CN115511776A - 一种用于小目标检测的模型训练方法、检测方法及装置 - Google Patents
一种用于小目标检测的模型训练方法、检测方法及装置 Download PDFInfo
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- CN115511776A CN115511776A CN202110700013.XA CN202110700013A CN115511776A CN 115511776 A CN115511776 A CN 115511776A CN 202110700013 A CN202110700013 A CN 202110700013A CN 115511776 A CN115511776 A CN 115511776A
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- 238000001514 detection method Methods 0.000 title claims abstract description 134
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- 238000013178 mathematical model Methods 0.000 claims description 19
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/10—Segmentation; Edge detection
- G06T7/11—Region-based segmentation
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/10—Image acquisition modality
- G06T2207/10004—Still image; Photographic image
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T2207/00—Indexing scheme for image analysis or image enhancement
- G06T2207/20—Special algorithmic details
- G06T2207/20021—Dividing image into blocks, subimages or windows
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CN202110700013.XA CN115511776A (zh) | 2021-06-23 | 2021-06-23 | 一种用于小目标检测的模型训练方法、检测方法及装置 |
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Effective date of registration: 20240405 Address after: No. 101, Building 7, Jinyuan Community, No. 38 Hetai Road, Yuetang Street, Hetang District, Zhuzhou City, Hunan Province, 2011 Applicant after: Zhuzhou Yawen Technology Co.,Ltd. Country or region after: China Address before: 201821 Room 1119, Building A, No. 1355, Chengbei Road, Jiading Industrial Zone, Jiading District, Shanghai Applicant before: Shanghai Lianlu Semiconductor Technology Co.,Ltd. Country or region before: China |
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