CN115421468A - Test box monomer and combined joint debugging test box - Google Patents
Test box monomer and combined joint debugging test box Download PDFInfo
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- CN115421468A CN115421468A CN202211022501.0A CN202211022501A CN115421468A CN 115421468 A CN115421468 A CN 115421468A CN 202211022501 A CN202211022501 A CN 202211022501A CN 115421468 A CN115421468 A CN 115421468A
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- box
- test box
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- box body
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- G—PHYSICS
- G05—CONTROLLING; REGULATING
- G05B—CONTROL OR REGULATING SYSTEMS IN GENERAL; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS OR ELEMENTS
- G05B23/00—Testing or monitoring of control systems or parts thereof
- G05B23/02—Electric testing or monitoring
- G05B23/0205—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults
- G05B23/0218—Electric testing or monitoring by means of a monitoring system capable of detecting and responding to faults characterised by the fault detection method dealing with either existing or incipient faults
- G05B23/0221—Preprocessing measurements, e.g. data collection rate adjustment; Standardization of measurements; Time series or signal analysis, e.g. frequency analysis or wavelets; Trustworthiness of measurements; Indexes therefor; Measurements using easily measured parameters to estimate parameters difficult to measure; Virtual sensor creation; De-noising; Sensor fusion; Unconventional preprocessing inherently present in specific fault detection methods like PCA-based methods
Abstract
The invention discloses a test box single body, which comprises a box body main body, a box cover, an I/O module and a connector, wherein the box body main body is provided with a box cover; the top of the box body main body is provided with an opening and is provided with a box cover; the I/O module is arranged in the box body main body, and the top of the I/O module is contacted with the box cover; the connector comprises a male end component and a female end component matched with the male end component; the male end assembly and the female end assembly are respectively arranged on two opposite outer side walls of the box body in the middle; the male end component is connected with the input end/output end of the I/O module; and the female terminal assembly is connected with the output/input terminal of the I/O module. The invention also discloses a combined joint debugging test box. The invention has the beneficial effects that: the test box can be freely combined for different test verification occasions and can also be independently used, so that the flexibility and the universality of the test box are greatly improved, the test efficiency is improved, the test cost is reduced, and the cleanliness of the test site environment is improved.
Description
Technical Field
The invention relates to the technical field of digital control system testing, in particular to a test box single body and a combined joint debugging test box.
Background
The digital control system test technology is to use test equipment (test box) to perform joint debugging test on a control system and the equipment to verify whether the functions of the control system and the equipment are normal. At present, conventional test boxes often can not be combined and spliced with each other, and a single test device is relatively large in size and inconvenient to carry, and each piece of equipment in a system needs to be provided with one test device, so that the integration level and the standardization degree of the device are not high, and the universality is poor. When a plurality of test boxes are required to be tested simultaneously by a verification object, the transportation, storage, field placement, integration and the like of the test boxes are required to be challenged. Therefore, it is necessary to develop a combined test box which can be freely combined for different test and verification occasions and can be used independently.
Disclosure of Invention
The invention aims to provide a test box single body with strong universality and a combined type joint debugging test box aiming at the defects of the prior art.
The technical scheme adopted by the invention is as follows: a test box single body comprises a box body main body, a box cover, an I/O module and a connector; the top of the box body main body is provided with an opening and is provided with a box cover; the I/O module is arranged in the box body main body, and the top of the I/O module is contacted with the box cover; the connector comprises a male end component and a female end component matched with the male end component; male end subassembly and female end subassembly arrange between two opposite lateral walls of box main part respectively.
According to the scheme, the single test box body is further provided with a guiding and positioning structure, the guiding and positioning structure comprises two groups of matched bosses and grooves, and the bosses are symmetrically arranged on the side walls of the box body main body at the two sides of the male end assembly/the female end assembly; the two groups of grooves are arranged on the side walls of the box body on two sides of the female end component/the male end component.
According to the scheme, the boss is provided with the magnet, and the reed pipe is arranged in the groove.
According to the scheme, the boss is a four-edge frustum, and four circumferential side surfaces of the boss are obliquely arranged relative to the first side wall of the box body.
According to the scheme, the box body is internally provided with the guide rail, the base and two sets of module adjusting mechanisms, the I/O module is arranged on the guide rail, the guide rail is arranged on the base, two ends of the base are respectively connected with one module adjusting mechanism, the module adjusting mechanisms are arranged at the bottom of the box body, and the module adjusting mechanisms drive the base and the guide rail to ascend and descend so as to drive the I/O module to ascend and descend, so that the top of the I/O module is tightly attached to the box cover.
According to the scheme, the module adjusting mechanism comprises a lifting nut, a screw rod, a limiting block, a lower gasket and an upper gasket, the lifting nut is fastened at the end part of the base, the upper end of the screw rod is matched with the lifting nut, and the lower end of the screw rod is connected to the box body through the upper gasket, the lower gasket and the limiting block; and rotating the screw rod, driving the base to lift by the lifting nut, and then driving the I/O module to lift.
According to the scheme, the box cover is connected with the box body through the L-shaped connecting plate at the edge part; and the box cover is provided with an installation process hole which is right opposite to the first fastening screw.
According to the scheme, the box body main body, the box cover and the base are all made of aluminum alloy materials.
The invention also provides a combined joint debugging test box, which comprises at least two test box single bodies as claimed in any one of claims 1 to 8, wherein the test box single bodies are sequentially connected end to end; the male end component of the previous test box monomer is connected with the female end component of the next test box monomer; the boss of the previous test box monomer is connected with the groove of the next test box monomer; the electric interfaces of the test box bodies are butted with the reed pipes in the grooves through the magnets of the bosses.
According to the scheme, the combined joint debugging test box also comprises a connecting plate and a handle; the connecting plate is connected with the corresponding side walls of the two adjacent test box monomers, and a handle is arranged on the connecting plate.
The invention has the beneficial effects that: 1. the combination is flexible: the invention can be freely combined for different test and verification occasions and can also be used independently, thereby greatly improving the flexibility and the universality of the test box, being beneficial to improving the test efficiency, reducing the test cost and improving the environment cleanliness of the test site. 2. The position of the I/O module in the test box can be adjusted in the installation process, and the use flexibility is high. 3. The assembled test box is neat in appearance, small in size, light in weight and easy to carry, and the field test efficiency is improved.
Drawings
FIG. 1 is a schematic view of the structure of a single body of the test chamber of the present invention.
FIG. 2 is a left-view direction full-section effect diagram of the single body of the test box of the present invention.
FIG. 3 is a schematic view of the top view of the single body of the test box of the present invention.
FIG. 4 is a left side view schematic diagram of the single body of the testing box of the present invention.
FIG. 5 is a diagram illustrating the effect of the combined test box of the present invention, which is composed of two single test boxes.
Wherein: 1. a box body main body; 1.1, a first side wall; 1.2, a second side wall; 2. a box cover; 2.1, mounting a process hole; 3. an I/O module; 4. a guide rail; 5. a connector; 5.1, a male end component; 5.2, a female end component; 6. a module adjusting mechanism; 6.1, lifting a nut; 6.2, a screw rod; 6.3, a limiting block; 6.4, lower gasket; 6.5, arranging a gasket; 7. a base; 8. a first fastening screw; 9. a guiding and positioning structure; 9.1, a boss; 9.1.1, a magnet; 9.2, grooves; 9.2.1, a reed pipe; 10. an L-shaped connecting plate; 11. a connecting plate; 12. and (4) a handle.
Detailed Description
For a better understanding of the present invention, reference is made to the following detailed description taken in conjunction with the accompanying drawings.
A single test box shown in fig. 1 to 3 comprises a box body main body 1, a box cover 2, an I/O module 3 and a connector 5; the top of the box body main body 1 is provided with an opening and is provided with a box cover 2; the I/O module 3 is arranged in the box body main body 1, and the top of the I/O module 3 is contacted with the box cover 2; the connector 5 comprises a male end component 5.1 and a female end component 5.2 matched with the male end component 5.1; the male end component 5.1 and the female end component 5.2 are respectively arranged on two opposite outer side walls of the box body 1 in the middle; when a plurality of test box monomers are connected, the male end component 5.1 of one test box monomer is used as an output end and is connected with the female end component 5.2 of the other test box monomer; the female end component 5.2 is used as an input end and is connected with the male end component 5.1 of another adjacent test box monomer.
In this embodiment, the male end assembly 5.1 is disposed on the first side wall 1.1 of the box body 1, and the female end assembly 5.2 is disposed on the second side wall 1.2 of the box body 1; the connector 5 can be a magnetic connector, and correspondingly, the male end component 5.1 and the female end component 5.2 are a magnetic male head and a magnetic female head respectively; the connector 5 is of a well-established construction commonly used in the industry and will not be described in detail here.
Preferably, the single test box is further provided with a guiding and positioning structure 9, the guiding and positioning structure 9 comprises two groups of bosses 9.1 and grooves 9.2 which are matched with each other, and the two groups of bosses 9.1 are symmetrically arranged on the side walls of the box body main body 1 at two sides of the male end component 5.1/the female end component 5.2; two groups of grooves 9.2 are arranged on the side walls of the box body main body 1 at two sides of the female end component 5.2/the male end component 5.1.
In this embodiment, the boss 9.1 and the male end component 5.1 are mounted on the first side wall 1.1; the groove 9.2 and the female end member 5.2 are mounted on the second side wall 1.2.
Preferably, the boss 9.1 is a four-edged frustum, and four circumferential side surfaces of the frustum are obliquely arranged relative to the first side wall 1.1 of the box body 1, that is, the boss 9.1 and the groove 9.2 are in a bevel wedging guiding relationship. The boss 9.1 is provided with a magnet 9.1.1, and the groove 9.2 is internally provided with a reed pipe 9.2.1.
In this embodiment, the reed switch 9.2.1 is an electrical switch standard component, and it is pasted on the outer wall of the box main body 1 where the groove 9.2 is located through glue, and the purpose of setting the reed switch 9.2.1 and the magnet 9.1.1 is as follows: the purpose is when the test box uses alone, lets expose female end subassembly 5.2 outage outside, prevents that outside touching from taking place short-circuit fault, plays the effect that tests box concatenation when using simultaneously, and female end subassembly 5.2 power of automatic switch-on. The principle is that the reed switch 9.2.1 is electrically connected with the female end component 5.2, the reed switch 9.2.1 is closed, and the female end component 5.2 is connected with a power supply; the reed switch 9.2.1 is disconnected and the female terminal assembly 5.2 is powered off. When the single testing bodies are spliced for use, the male end component 5.1 of the other testing box body is attracted with the female end component 5.2 of the current testing box body, and meanwhile, the magnet 9.1.1 of the other testing box body is close to the reed pipe 9.2.1 of the current testing box body to attract the reed pipe 9.2.1, so that the power supply of the male end component 5.1 of the other testing box body is connected, and the power supply of the female end component 5.2 is automatically disconnected when the testing box body leaves.
Preferably, be equipped with guide rail 4, base 7 and two sets of module adjustment mechanism 6 in the box main part 1, IO module 3 is located on guide rail 4 (the two can the joint), guide rail 4 installs on base 7, and the both ends of base 7 respectively link to each other with a module adjustment mechanism 6, and module adjustment mechanism 6 installs in box main part 1 bottom, and module adjustment mechanism 6 drives base 7 and guide rail 4 and goes up and down to drive IO module 3 and go up and down, make IO module 3 top and case lid 2 hug closely. In this embodiment, the guide rail 4 is fixedly connected with the base 7 through a first fastening screw 8.
Preferably, the module adjusting mechanism 6 includes a lifting nut 6.1, a screw 6.2, a limiting block 6.3, a lower gasket 6.4 and an upper gasket 6.5, the lifting nut 6.1 is fastened at the end of the base 7, the upper end of the screw 6.2 is matched with the lifting nut 6.1, and the lower end of the screw 6.2 is connected to the box body 1 (the screw 6.2 is rotatable) after passing through the upper gasket 6.5, the lower gasket 6.4 and the limiting block 6.3; and rotating the screw rod 6.2, driving the base 7 to lift by the lifting nut 6.1, and then driving the I/O module 3 to lift.
In this embodiment, the upper gasket 6.5 and the lower gasket 6.4 are both tetrafluoro gaskets.
In this embodiment, the box cover 2 is connected with the box body main body 1 through an L-shaped connecting plate 10 at the edge; set up installation fabrication hole 2.1 on the case lid 2, installation fabrication hole 2.1 is just to first fastening screw 8, and its effect lies in: before the first fastening screws 8 are screwed, the I/O module 3 is finely adjusted and aligned by taking the box cover 2 as a reference, and then the first fastening screws 8 are screwed by utilizing the mounting process holes 2.1.
Preferably, the box body 1, the box cover 2 and the base 7 are all made of aluminum alloy materials.
In the invention, when the single test box is used independently, the side wall of the single test box can be provided with the connecting plate 11, and the handle 12 is arranged on the connecting plate 11, so that the single test box is convenient to carry.
The combined joint debugging test box shown in fig. 5 comprises at least two test box single bodies, wherein the test box single bodies are sequentially connected end to end; the male end component 5.1 of the previous test box monomer is connected with the female end component 5.2 of the next test box monomer; the boss 9.1 of the previous test box monomer is connected with the groove 9.2 of the next test box monomer; the electric interface of each test box monomer is butted with the reed switch 9.2.1 in the groove 9.2 through the magnet 9.1.1 of the lug boss 9.1. In this embodiment, as shown in fig. 5, when two single test boxes are spliced for use, the magnet 9.1.1 on one single test box is connected with the reed switch 9.2.1 on the other single test box; when the test box is separated, the reed switch 9.2.1 is disconnected, so that the electric interfaces between the single test box bodies can be automatically connected when spliced, and the effect of automatic power off when separated is achieved.
Preferably, the combinable joint debugging test box further comprises a connecting plate 11 and a handle 12; the connecting plate 11 is connected with corresponding side walls of two adjacent test box monomers, and a handle 12 is installed on the connecting plate 11. In this embodiment, the pitch of the mounting holes of the connecting plate 11 is L, the pitch of the holes is L1, and L is twice the pitch of L1.
The above embodiments are merely preferred embodiments of the present invention, but not limited to the above embodiments, and the drawings only show the related structure diagram of the test box monomers and the combined effect diagram of two test box monomers, obviously, the combinable test box may be composed of N test box monomers, where N is a natural number greater than or equal to 1, and any design manner or design idea pointed out by the present invention should be considered within the protection scope of the present invention.
Claims (10)
1. A single test box is characterized by comprising a box body main body, a box cover, an I/O module and a connector; the top of the box body main body is provided with an opening and is provided with a box cover; the I/O module is arranged in the box body main body, and the top of the I/O module is contacted with the box cover; the connector comprises a male end component and a female end component matched with the male end component; male end subassembly and female end subassembly arrange between two opposite lateral walls of box main part respectively.
2. The single test box body of claim 1, wherein the single test box body is further provided with guide positioning structures, the guide positioning structures comprise matched bosses and grooves, and the bosses are symmetrically arranged on the side walls of the box body at two sides of the male end assembly/the female end assembly; the two groups of grooves are arranged on the side walls of the box body on two sides of the female end component/the male end component.
3. The single test box of claim 2, wherein the boss is configured with a magnet and the reed pipe is configured in the recess.
4. The single test box of claim 2, wherein the boss is a four-sided frustum with four circumferential sides disposed obliquely relative to the first side wall of the box body.
5. The single test box of claim 2, wherein the main box body has a guide rail, a base and two sets of module adjusting mechanisms, the I/O module is disposed on the guide rail, the guide rail is mounted on the base, two ends of the base are respectively connected to one module adjusting mechanism, the module adjusting mechanism is mounted at the bottom of the main box body, and the module adjusting mechanism drives the base and the guide rail to move up and down, thereby driving the I/O module to move up and down, so that the top of the I/O module is tightly attached to the box cover.
6. The single test box of claim 2, wherein the module adjusting mechanism comprises a lifting nut, a screw, a limiting block, a lower gasket and an upper gasket, the lifting nut is fastened at the end of the base, the upper end of the screw is matched with the lifting nut, and the lower end of the screw is connected to the box body after passing through the upper gasket, the lower gasket and the limiting block; and rotating the screw rod, driving the base to lift by the lifting nut, and then driving the I/O module to lift.
7. The test box unit as claimed in claim 6, wherein the box cover is connected to the box body by an L-shaped connecting plate at the edge; and the box cover is provided with an installation process hole which is right opposite to the first fastening screw.
8. The single test box of claim 6, wherein the main box body, the box cover and the base are made of aluminum alloy materials.
9. A combinable joint debugging test box, which is characterized by comprising at least two test box single bodies as claimed in any one of claims 1 to 8, wherein the test box single bodies are sequentially connected end to end; the male end component of the previous test box monomer is connected with the female end component of the next test box monomer; the boss of the previous test box monomer is connected with the groove of the next test box monomer; the electric interfaces of the single test boxes are in butt joint with the reed pipes in the grooves through the magnets of the bosses.
10. The combinable joint debugging test box of claim 9 further comprising a connecting plate and a pull handle; the connecting plate is connected with the corresponding side walls of the two adjacent test box monomers, and a handle is arranged on the connecting plate.
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211022501.0A CN115421468A (en) | 2022-08-25 | 2022-08-25 | Test box monomer and combined joint debugging test box |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202211022501.0A CN115421468A (en) | 2022-08-25 | 2022-08-25 | Test box monomer and combined joint debugging test box |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN115421468A true CN115421468A (en) | 2022-12-02 |
Family
ID=84198004
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202211022501.0A Pending CN115421468A (en) | 2022-08-25 | 2022-08-25 | Test box monomer and combined joint debugging test box |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN115421468A (en) |
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2022
- 2022-08-25 CN CN202211022501.0A patent/CN115421468A/en active Pending
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