CN115685967A - Response time testing device of instrument control system - Google Patents
Response time testing device of instrument control system Download PDFInfo
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- CN115685967A CN115685967A CN202211350545.6A CN202211350545A CN115685967A CN 115685967 A CN115685967 A CN 115685967A CN 202211350545 A CN202211350545 A CN 202211350545A CN 115685967 A CN115685967 A CN 115685967A
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- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E30/00—Energy generation of nuclear origin
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02P—CLIMATE CHANGE MITIGATION TECHNOLOGIES IN THE PRODUCTION OR PROCESSING OF GOODS
- Y02P90/00—Enabling technologies with a potential contribution to greenhouse gas [GHG] emissions mitigation
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Abstract
The present disclosure provides a response time testing device of an instrumentation and control system, comprising: the device comprises a controller, a signal generator, a serial port communication module and an output signal interface; the controller is respectively connected with the signal generator and the serial port communication module; the signal generator is also connected with the output signal interface; the serial port communication module is connected with a communication node of the instrument control system; triggering a time set point to start when an output signal is sent to an instrument control system, wherein the time set point is used as a first time point; the serial port communication module monitors communication signals responded by the tested instrument control system, and a timestamp is marked for each frame and/or packet of the received communication signals to serve as a second time point; the controller determines a response time of a communication node of the instrumentation control system to the output signal based on the first time point and the second time point. The response time testing device of the instrument control system realizes direct testing of the signal change response time of the communication transmission process in the working condition. The response time of the instrument control system is effectively and comprehensively tested.
Description
Technical Field
The present disclosure relates to the field of electronic testing technologies, and in particular, to a response time testing apparatus for an instrument control system.
Background
The instrument control system is a key device of the nuclear power station, monitors various working conditions in the operation process of the nuclear power station, and processes the working conditions according to designed logic. The logic of control, the precision of control and the real-time performance of control are key factors for judging the level of a nuclear power instrument control system. The instrument control system response time directly quantifies the real-time performance of control.
With the introduction of computer technology, nuclear power plant instrumentation and control systems have entered a full-scale digital era. The digital instrument control system of the nuclear power station can process thousands of signals simultaneously, and the signal processing capability is greatly enhanced. The traditional method for testing the response time of the digital instrument control system of the nuclear power station by using independent testing instruments such as an oscilloscope and a wave recorder is no longer practical. Therefore, a test device for response time is necessary. At present, a response time testing device can only test the response time from the channel input change to the channel output change of an instrument control system, namely the whole response time of a single working condition is tested, but the signal change response time of a communication transmission process in the working condition cannot be directly tested.
Disclosure of Invention
The technical problem to be solved by the present disclosure is to provide a device for testing the response time of the instrument control system under the full working condition, in order to overcome the defect that the prior art can only test the whole response time of a single working condition, but cannot directly test the signal change response time of the communication transmission process under the working condition.
The technical problem is solved by the following technical scheme:
the present disclosure provides a response time testing device of an instrumentation and control system, wherein the instrumentation and control system comprises a communication node;
the response time testing device comprises: the device comprises a controller, a signal generator, a serial port communication module and an output signal interface;
the controller is respectively connected with the signal generator and the serial port communication module;
the signal generator is also connected with the output signal interface;
the serial port communication module is connected with the communication node of the instrument control system;
the controller is used for controlling the signal generator to generate an output signal;
the signal generator is used for transmitting the output signal to the instrument control system through the output signal interface;
triggering a time set point to start when the output signal is sent to the instrument control system, wherein the time set point is used as a first time point;
the serial port communication module is used for monitoring communication signals responded by the tested instrument control system, and stamping a timestamp for each frame and/or packet of the received communication signals, wherein the timestamp is used as a second time point;
the controller is further configured to determine a response time of the communication node of the instrumentation system to the output signal based on the first point in time and the second point in time.
Preferably, the response time testing apparatus further includes: a signal receiver, an input signal interface;
the signal receiver is respectively connected with the controller and the input signal interface;
the input signal interface is used for receiving a feedback signal of the instrument control system;
the signal receiver is used for receiving the feedback signal of the input signal interface and recording a time point for receiving the feedback signal as a third time point;
the controller is further configured to determine a response time of the instrumentation system to the output signal based on the first time point and the third time point.
Preferably, the signal generator comprises an analog signal generator and a digital signal generator;
the controller is connected with the analog signal generator, and the analog signal generator is also connected with the output signal interface;
the analog signal generator is used for sending an analog output signal to the instrument control system;
the controller is connected with the digital signal generator, and the digital signal generator is also connected with the output signal interface;
the digital signal generator is used for sending a digital quantity output signal to the instrument control system.
Preferably, the output signal comprises a switching value output signal;
the signal generator comprises a relay card;
the controller is connected with the relay card, and the relay card is also connected with the output signal interface;
the relay card is used for sending switching value output signals to the instrument control system, and the switching value output signals comprise on signals and off signals.
Preferably, the controller is further configured to control the signal generator to send the output signal to the output signal interface at a preset generation time point.
Preferably, the response time testing device controller includes an application program, the application program stores testing task parameters in advance, and the testing task parameters include: the generation time point of the output signal, the type of the test task and the number of the test tasks;
the application program is used for sending the test task parameters to the controller, so that the controller controls the signal generator to generate the output signals according to the test task parameters.
Preferably, the response time testing device further comprises a signal conditioning module and a connector;
the controller is connected with the signal conditioning module, and the signal conditioning module is connected with the connector;
the connector is used for connecting an external industrial grade plug-in unit so as to expand the function of the response time testing device;
the signal conditioning module is used for mutually converting the voltage of the external industrial grade plug-in and the electric signal of the response time testing device.
Preferably, the instrumentation and control system further comprises a power distribution unit and a UPS power supply;
the power distribution unit is used for distributing external commercial power to the response time testing device;
the UPS power supply is used for providing uninterrupted power supply for the response time testing device.
Preferably, the instrument control system further comprises an external input terminal and/or a display terminal;
the external input terminal is used for inputting the test task parameters;
the display terminal is used for displaying the test process and/or the test result of the response time test device.
The positive progress effect of this disclosure lies in: the response time testing method of the instrument control system realizes direct testing of the signal change response time of the communication transmission process in the working condition. The response time of the instrument control system is effectively and comprehensively tested.
It should be understood that various forms of the flows shown above, reordering, adding or deleting steps, may be used. For example, the steps described in the present disclosure may be performed in parallel or sequentially or in a different order, and are not limited herein as long as the desired results of the disclosed technical solution can be achieved.
Drawings
The drawings are included to provide a better understanding of the present solution and are not to be construed as limiting the present disclosure. Wherein:
FIG. 1 is a schematic diagram of a response time testing apparatus of a instrumentation and control system according to an exemplary embodiment of the present disclosure;
fig. 2 is a PXI system diagram of a response time testing apparatus of an instrumentation and control system according to an exemplary embodiment of the present disclosure;
fig. 3 is a schematic diagram illustrating an FPGA board connection of a response time testing apparatus of an instrumentation and control system according to an exemplary embodiment of the present disclosure;
fig. 4 is a schematic diagram of a relay card connection of a response time testing apparatus of an instrument control system according to an exemplary embodiment of the present disclosure;
fig. 5 is a schematic diagram of a signal conditioning module and a connector of a response time testing apparatus of an instrumentation and control system according to an exemplary embodiment of the present disclosure.
Detailed Description
Exemplary embodiments of the present disclosure are described below with reference to the accompanying drawings, in which various details of the embodiments of the disclosure are included to assist understanding, and which are to be considered as merely exemplary. Accordingly, those of ordinary skill in the art will recognize that various changes and modifications of the embodiments described herein can be made without departing from the scope and spirit of the present disclosure. Also, descriptions of well-known functions and constructions are omitted in the following description for clarity and conciseness.
In one embodiment, the response time testing apparatus 11 shown in FIG. 1 comprises: a controller 112, a signal generator 111, a signal receiver 113, a serial communication module 114, an output signal interface 115, and an input signal interface 116. The instrumentation and control system 12 includes: input port 124, output port 125, communication node a, communication node B, communication node C.
The controller 112 is connected to the signal generator 111 and the signal receiver 113, respectively.
The signal generator 111 is also connected to an output signal interface 115.
The serial port communication module 114 is connected to the controller 112 and the communication node a, the communication node B, and the communication node C, respectively.
The output signal interface 115 is connected to the input port 124, and the input signal interface 116 is connected to the output port 125.
The input port 124 and the output port 125 are connected to the communication node a, the communication node B, and the communication node C, respectively.
The controller 112 is used for controlling the signal generator 111 to generate an output signal.
The signal generator 111 is configured to send an output signal to the input port 124 through the output signal interface 115.
The input port 124 is configured to distribute the received output signal to an instrumentation system operator, wherein the communications node is configured to communicate signals generated within the instrumentation system.
The first time point is a trigger time set point when the output signal is sent to the instrument control system;
the serial port communication module is used for monitoring communication signals responded by the tested instrument control system, and stamping a time stamp for each received frame and/or packet of the communication signals, wherein the time stamp is used as a second time point.
Wherein transmitting communication signals includes transmitting to other communication nodes and to devices controlled by instrumentation control system 12.
The signal receiver is respectively connected with the controller and the input signal interface;
the input signal interface is used for receiving a feedback signal of the instrument control system; the signal receiver is used for receiving a feedback signal input into the signal interface and recording a time point for receiving the feedback signal as a third time point;
the controller is further configured to determine a response time of a communication node of the instrumentation control system to the output signal based on the first point in time and the second point in time.
The controller is further configured to determine a response time of the instrumentation control system to the output signal based on the first point in time and the third point in time.
The present embodiment controls signal generation by the controller 112The device 111 generates an output signal, and sends the output signal to the output signal interface 115, where the time point of sending the output signal is a first time point, and the first time point is sent to the signal receiver 113 and the serial communication module 114, and starts timing. The output signal interface 115 transmits the output signal content to the instrument control system. After the signal enters from the input port of the instrument control system, logic operation is carried out in the instrument control system, and a plurality of communication nodes are generated in different processes and different signal points. And the instrument control system communication node is interacted with the serial port communication module. During the communication signal interaction process, the serial communication module 114 receives the same communication signal and records a second time point. Then, the serial port communication module 114 transmits the second time point to the controller 112. The controller 112 calculates the response time of the communication node to the output signal according to the difference between the first time point and the second time point. In particular embodiments, there may be a plurality of output signals and communication nodes. For example, the time point when the serial port communication module receives the signal sent by the communication node A is T i The controller gives the signal generator an output signal command at a time point T o Then the response time of the communication node A to the output signal is | T i -T o |。
According to the embodiment, the time point of the communication process in the instrument control system is obtained, so that the direct test of the communication process response time of the communication node of the instrument control system is realized.
In one embodiment, the controller 112 controls the signal generator 111 to generate an output signal, and sends the output signal to the output signal interface 115, where the time point of sending the output signal is a first time point, and the first time point is sent to the signal generator 111, the signal receiver 113, and the serial communication module 114, and starts timing. The input signal interface 116 receives a feedback signal from the instrument control system, the feedback signal is sent to the signal receiver 113, and the signal receiver 113 records a time point as a third time point after receiving the feedback signal. For example, the signal generator sends out the output signal at a time point T s The time point when the signal receiver receives the feedback signal is T e Then the response time of the entire instrument control system to the output signal is | T e -T s |。
According to the embodiment, the time point of the communication process in the instrument control system is obtained, so that the direct test of the communication process response time of the communication node of the instrument control system is realized.
In one embodiment, the functions of the controller 112, the signal generator 111, and the signal receiver 113 may be implemented by the PXI system 21. The PXI system 21 shown in fig. 2 includes a PXI host 211, an AO module 214, a DO module 212, an AI module 215, a DI module 213, and a RTD module 216. Among them, the AO module 214 and the DO module 212 may implement the function of the signal generator 111, the AI module 215 and the DI module 213 may implement the function of the signal receiver 113, and the PXI host 211 may implement the function of the controller 112. Among them, the components in the PXI system 21 may exchange data through a PXI bus (PCI eXtensions for Instrumentation) 217.
Wherein, the AO module 214 is used for outputting an analog output signal, and comprises: voltage, current, pressure, speed, flow semaphore; the AI module 215 is used for receiving an analog quantity signal output signal of the output port of the instrument control system; the DO module 212 is used to output digital output signals including switching values and binary data; the DI module 213 is configured to receive the digital output signal from the output port of the instrument control system.
In this embodiment, the response time testing apparatus sends an output signal to the instrument control system to be tested, the output signal is set by the upper computer according to a test purpose, and the setting options include: current output type, voltage output type, range, channel, resolution.
The application program of the controller 112 may store test task parameters in advance, where the test task parameters include: the generation time point of the output signal, the type of the test task and the number of the test tasks. The application program controls the signal generator 111 to generate an output signal according to the test task parameter through the controller 112.
The output signal interface sends the output signal to the input port of the instrument control system after processing, and the input port provides the signal for the instrument control system to be used for operation.
In the embodiment, different types of signals are simulated through the PXI system, and the direct test of the response time of the instrument control system to the communication process of different signals is realized.
In one embodiment, there are communication links between the outgoing signal interface 115 and the communication nodes a, B, C as shown in fig. 1. The communication link is used for communication, and the communication comprises: the communication node A, the communication node B and the communication node C perform mutual transmission of output signals, and the communication node A, the communication node B and the communication node C transmit the output signals to other nuclear power equipment. When the communication node a, the communication node B, and the communication node C send the communication signal, the communication signal is sent to the serial communication module 114 at the same time, and after the serial communication module 114 acquires the communication signal, the time point of the communication signal is recorded, and then the time point is sent to the PXI system for further processing.
The controller 112 is further configured to control the signal generator to send an output signal to the output signal interface 115 at a preset occurrence time point, and the controller 112 sends the occurrence time point of the output signal to the serial port communication module 114 and starts timing. The serial port communication module 114 may determine a unique time point of the communication signal for each acquired communication signal according to the occurrence time point of the communication signal sent by the communication node.
For example, an output signal needs to pass through the output signal interface 115 and the communication node a in sequence, and after becoming a communication signal, the serial communication module 114 will record the following time points:
the controller 112 controls the time point at which the signal generator 111 generates the output signal, recorded as T 0 ；
The point in time at which a communication signal is sent from communication node a to communication node B is recorded as T 1 ；
The point in time at which a communication signal is sent from communication node B to communication node C is recorded as T 2 ；
The point in time at which a communication signal originates from communication node C is recorded as T 3 ；
As can be seen, the response times of the communication node a, the communication node B, and the communication node C are: i T 1 -T 0 |、|T 2 -T 0 |、|T 3 -T 0 |。
In the present embodiment, as shown in fig. 3, the FPGA card 32 is connected to the PXI host 33. The FPGA board 32 is configured to collect output signals from the instrument control system, and send time points to the PXI host 33 for calculating response time.
In one embodiment, as shown in fig. 4, the PXI host 41 is connected to the relay card 42, and the relay card 42 is connected to the output signal interface 43. The PXI host 41 controls the relay card to send switching value input signals including on and off signals to the instrument control system. The test of the response time of the input signal of the switching value is realized.
In one embodiment, the response time testing apparatus as shown in fig. 5 further includes a signal conditioning module 51 and a connector 52, the pxi system is connected to the signal conditioning module 51, and the signal conditioning module 51 is connected to the connector 52. In one embodiment, the connector 52 is an industrial grade card, at least one in number. The signal conditioning module 51 will be used to convert the external voltage into an electrical signal that the response time testing device can process. The signal conditioning module is also used for conditioning external signals to electric signals collected in the PXI case and distributing various types of signals to corresponding connectors. In particular, the connector may be multiple. The connector is used for connecting an external industrial grade plug-in unit so as to expand the function of the response time testing device.
In the response time testing device, the operating Power Supply may be an Uninterruptible Power Supply (UPS) to provide Uninterrupted Power Supply to the case of the testing device, so as to prevent loss of data under test and possible damage to the testing device itself or the instrumentation system to be tested when the external mains Power is lost. The working power supply can also be a power distribution unit which distributes external mains supply to the main cabinet and the individual instruments, comprising: the system comprises a controller, a signal generator, a signal receiver, a serial port communication module and a PXI host.
In the response time testing device, the external input terminal can be a keyboard, a mouse, a touch panel, a wired and/or wireless input interface; the display terminal can be a display, an oscilloscope or an instrument panel. The external input terminal is used for inputting test task parameters and/or setting the PXI system, and the display terminal is used for displaying the test process and/or the test result of the response time test device.
It should be understood that various forms of the flows shown above may be used, with steps reordered, added, or deleted. For example, the steps described in the present disclosure may be executed in parallel, sequentially, or in different orders, as long as the desired results of the technical solutions disclosed in the present disclosure can be achieved, which is not limited herein.
The above detailed description should not be construed as limiting the scope of the disclosure. It should be understood by those skilled in the art that various modifications, combinations, sub-combinations and substitutions may be made, depending on design requirements and other factors. Any modification, equivalent replacement, and improvement made within the spirit and principle of the present disclosure should be included in the scope of protection of the present disclosure.
Claims (9)
1. The response time testing device of the instrument control system is characterized in that the instrument control system comprises a communication node;
the response time testing device comprises: the device comprises a controller, a signal generator, a serial port communication module and an output signal interface;
the controller is respectively connected with the signal generator and the serial port communication module;
the signal generator is also connected with the output signal interface;
the serial port communication module is connected with the communication node of the instrument control system;
the controller is used for controlling the signal generator to generate an output signal;
the signal generator is used for transmitting the output signal to the instrument control system through the output signal interface;
triggering a time set point to start when the output signal is sent to the instrument control system, wherein the time set point is used as a first time point;
the serial port communication module is used for monitoring communication signals responded by the tested instrument and control system, and stamping a timestamp for each frame and/or packet of the received communication signals, wherein the timestamp is used as a second time point;
the controller is further configured to determine a response time of the communication node of the instrumentation system to the output signal based on the first point in time and the second point in time.
2. The instrumentation system response time testing apparatus of claim 1, further comprising: a signal receiver, an input signal interface;
the signal receiver is respectively connected with the controller and the input signal interface;
the input signal interface is used for receiving a feedback signal of the instrument control system;
the signal receiver is used for receiving the feedback signal of the input signal interface and recording a time point for receiving the feedback signal as a third time point;
the controller is further configured to determine a response time of the instrumentation system to the output signal based on the first time point and the third time point.
3. The instrument control system response time test apparatus of claim 1, wherein said signal generator comprises an analog signal generator and a digital signal generator;
the controller is connected with the analog signal generator, and the analog signal generator is also connected with the output signal interface;
the analog signal generator is used for sending an analog output signal to the instrument control system;
the controller is connected with the digital signal generator, and the digital signal generator is also connected with the output signal interface;
the digital signal generator is used for sending a digital quantity output signal to the instrument control system.
4. The instrumentation system response time test device of claim 1, wherein said output signal comprises a switching output signal;
the signal generator comprises a relay card;
the controller is connected with the relay card, and the relay card is also connected with the output signal interface;
the relay card is used for sending switching value output signals to the instrument control system, and the switching value output signals comprise on signals and off signals.
5. The instrument control system response time testing arrangement of claim 1, wherein said controller is further configured to control a signal generator to send said output signal to said output signal interface at a predetermined point in time of occurrence.
6. The instrument control system response time testing device of any one of claims 1 to 5, wherein said response time testing device controller comprises an application program, said application program having pre-stored therein test task parameters, said test task parameters comprising: the generation time point of the output signal, the type of the test task and the number of the test tasks;
the application program is used for sending the test task parameters to the controller, so that the controller controls the signal generator to generate the output signals according to the test task parameters.
7. The instrumentation system response time test device of any one of claims 1 to 5, further comprising a signal conditioning module and a connector;
the controller is connected with the signal conditioning module, and the signal conditioning module is connected with the connector;
the connector is used for connecting an external industrial grade plug-in unit so as to expand the function of the response time testing device;
the signal conditioning module is used for mutually converting the voltage of the external industrial grade plug-in unit and the electric signal of the response time testing device.
8. The instrumentation system response time testing device of any one of claims 1 to 5, further comprising a power distribution unit and a UPS power supply;
the power distribution unit is used for distributing external commercial power to the response time testing device;
the UPS power supply is used for providing uninterrupted power supply for the response time testing device.
9. The instrumentation system response time testing device of claim 6, further comprising an external input terminal and/or a display terminal;
the external input terminal is used for inputting the test task parameters;
the display terminal is used for displaying the test process and/or the test result of the response time test device.
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