CN115547215B

CN115547215B - Display screen ESD soft reset method, electronic equipment and computer storage medium

Info

Publication number: CN115547215B
Application number: CN202210427074.8A
Authority: CN
Inventors: 董帅帅; 杨曦; 刘奕; 李磊; 吴晓
Original assignee: Honor Device Co Ltd
Current assignee: Honor Device Co Ltd
Priority date: 2022-04-21
Filing date: 2022-04-21
Publication date: 2023-06-20
Anticipated expiration: 2042-04-21
Also published as: CN115547215A

Abstract

The application provides a display screen ESD soft reset method which is applied to electronic equipment. The electronic device comprises a display screen and a processor, wherein the display screen comprises a display panel and a driving chip. The driving chip comprises a first type of register which is interfered by signal transmission and electrostatic discharge. The display screen ESD soft reset method comprises the following steps: the driving chip detects whether the high level and the low level of the first type register change. When the high level and the low level of the first type register change, the display panel judges whether the current capacitance value of the display panel rises and reaches a preset capacitance value, and the processor judges whether the direction of the electronic equipment is a preset direction. When the capacitance value of the display panel is judged to rise and reaches a preset capacitance value and the direction of the electronic equipment is a preset direction, the processor controls the display screen to carry out ESD soft reset. The display screen ESD soft reset method can reduce the probability of false triggering of the ESD soft reset and improve user experience. The application also provides electronic equipment and a computer storage medium.

Description

Display screen ESD soft reset method, electronic equipment and computer storage medium

Technical Field

The present disclosure relates to the field of electronic technologies, and in particular, to a display screen ESD soft reset method, an electronic device, and a computer storage medium.

Background

The display screen is an important device of the electronic apparatus. In some scenes (for example, a user scene or a test scene), an instantaneous high voltage is generated due to electrostatic Discharge (ESD), which easily causes a signal error transmitted from a system chip of the electronic device to the display screen, or a driving chip in the display screen is in an abnormal working state, so that the display screen displays an abnormality. In order to cope with the display abnormality of the display screen, it is generally required to start the ESD soft reset method of the display screen, that is, to reset the display screen to be powered down and powered up again, so as to eliminate the abnormality.

In the traditional display screen ESD soft reset method at present, the detection condition is single. For example, an ESD soft reset may be initiated upon detection of a change or abnormality in the state of a register driving the chip. However, since the number and types of registers driving the chip are large, the causes of the state change or abnormality of the different types of registers may be different in general. Therefore, if the display screen ESD soft reset method is adopted for different types of registers, the probability of false triggering of the ESD soft reset is increased, so that abnormal display occurs when the electronic equipment is normally used, and poor use experience is brought to users.

Disclosure of Invention

In view of the foregoing, it is necessary to provide a display screen ESD soft reset method, an electronic device and a computer storage medium, so as to reduce the probability of false triggering of ESD soft reset, and better enhance the user experience.

In a first aspect, an embodiment of the present application provides a display screen ESD soft reset method, which is applied to an electronic device. The electronic device includes a display screen and a processor. The display screen comprises a display panel and a driving chip. The driver chip includes a first type of register. The first type of register is a register that is subject to signal transmission disturbances and electrostatic discharge disturbances. The display screen ESD soft reset method comprises the following steps: the driving chip detects whether the high level and the low level of the first type register change. When the change of the high level and the low level of the first type register is detected, the display panel judges whether the current capacitance value of the display panel rises and reaches a preset capacitance value, and the processor judges whether the direction of the electronic equipment is a preset direction. When the capacitance value of the display panel is judged to rise and reach the preset capacitance value and the direction of the electronic equipment is the preset direction, the processor controls the display screen to carry out ESD soft reset. Obviously, in the first aspect of the present application, the display screen ESD soft reset method is applicable to the first type of register. Specifically, when the change of the high level and the low level of the first type register is detected, whether the current capacitance value of the display panel rises and reaches a preset capacitance value or not and whether the direction of the electronic equipment is the preset direction or not are judged, and whether the electronic equipment is in a test scene or a user scene or not is judged, so that whether ESD soft reset is conducted or not is further determined. When the two judging conditions are met at the same time, it can be judged that the electronic equipment is in a test scene, and the first type of registers are subjected to electrostatic interference, so that the possibility of state change or abnormality is high, and the electronic equipment is required to be subjected to electrostatic soft reset to eliminate the electrostatic interference. When any one of the two judging conditions is not met, the electronic equipment can be judged to be in a user scene, and the condition that the first type of registers are interfered by signal transmission to cause state change or abnormality is high in probability, so that the electronic equipment does not need to be subjected to ESD soft reset, the probability of false triggering of the ESD soft reset can be effectively reduced, and the user experience is better improved.

In one possible design, the processor controlling the ESD soft reset of the display screen includes: the processor controls the power-down preset time of the driving chip, and the driving chip starts to power down. After the preset time of power-down, the display panel continuously judges whether the capacitance value of the display panel rises and reaches the preset capacitance value or the processor continuously judges whether the direction of the electronic equipment is the preset direction. And when the capacitance value of the display panel is judged not to reach the preset capacitance value or the direction of the electronic equipment is not the preset direction, the processor controls the drive chip to be powered on and reset. Obviously, in the process of controlling the powering-down of the driving chip, whether the electronic equipment is still in a test scene is judged by judging whether the capacitance value of the display panel rises and reaches a preset capacitance value or whether the direction of the electronic equipment is a preset direction. When the capacitance value of the display panel is judged to not reach the preset capacitance value or the direction of the electronic equipment is not the preset direction, the electronic equipment is not in the test scene any more, so that the driving chip can be powered down and powered up to realize the ESD soft reset of the display screen, and the interference of static electricity generated by the static gun in the test scene on the display screen is effectively eliminated.

In one possible design, when it is determined that the capacitance value of the display panel is still a preset capacitance value or the direction of the electronic device is still a preset direction, the ESD soft reset method for the display screen further includes: and the processor controls the driving chip to continue to be powered down until the display screen is closed. Obviously, in the design, when the capacitance value of the display panel is still a preset capacitance value or the direction of the electronic device is still a preset direction, the electronic device is still in the test scene. At this time, the driving chip can be controlled by the processor to continue to be powered down until the display screen is closed. Therefore, after the driving chip is powered down, the first type register cannot change or be abnormal due to static interference generated by the static gun, and further cannot interfere with other static tests of the electronic equipment, namely, the first type register is favorable for carrying out other static tests on the electronic equipment.

In one possible design, when it is determined that the capacitance value of the display panel increases and reaches the preset capacitance value, and the direction of the electronic device is the preset direction, the ESD soft reset method for the display screen further includes: the processor reduces the voltage value of the driving chip to a preset voltage value; the display panel continuously judges whether the capacitance value of the display panel rises and reaches a preset capacitance value or the processor continuously judges whether the direction of the electronic equipment is a preset direction; when the capacitance value of the display panel is still a preset capacitance value or the direction of the electronic equipment is still a preset direction, the processor controls the voltage value of the driving chip to be maintained at the preset voltage value. Obviously, in a test scenario, when static electricity is discharged to an electronic device placed on a test bench through a static electricity generating device (for example, a static electricity gun), energy discharged by static electricity may cause interference to a pin (for example, an AVDD pin) of a driving chip, and a voltage withstand condition of the AVDD pin may cause that the driving chip cannot continue to work normally. For example, when the AVDD pin is not voltage-proof enough, the driving chip may be damaged, thereby affecting the display of the display screen. Therefore, in the design, when the electronic equipment is confirmed to be in a test scene, the voltage value of the driving chip is adjusted, so that the driving chip can be effectively ensured to work normally, and the probability of damaging the driving chip is reduced.

In one possible design, when it is determined that the capacitance value of the display panel does not reach the preset capacitance value or the direction of the electronic device is not the preset direction, the ESD soft reset method for the display screen further includes: the processor adjusts the voltage value of the driving chip to a normal working voltage value. The preset voltage value is smaller than the normal working voltage value. Obviously, in this design, when the voltage value of the driving chip is adjusted to a preset voltage value, the driving chip uses the preset voltage value as the working voltage. At this time, the brightness of the display screen may be slightly lowered or the color display of the display screen may be slightly affected. Therefore, when the electronic equipment is judged not to be in the test scene any more, the voltage value of the driving chip is restored to the normal working voltage value, so that the driving chip can work at the normal working voltage value, and the display screen can display normal brightness and color.

In one possible design, if the high-low level of the first type register is detected to change but the current capacitance value of the display panel does not reach the preset capacitance value, or if the high-low level of the first type register is detected to change but the processor judges that the direction of the electronic device is not the preset direction, the ESD soft reset method of the display screen further includes: the electronic device does not respond to a soft reset. Obviously, when the change of the high and low levels of the first type register is detected, but the current capacitance value of the display panel does not reach the preset capacitance value or the preset direction of the electronic equipment is not the preset direction, the electronic equipment is indicated to be in a user scene. At this time, according to the property of the first type of register, when the first type of register is in a user scene, the probability that the high level and the low level of the first type of register are changed due to the interference of signal transmission is greater than that of the first type of register due to the interference of daily static electricity, so that the first type of register does not need to be subjected to ESD soft reset. Thus, the electronic equipment can not respond, namely does not execute the ESD soft reset, so that the probability of false triggering of the ESD soft reset can be effectively reduced. Or, when detecting that the high level and the low level of the first type register are not changed, the first type register can work normally, so the electronic device does not need to respond.

In one possible design, the driver chip further includes a second type of register, which is a register that is subject to electrostatic discharge. The display screen ESD soft reset method further comprises the following steps: the driving chip detects whether the high level and the low level of the second type register change; when the change of the high level and the low level of the second type register is detected, the processor controls the display screen to carry out ESD soft reset. Obviously, the display screen ESD soft reset method can be applied to the second type of register. According to the nature of the second type of register, it is mainly subject to electrostatic interference, both in the test scenario and in the user scenario. Therefore, when the change of the high level and the low level of the second type register is detected, the steps can be directly executed to carry out ESD soft reset on the display screen so as to eliminate electrostatic interference.

In one possible design, the processor controlling the ESD soft reset of the display screen includes: when detecting that the high level and the low level of the second type register change, the processor controls the power-down preset time of the driving chip, and the driving chip starts to power down. After the power-down preset time, the processor controls the drive chip to be powered on and reset. Obviously, the display screen ESD soft reset method can be applied to the second type of register. According to the nature of the second type of register, it is mainly subject to electrostatic interference, both in the test scenario and in the user scenario. Therefore, when the change of the high level and the low level of the second type register is detected, the steps can be directly executed to carry out ESD soft reset on the display screen so as to eliminate electrostatic interference.

In one possible design, the predetermined direction is the direction of gravity of the display screen. It will be appreciated that in this design, the orientation of the electronic device is consistent with the orientation of the display screen. Correspondingly, the preset direction is the direction of the electronic equipment facing the gravity direction, namely the direction of the display screen facing the gravity direction. In the user scene, when the palm of the user comprehensively touches the display screen, the current capacitance value detected by the display panel also rises and approaches to the preset capacitance value, and although the probability of occurrence of the situation in the user scene is not large, the judgment accuracy is still caused to a certain extent. For another example, in a user scenario, there may be a case where the user turns the electronic device directly downward. Therefore, whether the electronic equipment is in the test scene is further judged by judging whether the direction of the electronic equipment is the preset direction and combining with judging whether the capacitance value of the display panel rises and reaches the preset capacitance value, so that the judgment accuracy is effectively improved.

In one possible design, the first type of register is any one of a mobile industry processor interface MIPI Error register, a MIPI ECC/CRC register, and a Checksum register.

In a second aspect, an embodiment of the present application provides an electronic device, including a display screen and a processor. The display screen comprises a display panel and a driving chip. The driving chip comprises a first type of register which is a register subject to signal transmission interference and electrostatic discharge interference. The driving chip is used for detecting whether the high level and the low level of the first type register change. The display panel is used for judging whether the current capacitance value of the display panel rises and reaches a preset capacitance value when the high and low levels of the first type register change. The processor is used for judging whether the direction of the electronic equipment is a preset direction or not. The processor is also used for controlling the display screen to carry out ESD soft reset when the capacitance value of the display panel rises and reaches a preset capacitance value and the direction of the electronic equipment is a preset direction.

In one possible design, controlling the ESD soft reset of the display screen includes: the processor controls the power-down preset time of the driving chip, and the driving chip starts to power down. After the preset time of power-down, the display panel continuously judges whether the capacitance value of the display panel rises and reaches the preset capacitance value or the processor continuously judges whether the direction of the electronic equipment is the preset direction. When the capacitance value of the display panel is judged not to reach the preset capacitance value or the direction of the electronic equipment is not the preset direction, the processor controls the driving chip to be powered on and reset.

In one possible design, when it is determined that the capacitance value of the display panel is still a preset capacitance value or the direction of the electronic device is still a preset direction, the processor is further configured to control the driving chip to continue to power down until the display screen is turned off.

In one possible design, when the capacitance value of the display panel increases and reaches the preset capacitance value, and the direction of the electronic device is the preset direction, the processor is further configured to: and reducing the voltage value of the driving chip to a preset voltage value, and continuously judging whether the direction of the electronic equipment is the preset direction. The display panel is also used for continuously judging whether the capacitance value of the display panel rises and reaches a preset capacitance value. When the capacitance value of the display panel is still a preset capacitance value or the direction of the electronic device is still a preset direction, the processor is further configured to control the voltage value of the driving chip to be maintained at the preset voltage value.

In one possible design, when the capacitance value of the display panel does not reach the preset capacitance value or the direction of the electronic device is not the preset direction, the processor is further configured to: and regulating the voltage value of the driving chip to a normal working voltage value. The preset voltage value is smaller than the normal working voltage value.

In one possible design, the driver chip further includes a second type of register, which is a register that is subject to electrostatic discharge. The driving chip is also used for detecting whether the high level and the low level of the second type register change. The processor is also used for controlling the display screen to carry out ESD soft reset when the high and low levels of the second type register are detected to change.

In a third aspect, embodiments of the present application provide an electronic device that includes a memory and a processor. The memory is used for storing program instructions. The processor is configured to read the program instructions stored in the memory to implement the display screen ESD soft reset method as in the first aspect and its possible designs.

In a fourth aspect, embodiments of the present application provide a computer storage medium. The computer storage medium has stored therein computer readable instructions. The computer readable instructions when executed by a processor implement the display screen ESD soft reset method of the first aspect and its possible designs.

In addition, the technical effects of the second aspect, the third aspect, and the fourth aspect, and any possible design manners thereof may be referred to the description related to the method of each design in the foregoing method section, which is not repeated herein.

Drawings

Fig. 1 (a) and 1 (b) are schematic diagrams of a C-PHY signal and a D-PHY signal, respectively.

Fig. 2 is a hardware architecture diagram of an electronic device according to an embodiment of the present application.

Fig. 3 is a flowchart of a method for ESD soft reset of a display screen according to an embodiment of the present application.

Fig. 4 is a schematic diagram of an electronic device in a test scenario according to an embodiment of the present application.

Fig. 5 is another flowchart of an ESD soft reset method for a display screen according to an embodiment of the present application.

Fig. 6 is another flowchart of a display screen ESD soft reset method according to an embodiment of the present application.

Fig. 7 is a functional block diagram of an electronic device according to an embodiment of the present application.

Detailed Description

The terms "first" and "second" are used below for descriptive purposes only and are not to be construed as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Thus, a feature defining "a first" or "a second" may explicitly or implicitly include one or more such feature. In describing embodiments of the present application, words such as "exemplary," "or," "such as," and the like are used to mean serving as an example, instance, or illustration. Any embodiment or design described herein as "exemplary" or "for example" should not be construed as preferred or advantageous over other embodiments or designs. Rather, the use of words such as "exemplary," "or," "such as," and the like are intended to present related concepts in a concrete fashion.

Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used in the description of the present application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. It should be understood that, "/" means or, unless otherwise indicated herein. For example, A/B may represent A or B. The term "and/or" in this application is merely an association relationship describing an association object, and means that three relationships may exist. For example, a and/or B may represent: a exists alone, A and B exist simultaneously, and B exists alone. "at least one" means one or more. "plurality" means two or more than two. For example, at least one of a, b or c may represent: seven cases of a, b, c, a and b, a and c, b and c, a, b and c.

In the traditional display screen ESD soft reset method at present, the detection condition is single. For example, an ESD soft reset may be initiated upon detection of a change or abnormality in the state of a register driving the chip. However, the number and types of registers of the driving chip are large. For example, taking a driving chip as a Display Driver IC (DDIC), the DDIC may include various types of registers, such as a first type of register and a second type of register. The first type of register is a register which is interfered by signal transmission and electrostatic discharge. For example, the first type of register may be, but is not limited to, a mobile industry processor interface (Mobile Industry Processor Interface, MIPI) Error register (Ab), MIPI ECC/CRC register (B0), checksum register (AA), etc. The second type of registers are registers that are primarily subject to electrostatic discharge (esd), such as an IC status register (0A), a line buffer register (BB), a display mode register (0D), etc.

Obviously, the reason why the states (e.g., high and low levels) of different types of registers change or are abnormal may be different due to the different types of registers. Therefore, if the display screen ESD soft reset method is adopted for different types of registers, the probability of false triggering of ESD soft reset is increased. For example, taking the first type of register as an example, when its state (for example, high and low levels) is changed or abnormal due to other reasons (for example, signal transmission) other than electrostatic discharge, if the above-mentioned ESD soft reset method for a display screen is adopted, false triggering of ESD soft reset is caused.

In addition, continuing to take the first type of register as an example, referring to fig. 1 (a) and 1 (b), the MIPI signal is currently transmitted by using the C-PHY transmission protocol and the D-PHY transmission protocol. With the advent of the 5G era, the transmission of signals (such as MIPI signals) between the rfs chip and the display screen is more frequent. In addition, the high refresh rate and the high reporting rate become hot spot demands of the terminal equipment, and the data quantity required to be transmitted at the same time is more. Therefore, the frequency of signal transmission by the C-PHY transmission protocol is also increased as compared to the D-PHY transmission protocol. However, when the signal transmission is performed using the C-PHY transmission protocol, once the signal quality is degraded, the signal transmission is more susceptible to interference errors, which also more easily causes a change or abnormality in the state of the first-type register. Therefore, if the traditional display screen ESD soft reset method is adopted, the probability of false touch is higher, so that the probability of abnormal display is higher when the electronic equipment is normally used, and poor user experience is caused.

Based on the technical problems, the embodiment of the application provides a display screen ESD soft reset method, electronic equipment and a computer storage medium, which are used for effectively reducing the probability of false triggering of ESD soft reset and better improving user experience.

Fig. 2 is a schematic diagram of a part of functional modules of the electronic device 100 according to an embodiment of the present application.

In some embodiments, electronic device 100 may be a cell phone, tablet, desktop, laptop, handheld, notebook, ultra-mobile personal computer (ultra-mobile personal computer, UMPC), netbook, as well as a cell phone, personal digital assistant (personal digital assistant, PDA), artificial intelligence (artificial intelligence, AI) device, wearable device, vehicle device, smart home device, and/or smart city device, among other display-screen electronic devices.

The electronic device 100 may include a processor 110, an external memory interface 120, an internal memory 121, a universal serial bus (Universal Serial Bus, USB) interface 130, a charge management module 140, a power management module 141, a battery 142, an antenna 1, an antenna 2, a mobile communication module 150, a wireless communication module 160, an audio module 170, a speaker 170A, a receiver 170B, a microphone 170C, an earphone interface 170D, a sensor module 180, keys 190, a motor 191, an indicator 192, a camera 193, a display 194, and a subscriber identity module (Subscriber Identification Module, SIM) card interface 195, etc. The sensor modules 180 may include a pressure sensor 180A, a gyroscope sensor 180B, an air pressure sensor 180C, a magnetic sensor 180D, an acceleration sensor 180E, a distance sensor 180F, a proximity sensor 180G, a fingerprint sensor 180H, a temperature sensor 180J, a touch sensor 180K, an ambient light sensor 180L, a gravity sensor 180M, and the like.

It is to be understood that the structure illustrated in the embodiments of the present application does not constitute a specific limitation on the electronic device 100. In other embodiments of the present application, electronic device 100 may include more or fewer components than shown, or certain components may be combined, or certain components may be split, or different arrangements of components. The illustrated components may be implemented in hardware, software, or a combination of software and hardware.

The processor 110 may include one or more processing units, such as: the processor 110 may include an application processor (Application Processor, AP), a modem processor, a graphics processor (Graphics Processing Unit, GPU), an image signal processor (Image Signal Processor, ISP), a controller, a video codec, a digital signal processor (Digital Signal Processor, DSP), a baseband processor, and/or a Neural network processor (Neural-network Processing Unit, NPU), etc. Wherein the different processing units may be separate devices or may be integrated in one or more processors.

A memory may also be provided in the processor 110 for storing instructions and data. In some embodiments, the memory in the processor 110 is a cache memory. The memory may hold instructions or data that the processor 110 has just used or recycled. If the processor 110 needs to reuse the instruction or data, it may be called directly from memory. Repeated accesses are avoided and the latency of the processor 110 is reduced, thereby improving the efficiency of the system.

In some embodiments, the processor 110 may include one or more interfaces. The interfaces may include integrated circuit (Inter-integrated Circuit, I2C) interfaces, integrated circuit built-in audio (Inter-integrated Circuit Sound, I2S) interfaces, pulse code modulation (Pulse Code Modulation, PCM) interfaces, universal asynchronous receiver transmitter (universal asynchronous receiver/transmitter, UART) interfaces, MIPI interfaces, general-Purpose Input/Output (GPIO) interfaces, subscriber identity module (Subscriber Identity Module, SIM) interfaces, and/or universal serial bus (Universal Serial Bus, USB) interfaces, among others.

The MIPI interface may be used to connect the processor 110 to peripheral devices such as a display 194, a camera 193, and the like. The MIPI interfaces include camera serial interfaces (Camera Serial Interface, CSI), display serial interfaces (Display Serial Interface, DSI), and the like. In some embodiments, processor 110 and display 194 communicate via a DSI interface to implement the display functionality of electronic device 100.

The GPIO interface may be configured by software. The GPIO interface may be configured as a control signal or as a data signal.

It should be understood that the interfacing relationship between the modules illustrated in the embodiments of the present application is only illustrative, and does not limit the structure of the electronic device 100. In other embodiments of the present application, the electronic device 100 may also use different interfacing manners, or a combination of multiple interfacing manners in the foregoing embodiments.

The electronic device 100 implements display functions through a GPU, a display screen 194, an application processor, and the like. The GPU is a microprocessor for image processing, and is connected to the display 194 and the application processor. The GPU is used to perform mathematical and geometric calculations for graphics rendering. Processor 110 may include one or more GPUs that execute program instructions to generate or change display information.

The display screen 194 is used to display images, videos, and the like. The display 194 includes a driving chip and a display panel. The driver chip may be, but is not limited to, a DDIC. It is understood that, in the embodiments of the present application, for convenience of description, the following description will be given with reference to a driving chip as a DDIC.

The driving chip is used for controlling the display panel, for example, sending driving signals and data to the display panel in the form of electric signals. The driver chip may include a plurality of pins with different functions, such as an analog circuit power supply (AVDD) pin, a Tearing Effect (TE) pin, etc., which may be used to transfer a specific signal. For example, the AVDD pin may have functions of controlling the operating power, powering up and powering down, etc. of the DDIC. The TE pin is used to transmit a feedback signal.

In the embodiment of the application, the driving chip includes a plurality of registers, for example, a first type of register, a second type of register, and the like. The plurality of registers are used for providing read-write of DDIC data and reflect the state of DDIC.

The display panel may employ a liquid crystal display (Liquid Crystal Display, LCD), an Organic Light-Emitting Diode (OLED), an Active-matrix Organic Light-Emitting Diode (AMOLED) or an Active-matrix Organic Light-Emitting Diode (Matrix Organic Light Emitting Diode), a flexible Light-Emitting Diode (Flex), a mini, a Micro-OLED, a quantum dot Light-Emitting Diode (Quantum Dot Light Emitting Diodes, QLED), or the like. In some embodiments, the electronic device 100 may include 1 or N display screens 194, N being a positive integer greater than 1.

The gravity sensor 180M may sense the direction of the electronic device 100 by sensing gravity information of the electronic device 100 and further identify the direction in which the display 194 is facing.

The gyro sensor 180B may be used to sense spatial movement positioning information of the electronic device 100 to sense a direction of the electronic device 100. The acceleration sensor 180E may be used for sensing acceleration information of the electronic device 100 to measure stress of the electronic device 100, and thus sense a direction of the electronic device 100.

In some embodiments, the processor 110, the display 194, and the sensor module 180 may be communicatively coupled via a communication bus to enable interaction of signals and data. In some embodiments, an interface of the processor 110, such as a MIPI interface, may communicate signals and data with a driver chip (e.g., DDIC) of the display screen 194 via a D-PHY transfer protocol and/or a C-PHY transfer protocol.

The following describes in detail the ESD soft reset method for the display screen provided in the embodiment of the present application with reference to the electronic device 100 shown in fig. 2.

Referring to fig. 3, a flowchart of an ESD soft reset method for a display screen according to an embodiment of the present application is shown. As shown in fig. 3, when the display screen ESD soft reset method is applied to the first type of register, the display screen ESD soft reset method includes the steps of:

s311, the driving chip detects whether the high level and the low level of the first type register change.

It is understood that in step S311, whether the state of the first type register is changed or abnormal may be determined by detecting whether the high and low levels of the first type register are changed. For example, when a change in the high-low level of the first-type register is detected, for example, a change from the high level to the low level (for example, a change from 1 to 0) or a change from the low level to the high level (for example, a change from 0 to 1) is detected, it may be determined that a change or abnormality in the state of the first-type register is detected, and step S312 is performed. As another example, when it is detected that the high and low levels of the first type register are not changed, it may be determined that the state of the first type register is not changed or abnormal, and step S320 is performed.

S312, the display panel judges whether the current capacitance value of the display panel rises and reaches a preset capacitance value.

It will be understood that, in step S311, when it is determined that the state of the first type register is changed or abnormal, it is necessary to further determine the cause of the change or abnormality in the state thereof.

As described above, according to the nature of the first type of register, the state change or abnormality is mainly interfered by signal transmission and electrostatic discharge. While in different scenarios (e.g., test scenario and user scenario), the interference of electrostatic discharge and signal transmission to the first type of registers is different. The test scene refers to an environment in which the electronic equipment is subjected to electrostatic test before leaving the factory. The user scene refers to a daily use environment of the electronic equipment delivered to a user after leaving the factory. Specifically, please refer to fig. 4, which is a schematic diagram of the electronic device 100 in a test scenario in the embodiment of the present application.

As shown in fig. 4, when the electronic device 100 is in a test scene, it is first necessary to place the electronic device 100 on the test stand 201, and place the side of the electronic device 100 provided with the display screen 194 toward the test stand 201 so that the display screen 194 contacts the test stand 201. In some embodiments, test station 201 may be a test platform made of iron plate.

Then, the static electricity generating device 203 discharges static electricity to the electronic apparatus 100. In some embodiments, the static electricity generating device 203 may be, but is not limited to, an electrostatic gun. The static electricity generating device 203 discharges static electricity to the electronic apparatus 100 by contacting the electronic apparatus 100. In some embodiments, the ESD test of the electronic device 100 may be performed by contacting the electrostatic generating device 203 to a plurality of different locations of the electronic device 100.

It is apparent that in the test scenario, the energy (e.g., intensity and/or frequency) of the static electricity discharged by the static electricity gun is greater or much greater than the energy of the daily static electricity that the electronic device 100 can contact in the user scenario. Therefore, in the embodiment of the present application, it may be determined whether the current electronic device 100 is in the test scenario or the user scenario through step S312, so as to further determine the cause of the state change or abnormality of the first type register. For example, when it is determined that the current capacitance value of the display panel increases and reaches the preset capacitance value, it is indicated that the electronic device 100 may be currently in the test scenario, and the state of the first type register may be changed or abnormal mainly caused by static electricity. For another example, when it is determined that the current capacitance value of the display panel does not reach the preset capacitance value, it is indicated that the electronic device 100 may be in a user scenario at present, and the state change or abnormality of the first type register may be mainly caused by signal transmission interference and not static electricity.

It will be understood that in step S312, the display 194 can detect the current capacitance of the display panel through the display panel, and compare the detected capacitance with the preset capacitance to determine whether the current capacitance rises and reaches the preset capacitance.

It will be appreciated that in some embodiments, the preset capacitance value may be set to a corresponding capacitance value when the display panel of the entire display screen 194 is contacted by the test iron plate. That is, the preset capacitance value may correspond to a capacitance value corresponding to when the electronic device 100 is placed on the test iron plate, and the display screen 194 faces the test iron plate and is fully contacted with the test iron plate. The preset capacitance value may also be referred to as an iron plate characteristic. In this way, in step S312, when the display panel determines that the current capacitance value of the display panel rises and reaches the preset capacitance value, the display screen 194 of the electronic device 100 may be determined to be in full contact with the test iron plate, so as to primarily determine that the electronic device 100 is in the test scene.

S313, the display 194 transmits a feedback signal to the processor 110 to report the anomaly.

In step S313, the display screen 194 may transmit a feedback signal (e.g., a feedback high signal) to the processor 110 through a pin (e.g., TE pin) of the driving chip (i.e., DDIC) to report an abnormality of the display screen 194 to the processor 110. For example, by pulling the TE signal fed back by the DDIC to the processor 110 high, the display screen 194 is caused to report an exception to the processor 110.

S314, the processor 110 receives the feedback signal to acquire the abnormality reported by the display 194.

In step S314, the processor 110 may receive the feedback signal transmitted by the DDIC through a pin (e.g., GPIO pin) of the processor 110 to obtain an anomaly reported by the display screen 194. For example, the processor 110 may be electrically connected to the TE pin of the DDIC through the GPIO pin to receive a feedback signal (e.g., a high level signal) output by the DDIC through the GPIO pin. That is, when the change of the high level and the low level of the first type register is detected in step S311 to determine that the state of the first type register is changed or abnormal, and the electronic device 100 is primarily determined to be in the test scene, the display screen 194 transmits a feedback signal to the processor 110, and the processor 110 receives the feedback signal to obtain the state of the first type register reported by the display screen 194 that is changed or abnormal.

In some embodiments, S313 and S314 may be combined, i.e., the information interaction between the display 194 and the processor 110 is complete.

S315, the processor 110 determines whether the direction of the electronic device 100 is a preset direction.

In some embodiments, the processor 110 may detect the current gesture of the electronic device 100 through the sensor module 180, and the detection principle thereof may refer to fig. 2 and the description related to the sensor module 180, which are not repeated herein.

It is understood that in the embodiments of the present application, the orientation of the electronic device 100 is consistent with the orientation of the display 194. Correspondingly, the preset direction is the downward direction or the gravity direction of the electronic device 100, that is, the downward direction or the gravity direction of the display screen 194.

It will be appreciated that in the user scenario, when the palm of the user fully touches the display screen 194, the current capacitance value detected by the display panel will also rise and approach the preset capacitance value, which, although the probability of this occurrence is not great in the user scenario, will still result in a certain degree of accuracy in the determination. For another example, in a user scenario, there may be a case where the user turns the electronic device 100 directly downward. Therefore, in the embodiment of the present application, through step S315, that is, through determining whether the direction of the electronic device 100 is the preset direction, and combining with step S312, it is further determined whether the electronic device 100 is in the test scene, so as to effectively improve the accuracy of the determination. That is, by combining step S312 and step S315 to determine whether the electronic device 100 is in the test scene, the accuracy of the determination can be effectively improved.

It is understood that, in the embodiment of the present application, the execution sequence of step S312 and step S315 is not limited. For example, as shown in fig. 3, in some embodiments, step S312 may be performed first and then step S315 may be performed. In other embodiments, step S315 may be performed first and then step S312 may be performed, that is, it may be determined whether the direction of the electronic device 100 is the preset direction, and then it may be determined whether the capacitance value of the display panel increases and reaches the preset capacitance value.

It can be appreciated that in step S315, when the processor 110 determines that the direction of the electronic device 100 is the preset direction, that is, the electronic device 100 is in the upside-down direction, it further illustrates that the electronic device 100 is in the test scene, and S316 is performed. When it is determined that the direction of the electronic device 100 is not the preset direction, S320 is performed.

S316, the processor 110 controls the power-down preset time of the driving chip, and the driving chip starts to power down.

It can be understood that, through step S312 and step S315, it can be determined whether the electronic device 100 is in a testing scenario, and the subsequent steps are performed according to the determination result. For example, when the electronic device 100 is determined to be in the test scenario, it is indicated that the state of the first type of register is changed or abnormal, mainly due to electrostatic interference. Therefore, it is necessary to normally perform ESD soft reset to eliminate electrostatic interference. Specifically, in step S316, the processor 110 may control a power-down preset time of the DDIC, and the DDIC starts to power down within the power-down preset time.

It will be appreciated that in other embodiments, if the electronic device 100 receives a specific operation (e.g., the power key of the electronic device 100 is triggered) within the power-down preset time, and the processor 110 detects the specific operation within the power-down preset time, the power-down state of the DDIC may be exited. That is, the power-down state of the DDIC can be exited by a specific operation.

It will be appreciated that if the electronic device 100 does not detect a specific operation within the power-down preset time, the DDIC maintains the power-down for the power-down preset time, and continues the subsequent flow of the method, for example, executing step S317.

After the power-down preset time, the processor 110 continues to determine whether the electronic device 100 is still in the test scenario in S317.

It can be understood that, in step S317, when the previous step is to determine whether the direction of the electronic device 100 is the preset direction (e.g. step S315), step S317 may determine whether the electronic device 100 is still in the test scene by determining whether the direction of the electronic device 100 is still the preset direction. When the previous step is to determine whether the capacitance value of the display panel increases and reaches the preset capacitance value (e.g., step S312), step S317 may determine whether the electronic device 100 is still in the test scene by determining whether the capacitance value of the display panel is still the preset capacitance value.

It is understood that in step S317, when it is determined that the electronic device 100 is no longer in the test scenario, step S318 is performed. When it is determined that the electronic apparatus 100 is still in the test scenario, step S319 is performed.

S318, the processor 110 controls the power-on reset of the driving chip of the display 194.

It is understood that in step S317, when it is determined that the electronic device 100 is no longer in the test scenario, the processor 110 controls the DDIC to be powered up again. By executing step S316 (power-down to the driving chip) and step S318 (power-up reset to the driving chip), that is, performing power-down and power-up to the driving chip, ESD soft reset of the display screen is realized, so that the interference of static electricity generated by the static gun in the test scene to the display screen 194 is eliminated.

S319, the processor 110 controls the driving chip to continue powering down until the display 194 is turned off.

In some embodiments, the processor 110 controls the DDIC to maintain the powered-down state until the display screen 194 is turned off, i.e., the display screen 194 enters the off-screen state.

It will be appreciated that in step S317, when it is determined that the electronic device 100 is still in the test scenario, the processor 110 continues to power down by controlling the DDIC until the display 194 is turned off. Thus, after the DDIC is powered down, the first type register will not change or be abnormal due to the electrostatic interference generated by the electrostatic gun, so as not to interfere with other electrostatic tests of the electronic device 100, i.e. be beneficial to performing other electrostatic tests on the electronic device 100.

S320, the electronic device 100 does not make a soft reset response.

It can be understood that in step S312 and step S315, when the current capacitance value of the display panel does not reach the preset capacitance value or the preset direction of the electronic device is not the preset direction, the electronic device 100 is illustrated as being in the user scene. At this time, according to the property of the first type of register, when the first type of register is in a user scene, the probability that the high level and the low level of the first type of register are changed due to the interference of signal transmission is greater than that of the first type of register due to the interference of daily static electricity, so that the first type of register does not need to be subjected to ESD soft reset. In this way, the electronic device 100 may not respond, i.e., not perform ESD soft reset, so that the probability of false triggering of ESD soft reset may be effectively reduced.

Alternatively, in step S311, when it is detected that the high level and the low level of the first type register are unchanged, it is indicated that the first type register can work normally, so the electronic device 100 does not need to perform a soft reset response.

As described above, in the ESD soft reset method for a display screen provided in the embodiment of the present application, when the high and low levels of the first type register change, it is determined that the electronic device 100 is in a test scenario or a user scenario, so as to further determine whether to perform ESD soft reset. Specifically, whether the electronic device 100 is in the test scene or the user scene can be determined by determining whether the current capacitance value of the display panel rises and reaches the preset capacitance value and determining whether the direction of the electronic device 100 is the preset direction. When the above two judging conditions are satisfied at the same time, it may be determined that the electronic device 100 is in the test scenario, which indicates that the first type of register is subjected to electrostatic interference, so that the state is highly likely to change or be abnormal, and thus the electronic device 100 needs to be subjected to ESD soft reset to eliminate the electrostatic interference. When any one of the two judging conditions is not satisfied, it may be judged that the electronic device 100 is in a user scene, which indicates that the first type of register is interfered by signal transmission and has a high possibility of state change or abnormality, so that ESD soft reset of the electronic device 100 is not required, and thus the probability of false triggering of ESD soft reset can be effectively reduced, and user experience is preferably improved.

Referring to fig. 5, fig. 5 is another flowchart of an ESD soft reset method for a display screen according to an embodiment of the present application. It will be appreciated that, in a test scenario, when static electricity is discharged to the electronic device 100 placed on the test stand 201 through the static electricity generating device (e.g., static electricity gun), the energy discharged by the static electricity may interfere with the pins (such as AVDD pins) of the driving chip, and the voltage withstand condition of the AVDD pins may cause the driving chip not to continue to operate normally. For example, when the AVDD pin is not voltage-proof enough, the driving chip may be damaged, thereby affecting the display of the display screen 194. Therefore, in the embodiment of the present application, when it is confirmed that the electronic device 100 is in the test scenario, the ESD soft reset method for the display screen may further include a step of adjusting the voltage value of the driving chip, so as to ensure that the driving chip can work normally and reduce the probability of damaging the driving chip.

As shown in fig. 5, the adjusting the voltage value of the driving chip specifically includes:

s511, the processor 110 decreases the voltage value of the driving chip to a predetermined voltage value.

In some embodiments, the processor 110 controls the voltage value of the AVDD pin of the DDIC to be adjusted from the normal operating voltage value to a preset voltage value by outputting a control signal to the DDIC.

It is understood that the preset voltage value is less than the normal operating voltage value of the AVDD pin of DDIC. In the embodiment of the present application, the normal operating voltage value may be, but is not limited to, 7.9V. The preset voltage value may be, but is not limited to, 7.5V. Of course, the normal operating voltage value is 7.9V and the preset voltage value of 7.5V is merely exemplary. For example, the normal operating voltage value may be set according to different models or definitions of DDIC, and the preset voltage value may be other voltage values or voltage value intervals, which are not limited herein.

It will be appreciated that when the DDIC is operated at a normal operating voltage value, the DDIC may operate at full load. When the voltage value of the DDIC is reduced to a preset voltage value, the DDIC operates at the preset voltage value with a margin compared to operating at a normal operating voltage value. Therefore, in a test scene, the allowance can be used for the DDIC to bear the energy release of static electricity generated by the static electricity gun so as to protect the DDIC from damage caused by overvoltage, thereby ensuring that the DDIC can work normally and reducing the probability of damage to the DDIC.

S512, the processor 110 determines whether the electronic device 100 is still in the test scenario.

It is understood that step S512 is similar to step S317 in fig. 3, and the detailed description of step S317 is omitted herein.

It can be appreciated that in step S512, when it is determined that the electronic device 100 is still in the test scenario, step S513 is performed. When it is determined that the electronic device 100 is not in the test scenario, step S514 is performed.

S513, the processor 110 controls the voltage value of the driving chip to be maintained at a preset voltage value.

In some embodiments, the processor 110 controls the voltage value of the AVDD pin of the DDIC to be maintained at a preset voltage value (e.g., 7.5V) such that the DDIC operates in a low power mode.

It can be appreciated that in the test scenario, by controlling or maintaining the voltage value of the driving chip at the preset voltage value, that is, operating in the low power mode, the DDIC may have a margin compared to the normal operating voltage value after the voltage value is reduced, and the margin may enable the DDIC to withstand the energy discharge of ESD in the subsequent test scenario, so as to effectively ensure that the DDIC may operate normally, and reduce the probability of damaging the DDIC.

S514, the processor 110 adjusts the voltage value of the driving chip to the normal operating voltage value.

It is understood that in step S512, when it is determined that the electronic device 100 is no longer in the test scenario, the voltage value of the DDIC may be adjusted to the normal operation voltage value, so that the DDIC resumes normal operation.

It is understood that when the voltage value of the DDIC is adjusted to a preset voltage value, the DDIC takes the preset voltage value as an operating voltage. At this time, the brightness of the display screen 194 may be slightly lowered, or the color display of the display screen 194 may be slightly affected. Therefore, in step S514, when the electronic device 100 is no longer in the test scenario, the driving chip can be operated at the normal operating voltage value by recovering the voltage value of the driving chip to the normal operating voltage value, and the display 197 can display at normal brightness and color.

Referring to fig. 6, fig. 6 is another flowchart of an ESD soft reset method for a display screen according to an embodiment of the present application. As shown in fig. 6, when the display screen ESD soft reset method is applied to the second type of register, the display screen ESD soft reset method further includes the steps of:

s611, the driving chip detects whether the high level and the low level of the second type register change.

It is understood that in step S611, whether the state of the second type register is changed or abnormal may be determined by detecting whether the high and low levels of the second type register are changed. For example, when a change in the high-low level of the second-type register is detected, for example, a change from the high level to the low level (for example, a change from 1 to 0) or a change from the low level to the high level (for example, a change from 0 to 1) is detected, it may be determined that a change or abnormality in the state of the second-type register is detected, and step S612 is performed. As another example, when it is detected that the high and low levels of the first type register are not changed, it may be determined that the state of the second type register is not changed or abnormal, and step S616 is performed.

S612, the driving chip outputs a feedback signal (e.g., a feedback high level signal) to the processor 110 to report an abnormality.

S613, the processor 110 receives the feedback signal to obtain the abnormality reported by the driving chip.

It can be appreciated that, in the embodiment of the present application, the steps S612 and S613 are similar to the steps S313 and S314 in fig. 3, and the description of the steps S313 and S314 in fig. 3 can be referred to, and will not be repeated here.

S614, the processor 110 outputs a control signal to the driving chip.

In some embodiments, the processor 110 may determine that the ESD soft reset is required according to detecting the high level signal fed back by the driving chip, and output the control signal to the driving chip.

S615, the drive chip of the display screen 194 is powered down and powered up for reset.

In some embodiments, the driving chip receives the control signal of the processor 110, and powers down and powers up again according to the control signal of the processor 110, so as to realize ESD soft reset of the display screen, thereby eliminating the interference of static electricity on the display screen 194.

It can be appreciated that, in the embodiment of the present application, the step S615 is similar to the steps S316 and S318 in fig. 3, and the description of the steps S316 and S318 in fig. 3 is specifically referred to, and will not be repeated here.

S616, the electronic device 100 does not make a soft reset response.

It will be appreciated that in step S611, when no change in the high-low level of the second type register is detected, it is indicated that the second type register is operating normally, so the electronic device 100 does not need to respond, i.e. does not need to perform ESD soft reset.

It will be appreciated that, as mentioned above, according to the nature of the second type of register, it is mainly subject to electrostatic interference, both in the test scenario and in the user scenario. Therefore, when the change of the high and low levels of the second type register is detected, the steps shown in fig. 6 can be directly executed to perform ESD soft reset on the display screen 194 to eliminate electrostatic interference.

It will be appreciated that in the embodiment of the present application, before performing the ESD soft reset, it is generally required to confirm whether the display 194 can be normally displayed, so as to eliminate false triggering of the ESD soft reset caused by abnormal display of the display 194. That is, once the display 194 itself is abnormal, there is no need to confirm the change in the state of the register or the cause of the abnormality, i.e., there is no need to perform the display ESD soft reset step or directly respond. Alternatively, the ESD soft reset method of the display screen according to the embodiment of the present application is performed on the premise that the display screen 194 can normally display. Thus, in some embodiments, the display screen ESD soft reset method further comprises the steps of:

confirm whether the display 194 is displayable normally.

It will be appreciated that in the embodiments of the present application, the manner in which whether the display 194 is normally displayable is not limited. For example, in some embodiments, the display 194 may be visually inspected for proper display by controlling the display 194 to light. As another example, when the driver chips are operated at different voltages, the display of the display screen 194 may be affected, for example, the brightness or color of the display. In this way, whether the display screen 194 can display normally can also be determined by observing the display change of the display screen 194, which is not specifically limited herein.

Referring to fig. 7, an embodiment of the present application further provides an electronic device 200. The electronic device 200 includes a processor 210, a memory 220, and a display 230. The display 230 includes a display panel 240 and a driving chip 250.

It will be appreciated that the electronic device 200 may be the electronic device 100, and the display screen 230 may be the display screen 194, and the detailed description thereof will be omitted herein with reference to fig. 2.

In the present embodiment, the memory 220 is used to store computer-executable instructions. When the electronic device 200 is operating, the processor 210 may execute computer-executable instructions stored by the memory 220 to perform the display screen ESD soft-reset method in the above embodiments.

The embodiment also provides a computer storage medium, in which computer instructions are stored, and when the computer instructions run on the electronic device, the electronic device is caused to execute the related method steps, so as to implement the ESD soft reset method for the display screen in the above embodiments.

The present embodiment also provides a computer program product, which when run on a computer, causes the computer to perform the above-mentioned related steps to implement the display screen ESD soft reset method in the above-mentioned embodiments.

It will be appreciated that the electronic device, the computer storage medium, the computer program product provided by the embodiments of the present application are all adapted to perform the corresponding methods provided above. Therefore, the advantages achieved by the method can be referred to as the advantages in the corresponding method provided above, and will not be described herein.

From the foregoing description of the embodiments, it will be apparent to those skilled in the art that, for convenience and brevity of description, only the above-described division of functional modules is illustrated, and in practical application, the above-described functional allocation may be implemented by different functional modules according to needs, i.e. the internal structure of the apparatus is divided into different functional modules to implement all or part of the functions described above.

In the several embodiments provided in this application, it should be understood that the disclosed systems and methods may be implemented in other ways. For example, the system embodiments described above are merely illustrative, e.g., the division of the modules or units is merely a logical functional division, and there may be additional divisions when actually implemented, e.g., multiple units or components may be combined or integrated into another system, or some features may be omitted, or not performed. Alternatively, the coupling or direct coupling or communication connection shown or discussed with each other may be an indirect coupling or communication connection via some interfaces, devices or units, which may be in electrical, mechanical or other form.

In addition, each functional unit in each embodiment of the present application may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit. The integrated units described above may be implemented either in hardware or in software functional units.

The integrated units, if implemented in the form of software functional units and sold or used as stand-alone products, may be stored in a readable storage medium. Based on such understanding, the technical solutions of the embodiments of the present application may be essentially or a part contributing to the prior art or all or part of the technical solutions may be embodied in the form of a software product stored in a storage medium, where the software product includes several instructions to cause a device (may be a single-chip microcomputer, a chip or the like) or a processor (processor) to perform all or part of the steps of the methods described in the embodiments of the present application. And the aforementioned storage medium includes: various media capable of storing program codes, such as a U disk, a removable hard disk, a ROM, a magnetic disk or an optical disk.

It will be evident to those skilled in the art that the present application is not limited to the details of the foregoing illustrative embodiments, and that the present application may be embodied in other specific forms without departing from the spirit or essential characteristics thereof. Therefore, appropriate modifications and variations of the above embodiments should be included within the scope of the claims of the present application, as long as they are within the true spirit of the present application.

Claims

1. The display screen ESD soft reset method is applied to electronic equipment, the electronic equipment comprises a display screen and a processor, the display screen comprises a display panel and a driving chip, the driving chip comprises a first type of register, and the first type of register is a register which can be interfered by signal transmission and electrostatic discharge, and is characterized in that the display screen ESD soft reset method comprises the following steps:

the driving chip detects whether the high level and the low level of the first type register change or not so as to determine whether the state of the first type register changes or is abnormal or not;

when detecting that the high level and the low level of the first type register change, the display panel judges whether the current capacitance value of the display panel rises and reaches a preset capacitance value, and the processor judges whether the direction of the electronic equipment is a preset direction so as to determine the reason for causing the state change or abnormality of the first type register;

and when the capacitance value of the display panel is judged to rise and reach the preset capacitance value and the direction of the electronic equipment is the preset direction, the processor controls the display screen to carry out ESD soft reset.

2. The display screen ESD soft reset method of claim 1 wherein the processor controlling the ESD soft reset of the display screen comprises:

the processor controls the power-down preset time of the driving chip, and the driving chip starts power-down;

after the power-down preset time, the display panel continuously judges whether the capacitance value of the display panel rises and reaches the preset capacitance value or the processor continuously judges whether the direction of the electronic equipment is the preset direction;

and when the capacitance value of the display panel is judged not to reach the preset capacitance value or the direction of the electronic equipment is not the preset direction, the processor controls the drive chip to be powered on and reset.

3. The display screen ESD soft reset method of claim 2, wherein when it is determined that the capacitance value of the display panel is still the preset capacitance value or the direction of the electronic device is still the preset direction, the display screen ESD soft reset method further comprises:

and the processor controls the driving chip to continue to be powered down until the display screen is closed.

4. The ESD soft reset method of any one of claims 1 to 3, wherein when it is determined that the capacitance value of the display panel increases and reaches the preset capacitance value, and the direction of the electronic device is the preset direction, the ESD soft reset method of the display further comprises:

The processor reduces the voltage value of the driving chip to a preset voltage value;

the display panel continuously judges whether the capacitance value of the display panel rises and reaches the preset capacitance value or the processor continuously judges whether the direction of the electronic equipment is the preset direction;

when the capacitance value of the display panel is still the preset capacitance value or the direction of the electronic equipment is still the preset direction, the processor controls the voltage value of the driving chip to be maintained at the preset voltage value.

5. The method for ESD soft reset of a display of claim 4, wherein when it is determined that the capacitance value of the display panel does not reach the preset capacitance value or the direction of the electronic device is not the preset direction, the method for ESD soft reset of a display further comprises:

the processor adjusts the voltage value of the driving chip to a normal working voltage value;

wherein the preset voltage value is smaller than the normal working voltage value.

6. The method for ESD soft reset of a display according to any one of claims 1 to 5, wherein if a change in the high-low level of the first type register is detected but the current capacitance value of the display panel does not reach the preset capacitance value, or if a change in the high-low level of the first type register is detected but the processor determines that the direction of the electronic device is not the preset direction, the method for ESD soft reset of a display further comprises:

The electronic device does not respond to a soft reset.

7. The ESD soft reset method of any one of claims 1 to 6, wherein the driver chip further comprises a second type of register, the second type of register being a register that is subject to electrostatic discharge interference, the ESD soft reset method further comprising:

the driving chip detects whether the high level and the low level of the second type register change or not;

and when detecting that the high level and the low level of the second type register change, the processor controls the display screen to carry out ESD soft reset.

8. The method of claim 7, wherein the processor controlling the ESD soft reset of the display when the change in the high-low level of the second type register is detected comprises:

after the power-down preset time, the processor controls the power-on reset of the driving chip.

9. The display screen ESD soft reset method according to any one of claims 1 to 8, wherein the preset direction is a direction of gravity of the display screen.

10. The display screen ESD soft reset method of any one of claims 1 to 9 wherein the first type of register is any one of a mobile industry processor interface MIPI Error register, MIPI ECC/CRC register, checksum register.

11. The electronic equipment is characterized by comprising a display screen and a processor, wherein the display screen comprises a display panel and a driving chip, the driving chip comprises a first type of register, and the first type of register is a register which can be interfered by signal transmission and electrostatic discharge; wherein,,

the driving chip is used for detecting whether the high level and the low level of the first type register change or not so as to determine whether the state of the first type register changes or is abnormal or not;

the display panel is used for judging whether the current capacitance value of the display panel rises and reaches a preset capacitance value when the high-low level of the first type register changes;

the processor is used for judging whether the direction of the electronic equipment is a preset direction or not so as to determine the reason for causing the state change or abnormality of the first type register;

the processor is further configured to control ESD soft reset of the display screen when the capacitance value of the display panel rises and reaches the preset capacitance value, and the direction of the electronic device is the preset direction.

12. The electronic device of claim 11, wherein the controlling the ESD soft reset of the display screen comprises:

13. The electronic device of claim 12, wherein the processor is further configured to control the driving chip to continue powering down until the display screen is turned off when it is determined that the capacitance value of the display panel is still the preset capacitance value or the direction of the electronic device is still the preset direction.

14. The electronic device of any one of claims 11 to 13, wherein when the capacitance value of the display panel increases and reaches the preset capacitance value, and the direction of the electronic device is the preset direction, the processor is further configured to:

Reducing the voltage value of the driving chip to a preset voltage value;

continuously judging whether the direction of the electronic equipment is the preset direction or not;

the display panel is also used for continuously judging whether the capacitance value of the display panel rises and reaches the preset capacitance value;

when the capacitance value of the display panel is still the preset capacitance value or the direction of the electronic device is still the preset direction, the processor is further configured to control the voltage value of the driving chip to be maintained at the preset voltage value.

15. The electronic device of claim 14, wherein when the capacitance value of the display panel does not reach the preset capacitance value or the orientation of the electronic device is not the preset orientation, the processor is further configured to:

regulating the voltage value of the driving chip to a normal working voltage value;

16. The electronic device according to any one of claims 11 to 15, wherein the driving chip further comprises a second type of register, the second type of register being a register that is subject to electrostatic discharge interference, and the driving chip is further configured to detect whether a high level and a low level of the second type of register are changed;

And the processor is also used for controlling the display screen to carry out ESD soft reset when detecting that the high level and the low level of the second type register change.

17. An electronic device comprising a memory and a processor;

the memory is used for storing program instructions;

the processor is configured to read the program instructions stored in the memory, so as to implement the ESD soft reset method of the display screen according to any one of claims 1 to 10.

18. A computer storage medium having stored therein computer readable instructions which when executed by a processor implement the display screen ESD soft reset method of any one of claims 1 to 10.