CN115390259A - Method for capturing and controlling particles in liquid based on adjustable Bessel light beam - Google Patents
Method for capturing and controlling particles in liquid based on adjustable Bessel light beam Download PDFInfo
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- 238000012576 optical tweezer Methods 0.000 abstract description 6
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- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
- G02B27/09—Beam shaping, e.g. changing the cross-sectional area, not otherwise provided for
- G02B27/0927—Systems for changing the beam intensity distribution, e.g. Gaussian to top-hat
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- G—PHYSICS
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- G02B27/00—Optical systems or apparatus not provided for by any of the groups G02B1/00 - G02B26/00, G02B30/00
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Abstract
The invention discloses a method for capturing and controlling particles in liquid based on adjustable Bessel light beams, which comprises the steps of adjusting a reflector and a reflector to enable weak light reflected by a first polarization beam splitter prism and transmitted strong light to be reversely and collinearly intersected in a nonlinear medium; the power ratio of the reflected light and the transmitted light of the first polarization splitting prism is adjusted by rotating the angle of the first half-wave plate; the power of the transmission light of the second polarization splitting prism is adjusted by rotating the angle of the second half-wave plate; and adjusting the power of the reflected light of the first polarization splitting prism by rotating the third half-wave plate. The invention utilizes Bessel light beams to capture multiple particles simultaneously, and solves the problem of low capture efficiency caused by light beam divergence at an out-of-focus position and serious distortion of light beams caused by the particles in the traditional optical tweezers technology. In addition, transverse manipulation of the multi-particle is realized by changing the size of the Bessel beam, which has great significance for in-situ analysis of the multi-particle in liquid and cell sorting and transportation.
Description
Technical Field
The invention belongs to the field of nonlinear optical application, relates to a laser capture and control device, and particularly relates to a method for capturing and controlling particles in liquid based on an adjustable Bessel light beam.
Background
Optical tweezers, as a particle capture and manipulation technique without mechanical contact, are widely used in various fields, such as analysis and identification of chromosomes, momentum transfer research during interaction between light and substances, in-situ online analysis of suspended aerosols, and the like. The traditional optical tweezers all adopt laser beams with Gaussian distribution as light sources. However, the beam is severely distorted due to beam divergence and particles at off-focus positions. Therefore, the capture and control of multiple particles by using the Gaussian beam are difficult, and the problem of low capture and control efficiency exists.
Disclosure of Invention
The invention aims to provide a method for capturing and controlling particles in liquid based on an adjustable Bessel light beam, so as to solve the technical problem that the capturing and controlling efficiency of multiple particles by adopting a Gaussian light beam in the prior art is low.
In order to solve the technical problems, the technical scheme adopted by the invention is as follows:
a method for capturing and controlling particles in liquid based on an adjustable Bessel beam adopts a device for capturing and controlling particles in liquid based on the adjustable Bessel beam, and the device comprises a laser, a Bessel beam generation module, a third reflector, a beam shrinking module, an illumination module, a dichroic mirror and a capturing module; the continuous laser beam emitted by the laser device passes through the Bessel beam generation module to obtain a hollow laser beam, and the hollow laser beam enters the beam shrinking module to be shrunk after being reflected by the third reflector; the shrunk light beam enters a capturing module after being reflected by a dichroic mirror, and a Bessel light beam and captured particles are obtained; the illumination module, the dichroic mirror and the capture module are all positioned on the same optical axis; the method specifically comprises the following operations:
by adjusting the reflector and the reflector, the weak light reflected by the first polarization splitting prism and the transmitted strong light are reversely collinearly intersected in the nonlinear medium; adjusting the power ratio of the reflected light and the transmitted light of the first polarization beam splitter by rotating the angle of the first half-wave plate to be 1;
the power of the transmitted light of the second polarization splitting prism is adjusted by rotating the angle of the second half-wave plate, the weak light emitted by the nonlinear medium can be converted into a hollow beam, and meanwhile, the imaging device forms a Bessel beam;
and adjusting the power of the reflected light of the first polarization splitting prism by rotating the third half-wave plate until the required number of particles is obtained, wherein the power of the reflected light and the number of the particles are linearly changed.
Furthermore, the laser is a 532nm semiconductor continuous laser.
Further, the Bessel beam generation module comprises a hollow beam generation system and a first microscope objective.
Furthermore, the hollow beam generating system comprises a first half-wave plate, a first polarization beam splitter prism, a second half-wave plate, a first lens, a second polarization beam splitter prism, a nonlinear medium, a third polarization beam splitter prism, a first reflecting mirror, a second reflecting mirror and a third half-wave plate; the continuous laser beam emitted by the laser enters a first polarization beam splitter prism after passing through a first half-wave plate, the reflected light of the first polarization beam splitter prism enters a first reflector, the reflected light of the first polarization beam splitter prism enters a second reflector after being reflected by the first reflector, the light reflected by the second reflector sequentially enters a third polarization beam splitter prism and a nonlinear medium after passing through a third half-wave plate, and the light transmitted by the nonlinear medium is reflected by the second polarization beam splitter prism and enters the third reflector;
the transmission light of the first polarization splitting prism sequentially passes through the second half-wave plate, the first lens, the second polarization splitting prism and the nonlinear medium and then enters the second polarization splitting prism; the first polarization beam splitter prism, the second half-wave plate, the first lens, the second polarization beam splitter prism, the nonlinear medium and the third polarization beam splitter prism are located on the same optical axis, and the nonlinear medium is located at the focus of the first lens.
Furthermore, the reflected light of the first polarization beam splitter prism in the hollow light beam generation system is weak light, the transmitted light of the first polarization beam splitter prism is strong light, and the weak light and the strong light are reversely, collinearly and intersect in the nonlinear medium.
Furthermore, the beam-shrinking module comprises a second lens and a third lens, and light reflected by the third reflector enters the dichroic mirror after being shrunk by the second lens and the third lens in sequence.
Further, the lighting module comprises a light emitting diode and a fourth lens; light emitted by the light emitting diode is focused by the fourth lens and then transmits through the dichroic mirror; wherein the light emitting diode and the fourth lens are on the same optical axis.
Furthermore, the capturing module comprises a sample cell and an imaging device, light reflected by the dichromatic retroreflection enters the sample cell through the first microscope objective and then enters the imaging device, and the sample cell is located at the focus of the first microscope objective.
Furthermore, the imaging acquisition device comprises a second microscope objective, a filter and an imaging device, and the contracted light beam and the illuminating light enter the sample cell through the first microscope objective and then sequentially pass through the second microscope objective and the filter and enter the imaging device.
Compared with the prior art, the invention has the following advantages:
(1) Based on cross phase modulation, the invention realizes the regulation and control of the strong Gaussian beam to the weak Gaussian beam, so that the light intensity center is distributed to obtain the Bessel beam; the characteristic of light intensity distribution of the concentric rings of the Bessel light beams is utilized to generate a plurality of optical potential wells, and the simultaneous capture of a plurality of particles in the liquid is realized. The problem of traditional optical tweezers because the light beam that the gaussian beam of out-of-focus position department diverges and the particle causes seriously distorts to the light beam to lead to catching inefficiency is solved.
(2) According to the invention, the size of the Bessel beam is changed by changing the power of strong light in the cross phase modulation system, so that the transverse control of multiple particles is realized. The method has important significance for in-situ analysis of multiple particles in liquid, cell sorting and transportation and practical application of the optical tweezers.
(3) The invention further regulates and controls the number of the captured particles by changing the weak light power in the cross phase modulation system.
(4) The analysis device provided by the invention has the advantages of easy structure realization, convenience in operation, low cost and easiness in popularization.
The technical solution of the present invention is further described in detail with reference to the accompanying drawings and embodiments.
Drawings
FIG. 1 is a schematic view showing the overall structure of an apparatus used in the method of the present invention;
FIG. 2 is an experimental graph of Bessel beam spot variation with high light power generated by the present invention;
FIG. 3 is an experimental diagram of the present invention using Bessel beams to achieve simultaneous capture of multiple particles;
FIG. 4 is an experiment showing the variation of the number of trapped particles with the power of a trapped Bessel beam according to the present invention;
FIG. 5 is a linear fit plot of the number of trapped particles as a function of trapped Bessel beam power;
fig. 6 is a schematic diagram of the lateral manipulation of multiple particles by varying the intensity of light in the cross-phase modulation system according to the present invention.
The meaning of the various reference numbers in the figures: 1-a laser, 2-a Bessel beam generating module, 3-a third reflector, 4-a beam shrinking module, 5-an illuminating module, 6-a dichroic mirror and 7-a capturing module;
201-hollow beam generation system, 202-first microscope objective;
2010-first half-wave plate, 2011-first polarization splitting prism, 2012-second half-wave plate, 2013-first lens, 2014-second polarization splitting prism, 2015-nonlinear medium, 2016-third polarization splitting prism, 2017-first mirror, 2018-second mirror, 2019-third half-wave plate;
401-second lens, 402-third lens;
501-light emitting diode, 502-fourth lens.
701-a sample cell, 702-an imaging device;
7021-second microscope objective, 7022-filter, 7023-imaging device.
The present invention will be explained in further detail with reference to examples.
Detailed Description
It should be noted that the bessel beam is adopted in the present invention for two reasons: firstly, the special light intensity distribution of the Bessel light beam can generate a plurality of optical potential wells, which is beneficial to the simultaneous capture of multiple particles; secondly, the bessel beams in the invention are obtained based on cross phase modulation, so that the size of the bessel beams can be further changed by changing the strong light power in the cross phase modulation, and finally the transverse control of the particles is realized. When the focused Bessel beam acts on the particle, the light is reflected and refracted, so that the momentum of the laser light is transferred to the particle, thereby generating gradient force and scattering force on the particle. Under geometrical optical approximation, the total force F can be expressed as:
wherein V m Is the speed of light, S, in the medium surrounding the particles 1 The area of the surface of the particle irradiated by the incident light, I is the intensity distribution of the incident light, alpha i The angle between the incident light of the illumination point and the normal,
and
representing the incident and reflected light rays respectively,
the transmitted light after k reflections in the particles, N light is the total number of reflections inside the particles, and R and T represent the reflection and transmission coefficients, respectively.
For better analysis of the stress condition of the particles, two coordinate systems are adopted: s (x, y, z) and S '(x', y ', z'). Wherein the origin of the S coordinate system is at the center of the Bessel beam and the radius is R 0 Has a coordinate C (r) in the S coordinate system 0 ,z 0 ). The origin of the coordinates of the S' coordinate system is the center of the particle. Z is parallel to Z'. Thus, the coordinates for any particle in the S coordinate system can be written as:
z＝z 0 +R 0 cosθ (3)
where theta and phi are the polar and azimuthal angles.
The intensity distribution of the bessel beam is axisymmetric, and we focus only on the energy flow in the z direction. Since gravity and scattering forces are along the direction of beam propagation, we only consider the movement of particles in the transverse plane in this patent. Therefore, we can ignore gravity and scattering forces. Through vector calculation, the transverse force F to which the particle is subjected can be obtained from the formula (1) ρ (r,z)：
Wherein
The light intensity distribution of the 0 th order bessel beam. We assume that all rays are parallel to the optical axis, so θ represents the angle of incidence of the ray at each point on the particle surface, θ t Is the transmission angle. When F is present ρ (r, z) =0, and this point is an equilibrium position, the particle will be trapped.
Thus, the use of bessel beams enables the simultaneous capture of multiple particles.
It should be noted that fig. 2 illustrates that the variation of the size of the bessel beam can be effectively controlled by changing the strong light power under the condition that the energy of the trapped laser (bessel beam/weak light emitted) is not changed.
All parts in the present invention are those known in the art, unless otherwise specified.
The following embodiments of the present invention are provided, and it should be noted that the present invention is not limited to the following embodiments, and all equivalent changes based on the technical solutions of the present invention are within the protection scope of the present invention.
Example (b):
the embodiment provides a device adopted by a method for capturing and manipulating particles in liquid based on an adjustable Bessel beam, and as shown in FIG. 1, the device comprises a laser 1, a Bessel beam generation module 2, a third reflector 3, a beam reduction module 4, an illumination module 5, a dichroic mirror 6 and a capture module 7.
The bessel beam generation module 2 comprises a system 201 for generating a hollow beam based on cross-phase modulation and a first microscope objective 202. The Bessel beam produced has a special light intensity distribution of concentric rings, and multiple optical potential wells can be produced for simultaneous capture of multiple particles as shown in FIG. 3. The problem of traditional optical tweezers because the light beam that the gaussian beam of out-of-focus position department diverges and the particle causes seriously distorts to the light beam to lead to catching inefficiency is solved.
The hollow beam generation system 201 includes a first half-wave plate 2010, a first polarization splitting prism 2011, a second half-wave plate 2012, a first lens 2013, a second polarization splitting prism 2014, a non-linear medium 2015, a third polarization splitting prism 2016, a first mirror 2017, a second mirror 2018, and a third half-wave plate 2019. The light reflected by the first polarization splitting prism 2011 is weak light, and the light transmitted by the first polarization splitting prism 2011 is strong light. The power of weak light in the cross-phase modulation system can be changed by rotating the third half-wave plate 2019, the power of the trapping laser (Bessel beam) is controlled, and the control of the number of trapped particles is realized as shown in FIG. 4. It can be seen that the number of trapped particles is also increased as the trapping laser light (bessel beam) is sequentially set to 50mw,65mw,80mw, 95mw. Figure 5 is a plot of the number of trapped particles as a function of trapped bessel beam power. It can be seen that the number of trapped particles is linear with the trapped bessel beam power.
Under the condition that the power of the trapped Bessel laser beam is unchanged, the power of strong light in the cross-phase modulation system can be changed by rotating the second half-wave plate 2012, and the simultaneous transverse manipulation of the trapped multi-particles is realized as shown in FIG. 6. It can be seen that as the intense light power is increased from 135mW to 185mW, the phenomenon of simultaneous intermediate movement of the trapped multiparticulates occurs.
The beam-reducing module 4 comprises a first lens 401 with a focal length of 300mm and a second lens 402 with a focal length of 50mm, and is used for reducing the generated hollow beam so that the hollow beam can enter the first microscope objective 202.
The focal length of the third lens 402 is 50mm, and is mainly used for focusing the illumination light generated by the light emitting diode 501.
The laser 1 is a 780nm semiconductor continuous laser.
Dichroic mirror 6 is used to reflect the 780nm hollow beam and transmit the illumination light produced by light emitting diode 501.
The first microscope objective 202 has a magnification of 10x and a numerical aperture of 0.25, and is mainly used for focusing the generated hollow beam to obtain a bessel beam near the focal point.
In the imaging and collecting device 702, the image of the captured particles sequentially passes through the second micro objective 7021, and the light intensity is attenuated by the optical filter 7022, so that the image is imaged on the imaging device CMOS camera. The second microscope, with a magnification of 80x and a numerical aperture of 0.8, is used primarily for focusing light. And the imaging effect can be optimized by changing the distance between the second microscope objective 7021 and the imaging device.
The illumination module 5, the dichroic mirror 6 and the capture module 7 are all mounted on a coaxial adjusting frame so as to be on the same optical axis. And the position of each device can be finely adjusted by utilizing the coaxial adjusting frame, so that an imaging result is optimized.
The principle and the operation and control method process of the invention are as follows:
a continuous laser beam with gaussian distribution is obtained from the laser 1, and a hollow beam is obtained by passing the obtained continuous laser beam through the cross-phase modulation-based hollow beam generation module 201, which includes the following specific steps: the laser light emitted from the laser 1 is split into two beams by a combination of the half-wave plate 2010 and the polarization beam splitter prism 2011, wherein the light reflected by the polarization beam splitter prism 2011 is weak light, and the light transmitted by the polarization beam splitter prism 2011 is strong light.
The first half-waveplate 2010 is mounted on a waveplate holder having 360 ° angular cuts in its end face, and rotation of the waveplate holder changes the components of the incident vertically and horizontally polarized light. Therefore, by rotating the half-wave plate 2010, the components of the transmitted light and the reflected light passing through the polarization splitting prism 2011 can be changed, and the adjustment of the power is realized. The power ratio of the reflected light to the transmitted light is 1; in general, the reflected light power is adjusted to 100mA, and the transmitted light power is adjusted to 300-400mA.
The strong light transmitted by the polarization beam splitter 2011 sequentially passes through the half-wave plate 2012, the lens 2013 and the polarization beam splitter 2014, then enters a cuvette containing a nonlinear medium (such as an ethanol solution) and is positioned on the same optical axis. With the non-linear medium 2015 at the focal point of the first lens 2013. Furthermore, the adjustment of the high optical power can be achieved by rotating the half-wave plate 2012. The weak light reflected by the polarization splitting prism 2011 enters the nonlinear medium (2015) after passing through the reflector 2017, the reflector 2018, the half-wave plate 2019 and the polarization splitting prism 2016 in sequence, and the light transmitted by the nonlinear medium (2015) is reflected by the second polarization splitting prism (2014) and enters the third reflector (3). By rotating the half-wave plate 2019, the adjustment of the weak light power can be realized until the required number of particles is obtained, and the power of the reflected light is linearly changed with the number of particles. By adjusting the reflecting mirror 2017 and the reflecting mirror 2018, the weak light and the focused strong light are reversely and collinearly intersected in the nonlinear medium 2015, and the weak light emitted by the nonlinear medium 2015 can be converted into a hollow light beam. Because the obtained hollow light beam is vertically polarized light, the light is incident through the polarization beam splitter 2014 and the reflector 3 and then is condensed through the beam condensing module 4 in sequence; then reflected by the dichroic mirror 6 into the first microscope objective 202, and the hollow beam focused by the first microscope objective 202 can obtain a Bessel beam near the focal point. The sample cell 701 is placed at the focus of the first microscope objective 202. Meanwhile, the lens 502 can focus the illumination light generated by the light emitting diode 501, and the illumination light further passes through the dichroic mirror 6 and sequentially enters the first microscope objective 202, the sample cell 701, the second microscope objective 7021, the filter 7022, and finally enters the imaging device (CCD/CMOS) 7023, wherein the filter 7022 is used for blocking the captured laser light and only allowing the illumination light to pass through. Finally, the captured picture of the particles can be captured by an imaging device (CCD/CMOS) 7023.
Claims (9)
1. A method for capturing and controlling particles in liquid based on adjustable Bezier light beams is characterized by adopting an apparatus for capturing and controlling particles in liquid based on adjustable Bezier light beams, wherein the apparatus comprises a laser (1), a Bezier light beam generation module (2), a third reflector (3), a beam shrinking module (4), an illumination module (5), a dichroic mirror (6) and a capturing module (7); the laser system comprises a laser device (1), a Bessel beam generation module (2), a beam contraction module (4), a beam expansion module (2), a beam contraction module (3) and a power supply module, wherein continuous laser beams emitted by the laser device (1) pass through the Bessel beam generation module to obtain a hollow laser beam, and the hollow laser beam enters the beam contraction module (4) for beam contraction after being reflected by the third reflector (3); the shrunk light beam is reflected by a dichroic mirror (6) and enters a capture module (7) to obtain a Bessel light beam and captured particles; the lighting module (5), the dichroic mirror (6) and the capturing module (7) are all positioned on the same optical axis; the method specifically comprises the following operations:
adjusting the mirror (2017) and the mirror (2018) so that the weak light reflected and the strong light transmitted by the first polarization splitting prism (2011) intersect in a non-linear medium (2015) in a reverse collinear manner; adjusting the power ratio of the reflected light and the transmitted light of the first polarization splitting prism (2011) to be 1;
the power of transmitted light of the second polarization splitting prism (2014) is adjusted by rotating the angle of the second half-wave plate (2012), weak light emitted by the nonlinear medium (2015) can be converted into a hollow beam, and meanwhile, the imaging device (7023) forms a Bessel beam;
and adjusting the power of the reflected light of the first polarization splitting prism (2011) by rotating the third half-wave plate (2019) until a required number of particles are obtained, wherein the power of the reflected light is linearly changed with the number of the particles.
2. The method for trapping and manipulating particles in a liquid based on a tunable bessel beam as claimed in claim 1, wherein the laser (1) is a 532nm semiconductor continuous laser.
3. The method for trapping and manipulating particles in liquid based on adjustable Bezier beam as claimed in claim 1, wherein the Bezier beam generation module (2) comprises a hollow beam generation system (201) and a first microscope objective (202).
4. The method for trapping and manipulating particles in a liquid based on an adjustable bessel beam as claimed in claim 3, wherein the hollow beam generating system (201) comprises a first half wave plate (2010), a first polarization splitting prism (2011), a second half wave plate (2012), a first lens (2013), a second polarization splitting prism (2014), a non-linear medium (2015), a third polarization splitting prism (2016), a first mirror (2017), a second mirror (2018) and a third half wave plate (2019); the continuous laser beam emitted by the laser (1) enters a first polarization splitting prism (2011) after passing through a first half-wave plate (2010), reflected light of the first polarization splitting prism (2011) enters a first reflecting mirror (2017), the reflected light of the first polarization splitting prism (2011) enters a second reflecting mirror (2018) after being reflected by the first reflecting mirror (2017), light reflected by the second reflecting mirror (2018) sequentially enters a third polarization splitting prism (2016) and a nonlinear medium (2015) after passing through a third half-wave plate (2019), and light transmitted by the nonlinear medium (2015) is reflected by a second polarization splitting prism (2014) and enters a third reflecting mirror (3);
the transmitted light of the first polarization beam splitter prism (2011) sequentially passes through the second half-wave plate (2012), the first lens (2013), the second polarization beam splitter prism (2014) and the nonlinear medium (2015) and then enters (2016); the first polarization splitting prism (2011), the second half-wave plate (2012), the first lens (2013), the second polarization splitting prism (2014), the nonlinear medium (2015) and the third polarization splitting prism (2016) are located on the same optical axis, and the nonlinear medium (2015) is located at a focal point of the first lens (2013).
5. A method as claimed in claim 3, wherein the reflected light from the first polarizing beam splitter prism (2011) in the hollow beam generating system (201) is weak light, and the transmitted light from the first polarizing beam splitter prism (2011) is strong light, wherein the weak light and the strong light intersect collinearly in the non-linear medium (2015).
6. The method for capturing and manipulating the particles in the liquid based on the adjustable Bessel beam as claimed in claim 1, wherein the beam-shrinking module (4) comprises a second lens (401) and a third lens (402), and the light reflected by the third reflector (3) is shrunk through the second lens (401) and the third lens (402) and enters the dichroic reflector (6).
7. The method for trapping and manipulating particles in a liquid based on adjustable bessel beams as claimed in claim 1, wherein the illumination module (5) comprises a light emitting diode (501) and a fourth lens (502); light emitted by the light emitting diode is focused by the fourth lens (502) and then transmits through the dichroic mirror (6); wherein the light emitting diode (501) and the fourth lens (502) are on the same optical axis.
8. The method for capturing and manipulating particles in liquid based on the adjustable Bessel beam as claimed in claim 1, wherein the capturing module (7) comprises a sample cell (701) and an imaging device (702), the light reflected by the dichroic mirror (6) enters the sample cell (701) through the first microscope objective (202) and then enters the imaging device (702), and the sample cell (701) is located at the focal point of the first microscope objective (202).
9. The method for capturing and controlling the particles in the liquid based on the adjustable Bessel beam as claimed in claim 8, wherein the imaging acquisition device (703) comprises a second micro objective (7021), a filter (7022) and an imaging device (7023), and after the condensed light beam and the illumination light enter the sample cell (701) through the first micro objective (202), the condensed light beam and the illumination light sequentially pass through the second micro objective (7021), the filter (7022) and then enter the imaging device (7023).
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Application publication date: 20221125 |