputs a scanning pencil beam 116 from the output 110. In contrast, the non-aligned configuration shown in fig. 1B enables the output source x-rays 104 to form a stationary wide-area beam 120 directed at the target 118 (or a different target).
As used throughout this application, "target" should be understood to mean any one or more of a variety of targets. For example, the embodiments of fig. 1A-1B may be used with a scanning pencil beam in an aligned configuration to obtain x-ray backscatter images in a scanning mode when used with an x-ray backscatter detector (such as those shown in exemplary fig. 2E, 10, and 17). Then, in the non-aligned configuration depicted in fig. 1B, for example, when used in conjunction with a pixelated x-ray transmission detector (e.g., the detectors shown in fig. 12 and 16), the apparatus 100 may be used to output a stationary wide-area beam 120 for transmission imaging of the same target or a different target 118. Thus, as applied to embodiments of the invention described herein, a "target" or "target object" should be understood to mean one or more target objects to be imaged in either or any of the aligned and non-aligned configurations.
In some implementations, the x-ray source module 102 is an x-ray tube or another x-ray source. In other embodiments, the x-ray source module may be more complex, including, for example, a switch; a separate housing; an internal x-ray collimator or other beam shaper; electrical input or output of power, signals, etc.; complementary attachment features or other portions of the module engagement interface 112; and the like. One example of a more complex x-ray source module is shown in fig. 15-16 and 18-19.
For example, the pencil beam forming module 106 may include a disk chopper wheel, such as shown in fig. 9 or 15, 18, and 19. For example, the pencil beamforming module 106 may also include a collimator or other x-ray beam shaping component, such as shown in fig. 9 or fig. 15, 18, and 19. Other components such as motors, mounting hardware, etc. may also be included in the module 106. Additionally, portions of the module engagement interface 112 may also be attached to the pencil beam forming module 106, such as the complementary attachment features shown in fig. 2A-2E or a rotational or translational coupling such as shown in fig. 3A-3B. Further, in some embodiments, for example, the pencil beam forming module and the x-ray backscatter detector are coupled together, such as is the case in fig. 2E or 17.
The module engagement interface 112 may include complementary attachment features on the x-ray source module 102 and the pencil beam forming module 106 that are configured to allow the pencil beam forming module and the x-ray source module to be directly or indirectly attached to one another in an aligned configuration and to be separated from one another in a non-aligned configuration. Examples of complementary attachment features include those described below in connection with fig. 2A-2E. In other embodiments, the module engagement interface may include a rotational coupling such as that shown in fig. 3A or a translational coupling such as that shown in fig. 3B. In the case of a rotational or translational coupling, the pencil beamforming module 106 may remain directly or indirectly physically connected to the x-ray source module 102 in both the aligned and non-aligned configurations.
In various embodiments, for example, user selection 114 may be via manual manipulation of device 100 by a user. In the lip and clip module engagement interface shown in fig. 2A, a user selection 114 can be via a user to open a clip attached to a pencil beam forming module from a lip attached to an x-ray source module. In other embodiments, the user selection 114 may be via the user pulling the modules 102 and 106 away from each other to overcome the magnetic force (fig. 2B), unthreading the strap from the post (fig. 2C), loosening the bolt from the bracket (fig. 2D), pulling the modules 102 and 104 away from the snap disk engagement (fig. 2E), rotating the hinge coupling (fig. 3A), or sliding the modules relative to each other along a translational coupling (fig. 3B). In other embodiments, for example, the user selection 114 may be received via an electrical signal, such as a signal to actuate an electromechanical actuator (fig. 3A-3B).
For example, the act of the module engagement interface 112, represented by arrow 115, acting on the x-ray source module 102 and the pencil beam forming module 106 to cause the aligned configuration or the non-aligned configuration may include the lips and clips of fig. 2A acting on or releasing from each other, the magnet and magnetically sensitive material in fig. 2B acting on or releasing from each other, the straps and posts of fig. 2C connecting or releasing from each other, the bolts and brackets of fig. 2D engaging or disengaging from each other, or the snap disks of fig. 2E engaging or disengaging from each other. In other embodiments, where an electromechanical actuator is used, such as in optional features of fig. 3A-3B, the act 115 of the module engagement interface 112 may comprise the electromechanical actuator rotating the pencil beamforming module 106 relative to the x-ray source module 102 about a rotational coupling (fig. 3A) or the electromechanical actuator translating the pencil beamforming module 106 relative to the x-ray source module 102 along a translational coupling (fig. 3B). It should be understood that the examples provided in this specification and the drawings are not limiting, and that many other means of enabling a user to select an aligned or non-aligned configuration and the module engagement interface acting on the modules 102, 106 to cause alignment or non-alignment are within the scope of embodiments.
The dashed line 100 as described above is only used to schematically depict the range of components comprised in the device. However, some embodiments include a housing that encloses all or a portion of the components of the apparatus 100 shown in fig. 1A-1B. In the case of a housing enclosing all components, the dashed lines representing the device 100 may also schematically represent the housing. Any of the modules 102 and 106 and the module engagement interface 112 may be individually or collectively attached to the housing. Additionally, the attachment features that attach the modules 102 and 106 to the housing may also serve as a module engagement interface that holds the modules 102 and 106 in an aligned configuration and allows for selection of a non-aligned configuration by detachment from the housing or by any other means, such as the examples described herein. The module engagement interface 112 may be a combination of the housing and attachment features (e.g., bolts) that attach the module 102, the module 106, or both to the housing.
The housing may be made of an x-ray shielding material, such as lead, tungsten, or another high atomic number material. The housing may include an output port through which x-rays may easily pass. In some embodiments, both the scanned pencil beam and the stationary wide area beam may exit the housing through the same housing output port. However, in other embodiments, two different housing output ports may be provided, a first housing output port for the scanning pencil beam in the aligned configuration and a second housing output port for the stationary wide area beam in the non-aligned configuration. One example is described below with respect to fig. 3B.
As used herein, "pencil beam" should be understood to have the usual meaning in the art of backscatter x-ray imaging where an x-ray pencil beam is actively scanned over a target. Some of the x-rays that are backscattered from the target and not fully transmitted therethrough may be detected at the x-ray backscatter detector as a function of the position of the pencil beam at the intersection with the target.
As also used herein, a "stationary wide-area beam" should be understood to include an x-ray beam that is not scanned in position over time and is used with a pixelated detector for transmission x-ray imaging, as understood by those skilled in the art of x-ray imaging.
Fig. 2A is a schematic block diagram illustrating an embodiment apparatus in which a lip 222 formed on the x-ray source module 102, together with a clip 224 attached to the pencil beam forming module 106, forms the module engagement interface 112 shown in fig. 1A-1B. Similar to the configuration schematically depicted in fig. 1A-1B, the lip 222 and clip 224 are example complementary attachment features that allow the pencil beam forming module 106 and the x-ray module x-ray source module 102 to be attached to each other in an aligned configuration and detached from each other in a non-aligned configuration, respectively. Various alternative complementary attachment features are shown in fig. 2B-2E.
Fig. 2B is a schematic block diagram illustrating an embodiment apparatus in which a magnet 228 mounted to the pencil beam forming module 106 forms a module interface with a magnetically sensitive material 226 mounted to the x-ray source module 102. When sufficiently close, the magnet 228 is securely attached to the magnetically sensitive material 226, thus securing the modules 102 and 106 together in an aligned configuration. The modules 102 and 106 may be manually pulled apart from each other, for example, to be completely separated from each other for a non-aligned configuration.
Fig. 2C is a schematic block diagram illustrating an embodiment apparatus in which a strap 232 is used to secure modules 102 and 106 together in an aligned configuration via connection of the strap 232 to a post 230 mounted to both modules 102 and 106. To separate the modules from each other for the non-aligned configuration, the strap 232 is removed from the post 230 to release the modules 102 and 106 from each other.
Fig. 2D is a schematic block diagram illustrating an embodiment apparatus in which brackets 234 mounted to modules 102 and 106 are fixed to each other via bolts 236. Bolts 236 may be threaded into the opposing brackets 234 to secure the modules to one another for an aligned configuration. The bolt 236 may be unscrewed to release the pencil beam forming module 106 from the source x-ray source module 102 for a non-aligned configuration.
Fig. 2E is a schematic block diagram illustrating an embodiment device in which a complementary snap disk 238 with a lip is attached to the x-ray source module 102 and a grooved and complementary snap disk 240 is attached to the pencil beam forming module 106. In this embodiment, as in other embodiments shown in fig. 2A-2D, the complementary attachment features allow the modules 102 and 106 to be fixedly secured to each other in proper alignment to receive the source x-rays 104 and form the pencil beam 116 in an aligned configuration, as shown in fig. 1A.
As will be readily understood based on the description and the drawings, in addition to the complementary attachment features of fig. 2A-2E, other complementary attachment features may include other features known in the mechanical arts, such as other mechanical straps, latches, snaps, rivets, pins, hook and loop fasteners (e.g., velcro (R)), and other fastener components.
The apparatus of fig. 2E also includes an x-ray backscatter detector 242 that forms part of the pencil-beam forming module 106 and is configured to remain fixedly attached to the pencil-beam forming module 106 in both the aligned and non-aligned configurations. For the non-aligned configuration, the combination 106, 242 is removed as a single unit, allowing the x-ray source module 102 to output the stationary wide-area beam 120 shown in fig. 1B for transmission imaging with the pixelated detector pixelated x-ray transmission detector. Backscatter detector 242 is configured to detect x-rays backscattered from target 118 from scanned pencil beam 116 (shown in fig. 1A), where scanned pencil beam 116 and target 118 are shown in fig. 1A. Other example backscatter detectors that may form part of the embodiments described herein are shown in fig. 4A-4C and 10.
Fig. 3A is a schematic block diagram illustrating an embodiment device, wherein the module engagement interface includes a swivel coupling 344. In this embodiment, the swivel coupling 344 is in particular a hinge coupling. For the aligned configuration, the pencil beam forming module 106 rotates with the rotation 346 about the hinge coupling 344 such that the input port of the pencil beam forming module 106 receives the source x-rays and outputs a scanning pencil beam. For the unaligned configuration, the module 106 rotates with the rotation 346 out of the path of the source x-rays from the module 102, as shown in FIG. 1A. In this way, the modules 102 and 106 remain mechanically coupled to each other in the non-aligned configuration. It should be understood that various knobs, handles, etc. may be provided to facilitate rotation 346 when manually performed by a user.
Also shown in fig. 3A is an optional electromechanical actuator 348 configured to cause rotation 346 about rotational coupling 344. By this means, the pencil beam forming module 106 can rotate with the rotational movement 346 relative to the x-ray source module 102 in response to a user selection of an aligned or misaligned configuration. Where an optional electromechanical actuator 348 is provided, the user selection may be via a wired or wireless signal to the electromechanical actuator 348 in response to a user input. For example, user input may be provided via a touch screen or a remote control device. For example, touch screen operation is shown and described in connection with FIG. 6, while a remotely operable platform is shown and described in connection with FIGS. 3C-3D.
Fig. 3B is a schematic block diagram illustrating an embodiment apparatus that includes a translational coupling 350 between the x-ray source module 102 and the pencil beam forming module 106. In this embodiment, the translational coupling 350 is in particular a sliding bracket, part of which is attached to the respective module 102, 106. The sliding bracket translation coupling 350 provides the ability to translate 352 as part of the selection of the aligned and non-aligned configurations. Optionally, an electromechanical actuator 354, such as a linear lead screw actuator, may be provided to cause the translation 352 in response to a user selection. The user selections may be similar to the user selections described in connection with FIG. 3A providing an electromechanical actuator 348.
Also shown in fig. 3B is a portion of an optional housing 300 that may fully or partially enclose the equipment, including modules 102 and 106, a translational coupling 350, and an actuator 354. Optional housing 300 includes two optional x-ray output ports 353 and 355. Although not shown in fig. 3B, the pencil beamforming module 106 may be attached to the housing 300, while the source x-ray module 102 may be attached to the module 106 via only the translational coupling 350. In this case, arrow 352 represents movement of the module 102 relative to the fixed combination of the module 106 and the housing 300, rather than movement of the module 106 relative to the fixed combination of the module 102 and the housing 300. Thus, the first housing output port 353 outputs a scanned pencil beam when the x-ray source module translates downward to align with the pencil beam forming module 106. On the other hand, the second housing output port 355 outputs a stationary wide-area beam when the x-ray source module translates upward out of alignment with the pencil beam forming module 106. It should be understood that the first and second housing output ports may be used in a similar manner with other types of module engagement interfaces in other embodiments.
Fig. 3C is a schematic diagram illustrating an embodiment device configured to mount to a robotic platform 360, and in particular a robotic arm 358 of robotic platform 360, via robotic platform mounting feature 356. As will be understood by those skilled in the mechanical arts, the mounting features 356 may include complementary attachment features such as bolts, mechanical latches, straps, snaps, rivets, pins, hook and loop fastener components, and the like. The robotic platform 360 may include various translational, rotational degrees of freedom to allow a pencil beam or a stationary wide-area beam device to be properly directed at the target.
Fig. 3D is a schematic diagram illustrating an embodiment apparatus configured to be mounted to an Unmanned Aerial Vehicle (UAV) 364 (also referred to herein as a "drone") via a mounting feature 362. The robot-based and drone-based embodiments of fig. 3C-3D may be particularly advantageous for performing remote inspection of targets for security reasons or because access to target objects to be imaged is limited. In these embodiments, for example, the electromechanical actuators 348 and 354 of fig. 3A-3B may be advantageous to allow a user to selectively select the alignment and non-alignment configurations via wired or wireless remote control.
Fig. 4A-4C are perspective views illustrating the embodiment device of fig. 1A-1B, respectively, further including relatively smaller and relatively larger x-ray backscatter detectors that may be selectively and interchangeably attached to the embodiment device. Fig. 4A shows the x-ray source module 102 and the pencil beam forming module 106 with the module interface 112 depicted as holding the modules 102 and 106 together and aligned. The apparatus includes a relatively smaller backscatter x-ray detector 466.
The detector 466 is depicted as attached to the pencil beamforming module 106. It should be noted that fig. 17 depicts another arrangement in which an x-ray backscatter detector is coupled to a pencil beam forming module. Such an arrangement may be advantageous because the x-ray backscatter detectors may be present or removed with the pencil beam forming module, both of which may preferably be used in an aligned configuration that scans using pencil beams and generates backscatter images of the target. However, in other embodiments, an x-ray backscatter detector or multiple backscatter detectors having different respective sizes may be selectively, or even interchangeably, attached to the x-ray source module 102.
Fig. 4B is a perspective view illustrating an embodiment apparatus coupled to a relatively larger x-ray backscatter detector 468 that may be used to obtain a higher signal-to-noise ratio backscatter image in an aligned configuration. x-ray backscatter detectors 466 and 468 may be selectively and interchangeably attached to a device, such as to pencil beam forming module 106 or x-ray source module 102. This selective attachment may provide a small compact design with a smaller detector 466 that may fit into a more compact workspace and be lighter and more conveniently held in a handheld implementation. Such selective attachment may also have the advantage of providing a relatively larger detector 468 for higher quality backscatter images when there is no problem with confined space. In other embodiments, a relatively smaller detector 466 may remain attached to the device, while a relatively larger detector 468 may be selectively added to the device to supplement the detection sensitivity of the smaller detector 466.
Fig. 4C is a perspective view illustrating an embodiment system 400 including an embodiment x-ray imaging device 100 and a plurality of detectors 466 and 468.
Embodiments presented in the foregoing detailed description include a pencil beam forming module that is removable from, displaced relative to, or otherwise brought into a non-aligned configuration relative to an x-ray source module. More generally, embodiments extend to an x-ray imaging device including a beam forming module that includes an x-ray source and that can selectively obtain an x-ray beam from the same x-ray source in a scanned pencil beam format and a stationary wide area beam format. These embodiments are further described below with reference to example figures 5-6.
Fig. 5 is a schematic diagram illustrating an embodiment x-ray imaging device 500. The apparatus 500 includes a beam forming module 501 configured to output x-rays from an x-ray source 502 forming part of the beam forming module 501. Device 500 receives a user selection 514 that specifies, according to a selectable 570, whether to output a scanned pencil beam 116 from the device in a sweep pattern 117, or a stationary wide-area beam 120 from the device toward a target 118. In some embodiments, selectivity may be provided via a beamforming module 501 that includes a pencil beamforming module (e.g., module 106 described above). A pencil beam forming module may be used in the beam forming module 501 to select an alignment or non-alignment configuration corresponding to the x-ray beam 116 and the stationary wide area output beam 120, respectively. However, in other embodiments, other means may be provided for selection.
Fig. 6 is a schematic diagram showing how a touchscreen 672 forming part of a beam forming module 501 attached to the beam forming module 501 may be touched to select 514 via a human hand 14. The touch screen 672 is an example of an x-ray beam mode selection interface configured to enable a user to select a scanning pencil beam forming (first) mechanical arrangement configured to form a source x-ray into a scanning pencil beam, and alternatively a stationary wide area x-ray beam forming (second) mechanical arrangement configured to form an x-ray source into a stationary wide area x-ray beam.
According to other embodiments, a safety interlock feature is provided such that x-ray radiation from the x-ray source module is automatically turned off when the pencil beam forming module is removed or misaligned relative to the x-ray source module.
Fig. 7A is a schematic block diagram of an x-ray imaging device 700. The apparatus 700 includes an x-ray source module 102 and a pencil beam forming module 106, as previously described. The device 700 also includes a safety interlock 774 configured to cause the x-ray source module to stop outputting source x-rays in continuous operation when the pencil beam forming module 106 is separated from the x-ray source module 102. Thus, when the modules 102 and 106 are attached and aligned with each other, the pencil beam forming module 106 is configured to receive source x-rays from the x-ray source module 102 and output a scanning pencil beam 117.
Fig. 7B is a schematic diagram illustrating the device 700 of fig. 7A in a separated, unaligned state. When the pencil beam forming module 106 is detached from the x-ray source module 102, the safety interlock 774 causes the x-ray source module 102 to stop outputting source x-rays, as shown at 775. Safety interlock 774 may be electrical, mechanical, or electromechanical, according to design principles generally well understood by those implementing safety interlocks in medical and industrial settings. However, prior to the present disclosure, there has not been a need or consideration for a safety interlock that operates in the manner specified herein, i.e., acts to stop the output of x-rays from the x-ray source module upon separation of the pencil beam forming module, as such separation has not previously been contemplated.
Fig. 7C is a schematic block diagram illustrating an x-ray imaging apparatus 701, which is similar to the apparatus 700 illustrated in fig. 7A-7B. However, the device 701 in FIG. 7C has a safety interlock 775 as a circuit. When the modules 102 and 106 are attached to each other, current flows through the continuous loop 776 via the electrical contacts 778 that are present in corresponding locations at mechanically opposing edges of the modules 102 and 106. While current flows through the continuity loop 776, the output scanning x-ray beam is allowed because the source x-rays originate from the x-ray source module 102. However, when the pencil beam forming module 106 is separated, the electrical contacts 778 on the modules 102, 106 are no longer in contact with each other and current does not flow through the continuity loop 776. When the current stops flowing, the safety interlock circuit 775 stops outputting x-rays from the x-ray source module 102. This stopping may be accomplished via a mechanical shutter that is automatically actuated to block source x-rays. Advantageously, however, the safety interlock circuit 775 may allow the power to the x-ray sources in the x-ray source module 102 to be completely shut off, which is a simpler and more preferred implementation.
FIG. 8 is a flow chart illustrating an embodiment process 800 for x-ray imaging. At 880, an x-ray beam in a scanned pencil beam format is selectively formed at the beam forming module using x-rays from the x-ray source forming portion of the beam forming module. At 882, an x-ray beam in a stationary wide-area beam format is selectively formed at a beamform module using x-rays from the x-ray source. For example, process 800 may be performed using any of the embodiment devices or systems described herein, such as those shown in fig. 1A-1B and 5-6.
Process 800 highlights features of various implementation devices, systems, and methods that can obtain both a scanned pencil beam and a stationary wide area beam from the same x-ray source and device. In some embodiments, such as those described in conjunction with fig. 1A-1B, two different types of x-ray beams may be selectively provided via a module engagement interface 112, the module engagement interface 112 acting on the x-ray source module 102 and the pencil beam forming module 106 to provide an aligned configuration or a non-aligned configuration that may be selected by a user. However, in other embodiments, such as those shown in fig. 5-6, selection of beam type may be provided by other means. It should be appreciated that, according to the process 800, both of the different beam types are selected at different respective times.
From the other descriptions of embodiment devices and systems provided herein, it will be understood that various other actions may be included in the embodiment process. For example, where the beamforming module further comprises a pencil beamforming module (e.g., module 106 in fig. 1A), selectively forming an x-ray beam in a scanned pencil beam format at 880 may comprise aligning an input port of the pencil beamforming module with the x-ray source to receive source x-rays at an input port of a scanned pencil beam of the pencil beamforming module. Further, where the beamforming module further comprises a pencil beamforming module, selectively forming the stationary wide-area beam according to 882 may include mechanically displacing an input port of the pencil beamforming module relative to the x-ray source such that the input port of the pencil beamforming module is not aligned to receive the x-ray source at the input port. Additionally, other implementation processes may also include scanning the x-ray beam in a pencil beam format over the first target and irradiating the first target or the second target with the x-ray beam in a stationary wide area beam format.
Fig. 9 (prior art) is a perspective schematic view of a system showing the basic principles of x-ray backscatter imaging. A standard x-ray tube 14 generates source x-rays 4 which are collimated into a fan-beam 16 through a slit in an attenuation plate 19. The fan beam 16 is then "chopped" into a scanning pencil beam 23 by a rotating chopper wheel 18 defining a slit 21. As the chopper wheel 18 rotates with the rotation 24, the scanning pencil beam 23 scans over the target object being imaged. The intensity of x-rays scattered in the backward direction (returning from the scanned target object 11) is then recorded by one or more large area backscatter detectors (not shown in fig. 9) as a function of the position at which the scanned pencil beam 23 was irradiated.
A two-dimensional backscatter image of the target object 11 can be obtained by moving the object across a plane containing the scanned beam on a conveyor 27 or under its own power supply. Alternatively, the target object 11 may be stationary and the imaging system (including the x-ray source 14, the attenuation plate 19, and the chopper wheel 18) may be moved relative to the target object 11. In some cases, transmission detector 25 may be used simultaneously with backscatter imaging via example signal cable 26, monitor 13, or the like to obtain a transmission image based on a scanned pencil beam. In this way, an image of contraband 12 may be obtained based on the use of transmission detector 25 in addition to any x-ray backscatter images obtained with a backscatter detector.
FIG. 10 (Prior Art) is an image showing a prior art handheld x-ray imaging instrument 1083 manufactured by Viken Detection Corporation, operating at 120kV, with a compact built-in backscatter detector 1042. A handle 1084 configured to be held by a human hand facilitates handheld operation. Over the past few years, handheld x-ray backscatter imaging devices have been introduced into the marketplace, enabling operators to quickly inspect suspicious vehicles, packages, or other objects. These devices have been designed to be relatively compact and lightweight, making it easier to operate them for long periods of time. Various embodiments described herein may incorporate features of the backscatter x-ray imaging system shown in fig. 10. Certain aspects of the system shown in FIG. 10 have been described in U.S. patent application Ser. No.15/946,425 (now U.S. Pat. No.10,770,195), filed on 5/4/2018, which is incorporated herein by reference in its entirety.
FIG. 11 (Prior Art) is an image showing the use of the apparatus 1083 of FIG. 10 with a non-pixilated detector panel 1125 to acquire a transmission image of a travel bag 1118 in a pencil beam scanning system. Fig. 11 illustrates how existing x-ray backscatter imager devices may also obtain transmission images of a target object by placing a non-pixilated detector panel 1125 (i.e., single channel) x-ray detector panel behind the object being imaged. The detector panel intercepts the x-ray pencil beam after it has passed through the object, allowing a transmission image to be created simultaneously with the acquisition of the backscatter image.
However, a significant limitation of the method of fig. 11 is that the resolution of the transmission image acquired in this manner is low, since the imaging resolution is defined by the size of the sweeping pencil beam as it passes through the target object being imaged. For example, the width of the sweeping pencil beam may be about 5mm at about 30cm in front of the small handheld backscatter imaging instrument 1083, creating a transmission image that is perceived as out-of-focus or blurred. This is particularly true when the transmission images are compared to images acquired with very high resolution, pixilated flat panel transmission detectors (as shown in fig. 12) typically used on-site by bomb disposal technicians 1290.
Fig. 12 (prior art) is an image and illustration showing the use of a cone-beam x-ray source 1288 in combination with a pixelated detector panel 1286 to create a very high resolution transmission image of the object travel bag 1118. A user 1290 may place an x-ray source 1288 to one side of the object travel bag 1118 to illuminate the object 1118 with the cone beam 1220 while the pixelated transmission detector panel 1286 acquires transmission signals.
Fig. 13 (prior art) is an example image 139 of an explosive device concealed within a fire extinguisher inside a suitcase target 1118. As in the setup of fig. 11, an image 1392 is acquired using a pencil beam from a handheld backscatter imager 1083 in combination with a non-pixilated detector panel 1125.
Fig. 14 (prior art) is an image 1492 of the same explosive device as in fig. 13, hidden within a fire extinguisher inside the same suitcase target 1118. However, the image 1492 in FIG. 14 was acquired with the x-ray cone beam 1220 and the pixelated flat-panel detector shown in FIG. 12. It can be seen that the resolution in image 1492 is much better than the resolution in image 1392.
For bomb disposal or explosive ordnance technicians, high resolution transmission images (e.g., image 1492) are a necessary tool to safely disable explosive devices because the precise location and routing of the leads and the location of the initiator must be accurately known. For example, as shown in fig. 11, this is not possible using a transmission image acquired with a scanned pencil beam from a backscatter imager. However, the image 1492 acquired with the cone beam and the pixelated transmission detector panel provides the resolution required for a safety shutdown device. It would be desirable to be able to acquire both types of images from the same device.
Advantageously, various embodiments disclosed herein relate to a handheld or other portable device that can obtain backscatter images with a scanned pencil beam, with all its advantages, and can also be used to acquire high resolution transmission images with sufficient resolution for bomb disposal or Explosive Ordnance Disposal (EOD) technicians. In one application, the backscatter image may be used to locate the presence of explosive organic material, and the higher resolution transmission image obtained via the cone beam from the same device may be used to assist in disabling the initiating device that may also be present.
Various embodiments may quickly switch between the two imaging modalities. In the first imaging mode, the backscatter imaging mode relies on a sweeping pencil beam of x-rays. In the second imaging mode, the high resolution transmission imaging mode relies on a stationary wide area x-ray beam, such as a cone beam. In some embodiments, the stationary wide area x-ray beam has a substantially circularly symmetric cross-sectional beam intensity distribution. However, in other embodiments, the cross-sectional beam intensity distribution is substantially elliptical or rectangular.
To use certain embodiments in a backscatter imaging modality, a detachable module including a beam forming chopper wheel mechanism is attached to an x-ray source module. For example, as shown in fig. 15, a pencil beam forming disk chopper wheel may form part of a pencil beam forming module. In an embodiment, the pencil beam shaping module collimates the source output cone beam into a fan beam incident on a rotating disk chopper wheel having one or more slits defined therein, which may also be referred to as a "slit aperture". The resulting swept pencil beam emerging from the output side of the pencil beam forming module may be used to illuminate a target object being imaged, and x-rays backscattered from the target object may be detected in one or more x-ray backscatter detectors.
For imaging in the transmission mode, the detachable pencil beam-forming module in various embodiments may be removed or otherwise brought into a non-aligned configuration relative to the x-ray source module, and the uncollimated cone beam emitted from the x-ray source module may be used to illuminate the target object being imaged. A high resolution, pixilated transmission detector panel may be placed behind the subject, allowing transmission images to be acquired.
An enabling feature of various embodiments is a quick detachable pencil beam forming module that allows a user to quickly switch from a backscatter imaging modality to a high resolution transmission imaging modality.
In one embodiment, a dual modality portable imaging system includes a detachable pencil beam forming module, wherein the device can acquire backscatter x-ray images with a sweeping pencil beam of x-rays in one imaging mode and transmission images with a cone beam in a second imaging mode.
In various embodiments, for example, as shown in fig. 17, the backscatter detectors and pencil beam forming module may be mounted together in a removable assembly. For example, as shown in fig. 4A-4C, the pencil beam forming module and backscatter detectors may be separable from each other, allowing backscatter detectors of different sizes to be mounted to the pencil beam forming module.
For example, as described in connection with fig. 3C, some embodiments may be mounted on a robotic platform for remote operation, and the apparatus may include robotic platform mounting features that enable the imaging apparatus to be so mounted. For example, as shown in fig. 3D, some embodiment devices may be mounted on a drone for remote aerial operations and include drone mounting features that enable the device to be so mounted. The imaging modalities of embodiments may be manually switched from one modality to another, such as by manual manipulation of complementary attachment features, hinged coupling, or translational coupling. A modality switch or modality setting may be included on the system or on a system control to allow manual switching from one modality to another. Alternatively, the imaging modality of the system may also be switched from one modality to another using an automated mechanism (e.g., the example actuators shown in fig. 3A-3B).
In one embodiment, the robotic mechanism may cause backscatter imaging to be performed using a sweeping pencil beam, then remove or disable the pencil beam forming module from the device, then apply a stationary cone beam to perform high resolution transmission imaging using a pixelated transmission detector panel. The robotic mechanism may perform transmission by attaching the pencil beam forming module to the device at the appropriate time and then perform backscatter imaging.
Fig. 15 is a perspective image and schematic diagram illustrating an embodiment x-ray imaging device, which includes an x-ray source module 1502 and a detachable pencil beam forming module 1506. The device is being used to image a target object backpack 1518. The detachable pencil beam forming module 1506 is designed to be easily and quickly connected or disconnected from the x-ray radiation output port 1512 of the x-ray source module 1502. In the embodiment of fig. 15, the input port 1508 of the pre-collimator 1594 that forms part of the pencil beam forming module 1506 is designed to slide onto the x-ray radiation output port 1512 of the x-ray source module 1502 and lock into place with a locking mechanism (not shown in fig. 15). As such, the locking mechanism (not shown) and the output port 1512 together form a complementary attachment feature, a module engagement interface, within the scope of the disclosed embodiments.
The pencil beam forming module 1506 includes a rotating chopping wheel 1596 with a slit aperture that creates a scanned pencil beam 116 that scans the output beam plane 1517 as the chopping wheel 1596 rotates. The chopper wheel 1596 is housed in a housing 1598 that includes an output port 1510, the output port 1510 being an output port of the pencil beam shaping module 1506. The input port 1508 of the pre-collimator 1594 serves as an input port for the pencil beam forming module 1506.
In the embodiment of fig. 15, the output beam plane 1517 is a vertical plane, but in other embodiments the output plane is a horizontal plane or has another arbitrary orientation. This enables backscatter images to be acquired as the entire apparatus is moved horizontally along direction 1551 relative to the target object 1518 being scanned. The backscatter detectors are not shown in fig. 15, but may be placed generally in proximity between the target object backpack 1518 and the module 1506 or the module 1502.
Fig. 16 is a perspective image illustration showing the x-ray source module of fig. 15 with the pencil beam forming module 1506 removed therefrom. Thus, a non-aligned configuration is shown in fig. 16, where x-ray source module 1502 outputs a stationary wide-area x-ray beam for high resolution transmission imaging using pixelated transmission detector 1286. A pixelated flat panel x-ray detector 1286 is placed on the far side of the target object 1518 being imaged. When the pencil beam forming module 1506 is not in place (in a non-aligned configuration), the x-ray detector 1286 intercepts a cone beam 1620 of x-ray radiation emitted from the x-ray source module 1502.
As described above, fig. 4A-4C illustrate an embodiment handheld backscatter imager having a detachable backscatter detector, such that backscatter detectors of different sizes can be mounted to the device depending on the application. For example, for use in confined spaces, smaller detectors may be used. On the other hand, for imaging large objects or surfaces at larger distances, larger backscatter detectors are advantageous because they allow images to be acquired at larger stand-off distances, thereby reducing the time to perform an examination. These detectors may be used in combination with various embodiments, including the embodiment of fig. 15.
FIG. 17 is a perspective view of the pencil beam forming module 1506 and the x-ray backscatter detector 1742 of FIG. 15 mounted together in a removable assembly 1700. The pencil beam forming module 1506 and surrounding backscatter detectors 1742 are packaged as a removable assembly 1700 and can be used to acquire backscatter images. This may be accomplished by connecting and thus aligning the input port 1508 to a radiation output port of an x-ray source module (e.g., the x-ray source module shown in fig. 15-16). Cable 1753 provides power to detector 1742 and to a chopper wheel motor (not shown) to drive a chopper wheel that forms part of pencil beam forming module 1506. Cable 1753 may also be used as a path for the signal output from detector 1742.
Various features of the detector 1742 have been described in U.S. patent application No.16/265,992 (now U.S. patent No.10,794,843), filed on 1/2/2019, which is incorporated herein by reference in its entirety. Various other features described in U.S. patent application Ser. No.16/265,992 may be added to the embodiments described herein.
Fig. 18 is an illustration showing the x-ray imaging device of fig. 15 modified to mount to a rotating platform 1855 having a rotation 1857. The apparatus of fig. 18 allows scanning of the pencil beam 116 in a vertical plane 1517. Additionally, for example, rather than translating the imaging device through the object as indicated by arrow 1551 in fig. 15, the entire imaging system may be mounted on a stage 1855 and may be rotated as indicated by arrow 1857, thereby providing a full raster scanning capability of the beam 116 across the target object 1518 being imaged, rather than translation, via rotation 1857.
Fig. 19 is a perspective view of the embodiment device of fig. 18, wherein the module engagement interface includes a swivel coupling (not shown). For example, as described in connection with fig. 3C-3D, the swivel coupling is useful when the embodiment device is mounted on a robotic or drone platform to perform remote inspections. Remote inspection may be advantageous for safety reasons or because access to the target object being imaged is limited. When used with an optional electromechanical actuator, the device can be remotely controlled to output a scanned pencil beam output or a stationary wide area beam. For example, as shown in fig. 3A, rotation 1946 of the pencil beam forming module 1506 relative to the x-ray source module 1502 can be provided by a hinge coupling or other rotationally coupled component and, optionally, an electromechanical actuator. Alternatively, switching from the backscatter imaging mode to the transmission mode (or vice versa) may be performed manually by an operator, or the switching process of the pencil beam forming module being disconnected or connected to the x-ray source module may be automated using a switching mechanism.
FIG. 19 shows the path of the pencil beam forming module rotating away from the x-rays emitted by the source, as indicated by rotational arrow 1946. Such rotation may be achieved, for example, by a servo or motor. However, as will be understood by those skilled in the art in view of this specification, there are many other means within the scope of the embodiments described herein by which the pencil beamforming module can be moved out of the way of the emitted source x-rays to achieve a non-aligned configuration.
In another embodiment, the means of providing fiducial markers in the backscatter and transmission images may allow the information contained in the two images to be obtained to be accurately superimposed.
While example embodiments have been particularly shown and described, it will be understood by those skilled in the art that various changes in form and details may be made therein without departing from the scope of embodiments encompassed by the appended claims.

Claims (24)

1. An x-ray imaging device, comprising:
an X-ray source module configured to output source X-rays;
a pencil beam shaping module having an input port and an output port; and
a module engagement interface configured to enable a user to select an aligned configuration of the x-ray source module and the pencil beam forming module, wherein in the aligned configuration the pencil beam forming module is aligned with the x-ray source module to receive the source x-rays at the input port and output a scanning pencil beam through the output port toward a target,
the module engagement interface is further configured to enable the user to select a non-aligned configuration of the x-ray source module and the pencil beam forming module, wherein in the non-aligned configuration the pencil beam forming module is not aligned with the x-ray source module to receive the source x-rays at the input port and not output the scanning pencil beam, the non-aligned configuration enabling the output source x-rays to form a stationary wide area beam directed at the target.
2. The x-ray imaging device of claim 1, wherein the module engagement interface comprises complementary attachment features on the pencil beam forming module and the x-ray source module configured to allow the pencil beam forming module and the x-ray source module to attach to each other in the aligned configuration and detach from each other in the unaligned configuration.
3. The x-ray imaging device of claim 2, wherein the complementary attachment feature is a mechanical latch, strap, snap, rivet, pin, or hook and loop fastener component.
4. The x-ray imaging device of claim 2, wherein the complementary attachment feature is a magnet, or a magnet and a magnetically sensitive material.
5. The x-ray imaging device of any one of claims 1-4, wherein the module engagement interface comprises a rotational coupling between the pencil beam forming module and the x-ray source module.
6. The x-ray imaging device of any one of claims 1-5, wherein the module engagement interface comprises a translational coupling between the pencil beam forming module and the x-ray source module.
7. The x-ray imaging device of any one of claims 1-6, wherein the module engagement interface is further configured to enable the user to select the aligned configuration or unaligned configuration via manual manipulation of the pencil beamforming module by the user via the module engagement interface.
8. The x-ray imaging device of any one of claims 1 to 6, wherein the module engagement interface comprises an electromechanical actuator configured to move the pencil beamforming module relative to the x-ray source module in response to a user selection of the aligned or unaligned configuration.
9. The x-ray imaging device of any of claims 1-8, further comprising a handle configured to accommodate handheld operation.
10. The x-ray imaging device of any of claims 1 to 9, further comprising a robotic platform mounting feature configured to mechanically couple the x-ray source module to a robotic platform for operation.
11. The x-ray imaging device of any of claims 1 to 10, further comprising a drone mounting feature configured to mechanically couple the x-ray source module to a drone for remote aerial operation.
12. The x-ray imaging device of any one of claims 1 to 11, further comprising a housing that completely or partially encloses the x-ray source module and the pencil beam forming module, the housing comprising a first housing output port configured to output the scanned pencil beam in the aligned configuration, and the housing comprising a second housing output port configured to output the stationary wide area beam in the unaligned configuration.
13. The x-ray imaging device of any one of claims 1-12, further comprising a backscatter detector configured to detect x-rays from the scanned pencil beam backscattered from the target.
14. The x-ray imaging device of claim 13, wherein the backscatter detector forms part of the pencil beamforming module and is configured to remain fixedly attached to the pencil beamforming module in the aligned configuration and the unaligned configuration.
15. An x-ray imaging system comprising the x-ray imaging device of claim 13, further comprising a plurality of backscatter detectors having different respective sizes and selectively and interchangeably attachable to the x-ray source module or the pencil beam forming module.
16. An x-ray imaging system comprising the x-ray imaging device of any one of claims 1 to 15, the system further comprising a pixelated detector configured to receive x-rays from the stationary wide area beam transmitted through the target.
17. An x-ray imaging device, comprising:
a beam forming module configured to selectively output x-rays from an x-ray source formation of the beam forming module in a scanning pencil beam format and in a stationary wide area beam format.
18. An x-ray imaging method, comprising the steps of:
selectively forming, at a beam forming module, an x-ray beam in a scanning pencil beam format using x-rays from an x-ray source formation of the beam forming module; and
selectively forming an x-ray beam in a stationary wide-area beam format using x-rays from the x-ray source at the beamforming module.
19. The x-ray imaging method of claim 18, wherein the beamforming module further comprises a pencil beamforming module, and wherein selectively forming the x-ray beam in the scanning pencil beam format comprises aligning an input port of the pencil beamforming module with the x-ray source to receive the source x-rays at the input port.
20. The x-ray imaging method of claim 18, wherein the beamforming module further comprises a pencil beamforming module, wherein selectively forming the stationary wide-area beam comprises mechanically displacing an input port of the pencil beamforming module relative to the x-ray source such that the input port of the pencil beamforming module is not aligned to receive the source x-rays at the input port.
21. The x-ray imaging method according to any one of claims 18 to 20, further comprising the steps of:
scanning the x-ray beam in the scanned pencil beam format over a first target; and
illuminating the first target or the second target with the x-ray beam in the stationary wide-area beam format.
22. An x-ray imaging device, comprising:
an x-ray source module configured to output source x-rays;
a pencil beam shaping module selectively attachable to and detachable from the x-ray source module, the pencil beam shaping module configured to receive the source x-rays and output a scanning pencil beam when attached to the x-ray source module; and
a safety interlock configured to cause the x-ray source module to stop outputting source x-rays in continuous operation when the pencil beam forming module is detached from the x-ray source module.
23. An x-ray imaging device, comprising:
means for selectively forming, at a beam forming module, an x-ray beam in a scanned pencil beam format using x-rays from an x-ray source formation of the beam forming module; and
means for selectively forming an x-ray beam in a stationary wide-area beam format using x-rays from the x-ray source at the beam forming module.
24. An x-ray imaging device, comprising:
an x-ray source module configured to output source x-rays; and
an x-ray beam mode selection interface configured to enable a user to select a scanning pencil beam forming mechanical arrangement configured to form the source x-rays into a scanning pencil beam, and alternatively a stationary wide area x-ray beam forming mechanical arrangement configured to form the source x-rays into a stationary wide area x-ray beam.
CN202180040204.6A 2020-06-02 2021-06-01 X-ray imaging apparatus and method Pending CN115698774A (en)

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Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US10670740B2 (en) * 2012-02-14 2020-06-02 American Science And Engineering, Inc. Spectral discrimination using wavelength-shifting fiber-coupled scintillation detectors
EP3221722A1 (en) 2014-11-20 2017-09-27 Heuresis Corporation X-ray scanning system
US10770195B2 (en) 2017-04-05 2020-09-08 Viken Detection Corporation X-ray chopper wheel assembly
CN115698774A (en) 2020-06-02 2023-02-03 维肯检测公司 X-ray imaging apparatus and method

Family Cites Families (63)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4031401A (en) 1975-03-14 1977-06-21 American Science & Engineering, Inc. Radiant energy imaging scanning
US4242583A (en) 1978-04-26 1980-12-30 American Science And Engineering, Inc. X-ray imaging variable resolution
US4260898A (en) 1978-09-28 1981-04-07 American Science And Engineering, Inc. X-ray imaging variable resolution
US4315146A (en) 1979-08-17 1982-02-09 The Research Foundation Of State University Of New York Process and apparatus for scatter reduction in radiography
US4472822A (en) 1980-05-19 1984-09-18 American Science And Engineering, Inc. X-Ray computed tomography using flying spot mechanical scanning mechanism
US4342914A (en) 1980-09-29 1982-08-03 American Science And Engineering, Inc. Flying spot scanner having arbitrarily shaped field size
US4503332A (en) 1981-09-21 1985-03-05 American Science And Engineering, Inc. Grazing angle detector array
US4646339A (en) 1985-06-11 1987-02-24 John K. Grady Rotating X-ray mask with sector slits
US4799247A (en) 1986-06-20 1989-01-17 American Science And Engineering, Inc. X-ray imaging particularly adapted for low Z materials
US4809312A (en) 1986-07-22 1989-02-28 American Science And Engineering, Inc. Method and apparatus for producing tomographic images
US5179581A (en) 1989-09-13 1993-01-12 American Science And Engineering, Inc. Automatic threat detection based on illumination by penetrating radiant energy
US5022062A (en) 1989-09-13 1991-06-04 American Science And Engineering, Inc. Automatic threat detection based on illumination by penetrating radiant energy using histogram processing
FR2653233B1 (en) 1989-10-17 1994-07-29 Commissariat Energie Atomique LINEAR RADIATION DETECTION DEVICE.
US5181234B1 (en) 1990-08-06 2000-01-04 Rapiscan Security Products Inc X-ray backscatter detection system
US5224144A (en) 1991-09-12 1993-06-29 American Science And Engineering, Inc. Reduced mass flying spot scanner having arcuate scanning lines
US5391878A (en) 1993-11-03 1995-02-21 Rockwell International Corporation Multiplexed fiber readout of scintillator arrays
US5666393A (en) 1994-02-17 1997-09-09 Annis; Martin Method and apparatus for reducing afterglow noise in an X-ray inspection system
DE19532965C2 (en) 1995-09-07 1998-07-16 Heimann Systems Gmbh & Co X-ray inspection system for large-volume goods
US5783829A (en) 1995-11-06 1998-07-21 The University Of Virginia Energy and position sensitive radiation detectors
US5764683B1 (en) 1996-02-12 2000-11-21 American Science & Eng Inc Mobile x-ray inspection system for large objects
US6078052A (en) 1997-08-29 2000-06-20 Picker International, Inc. Scintillation detector with wavelength-shifting optical fibers
US6461040B1 (en) 1998-11-12 2002-10-08 Koninklijke Philips Electronics N.V. Apparatus and method to correct for position errors in diagnostic imaging
ATE290223T1 (en) 1998-11-30 2005-03-15 American Science & Eng Inc X-RAY EXAMINATION SYSTEM WITH CONE AND PENCIL BEAMS FROM A COMMON SOURCE
US6453007B2 (en) 1998-11-30 2002-09-17 American Science And Engineering, Inc. X-ray inspection using co-planar pencil and fan beams
CA2366536A1 (en) 1999-04-14 2000-10-19 Jack Edward Juni Single photon emission computed tomography system
US6272206B1 (en) * 1999-11-03 2001-08-07 Perkinelmer Detection Systems, Inc. Rotatable cylinder dual beam modulator
US6434219B1 (en) 2000-07-24 2002-08-13 American Science And Engineering, Inc. Chopper wheel with two axes of rotation
US7103137B2 (en) 2002-07-24 2006-09-05 Varian Medical Systems Technology, Inc. Radiation scanning of objects for contraband
US20090257555A1 (en) 2002-11-06 2009-10-15 American Science And Engineering, Inc. X-Ray Inspection Trailer
US7099434B2 (en) 2002-11-06 2006-08-29 American Science And Engineering, Inc. X-ray backscatter mobile inspection van
US7115875B1 (en) 2004-02-17 2006-10-03 Photodetection Systems, Inc. PET scanner with photodetectors and wavelength shifting fibers
US7175347B2 (en) 2004-07-30 2007-02-13 Neurologica, Corp. Anatomical imaging system with centipede belt drive
US7310407B2 (en) 2004-09-03 2007-12-18 Juni Jack E Nuclear medical imaging device
US7200201B2 (en) * 2004-11-16 2007-04-03 General Electric Company Flat panel detector based slot scanning configuration
PL2049888T3 (en) 2006-08-11 2014-08-29 American Science & Eng Inc X-ray inspection with contemporaneous and proximal transmission and backscatter imaging
US7742568B2 (en) 2007-06-09 2010-06-22 Spectrum San Diego, Inc. Automobile scanning system
US7593510B2 (en) 2007-10-23 2009-09-22 American Science And Engineering, Inc. X-ray imaging with continuously variable zoom and lateral relative displacement of the source
ATE535191T1 (en) 2008-05-01 2011-12-15 Koninkl Philips Electronics Nv SOURCE AND/OR DETECTOR POSITIONING SYSTEM
CN201340400Y (en) 2009-01-20 2009-11-04 江苏天瑞仪器股份有限公司 Hand-held X-ray fluorescence spectrometer with integrated heat sink
GB2488698B (en) 2009-10-29 2014-03-05 Rapiscan Systems Inc Mobile aircraft inspection system
US8571181B2 (en) 2009-11-02 2013-10-29 Xrsciences Llc Rapidly switching dual energy X-ray source
WO2012058207A2 (en) 2010-10-27 2012-05-03 American Science And Engineering, Inc. Versatile x-ray beam scanner
US8903045B2 (en) 2011-04-15 2014-12-02 American Science And Engineering, Inc. Backscatter system with variable size of detector array
EP2748628A4 (en) 2011-06-14 2015-07-08 Rapiscan Systems Inc Covert surveillance using multi-modality sensing
US8975868B2 (en) 2011-11-30 2015-03-10 General Electric Company Charging station for portable X-ray detectors
PE20150233Z (en) * 2012-01-27 2015-02-12 American Science & Eng Inc MANUAL X-RAY BACKSPATTER IMAGING DEVICE
WO2013116058A1 (en) 2012-02-02 2013-08-08 American Science And Engineering, Inc. Convertible scan panel for x-ray inspection
EP2825904B1 (en) 2012-02-14 2018-07-04 American Science and Engineering, Inc. X-ray inspection using wavelength-shifting fiber-coupled scintillation detectors
US20130315368A1 (en) 2012-05-22 2013-11-28 Aribex, Inc. Handheld X-Ray System for 3D Scatter Imaging
US20160341847A1 (en) 2012-07-16 2016-11-24 Rapiscan Systems, Inc. Ultra-Portable People Screening System
USD724716S1 (en) 2012-08-29 2015-03-17 Ningbo Chenwu Humidifying Equipment Factory Evaporative air cooler
US9689997B2 (en) 2014-09-04 2017-06-27 General Electric Company Systems and methods for modular imaging detectors
FR3028039B1 (en) 2014-11-05 2016-12-30 Univ Joseph Fourier RADIOGRAPHIC IMAGING SYSTEM AND METHOD FOR POSITIONING SUCH A SYSTEM
EP3221722A1 (en) 2014-11-20 2017-09-27 Heuresis Corporation X-ray scanning system
US9989483B2 (en) 2015-08-17 2018-06-05 The Boeing Company Systems and methods for performing backscatter three dimensional imaging from one side of a structure
CN110381834B (en) * 2017-02-28 2023-04-18 富士胶片株式会社 Radiation irradiation device
US10770195B2 (en) 2017-04-05 2020-09-08 Viken Detection Corporation X-ray chopper wheel assembly
US10762999B2 (en) 2017-10-06 2020-09-01 Best Theratronics Ltd Irradiator apparatus and system and method for irradiating a sample using x-rays
CN107966460A (en) 2017-12-26 2018-04-27 清华大学 Radiation checking system and radiation testing method
AU2019215207A1 (en) * 2018-02-02 2020-08-20 Viken Detection Corporation System and kit for x-ray backscatter imaging with removable detector
WO2019217596A1 (en) 2018-05-08 2019-11-14 Viken Detection Corporation Radiation scanning system with variable field of view
CN108318512A (en) * 2018-05-10 2018-07-24 同方威视技术股份有限公司 Transmission-back scattering combine detection equipment and detection method for human body
CN115698774A (en) 2020-06-02 2023-02-03 维肯检测公司 X-ray imaging apparatus and method

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