CN115639418A - Isolator withstand voltage life evaluation method and device and electronic equipment - Google Patents
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Abstract
The invention relates to the technical field of isolators, in particular to a method and a device for evaluating the voltage endurance life of an isolator and electronic equipment. The method for evaluating the withstand voltage life of the isolator comprises the following steps: after the voltage stress value of the isolator to be tested during working is obtained, the working life of the isolator to be tested can be obtained according to the obtained voltage stress value during working and the corresponding relation between the voltage stress and the service life which are obtained in advance. The method can quickly acquire the voltage endurance life of the isolator to be tested, shorten the measurement period and save the time cost of the test.
Description
Technical Field
The invention relates to the technical field of isolators, in particular to a method and a device for evaluating the voltage endurance life of an isolator and electronic equipment.
Background
The isolator is a device for completing digital signal or analog signal transmission under an electrical isolation state, and is widely applied to important fields of aviation, aerospace, military industry and the like. Common isolators include magnetic coupling isolators and capacitive isolators, among others. The magnetic coupling isolator isolates transmission data through electromagnetic coupling between primary and secondary coils of the on-chip transformer, and has the characteristics of high transmission rate, low power consumption, excellent CMTI (Common-Mode Transient Immunity) performance and the like; the capacitive isolator isolates and transmits data through the change of an electric field inside an on-chip capacitor, has the advantages of high transmission rate, strong anti-electromagnetic interference capability, high reliability and the like, and both are the main development directions of the isolator. The evaluation of the voltage endurance life of the isolator can provide data support for the reliability, maintainability and supportability of the isolator in the use of an electronic system, is beneficial to the optimization, expansion and extension of isolation samples, and provides important reference value for the evaluation of the voltage endurance life and reliability of the isolator.
In the past research, long time is needed to track the service life data of the isolator in the using process under normal stress, and a large amount of manpower, material resources and time are consumed. With the rapid development of microelectronic technology, samples are updated frequently, new substitute samples are often put into use, and the service life data of old samples are collected, so that the determination of the service life distribution and change rules is difficult, the service life of the samples is determined and prolonged, and the use risk is increased.
Disclosure of Invention
The invention provides a method and a device for evaluating the withstand voltage life of an isolator, which are used for solving the technical problem of long time period spent on acquiring the withstand voltage life of the isolator in the prior art.
In one aspect, the present invention provides a method for evaluating a withstand voltage life of an isolator, including:
acquiring a voltage stress value of the isolator to be tested during working;
and acquiring the working life of the isolator to be tested according to the voltage stress value during working and the corresponding relation between the voltage stress and the working life acquired in advance.
According to the method for evaluating the withstand voltage life of the isolator, provided by the invention, the corresponding relation between the voltage stress and the working life is obtained by the following method:
selecting a plurality of isolators as samples, testing the samples under different voltages respectively, and obtaining a service life value of each sample when the sample fails;
and determining the coefficient value of a preset acceleration model of the isolator according to the voltage stress and the corresponding service life values when the plurality of samples fail, so as to obtain the corresponding relation between the voltage stress and the service life.
According to the method for evaluating the pressure-resistant life of the isolator provided by the invention, the preset acceleration model of the isolator is as follows:
lnξ＝a+b*ln(v) (1)
in the above formula (1), ξ represents the lifetime value of the separator, v represents the voltage stress exerted on the separator, a and b are coefficients of the acceleration model, and a and b are constants.
According to the method for evaluating the withstand voltage life of the isolator, provided by the invention, the judgment basis when the sample fails is as follows:
and when the leakage current I of the sample is more than or equal to 1mA, determining that the sample fails.
According to the method for evaluating the withstand voltage life of the isolator, provided by the invention, the samples are respectively tested under different voltages, and the life value of each sample when the sample fails is respectively obtained; determining the coefficient value of a preset acceleration model of the isolator according to the voltage stress and the corresponding service life values when the plurality of samples fail, so as to obtain the corresponding relation between the voltage stress and the service life, wherein the method comprises the following steps:
equally dividing the plurality of samples into eight groups, wherein four groups are used for direct current voltage testing, and the other four groups are used for alternating current voltage testing;
respectively obtaining direct-current voltage stress and life values corresponding to each failed sample for direct-current voltage testing, and determining the coefficient value of a preset acceleration model of the isolator according to multiple groups of direct-current voltage stress and life values by adopting a least square method so as to obtain the corresponding relation between the direct-current voltage stress and the life;
and respectively acquiring corresponding alternating voltage stress and service life values when each sample for alternating voltage testing fails, and determining the coefficient value of a preset acceleration model of the isolator according to a plurality of groups of alternating voltage stress and service life values by adopting a least square method so as to obtain the corresponding relation between the alternating voltage stress and the service life.
According to the method for evaluating the withstand voltage life of the isolator provided by the invention, the corresponding relation between the alternating voltage stress and the life is as follows:
ln(ξ)＝9.7299-4.277ln(v) (2)
the corresponding relation between the direct-current voltage stress and the service life is as follows:
ln(ξ)＝18.175-4.46ln(v) (3)
in the above equations (2) and (3), ξ represents the lifetime value of the separator and v represents the voltage stress applied by the separator.
In another aspect, the present invention further provides an apparatus for evaluating a withstand voltage life of an isolator, including:
the voltage acquisition module is used for acquiring a voltage stress value of the isolator to be tested during working;
and the service life evaluation module is used for acquiring the service life of the isolator to be tested according to the voltage stress value during working and the corresponding relation between the voltage stress and the service life acquired in advance.
In another aspect, the present invention further provides an electronic device, which includes a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements any one of the above methods for evaluating the withstand voltage life of the isolator when executing the program.
In another aspect, the present invention further provides a non-transitory computer-readable storage medium, on which a computer program is stored, the computer program, when executed by a processor, implementing the method for evaluating the withstand voltage life of an isolator as described in any one of the above.
In another aspect, the present invention further provides a computer program product, which includes a computer program, and when the computer program is executed by a processor, the method for evaluating the withstand voltage life of the isolator is implemented as any one of the above methods.
According to the method for evaluating the withstand voltage life of the isolator, provided by the invention, after the voltage stress value of the isolator to be tested during working is obtained, the working life of the isolator to be tested is obtained according to the voltage stress value during working and the pre-obtained corresponding relation between the voltage stress and the working life. The method can quickly obtain the withstand voltage life of the isolator to be tested, shortens the measurement period and saves the time cost of the test.
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In order to more clearly illustrate the technical solutions of the present invention or the prior art, the drawings needed for the description of the embodiments or the prior art will be briefly described below, and it is obvious that the drawings in the following description are some embodiments of the present invention, and those skilled in the art can also obtain other drawings according to the drawings without creative efforts.
FIG. 1 is a schematic flow chart of a method for evaluating the pressure-resistant life of an isolator according to the present invention;
FIG. 2 is a schematic diagram showing the relationship between the failure time of a sample under AC voltage and a failure distribution function provided by the present invention;
FIG. 3 is a schematic diagram showing the relationship between the life of a sample and the voltage under an alternating voltage provided by the present invention;
FIG. 4 is a schematic diagram showing the relationship between the sample failure time and the failure distribution function under the DC voltage provided by the present invention;
FIG. 5 is a schematic diagram showing the relationship between the life of a sample and the voltage under a DC voltage provided by the present invention;
FIG. 6 is a schematic diagram of an isolator voltage stress acquisition circuit provided by the present invention;
FIG. 7 is a schematic structural diagram of an isolator withstand voltage life evaluation device provided by the present invention;
fig. 8 is a schematic structural diagram of an electronic device provided by the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention clearer, the technical solutions of the present invention will be clearly and completely described below with reference to the accompanying drawings, and it is obvious that the described embodiments are some, but not all embodiments of the present invention. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Based on the accelerated life test model, the invention reasonably increases the test stress level and shortens the test time under the condition of not changing the failure mechanism of the isolator, and obtains the corresponding relation between the voltage stress and the service life. During testing, the working voltage stress of the isolator to be tested is obtained, and the service life data of the sample can be quickly obtained according to the obtained corresponding relation, so that the measuring period is shortened, and the testing time cost is saved.
The first embodiment is as follows:
the present embodiment provides a method for evaluating a withstand voltage life of an isolator, as shown in fig. 1, the method includes:
step 101: and acquiring a voltage stress value of the isolator to be tested during working.
In this embodiment, the voltage stress value applied to the isolator can be collected by the voltage stress collecting circuit. For example, as shown in fig. 6, the left and right pins of the isolator are respectively shorted together, and voltage stress is applied between the input side and the output side by a high voltage meter, and the current on both sides of the isolation gate is monitored at the same time.
Step 102: and acquiring the service life of the isolator to be tested according to the voltage stress value during working and the corresponding relation between the voltage stress and the service life acquired in advance. In other words, it can be understood that: and (3) forming a service life evaluation model after acquiring the corresponding relation between the voltage stress and the service life in advance, and inputting the acquired voltage stress value of the isolator to be tested into the service life evaluation model to obtain the working service life of the isolator to be tested.
In the present embodiment, when obtaining the corresponding relationship between the voltage stress and the lifetime, firstly, an acceleration model of the isolator needs to be constructed according to the characteristics of the isolator. During the accelerated life test, the applicant finds that there is a definite functional relationship between the life and the stress, i.e. an accelerated model is satisfied between the life and the stress, the accelerated model being that the life of the isolator is shortened when the voltage stress applied across the isolator is increased. As the isolator belongs to an electronic device, the life data of the isolator accords with Weibull distribution through the test of the applicant, and an inverse power law model is obeyed between the characteristic life of the electronic device and the acceleration stress. Therefore, an inverse power law model is selected to study the relationship between the voltage stress and the service life, and the specific obtained acceleration relationship between the voltage stress and the service life is as follows:
ξ＝Av -c
where ξ represents the operational lifetime of the isolator, v represents the voltage stress, and A is a constant; c is a normal number related to activation energy, and can be approximately regarded as a constant when the range of variation of the absolute temperature T of the sample is very small.
In order to more intuitively represent the relationship between the service life xi and the voltage stress, the formula xi = Av -c The natural logarithm is taken with e as the base on the left and right sides to obtain an acceleration model of the isolator of the embodiment as follows:
lnξ＝a+b*ln(v) (1)
in the formula (1), ξ represents the life value of the isolator, v represents the voltage stress applied by the isolator, a and b are undetermined constants, and ln ξ and ln are simply linearly related.
As can be seen from the above equation (1), if the values of a and b are obtained, the relationship between the lifetime ξ and the voltage stress can be obtained. In the embodiment, 240 ADuM120N type magnetic coupling isolators of ADI company are selected as samples, a loading mode of constant voltage stress is selected for accelerated test, in order to comprehensively evaluate the voltage withstanding characteristic of the isolators, two modes of direct current and alternating current are adopted for test, and a calculation method of GB2689.1-81 'general rule of constant stress life test and accelerated life test method' is referred to when the stress grade of the test is designed.
In this embodiment, 240 magnetic coupling isolators are divided into 8 groups, wherein 4 groups are used for ac tests, and ac voltage stresses are set to 2000V, 2289V, 2620V, and 3000V, respectively, and the other 4 groups are used for dc tests, and dc voltage stresses are set to 3500V, 3806V, 4138V, and 4500V, respectively, and the test is stopped by using a constant number tail-off manner, that is, the test is ended when all samples in each group fail, and the failure criterion is that the test isolator is considered to fail when the leakage current I of the test isolator is greater than or equal to 1 mA. The specific test protocol is shown in table 1 below.
TABLE 1 accelerated life test protocol
The voltage-lifetime relationship is derived based on the characteristic lifetime of the isolator under different voltage stresses. Specifically, based on the voltage stress accelerated life test, for direct current and alternating current tests, four sample failure time relation graphs can be obtained, each group of voltages are different, the trend of life data is different, four groups of (ln xi, ln) pairs can be obtained, and a and b are determined by using a least square method to obtain the relation between ln xi and ln.
Wherein, because the isolator belongs to electron device, the life data accords with weibull distribution, and the distribution function expression of inefficacy is:
or let t 0 ＝α β Then the above equation equals:
the failure rate function is then:
Wherein t is failure time, F (t) is failure probability when the failure time is less than or equal to t, alpha is a scale parameter, beta is a shape parameter, and the values of alpha and beta are solved to obtain the expressions of a failure distribution function F (t) and a failure rate function lambda (t).
The parameters of the values of alpha and beta are estimated by using a least square method, and a Weibull distribution function can be transformed into:
taking two logarithms on two sides to obtain:
life data from tests
Fitting the experimental life data based on a least squares method can result in:
in the present embodiment, the sample selects the magnetic coupling isolator, and under four different ac voltage stresses, the failure time relationship of four groups of samples (magnetic coupling isolators) is shown in fig. 2, where four failure rate functions are:
the curve in fig. 2 can only show the trend of life change, and a criterion is also needed to judge when the sample fails, that is, the failure time, that is, the life ξ, corresponding to the failure rate of the sample under four voltage stresses is 10ppm is calculated, and the result is shown in table 2:
TABLE 2 failure time of samples under four voltage stresses
Four groups of (ln xi, lnv) number pairs are obtained, a distribution straight line is fitted based on a least square method, the values of a and b are determined, and the relationship between the alternating voltage stress and the service life is obtained as shown in fig. 3, specifically, the relationship between the alternating voltage stress and the service life is determined as follows:
ln(ξ)＝9.7299-4.277ln(v) (2)
under four different direct-current voltage stresses, the relationship of failure time of four groups of samples is shown in fig. 4, and four failure rate functions are respectively:
the failure time was also calculated for the sample at 10ppm failure rate for the four voltage conditions, and the results are shown in table 3:
TABLE 3 failure time of samples under four voltage stresses
Four groups of (ln xi, lnv) number pairs are obtained, distribution straight lines are fitted based on a least square method, values of a and b are determined, and the relation between the direct current voltage stress and the service life is obtained as shown in FIG. 5, and the formula is as follows:
ln(ξ)＝18.175-4.46ln(v) (3)
estimating the service life of the isolator under normal stress:
for example, based on equation (2), assuming that the maximum ac operating voltage for the ADuM120N sample is about 565V, the device operating life is 30 years.
Based on the formula (3), assuming that the maximum dc operating voltage corresponding to the ADuM120N sample is about 1430V, the device operating life is 30 years.
Therefore, the method of the embodiment can be used for rapidly obtaining the withstand voltage service life of the isolator to be tested, shortening the measurement period and saving the time cost of the test.
Example two:
the following describes the apparatus for evaluating the withstand voltage life of the isolator provided by the present invention, and the apparatus for evaluating the withstand voltage life of the isolator described below and the method for evaluating the withstand voltage life of the isolator described above can be referred to correspondingly.
The present embodiment provides an isolator withstand voltage life evaluation apparatus, as shown in fig. 7, the life evaluation apparatus including: a voltage acquisition module 201 and a lifetime assessment module 202.
The voltage obtaining module 201 is configured to obtain a voltage stress value of the isolator to be tested during operation; the service life evaluation module 202 is configured to obtain the service life of the isolator to be tested according to the voltage stress value during operation and the pre-obtained correspondence between the voltage stress and the service life.
The implementation method of each functional module in the voltage endurance life assessment apparatus of the isolator of this embodiment is the same as that in the first embodiment, and is not described herein again.
Fig. 8 illustrates a physical structure diagram of an electronic device, and as shown in fig. 8, the electronic device may include: a processor (processor) 710, a communication interface (communication interface) 720, a memory (memory) 730, and a communication bus 740, wherein the processor 710, the communication interface 720, and the memory 730 communicate with each other via the communication bus 740. Processor 710 may call logic instructions in memory 730 to perform an isolator withstand voltage life assessment method comprising: acquiring a voltage stress value of the isolator to be tested during working; and acquiring the working life of the isolator to be tested according to the voltage stress value during working and the corresponding relation between the voltage stress and the working life acquired in advance.
In addition, the logic instructions in the memory 730 can be implemented in the form of software functional units and stored in a computer readable storage medium when the logic instructions are sold or used as independent products. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-only memory (ROM), a Random Access Memory (RAM), a magnetic disk, an optical disk, or other various media capable of storing program codes.
In another aspect, the present invention further provides a computer program product, the computer program product including a computer program, the computer program being stored on a non-transitory computer-readable storage medium, wherein when the computer program is executed by a processor, the computer is capable of executing the method for estimating the withstand voltage life of the isolator, the method including: acquiring a voltage stress value of the isolator to be tested during working; and acquiring the working life of the isolator to be tested according to the voltage stress value during working and the corresponding relation between the voltage stress and the working life acquired in advance.
In still another aspect, the present invention also provides a non-transitory computer-readable storage medium, on which a computer program is stored, the computer program being implemented by a processor to execute the method for evaluating the withstand voltage life of an isolator provided by the above methods, the method including: acquiring a voltage stress value of the isolator to be tested during working; and acquiring the working life of the isolator to be tested according to the voltage stress value during working and the corresponding relation between the voltage stress and the working life acquired in advance.
The above-described embodiments of the apparatus are merely illustrative, and the units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment. One of ordinary skill in the art can understand and implement it without inventive effort.
Through the above description of the embodiments, those skilled in the art will clearly understand that each embodiment can be implemented by software plus a necessary general hardware platform, and certainly can also be implemented by hardware. With this understanding in mind, the above-described technical solutions may be embodied in the form of a software product, which can be stored in a computer-readable storage medium such as ROM/RAM, magnetic disk, optical disk, etc., and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute the methods described in the embodiments or some parts of the embodiments.
Finally, it should be noted that: the above examples are only intended to illustrate the technical solution of the present invention, but not to limit it; although the present invention has been described in detail with reference to the foregoing embodiments, it will be understood by those of ordinary skill in the art that: the technical solutions described in the foregoing embodiments may still be modified, or some technical features may be equivalently replaced; and such modifications or substitutions do not depart from the spirit and scope of the corresponding technical solutions of the embodiments of the present invention.
Claims (10)
1. An isolator withstand voltage life evaluation method is characterized by comprising the following steps:
acquiring a voltage stress value of the isolator to be tested during working;
and acquiring the working life of the isolator to be tested according to the voltage stress value during working and the corresponding relation between the voltage stress and the working life acquired in advance.
2. The method for evaluating the withstand voltage life of the isolator according to claim 1, wherein the correspondence between the voltage stress and the operating life is obtained by:
selecting a plurality of isolators as samples, testing the samples under different voltages respectively, and obtaining a life value of each sample when the sample fails;
and determining the coefficient value of a preset acceleration model of the isolator according to the voltage stress and the corresponding service life values when the plurality of samples fail, so as to obtain the corresponding relation between the voltage stress and the service life.
3. The method for evaluating the withstand voltage life of the isolator as claimed in claim 1, wherein the preset acceleration model of the isolator is:
lnξ＝a+b*ln(v) (1)
in the above equation (1), ξ represents the lifetime value of the isolator, v represents the voltage stress exerted on the isolator, a and b are coefficients of the acceleration model, and a and b are constants.
4. The method for evaluating the withstand voltage life of the isolator according to claim 2, wherein the criterion for the sample failure is:
and when the leakage current I of the sample is more than or equal to 1mA, determining that the sample fails.
5. The method for evaluating the withstand voltage life of the isolator according to claim 2, wherein the samples are tested at different voltages respectively, and the life value of each sample when the sample fails is obtained respectively; determining the coefficient value of a preset acceleration model of the isolator according to the voltage stress and the corresponding service life values when the multiple samples fail, so as to obtain the corresponding relation between the voltage stress and the service life, wherein the method comprises the following steps:
equally dividing the plurality of samples into eight groups, wherein four groups are used for direct current voltage testing, and the other four groups are used for alternating current voltage testing;
respectively obtaining direct-current voltage stress and life values corresponding to each failed sample for direct-current voltage testing, and determining coefficient values of a preset acceleration model of the isolator according to multiple groups of direct-current voltage stress and life values by adopting a least square method so as to obtain a corresponding relation between the direct-current voltage stress and the life;
and respectively acquiring corresponding alternating voltage stress and service life values when each sample for alternating voltage testing fails, and determining the coefficient value of a preset acceleration model of the isolator according to a plurality of groups of alternating voltage stress and service life values by adopting a least square method so as to obtain the corresponding relation between the alternating voltage stress and the service life.
6. The method for evaluating the withstand voltage life of the isolator according to claim 4, wherein the correspondence relationship between the alternating voltage stress and the life is as follows:
ln(ξ)＝9.7299-4.277ln(v) (2)
the corresponding relation between the direct-current voltage stress and the service life is as follows:
ln(ξ)＝18.175-4.46ln(v) (3)
in the above equations (2) and (3), ξ represents the lifetime value of the separator and v represents the voltage stress applied by the separator.
7. An isolator withstand voltage life evaluation device characterized by comprising:
the voltage acquisition module is used for acquiring a voltage stress value of the isolator to be tested during working;
and the service life evaluation module is used for acquiring the service life of the isolator to be tested according to the voltage stress value during working and the corresponding relation between the voltage stress and the service life acquired in advance.
8. An electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, wherein the processor implements the method for evaluating the withstand voltage life of the isolator according to any one of claims 1 to 6 when executing the program.
9. A non-transitory computer-readable storage medium having a computer program stored thereon, wherein the computer program, when executed by a processor, implements the method for evaluating the pressure-resistant life of an isolator according to any one of claims 1 to 6.
10. A computer program product comprising a computer program, wherein the computer program when executed by a processor implements the method of evaluating the pressure life of an isolator as claimed in any one of claims 1 to 6.
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN116203298A (en) * | 2023-01-31 | 2023-06-02 | 赛福凯尔(绍兴)医疗科技有限公司 | Power protection method and system based on magnetic coupling digital isolator |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN116203298A (en) * | 2023-01-31 | 2023-06-02 | 赛福凯尔(绍兴)医疗科技有限公司 | Power protection method and system based on magnetic coupling digital isolator |
| CN116203298B (en) * | 2023-01-31 | 2024-04-02 | 赛福凯尔(绍兴)医疗科技有限公司 | Power protection method and system based on magnetic coupling digital isolator |
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