CN1155070A - Dynamic error correction device of digital measuring instrument - Google Patents

Dynamic error correction device of digital measuring instrument Download PDF

Info

Publication number
CN1155070A
CN1155070A CN 95117876 CN95117876A CN1155070A CN 1155070 A CN1155070 A CN 1155070A CN 95117876 CN95117876 CN 95117876 CN 95117876 A CN95117876 A CN 95117876A CN 1155070 A CN1155070 A CN 1155070A
Authority
CN
China
Prior art keywords
data
instrument
waveform
dynamic error
waveform generator
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN 95117876
Other languages
Chinese (zh)
Inventor
肖峰
高德香
胡占明
方向君
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
No208 Institute Of China Ordnance Industry
Original Assignee
No208 Institute Of China Ordnance Industry
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by No208 Institute Of China Ordnance Industry filed Critical No208 Institute Of China Ordnance Industry
Priority to CN 95117876 priority Critical patent/CN1155070A/en
Publication of CN1155070A publication Critical patent/CN1155070A/en
Pending legal-status Critical Current

Links

Images

Landscapes

  • Arrangements For Transmission Of Measured Signals (AREA)

Abstract

The present invention relates to a correction device for dynamic error of digitized measuring instrument, including D/A conversion type waveform generator and computer. The standard waveform data is stored in the memory of the waveform generator, and its number is equal to the number of samples of the instrument to be corrected. Said computer can be used for receiving the output data of the instrument to be corrected, and can compare said data with the data stored in the memory of the waveform generator point-by-point so as to solve for dynamic error of every point. Besides, it can represent the relationship between the dynamic error and signal spectrum and the relationship of dynamic error and waveform.

Description

Dynamic error correction device of digital measuring instrument
The present invention proposes a kind of dynamic error correction device of digital measuring instrument, comprises waveform generator and microcomputer.Said waveform generator is made of storer that has Wave data and D/A switching network.The digitized measurement that relates to electric signal.
Digitizing Electrical Measuring Instrument (for example instantaneous state recorder, signal analyzer etc.) is converted to the basis with A/D, and its input quantity is an analog quantity, and output quantity is a digital quantity.Adopt traditional sinusoidal wave frequency sweep method amplitude calibration can not accurately calibrate this quasi-instrument.Before the present invention, prior art adopts waveform generator to calibrate.Waveform generator comprises the read only memory ROM and the D/A transducer that this Wave data is converted to analog voltage signal that there are Wave data.It can calibrate the error that more can reflect instrument than sinusoidal wave frequency sweep method amplitude for instrument to be calibrated provides a Dynamic Signal input that waveform is close with actual conditions, helps to simplify calibration operation.For example, the B201 prover of commercially available Austrian AVL company comes to this and constitutes.Owing to the maximal value of instrument output to be calibrated and the maximal value of standard signal can only be made amplitude relatively, the calibration instrument of prior art and calibration steps can not reflect treat in the instrument quantizing process of school " lose the sign indicating number " with " and rank " error, can not reflect dynamic error and signal spectrum, and the relation between dynamic error and waveform and the waveform character point.
The objective of the invention is at the above-mentioned deficiency of prior art and propose a kind of new dynamic error correction device of digital measuring instrument.It can provide respectively instrument to be calibrated duration of signal in the dynamic error of each sampled point so that more accurate and reflect the levels of precision of instrument objectively.
The present invention has realized above-mentioned purpose by the numeric ratio method that the output data and the reference waveform data in the said storer of instrument to be calibrated are done pointwise.The dynamic error correction device of digital measuring instrument that is proposed comprises waveform generator and computing machine two parts.Said waveform generator comprises storer and the D/A converting network that this Wave data can be converted to analog voltage signal that has Wave data.Different is the strict equity of the number of the Wave data of being deposited in the storer of the present invention and the number of samples of surveying instrument to be calibrated.Computing machine receives the output data of instrument to be calibrated, and the numeric ratio that the reference waveform data in itself and the storer are done pointwise, obtains the dynamic error of this instrument in each sample point.
Compared with prior art, owing to adopted the comparison of digital quantity, and there are strict digital quantity corresponding relation, calibrating installation of the present invention to record to treat the error amount of each sampled point in the school instrument is the duration of input signal between output quantity and the input quantity.Analyze " losing sign indicating number " and the relation between " and rank " error, dynamic error and signal spectrum that result relatively just can find instrument to be calibrated, and the relation of dynamic error and waveform and waveform character point, thereby can reflect the dynamic error of instrument to be calibrated more accurately.
The present invention includes three frame accompanying drawings.Wherein
Fig. 1 is a theory diagram of the present invention;
Fig. 2 is the Wave data synoptic diagram of certain automatic mechanism of small aims movement velocity curve;
Fig. 3 is when importing as waveform with Fig. 2 curve, the result that calibrating installation of the present invention is calibrated the SM2100B signal analyzer of Japanese rock fine jade communication Co., Ltd. (IWATSU).The top of figure is the outline line of waveform, and the below is the error function curve of this instrument.
According to instructions of the present invention also with reference to the accompanying drawings, the professional is easy to implement the every claim of the present invention.Below will contrast drawing reference numeral and be described in more detail embodiment of the present invention.
As shown in Figure 1, calibrating installation of the present invention is made of D/A changing type waveform generator (1) and computing machine (4).Wherein waveform generator comprises having certain reference waveform memory of data (2) and the D/A converting network (3) that this Wave data can be converted to analog voltage signal.Change the sample rate and the reference voltage of D/A transducer, just can regulate the width and the amplitude of output simulating signal easily.
As previously mentioned, the present invention's number strictness of depositing the Wave data of storer in equals the number of samples of instrument to be calibrated (7).For each waveform, may need the data of multiple sampling number.To this, there are three kinds of alternative embodiments at least:
One, said storer has enough big storage space, stores each point data of corresponding different sample rates respectively.The reason that this scheme can realize is that the sample rate of digital measuring instrument normally stepping is adjustable.
Two, the corresponding the most frequently used or Wave data of high sample rate of storage only utilizes interpolation or smoothing algorithm to obtain each point data of corresponding different sample rates.
Three, all derive its mathematical model for every kind of waveform, utilize this model to obtain each point data of corresponding different sample rates.
Adopt the method for random writing can save storage space.Specifically, in waveform generator, adopt the storer of being convenient to write again, in said computing machine, set up waveform database (5), according to above-mentioned any mode storage standards Wave data, and in computing machine, be provided with to waveform generator transmission data and write the device of described storer.Before each calibration, select or generate one group of Wave data according to the sample rate of required waveform and instrument to be calibrated, be transferred to the reference waveform generator and write in the described storer, for the usefulness of D/A conversion.
The direct advantage of another of random writing method is to be convenient to select the different wave data.
For ease of rewrite data, this scheme requires to adopt dynamic storage (RAM).Because the read/write speed of RAM is higher, an attendant advantages of this scheme is to make calibrating installation of the present invention can adapt to the calibration of the very high digitized instrument of sample rate.
During actual alignment, the analog output signal of D/A transducer (3) is sent into the input end of instrument to be calibrated (7).The output of instrument to be calibrated is sent into computing machine (4) through interface circuit (6).Calibration operation needs may further comprise the steps at least:
selects or generates one group of reference waveform data;
transmits it to the reference waveform generator and writes in the said storer;
starts the D/A conversion process, sends into the D/A transducer by the Wave data in certain time interval readout memory successively, is transformed to the aanalogvoltage waveform;
The computing machine receives the digital quantity output of instrument to be calibrated through interface circuit, and carries out pointwise with the Wave data of being stored and compare, and the difference of each sample point two data is the dynamic error of this instrument in this sample point.
Be used as the comparative standard Wave data in the computing machine and can directly take from said database (5), also can take from the storer (2) of waveform generator.
Analysis chart 3 error function curves are as can be seen: this instrument to be calibrated is bigger in the catastrophe point place error of correspondence input waveform, and error is less in the signal smoothing district.This shows that calibrating installation of the present invention can reflect the dynamic error of instrument to be calibrated and the relation of waveform frequency spectrum, and the corresponding relation between dynamic error and the waveform character point.
When the error amount of a certain sample point obviously greater than around during other each points, should consider that " and rank " or " losing sign indicating number " error may take place this sample point.By situation, help finally to determine the character of error with reference to the following synchronizing signal that will describe.
Constitute in the synoptic diagram in Fig. 2 data, added guiding, synchronous and zero correction signal in the front of reference waveform respectively.
Pilot signal is by n 1Individual scale-of-two " 000000 ... 00 " constitutes.Before treating that the school instrument is triggered and computing machine begins reading, calibrating installation should be in reset mode, and the output voltage of the effect of this pilot signal D/A network when being to guarantee reset mode is 0.
Synchronizing signal is by n 2Individual scale-of-two " 101010 ... 10 " constitutes.Its effect at first is to reliable trigger pip of instrument to be calibrated, the triggering level that no longer needs to regulate instrument when guaranteeing calibration.Secondly, it can be used as computing machine carry out numeric ratio than the time registration mark.The sequence of this at last " 101010 ... 10 " helps to determine to have occurred " losing sign indicating number " or " and rank " on which binary digit.
The zero correction signal is by n 3Individual scale-of-two " 000000 ... 00 " constitutes.It can be used to proofread and correct the zero level error of instrument to be calibrated.If after instrument to be calibrated outputs to computing machine, be not 0 to data that should signal, then show to have zero-error, should correspondingly deduct this zero-error at thereafter numeric ratio.
Here positive integer n 1, n 2And n 3Can arbitrarily select.
As everyone knows, digitized instrument " losing sign indicating number " or " and rank " error have the characteristics by the 2x increase and decrease.When the data of a certain sampled point and the difference of reference waveform data have this characteristics, and synchronizing signal is when also existing onesize error, can confirm that then this treats that " losing sign indicating number " or " and rank " have taken place at x binary digit place of this sampled point the school instrument.This effect is that existing calibrating installation is beyond one's reach.
For changing the output amplitude of calibrating installation simulating signal of the present invention subtly, present embodiment adopts second D/A transducer (8) to provide reference voltage for an aforesaid D/A transducer (3), and the numeral input that makes the 2nd D/A transducer takes from a manual toggle switch (9), perhaps a certain can be by the memory cell of program rewriting.Both of these case can be obtained the advantage that makes things convenient for intuitively and be convenient to sequencing respectively.
Calibrating installation of the present invention can be made into the prover that links to each other and use with microcomputer.Because calibrating installation of the present invention is convenient to sequencing control, thereby also is fit to make the plug-in card of microcomputer, the function of expanding universal microcomputer makes it can be used for the calibration of digital measuring instrument dynamic error.

Claims (4)

1. the dynamic error correction device of digital measuring instrument, comprise waveform generator (1) and computing machine (4), said waveform generator comprises there is reference waveform memory of data (2), with a D/A converting network (3) that this Wave data can be converted to analog voltage signal, feature of the present invention is: the number of the Wave data of being deposited in the said storer equates with the number of samples of surveying instrument to be calibrated (7), said computing machine receives the output data of instrument to be calibrated, and the numeric ratio that itself and said Wave data are done pointwise, obtains the dynamic error of this instrument at each point.
2, calibrating installation as claimed in claim 1, it is characterized in that: in the reference waveform generator, adopt the storer of being convenient to write again, there is the reference waveform database in the said computing machine, and has to waveform generator transmission data and write the device of said storer.
3, calibrating installation as claimed in claim 1 or 2 is characterized in that: the front portion of said reference waveform data is contained n successively 1The vectoring information that individual " 000000 ... 00 " constitutes, n 2The synchrodata that individual " 101010 ... 10 " constitute, n 3The zero correction data that individual " 000000 ... 00 " constitutes.
4, as claim 1,2 or 3 described calibrating installations, it is characterized in that: adopt the 2nd D/A transducer (8) to provide reference voltage for an aforesaid D/A transducer (3), and make the numeral input of the 2nd D/A transducer take from a manual toggle switch (9) or a certain can be by the memory cell of program rewriting.
CN 95117876 1995-12-08 1995-12-08 Dynamic error correction device of digital measuring instrument Pending CN1155070A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN 95117876 CN1155070A (en) 1995-12-08 1995-12-08 Dynamic error correction device of digital measuring instrument

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN 95117876 CN1155070A (en) 1995-12-08 1995-12-08 Dynamic error correction device of digital measuring instrument

Publications (1)

Publication Number Publication Date
CN1155070A true CN1155070A (en) 1997-07-23

Family

ID=5081414

Family Applications (1)

Application Number Title Priority Date Filing Date
CN 95117876 Pending CN1155070A (en) 1995-12-08 1995-12-08 Dynamic error correction device of digital measuring instrument

Country Status (1)

Country Link
CN (1) CN1155070A (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101267207B (en) * 1999-03-24 2011-12-28 株式会社爱德万测试 A/D converter and calibration unit
CN107095676A (en) * 2017-04-13 2017-08-29 深圳市美好创亿医疗科技有限公司 The method of testing and system of lung function instrument data processing accuracy

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN101267207B (en) * 1999-03-24 2011-12-28 株式会社爱德万测试 A/D converter and calibration unit
CN107095676A (en) * 2017-04-13 2017-08-29 深圳市美好创亿医疗科技有限公司 The method of testing and system of lung function instrument data processing accuracy

Similar Documents

Publication Publication Date Title
CN1187620C (en) Method for time-marking of waveshape edge of input signals
US6269317B1 (en) Self-calibration of an oscilloscope using a square-wave test signal
US4283713A (en) Waveform acquisition circuit
CN1230683C (en) Simultaneous display of primary measurement values and derived parameters
EP0107050B1 (en) Signal generator for digital spectrum analyzer
CN1029345C (en) Linearizing non-linear analog-to-digital process and circuit
CN1637422A (en) Electrical power measuring devices
US4149120A (en) Circuit arrangement for linearizing the output signal of a test sensor
GB2155288A (en) Data display method and apparatus
CN1204414C (en) Device for automatic correcting measuring module
CN1155070A (en) Dynamic error correction device of digital measuring instrument
EP0191478A2 (en) Measurement circuit for evaluating a digital-to-analog converter
US5933013A (en) Calibration circuit for calibrating frequency characteristics of an AC/DC converter
CN1625841A (en) Digital-to-analog converter with integrated test circuit
CN2630863Y (en) Automatic calibrating device for measuring module
CN1114112C (en) Calibration method for electronic electricity meter
CN112067870B (en) Automatic oscilloscope parameter measuring device and method based on FPGA
CN114859281A (en) Calibration device and method for function generator
CN1137386C (en) Signal sampling method and signal detection display system
CN207882426U (en) A kind of system for being calibrated to the absolute delay time
CN1213377C (en) Device and method for detecting long term frequency stability of clock
JP3666864B2 (en) Waveform observation device
CN116312308B (en) Output voltage calibration method and device for shortening Bar and storage medium
CN2137057Y (en) Scanning frequency equivalent meter for accurately determining loudness evaluation value
Pajkossy et al. Fast algorithm for differintegration

Legal Events

Date Code Title Description
C10 Entry into substantive examination
SE01 Entry into force of request for substantive examination
C06 Publication
PB01 Publication
C01 Deemed withdrawal of patent application (patent law 1993)
WD01 Invention patent application deemed withdrawn after publication