CN115622637A - Test method and test system - Google Patents

Test method and test system Download PDF

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Publication number
CN115622637A
CN115622637A CN202110787009.1A CN202110787009A CN115622637A CN 115622637 A CN115622637 A CN 115622637A CN 202110787009 A CN202110787009 A CN 202110787009A CN 115622637 A CN115622637 A CN 115622637A
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China
Prior art keywords
test
instruction
signal
test instruction
wifi module
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CN202110787009.1A
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Chinese (zh)
Inventor
黄昌强
郭征
陈齐慧
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Guangzhou Shiyuan Electronics Thecnology Co Ltd
Guangzhou Shirui Electronics Co Ltd
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Guangzhou Shiyuan Electronics Thecnology Co Ltd
Guangzhou Shirui Electronics Co Ltd
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Priority to CN202110787009.1A priority Critical patent/CN115622637A/en
Publication of CN115622637A publication Critical patent/CN115622637A/en
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    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B17/00Monitoring; Testing
    • H04B17/10Monitoring; Testing of transmitters
    • H04B17/11Monitoring; Testing of transmitters for calibration
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B17/00Monitoring; Testing
    • H04B17/20Monitoring; Testing of receivers
    • H04B17/21Monitoring; Testing of receivers for calibration; for correcting measurements
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04WWIRELESS COMMUNICATION NETWORKS
    • H04W24/00Supervisory, monitoring or testing arrangements
    • H04W24/08Testing, supervising or monitoring using real traffic
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04WWIRELESS COMMUNICATION NETWORKS
    • H04W84/00Network topologies
    • H04W84/02Hierarchically pre-organised networks, e.g. paging networks, cellular networks, WLAN [Wireless Local Area Network] or WLL [Wireless Local Loop]
    • H04W84/10Small scale networks; Flat hierarchical networks
    • H04W84/12WLAN [Wireless Local Area Networks]

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  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Mobile Radio Communication Systems (AREA)

Abstract

The embodiment of the application discloses a test method, which is applied to a test system, wherein the test system comprises a PC (personal computer) host, a signal adapter plate and a WiFi (wireless fidelity) module of an SDIO (serial digital input output) interface, and the method comprises the following steps: when the PC host computer detects the installation signal of the WiFi module of the SDIO interface, a first test instruction is generated, the first test instruction is sent to the signal transfer board, the signal transfer board converts the first test instruction into a second test instruction, the second test instruction is sent to the WiFi module of the SDIO interface, and the WiFi module of the SDIO interface tests test items in the WiFi module of the SDIO interface based on the second test instruction. Through the method, when the WiFi module of the SDIO interface is tested, complex test environment in the related technology does not need to be built, the signal transfer board is connected with the WiFi module of the PC host and the SDIO interface, the radio frequency parameters of the WiFi module of the SDIO interface can be directly calibrated and tested on the PC host, and the test efficiency of the WiFi module of the SDIO interface can be improved.

Description

Test method and test system
Technical Field
The present application relates to the field of communications devices, and in particular, to a test method and a test system.
Background
A Wireless Fidelity (WiFi) module of a Secure Digital Input and Output (SDIO) interface is based on an SDIO transmission protocol, follows an 802.11 protocol and a TCP/IP protocol stack, has high communication speed and can easily realize data exchange of two Wireless parties. In the related art, testing the WiFi module of the SDIO interface requires building a complex test environment, and the test system usually includes: and the upper computer and a test board (based on ARM) of the Linux kernel, flash, a power supply and the like. In the test system, the test environment is complex to build, a plurality of connecting wires are arranged, hot plugging is not supported, the phenomenon of dead halt or blue screen is easy to occur, the computer is required to be restarted, and the test efficiency is greatly reduced.
Disclosure of Invention
The embodiment of the application provides a test method and a test system, and aims to solve the technical problem of how to improve the test efficiency of a WiFi module of an SDIO interface in the related technology. The technical scheme is as follows:
in a first aspect, an embodiment of the present application provides a test method, which is applied to a test system, where the test system includes a PC host, a signal adapter board, and a WiFi module of an SDIO interface, and the method includes:
when the PC host detects an installation signal of a WiFi module of the SDIO interface, generating a first test instruction, and sending the first test instruction to the signal adapter plate;
the signal adapter board converts the first test instruction into a second test instruction and sends the second test instruction to a WiFi module of the SDIO interface;
and the WiFi module of the SDIO interface tests the test items in the WiFi module of the SDIO interface based on the second test instruction.
In a second aspect, an embodiment of the present application provides a test system, where the system includes: the system comprises a PC host, a signal adapter plate and a WiFi module of an SDIO interface;
the PC host is used for generating a first test instruction when detecting an installation signal of a wireless fidelity module of the safe digital input/output interface and sending the first test instruction to the signal adapter plate;
the signal adapter plate is used for converting the first test instruction into a second test instruction and sending the second test instruction to the wireless fidelity module of the safe digital input/output interface;
and the wireless fidelity module of the safe digital input/output interface is used for testing the test items in the wireless fidelity module of the safe digital input/output interface based on the second test instruction.
The beneficial effects that technical scheme that this application embodiment brought include at least:
the scheme of this application embodiment is when carrying out, is applied to test system, test system includes the wiFi module of PC host computer, signal transfer board and SDIO interface, works as when the installation signal of the wiFi module of SDIO interface is detected to the PC host computer, generates first test instruction, and will first test instruction send to the signal transfer board, the signal transfer board will first test instruction converts the second test instruction into, and will second test instruction send to the wiFi module of SDIO interface, the wiFi module of SDIO interface is based on the second test instruction is right test item in the wiFi module of SDIO interface tests. Through the method, when the WiFi module of the SDIO interface is tested, complex test environment in the correlation technique does not need to be built, the PC host and the WiFi module of the SDIO interface are connected through the signal transfer board, the radio frequency parameters of the WiFi module of the SDIO interface can be directly calibrated and tested on the PC host, and the test efficiency of the WiFi module of the SDIO interface can be improved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a system architecture diagram of a testing method provided in an embodiment of the present application;
FIG. 2 is a schematic flow chart of a testing method provided in an embodiment of the present application;
FIG. 3 is a schematic flow chart of another testing method provided in the embodiments of the present application;
FIG. 4 is a schematic illustration of a test system according to an embodiment of the present disclosure;
FIG. 5 is a schematic illustration of another exemplary testing system provided in the embodiments of the present application;
fig. 6 is a schematic structural diagram of a test system according to an embodiment of the present application.
Detailed Description
The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application.
In the following description, the terms "first" and "second" are used for descriptive purposes only and are not intended to indicate or imply relative importance. The following description provides embodiments of the present application, which may be combined or interchanged with one another, and therefore the present application is also to be construed as encompassing all possible combinations of the same and/or different embodiments described. Thus, if one embodiment includes features a, B, C and another embodiment includes features B, D, then this application should also be construed to include embodiments that include all other possible combinations of one or more of a, B, C, D, although such embodiments may not be explicitly recited in the following text.
The following description provides examples, and does not limit the scope, applicability, or examples set forth in the claims. Changes may be made in the function and arrangement of elements described without departing from the scope of the disclosure. Various examples may omit, substitute, or add various procedures or components as appropriate. For example, the described methods may be performed in a different order than described, and various steps may be added, omitted, or combined. Furthermore, features described with respect to some examples may be combined into other examples.
Referring to fig. 1, a system architecture diagram of a test system provided in an embodiment of the present application includes a first terminal 110, a signal adapter board 120, and a WiFi module 130 of SDIO interface.
Wherein the first terminal 110 includes a first port 112; the signal patch panel 120 includes a second port 122 and a third port 124; the WiFi module 130 of the SDIO interface includes a fourth port 132. The first terminal 110 is connected to the signal adapter board 120 through the first port 112 and the second port 122, and the signal adapter board 120 is connected to the WiFi module of the SDIO interface through the third port 124 and the fourth port 132. In this embodiment, the first port 112 and the second port 122 may be a high-speed serial computer interconnect express (PCIE) interface, and the third port 124 and the fourth port 132 may be SDIO interfaces.
The first terminal 110 may be various electronic devices with a display screen, including but not limited to a flat panel television, a CRT television, a rear projection television, a portable computer, a desktop computer, and the like, and if the first terminal 110 is a television, the control system corresponding to the first terminal 110 may be an android system. The first terminal 110 may be hardware or software. When the first terminal 110 is software, it may be installed in the electronic device listed above. Which may be implemented as multiple software or software modules (e.g., to provide distributed services) or as a single software or software module, and is not particularly limited herein. When the first terminal 110 is a hardware, a display device and a camera may be further installed thereon, and the display of the display device may be various devices capable of implementing a display function, for example: the display device may be a Cathode ray tube (CR) display, a Light-emitting diode (LED) display, an electronic ink screen, a Liquid Crystal Display (LCD), a Plasma Display Panel (PDP), or the like. The user may utilize the display device on the first terminal 110 to view information such as displayed text, pictures, videos, and the like.
The signal adapter board 120 may be a circuit board provided with a signal conversion chip, and the chip in this embodiment may be RTS5249. According to some embodiments, a touch switch, which may be a boat-type switch, may be mounted on the signal adapter board 120 to start or end a communication process of the SDIO signal. The specific implementation process may be that, after the circuit of the system architecture diagram shown in fig. 1 is connected, the ship-type switch is turned on to trigger communication between the WiFi module of the SDIO interface and the PC host; when the WiFi module finishes the calibration test, the ship-shaped switch is closed, the communication between the WiFi module of the SDIO DIO interface and the PC host is ended, and further, the next WiFi module can be replaced for testing.
The WiFi module of the SDIO interface is an embedded module which is based on the SDIO interface and accords with WiFi wireless network standards, a wireless network protocol IEEE802.11 protocol stack and a TCP/IP protocol stack are built in the WiFi module, and conversion from the SDIO interface to a wireless network of user host platform data can be achieved. The WiFi module of the SDIO interface can be composed of other hardware such as a WiFi module, an external power supply system and a horn socket. Also can be provided with ox horn socket on the signal keysets, and the connection between wiFi module and the signal keysets can be connected through the SDIO signal connection line between the ox horn socket.
It should be noted that the number of each port in each module is merely explained as an example, and the specific number of each port is not limited in the embodiment of the present application.
The scheme of this application embodiment is applied to test system when carrying out, test system includes the wiFi module of PC host computer, signal transfer board and SDIO interface, works as when the installation signal of the wiFi module of SDIO interface is detected to the PC host computer, generates first test instruction, and will first test instruction sends to the signal transfer board, the signal transfer board will first test instruction converts the second test instruction into, and will second test instruction sends to the wiFi module of SDIO interface, the wiFi module of SDIO interface is based on the second test instruction is right test item in the wiFi module of SDIO interface tests. Through the method, when the WiFi module of the SDIO interface is tested, complex test environment in the related technology does not need to be built, the signal transfer board is connected with the WiFi module of the PC host and the SDIO interface, the radio frequency parameters of the WiFi module of the SDIO interface can be directly calibrated and tested on the PC host, and the test efficiency of the WiFi module of the SDIO interface can be improved.
Please refer to fig. 2, which is a schematic flowchart of a testing method provided in an embodiment of the present application, where the method is applied to a testing system, and the testing system includes a PC host, a signal adapter board, and a WiFi module of an SDIO interface. As shown in fig. 2, the method of the embodiment of the present application is applied to the system architecture diagram shown in fig. 1, and may include the following steps:
s201, when the PC host detects an installation signal of a WiFi module of the SDIO interface, generating a first test instruction, and sending the first test instruction to a signal transfer board.
It can be understood that the WiFi module of the SDIO interface is an embedded module based on the SDIO interface and conforming to the WiFi wireless network standard, and the built-in wireless network protocol IEEE802.11 protocol stack and the TCP/IP protocol stack can implement the conversion from the user host platform data to the wireless network through the SDIO interface. The SDIO interface is an interface developed on the basis of an SD memory card interface, is compatible with the former SD memory card and can be connected with equipment of the SDIO interface. The installation signal refers to, after each component is connected according to the system architecture diagram shown in fig. 1 in the embodiment of the present application, that is, the WiFi module is connected with the signal adapter board first, and the installation signal corresponding to the installation action when the local shell of the signal adapter board is inserted into the PCIE slot on the PC host again, and when the shell is inserted into the PCIE slot, the PC host can recognize the WiFi module of the SDIO interface.
It can be understood that the first test instruction refers to an instruction for debugging a test item in the WiFi module, the test item may refer to a radio frequency parameter, and software similar to an upper computer is installed on the PC host, and the radio frequency parameter of the WiFi module can be directly adjusted through the software. Because in the traditional mode, need use the host computer to connect and survey test panel, survey test panel reconnection wiFi module, then send test instruction by the host computer and give and survey test panel, survey test panel and detect the test item of wiFi module again. In the embodiment of the application, only software is needed to send the test instruction to the signal adapter plate, so that the signal sends the test instruction to the WiFi module on the adapter plate, and the WiFi module detects each test item according to the test instruction.
And S202, the signal adapter plate converts the first test instruction into a second test instruction and sends the second test instruction to a WiFi module of the SDIO interface.
It can be understood that the signal adapter board is a circuit board provided with a signal conversion chip in the embodiments of the present application, the signal conversion chip may convert a first test instruction into a second test instruction, the first test instruction is generated by the PC host and is sent to the signal adapter board by the PC host, and the second test instruction is converted by the first test instruction and is sent to the WiFi module of the SDIO interface by the signal adapter board. Because the WiFi module of the SDIO interface can not be directly connected with the PC host, and the first test instruction generated by the PC host can not be directly sent to the WiFi module of the SDIO interface, therefore, the first test instruction needs to be converted into the second test instruction which can be directly received by the WiFi module of the SDIO interface, and then the second test instruction is sent to the WiFi module of the SDIO. It can be understood that, the wiFi module of SDIO interface can only be connected with the equipment of SDIO interface, consequently can use the SDIO connecting wire to be connected with the signal transfer board, also can only transmit the SDIO signal, and second test instruction can be the test instruction of SDIO signal. The PC host is generally configured with a PCIE interface or a USB interface, and is not provided with an SDIO interface, and there is no chip that converts a USB signal into an SDIO signal, but there is a chip that can convert a PCIE signal into an SDIO signal.
Specifically, the PCIE signal includes 1 pair of CLK signals and 2 pairs of differential signals, that is, 1 pair of clock signals and 2 pairs of differential data signals, and 6 signal lines. The SDIO signal also has 6 signal lines, CMD, CLK, DATA0, DATA1, DATA2, DATA3, respectively, with CMD used to transmit command tokens, CLK being a clock signal line, and DATA0-DATA3 being differential signal lines. The signal conversion chip of the signal adapter board, for example, the RTS5249 chip, can convert SDIO signals and PCIE signals into each other, and it can be understood that a PCIE protocol can be executed to convert signals transmitted by a PCIE interface into signals transmitted by an SDIO interface, or an SDIO protocol can be executed to convert signals transmitted by an SDIO interface into signals transmitted by a PCIE interface. Because the SDIO signal and the PCIE signal are both composed of a clock signal and a data signal, in the signal conversion process, the clock signal is used to synchronize the node, that is, the clock signal is used to provide the time of signal conversion, for example, when the clock signal is at a low level or a high level, data conversion may be performed once, that is, the SDIO signal is converted into the PCIE signal, or the PCIE signal is converted into the SDIO signal. SDIO uses HOST-DEVICE mode, all communication is commanded by HOST, and DEVICE can communicate with HOST by only resolving HOST command. The CLK signal in the SDIO signal line is the HOST clock signal to DEVICE, the CMD signal is a bi-directional signal used to transfer commands and responses, and the DAT0-DAT3 signals are four data lines used for transfer. On the SDIO bus, a HOST initiates a request, and then a DEVICE responds to the request, with data information in the request and the response. For a read command, first HOST sends a command to DEVICE, then DEVICE returns a handshake signal, and when HOST receives the handshake signal in response, it puts the data on the 4-bit data line, and transmits the data while following the CRC check code. When the entire read command is transferred, HOST will again send a command informing DEVICE that the operation is complete, and DEVICE will return a response. For a write command, first HOST sends a command to DEVICE, and then DEVICE returns a handshake signal, when HOST receives the handshake signal in response, it puts the data on the 4-bit data line, and follows the CRC check code while transferring the data. When the entire write transfer is complete, HOST will again send a command informing DEVICE that the operation is complete, and DEVICE will return a response at the same time.
S203, the WiFi module of the SDIO interface tests test items in the WiFi module of the SDIO interface based on the second test instruction.
The test items in the embodiment of the present application may include radio frequency parameters and the like. Specifically, the WiFi module of SDIO interface can receive the second test instruction that comes from the signal keysets, and the second test instruction is the instruction of SDIO interface transmission, and the instruction is used for instructing the WiFi module of SDIO interface to adjust the radio frequency parameter, and the radio frequency parameter mainly includes: the transmission power, the error vector magnitude, and the frequency error may further include: frequency offset template, spectrum flatness, receiving sensitivity, etc. of the transmitted signal. Transmission power: the unit is dBm, the wireless transmitting power determines the strength and distance of a wireless signal, and the larger the power is, the stronger the signal is. Error Vector Magnitude (EVM): the unit of the measure is dB, and the smaller the EVM, the better the signal quality. Generally, in a wireless product, the transmission power and the EVM are correlated, and the larger the transmission power, the larger the EVM, i.e. the worse the signal quality, so in practical applications, a compromise can be made between the transmission power and the EVM. Frequency error: the method is used for representing the deviation of a radio frequency signal from the central frequency of a channel where the signal is located, and the unit is PPM. Frequency offset template of the transmitted signal: the quality of the transmitted signal and the interference suppression capability on adjacent channels may be measured. The spectrum template of the measured signal is qualified in the standard spectrum template, and the performance is better when the spectrum template is smaller and the standard template line is farther under the condition that the transmitting power is met. Spectral flatness: and characterizing the power flatness of the signal to be tested in the channel in which the signal is positioned. Whether the flatness of the spectrum is flat or not affects the connection performance of the wireless signal. Reception sensitivity: a parameter characterizing the receptivity of the test object. The better the reception sensitivity, the more useful signals it receives, and the greater its radio coverage. When one WiFi module leaves the factory, the radio frequency parameters are empty, and the radio frequency parameters can be adjusted through the method of the embodiment of the application, so that each parameter is adjusted to be a proper parameter value.
The scheme of this application embodiment is when carrying out, is applied to test system, test system includes the wiFi module of PC host computer, signal transfer board and SDIO interface, works as when the installation signal of the wiFi module of SDIO interface is detected to the PC host computer, generates first test instruction, and will first test instruction send to the signal transfer board, the signal transfer board will first test instruction converts the second test instruction into, and will second test instruction send to the wiFi module of SDIO interface, the wiFi module of SDIO interface is based on the second test instruction is right test item in the wiFi module of SDIO interface tests. Through the method, when the WiFi module of the SDIO interface is tested, complex test environment in the related technology does not need to be built, the signal transfer board is connected with the WiFi module of the PC host and the SDIO interface, the radio frequency parameters of the WiFi module of the SDIO interface can be directly calibrated and tested on the PC host, and the test efficiency of the WiFi module of the SDIO interface can be improved.
Please refer to fig. 3, which is a flowchart illustrating another testing method according to an embodiment of the present disclosure. As shown in fig. 3, the method of the embodiment of the present application may include the steps of:
s301, when the PC host detects an installation signal of a WiFi module of the SDIO interface, a first test instruction is generated, and the first test instruction is sent to the signal transfer board through the PCIE interface.
In some embodiments, a touch switch may be further installed on the signal adapter board, which is shown in fig. 4 as a physical schematic diagram of part of hardware of the test system, where the physical schematic diagram includes the WiFi module 410 of the SDIO interface, the SDIO connection line 430, the signal adapter board 440, the housing 450, and the switch 460. The WiFi module 420 is included in the WiFi module 410 of the SDIO interface, the WiFi module 420 in the WiFi module 410 of different SDIO interfaces is different, the SDIO connecting wire 430 is used for connecting the WiFi module 410 of the SDIO interface and the signal adapter plate 440, the switch 460 is arranged on the signal adapter plate 440, and the shell 450 is used for wrapping the partial area of the signal adapter plate. Can refer to the material object sketch of the whole hardware of test system shown in fig. 5, all parts in fig. 4 all embody in fig. 5, it is concrete, the PCIE slot of PC host computer is inserted to the shell shown in fig. 5, and the wiFi module of signal transfer board and SDIO interface passes through the SDIO connecting wire and connects the back, the tester can toggle the switch, after the toggle switch, the wiFi module of signal transfer board and SDIO interface is in the on-state, the PC host computer can detect hardware equipment (the wiFi module of SDIO interface), that is to say, the action that the switch was stirred is just the installation signal of the wiFi module of SDIO interface at the signal that the PC host computer corresponds. Correspondingly, after the test of the WiFi module of the last SDIO interface is completed, the tester can close the switch, and at the moment, the WiFi modules of the signal transfer board and the SDIO interface are in a power-off state. Furthermore, the WiFi module of the next SDIO interface can be replaced for testing, different WiFi modules can be replaced in sequence for testing according to the steps, and hot plug of the WiFi modules can be achieved. The PC host generates a first test instruction after installing the signal, and sends the first test instruction to the signal adapter board through the PCIE interface, which may refer to S201 in fig. 2, and is not described herein again.
And S302, the signal adapter plate converts the first test instruction into a second test instruction, and the second test instruction is sent to a WiFi module of an SDIO interface through an SDIO connecting line.
In some embodiments, the SDIO signal may be a differential signal, and since the signal line of the PCIE for transmitting data is also a differential signal, the SDIO connection line may be designed to have equal length and equal width, and the connection line may also be strictly covered, so that the signal may be prevented from being interfered in the transmission process. In addition, the SDIO connecting wire should not be overlength, for example the SDIO connecting wire can be controlled within 20cm, avoids influencing signal quality.
Specifically, the process of converting the first test command into the second test command by the signal adapter board may refer to S202 in fig. 2, which is not described herein again.
And S303, testing the radio frequency parameters in the WiFi module of the SDIO interface by the WiFi module of the SDIO interface based on the second test instruction.
Specifically, S303 can be referred to as S203 in fig. 2, and is not described herein again.
And S304, the WiFi module of the SDIO interface generates a first feedback instruction, and sends the first feedback instruction to the signal adapter plate.
S305, the signal adapter board converts the first feedback instruction into a second feedback instruction, and sends the second feedback instruction to the PC host, so that the PC host executes the steps of generating the first test instruction, and sending the first test instruction to the signal adapter board.
S304 and S305 are explained below.
The first feedback instruction is used for informing the PC host to generate a test instruction of a next test item, where the test item mainly refers to a radio frequency parameter in the embodiment of the present application. It can be understood that the PC host issues a test instruction of a first radio frequency parameter to the WiFi module of the SDIO interface, and after the WiFi module adjusts the first radio frequency parameter, the WiFi module sends a feedback instruction to the PC host to indicate that the first radio frequency parameter has been adjusted, and can perform a test of a second radio frequency parameter.
Specifically, because first feedback instruction generates at the wiFi module of SDIO interface, be the SDIO signal through SDIO interface transmission, the PC host computer does not have the SDIO interface that can the direct receipt SDIO signal, then need send first feedback instruction to signal transfer board through the SDIO connecting wire to make signal transfer board convert first feedback instruction into the second feedback instruction that can be transmitted by the PCIE interface, second feedback instruction is the PCIE signal. Further, the signal adapter board sends the second feedback instruction to the PC host computer, so that the PC host computer continues to generate the test instruction of the next test item. Furthermore, the PC host can send the test instruction of the next test item to the signal adapter plate again, so that the signal adapter plate continues to convert the test instruction transmitted by the PCIE interface into the test instruction transmitted by the SDIO interface, and the WiFi module of the SDIO interface can sequentially complete the test of each test item. Specifically, the test items of the WiFi module generally refer to radio frequency parameters, which mainly include: the transmission power, the error vector magnitude, and the frequency error may further include: frequency offset template, spectrum flatness, receiving sensitivity, etc. of the transmitted signal. Adjusting the rf parameters of the WiFi module belongs to the technical means known to those skilled in the art, and will not be described herein.
It is understood that after the testing operation of one WiFi module is completed, the switch 460 shown in fig. 4 can be directly turned off, then the next WiFi module is replaced, the switch 460 is turned on, and the above steps are repeated to perform the testing of the next WiFi module. Different from the related art, the test system needs to run in an operating system such as Linux or android, and WiFi modules of SDIO interfaces of different schemes, such as RT8189FT or RTL8821CS, need software engineers to adapt to corresponding WiFi drivers, so that the flexibility of the test system is low.
When the scheme of the embodiment of the application is executed, the scheme is applied to a test system, and the test system comprises a PC (personal computer) host, a signal transfer board and a WiFi (wireless fidelity) module of an SDIO (serial digital input output) interface. Firstly, a touch switch is installed on the signal adapter plate, after line connection of all parts of the test system, the touch switch can be turned on, the PC host generates a test command to test the current WiFi module, after the current WiFi module is tested, the touch switch can be turned off, the next WiFi module is replaced to test, and the method and the device are repeated in cycles, so that hot plugging of the WiFi module can be realized, and the PC host does not need to be turned on and off repeatedly. In addition, this application embodiment is different from prior art, need not to set up complicated test environment, this application realizes the interconversion between SDIO signal and PCIE signal through using the signal keysets to the PC host computer can calibrate the radio frequency parameter of the wiFi module of SDIO interface, convenient operation can circulate the test, thereby can reduce test time, improve efficiency of software testing, more need not develop the driver to each wiFi module, can improve the compatibility of wiFi module test.
A test system provided by the embodiment of the present application will be described in detail below with reference to fig. 6. It should be noted that the test system shown in fig. 6 is used for executing the test method of the embodiment shown in fig. 3 of the present application, and for convenience of description, only the portion related to the embodiment of the present application is shown, and details of the specific technology are not disclosed, please refer to the embodiment shown in fig. 3 of the present application.
Referring to fig. 6, fig. 6 is a schematic structural diagram of a test system 600 according to an embodiment of the present disclosure. As shown in fig. 6, the system includes: PC host 610, signal transfer board 620 and the wiFi module 630 of SDIO interface, wherein:
the PC host 610 is configured to generate a first test instruction when detecting an installation signal of a WiFi module of the SDIO interface, and send the first test instruction to the signal adapter board;
the signal adapter board 620 is configured to convert the first test instruction into a second test instruction, and send the second test instruction to the WiFi module of the SDIO interface;
the WiFi module 630 of the SDIO interface is configured to test the test items in the WiFi module of the SDIO interface based on the second test instruction.
Optionally, when the signal adapter board 620 is configured to convert the first test instruction into a second test instruction, the signal adapter board is specifically configured to:
and converting the first test instruction into a second test instruction through a signal switching chip, wherein the first test instruction is a test instruction of a PCIE signal, and the second test instruction is a test instruction of an SDIO signal.
Optionally, after the WiFi module 630 of the SDIO interface is configured to test the test items in the WiFi module of the SDIO interface based on the second test instruction, the WiFi module of the SDIO interface is further configured to:
generating a first feedback instruction, and sending the first feedback instruction to the signal adapter plate;
and converting the first feedback instruction into a second feedback instruction, and sending the second feedback instruction to the PC host, so that the PC host executes the steps of generating the first test instruction and sending the first test instruction to the signal adapter plate.
Optionally, when the signal adapter board 620 is configured to convert the first feedback instruction into a second feedback instruction, the signal adapter board is specifically configured to:
the signal adapter plate converts the first feedback instruction into a second feedback instruction through a signal adapter chip, the first feedback instruction is a feedback instruction of an SDIO signal, and the second feedback instruction is a feedback instruction of a PCIE signal.
Optionally, when the PC host 610 is configured to send the first test instruction to the signal adapter board, it is specifically configured to:
and sending the first test instruction to the signal adapter plate through the PCIE interface.
Optionally, when the signal adapting board 620 is configured to send the second test instruction to the WiFi module of the SDIO interface, the signal adapting board is specifically configured to:
and sending the second test instruction to a WiFi module of the SDIO interface through an SDIO connecting line, wherein the SDIO connecting line is the connecting line with equal length and equal width.
Optionally, when the WiFi module 630 of the SDIO interface is used to test the test items in the WiFi module of the SDIO interface based on the second test instruction, the WiFi module is specifically used to:
and testing the radio frequency parameters in the WiFi module of the SDIO interface based on the second test instruction.
The scheme of this application embodiment is when carrying out, is applied to test system, test system includes the wiFi module of PC host computer, signal transfer board and SDIO interface, works as when the installation signal of the wiFi module of SDIO interface is detected to the PC host computer, generates first test instruction, and will first test instruction send to the signal transfer board, the signal transfer board will first test instruction converts the second test instruction into, and will second test instruction send to the wiFi module of SDIO interface, the wiFi module of SDIO interface is based on the second test instruction is right the radio frequency parameter in the wiFi module of SDIO interface tests. Through the method, when the WiFi module of the SDIO interface is tested, complex test environment in the related technology does not need to be built, the signal transfer board is connected with the WiFi module of the PC host and the SDIO interface, the radio frequency parameters of the WiFi module of the SDIO interface can be directly calibrated and tested on the PC host, and the test efficiency of the WiFi module of the SDIO interface can be improved.
The present application also provides a computer-readable storage medium having stored thereon a computer program which, when executed by a processor, performs the steps of the above-described method. The computer-readable storage medium may include, but is not limited to, any type of disk including floppy disks, optical disks, DVDs, CD-ROMs, microdrive, and magneto-optical disks, ROMs, RAMs, EPROMs, EEPROMs, DRAMs, VRAMs, flash memory devices, magnetic or optical cards, nanosystems (including molecular memory ICs), or any type of media or device suitable for storing instructions and/or data.
It should be noted that, for simplicity of description, the above-mentioned method embodiments are described as a series of acts or combination of acts, but those skilled in the art will recognize that the present application is not limited by the order of acts described, as some steps may occur in other orders or concurrently depending on the application. Further, those skilled in the art should also appreciate that the embodiments described in the specification are preferred embodiments and that the acts and modules referred to are not necessarily required in this application.
In the foregoing embodiments, the descriptions of the respective embodiments have respective emphasis, and for parts that are not described in detail in a certain embodiment, reference may be made to related descriptions of other embodiments.
In the several embodiments provided in the present application, it should be understood that the disclosed apparatus may be implemented in other manners. For example, the above-described embodiments of the apparatus are merely illustrative, and for example, a division of a unit is merely a logical division, and an actual implementation may have another division, for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed coupling or direct coupling or communication connection between each other may be through some service ports, indirect coupling or communication connection of devices or units, and may be electrical or in other forms.
Units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional units in the embodiments of the present application may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit can be realized in a form of hardware, and can also be realized in a form of a software functional unit.
The integrated unit, if implemented in the form of a software functional unit and sold or used as a stand-alone product, may be stored in a computer readable memory. Based on such understanding, the technical solutions of the present application, which are essential or part of the technical solutions contributing to the prior art, or all or part of the technical solutions, may be embodied in the form of a software product, which is stored in a memory and includes several instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to execute all or part of the steps of the methods of the embodiments of the present application. And the aforementioned memory comprises: various media capable of storing program codes, such as a usb disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a removable hard disk, a magnetic disk, or an optical disk.
Those skilled in the art will appreciate that all or part of the steps in the methods of the above embodiments may be implemented by a program which instructs associated hardware to perform the steps, and the program may be stored in a computer readable memory, and the memory may include: flash disks, read-Only memories (ROMs), random Access Memories (RAMs), magnetic or optical disks, and the like.
The above are merely exemplary embodiments of the present disclosure, and the scope of the present disclosure should not be limited thereby. It is intended that all equivalent variations and modifications made in accordance with the teachings of the present disclosure be covered thereby. Embodiments of the present disclosure will be readily apparent to those skilled in the art from consideration of the specification and practice of the disclosure herein. This application is intended to cover any variations, uses, or adaptations of the disclosure following, in general, the principles of the disclosure and including such departures from the present disclosure as come within known or customary practice within the art to which the disclosure pertains. It is intended that the specification and examples be considered as exemplary only, with a true scope and spirit of the disclosure being indicated by the following claims.

Claims (10)

1. A test method is applied to a test system, the test system comprises a PC host, a signal adapter plate and a wireless fidelity module of a secure digital input and output interface, and the method is characterized by comprising the following steps:
when the PC host detects an installation signal of a wireless fidelity module of a secure digital input/output interface, generating a first test instruction, and sending the first test instruction to the signal adapter plate;
the signal adapter plate converts the first test instruction into a second test instruction and sends the second test instruction to the wireless fidelity module of the safe digital input/output interface;
and the wireless fidelity module of the safe digital input and output interface tests the test items in the wireless fidelity module of the safe digital input and output interface based on the second test instruction.
2. The method of claim 1, wherein the signal patch panel converts the first test command into a second test command, comprising:
the signal adapter board converts the first test instruction into a second test instruction through a signal adapter chip, the first test instruction is a test instruction of a standard signal of a high-speed serial computer expansion bus, and the second test instruction is a test instruction of a safe digital input/output signal.
3. The method of claim 1, wherein after the testing the test item in the wireless fidelity module of the sdo interface based on the second test instruction, the method further comprises:
the wireless fidelity module of the safe digital input and output interface generates a first feedback instruction and sends the first feedback instruction to the signal adapter plate;
and the signal adapter plate converts the first feedback instruction into a second feedback instruction, and sends the second feedback instruction to the PC host, so that the PC host executes the steps of generating the first test instruction and sending the first test instruction to the signal adapter plate.
4. The method of claim 3, wherein the signal patch panel converts the first feedback instruction to a second feedback instruction, comprising:
the signal adapter plate converts the first feedback instruction into a second feedback instruction through a signal adapter chip, the first feedback instruction is a feedback instruction of a safe digital input/output signal, and the second feedback instruction is a feedback instruction of a standard signal of a high-speed serial computer expansion bus.
5. The method of claim 1, wherein sending the first test command to the signal patch panel by the PC host comprises:
and the PC host sends the first test instruction to the signal adapter plate through a high-speed serial computer expansion bus standard interface.
6. The method of claim 1, wherein the signal patch panel sends the second test command to a wireless fidelity module of the sdvo interface, comprising:
and the signal adapter plate sends the second test instruction to the wireless fidelity module of the safe digital input and output interface through a safe digital input and output connecting line, and the safe digital input and output connecting line is a connecting line with equal length and equal width.
7. The method of claim 1, wherein the testing the test items in the wireless fidelity module of the secure digital input output interface based on the second test instruction comprises:
and the wireless fidelity module of the safe digital input/output interface tests the radio frequency parameters in the wireless fidelity module of the safe digital input/output interface based on the second test instruction.
8. A test system, the test system comprising: the system comprises a PC host, a signal adapter plate and a wireless fidelity module of a safe digital input/output interface;
the PC host is used for generating a first test instruction when detecting an installation signal of a wireless fidelity module of the safe digital input/output interface and sending the first test instruction to the signal adapter plate;
the signal adapter plate is used for converting the first test instruction into a second test instruction and sending the second test instruction to the wireless fidelity module of the safe digital input/output interface;
and the wireless fidelity module of the safe digital input/output interface is used for testing the test items in the wireless fidelity module of the safe digital input/output interface based on the second test instruction.
9. The system of claim 8, wherein the wifi module of the sdvo interface is further configured to generate a first feedback command and send the first feedback command to the signal adapter board;
the signal adapter plate is further configured to convert the first feedback instruction into a second feedback instruction, and send the second feedback instruction to the PC host, so that the PC host executes the step of generating the first test instruction, and sends the first test instruction to the signal adapter plate.
10. The system of claim 8, wherein the PC host is further configured to send the first test command to the signal patch panel via a high speed serial computer expansion bus standard interface.
CN202110787009.1A 2021-07-12 2021-07-12 Test method and test system Pending CN115622637A (en)

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