CN115493859A - Method, device, equipment and medium for determining equipment health parameters - Google Patents
Method, device, equipment and medium for determining equipment health parameters Download PDFInfo
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- CN115493859A CN115493859A CN202110673088.3A CN202110673088A CN115493859A CN 115493859 A CN115493859 A CN 115493859A CN 202110673088 A CN202110673088 A CN 202110673088A CN 115493859 A CN115493859 A CN 115493859A
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Abstract
The application discloses a method, a device and a medium for determining equipment health parameters, wherein the equipment comprises a board card, the board card comprises a functional circuit, and the functional circuit comprises components; the method comprises the following steps: determining a first parameter influencing a failure mode of the component according to a failure mechanism of the component; determining a target parameter with a reference degree score larger than a preset score from the first parameters, wherein the reference degree score is obtained through objective data scoring, and the reference degree score is positively correlated with the dimensionality number of the objective data; determining a second parameter from the target parameters according to the influence of the target parameters on the failure mode of the functional circuit; and determining the health parameters from the second parameters according to the influence of the second parameters on the failure mode of the board card. In this manner, the method enables a lower cost and accurate determination of device health parameters.
Description
Technical Field
The present application relates to the field of nuclear power detection technologies, and in particular, to a method and an apparatus for determining a health parameter of a device, a computing device, and a computer-readable storage medium.
Background
Health parameters refer to parameters that affect the state of health. For example, for a device, a health parameter of the device is a parameter that has an impact on the health state of the device. In a nuclear power control scenario, the device may be a Distributed Control System (DCS). Over time, the health state of the distributed control system gradually deteriorates until the distributed control system cannot normally operate, and the health parameters of the distributed control system are correspondingly changed.
In a related technical scheme, the health parameters of the equipment can be obtained through a test method. Specifically, in order to obtain the health parameters of the equipment, the staff performs accelerated aging tests on the equipment to obtain the parameters which influence the health state of the equipment in the gradual deterioration process, and then the parameters are used for predicting the health state of the equipment.
However, the dependence of the test method on the subjective experience of the worker is strong, and the reference value of the parameters obtained by the test method is poor. For example, through a test method, a worker considers that the parameter affecting the health state of the equipment is the parameter a according to subjective experience, and the parameter actually affecting the health state of the equipment is the parameter B, namely the reference value of the parameter a is poor. In addition, the above test method requires high cost, and in the case of electronic products, it often takes several months of test time to observe the deviation of the parameters from the normal values.
Accordingly, there is a need for a method for determining health parameters of a device accurately at low cost.
Disclosure of Invention
In order to solve the technical problem, the application provides a method for determining the health parameters of the equipment, and the method can determine the more accurate health parameters under the condition of low cost.
The embodiment of the application discloses the following technical scheme:
in a first aspect, the present application provides a method for determining health parameters of a device, where the device includes a board card, where the board card includes a functional circuit, and the functional circuit includes a component; the method comprises the following steps:
determining a first parameter influencing a failure mode of the component according to a failure mechanism of the component;
determining a target parameter with a reference degree score larger than a preset score from the first parameters, wherein the reference degree score is obtained through objective data scoring, and the reference degree score is positively correlated with the dimensionality number of the objective data;
determining a second parameter from the target parameters according to the influence of the target parameters on the failure mode of the functional circuit;
and determining the health parameters from the second parameters according to the influence of the second parameters on the failure mode of the board card.
Optionally, the health parameter is used to indicate a health status of the device, and the method further includes:
and when the difference value between the health parameter of the equipment and the reference value is larger than a preset difference value threshold value, generating feedback information.
Optionally, the determining, from the first parameters, a target parameter whose referenceable degree score is greater than a preset score includes:
sorting the parameters in the first parameters according to the scores of the referential degrees of the parameters in the first parameters to obtain sorting results;
determining a preset score according to the sorting result;
and determining the parameter of which the score of the referable degree of the parameter in the first parameter is larger than the preset score as the target parameter.
Optionally, the determining a preset score according to the sorting result includes:
determining the number of targets according to a preset proportion and the number of parameters in the first parameters;
determining a target serial number according to the target number;
and determining the score of the referential degree of the parameter corresponding to the target sequence number in the sequencing result as a preset score.
Optionally, the determining a second parameter from the target parameters according to the influence of the target parameters on the failure mode of the functional circuit includes:
when the parameters in the target parameters have influence on a first failure mode of the functional circuit, judging whether the parameters influencing the first failure mode are determined as parameters in a second parameter or not;
if not, determining the parameters influencing the first failure mode as the parameters in the second parameters.
Optionally, the determining the parameter affecting the first failure mode as a parameter in the second parameters includes:
and determining the parameters influencing the first failure mode as parameters in the second parameters according to the collectability of the parameters influencing the first failure mode.
Optionally, the determining the health parameter from the second parameter according to the influence of the second parameter on the failure mode of the board card includes:
when the parameters in the second parameters have influence on a second failure mode of the board card, judging whether the parameters influencing the second failure mode are determined as parameters in the health parameters;
if not, determining the parameters affecting the second failure mode as the parameters in the health parameters.
In a second aspect, the present application provides a device for determining health parameters of an apparatus, where the apparatus includes a board card, the board card includes a functional circuit, and the functional circuit includes components; the device comprises:
the first-stage parameter determining module is used for determining a first parameter influencing a failure mode of the component according to a failure mechanism of the component; determining a target parameter with a referable degree score larger than a preset score from the first parameters, wherein the referable degree score is obtained through objective data scoring, and the referable degree score is positively correlated with the dimensionality number of the objective data;
the second-stage parameter determining module is used for determining a second parameter from the target parameters according to the influence of the target parameters on the failure mode of the functional circuit;
and the health parameter determining module is used for determining the health parameters from the second parameters according to the influence of the second parameters on the failure modes of the board card.
In a third aspect, the present application provides a computing device comprising a processor and a memory;
the processor is configured to execute instructions stored in the memory to cause the computing device to perform the method of any of the first aspects described above.
In a fourth aspect, the present application provides a computer-readable storage medium comprising instructions that instruct a computing device in the third aspect to perform the method of any of the first aspect.
According to the technical scheme, the method has the following advantages:
according to the method for determining the health parameters of the equipment, the equipment comprises a board card, the board card comprises a functional circuit, and the functional circuit comprises components. According to the method, a first parameter influencing a failure mode of the component is determined through a failure mechanism of the component, then the referable degree of the first parameter is scored according to objective data, the score of the referable degree is positively correlated with the number of dimensions adopting the objective data, and the parameter of which the score of the referable degree is larger than a preset score is taken as a target parameter. And determining a second parameter from the target parameters according to the influence of the target parameters on the failure mode of the functional circuit, and determining health parameters from the second parameter according to the influence of the second parameter on the failure mode of the board card. The health parameter is obtained through the target parameter with higher referential degree, so that the health parameter has better referential value.
Further, the method determines a second parameter from the target parameters based on the influence of the failure mode of the component on the failure mode of the functional circuit, and then determines the health parameter from the second parameter through the influence of the failure mode of the functional circuit on the failure mode of the board card. The method can accurately determine the health parameters of the equipment without high cost.
Drawings
In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present application, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a schematic diagram of a P-F curve provided in an embodiment of the present application;
FIG. 2 is a flow chart of a method for determining health parameters of a device according to an embodiment of the present disclosure;
FIG. 3 is a flowchart of a method for determining target parameters according to an embodiment of the present disclosure;
FIG. 4 is a flowchart of a method for determining a second parameter from a target parameter according to an embodiment of the present disclosure;
FIG. 5 is a flowchart of a method for determining a health parameter from a second parameter according to an embodiment of the present application;
fig. 6 is a schematic diagram of an apparatus for determining a health parameter of a device according to an embodiment of the present application.
Detailed Description
In order to make the technical solutions of the present application better understood, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application, and it is obvious that the described embodiments are only a part of the embodiments of the present application, and not all of the embodiments. All other embodiments obtained by a person of ordinary skill in the art based on the embodiments in the present application without making any creative effort belong to the protection scope of the present application.
To facilitate understanding by those skilled in the art, the technical terms referred to in the present application will be described below.
Health parameters refer to parameters that affect the state of health. For example, for a device, a health parameter of the device is a parameter that has an impact on the health state of the device. In a nuclear power control scenario, the device may be a Distributed Control System (DCS). Over time, the health state of the distributed control system gradually deteriorates until the distributed control system cannot normally operate, and the health parameters of the distributed control system are correspondingly changed.
As shown in fig. 1, which shows a schematic of a P-F curve. It can be seen from the figure that the health state (e.g. function, life, performance) of the device is gradually deteriorated, and the health parameters of the device are correspondingly changed. The health state of the equipment can be determined by monitoring the health parameters of the equipment, so that the equipment can be subjected to adaptive maintenance or other treatment in time, and the equipment is prevented from entering a fault state.
In a related technical scheme, the health parameters of the equipment can be obtained through a test method. Specifically, the equipment is subjected to an accelerated aging test, and first, the equipment is subjected to a background test to find out a limit environment (such as temperature, humidity, vibration, and the like) in which the equipment can normally operate. Secondly, a long-term accelerated aging test is carried out by adopting test conditions slightly lower than a limit environment. In the process, parameters of the equipment are determined based on subjective experience of workers, and then the parameters are monitored until the equipment fails.
However, the above test method has strong dependence on subjective experience of workers, and thus the reference value of the parameters obtained by the test method is poor. For example, through a test method, a worker considers that the parameter affecting the health state of the equipment is the parameter a according to subjective experience, and the parameter actually affecting the health state of the equipment is the parameter B, namely the reference value of the parameter a is poor. In addition, the above test method requires high cost, and in the case of electronic products, it often takes several months of test time to observe the deviation of the parameters from the normal values.
In view of the above, the present application provides a method of determining a health parameter of a device, which method may be performed by an evaluation device. Specifically, the equipment comprises a board card, the board card comprises a functional circuit, the functional circuit comprises components, and the method comprises the following steps: the evaluation equipment determines a first parameter influencing a failure mode of the component according to a failure mechanism of the component, and then determines a target parameter of which the reference degree score is larger than a preset score from the first parameter, wherein the reference degree score is obtained by objective data scoring, and the more the dimensionality of the objective data is, the higher the reference degree score is. The evaluation equipment determines a second parameter from the target parameters according to the influence of the target parameters on the failure mode of the functional circuit, and determines health parameters from the second parameter according to the influence of the second parameter on the failure mode of the board card. As such, the referenceable cost of the health parameter is high, and the health parameter does not need to be determined at a high cost.
The method for determining the equipment health parameters provided by the embodiment of the application can be applied to nuclear power control scenes. In a nuclear power control scenario, the evaluation device can determine the health parameters of the distributed control system through the method, so as to represent the health state of the distributed control system through the health parameters. Therefore, fault state early warning, residual life prediction, future health state prediction and maintenance strategy formulation of the distributed control system can be realized, and the method can realize that the specific operation condition (such as health parameters) of the distributed control system is used for carrying out maintenance and other treatment on the distributed control system.
In order to make the technical solution of the present application clearer and easier for a person skilled in the art to understand, the following takes an example of determining a health parameter of a distributed control system by an evaluation device, and describes a method for determining a health parameter of a device provided in an embodiment of the present application.
As shown in FIG. 2, a flow chart of a method of determining a health parameter of a device, which may be a distributed control system, is shown. In some embodiments, the distributed control system includes a board card including functional circuitry including components. The method comprises the following steps:
s201: the evaluation equipment determines a first parameter influencing a failure mode of the component according to a failure mechanism of the component.
A component refers to an electronic component, for example, electronic components including, but not limited to: resistors, capacitors, inductors, potentiometers, electron tubes, radiators, electromechanical elements, connectors, semiconductor discrete devices, electroacoustic devices, laser devices, electronic display devices, photoelectric devices, sensors, power supplies, switches, micro-special motors, electronic transformers, relays, printed circuit boards, integrated circuits, various circuits, piezoelectricity, crystals, quartz, ceramic magnetic materials, base substrates for printed circuits, materials special for electronic functional processes, electronic adhesive (tape) products, electronic chemical materials, parts and the like
The failure mechanism is the cause of the failure mode. For a component, the failure mechanism of the component is the cause of the component failure mode. For electronic products, failure mechanisms include electromigration, silver ion migration, corrosion, dendrite growth, hot carriers, and the like.
Failure mode refers to the manner in which failure occurs, such as overvoltage, overcurrent, etc.
The components are the basis of the functional circuit, and the functional circuit is the basis of the board card. Thus, the evaluation equipment needs to determine the health parameters of the components. The health parameter may be a performance-like health parameter or a fault-like health parameter, which is not limited in the present application.
In some implementations, a method of determining a target parameter, as shown in fig. 3, includes the steps of:
s301: the evaluation equipment determines a failure mode of the component.
In some embodiments, the evaluation device may determine the failure mode of the component by means of Failure Mode and Effects Analysis (FMEA), for example, the parameter IEC61508.
S302: and the evaluation equipment acquires the failure mechanism of the component.
In some embodiments, the evaluation equipment may determine the failure mechanism of the component through EPRI 1018534.
S303: the evaluation device determines a first parameter that affects a failure mode of the component.
In some embodiments, the evaluation device may determine, according to a failure mechanism of the component, a cause of the failure mode of the component, and further determine a parameter, i.e., a first parameter, that affects the failure mode of the component.
S202: the evaluation device determines a target parameter whose referable degree score is greater than a preset score from the first parameters.
The degree of referential refers to the degree of confidence that the first parameter has an effect on the existence of a failure mode of the component, which can be characterized in the form of a score. For example, a higher score for the referenceable degree indicates a greater confidence that the parameter has an effect on the presence of a failure mode for the component. In some implementations, the reference level may be a percentage, the preset level may be 80 points, and when the reference level exceeds 80 points, the parameter is considered as a parameter having an influence on the failure mode of the component.
In some embodiments, the referenceable degree score can be obtained by scoring the objective data, and the referenceable degree score is positively correlated with the dimensionality number of the objective data. Objective data includes, but is not limited to, failure mechanism compliance, technical literature disclosures, tests, existing operating conditions, and the like. For the convenience of understanding, the number of dimensions of objective data is 4, for example, the dimensions include a failure mechanism conformance dimension, a technical literature disclosure dimension, a test dimension, and an existing operating condition dimension.
The evaluation device can analyze and verify the parameter in the first parameter by using the objective data, for example, the failure mechanism conformity dimension and the technical literature disclosure dimension, and after the parameter passes the verification, the referential degree of the parameter can be 85 points. And for example, after the failure mechanism conformance dimension, the technical literature disclosure dimension, the test dimension and the existing operation condition dimension are verified and passed, the referable degree of the parameter can be 100 points. For another example, if verification is made only from the existing operating condition dimension and the verification is passed, the referable degree of the parameter may be 50 points.
In some implementations, the evaluation device may rank the parameters in the first parameters according to scores of referable degrees of the parameters in the first parameters to obtain ranking results, and then determine the preset score according to the ranking results.
Specifically, the evaluation equipment determines the number of targets according to the preset proportion and the number of parameters in the first parameters, determines the number of the targets according to the number of the targets, and takes the fraction of the referable degree of the parameter corresponding to the target number as the preset fraction.
For example, the first parameters include 10 parameters, and the preset ratio is 60%, so that the target number is 10 × 60% =6. The target sequence number is the sequence number located at the position of the target number in the above sorting result, and the target sequence number is the 6 th in this embodiment. Then, the score of the referable degree of the parameter with the target serial number of 6 is taken as a preset score.
Therefore, the preset score is obtained through the score of the parameter in the first parameter, and is not a fixed value set subjectively, and further the reasonability of obtaining the target parameter through screening from the first parameter can be increased.
The above description of the referenceable degree score and the preset score is merely illustrative and does not constitute a limitation of the present application.
After the evaluation equipment determines the target parameters with the reference degree scores larger than the preset scores from the first parameters, all the parameters in the target parameters have influences on the failure modes of the components and have higher credibility. In this way, the evaluation device determines the health parameter of the device according to the parameter with higher reliability, and the reliability of the obtained health parameter is also higher. Further, the parameters in the target parameters are parameters which are verified and passed through objective data of multiple dimensions, so that the real health state of the equipment can be reflected through the parameters, and real visual maintenance (maintenance is carried out according to the actual operation condition of the equipment) is realized.
S203: the evaluation device determines a second parameter from the target parameters based on the effect of the target parameters on the failure mode of the functional circuit.
After the evaluation equipment determines the target parameter, the evaluation equipment determines a second parameter from the target parameter according to the influence of the target parameter on the failure mode of the functional circuit, wherein the second parameter is a parameter influencing the failure mode of the functional circuit.
As shown in fig. 4, which shows a flow chart of a method for determining a second parameter from a target parameter, the method comprises the following steps:
s401: the evaluation device determines whether a parameter in the target parameter has an influence on the first failure mode of the functional circuit, and if so, executes S402.
In some embodiments, the evaluation device determines a parameter of the target parameters that has an effect on the first failure mode of the functional circuit.
S402: the evaluation device determines whether the parameter affecting the first failure mode of the functional circuit has been determined as the parameter in the second parameter, and if not, executes S403.
After the evaluation device determines the parameter affecting the first failure mode of the functional circuit, it needs to determine whether the parameter is determined to be the parameter in the second parameter, if not, it indicates that the parameter is the first parameter affecting the first failure mode of the functional circuit, and then S403 is executed; if so, it is indicated that the parameter is not the first parameter that has an effect on the first failure mode of the functional circuit, that is, a parameter that has an effect on the first failure mode of the functional circuit already exists in the second parameter, and therefore, the parameter does not need to be determined again as a parameter in the second parameter.
In some embodiments, if so, the evaluation device may further determine one of the plurality of parameters that has an effect on the first failure mode of the functional circuit as the parameter of the second parameter. For example, one of the plurality of parameters that is easy to acquire is taken as a parameter of the second parameter.
In other embodiments, if yes, the evaluation device may further compare scores of referable degrees in the parameters affecting the first failure mode, and determine the parameter affecting the first failure mode with the highest score of referable degrees as the parameter in the second parameters.
S403: the evaluation equipment determines the parameters influencing the first failure mode as the parameters in the second parameters according to the collectability of the parameters influencing the first failure mode.
When the evaluation device determines that the parameter affecting the first failure mode of the functional circuit is not determined as the parameter in the second parameter, the evaluation device will further continue to determine whether the parameter affecting the first failure mode of the functional circuit is easy to collect, for example, the collection cost is high or low, the collection technology is easy to implement, and if the parameter is easy to collect, the parameter is taken as the parameter in the second parameter.
S204: and the evaluation equipment determines the health parameters from the second parameters according to the influence of the second parameters on the failure modules of the board card.
And after the evaluation equipment determines the second parameter, the evaluation equipment determines a health parameter from the second parameter according to the influence of the second parameter on the failure mode of the board card, wherein the health parameter is a parameter influencing the failure mode of the board card.
As shown in fig. 5, which shows a flow chart of a method for determining a health parameter from a second parameter, the method comprises the steps of:
s501: the evaluation device determines whether the parameters in the second parameters have an influence on the second failure mode of the board card, and if so, executes S502.
In some embodiments, the evaluation device determines the parameters of the second parameters that have an influence on the second failure mode of the board.
S502: the evaluation device determines whether the parameter affecting the second failure mode of the board card is determined to be the parameter in the health parameter, and if not, executes S503.
After the evaluation device determines the parameter affecting the second failure mode of the board card, it needs to determine whether the parameter is determined to be a parameter in the health parameters, if not, the parameter is the first parameter affecting the second failure mode of the board card, and then S503 is executed; if so, it is indicated that the parameter is not the first parameter which has an influence on the second failure mode of the board, that is, the parameter which has an influence on the second failure mode of the board already exists in the health parameters, so that the parameter does not need to be determined as the parameter in the health parameters again.
In some embodiments, if so, the evaluation device may further determine a parameter from a plurality of parameters that have an influence on the second failure mode of the board, as the parameter in the health parameter. For example, one of the plurality of parameters that is easy to acquire is taken as a parameter in the health parameter.
In other embodiments, if yes, the evaluation device may further compare scores of the referenceable degrees in the parameters affecting the second failure mode, and determine the parameter affecting the second failure mode with the highest score of the referenceable degrees as the parameter in the health parameters.
S503: and the evaluation equipment determines the parameters influencing the second failure mode of the board card as the parameters in the health parameters.
In some embodiments, after the evaluation device determines the health parameter, the health parameter of the distributed control system may be compared with a reference value, and if a difference between the health parameter and the reference value is greater than a preset difference threshold, feedback information is generated. The feedback information includes, but is not limited to, forecast information, repair information, maintenance information, and the like.
Based on the above description, the method for determining the health parameters of the equipment provided by the application includes the board card, the board card includes the functional circuit, and the functional circuit includes the components. According to the method, a first parameter influencing a failure mode of the component is determined through a failure mechanism of the component, then the referable degree of the first parameter is scored according to objective data, the score of the referable degree is positively correlated with the number of dimensionalities adopting the objective data, and the parameter with the referable degree score larger than a preset score is used as a target parameter. And determining a second parameter from the target parameters according to the influence of the target parameters on the failure mode of the functional circuit, and determining health parameters from the second parameter according to the influence of the second parameter on the failure mode of the board card. The health parameter is obtained through the target parameter with higher referential degree, so that the health parameter has better referential value.
Further, the method determines a second parameter from the target parameters based on the influence of the failure mode of the component on the failure mode of the functional circuit, and then determines the health parameter from the second parameter through the influence of the failure mode of the functional circuit on the failure mode of the board card. The method can accurately determine the health parameters of the equipment without spending high cost.
The embodiment of the application further provides a device for determining the health parameters of the equipment, the equipment comprises a board card, the board card comprises a functional circuit, and the functional circuit comprises components. As shown in fig. 6, the apparatus includes:
a first-stage parameter determining module 601, configured to determine, according to a failure mechanism of the component, a first parameter that affects a failure mode of the component; determining a target parameter with a reference degree score larger than a preset score from the first parameters, wherein the reference degree score is obtained through objective data scoring, and the reference degree score is positively correlated with the dimensionality number of the objective data;
a second-stage parameter determining module 602, configured to determine a second parameter from the target parameters according to an influence of the target parameters on a failure mode of the functional circuit;
a health parameter determining module 603, configured to determine the health parameter from the second parameter according to an influence of the second parameter on a failure mode of the board card.
Optionally, the apparatus further comprises: a feedback module;
the feedback module is used for generating feedback information when the difference value between the health parameter of the equipment and the reference value is larger than a preset difference value threshold value.
Optionally, the first-stage parameter determining module 601 is specifically configured to rank the parameters in the first parameters according to the scores of the referential degrees of the parameters in the first parameters, so as to obtain a ranking result; determining a preset score according to the sequencing result; and determining the parameter of which the score of the referable degree of the parameter in the first parameter is larger than the preset score as the target parameter.
Optionally, the first-stage parameter determining module 601 is specifically configured to determine the number of targets according to a preset ratio and the number of parameters in the first parameter; determining a target serial number according to the target number; and determining the score of the referable degree of the parameter corresponding to the target sequence number in the sequencing result as a preset score.
Optionally, the second-stage parameter determining module 602 is specifically configured to, when a parameter in the target parameter has an influence on a first failure mode of the functional circuit, determine whether the parameter that influences the first failure mode is determined as a parameter in a second parameter; if not, determining the parameters influencing the first failure mode as the parameters in the second parameters.
Optionally, the second-stage parameter determining module 602 is specifically configured to determine, according to the collectability of the parameter affecting the first failure mode, the parameter affecting the first failure mode as a parameter in the second parameters.
An embodiment of the present application further provides a computing device, which includes a processor and a memory;
the processor is configured to execute instructions stored in the memory to cause the computing device to perform the method of any of the above method embodiments.
Embodiments of the present application further provide a computer-readable storage medium, which includes instructions that instruct the above-mentioned computing device to execute the method described in any of the above-mentioned method embodiments.
The embodiments in the present specification are described in a progressive manner, and the same and similar parts among the embodiments are referred to each other, and each embodiment focuses on the differences from the other embodiments. In particular, for the apparatus embodiment, since it is substantially similar to the method embodiment, it is relatively simple to describe, and reference may be made to some descriptions of the method embodiment for relevant points. The above-described apparatus embodiments are merely illustrative, and the units and modules described as separate components may or may not be physically separate. In addition, some or all of the units and modules may be selected according to actual needs to achieve the purpose of the solution of the embodiment. One of ordinary skill in the art can understand and implement it without inventive effort.
It should be understood that, in this application, "at least one" means one or more, "a plurality" means two or more. "and/or" for describing an association relationship of associated objects, indicating that there may be three relationships, e.g., "a and/or B" may indicate: only A, only B and both A and B are present, wherein A and B may be singular or plural. The character "/" generally indicates that the former and latter associated objects are in an "or" relationship. "at least one of the following" or similar expressions refer to any combination of these items, including any combination of single item(s) or plural items. For example, at least one (one) of a, b, or c, may represent: a, b, c, "a and b", "a and c", "b and c", or "a and b and c", wherein a, b, c may be single or plural.
The foregoing is merely a preferred embodiment of the present application and is not intended to limit the present application in any way. Although the present application has been described with reference to the preferred embodiments, it is not intended to limit the present application. Those skilled in the art can now make numerous possible variations and modifications to the disclosed embodiments, or modify equivalent embodiments, using the methods and techniques disclosed above, without departing from the scope of the claimed embodiments. Therefore, any simple modification, equivalent change and modification made to the above embodiments according to the technical essence of the present application still fall within the protection scope of the technical solution of the present application without departing from the content of the technical solution of the present application.
Claims (10)
1. A method for determining health parameters of equipment is characterized in that the equipment comprises a board card, wherein the board card comprises a functional circuit, and the functional circuit comprises components; the method comprises the following steps:
determining a first parameter influencing a failure mode of the component according to a failure mechanism of the component;
determining a target parameter with a reference degree score larger than a preset score from the first parameters, wherein the reference degree score is obtained through objective data scoring, and the reference degree score is positively correlated with the dimensionality number of the objective data;
determining a second parameter from the target parameters according to the influence of the target parameters on the failure mode of the functional circuit;
and determining the health parameters from the second parameters according to the influence of the second parameters on the failure mode of the board card.
2. The method of claim 1, further comprising:
and when the difference value between the health parameter of the equipment and the reference value is larger than a preset difference value threshold value, generating feedback information.
3. The method according to claim 1, wherein the determining, from the first parameters, a target parameter whose referable degree score is greater than a preset score includes:
sorting the parameters in the first parameters according to the scores of the referable degrees of the parameters in the first parameters to obtain sorting results;
determining a preset score according to the sequencing result;
and determining the parameter of which the score of the referable degree of the parameter in the first parameter is larger than the preset score as the target parameter.
4. The method of claim 3, wherein determining a preset score according to the ranking result comprises:
determining the number of targets according to a preset proportion and the number of parameters in the first parameters;
determining a target serial number according to the target number;
and determining the score of the referential degree of the parameter corresponding to the target sequence number in the sequencing result as a preset score.
5. The method of claim 1, wherein determining a second parameter from the target parameters based on the effect of the target parameters on the failure mode of the functional circuit comprises:
when the parameters in the target parameters have influence on a first failure mode of the functional circuit, judging whether the parameters influencing the first failure mode are determined as parameters in a second parameter or not;
if not, determining the parameters influencing the first failure mode as the parameters in the second parameters.
6. The method of claim 5, wherein the determining the parameter affecting the first failure mode as the parameter in the second parameters comprises:
and determining the parameters influencing the first failure mode as parameters in the second parameters according to the collectability of the parameters influencing the first failure mode.
7. The method of claim 1, wherein determining the health parameter from the second parameter based on the effect of the second parameter on the failure mode of the board comprises:
when the parameters in the second parameters have influence on a second failure mode of the board card, judging whether the parameters influencing the second failure mode are determined as parameters in the health parameters;
if not, determining the parameters affecting the second failure mode as the parameters in the health parameters.
8. A device for determining health parameters of equipment is characterized in that the equipment comprises a board card, the board card comprises a functional circuit, and the functional circuit comprises components; the device comprises:
the first-stage parameter determining module is used for determining a first parameter influencing a failure mode of the component according to a failure mechanism of the component; determining a target parameter with a referable degree score larger than a preset score from the first parameters, wherein the referable degree score is obtained through objective data scoring, and the referable degree score is positively correlated with the dimensionality number of the objective data;
the second-stage parameter determining module is used for determining a second parameter from the target parameters according to the influence of the target parameters on the failure mode of the functional circuit;
and the health parameter determination module is used for determining the health parameters from the second parameters according to the influence of the second parameters on the failure mode of the board card.
9. A computing device, wherein the computing device comprises a processor and a memory;
the processor is to execute instructions stored in the memory to cause the computing device to perform the method of any of claims 1-7.
10. A computer-readable storage medium comprising instructions that instruct a computing device to perform the method of any of claims 1-7.
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| CN202110673088.3A CN115493859A (en) | 2021-06-17 | 2021-06-17 | Method, device, equipment and medium for determining equipment health parameters |
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| CN202110673088.3A CN115493859A (en) | 2021-06-17 | 2021-06-17 | Method, device, equipment and medium for determining equipment health parameters |
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