CN115451820A - Three-channel polarization information acquisition system - Google Patents
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Abstract
The invention discloses a three-channel polarization information acquisition system, which comprises the following steps: designing a polarization information acquisition system; step two, optical tracking and simulation; step three, establishing a light path model, acquiring polarization information of a measured object through a three-channel polarization information acquisition system, obtaining original light intensity by solving a Stokes vector, obtaining a high-quality grating image in a dark area by matching with a high-sensitivity CMOS sensor, and eliminating the attenuation effect of a polaroid; the polarization information obtained by the polarizing films with three different angles can select the saturated pixel and the optimal unsaturated channel of the pixel to finish the accurate measurement of the highlight area, the system not only can greatly improve the dynamic range of the measurement, but also can accurately measure the dark area and the highlight area simultaneously, and the system has huge application potential in the fields of industrial measurement, defect detection, reverse engineering and cultural relic protection.
Description
Technical Field
The invention relates to the field of information acquisition, in particular to a three-channel polarization information acquisition system.
Background
The objective world exists in a three-dimensional form, in the process of observing and recognizing the world, two eyes and a brain present an observed picture in a three-dimensional form in our cognition, and with the development of science and technology, when a human carries out information acquisition on an object, the situation that how to acquire three-dimensional information of the object is not satisfied when a sensor acquires the two-dimensional information of the object becomes a research hotspot, wherein, a digital grating projection three-dimensional measurement technology is the most representative one of non-contact three-dimensional imaging and measurement technologies, and the digital grating projection three-dimensional measurement technology becomes the most widely applied three-dimensional measurement technology due to the characteristics of high precision, high resolution, lower cost, high speed and the like.
However, the conventional three-dimensional measurement technique has the following disadvantages:
(1) When the measuring surface of the three-dimensional measuring technology is a non-diffuse reflection object, particularly a high-reflection surface object, due to different surface reflectivities, the acquired image can generate local dark or local high-brightness areas, grating information obtained from the areas is difficult to be used for measurement calculation, and the application range of the technology is greatly limited;
(2) Polarization is added to part of three-dimensional measurement technologies, for example, a polarization three-dimensional imaging technology based on specular reflection and a polarization three-dimensional imaging technology based on diffuse reflection, so that the measurement problem of a high-reflection surface can be effectively solved, but due to the attenuation effect of a polarizing film, the signal-to-noise ratio of a dark area is low, a good measurement result can be obtained only by combining a multi-exposure technology, and the measurement precision of the technology when the surface reflectivity changes greatly is limited.
Disclosure of Invention
The invention aims to provide a three-channel polarization information acquisition system to solve the problems that when the measurement surface of the three-dimensional measurement technology provided by the background technology is a non-diffuse reflection object, particularly a high-reflection surface object, due to different surface reflectivities, the acquired image can generate local dark or local high-brightness areas, and grating information obtained by the areas is difficult to be used for measurement calculation, so that the application range of the technology is greatly limited; polarization is added to part of three-dimensional measurement technologies, for example, a polarization three-dimensional imaging technology based on specular reflection and a polarization three-dimensional imaging technology based on diffuse reflection, so that although the measurement problem of a high-reflection surface can be effectively solved, due to the attenuation effect of a polarizing film, the signal-to-noise ratio of a dark area is low, a good measurement result can be obtained only by combining a multi-exposure technology, and the problem of measurement accuracy of the technology when the surface reflectivity changes greatly is limited.
In order to achieve the purpose, the invention provides the following technical scheme: the three-channel polarization information acquisition system comprises the following steps:
step one, designing a polarization information acquisition system: the trisection prism group, the image space telecentric optical system, the polaroid, the high-sensitivity CMOS sensor and the data acquisition processing circuit form a polarization information acquisition system;
step two, optical tracking and simulation: optical tracking and simulation are carried out by adopting ZEMAX optical design software, and trisection prism groups and image space telecentric system parameters meeting requirements are designed;
step three, establishing a light path model: establishing a trisection light path, and ensuring the focusing positions of three paths of light rays by optimizing structural model parameters to obtain a real-time three-channel imaging system with a common view field;
step four, building a three-dimensional measurement system: the polarization information acquisition system is combined with an industrial projector;
step five, calibrating the system components: calibrating light intensity errors of the three-channel polarization information acquisition system, calibrating distortion of the projector and calibrating the system;
step six, polarization information acquisition: polarization components in three different directions are obtained through three polarizing plates respectively to acquire polarization information, and three paths of polarization information of a common view field are obtained;
step seven, imaging by a sensor: the three polaroids are matched with the high-sensitivity CMOS sensor for imaging;
step eight, object information acquisition: and projecting the coding grating on the high-reflectivity object, and calculating a three-dimensional measurement result of the high-reflectivity object according to the light intensity distribution of the three polarization channels.
As a preferred technical solution of the present invention, in the fifth step, the system calibration is camera calibration and projector calibration, and the camera calibration and projection calibration is performed by using a calibration board with a known feature point position, first, a set of code patterns is projected on the surface of the calibration board by the projector, after being reflected by the surface of the calibration board, the code patterns are collected and calculated by the camera, one-to-one mapping between the projector pixels and the camera pixels is established by the code patterns, then the calibration board patterns are collected, the feature point positions on the images are extracted, and the feature points are mapped onto the pixels of the projector by the established relationship, so as to obtain the corresponding relationship between the feature points on the calibration board and the projector image pixels.
As a preferred technical scheme of the invention, the calibration of the light intensity error of the three-channel polarization information acquisition system in the fifth step is to select a target plate, test the light intensity value of each channel after the prism light splitting system is installed and adjusted, perform a group of calibration, realize the average distribution of the light intensity values of each channel through an algorithm, record an average value I, select the target plate, and obtain the polarized light intensity information of three polarization directions through the acquisition system after the polarizer is installed, wherein I is the information of the polarized light intensity of three polarization directions 0° 、I 60° 、I 120° Then the pixel-by-pixel calculation is carried out,
(1) In which S is 0 The average light intensity value is the average light intensity value of the three paths of light splitting before passing through the space between the polaroids, and the average light intensity value is compared with I to realize polarization calibration after passing through the polaroid transmittance compensation.
As a preferred technical solution of the present invention, in the sixth step, the placing angles of the three polarizers are 0 °, 60 ° and 120 °.
As a preferred technical solution of the present invention, in the seventh step, the high-sensitivity CMOS sensor performs imaging as a high-sensitivity CMOS sensor driving and synchronous acquisition circuit.
As a preferred technical solution of the present invention, in the eighth step, according to the light intensity distribution of the three polarization channels and the three-dimensional measurement result of the highly reflective object is calculated, n grating images for measurement are projected, and n × 3 images are obtained by the three-channel polarization information acquisition system, where one grating image and the acquired images of the three channels are respectively the three-dimensional measurement result of the highly reflective object
Where k =1,2, …, n, due to reflection,the modulation modes of different object surfaces on the grating are different, so that the acquisition results obtained in three polarization channels are different, wherein one channel can be in a saturated state, saturated pixels are firstly screened to obtain a high-light area, grating information can be acquired in other areas due to three channels, the original light intensity is calculated to obtain high-quality grating information, the influence of a polarizing film on a dark area is eliminated, the screened saturated pixels are selected, the maximum unsaturated pixel value is selected as the acquisition result at the same position of the other two channels acquired by the same grating image, the channel is also selected by the other grating images, the pixel value at the position can be calculated, and the measurement result is obtained.
Compared with the prior art, the invention has the beneficial effects that:
1. the polarization information of a measured object is acquired through a three-channel polarization information acquisition system, the original light intensity can be obtained by solving the Stokes vector, and a high-quality grating image can be obtained in a dark area by matching with a high-sensitivity CMOS sensor, so that the attenuation effect of a polarizer is eliminated;
2. the polarization information obtained by the polarizing films with three different angles can select a saturated pixel and an optimal unsaturated channel of the pixel to finish the accurate measurement of a highlight area, the system not only can greatly improve the dynamic range of measurement, but also can accurately measure a dark area and the highlight area simultaneously, and the system has huge application potential in the fields of industrial measurement, defect detection, reverse engineering and cultural relic protection.
Drawings
FIG. 1 is a schematic structural view of the present invention;
FIG. 2 is a schematic view of the arrangement of the polarizing film of the present invention;
FIG. 3 is a table of optical indicators for the system of the present invention;
FIG. 4 is a schematic diagram of the synchronous acquisition of the present invention;
FIG. 5 is a schematic diagram of a projector calibration method according to the present invention;
FIG. 6 is a schematic diagram of a three-dimensional measurement technique according to the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1-6, the present invention provides a three-channel polarization information collecting system, comprising the following steps:
designing a polarization information acquisition system: the trisection prism group, the image space telecentric optical system, the polaroid, the high-sensitivity CMOS sensor and the data acquisition processing circuit form a polarization information acquisition system;
step two, optical tracking and simulation: performing optical tracking and simulation by adopting ZEMAX optical design software, and designing trisection prism groups and image space telecentric system parameters meeting requirements;
step three, establishing a light path model: establishing a trisection light path, and ensuring the focusing positions of three paths of light rays by optimizing structural model parameters to obtain a real-time three-channel imaging system with a common view field;
step four, building a three-dimensional measurement system: the polarization information acquisition system is combined with an industrial projector;
step five, calibrating the system components: calibrating light intensity errors of the three-channel polarization information acquisition system, calibrating distortion of the projector and calibrating the system;
step six, polarization information acquisition: polarization components in three different directions are obtained through three polarizing plates respectively to acquire polarization information, and three paths of polarization information of a common view field are obtained;
step seven, imaging by a sensor: the three polarizing films are matched with a high-sensitivity CMOS sensor to perform imaging;
step eight, object information acquisition: and projecting the coding grating on the high-reflectivity object, and calculating a three-dimensional measurement result of the high-reflectivity object according to the light intensity distribution of the three polarization channels.
And fifthly, calibrating the system into camera calibration and projector calibration, wherein the camera calibration and the projector calibration use a calibration plate with a known characteristic point position, firstly, a group of coding patterns are projected on the surface of the calibration plate through the projector, after the coding patterns are reflected by the surface of the calibration plate, the coding patterns are collected and calculated by the camera, one-to-one mapping between the pixels of the projector and the pixels of the camera is established through the coding patterns, then, the patterns of the calibration plate are collected, the characteristic point position on the images is extracted, and the characteristic point position is mapped onto the pixels of the projector through the established relationship, so that the corresponding relationship between the characteristic point on the calibration plate and the pixels of the image of the projector is obtained.
In the fifth step, the light intensity error calibration of the three-channel polarization information acquisition system is to select a target plate, the light intensity value of each path is tested after the prism light splitting system is installed and adjusted, a group of calibrations are carried out, the light intensity value of each path is enabled to be evenly distributed through an algorithm, the average value I is recorded, the target plate is selected, and the polarization light intensity information of three polarization directions is obtained through the acquisition system after the polaroid is installed, wherein the I is the polarization intensity information of the three polarization directions 0° 、I 60° 、I 120° Then the pixel-by-pixel calculation is carried out,
wherein S 0 The average light intensity value is the average light intensity value of the three paths of light splitting before passing through the polaroids, and the polarization calibration is realized by comparing the average light intensity value with I after the average light intensity value is compensated by the transmissivity of the polaroids.
In the sixth step, the placing angles of the three polaroids are 0 degree, 60 degrees and 120 degrees.
And seventhly, imaging the high-sensitivity CMOS sensor into a high-sensitivity CMOS sensor driving and synchronous acquisition circuit.
And step eight, calculating a three-dimensional measurement result of the highly reflective object according to the light intensity distribution of the three polarization channels, projecting n grating images for measurement, and acquiring n multiplied by 3 images through a three-channel polarization information acquisition system, wherein one of the grating images is acquired by acquiring the three channels of images respectively
K =1,2, …, n, after reflection, different object surfaces have different grating modulation modes, so that acquisition results obtained in three polarization channels are different, wherein one channel can be in a saturated state, therefore, a saturated pixel is firstly screened to obtain a high-light area, grating information can be acquired in other areas due to three channels, original light intensity is calculated to obtain high-quality grating information, further, the influence of a polarizing plate on a dark area is eliminated, the screened saturated pixel selects the maximum unsaturated pixel value as an acquisition result at the same position of the other two channels acquired by the same grating image, the other grating images also select the channel, and the pixel value at the position can be calculated to obtain a measurement result.
When the invention is used: the three-division prism group, the image space telecentric optical system, the polaroid, the high-sensitivity CMOS sensor and the data acquisition processing circuit form a polarization information acquisition system, ZEMAX optical design software is adopted for optical tracking and simulation, parameters of the three-division prism group and the image space telecentric system which meet requirements are designed, ZEMAX optical design software is adopted for optical tracking and simulation, a three-division optical path is established, three-path light focusing positions are guaranteed by optimizing structural model parameters, a real-time three-channel imaging system with a common view field is obtained, the polarization information acquisition system is combined with an industrial projector to form a three-dimensional measurement system based on grating projection, due to the reasons of processing and the like, the prism group is difficult to realize accurate trisection of light energy, light intensity errors are inevitable, three-pair images with different polarization components in the common view field can be obtained through the three-channel polarization information acquisition system, original light intensity can be obtained through solving a Stokes vector, and therefore, the integral light intensity can be regarded as a camera, and the three-dimensional measurement system of classical structured light is constructed by combining with the projector. In the measuring system, due to reasons of processing and the like, the prism group is difficult to realize accurate trisection of light energy, inevitable light intensity errors exist, and meanwhile, the collecting systemThe calibration and projection calibration of a camera are carried out by using a calibration plate with known characteristic point positions, firstly, a group of coding patterns are projected on the surface of the calibration plate through the projector, after the coding patterns are reflected by the surface of the calibration plate, the coding patterns are collected and calculated by the camera, one-to-one mapping between projector pixels and camera pixels is established through the coding patterns, then the patterns of the calibration plate are collected, the characteristic point positions on the images are extracted and mapped onto the pixels of the projector through the established relationship, the corresponding relationship between the characteristic points on the calibration plate and the image pixels of the projector is obtained, the system light intensity error calibration is to select a target plate, the light intensity value of each path is measured after the prism light splitting system is adjusted, and a group of calibration is carried out, the light intensity value of each path is averagely distributed and recorded through an algorithm, the average value I is selected, the calibration plate is obtained after the mounting of the three polarizing plates, the polarizing plates are used for acquiring the light intensity information of three polarizing plates in the light intensity directions, and the polarizing plates are arranged, and the average value of the polarizing plates is recorded through the light intensity information of the polarizing plates 0° 、I 60° 、I 120° Then the pixel-by-pixel calculation is carried out,
wherein S 0 The system is composed of an imaging lens group and a polarization splitting system, trisection of visible light energy is realized by utilizing a prism splitting technology and a coating technology, polarization components of 0 degrees, 60 degrees and 120 degrees in three different directions are obtained through the three polarizers to carry out polarization information acquisition to obtain three polarization information of a common field of view, the three polarizers are matched with a high-sensitivity CMOS sensor drive and a synchronous acquisition circuit to carry out imaging, a coding grating is projected on a high-reflectivity object, n grating images for measurement are projected according to light intensity distribution of three polarization channels, and n x 3 images are obtained through a three-channel polarization information acquisition system, wherein one grating image is acquiredRespectively, of three channels
K =1,2, …, n, after reflection, different object surfaces have different grating modulation modes, so that acquisition results obtained in three polarization channels are different, wherein one channel can be in a saturated state, therefore, a saturated pixel is firstly screened to obtain a high-light area, grating information can be acquired in other areas due to three channels, original light intensity is calculated to obtain high-quality grating information, further, the influence of a polarizing plate on a dark area is eliminated, the screened saturated pixel selects the maximum unsaturated pixel value as an acquisition result at the same position of the other two channels acquired by the same grating image, the other grating images also select the channel, and the pixel value at the position can be calculated to obtain a measurement result.
Although the present invention has been described in detail with reference to the foregoing embodiments, it will be apparent to those skilled in the art that various changes in the embodiments and/or modifications of the invention can be made, and equivalents and modifications of some features of the invention can be made without departing from the spirit and scope of the invention.
Claims (6)
1. The three-channel polarization information acquisition system is characterized by comprising the following steps of:
step one, designing a polarization information acquisition system: the trisection prism group, the image space telecentric optical system, the polaroid, the high-sensitivity CMOS sensor and the data acquisition processing circuit form a polarization information acquisition system;
step two, optical tracking and simulation: optical tracking and simulation are carried out by adopting ZEMAX optical design software, and trisection prism groups and image space telecentric system parameters meeting requirements are designed;
step three, establishing a light path model: establishing a trisection light path, and ensuring the focusing positions of three paths of light rays by optimizing structural model parameters to obtain a real-time three-channel imaging system with a common view field;
step four, building a three-dimensional measurement system: the polarization information acquisition system is combined with an industrial projector;
step five, calibrating system components: calibrating light intensity errors of the three-channel polarization information acquisition system, calibrating distortion of the projector and calibrating the system;
step six, polarization information acquisition: polarization components in three different directions are obtained through three polarizing plates respectively to acquire polarization information, and three paths of polarization information of a common view field are obtained;
step seven, imaging by a sensor: the three polaroids are matched with the high-sensitivity CMOS sensor for imaging;
step eight, collecting object information: and projecting the coding grating on the high-reflectivity object, and calculating a three-dimensional measurement result of the high-reflectivity object according to the light intensity distribution of the three polarization channels.
2. The three-channel polarization information acquisition system according to claim 1, wherein: the system calibration in the fifth step is camera calibration and projector calibration, the camera calibration and the projector calibration are performed by using a calibration plate with known characteristic point positions, firstly, a group of coding patterns are projected on the surface of the calibration plate through the projector, after the coding patterns are reflected by the surface of the calibration plate, the coding patterns are collected and calculated by the camera, one-to-one mapping between the pixels of the projector and the pixels of the camera is established through the coding patterns, then the patterns of the calibration plate are collected, the characteristic point positions on the images are extracted, and the characteristic point positions are mapped onto the pixels of the projector through the established relationship, so that the corresponding relationship between the characteristic points on the calibration plate and the pixels of the images of the projector is obtained.
3. The three-channel polarization information acquisition system according to claim 1, wherein: and fifthly, calibrating the light intensity error of the three-channel polarization information acquisition system to select a target plate, testing the light intensity value of each path after the prism light splitting system is installed and adjusted, performing a group of calibration, and enabling each path to be calibrated through an algorithmThe light intensity value is evenly distributed and the average value I is recorded, the target board is selected, and the polarized light intensity information of three polarization directions is acquired through an acquisition system after the polaroid is installed, wherein the average value I is 0° 、I 60° 、I 120° Then the calculation of the pixel by the pixel is carried out,
wherein S 0 The average light intensity value is the average light intensity value of the three paths of light splitting before passing through the polaroids, and the polarization calibration is realized by comparing the average light intensity value with I after the average light intensity value is compensated by the transmissivity of the polaroids.
4. The three-channel polarization information acquisition system according to claim 1, wherein: in the sixth step, the placing angles of the three polaroids are 0 degree, 60 degrees and 120 degrees.
5. The three-channel polarization information acquisition system according to claim 1, wherein: and imaging the high-sensitivity CMOS sensor in the seventh step into a high-sensitivity CMOS sensor driving and synchronous acquisition circuit.
6. The three-channel polarization information acquisition system according to claim 1, wherein: in the eighth step, three-dimensional measurement results of the highly reflective object are calculated according to the light intensity distribution of the three polarization channels, n grating images for measurement are projected, and n multiplied by 3 images are obtained through the three-channel polarization information acquisition system, wherein one of the grating images and the acquired images of the three channels are respectively
K =1,2, …, n, since the modulation modes of different object surfaces on the gratings are different after reflection, the acquisition results obtained in the three polarization channels are different, wherein one channel can be in a saturated state, therefore, saturated pixels are firstly screened to obtain a highlight area, grating information can be acquired in other areas due to three channels, the original light intensity is calculated, and high-quality grating information is obtainedAnd the grating information further eliminates the influence of a polarizing film on a dark area, the screened saturated pixels select the maximum unsaturated pixel value as an acquisition result at the same position of the other two channels acquired by the same grating pattern, the other grating patterns also select the channel, and the pixel value at the position can be used for calculating the phase value at the position so as to obtain a measurement result.
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Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116773457A (en) * | 2023-08-18 | 2023-09-19 | 华东交通大学 | Polarization measurement method, system, equipment and medium based on Stokes parameters |
| CN117041712A (en) * | 2023-10-08 | 2023-11-10 | 深圳市信润富联数字科技有限公司 | Light source integrated camera and detection method |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20100321773A1 (en) * | 2009-06-19 | 2010-12-23 | Industrial Technology Research Institute | Method and system for three-dimensional polarization-based confocal microscopy |
| CN107607040A (en) * | 2017-08-11 | 2018-01-19 | 天津大学 | A kind of three-dimensional scanning measurement device and method suitable for High Reflective Surface |
| CN111982026A (en) * | 2020-08-27 | 2020-11-24 | 苏州飞特西普三维科技有限公司 | Grating projection three-dimensional measuring device and measuring method for high-reflection object curved surface |
| CN113237436A (en) * | 2021-04-07 | 2021-08-10 | 上海大学 | Device and method for measuring shape of polarized light space phase shift non-Lambertian metal object |
| CN113687510A (en) * | 2021-07-19 | 2021-11-23 | 沈阳理工大学 | Light path folding reflection type large-view-field compound eye imaging optical system and method thereof |
-
2022
- 2022-10-21 CN CN202211297987.9A patent/CN115451820A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US20100321773A1 (en) * | 2009-06-19 | 2010-12-23 | Industrial Technology Research Institute | Method and system for three-dimensional polarization-based confocal microscopy |
| CN107607040A (en) * | 2017-08-11 | 2018-01-19 | 天津大学 | A kind of three-dimensional scanning measurement device and method suitable for High Reflective Surface |
| CN111982026A (en) * | 2020-08-27 | 2020-11-24 | 苏州飞特西普三维科技有限公司 | Grating projection three-dimensional measuring device and measuring method for high-reflection object curved surface |
| CN113237436A (en) * | 2021-04-07 | 2021-08-10 | 上海大学 | Device and method for measuring shape of polarized light space phase shift non-Lambertian metal object |
| CN113687510A (en) * | 2021-07-19 | 2021-11-23 | 沈阳理工大学 | Light path folding reflection type large-view-field compound eye imaging optical system and method thereof |
Non-Patent Citations (2)
| Title |
|---|
| 张朝阳 等: "伪装遮障的光学与红外偏振成像", 红外与激光工程, vol. 38, no. 3, 30 June 2009 (2009-06-30), pages 424 - 427 * |
| 范晨等 著: "基于导航拓扑图的仿生导航方法研究", 31 May 2020, 北京：国防工业出版社, pages: 88 - 90 * |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN116773457A (en) * | 2023-08-18 | 2023-09-19 | 华东交通大学 | Polarization measurement method, system, equipment and medium based on Stokes parameters |
| CN117041712A (en) * | 2023-10-08 | 2023-11-10 | 深圳市信润富联数字科技有限公司 | Light source integrated camera and detection method |
| CN117041712B (en) * | 2023-10-08 | 2024-03-26 | 深圳市信润富联数字科技有限公司 | Light source integrated camera and detection method |
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