CN115529623B

CN115529623B - Baseband unit testing device and method, terminal equipment and storage medium

Info

Publication number: CN115529623B
Application number: CN202211479836.5A
Authority: CN
Inventors: 蒋政; 雷文明
Original assignee: Guangzhou Shiju Network Technology Co Ltd
Current assignee: Guangdong Shiju Network Technology Co ltd
Priority date: 2022-11-24
Filing date: 2022-11-24
Publication date: 2023-05-02
Anticipated expiration: 2042-11-24
Also published as: CN115529623A

Abstract

The embodiment of the invention discloses a baseband unit testing device, a baseband unit testing method, terminal equipment and a storage medium. According to the embodiment of the invention, the control module and the test module are arranged in the baseband unit test device, the second end of the control module is connected with the debugging end of the baseband unit, and the control module can issue the forward test instruction, the return test instruction, the uplink decoding test instruction and the throughput rate test instruction to the test module and the baseband unit after connecting the data transmission port of the test module with the optical port of the control module, so that the test module performs the forward test, the return test, the uplink decoding test and the throughput rate test through the data transmission port and the baseband unit. According to the embodiment of the invention, the baseband unit testing device can test multiple functions of the baseband unit, multiple testing environments are not required to be built, the testing steps are simplified, and meanwhile, the testing efficiency of the baseband unit is improved.

Description

Baseband unit testing device and method, terminal equipment and storage medium

Technical Field

The embodiment of the application relates to the field of 5G communication, in particular to a baseband unit testing device, a baseband unit testing method, terminal equipment and a storage medium.

Background

In the field of 5G communication, an extended small base station includes BBU (baseband unit), EU (extended unit), and RRU (remote unit). Before the BBU leaves the factory, the core functions of the BBU generally need to be tested by leaving the factory. The core functions of the BBU comprise throughput rate of a front light transmitting port, 1588 function of the front light transmitting port, 1588 function of a back light transmitting port and correctness of uplink decoding. In the traditional testing method, 2 environments are built to complete the testing of the core functions, the testing process is complex and complicated, the testing efficiency is low, more testing resources are occupied, and higher cost is consumed.

In summary, how to improve the testing efficiency when testing the core function of the baseband unit is a technical problem that needs to be solved at present.

Disclosure of Invention

The embodiment of the invention provides a baseband unit testing device, a method, terminal equipment and a storage medium, which solve the technical problem of low efficiency in the prior art when testing the core function of a baseband unit. The embodiment of the invention can improve the efficiency when testing the core function of the baseband unit.

In a first aspect, an embodiment of the present invention provides a baseband unit testing apparatus, including: the device comprises a control module and a test module, wherein a first end of the control module is used for being connected with a debugging end of the baseband unit, a second end of the control module is connected with the debugging end of the test module, and a data transmission port of the test module is used for being connected with an optical port of the baseband unit.

The control module is used for sending a forward test instruction, a return test instruction, an uplink decoding test instruction or a throughput rate test instruction to the test module and the baseband unit; the forward test instruction, the return test instruction, the uplink decoding test instruction and the throughput rate test instruction are respectively used for indicating the baseband unit and the test module to perform forward test, return test, uplink decoding test and throughput rate test;

the test module is used for carrying out a forward test between the data transmission port and the baseband unit when receiving a forward test instruction; the data transmission port is used for receiving a feedback test instruction and carrying out a feedback test between the data transmission port and the baseband unit; when receiving the uplink decoding test instruction, the uplink decoding test is carried out between the data transmission port and the baseband unit; and the data transmission port is connected in a loop when receiving the throughput rate test instruction, so that the baseband unit performs throughput rate test.

In a second aspect, an embodiment of the present invention provides a method for testing a baseband unit, where the method is applicable to a test module in the baseband unit testing device of the first aspect, and the method includes:

when a forwarding test instruction sent by the control module is received, forwarding test is carried out between the data transmission port and the baseband unit;

When a return test instruction sent by the control module is received, a return test is carried out between the data transmission port and the baseband unit;

when an uplink decoding test instruction sent by the control module is received, uplink decoding test is carried out between the data transmission port and the baseband unit;

and when receiving the throughput rate test instruction sent by the control module, carrying out loop connection on the data transmission port so as to enable the baseband unit to carry out throughput rate test.

In a third aspect, an embodiment of the present invention provides a terminal device, where the terminal device includes a processor and a memory;

the memory is used for storing the computer program and transmitting the computer program to the processor;

the processor is configured to execute a baseband unit testing method according to the second aspect according to instructions in the computer program.

In a fourth aspect, embodiments of the present invention provide a storage medium storing computer-executable instructions that, when executed by a computer processor, are used to perform a baseband unit testing method as in the second aspect.

In the above-mentioned embodiment of the present invention, by setting the control module and the test module in the baseband unit test device, after connecting the second end of the control module with the debug end of the baseband unit and connecting the data transmission port of the test module with the optical port of the control module, the control module can issue the forward test instruction, the return test instruction, the uplink decoding test instruction and the throughput test instruction to the test module and the baseband unit, so that the test module performs the forward test, the return test, the uplink decoding test and the throughput test through the data transmission port and the baseband unit. According to the embodiment of the invention, the baseband unit testing device can test multiple functions of the baseband unit, multiple testing environments are not required to be built, the testing steps are simplified, and meanwhile, the testing efficiency of the baseband unit is improved.

Drawings

Fig. 1 is a schematic structural diagram of a baseband unit testing device according to an embodiment of the present invention.

Fig. 2 is a flowchart of a baseband unit testing method according to an embodiment of the present invention.

Fig. 3 is a schematic structural diagram of another baseband unit testing apparatus according to an embodiment of the present invention.

Fig. 4 is a schematic structural diagram of another baseband unit testing apparatus according to an embodiment of the present invention.

Fig. 5 is a schematic diagram of an internal structure of a switch switching unit according to an embodiment of the present invention.

Fig. 6 is a schematic structural diagram of another baseband unit testing apparatus according to an embodiment of the present invention.

Fig. 7 is a schematic structural diagram of a terminal device according to an embodiment of the present invention.

Reference numerals:

control module 1, test module 2, baseband unit 3, data transmission port 4, optical port 5, first connection end SFPB0, second connection end SFPB1, third connection end SFPB2, fourth connection end SFPB3, fifth connection end SFPB4, first front optical port SFPA0, second front optical port SFPA1, third front optical port SFPA2, fourth front optical port SFPA3, back optical port SFPA4, switch unit 21, uplink signal source unit 22, master clock unit 23, slave clock unit 24, switch unit 12, and control unit 11.

Detailed Description

The following description and the drawings illustrate specific embodiments of the application sufficiently to enable those skilled in the art to practice them. The embodiments represent only possible variations. Individual components and functions are optional unless explicitly required, and the sequence of operations may vary. Portions and features of some embodiments may be included in, or substituted for, those of others. The scope of the embodiments of the present application encompasses the full ambit of the claims, as well as all available equivalents of the claims. Embodiments may be referred to herein, individually or collectively, by the term "invention" merely for convenience and without intending to voluntarily limit the scope of this application to any single invention or inventive concept if more than one is in fact disclosed. Relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Moreover, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed. Various embodiments are described herein in a progressive manner, each embodiment focusing on differences from other embodiments, and identical and similar parts between the various embodiments are sufficient to be seen with each other. The structures, products and the like disclosed in the embodiments correspond to the parts disclosed in the embodiments, so that the description is relatively simple, and the relevant parts refer to the description of the method parts.

As shown in fig. 1, fig. 1 is a schematic structural diagram of a baseband unit testing device according to an embodiment of the present invention. The baseband unit testing device provided by the embodiment of the invention comprises: the device comprises a control module 1 and a test module 2, wherein a first end of the control module 1 is used for being connected with a debugging end of a baseband unit 3, a second end of the control module 1 is connected with the debugging end of the test module 2, and a data transmission port 4 of the test module 2 is used for being connected with an optical port 5 of the baseband unit 3.

The control module 1 is used for sending a forward test instruction, a return test instruction, an uplink decoding test instruction or a throughput rate test instruction to the test module 2 and the baseband unit 3; the forward test instruction, the return test instruction, the uplink decoding test instruction and the throughput rate test instruction are respectively used for indicating the baseband unit 3 and the test module 2 to perform forward test, return test, uplink decoding test and throughput rate test.

In this embodiment, the baseband unit testing device includes a control module 1 and a testing module 2, wherein the control module 1 is used for controlling the baseband unit 3 and the testing module 2, and the testing module 2 is used for testing different functions of the baseband unit 3. Specifically, in this embodiment, a first end of the control module 1 is connected to a debug end of the baseband unit 3, and a second end of the control module 1 is connected to a debug end of the test module 2. The control module 1 is configured to send a forward test instruction, a return test instruction, an uplink decoding test instruction, or a throughput rate test instruction to the test module 2 and the baseband unit 3 through a first end and a second end of the control module. It can be understood that, in order to ensure the normal running of the test, when the control module 1 transmits any one of the forward test instruction, the return test instruction, the uplink decoding test instruction, or the throughput rate test instruction, it is necessary to simultaneously transmit the instruction to the test module 2 and the baseband unit 3.

In this embodiment, the forward test instruction, the return test instruction, the uplink decoding test instruction, and the throughput test instruction are respectively used to instruct the baseband unit 3 and the test module 2 to perform the forward test, the return test, the uplink decoding test, and the throughput test. The forward test refers to testing the forward interface of the baseband unit 3; the backhaul test refers to testing the backhaul interface of the baseband unit 3; the uplink decoding test refers to a signal decoding test for the uplink of the baseband unit 3; throughput rate testing refers to testing the amount of transmission data per unit time of the baseband unit 3.

The test module 2 is used for carrying out a forward test between the data transmission port 4 and the baseband unit 3 when receiving a forward test instruction; the data transmission port 4 is used for carrying out a backhaul test between the baseband unit 3 and the data transmission port when receiving a backhaul test instruction; when receiving the uplink decoding test instruction, the uplink decoding test is carried out between the data transmission port 4 and the baseband unit 3; and the data transmission port 4 is connected in a loop when receiving the throughput rate test instruction, so that the baseband unit 3 performs throughput rate test.

In this embodiment, the debug end of the test module 2 is connected to the first end of the control module 1, and is configured to receive a forward test instruction, a return test instruction, an uplink decoding test instruction, and a throughput rate test instruction sent by the control module 1. The data transmission port 4 of the test module 2 is connected with the optical port 5 of the baseband unit 3, and the test module 2 is used for performing various tests between the data transmission port 4 and the baseband unit 3. Specifically, when the control end of the test module 2 receives the forwarding test instruction sent by the control module 1, the test module 2 can perform data transmission between the data transmission port 4 and the optical port 5 of the baseband unit 3, so as to complete the forwarding test of the baseband unit 3. Similarly, when the control end of the test module 2 receives the backhaul test instruction sent by the control module 1, data transmission can be performed between the data transmission port 4 and the optical port 5 of the baseband unit 3, so as to complete backhaul test of the baseband unit 3. When the control end of the test module 2 receives the uplink decoding test instruction sent by the control module 1, an uplink signal can be sent to the optical port 5 of the baseband unit 3 through the data transmission port 4, so that the baseband unit 3 decodes the uplink signal to complete an uplink decoding test. When the control end of the test module 2 receives the throughput rate test, the control end is used for performing loop connection on the data transmission port 4, so that after the optical port 5 of the baseband unit 3 sends test data to the test module 2, the test module 2 can return the test data to the optical port 5 of the baseband unit 3 again, and the throughput rate test of the optical port 5 is completed by the baseband unit 3.

In addition, the embodiment of the present invention further provides a baseband unit testing method, as shown in fig. 2, where the baseband unit testing method provided by the embodiment of the present invention is applicable to the testing module 2 in the baseband unit testing device, and includes:

and step 101, when a forwarding test instruction sent by the control module is received, forwarding test is carried out between the data transmission port and the baseband unit.

In this embodiment, after the control module 1 sends the forwarding test instruction to the test module 2 and the baseband unit 3, the baseband unit 3 and the test module 2 can execute respective preset forwarding test programs, the test module 2 starts data transmission with the baseband unit 3 through the data transmission port 4, and the baseband unit 3 and the test module 2 complete forwarding test through mutual cooperation. After the forward test is completed, the baseband unit 3 may generate a forward test result, the control module 1 may obtain the forward test result through the debug end of the baseband unit 3, and confirm whether the forward test is passed according to the forward test result, if not, the control module 1 may notify related personnel through an alarm manner.

And 102, when a return test instruction sent by the control module is received, performing a return test between the data transmission port and the baseband unit.

Similarly, after the control module 1 sends the backhaul test instruction to the test module 2 and the baseband unit 3, the baseband unit 3 and the test module 2 can execute respective predetermined backhaul test procedures, the test module 2 starts data transmission with the baseband unit 3 through the data transmission port 4, and the baseband unit 3 and the test module 2 complete backhaul test through mutual cooperation. After the return test is completed, the test module 2 generates a return test result, and the control module 1 can obtain the return test result through the debug end of the test module 2 and confirm whether the return test is passed or not according to the return test result.

And 103, when an uplink decoding test instruction sent by the control module is received, an uplink decoding test is carried out between the data transmission port and the baseband unit.

After the control module 1 sends the uplink decoding test instruction to the test module 2 and the baseband unit 3, the baseband unit 3 and the test module 2 can execute respective preset uplink decoding programs, the test module 2 starts to send uplink signals to the baseband unit 3 through the data transmission port 4, and the uplink decoding programs in the baseband unit 3 can perform uplink decoding on the uplink signals. After the uplink decoding test is completed, the baseband unit 3 generates an uplink decoding result, and the control module 1 can obtain the uplink decoding result through the debugging end of the baseband unit 3 and confirm whether the uplink decoding test is passed or not according to the uplink decoding result.

And 104, when receiving the throughput rate test instruction sent by the control module, performing loop connection on the data transmission port so as to enable the baseband unit to perform throughput rate test.

In this embodiment, after the control module 1 sends the throughput rate test instruction to the test module 2 and the baseband unit 3, the baseband unit 3 and the test module 2 can execute respective preset throughput rate test programs. At this time, the test module 2 performs loop connection on its own data transmission port 4, for example, if the data transmission port 4 includes two data transmission ends connected to two optical ports, the test module 2 may short-circuit the two data transmission ends to complete loop connection. Meanwhile, the baseband unit 3 starts to send test data to the test module 2 through the optical port 5, and the test data sent by the baseband unit 3 returns to the baseband unit 3 after passing through the data transmission port 4 due to the loop connection of the data transmission port 4, so that the throughput rate test program of the baseband unit 3 can analyze the sent test data and the received test data, thereby completing the throughput rate test and generating the throughput rate test result. The control module 1 can obtain the throughput rate test result through the debugging end of the baseband unit 3, and confirm whether the throughput rate test is passed or not according to the throughput rate test result.

In the above-mentioned embodiment of the present invention, by setting the control module and the test module in the baseband unit test device, after connecting the second end of the control module with the debug end of the baseband unit and connecting the data transmission port of the test module with the optical port of the control module, the control module can issue the forward test instruction, the return test instruction, the uplink decoding test instruction and the throughput test instruction to the test module and the baseband unit, so that the test module performs the forward test, the return test, the uplink decoding test and the throughput test through the data transmission port and the baseband unit. According to the embodiment of the invention, the baseband unit testing device can test multiple functions of the baseband unit, multiple testing environments are not required to be built, the testing steps are simplified, the testing efficiency of the baseband unit is improved, and the technical problem of low testing efficiency when the core functions of the baseband unit are tested in the prior art is solved.

Based on the above embodiment, the data transmission port 4 of the test module 2 includes a first connection end SFPB0, a second connection end SFPB1, a third connection end SFPB2, a fourth connection end SFPB3, and a fifth connection end SFPB4, the optical port 5 of the baseband unit 3 includes a first front optical port SFPA0, a second front optical port SFPA1, a third front optical port SFPA2, a fourth front optical port SFPA3, and a back optical port SFPA4, the first connection end SFPB0 is used for being connected with the first front optical port SFPA0, the second connection end SFPB1 is used for being connected with the second front optical port SFPA1, the third connection end SFPB2 is used for being connected with the third front optical port SFPA2, the fourth connection end SFPB3 is used for being connected with the fourth front optical port SFPA3, and the fifth connection end SFPB4 is used for being connected with the back optical port SFPA 4.

In one embodiment, as shown in fig. 3, the data transmission port 4 of the test module 2 includes a first connection end SFPB0, a second connection end SFPB1, a third connection end SFPB2, a fourth connection end SFPB3, and a fifth connection end SFPB4, and the optical port 5 of the baseband unit 3 includes a first front optical port SFPA0, a second front optical port SFPA1, a third front optical port SFPA2, a fourth front optical port SFPA3, and a back optical port SFPA4. The first connection end SFPB0 is used for being connected with the first front light port SFPA0, the second connection end SFPB1 is used for being connected with the second front light port SFPA1, the third connection end SFPB2 is used for being connected with the third front light port SFPA2, the fourth connection end SFPB3 is used for being connected with the fourth front light port SFPA3, and the test module 2 and the baseband unit 3 perform front light test, uplink decoding test and throughput rate test through the first front light port SFPA0, the second front light port SFPA1, the third front light port SFPA2 and the fourth front light port SFPA 3. The fifth connection end SFPB4 is configured to be connected to the backhaul optical port SFPA4, and the test module 2 and the baseband unit 3 complete backhaul test through the backhaul optical port SFPA4.

On the basis of the above embodiment, the test module 2 includes the switch switching unit 21, the uplink signal source unit 22, the master clock unit 23, and the slave clock unit 24.

The first port of the switch switching unit 21 is connected with the first connection end SFPB0, the second connection end SFPB1, the third connection end SFPB2 and the fourth connection end SFPB3, and the second port of the switch switching unit 21 is used for being connected with the slave clock unit 24 when the test module 2 receives the forwarding test instruction; and is used for connecting with the uplink signal source unit 22 when the test module 2 receives the uplink decoding test instruction; the switch switching unit 21 is further configured to perform loop connection on the first connection end SFPB0, the second connection end SFPB1, the third connection end SFPB2, and the fourth connection end SFPB3 when the test module 2 receives the throughput rate test instruction.

In this embodiment, as shown in fig. 4, the test module 2 includes a switch switching unit 21, an uplink signal source unit 22, a master clock unit 23, and a slave clock unit 24. The first port of the switch switching unit 21 is connected to the first connection end SFPB0, the second connection end SFPB1, the third connection end SFPB2, and the fourth connection end SFPB3 of the data transmission port 4, and the switch switching unit 21 may enable the data transmission port 4 to be connected to different objects by changing the connection relationship of the second port. Specifically, the switch switching unit 21 is configured to connect the second port to the slave clock unit 24 when the test module 2 receives the forwarding test instruction; when the test module 2 receives the uplink decoding test instruction, the second port is connected with the uplink signal source unit 22; when the test module 2 receives the throughput rate test instruction, the first connection end SFPB0, the second connection end SFPB1, the third connection end SFPB2, and the fourth connection end SFPB3 are connected in a loop. As illustrated in fig. 5, the switch switching unit 21 is provided with a plurality of switches inside, and the switch switching unit 21 changes the connection relationship of the second port by switching the switches. For example, when the switch switching unit 21 receives the throughput rate test instruction, the first connection end SFPB0 and the second connection end SFPB1 may be connected, and the third connection end SFPB2 and the fourth connection end SFPB3 may be connected, so that when the baseband unit 3 receives the throughput rate test instruction, the test data sent by the first front optical port SFPA0, the second front optical port SFPA1, the third front optical port SFPA2, and the fourth front optical port SFPA3 of the baseband unit 3 may be returned to the baseband unit 3 again, so that the baseband unit 3 performs the throughput rate test by receiving the returned test data.

The slave clock unit 24 is configured to perform a forwarding test between the baseband unit 3 and the first connection terminal SFPB0, the second connection terminal SFPB1, the third connection terminal SFPB2, and the fourth connection terminal SFPB3 when receiving the forwarding test instruction from the test module 2.

The slave clock unit 24 in the test module 2 is configured to perform a forwarding test between the baseband unit 3 and the first connection terminal SFPB0, the second connection terminal SFPB1, the third connection terminal SFPB2, and the fourth connection terminal SFPB3 when the test module 2 receives the forwarding test command. For example, the forward test is a forward 1588 test, a master clock unit is disposed in the baseband unit 3, and when the baseband unit 3 and the test module 2 receive a forward test instruction, the switch switching unit 21 interfaces the master clock unit of the baseband unit 3 with the slave clock unit 24 of the test module 2, so that the master clock unit of the baseband unit 3 and the slave clock unit 24 of the test module 2 perform the forward 1588 test in a manner of sending messages to each other, and after the forward 1588 test is completed, the master clock unit in the baseband unit 3 can output a forward test result.

The uplink signal source unit 22 is configured to perform uplink decoding test between the baseband unit 3 and the first, second, third, and fourth connection terminals SFPB0, SFPB1, SFPB2, SFPB3 when the test module 2 receives the uplink decoding test instruction.

In this embodiment, the uplink signal source unit 22 is configured to send uplink signals to the baseband unit 3 through the first connection end SFPB0, the second connection end SFPB1, the third connection end SFPB2, and the fourth connection end SFPB3 when the test module 2 receives the uplink decoding test instruction, so that the baseband unit 3 performs an uplink decoding test according to the uplink signals sent by the uplink signal source, and outputs an uplink decoding test result after the uplink decoding test is completed.

The master clock unit 23 is connected to the fifth connection SFPB4, and is configured to perform a backhaul test between the baseband unit 3 and the fifth connection SFPB4 when the test module 2 receives a backhaul test instruction.

The master clock unit 23 in the test module 2 is connected to the fifth connection end SFPB4, and the master clock unit 23 is configured to perform a backhaul test between the baseband unit 3 and the backhaul optical port SFPA4 on the baseband unit 3 through the fifth connection end SFPB4 when the test module 2 receives a backhaul test instruction. The backhaul test is exemplified by backhaul 1588 test, in which a slave clock unit is disposed in the baseband unit 3, when the baseband unit 3 and the test module 2 receive a backhaul test instruction, the switch switching unit 21 interfaces the slave clock unit of the baseband unit 3 with the master clock unit 23 of the test module 2, so that the slave clock unit of the baseband unit 3 and the master clock unit 23 of the test module 2 perform backhaul 1588 test in a manner of sending messages to each other, and after backhaul 1588 test is completed, the master clock unit 23 in the test module 2 can output a backhaul test result.

On the basis of the test module 2, the embodiment of the application provides a baseband unit test method, which comprises the following steps:

step 201, when a forwarding test instruction is received, the second port of the control switch switching unit is connected with the slave clock unit, and the slave clock unit is utilized to perform a forwarding test between the baseband unit and the fourth connection terminal through the first connection terminal, the second connection terminal, the third connection terminal.

Step 202, when a backhaul test instruction is received, a backhaul test is performed between the baseband unit and the fifth connection terminal by using the master clock unit.

And 203, when an uplink decoding test instruction is received, the second port of the control switch switching unit is connected with the uplink signal source unit, and uplink decoding test is performed between the fourth connection end and the baseband unit through the first connection end, the second connection end, the third connection end and the uplink signal source unit.

And 204, when receiving the throughput rate test instruction, controlling the switch switching unit to carry out loop connection on the first connecting end, the second connecting end, the third connecting end and the fourth connecting end, so that the baseband unit carries out throughput rate test through the first front light transmitting port, the second front light transmitting port, the third front light transmitting port and the fourth front light transmitting port when receiving the throughput rate test instruction.

On the basis of the above embodiment, the test module 2 further includes a register, and an output end of the register is connected to a control end of the switch switching unit 21;

the test module 2 is configured to, when receiving a forwarding test instruction, control the register to output a first value so that the second port of the switch switching unit 21 is connected to the slave clock unit 24; when receiving the uplink decoding test instruction, the control register outputs a second value to connect the second port of the switch switching unit 21 with the uplink signal source unit 22; when receiving the throughput rate test instruction, the control register outputs a third value to enable the switch switching unit 21 to perform loop connection on the first connection terminal SFPB0, the second connection terminal SFPB1, the third connection terminal SFPB2, and the fourth connection terminal SFPB 3.

In one embodiment, the test module 2 further includes a register, an output terminal of the register is connected to a control terminal of the switch switching unit 21, and the test module 2 can control the switch switching unit 21 through the register. Specifically, when the test module 2 receives the forwarding test instruction sent by the control module 1, the control register outputs a first value, and after receiving the first value, the switch switching unit 21 connects the second port with the slave clock unit 24 by the switch switching unit 21, so as to start the forwarding test on the baseband unit 3. When the test module 2 receives the uplink decoding test instruction sent by the control module 1, the control register outputs a second value, and after receiving the second value, the switch switching unit 21 connects the second port with the uplink signal source unit 22, so that the uplink decoding test of the baseband unit 3 is started. When the test module 2 receives the throughput rate test instruction sent by the control module 1, the control register outputs a third value, and after receiving the third value, the switch switching unit 21 performs loop connection on the first connection end SFPB0, the second connection end SFPB1, the third connection end SFPB2, and the fourth connection end SFPB3, so that the baseband unit 3 can start to perform the throughput rate test.

On the basis of the test module, the embodiment of the application also provides a method for controlling the switch switching unit, which comprises the following steps:

step 301, when a forwarding test instruction is received, a control register outputs a first value so as to connect a second port of a switch switching unit with a slave clock unit;

step 302, when an uplink decoding test instruction is received, the control register outputs a second numerical value so as to enable a second port of the switch switching unit to be connected with the uplink signal source unit;

in step 303, when receiving the throughput rate test instruction, the control register outputs a third value to enable the switch switching unit to perform loop connection on the first connection end, the second connection end SFPB1, the third connection end and the fourth connection end.

On the basis of the above embodiment, the slave clock unit 24 is specifically configured to, when receiving a forwarding test instruction from the test module 2, transmit a forwarding test packet between the baseband unit 3 and the first connection end SFPB0, the second connection end SFPB1, the third connection end SFPB2, and the fourth connection end SFPB3, perform a forwarding test according to the forwarding test packet, generate a forwarding test result, and then send the forwarding test result to the control module 1.

In this embodiment, after receiving the forwarding test instruction sent by the control module 1, the baseband unit 3 and the test module 2 are connected to the second end of the switch switching unit 21 and the slave clock unit 24, and the slave clock unit 24 on the test module 2 can perform transmission of the forwarding test packet with the master clock unit of the baseband unit 3 through the first connection end SFPB0, the second connection end SFPB1, the third connection end SFPB2, and the fourth connection end SFPB3, and complete the forwarding test according to the transmitted forwarding test packet. For example, the control module 1 logs in the test device through the debug end of the test module 2, and sends a forwarding test instruction to the test module 2, and after receiving the forwarding test instruction, the test module 2 controls the register to output a first value, for example, the first value is 1. At this time, the second port of the switch switching unit 21 is connected with the slave clock unit 24 on the test module 2, the slave clock unit 24 on the test module 2 is in butt joint with the master clock unit of the baseband unit 3, and then the slave clock unit 24 on the test module 2 and the master clock unit of the baseband unit 3 can perform the forward 1588 test. When the forward 1588 test is performed, the Master clock unit (Master) of the baseband unit 3 sends a "synchronization" message to the Slave clock unit 24 (Slave) of the test module 2, and the sending time T1 is recorded in the first register, and the Slave clock unit 24 (Slave) of the test module 2 receives the "synchronization" message and records the received time T2. The Master clock unit (Master) of the baseband unit 3 sends a Follow message to the Slave clock unit 24 (Slave) of the test module 2, embeds the time T1 in the Follow message, sends a Delay request message to the Master clock unit of the baseband unit 3 from the Slave clock unit 24 of the test module 2, and embeds the time stamp T3. The master clock unit of the baseband unit 3 receives the "Delay request" message and remembers the time T4, and the master clock unit of the baseband unit 3 embeds T4 in a "Delay response" (delay_resp) message, which is sent to the slave clock unit 24 of the test module 2. The slave clock unit 24 of the test module 2 can calculate the time Offset (Offset) between itself and the master clock unit of the baseband unit 3 according to T1, T2, T3 and T4, and send the time Offset (Offset) to the control module 1 as a forwarding test result. The control module 1 determines whether the time Offset (Offset) is within 30ns, if so, the forward transmission 1588 passes the test, otherwise, it does not pass.

On the basis of the test module, the embodiment of the invention also provides a method for performing forward test on the baseband unit, which comprises the following steps:

when a forwarding test instruction is received, the forwarding test message is transmitted between the slave clock unit and the baseband unit through the first connecting end, the second connecting end, the third connecting end and the fourth connecting end, so that the slave clock unit performs the forwarding test according to the forwarding test message and generates a forwarding test result, and then the forwarding test result is sent to the control module.

On the basis of the above embodiment, the master clock unit 23 is specifically configured to transmit the backhaul test message between the baseband unit 3 and the fifth connection terminal SFPB4 when the backhaul test instruction is received by the test module 2, so that the baseband unit 3 performs backhaul test according to the backhaul test message and generates a backhaul test result, and then sends the backhaul test result to the control module 1.

In this embodiment, after receiving the backhaul test instruction sent by the control module 1, the baseband unit 3 and the test module 2 transmit the backhaul test message through the fifth connection end SFPB4 and the slave clock unit on the baseband unit 3 by the master clock unit 23 on the test module 2, so that the baseband unit 3 performs backhaul test according to the backhaul test message. Specifically, after the control module 1 sends a backhaul test instruction to the baseband unit 3 and the test module 2, the control module may log in the baseband unit 3 through a debug end of the baseband unit 3, and control a slave clock unit of the baseband unit 3 to run, and a backhaul 1588 test is performed between the master clock unit 23 on the test module 2 and the slave clock unit of the baseband unit 3. The procedure of the backhaul 1588 test is similar to the procedure of the foregoing backhaul 1588 test, and will not be repeated in this embodiment. After the backhaul 158 is tested, the slave clock unit of the baseband unit 3 outputs a time Offset (Offset) with the master clock unit 23 of the test module 2, and sends the time Offset (Offset) as a backhaul test result to the control module 1, and the control module 1 determines whether the time Offset (Offset) is within 30ns, if yes, the backhaul 1588 test passes, otherwise, the time Offset (Offset) does not pass.

On the basis of the test module, the embodiment of the invention also provides a method for carrying out backhaul test on the baseband unit, which comprises the following steps:

when receiving the feedback test instruction, the master clock unit is utilized to transmit the feedback test message between the fifth connection end and the baseband unit, so that the baseband unit performs the feedback test according to the feedback test message and generates a feedback test result, and then sends the feedback test result to the control module.

On the basis of the above embodiment, the uplink signal source unit 22 is specifically configured to, when receiving an uplink decoding test instruction by the test module 2, send an uplink signal to the baseband unit 3 through the first connection end SFPB0, the second connection end SFPB1, the third connection end SFPB2, and the fourth connection end SFPB3, so that the baseband unit 3 performs an uplink decoding test according to the uplink signal and generates an uplink decoding test result, and then send the uplink decoding test result to the control module 1.

In this embodiment, after receiving the uplink decoding test instruction sent by the control module 1, the baseband unit 3 and the test module 2 connect the second end of the switch switching unit 21 with the uplink signal source unit 22, and the uplink signal source unit 22 sends uplink signals to the baseband unit 3 through the first connection end SFPB0, the second connection end SFPB1, the third connection end SFPB2 and the fourth connection end SFPB3, so that the baseband unit 3 performs an uplink decoding test according to the received uplink signals. For example, the control module 1 logs in the test device through the debug end of the test module 2, and sends an uplink decoding test instruction to the test module 2, and after receiving the uplink decoding test instruction, the test module 2 controls the register to output a second value, for example, the second value is 2. At this time, the second port of the switch switching unit 21 is connected to the upstream signal source unit 22 of the test module 2, and the upstream signal source unit 22 starts to send an upstream signal, for example, a 5G upstream signal, to the baseband unit 3. Meanwhile, the control module 1 logs in the baseband unit 3 through the debugging end of the baseband unit 3, the baseband unit 3 is controlled to start executing an uplink decoding program, the uplink decoding program decodes the 5G uplink signal to obtain the number of error packets, the number of error packets is used as an uplink decoding test result to be sent to the control module 1, the control module 1 judges whether the number of error packets is 0, if so, the uplink decoding test is passed, otherwise, the uplink decoding test is not passed.

On the basis of the test module, the embodiment of the invention also provides a method for carrying out uplink decoding test on the baseband unit, which comprises the following steps:

when an uplink decoding test instruction is received, an uplink signal source unit is utilized to send uplink signals to a baseband unit through a first connecting end, a second connecting end, a third connecting end and a fourth connecting end, so that the baseband unit carries out uplink decoding test according to the uplink signals and generates an uplink decoding test result, and then the uplink decoding test result is sent to a control module.

On the basis of the above embodiment, the switch switching unit 21 is specifically configured to short-circuit the first connection end SFPB0 and the second connection end SFPB1, short-circuit the third connection end SFPB2 and the fourth connection end SFPB3 when receiving the throughput rate test instruction, so that the baseband unit 3 performs throughput testing through the first front light port SFPA0, the second front light port SFPA1, the third front light port SFPA2 and the fourth front light port SFPA3 when receiving the throughput rate test instruction, and sends the throughput rate test result to the control module 1 after generating the throughput rate test result.

In this embodiment, after receiving the throughput rate test instruction sent by the control module 1, the baseband unit 3 and the test module 2 short-circuit the first connection end SFPB0 and the second connection end SFPB1, and short-circuit the third connection end SFPB2 and the fourth connection end SFPB3 by the switch switching unit 21, so that when receiving the throughput rate test instruction, the baseband unit 3 performs throughput rate test through the first front light transmission port SFPA0, the second front light transmission port SFPA1, the third front light transmission port SFPA2 and the fourth front light transmission port SFPA 3. Illustratively, the control module 1 logs in the test device through the debug end of the test module 2, and sends a forwarding test instruction to the test module 2, and after receiving the forwarding test instruction, the test module 2 controls the register to output a third value, for example, the first value is 3. At this time, the switching unit 21 shorts the first connection terminal SFPB0 and the second connection terminal SFPB1, and shorts the third connection terminal SFPB2 and the fourth connection terminal SFPB 3. Meanwhile, the control module 1 logs in the baseband unit 3 through the debugging end of the baseband unit 3, and controls the baseband unit 3 to run the throughput rate test program. And then, the throughput test program sends the Ethernet packet through the first front optical port SFPA0, the second front optical port SFPA1, the third front optical port SFPA2 and the fourth front optical port SFPA3 according to the maximum capacity, and receives the returned Ethernet packet after loop-back. And the throughput test program outputs the throughput of the Ethernet packet which is checked by the CRC, and sends the throughput to the control module 1 as a throughput rate test result. And the control module 1 judges whether the throughput is greater than 9Gbps, if so, the throughput rate test passes, otherwise, the throughput rate test does not pass. The reason why the throughput rate test is determined to be passed according to whether the throughput is greater than 9Gbps is that the throughput reaches 9Gbps because the maximum rate of the optical port is 10Gbps and the maximum traffic applied by the baseband unit only needs 7Gbps, thereby meeting the throughput rate test requirement.

On the basis of the test module, the embodiment of the invention also provides a method for testing the throughput rate of the baseband unit, which comprises the following steps:

when receiving the throughput rate test, the control switch switching unit short-circuits the first connecting end and the second connecting end, short-circuits the third connecting end and the fourth connecting end, so that when receiving the throughput rate test instruction, the baseband unit carries out throughput rate test through the first front light transmission port, the second front light transmission port, the third front light transmission port and the fourth front light transmission port, generates a throughput rate test result, and then sends the throughput rate test result to the control module.

On the basis of the above embodiment, the control module 1 includes the control unit 11 and the switch unit 12; the first end of the control unit 11 is connected to the input of the switch unit 12, the first output of the switch unit 12 is connected to the debug end of the baseband unit 3, and the second output of the switch unit 12 is connected to the debug end of the test module 2.

In one embodiment, as shown in fig. 6, the control module 1 includes a control unit 11 and a switch unit 12, where the control unit 11 may be a chip with a control function, such as a processor or a microcontroller, or may also be a device, such as a computer, a tablet, or a notebook. And switch unit 12 is a network device for electrical (optical) signal forwarding that provides a single shared electrical signal path for any two network nodes accessing the switch. For example, in this embodiment, the input end of the switch unit 12 is connected to the first end of the control unit 11, the first output end of the switch unit 12 is connected to the debug end of the baseband unit 3, and the second output end of the switch unit 12 is connected to the debug end of the test module 2, so that the switch unit 12 can provide an independent electrical signal path for the control unit 11 and the baseband unit 3, and an independent electrical signal path for the control unit 11 and the test module 2, respectively.

The control unit 11 is configured to send a forwarding test instruction, a backhaul test instruction, an uplink decoding test instruction, or a throughput rate test instruction to the switch unit 12.

The switch unit 12 is configured to send the forward test instruction, the return test instruction, and the uplink decoding test instruction throughput rate test instruction to the baseband unit 3 and the test module 2.

In this embodiment, the control unit 11 is configured to send a forwarding test instruction, a backhaul test instruction, an uplink decoding test instruction, or a throughput rate test instruction to the switch unit 12, and after receiving the forwarding test instruction, the backhaul test instruction, the uplink decoding test instruction, or the throughput rate test instruction, the switch unit 12 further sends the received instruction to the baseband unit 3 and the test module 2, so that the baseband unit 3 and the test module 2 can execute corresponding tests according to different instructions. In addition, the control unit 11 can also obtain the feedback test result, the uplink decoding test result, and the throughput rate test result from the baseband unit 3 through the switch unit 12, and obtain the forwarding test result from the test module 2. In one embodiment, the control unit 11 is further connected to the display module, and the control unit 11 can send the feedback test result, the uplink decoding test result, the throughput rate test result and the forward test result to the display module for display, so that the operator can check the results.

In the embodiment of the invention, the switch switching unit, the uplink signal source unit, the master clock unit and the slave clock unit are arranged in the test module, when the test module receives the forwarding test instruction, the second port of the switch switching unit is controlled to be connected with the slave clock unit, and the forwarding test is performed between the fourth connection end and the baseband unit through the first connection end, the second connection end, the third connection end and the slave clock unit. When the test module receives the feedback test instruction, the main clock unit is utilized to carry out the feedback test between the fifth connecting end and the baseband unit. When the test module receives an uplink decoding test instruction, the second port of the control switch switching unit is connected with the uplink signal source unit, and uplink decoding test is carried out between the fourth connecting end and the baseband unit through the first connecting end, the second connecting end, the third connecting end and the uplink signal source unit. When the test module receives the throughput rate test instruction, the first connection end, the second connection end, the third connection end and the fourth connection end are connected in a loop, so that the baseband unit performs throughput rate test through the first front light transmission port, the second front light transmission port, the third front light transmission port and the fourth front light transmission port when receiving the throughput rate test instruction. According to the embodiment of the invention, the connection relation of the data transmission port is changed by utilizing the switch switching unit, so that the test module can complete various tests with the baseband unit through the data transmission port, multiple test environments do not need to be built, the test steps are simplified, the test efficiency of the baseband unit is improved, the technical problem of low test efficiency in the process of testing the core function of the baseband unit in the prior art is solved, and the resources occupied and the cost used in the process of testing different functions of the baseband unit are reduced.

The present embodiment also provides a terminal device, as shown in fig. 7, a terminal device 40, the terminal device including a processor 400 and a memory 401;

the memory 401 is used for storing a computer program 402 and transmitting the computer program 402 to the processor;

the processor 400 is configured to execute the steps of one of the above-described embodiments of the baseband unit testing method according to instructions in the computer program 402.

By way of example, the computer program 402 may be partitioned into one or more modules/units that are stored in the memory 401 and executed by the processor 400 to complete the present application. The one or more modules/units may be a series of computer program instruction segments capable of performing the specified functions, which instruction segments describe the execution of the computer program 402 in the terminal device 40.

The terminal device 40 may be a computing device such as a desktop computer, a notebook computer, a palm computer, and a cloud server. The terminal device 40 may include, but is not limited to, a processor 400, a memory 401. It will be appreciated by those skilled in the art that fig. 7 is merely an example of the terminal device 40 and is not limiting of the terminal device 40, and may include more or fewer components than shown, or may combine certain components, or different components, e.g., the terminal device 40 may also include input and output devices, network access devices, buses, etc.

The processor 400 may be a central processing unit (Central Processing Unit, CPU), other general purpose processors, digital signal processors (Digital Signal Processor, DSP), application specific integrated circuits (Application Specific Integrated Circuit, ASIC), off-the-shelf programmable gate arrays (Field-Programmable Gate Array, FPGA) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, or the like. A general purpose processor may be a microprocessor or the processor may be any conventional processor or the like.

The memory 401 may be an internal storage unit of the terminal device 40, for example, a hard disk or a memory of the terminal device 40. The memory 401 may also be an external storage device of the terminal device 40, such as a plug-in hard disk, a Smart Media Card (SMC), a Secure Digital (SD) Card, a Flash memory Card (Flash Card) or the like, which are provided on the terminal device 40. Further, the memory 401 may also include both an internal storage unit and an external storage device of the terminal device 40. The memory 401 is used for storing the computer program and other programs and data required by the terminal device 40. The memory 401 may also be used to temporarily store data that has been output or is to be output.

It will be clear to those skilled in the art that, for convenience and brevity of description, specific working procedures of the above-described systems, apparatuses and units may refer to corresponding procedures in the foregoing method embodiments, which are not repeated herein.

In the several embodiments provided in this application, it should be understood that the disclosed systems, apparatuses, and methods may be implemented in other ways. For example, the apparatus embodiments described above are merely illustrative, e.g., the division of the units is merely a logical function division, and there may be additional divisions when actually implemented, e.g., multiple units or components may be combined or integrated into another system, or some features may be omitted or not performed. Alternatively, the coupling or direct coupling or communication connection shown or discussed with each other may be an indirect coupling or communication connection via some interfaces, devices or units, which may be in electrical, mechanical or other form.

The units described as separate units may or may not be physically separate, and units shown as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units may be selected according to actual needs to achieve the purpose of the solution of this embodiment.

In addition, each functional unit in the embodiments of the present invention may be integrated in one processing unit, or each unit may exist alone physically, or two or more units may be integrated in one unit. The integrated units may be implemented in hardware or in software functional units.

The integrated units, if implemented in the form of software functional units and sold or used as stand-alone products, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present invention may be embodied essentially or in part or all of the technical solution or in part in the form of a software product stored in a storage medium, including instructions for causing a computer device (which may be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: a usb disk, a removable hard disk, a Read-Only Memory (ROM), a random access Memory (RAM, random Access Memory), a magnetic disk, or an optical disk, or other various media in which computer programs can be stored.

The embodiment of the present invention also provides a storage medium containing computer executable instructions, which when executed by a computer processor, are used to perform a method for testing a baseband unit, the method being applicable to a test module in a baseband unit testing device as described above, and comprising the steps of:

Note that the above is only a preferred embodiment of the present invention and the technical principle applied. It will be understood by those skilled in the art that the embodiments of the present invention are not limited to the particular embodiments described herein, but are capable of numerous obvious changes, rearrangements and substitutions without departing from the scope of the embodiments of the present invention. Therefore, while the embodiments of the present invention have been described in connection with the above embodiments, the embodiments of the present invention are not limited to the above embodiments, but may include many other equivalent embodiments without departing from the spirit of the embodiments of the present invention, and the scope of the embodiments of the present invention is determined by the scope of the appended claims.

Claims

1. A baseband unit testing device, comprising: the device comprises a control module and a test module, wherein a first end of the control module is used for being connected with a debugging end of a baseband unit, a second end of the control module is connected with the debugging end of the test module, and a data transmission port of the test module is used for being connected with an optical port of the baseband unit;

the test module is used for carrying out the forwarding test between the data transmission port and the baseband unit when receiving the forwarding test instruction; the data transmission port is used for receiving the backhaul test instruction and carrying out backhaul test between the data transmission port and the baseband unit; when receiving an uplink decoding test instruction, the uplink decoding test is carried out between the data transmission port and the baseband unit; when receiving the throughput rate test instruction, the data transmission port is connected in a loop so that the baseband unit can perform the throughput rate test;

The data transmission port of the test module comprises a first connection end, a second connection end, a third connection end and a fourth connection end; the test module comprises a switch switching unit, an uplink signal source unit and a slave clock unit;

the first port of the switch switching unit is connected with the first connecting end, the second connecting end, the third connecting end and the fourth connecting end, and the second port of the switch switching unit is used for being connected with the slave clock unit when the test module receives the forward test instruction; the test module is used for connecting with the uplink signal source unit when receiving the uplink decoding test instruction; the switch switching unit is further configured to perform loop connection on the first connection end, the second connection end, the third connection end, and the fourth connection end when the test module receives the throughput rate test instruction;

the slave clock unit is used for carrying out the forwarding test between the first connecting end, the second connecting end, the third connecting end, the fourth connecting end and the baseband unit when the test module receives the forwarding test instruction;

The uplink signal source unit is configured to perform the uplink decoding test between the baseband unit and the fourth connection end through the first connection end, the second connection end, the third connection end, and the first connection end when the test module receives the uplink decoding test instruction;

the data transmission port of the test module further comprises a fifth connection end, the optical port of the baseband unit comprises a first front optical port, a second front optical port, a third front optical port, a fourth front optical port and a back optical port, the first connection end is used for being connected with the first front optical port, the second connection end is used for being connected with the second front optical port, the third connection end is used for being connected with the third front optical port, the fourth connection end is used for being connected with the fourth front optical port, and the fifth connection end is used for being connected with the back optical port;

the uplink signal source unit is specifically configured to send an uplink signal to the baseband unit through the first connection end, the second connection end, the third connection end and the fourth connection end when the test module receives the uplink decoding test instruction, so that the baseband unit performs an uplink decoding test according to the uplink signal and generates an uplink decoding test result, and then sends the uplink decoding test result to the control module.

2. The baseband unit testing device according to claim 1, wherein the testing module further comprises a master clock unit;

the main clock unit is connected with the fifth connection end and is used for carrying out the backhaul test between the fifth connection end and the baseband unit when the test module receives the backhaul test instruction.

3. The baseband unit testing device according to claim 2, wherein the testing module further comprises a register, and an output end of the register is connected to the control end of the switch switching unit;

the test module is used for controlling the register to output a first numerical value when receiving the forward test instruction so as to enable the second port of the switch switching unit to be connected with the slave clock unit; when the uplink decoding test instruction is received, controlling the register to output a second numerical value so that a second port of the switch switching unit is connected with the uplink signal source unit; and the register is used for controlling the register to output a third value when the throughput rate test instruction is received, so that the switch switching unit carries out loop connection on the first connecting end, the second connecting end, the third connecting end and the fourth connecting end.

4. The baseband unit testing device according to claim 1, wherein the slave clock unit is specifically configured to transmit a forwarding test packet between the baseband unit and the first, second, third, and fourth connection terminals through the first, second, and third connection terminals when the test module receives the forwarding test instruction, and send the forwarding test result to the control module after performing the forwarding test according to the forwarding test packet and generating a forwarding test result.

5. The baseband unit testing device according to claim 2, wherein the master clock unit is specifically configured to transmit a backhaul test message between the fifth connection end and the baseband unit when the test module receives the backhaul test instruction, so that the baseband unit performs the backhaul test according to the backhaul test message and generates a backhaul test result, and then sends the backhaul test result to the control module.

6. The baseband unit testing device according to claim 1, wherein the switch switching unit is specifically configured to short-circuit the first connection end and the second connection end, short-circuit the third connection end and the fourth connection end when the throughput rate testing instruction is received, so that the baseband unit performs throughput testing through the first front light port, the second front light port, the third front light port and the fourth front light port when the throughput rate testing instruction is received, and sends the throughput rate testing result to the control module after the throughput rate testing result is generated.

7. The baseband unit testing device according to claim 1, wherein the control module comprises a control unit and a switch unit; the first end of the control unit is connected with the input end of the switch unit, the first output end of the switch unit is connected with the debugging end of the baseband unit, and the second output end of the switch unit is connected with the debugging end of the test module;

the control unit is configured to send the forwarding test instruction, the backhaul test instruction, the uplink decoding test instruction, or the throughput rate test instruction to the switch unit;

the switch unit is configured to send the forward test instruction, the return test instruction, the uplink decoding test instruction, or the throughput rate test instruction to the baseband unit and the test module.

8. A method for testing a baseband unit, which is suitable for a testing module in a baseband unit testing apparatus according to any one of claims 1 to 7, and includes:

when receiving the throughput rate test instruction sent by the control module, carrying out loop connection on the data transmission port so as to enable the baseband unit to carry out throughput rate test;

the data transmission port of the test module comprises a first connection end, a second connection end, a third connection end and a fourth connection end; the test module comprises a switch switching unit, an uplink signal source unit and a slave clock unit, and the method comprises the following steps:

when a forwarding test instruction is received, a second port of the switch switching unit is controlled to be connected with the slave clock unit, and forwarding test is carried out between the first connection end, the second connection end, the third connection end, the fourth connection end and the baseband unit by using the slave clock unit;

when an uplink decoding test instruction is received, a second port of the switch switching unit is controlled to be connected with the uplink signal source unit, and uplink decoding test is carried out by utilizing the uplink signal source unit through the first connecting end, the second connecting end, the third connecting end, the fourth connecting end and the baseband unit;

When receiving a throughput rate test instruction, controlling the switch switching unit to carry out loop connection on the first connecting end, the second connecting end, the third connecting end and the fourth connecting end;

wherein, still include:

and when the uplink decoding test instruction is received, the uplink signal source unit is utilized to send uplink signals to the baseband unit through the first connecting end, the second connecting end, the third connecting end and the fourth connecting end, so that the baseband unit performs uplink decoding test according to the uplink signals and generates an uplink decoding test result, and then the uplink decoding test result is sent to the control module.

9. A terminal device, characterized in that the terminal device comprises a processor and a memory;

the memory is used for storing a computer program and transmitting the computer program to the processor;

the processor is configured to execute a baseband unit testing method according to claim 8 according to instructions in the computer program.

10. A storage medium storing computer executable instructions which, when executed by a computer processor, are adapted to perform a baseband unit testing method according to claim 8.