CN115599037B - Automatic monitoring method for gene detection laboratory equipment - Google Patents
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Abstract
The invention provides an automatic monitoring method for gene detection laboratory equipment, which belongs to the technical field of automatic monitoring, and is used for acquiring running state monitoring data of the laboratory equipment in real time, measuring sensing data of the environment of the laboratory equipment and acquiring adjustment parameters of operators on each laboratory equipment; monitoring the operation times and the operation duration of the laboratory equipment by an operator as operation parameters; making the operating state monitoring data and the sensing data into operating state monitoring data variation curves over time and sensing data variation curves over time; respectively calculating curvatures of the two curves at different moments, calculating a curvature difference sequence according to the curvatures at different moments, and defining the moment higher than a threshold difference in the curvature difference sequence as a data abnormal time period; and correcting abnormal data, and calculating whether the corrected expected state of the laboratory equipment meets the expectation or not, so that the judgment accuracy of the abnormal data and the abnormal data time interval and the feedback adjustment of the abnormality of the laboratory equipment are improved.
Description
Technical Field
The invention relates to the technical field of automatic monitoring, in particular to an automatic monitoring method for gene detection laboratory equipment.
Background
With the increasing popularity of computer applications, laboratory data management systems have also entered a rapid development phase. Particularly, when a gene detection experiment is performed, various environmental parameters are usually recorded and an experiment report is filled in, and the experiment report needs to be stored for a long time, so that whether the laboratory conditions are suitable for developing the current biological experiment is judged according to the information of the various environmental parameters. Various environmental parameters can also be adjusted using the environmental parameter adjusting device, for example, the temperature of a laboratory can be measured using the temperature measuring device, the humidity of the laboratory can be measured using the humidity measuring device, the ultraviolet light intensity of the laboratory can be measured using the ultraviolet light measuring device, then the temperature of the laboratory can be adjusted using the temperature parameter adjusting device, the humidity of the laboratory can be adjusted using the humidity parameter adjusting device, and the ultraviolet light intensity of the laboratory can be adjusted using the ultraviolet light parameter adjusting device. Various environmental parameter measurement devices are capable of providing various valuable reference data for various operations.
The existing laboratory data management system is generally designed based on the traditional experimental process and by adopting a C/S framework, so that the system cannot meet the correlation between the experimental link and the analysis link, and further cannot meet the function of automatically generating a detection report according to a second-generation sequencing result in gene detection. Moreover, the development of the system based on the C/S architecture focuses on the client software, but the existing large and small hospitals and clinics are in a large number, so the existing laboratory data management system needs to install a large number of client software, which may cause the following problems: firstly, the client software is high in installation difficulty and high in cost for the first time; secondly, the gene detection technology is rapidly developed at present, and the corresponding system is updated and updated quickly, so that the client software needs to be updated and upgraded frequently, which obviously needs higher time cost and economic cost. In addition, many information in the gene detection process needs to be managed in a unified way and even needs to be operated in a coordinated way, but the clients based on the C/S architecture are independent from each other, and data can be managed in a unified way only by synchronizing the data to the server, so that the information sharing degree of the laboratory management system based on the C/S architecture is not high, and the laboratory management system based on the C/S architecture is not convenient to manage in a unified way.
Meanwhile, the fault diagnosis is to analyze and judge according to the information obtained from the operation process of the instrument and equipment to determine whether the instrument and equipment have faults and cause the faults. Along with the development of science and technology, the degree of automation of the structure and the system of the existing instrument and equipment is more and more complicated, the possibility that the instrument and equipment breaks down is increased, meanwhile, the control and the detection of the faults of the instrument and equipment are more and more difficult, and the fault detection problem of the instrument and equipment is more and more emphasized by experimenters because the loss caused by the faults of the instrument and equipment is more and more large. However, because the existing instruments and equipment have high integration and complex structures, manual detection is generally needed during fault diagnosis, and diagnosis errors are easy to occur.
Disclosure of Invention
In order to solve the technical problem, the invention provides an automatic monitoring method for gene detection laboratory equipment, which comprises the following steps:
s1, acquiring running state monitoring data of laboratory equipment in real time, measuring sensing data of a laboratory equipment environment, and monitoring an operation screen of each laboratory equipment by using a camera unit to acquire adjustment parameters of an operator on each laboratory equipment;
s2, monitoring the operation times and the operation duration of the laboratory equipment by an operator as operation parameters;
s3, making the running state monitoring data and the sensing data into a running state monitoring data time-varying curve X1 and a sensing data time-varying curve X2;
s4, respectively calculating curvatures of the state monitoring data changing curve X1 along with time and the sensing data changing curve X2 along with time at different moments, respectively calculating curvature difference value sequences according to the curvatures at the different moments on each curve, extracting abnormal curvature difference values higher than a threshold difference value, determining that two curvatures forming the abnormal curvature difference values respectively correspond to two moments on the state monitoring data changing curve X1 along with time and two moments on the sensing data changing curve X2 along with time, respectively defining a time period between the two moments on each changing curve as a data abnormal period, and then defining data corresponding to the data abnormal period in each changing curve as abnormal data;
and S5, correcting the abnormal data, and calculating whether the corrected expected state of the laboratory equipment meets the expectation.
Further, in step S4, the step of,
respectively calculating curvatures V of the two curves at different time, calculating a curvature difference value sequence delta V according to the curvatures V at different time, and using V = { V = i I =1,2, …, n } denotes a plurality of different time instants, V i Representing curvature data at time i, the power difference sequence is defined as follows:
ΔV＝{V i+1 -V i ,i＝1,2,…,n-1}。
further, in step S5,
if the abnormal data periods appearing in the two curves are both in the same time period, the internal circuit or the external environment of the corresponding laboratory equipment needs to be corrected according to the abnormal sensing data;
if only the data abnormal time interval appears in the curve X1, the operation parameters corresponding to the data abnormal time interval need to be extracted, whether the operator finds and carries out the correction operation in time or not is judged, and the operation screen monitored by the camera unit during the operation is extracted, and whether the adjustment parameters are correct or not is judged.
Further, the abnormal state appearing in the curve X1 in the current data abnormal time period is set as s, and the corresponding adopted adjusting parameter in the data abnormal time period is set as
The desired state obtained by the curve X1 at this setting of the adjustment parameter is Q:
Further, the parameters are learned
To satisfy 0 ≦ ->
Constant less than or equal to 1.
Further, an internal circuit or an external environment of the laboratory device is measured with the sensor unit to sense a specific signal, forming sensing data.
Further, the sensor unit comprises a noise measuring sensor for measuring noise, a temperature measuring sensor for measuring temperature, a vibration measuring sensor for measuring vibration, a motion measuring sensor for measuring motion.
Compared with the prior art, the invention has the following technical effects:
acquiring running state monitoring data of the laboratory equipment in real time, measuring sensing data of the environment of the laboratory equipment, and acquiring adjusting parameters of operators on each laboratory equipment; monitoring the operation times and the operation duration of the laboratory equipment by an operator as operation parameters; original monitoring data are formed by multiple dimensions, so that the subsequent judgment process is more accurate; the operation state monitoring data and the sensing data are made into a time variation curve of the operation state monitoring data, and the abnormal time period of the data is judged through the sudden change of the curvature difference value sequence, so that the judgment accuracy of the abnormal data and the abnormal time period of the data is improved; and correcting abnormal data, and calculating whether the corrected expected state of the laboratory equipment meets the expectation or not, thereby realizing the feedback adjustment of the monitoring system.
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In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without inventive labor.
FIG. 1 is a schematic diagram of an automated monitoring system for equipment according to the present invention;
FIG. 2 is a schematic view of the structure of the facility monitoring apparatus of the present invention;
FIG. 3 is a diagram of a monitoring processor according to the present invention;
fig. 4 is a flow chart of the automatic monitoring method of the equipment of the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present application clearer, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are some embodiments of the present application, but not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present application.
In the drawings of the embodiments of the present invention, in order to better and more clearly describe the working principle of each element in the system, the connection relationship of each part in the apparatus is shown, only the relative position relationship between each element is clearly distinguished, and the restriction on the signal transmission direction, the connection sequence, and the size, the dimension, and the shape of each part structure in the element or structure cannot be formed.
FIG. 1 is a schematic structural diagram of an automated monitoring system for gene testing laboratory equipment according to an embodiment of the present invention, the automated monitoring system comprising: the device comprises an equipment monitoring device, an operation monitoring device, a monitoring processor, a display device and a management terminal.
The device monitoring device is installed in each laboratory device in the automation process and is used for monitoring the operation state of the laboratory device in real time, generating operation state monitoring data, measuring sensing data of the laboratory device and acquiring adjusting parameters of an operator to each laboratory device. Preferably, the device monitoring apparatus can be implemented by using a PLC device using a ladder diagram as a programming language.
Fig. 2 is a schematic structural diagram of an apparatus monitoring device according to an embodiment of the present invention, which includes an apparatus state acquisition unit, a camera unit, and a sensor unit.
The device state acquisition unit is used for acquiring operation state monitoring data of each laboratory device in an automation process, and the sensor unit is used for measuring an internal circuit or an external environment of the laboratory device to sense a specific signal to form sensing data. For example, the sensor unit includes a noise measurement sensor for measuring noise, a temperature measurement sensor for measuring temperature, a vibration measurement sensor for measuring vibration, a motion measurement sensor for measuring motion, and the like. The camera unit is used for monitoring an operation screen of each laboratory device so as to acquire adjustment parameters of each laboratory device by an operator.
The operation monitoring device is used for monitoring operation parameters such as the operation times, the operation duration and the like of the laboratory equipment by an operator.
The monitoring processor is configured to include an apparatus state analysis unit, a person state analysis unit, and an abnormal state determination unit. FIG. 3 is a diagram illustrating an exemplary monitoring processor according to the present invention.
The equipment state analysis unit is used for collecting data from the equipment monitoring device and analyzing the equipment state. The collected data includes operational state monitoring data, sensing data. The personnel state analysis unit is used for collecting operation parameters from the operation monitoring device and analyzing the operation condition of the operator. The operation parameters include the number of operations and the operation time length.
The device state analyzing unit creates the collected data as time-varying curves, i.e., a running state monitoring data time-varying curve X1 and a sensing data time-varying curve X2, respectively.
Respectively calculating curvatures V of the two curves at different moments, calculating a curvature difference value sequence delta V according to the curvatures V at different moments, and using V = { V = { (V) i I =1,2, …, n } denotes a plurality of different time instants, V i Representing curvature data at time i, the power difference sequence is defined as follows:
ΔV＝{V i+1 -V i ,i＝1,2,…,n-1}；
and extracting the abnormal curvature difference value which is higher than the threshold difference value, determining two corresponding moments on the change curve of the two curvatures forming the abnormal curvature difference value, defining a time period between the two moments as a data abnormal time period, and taking the data corresponding to the data abnormal time period in the curve as abnormal data.
If the abnormal periods of data appearing in the two curves are both within the same time period, the internal circuit or external environment of the corresponding laboratory equipment needs to be corrected according to the abnormal sensing data.
If only the data abnormal time interval appears in the curve X1, the operation parameters corresponding to the data abnormal time interval need to be extracted, whether the operator finds the data abnormal time interval in time and carries out correction operation or not is judged, and whether the adjustment parameters are correct or not is judged by extracting an operation screen monitored by the camera unit during operation.
Specifically, the abnormal state appearing in the curve X1 in the current data abnormal period is set as s, and the corresponding adjustment parameter adopted in the data abnormal period is set as s
The desired state obtained by the curve X1 at this setting of the adjustment parameter is Q:
The display device is used for displaying the data abnormal time periods appearing in the two curves, and feeding back the internal circuit or the external environment of the laboratory equipment needing to be corrected or the adjusting parameters needing to be corrected through the management terminal.
In a preferred embodiment, the monitoring processor may comprise a computer processor running software that enables control and monitoring of the operating conditions of the laboratory equipment and the respective various operating parameters. For example, the monitoring processor may alter the power supply settings of a single laboratory device by analyzing the input parameters. The monitoring processor may use control mechanisms known in the art to maintain or adjust plant parameters and experimental variables. The monitoring processor may be configured to automatically monitor and record experimental variables and allow an operator to automatically change set points of the equipment in the laboratory equipment. For example, the monitoring processor may allow an operator to specify a power level to be provided to the laboratory device by the software, turn the laboratory device on and off by the software, or allow the operator to set when to turn the laboratory device on and off at predetermined time intervals. The controller may also allow the operator to set experimental conditions that will turn the laboratory device on or off. The monitoring processor may be configured to run software that records experimental data in a database or spreadsheet format, for example, that allows an operator to access and analyze the recorded data.
FIG. 4 is a schematic flow chart of an automated monitoring method for gene testing laboratory equipment according to an embodiment of the present invention, the automated monitoring method comprises the following steps:
s1, acquiring running state monitoring data of the laboratory equipment in real time, measuring sensing data of the environment of the laboratory equipment, and acquiring adjustment parameters of each laboratory equipment by an operator.
And S2, monitoring the operation times and the operation duration of the laboratory equipment by the operator as operation parameters.
And S3, manufacturing the running state monitoring data and the sensing data into a running state monitoring data time-varying curve X1 and a sensing data time-varying curve X2.
S4, respectively calculating curvatures of the two curves at different moments, calculating a curvature difference value sequence according to the curvatures at the different moments, extracting an abnormal curvature difference value higher than a threshold difference value, determining two moments corresponding to the two curvatures forming the abnormal curvature difference value on a change curve, defining a time period between the two moments as a data abnormal time period, and determining data corresponding to the data abnormal time period in the curve as abnormal data.
Specifically, curvatures V at different times of the two curves are calculated respectively, and a curvature difference value sequence Δ V is calculated from the curvatures V at the different times, with V = { V = { i I =1,2, …, n } denotes a plurality of different time instants, V i Representing curvature data at time i, the power difference sequence is defined as follows:
ΔV＝{V i+1 -V i ,i＝1,2,…,n-1}。
and S5, correcting the abnormal data, and calculating whether the corrected expected state of the laboratory equipment is in accordance with expectation.
If the abnormal periods of data appearing in the two curves are both within the same time period, the internal circuit or external environment of the corresponding laboratory equipment needs to be corrected according to the abnormal sensing data.
If only the data abnormal time interval appears in the curve X1, the operation parameters corresponding to the data abnormal time interval need to be extracted, whether the operator finds and carries out the correction operation in time or not is judged, and the operation screen monitored by the camera unit during the operation is extracted, and whether the adjustment parameters are correct or not is judged.
Setting the abnormal state appearing in the curve X1 at the current data abnormal time interval as s, and correspondingly adopting the adjusting parameters at the data abnormal time interval as
The desired state obtained by the curve X1 at this setting of the adjustment parameter is Q:
The method comprises the steps of acquiring running state monitoring data of the laboratory equipment in real time, measuring sensing data of the environment of the laboratory equipment, and acquiring adjustment parameters of operators on each laboratory equipment; monitoring the operation times and the operation duration of the laboratory equipment by an operator as operation parameters; original monitoring data are formed by multiple dimensions, so that the subsequent judgment process is more accurate; the operation state monitoring data and the sensing data are made into a time variation curve of the operation state monitoring data, and the abnormal time period of the data is judged through the sudden change of the curvature difference value sequence, so that the judgment accuracy of the abnormal data and the abnormal time period of the data is improved; and correcting abnormal data, and calculating whether the corrected expected state of the laboratory equipment meets the expectation or not, thereby realizing the feedback adjustment of the monitoring system.
In the above embodiments, the implementation may be wholly or partially realized by software, hardware, firmware, or any combination thereof. When implemented in software, may be implemented in whole or in part in the form of a computer program product. The computer program product includes one or more computer instructions. When loaded and executed on a computer, cause the processes or functions described in accordance with the embodiments of the application to occur, in whole or in part. The computer may be a general purpose computer, a special purpose computer, a network of computers, or other programmable device. The computer instructions may be stored in or transmitted over a computer-readable storage medium. The computer-readable storage medium can be any available medium that can be accessed by a computer or a data storage device, such as a server, a data center, etc., that incorporates one or more of the available media. The usable medium may be a magnetic medium (e.g., floppy disk, hard disk, magnetic tape), an optical medium (e.g., DVD), or a semiconductor medium (e.g., solid State Disk (SSD)), among others.
While the invention has been described with reference to specific embodiments, the scope of the invention is not limited thereto, and those skilled in the art can easily conceive various equivalent modifications or substitutions within the technical scope of the invention. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (5)
1. An automatic monitoring method for gene detection laboratory equipment is characterized by comprising the following steps:
s1, acquiring running state monitoring data of laboratory equipment in real time, measuring sensing data of a laboratory equipment environment, and monitoring an operation screen of each laboratory equipment by using a camera unit to acquire adjustment parameters of an operator on each laboratory equipment;
s2, monitoring the operation times and the operation duration of the laboratory equipment by an operator as operation parameters;
s3, making the running state monitoring data and the sensing data into a running state monitoring data time-varying curve X1 and a sensing data time-varying curve X2;
s4, respectively calculating curvatures of the state monitoring data change-over-time curve X1 and the sensing data change-over-time curve X2 at different moments, respectively calculating a curvature difference value sequence according to the curvatures of the different moments on each curve, extracting abnormal curvature difference values higher than a threshold difference value, determining two curvatures forming the abnormal curvature difference values, respectively corresponding to two moments on the state monitoring data change-over-time curve X1 and two moments on the sensing data change-over-time curve X2, respectively defining a time period between the two moments on each change curve as a data abnormal time period, and then, respectively defining data corresponding to the data abnormal time period in each change curve as abnormal data; respectively calculating curvatures V of the two curves at different time, calculating a curvature difference value sequence delta V according to the curvatures V at different time, and using V = { V = i I =1,2, …, n } denotes a plurality of different time instants, V i Representing curvature data at time i, the power difference sequence is defined as follows:
ΔV＝{V i+1 -V i ,i＝1,2,…,n-1}；
s5, correcting the abnormal data, and calculating whether the corrected expected state of the laboratory equipment meets the expectation;
if the abnormal time periods of the data appearing in the two curves are both in the same time period, the internal circuit or the external environment of the corresponding laboratory equipment needs to be corrected according to the abnormal sensing data;
if only the data abnormal time interval appears in the curve X1, the operation parameters corresponding to the data abnormal time interval need to be extracted, whether the operator finds the data abnormal time interval in time and carries out correction operation or not is judged, and whether the adjustment parameters are correct or not is judged by extracting an operation screen monitored by the camera unit during operation.
2. The automatic equipment monitoring method according to claim 1, wherein the abnormal state occurring in the curve X1 in the current data abnormal period is set as s, the corresponding adopted adjusting parameter in the data abnormal period is set as a, and the expected state obtained by the curve X1 under the setting of the adjusting parameter is set as Q:
3. The method of automated equipment monitoring according to claim 2, wherein the learning parameter γ is a constant satisfying 0 ≦ γ ≦ 1.
4. The method for automated monitoring of equipment according to claim 1, wherein the sensing data is formed by measuring an internal circuit or an external environment of the laboratory equipment using a sensor unit to sense a specific signal.
5. The method for automated monitoring of equipment according to claim 4, wherein the sensor unit comprises a noise measurement sensor for measuring noise, a temperature measurement sensor for measuring temperature, a vibration measurement sensor for measuring vibration, a motion measurement sensor for measuring motion.
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Address after: 150000 east side of floor 5, A10 building, China Cloud valley software park, No. 9, Songhua Road, haping road concentration area, economic development zone, Harbin, Heilongjiang Province Patentee after: Xingyun Gene Technology Co.,Ltd. Address before: 150000 east side of floor 5, A10 building, China Cloud valley software park, No. 9, Songhua Road, haping road concentration area, economic development zone, Harbin, Heilongjiang Province Patentee before: Harbin Xingyun medical laboratory Co.,Ltd. |
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