CN115454023A - BMS testing method, BMS testing device, electronic equipment and storage medium - Google Patents
BMS testing method, BMS testing device, electronic equipment and storage medium Download PDFInfo
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- CN115454023A CN115454023A CN202211030760.8A CN202211030760A CN115454023A CN 115454023 A CN115454023 A CN 115454023A CN 202211030760 A CN202211030760 A CN 202211030760A CN 115454023 A CN115454023 A CN 115454023A
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- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0208—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterized by the configuration of the monitoring system
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B2219/00—Program-control systems
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Abstract
The embodiment of the application provides a BMS testing method, a BMS testing device, electronic equipment and a storage medium, test data output by external testing equipment is obtained, a detection value obtained by detecting the test data is obtained, if the detection value meets a preset test input condition, a test channel between the external testing equipment and a testing tool is controlled to be closed, the test data can be input to the testing tool through the test channel, the BMS placed on the testing tool is tested, and a testing result of the BMS is obtained.
Description
Technical Field
The application relates to the technical field of BMS battery management system testing, in particular to a BMS testing method, a BMS testing device, electronic equipment and a storage medium.
Background
In order to improve BMS's quality, can carry out quality test such as validity, security, ageing nature when BMS leaves the factory, but when inserting test fixture and gathering the power-on test to BMS, overload such as voltage, electric current, power that test fixture exported on BMS can lead to BMS circuit device to damage.
Disclosure of Invention
The main purpose of the embodiment of the application is to provide a BMS testing method, a BMS testing device, electronic equipment and a storage medium, which can avoid damage to BMS circuit devices caused by abnormal test data output by a tool.
In order to achieve the above object, a first aspect of an embodiment of the present application provides a BMS testing method, including:
acquiring test data output by external test equipment;
acquiring a detection value obtained by detecting the test data;
and if the detection value meets the preset test input condition, controlling the test channel between the external test equipment and the test tool to be closed, so that the test data can be input to the test tool through the test channel, and testing the BMS placed on the test tool to obtain the test result of the BMS.
In some embodiments, the detection value includes a voltage value, a current value, a temperature value, and a power value, and if the detection value satisfies a preset test input condition, the method controls a test channel between the external test device and the test fixture to be closed, including:
and if the voltage value is within a preset voltage range, the current value is within a preset current range, the temperature value is within a preset temperature range, and the power value is within a preset power range, controlling the test channel to be closed.
In some embodiments, the testing the BMS placed on the testing fixture to obtain the test result of the BMS includes:
acquiring a product parameter value obtained by testing the BMS;
if the product parameter value meets the preset product test condition, determining that the test result of the BMS is defect-free;
and if the product parameter value does not meet the preset product test condition, determining that the test result of the BMS is defective.
In some embodiments, after the obtaining of the detection value obtained by detecting the test data, the BMS testing method further includes:
and if the detection value does not meet the preset test input condition, generating first prompt information and second prompt information, wherein the first prompt information is used for prompting to check the external test equipment, and the second prompt information is used for prompting to check a test channel between the external test equipment and test work.
In some embodiments, after the obtaining of the detection value obtained by detecting the test data, the BMS testing method further includes:
and if the detection value does not meet the preset test input condition, controlling the disconnection of a test channel between the external test equipment and the test tool, and controlling the external test equipment to be closed.
In some embodiments, if the detected value satisfies a preset test input condition, controlling a test channel between the external test device and the test fixture to be closed includes:
and if the detection value meets the test input conditions of all the test channels, controlling all the test channels between the external test equipment and the test tool to be closed.
In some embodiments, an electronic switch is disposed on the test channel, and the control of closing the test channel between the external test equipment and the test fixture includes:
and sending a closing signal to the electronic switch, so that the electronic switch receives the closing signal and closes the test channel.
To achieve the above object, a second aspect of embodiments of the present application provides a BMS testing device, the device including:
the first acquisition module is used for acquiring test data output by external test equipment;
the second acquisition module is used for acquiring a detection value obtained by detecting the test data;
and the BMS testing module is used for controlling the closing of a testing channel between the external testing equipment and the testing tool if the detection numerical value meets the preset testing input condition, so that the testing data can be input to the testing tool through the testing channel, and the BMS placed on the testing tool is tested to obtain the testing result of the BMS.
In order to achieve the above object, a third aspect of the embodiments of the present application provides an electronic device, which includes a memory, a processor, a program stored in the memory and executable on the processor, and a data bus for implementing connection communication between the processor and the memory, where the program implements the method of the first aspect when executed by the processor.
To achieve the above object, a fourth aspect of the embodiments of the present application proposes a storage medium, which is a computer-readable storage medium for computer-readable storage, and stores one or more programs, which are executable by one or more processors to implement the method of the first aspect.
The BMS testing method, the BMS testing device, the electronic equipment and the storage medium are characterized in that testing data output by external testing equipment are obtained, detection numerical values obtained by detecting the testing data are obtained, if the detection numerical values meet preset testing input conditions, a testing channel between the external testing equipment and a testing tool is controlled to be closed, the testing data can be input into the testing tool through the testing channel, the BMS placed on the testing tool is tested, and a testing result of the BMS is obtained.
Drawings
Fig. 1 is a first flowchart of a BMS testing method provided by an embodiment of the present application;
FIG. 2 is a flowchart of step S130 in FIG. 1;
fig. 3 is a second flowchart of a BMS testing method provided by an embodiment of the present application;
fig. 4 is a first structural view of a BMS testing device provided by an embodiment of the present application;
fig. 5 is a second structural schematic diagram of a BMS testing device provided in an embodiment of the present application;
fig. 6 is a schematic hardware structure diagram of an electronic device according to an embodiment of the present application.
Detailed Description
In order to make the objects, technical solutions and advantages of the present application more apparent, the present application is described in further detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present application and are not intended to limit the present application.
It should be noted that although functional blocks are partitioned in a schematic diagram of an apparatus and a logical order is shown in a flowchart, in some cases, the steps shown or described may be performed in a different order than the partitioning of blocks in the apparatus or the order in the flowchart. The terms first, second and the like in the description and in the claims, as well as in the drawings described above, are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein is for the purpose of describing embodiments of the present application only and is not intended to be limiting of the application.
First, several terms referred to in the present application are resolved:
testing the tool: is a device for checking whether a product meets a desired specification. When the product is unqualified, the test tool outputs a corresponding response.
Battery Management System (BMS): is an electronic system or circuit that monitors and maintains the health and capacity of a battery or battery pack, and may monitor charging, discharging, temperature, and other factors that affect the state of the battery or battery pack.
The power battery system is an important component of the new energy electric automobile, and the BMS is a management system of the power battery and is used for intelligently managing and maintaining each battery unit so as to prevent the battery from being overcharged and overdischarged, prolong the service life of the battery and ensure the safety of the battery. The state of each battery unit is monitored through the BMS, and an alarm is given when a battery failure is recognized, thereby ensuring the safety of the entire vehicle system. The quality of BMS is related to the safety of battery system and whole vehicle system, in order to improve BMS's quality, can carry out quality testing such as validity, security and ageing when BMS dispatches from the factory.
In the correlation technique, the BMS board can be accessed into the frock and gather the power-on test when inserting the line, judge whether normal according to the test result product function to ensure BMS's quality, but when the power-on test was gathered to BMS to the access test frock, because the power isoparametric of callback test fixture did not have during certain high-power test before, make voltage, electric current, power etc. that test fixture exported on BMS transship, can lead to BMS circuit device to damage.
Based on this, the embodiment of the application provides a BMS testing method, a BMS testing device, electronic equipment and a storage medium, aiming at avoiding damage to BMS circuit devices caused by abnormal test data output by a tool.
The BMS testing method, the BMS testing device, the electronic device, and the storage medium provided in the embodiments of the present application are specifically described in the following embodiments, and the BMS testing method in the embodiments of the present application is first described.
The embodiment of the application provides a BMS testing method, and relates to the technical field of BMS battery management system testing. The BMS testing method provided by the embodiment of the application can be applied to a terminal, a server side and software running in the terminal or the server side. In some embodiments, the terminal may be a smartphone, tablet, laptop, desktop computer, or the like; the server side can be configured into an independent physical server, a server cluster or a distributed system formed by a plurality of physical servers, and cloud servers for providing basic cloud computing services such as cloud service, a cloud database, cloud computing, cloud functions, cloud storage, network service, cloud communication, middleware service, domain name service, security service, CDN (content delivery network) and big data and artificial intelligence platforms; the software may be an application or the like implementing the BMS testing method, but is not limited to the above form.
The application is operational with numerous general purpose or special purpose computing system environments or configurations. For example: personal computers, server computers, hand-held or portable devices, tablet-type devices, multiprocessor systems, microprocessor-based systems, set top boxes, programmable consumer electronics, network PCs, minicomputers, mainframe computers, distributed computing environments that include any of the above systems or devices, and the like. The application may be described in the general context of computer-executable instructions, such as program modules, being executed by a computer. Generally, program modules include routines, programs, objects, components, data structures, etc. that perform particular tasks or implement particular abstract data types. The application may also be practiced in distributed computing environments where tasks are performed by remote processing devices that are linked through a communications network. In a distributed computing environment, program modules may be located in both local and remote computer storage media including memory storage devices.
Fig. 1 is an alternative flowchart of a BMS testing method provided in an embodiment of the present application, and the method in fig. 1 may include, but is not limited to include, step S110 to step S130.
Step S110, obtaining test data output by external test equipment;
step S120, obtaining a detection value obtained by detecting the test data;
and S130, if the detection value meets the preset test input condition, controlling the test channel between the external test equipment and the test tool to be closed, so that test data can be input into the test tool through the test channel, and testing the BMS placed on the test tool to obtain the test result of the BMS.
In step S110 of some embodiments, the BMS is placed on the test fixture, and test input conditions are set in the upper computer in advance to complete preparation before the test. After the preparation work before the test is finished, the upper computer issues a test instruction to the external test equipment, the external test equipment outputs test data after receiving the test instruction, and the upper computer acquires the test data output by the external test equipment, wherein the test data can be parameters such as voltage, current, power and temperature.
In step S120 of some embodiments, a digital multimeter measures a specific value of the test data output by the external test device to obtain a corresponding detection value, and the upper computer obtains the detection value, where the detection value may be a voltage value, a current value, a temperature value, and a power value.
In step S130 of some embodiments, an electronic switch is disposed on the test channel, and if the detected value satisfies a preset test input condition, the upper computer sends a close signal to the electronic switch to control the test channel between the external test device and the test fixture to be closed, so that the test data can be input to the test fixture through the test channel, where the electronic switch may be a relay, a switch diode, a switch triode, or the like. If the detection value does not meet the preset test input condition, the test is not carried out, the upper computer generates first prompt information and second prompt information and sends a disconnection signal to the electronic switch to control the disconnection of a test channel between the external test equipment and the test tool, and then sends a test stopping instruction to the external test equipment to enable the external test equipment not to output test data after receiving the test stopping instruction, wherein the first prompt information is used for prompting to check the external test equipment, and the second prompt information is used for prompting to check the test channel between the external test equipment and the test work. The testing tool and the external testing equipment are controlled through the upper computer, when the external testing equipment is high-voltage equipment, a tester is not required to contact the equipment to enable the equipment to output testing data, the tester can be protected, and risks caused by contact with the high-voltage equipment are avoided.
It should be noted that, if the detected value satisfies the test input condition of all the test channels, all the test channels between the external test device and the test fixture are controlled to be closed, and if the detected value does not satisfy the test input condition of a certain test channel, the test channel between the external test device and the test fixture is controlled to be opened.
Specifically, if the voltage value is within a preset voltage range, the current value is within a preset current range, the temperature value is within a preset temperature range, and the power value is within a preset power range, a closing signal is sent to the electronic switch to close the test channel. And if a certain detection value does not meet the test input condition corresponding to the detection value, disconnecting the test channel.
And in the test process, obtaining the detection value of the test data, and if the detection value does not meet the preset test input condition, not carrying out the test. The BMS circuit device testing method has the advantages that the BMS input, namely the testing data output by the external testing equipment, is detected in the testing process, and the damage to the BMS circuit device caused by the abnormal BMS input can be avoided in the testing process.
Steps S110 to S130 illustrated in the embodiment of the present application, by obtaining test data output by external test equipment, a detection value obtained by detecting the test data is obtained, and if the detection value satisfies a preset test input condition, closing of a test channel between the external test equipment and the test fixture is controlled, so that the test data can be input to the test fixture through the test channel, and the BMS placed on the test fixture is tested, and a test result of the BMS is obtained. Before BMS testing, the external input required by the BMS is detected, and the safety of circuit devices of the BMS is not influenced by the external input.
Referring to fig. 2, in some embodiments, step S130 may include, but is not limited to, step S210 to step S230:
step S210, obtaining product parameter values obtained by testing the BMS;
step S220, if the product parameter value meets the preset product test condition, determining that the test result of the BMS is defect-free;
and step S230, if the product parameter value does not meet the preset product test condition, determining that the test result of the BMS is defective.
In steps S210 to S230 of some embodiments, the BMS is tested by the probe of the test fixture contacting a circuit point on the BMS to obtain a product parameter value of the BMS, and the product parameter value of the BMS is output to the upper computer. And the upper computer judges whether the product parameter value meets the product test condition, if the product parameter value meets the product test condition preset in the upper computer, the test result of the BMS is determined to be defect-free, and if the product parameter value does not meet the product test condition preset in the upper computer, the test result of the BMS is determined to be defect-free, wherein the product test condition is a test condition meeting the product quality standard and can be defined according to the product quality standard.
Referring to fig. 3, fig. 3 is an alternative flowchart of a BMS testing method according to an embodiment of the present application, and the method in fig. 3 may include, but is not limited to include, step S310 to step S380.
Step S310, the upper computer issues a test instruction, and the external test equipment receives the test instruction and outputs test data;
step S320, the universal meter detects the test data to obtain a detection value corresponding to the test data;
step S330, the upper computer judges whether the test value meets the test input condition, if so, the step S340 is executed; if the determination result is no, go to step S380;
step S340, the upper computer sends a closing signal to an electronic switch arranged on a test channel, controls the test channel to be closed, enables test data to be input into a test tool through the test channel, tests the BMS arranged on the test tool, and the test channel is arranged between external test equipment and the test tool;
s350, the upper computer obtains a current detection value corresponding to the test data in the test process;
step S360, judging whether the current detection value meets the test input condition, if so, executing step S370; if the determination result is negative, step S380 is executed.
And step S370, continuing to test the BMS until the test result of the BMS is obtained.
Step S380, the upper computer generates first prompt information and second prompt information, sends a disconnection signal to an electronic switch arranged on the test channel to disconnect the test channel and close the external test equipment, wherein the first prompt information is used for prompting to check the external test equipment, and the second prompt information is used for prompting to check the test channel between the external test equipment and the test work;
by executing the steps S310 to S380, before the BMS test, the external input required by the BMS is detected, so that it is ensured that the external input does not affect the safety of the circuit devices of the BMS, the BMS input is detected in the test process, and it is ensured that the circuit devices of the BMS are not damaged in the test process.
Referring to fig. 4, an embodiment of the present application further provides a BMS testing apparatus, which can implement the BMS testing method, and the apparatus includes:
a first obtaining module 410, configured to obtain test data output by an external test device;
a second obtaining module 420, configured to obtain a detection value obtained by detecting the test data;
and the BMS testing module 430 is used for controlling the closing of a testing channel between external testing equipment and a testing tool if the detection numerical value meets the preset testing input condition, so that the testing data can be input into the testing tool through the testing channel, and the BMS placed on the testing tool is tested to obtain the testing result of the BMS.
Referring to fig. 5, an embodiment of the present application further provides a BMS testing device, which can implement the BMS testing method, and the device includes: an external test input module 510, a tool access module 520, a tool input detection module 530, a control module 540, and a test tool module 550. The tool access module 520 is a connection module between the external test input module 510 and the test tool module 550, and a relay is provided on the tool access module 520, so that data output by the external test input module 510 can reach the test tool module 550 according to the control of the relay. The tool input detection module 530 measures input data of the front ends of the relays by disposing a digital multimeter at the front ends of the relays of the tool access module 520, where the input data is output by the external test input module 510. The control module 540 controls the on/off of each relay on the tool access module 520 by reading the multimeter measurement value of the tool input detection module 530. The test fixture module 550 tests the BMS to obtain a test result, and the control module 540 may read the test result.
The specific implementation of the BMS testing device is substantially the same as the specific implementation of the BMS testing method, and is not described again here.
An embodiment of the present application further provides an electronic device, where the electronic device includes: the BMS testing method comprises a memory, a processor, a program stored on the memory and capable of running on the processor, and a data bus for realizing connection communication between the processor and the memory, wherein the program realizes the BMS testing method when being executed by the processor. The electronic equipment can be any intelligent terminal including a tablet computer, a vehicle-mounted computer and the like.
Referring to fig. 6, fig. 6 illustrates a hardware structure of an electronic device according to another embodiment, where the electronic device includes:
the processor 610 may be implemented by a general-purpose CPU (central processing unit), a microprocessor, an Application Specific Integrated Circuit (ASIC), or one or more integrated circuits, and is configured to execute a relevant program to implement the technical solution provided in the embodiment of the present application;
the memory 620 may be implemented in a form of a Read Only Memory (ROM), a static storage device, a dynamic storage device, or a Random Access Memory (RAM). The memory 620 may store an operating system and other application programs, and when the technical solution provided by the embodiments of the present disclosure is implemented by software or firmware, the relevant program codes are stored in the memory 620 and are called by the processor 610 to execute the BMS testing method according to the embodiments of the present disclosure;
an input/output interface 630 for implementing information input and output;
the communication interface 640 is used for realizing communication interaction between the device and other devices, and may realize communication in a wired manner (e.g., USB, network cable, etc.) or in a wireless manner (e.g., mobile network, WIFI, bluetooth, etc.);
a bus 650 that transfers information between various components of the device (e.g., the processor 610, the memory 620, the input/output interface 630, and the communication interface 640);
wherein the processor 610, memory 620, input/output interface 630, and communication interface 640 are communicatively coupled to each other within the device via a bus 650.
Embodiments of the present application also provide a storage medium, which is a computer-readable storage medium for computer-readable storage, and the storage medium stores one or more programs, and the one or more programs are executable by one or more processors to implement the BMS testing method described above.
The memory, which is a non-transitory computer readable storage medium, may be used to store non-transitory software programs as well as non-transitory computer executable programs. Further, the memory may include high speed random access memory, and may also include non-transitory memory, such as at least one disk storage device, flash memory device, or other non-transitory solid state storage device. In some embodiments, the memory optionally includes memory located remotely from the processor, and these remote memories may be connected to the processor through a network. Examples of such networks include, but are not limited to, the internet, intranets, local area networks, mobile communication networks, and combinations thereof.
The BMS testing method, the BMS testing device, the electronic equipment and the storage medium provided by the embodiment of the application can obtain the detection value obtained by detecting the test data by obtaining the test data output by the external testing equipment, and control the closing of the test channel between the external testing equipment and the testing tool if the detection value meets the preset test input condition, so that the test data can be input into the testing tool through the test channel, the BMS placed on the testing tool is tested, and the test result of the BMS is obtained.
The embodiments described in the embodiments of the present application are for more clearly illustrating the technical solutions of the embodiments of the present application, and do not constitute a limitation to the technical solutions provided in the embodiments of the present application, and it is obvious to those skilled in the art that the technical solutions provided in the embodiments of the present application are also applicable to similar technical problems with the evolution of technology and the emergence of new application scenarios.
It will be appreciated by those skilled in the art that the solutions shown in fig. 1-3 are not intended to limit the embodiments of the present application and may include more or fewer steps than those shown, or some of the steps may be combined, or different steps may be included.
The above-described embodiments of the apparatus are merely illustrative, wherein the units illustrated as separate components may or may not be physically separate, i.e. may be located in one place, or may also be distributed over a plurality of network elements. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of this embodiment.
One of ordinary skill in the art will appreciate that all or some of the steps of the methods, systems, functional modules/units in the devices disclosed above may be implemented as software, firmware, hardware, and suitable combinations thereof.
The terms "first," "second," "third," "fourth," and the like in the description of the application and the above-described figures, if any, are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the application described herein are capable of operation in sequences other than those illustrated or described herein. Moreover, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
It should be understood that in the present application, "at least one" means one or more, "a plurality" means two or more. "and/or" is used to describe the association relationship of the associated object, indicating that there may be three relationships, for example, "a and/or B" may indicate: only A, only B and both A and B are present, wherein A and B may be singular or plural. The character "/" generally indicates that the former and latter associated objects are in an "or" relationship. "at least one of the following" or similar expressions refer to any combination of these items, including any combination of single item(s) or plural items. For example, at least one (one) of a, b, or c, may represent: a, b, c, "a and b", "a and c", "b and c", or "a and b and c", wherein a, b, c may be single or plural.
In the several embodiments provided in the present application, it should be understood that the disclosed apparatus and method may be implemented in other ways. For example, the above-described apparatus embodiments are merely illustrative, and for example, the division of the above-described units is only one type of logical functional division, and other divisions may be realized in practice, for example, a plurality of units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, devices or units, and may be in an electrical, mechanical or other form.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional units in the embodiments of the present application may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit can be realized in a form of hardware, and can also be realized in a form of a software functional unit.
The integrated unit, if implemented in the form of a software functional unit and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solutions of the present application, which are essential or part of the technical solutions contributing to the prior art, or all or part of the technical solutions, may be embodied in the form of a software product stored in a storage medium, which includes multiple instructions for enabling a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the methods of the embodiments of the present application. And the aforementioned storage medium includes: various media capable of storing programs, such as a usb disk, a removable hard disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a magnetic disk, or an optical disk.
The preferred embodiments of the present application have been described above with reference to the accompanying drawings, and the scope of the claims of the embodiments of the present application is not limited thereto. Any modifications, equivalents, and improvements that may occur to those skilled in the art without departing from the scope and spirit of the embodiments of the present application are intended to be within the scope of the claims of the embodiments of the present application.
Claims (10)
- A bms testing method, characterized in that the method comprises:acquiring test data output by external test equipment;acquiring a detection value obtained by detecting the test data;and if the detection value meets the preset test input condition, controlling the test channel between the external test equipment and the test tool to be closed, so that the test data can be input to the test tool through the test channel, and testing the BMS placed on the test tool to obtain the test result of the BMS.
- 2. The BMS testing method according to claim 1, wherein the detected values include a voltage value, a current value, a temperature value and a power value, and if the detected values satisfy a preset test input condition, a test channel between the external testing device and a testing tool is controlled to be closed, including:and if the voltage value is within a preset voltage range, the current value is within a preset current range, the temperature value is within a preset temperature range, and the power value is within a preset power range, controlling the test channel to be closed.
- 3. The BMS testing method according to claim 1, wherein the step of testing the BMS placed on the testing tool to obtain the testing result of the BMS comprises the following steps:acquiring a product parameter value obtained by testing the BMS;if the product parameter value meets the preset product test condition, determining that the test result of the BMS is defect-free;and if the product parameter value does not meet the preset product test condition, determining that the test result of the BMS is defective.
- 4. The BMS testing method according to claim 1, characterized in that after said obtaining a detection value detected for the test data, the BMS testing method further comprises:and if the detection value does not meet the preset test input condition, generating first prompt information and second prompt information, wherein the first prompt information is used for prompting to check the external test equipment, and the second prompt information is used for prompting to check a test channel between the external test equipment and test work.
- 5. The BMS testing method according to claim 1, characterized in that after said obtaining a detection value detected from said test data, said BMS testing method further comprises:and if the detection value does not meet the preset test input condition, controlling the disconnection of a test channel between the external test equipment and the test tool, and controlling the external test equipment to be closed.
- 6. The BMS testing method according to any of claims 1 to 5, wherein if the detected value meets a preset test input condition, controlling a test channel between the external testing equipment and a testing tool to be closed comprises:and if the detection value meets the test input conditions of all the test channels, controlling all the test channels between the external test equipment and the test tool to be closed.
- 7. The BMS testing method according to any one of claims 1 to 5, wherein an electronic switch is arranged on the testing channel, and the step of controlling the closing of the testing channel between the external testing equipment and the testing tool comprises the steps of:and sending a closing signal to the electronic switch, so that the electronic switch receives the closing signal and closes the test channel.
- BMS testing device, characterized in that, the device includes:the first acquisition module is used for acquiring test data output by external test equipment;the second acquisition module is used for acquiring a detection value obtained by detecting the test data;and the BMS testing module is used for controlling the closing of a testing channel between the external testing equipment and the testing tool if the detection numerical value meets the preset testing input condition, so that the testing data can be input to the testing tool through the testing channel, and the BMS placed on the testing tool is tested to obtain the testing result of the BMS.
- 9. Electronic device, characterized in that it comprises a memory, a processor, a program stored on said memory and executable on said processor, said program implementing the steps of the method according to any one of claims 1 to 7 when executed by said processor, and a data bus for implementing a connection communication between said processor and said memory.
- 10. A storage medium, being a computer readable storage medium, for computer readable storage, characterized in that the storage medium stores one or more programs executable by one or more processors to implement the steps of the method of any one of claims 1 to 7.
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