CN115389840A - Fault testing method and device, storage medium and electronic device - Google Patents
Fault testing method and device, storage medium and electronic device Download PDFInfo
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Abstract
The invention discloses a fault testing method and device, a storage medium and an electronic device. Wherein, the method comprises the following steps: acquiring first working data of at least one test object through a data acquisition instrument; sending a fault test instruction according to the first working data through the upper computer, wherein the fault test instruction is used for controlling a power supply and/or at least one wire breaker to make a fault on a fault test system; responding to a power supply and/or at least one wire breaker to execute a fault test instruction, and acquiring second working data of at least one test object through a data acquisition instrument; and determining a fault test response of the at least one test object according to the second working data, wherein the fault test response is used for indicating the execution measures of the at least one test object when the fault test system fails. The invention solves the technical problem that the test result is inaccurate because only a single device is tested in the related technology and all fault conditions possibly occurring in the actual running of the vehicle cannot be simulated.
Description
Technical Field
The invention relates to the technical field of vehicles, in particular to a fault testing method and device, a storage medium and an electronic device.
Background
With the popularization of new energy vehicles and the rapid development of vehicle intellectualization, the market occupation of new energy vehicles is more and more, and intelligent electric equipment on the vehicles is more and more. Compared with the conventional fuel vehicle in which a 12V storage battery is supplied with power by a generator, the new energy vehicle supplies power to the 12V storage battery through a Direct Current (DCDC) converter, and the stable and reliable 12V low-voltage power supply has a great influence on the working state of intelligent electric equipment.
Currently, in the process of developing low-voltage electric devices, a Hardware-in-the-Loop (HiL) system is usually used to test a single low-voltage electric device, so as to ensure that the low-voltage electric device can work normally after being integrated on a vehicle. But the low pressure work interval that various low voltage consumer can bear exists the difference, when the vehicle power supply was unusual, because the low voltage consumer is numerous and the relation of connection is complicated on the vehicle, various unpredictable trouble probably appears, and these trouble do not have the law, are difficult to the investigation, seriously influence the safety of passenger and vehicle.
Disclosure of Invention
The embodiment of the invention provides a fault testing method, a fault testing device, a storage medium and an electronic device, which are used for at least solving the technical problem that the testing result is inaccurate because only a single device is tested in the related technology and all fault conditions possibly occurring in the actual running of a vehicle cannot be simulated.
According to one embodiment of the present invention, a fault testing method is provided, which is applied to a fault testing system, where the fault testing system includes an upper computer, a power supply, a data acquisition instrument, at least one wire breaker and at least one test object, and each wire breaker is used to control the working state of the corresponding test object, and the method includes:
acquiring first working data of at least one test object through a data acquisition instrument, wherein the first working data is used for representing the initial working state of the at least one test object; sending a fault test instruction according to the first working data through the upper computer, wherein the fault test instruction is used for controlling a power supply and/or at least one wire breaker to make a fault on a fault test system; responding to a power supply and/or at least one wire breaker to execute a fault test instruction, and acquiring second working data of at least one test object through a data acquisition instrument, wherein the second working data is used for representing a target working state of the at least one test object; and determining a fault test response of the at least one test object according to the second working data, wherein the fault test response is used for representing the execution measures of the at least one test object when the fault test system has faults.
Optionally, sending the fault test instruction according to the first working data through the upper computer includes: and sending a first fault test instruction according to the first working data through the upper computer, wherein the first fault test instruction is used for controlling a power supply to adjust output voltage according to a first preset rule, and the power supply is used for supplying power to at least one test object.
Optionally, the first preset rule includes increasing the output voltage by a first value every first time interval, or decreasing the output voltage by a second value every second time interval.
Optionally, sending the fault test instruction according to the first working data through the upper computer includes: and sending a second fault test instruction according to the first working data through the upper computer, wherein the second fault test instruction is used for controlling the power supply to adjust the power-off duration of the power supply according to a second preset rule.
Optionally, the second preset rule is used to indicate that the power-off duration is increased by a third value every third time interval.
Optionally, the sending the fault test instruction according to the first working data by the upper computer includes: and sending a third fault test instruction according to the first working data through the upper computer, wherein the third fault test instruction is used for controlling at least one wire breaker to break down.
Optionally, the sending the fault test instruction according to the first working data by the upper computer includes: determining a first moment according to the first working data through the upper computer; a failure test instruction is sent at a first time.
According to an embodiment of the present invention, there is further provided a fault testing apparatus applied to a fault testing system, where the fault testing system includes an upper computer, a power supply, a data acquisition instrument, at least one wire breaker and at least one test object, and each wire breaker is configured to control a working state of the corresponding test object, the apparatus includes:
the acquisition module is used for acquiring first working data of at least one test object through the data acquisition instrument, wherein the first working data is used for representing the initial working state of the at least one test object; the testing module is used for sending a fault testing instruction according to the first working data through the upper computer, wherein the fault testing instruction is used for controlling the power supply and/or the at least one wire breaker to make a fault on the fault testing system; the acquisition module is also used for responding to a fault test instruction executed by the power supply and/or the at least one wire breaker and acquiring second working data of the at least one test object through the data acquisition instrument, wherein the second working data is used for representing a target working state of the at least one test object; and the determining module is used for determining the fault test response of the at least one test object according to the second working data, wherein the fault test response is used for representing the execution measures of the at least one test object when the fault test system fails.
Optionally, the test module is further configured to send a first fault test instruction according to the first working data through the upper computer, where the first fault test instruction is used to control the power supply to adjust the output voltage according to a first preset rule, and the power supply is used to supply power to at least one test object.
Optionally, the first preset rule includes increasing the output voltage by a first value every first time interval, or decreasing the output voltage by a second value every second time interval.
Optionally, the test module is further configured to send a second fault test instruction according to the first working data through the upper computer, where the second fault test instruction is used to control the power supply to adjust the power-off duration of the power supply according to a second preset rule.
Optionally, the second preset rule is used to indicate that the power-off duration is increased by a third value every third time interval.
Optionally, the test module is further configured to send a third fault test instruction according to the first working data through the upper computer, where the third fault test instruction is used to control the at least one wire breaker to have a fault.
Optionally, the test module is further configured to determine a first time according to the first working data through the upper computer; a failure test instruction is sent at a first time.
According to an embodiment of the present invention, there is further provided a computer-readable storage medium having a computer program stored therein, where the computer program is configured to execute the fault testing method in any one of the above when the computer program runs on a computer or a processor.
There is further provided, according to an embodiment of the present invention, an electronic apparatus including a memory and a processor, the memory having a computer program stored therein, the processor being configured to execute the computer program to perform the fault testing method in any one of the above.
In the embodiment of the invention, first working data of at least one test object is acquired through a data acquisition instrument, wherein the first working data is used for representing the initial working state of the at least one test object; sending a fault test instruction according to the first working data through the upper computer, wherein the fault test instruction is used for controlling a power supply and/or at least one wire breaker to make a fault on a fault test system; responding to a power supply and/or at least one wire breaker to execute a fault test instruction, and acquiring second working data of at least one test object through a data acquisition instrument, wherein the second working data is used for representing a target working state of the at least one test object; and determining a fault test response of the at least one test object according to the second working data, wherein the fault test response is used for indicating the execution measures of the at least one test object when the fault test system fails. By adopting the method, a fault test system is provided, so that each wire breaker can control the working state of the corresponding test object, and fault test instructions are sent to the power supply and/or the wire breakers through the upper computer according to the initial working state of the test object, so that various fault conditions are manufactured, the fault test is carried out on the test object, and the response of the test object when various faults occur is determined. The purpose of checking various fault conditions which may occur during the actual running of the vehicle and testing the response of each test object when various faults occur is achieved, so that the test objects and the vehicle system can be optimized under various fault conditions and the response of each test object under various fault conditions, the safety of passengers and the vehicle is ensured, and the technical problem that the test result is inaccurate because only a single device is tested in the related technology and all fault conditions which may occur during the actual running of the vehicle cannot be simulated is solved.
Drawings
The accompanying drawings, which are included to provide a further understanding of the invention and are incorporated in and constitute a part of this application, illustrate embodiment(s) of the invention and together with the description serve to explain the invention without limiting the invention. In the drawings:
FIG. 1 is a flow diagram of a fault testing method according to one embodiment of the invention;
FIG. 2 is a schematic diagram of a fault simulation apparatus according to one embodiment of the present invention;
FIG. 3 is a schematic diagram of a wire breaker according to one embodiment of the present invention;
FIG. 4 is a schematic view of a test rig according to one embodiment of the present invention;
FIG. 5 is a schematic diagram of a low voltage topology according to one embodiment of the present invention;
FIG. 6 is a schematic diagram of a network topology according to one embodiment of the present invention;
fig. 7 is a block diagram of a fault testing apparatus according to an embodiment of the present invention.
Detailed Description
In order to make the technical solutions of the present invention better understood, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that the terms "first," "second," and the like in the description and claims of the present invention and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the invention described herein are capable of operation in other sequences than those illustrated or described herein. Moreover, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus.
Where an embodiment of a method of fault testing is provided according to one embodiment of the present invention, it is noted that the steps illustrated in the flowchart of the figure may be performed in a computer system such as a set of computer-executable instructions, and that while a logical order is illustrated in the flowchart, in some cases, the steps illustrated or described may be performed in an order different than presented herein.
The method embodiments may be performed in an electronic device, similar control device or system, comprising a memory and a processor. Taking an electronic device as an example, the electronic device may include one or more processors and memory for storing data. Optionally, the electronic apparatus may further include a communication device for a communication function and a display device. It will be understood by those skilled in the art that the foregoing structural description is merely illustrative and not restrictive on the structure of the electronic device. For example, the electronic device may also include more or fewer components than described above, or have a different configuration than described above.
A processor may include one or more processing units. For example: the processor may include a Central Processing Unit (CPU), a Graphics Processing Unit (GPU), a Digital Signal Processing (DSP) chip, a Microprocessor (MCU), a field-programmable gate array (FPGA), a neural Network Processor (NPU), a Tensor Processing Unit (TPU), an Artificial Intelligence (AI) type processor, and the like. Wherein the different processing units may be separate components or may be integrated in one or more processors. In some examples, the electronic device may also include one or more processors.
The memory may be configured to store a computer program, for example, a computer program corresponding to the fault testing method in the embodiment of the present invention, and the processor executes the computer program stored in the memory, so as to implement the fault testing method described above. The memory may include high speed random access memory, and may also include non-volatile memory, such as one or more magnetic storage devices, flash memory, or other non-volatile solid-state memory. In some examples, the memory may further include memory remotely located from the processor, which may be connected to the electronic device over a network. Examples of such networks include, but are not limited to, the internet, intranets, local area networks, mobile communication networks, and combinations thereof.
Communication devices are used to receive or transmit data via a network. Specific examples of the network described above may include a wireless network provided by a communication provider of the mobile terminal. In one example, the communication device includes a Network Interface Controller (NIC) that may be connected to other network devices via a base station to communicate with the internet. In one example, the communication device may be a Radio Frequency (RF) module for communicating with the internet by wireless.
The display device may be, for example, a touch screen type Liquid Crystal Display (LCD) and a touch display (also referred to as a "touch screen" or "touch display screen"). The liquid crystal display may enable a user to interact with a user interface of the mobile terminal. In some embodiments, the mobile terminal has a Graphical User Interface (GUI), and the user can perform human-computer interaction with the GUI by touching a finger contact and/or a gesture on the touch-sensitive surface, where the human-computer interaction function optionally includes the following interactions: executable instructions for creating web pages, drawing, word processing, making electronic documents, games, video conferencing, instant messaging, emailing, call interfacing, playing digital video, playing digital music, and/or web browsing, etc., for performing the above-described human-computer interaction functions, are configured/stored in one or more processor-executable computer program products or readable storage media.
The embodiment provides a fault testing method running on an electronic device, which is applied to a fault testing system, wherein the fault testing system comprises a fault simulation device and a test bench, and specifically comprises an upper computer, a power supply, a data acquisition instrument, at least one wire breaker and at least one test object, and each wire breaker is used for controlling the working state of the corresponding test object. Fig. 1 is a flow chart of a fault testing method according to an embodiment of the present invention, as shown in fig. 1, the flow chart includes the following steps:
s101, first working data of at least one test object are obtained through a data acquisition instrument.
The first working data is used for representing the initial working state of at least one test object.
Fig. 2 is a schematic diagram of a fault simulation apparatus according to an embodiment of the present invention, the fault simulation apparatus includes a data acquisition instrument 210, an upper computer 220, a power supply 230, and at least one wire breaker 240. The data collector 210 is configured to collect working data of each controller on the test bed, and may be understood as collecting working data of each test object on the test bed. The working data comprises response data after the test object receives any instruction, voltage, current and other data of the test object, and the working data can reflect the current working state of the test object.
The data collector 210 includes a plurality of CAN interfaces 211, a plurality of voltage modules 212, and a plurality of current modules 213. The data collector 210 is connected to a test rack (not shown in fig. 2) through a CAN interface 211, so that response data of each test object on the test rack CAN be collected. The data collector 210 is connected to the wire breaker 240 through the voltage module 212 and the current module 213, so that voltage data and current data on the test object controlled by the wire breaker 240 can be collected. The data acquisition instrument 210 is further connected to the upper computer 220 through the CAN interface 211, so that the acquired response data, voltage data and current data CAN be transmitted to the upper computer 220, and the upper computer 220 CAN determine the working state of the test object according to the working data.
The upper computer 220 is used for sending an operation instruction to control the data acquisition instrument 210, the power supply 230 and the wire breaker 240 to execute corresponding operations. The upper computer 220 comprises a plurality of CAN interfaces 211 and a plurality of switch modules 221, and the upper computer 220 is connected with the data acquisition instrument 210 through the CAN interfaces 211, so that an operation instruction CAN be sent to the data acquisition instrument 210 to control the data acquisition instrument 210 to acquire working data of a test object. The upper computer 220 is connected with the power supply 230 through the CAN interface 211, so that an operation instruction CAN be sent to the power supply 230 to adjust the output voltage of the power supply 230. The upper computer 220 is connected with the wire breaker 240 through the switch module 221, so that the conduction state of the wire breaker 240 can be controlled, and the working state of the test object correspondingly controlled by the wire breaker 240 can be controlled.
The power supply 230 includes several CAN interfaces 211 for supplying power to the entire fault testing system. Specifically, the power supply 230 may be a low voltage power supply, and the power supply 230 is connected to the test bed (not shown in fig. 2), specifically, connected in parallel with a power supply loop on the test bed, and is capable of supplying power independently after a power supply device of the test bed is disconnected.
The wire breaker 240 is used to control a working state of a corresponding test object, specifically, to control the test object to work normally, and to control the test object to have a fault. The wire breaker 240 comprises a relay 241, a voltage acquisition module 242, a current acquisition module 243, a controller connection end plug-in unit 244 and a wiring harness end plug-in unit 245, wherein the relay 241 is connected with a switch module 221 in the upper computer 220, so that the upper computer 220 can control the conduction state of the relay 241 by sending a breaking instruction or a conduction instruction, and the on-off of the wire breaker 240 is realized. The controller end plug-in 244 and the wiring harness end plug-in 245 are matched with test objects, the controller end plug-in 244 is connected with the test objects corresponding to the wire breakers 240, and the wiring harness end plug-in 245 is connected with a bus, so that the aim that each wire breaker 240 controls the working state of the corresponding test object can be achieved. The voltage acquisition module 242 and the current acquisition module 243 are correspondingly connected with the voltage module 212 and the current module 213 in the data acquisition instrument 210, and the voltage data and the current data acquired by the voltage acquisition module 242 and the current acquisition module 243 are the voltage data and the current data of the test object corresponding to the wire breaker 240, so that the voltage data and the current data of the test object can be sent to the data acquisition instrument 210.
Fig. 3 is a schematic diagram of a wire breaker according to an embodiment of the present invention, wherein the wire breaker further includes a plurality of connection terminals, such as terminal 1, terminal 2, terminal 3 and terminal 4 in fig. 3, a path is formed between terminal 1 and terminal 2, a path is formed between terminal 3 and terminal 4, and a broken path is formed between terminal 2 and terminal 3. The two ends of the relay 241, the voltage collecting module 242 and the current collecting module 243 in fig. 2 are led out of a wiring harness with a terminal, so that the wiring harness with a terminal can be connected with the terminal 1, the terminal 2, the terminal 3 and the terminal 4 in the wire breaker, when the conducting state of a test object needs to be controlled, the relay 241 is added between the terminal 2 and the terminal 3, when the current of the test object needs to be measured, the current collecting module 243 is added between the terminal 2 and the terminal 3, when the voltage of the test object needs to be measured, the voltage collecting module 242 is added on the corresponding terminal between the terminal 1, the terminal 2, the terminal 3 and the terminal 4, and when the conducting state of the test object does not need to be controlled, the terminal 2 and the terminal 3 can be conducted by using a standard wiring harness with a terminal.
FIG. 4 is a schematic diagram of a test rig for use in truly simulating a vehicle system, thereby improving the authenticity of a failure test, in accordance with one embodiment of the present invention. The test bench comprises a dynamometer 401, an engine assembly 402, a generator 403, a transmission 404, a driving motor 405, an inverter 406, a power battery 407, an inverter 408, a driving motor 409, a speed reducer 410, an air conditioner compressor 411, a high-pressure heater (PTC) 412, a charger 413, a DCDC 414, a low-voltage storage battery 415 and a Vehicle Control Unit (VCU) 416.
And 4 independent dynamometer machines 401 in the test bed are used for applying load to the power system assembly and truly simulating the running load of the whole vehicle. 402-406 form the powertrain of the vehicle system, wherein the engine assembly 402 is connected to the generator 403 through a gear mechanism on the shaft, which in turn is connected to the transmission 404 through the shaft and clutch, the generator 403 being used to power the entire test rig and to start the engine assembly 402. The transmission 404 is connected with the two dynamometers 401 through a driving shaft, the driving motor 405 is connected with the transmission 404 through a gear, and the engine assembly 402 and the driving motor 405 apply torque to the dynamometers 401 through the transmission 404. The inverter 406 is connected to the generator 403 and the driving motor 405 via high-voltage lines, the driving motor 405 also has a power generation function when decelerating, and the inverter 406 is used for converting electric energy. 408-410 constitute an electric drive assembly for a vehicle system, wherein an inverter 408 is connected to a drive motor 409 via high voltage lines, the drive motor 409 is connected to a retarder 410 via gear shafts, the retarder 410 is connected to two dynamometers 401 via drive shafts, the inverter 408 is used for converting electric energy, the drive motor 409 has a power generating function during retarding, and the drive motor 409 applies a torque to the dynamometers 401 via the retarder 410.
The power battery 407 is respectively connected with the inverter 406, the inverter 408, the air conditioner compressor 411, the PTC 412, the charger 413 and the DCDC 414 through high-voltage lines, wherein the air conditioner compressor 411, the PTC 412 and the DCDC 414 are high-voltage loads. The electric drive connecting inverter 406 and inverter 408 can be used as a high voltage load or to charge power battery 407. The low-voltage battery 415 may be, for example, a 12V battery, the charger 413 is used to charge the power battery 407, and the low-voltage battery 415 and the DCDC 414 form a parallel circuit for supplying power to the low-voltage devices in the test rig. As shown in fig. 5, fig. 5 is a schematic structural diagram of a low-voltage topology according to an embodiment of the present invention, and includes an air conditioner compressor 411, a PTC 412, a charger 413, a DCDC 414, a low-voltage Battery 415, a VCU 416, an Engine Management System (EMS) 501, an electric drive controller (MCU) 502, an electric drive controller 503, and a Battery Management System (BMS) 504, where 411 to 416 and 501 to 504 form a low-voltage loop of a vehicle System, and the low-voltage Battery 415 and the DCDC 414 form a parallel loop as a low-voltage power supply device to supply power to the low-voltage loop.
The low-voltage battery 415 and the DCDC 414 form a parallel circuit that is also used to provide low-voltage power to the VCU 416, which VCU 416 is used to control other controllers in the coordinated vehicle system. As shown in fig. 6, fig. 6 is a schematic structural diagram of a Network topology according to an embodiment of the present invention, which includes control units 601-606 corresponding to the air conditioner compressor 411, the PTC 412, the charger 413, the DCDC 414, and the VCU 416, respectively, and a Controller Area Network (CAN) Network formed by connecting the engine management system 501, the electric drive Controller 502, the electric drive Controller 503, and the battery management system 504 in parallel, and the CAN Network is used for information exchange among the controllers. The VCU 416 is capable of controlling the various controllers in FIG. 6.
The fault simulation device needs to be connected into a test bench to be capable of carrying out fault testing on the test bench, when the fault simulation device is connected, the current low-voltage wiring harnesses of all controllers on the test bench need to be disconnected, the controllers and the controller connecting end plug-in units 244 of the wire breaker 240 are connected, and the wiring harness end plug-in units 245 of the wire breaker 240 are connected with the low-voltage wiring harnesses. According to the test requirements of the tested controller, the relay 241, the voltage acquisition module 242 and the current acquisition module 243 are connected into the wire breaker 240, and when fault tests are required to be simultaneously carried out on a plurality of controllers, the plurality of wire breakers 240 are connected into a test bench. The power supply 230, the DCDC 414 and the low-voltage storage battery 415 are connected in parallel to supply power for the test bed at low voltage.
In the embodiment of the invention, the wire breakers correspond to the test objects, and one wire breaker can control the working state of one test object. The test object may be any controller, assembly, sensor, etc. in a vehicle system, and the invention is not limited thereto. The first operation data includes response data of at least one test object, current data of at least one wire breaker and voltage data of at least one wire breaker.
Illustratively, the upper computer 220 sends an operation instruction to the data acquisition instrument 210, and the data acquisition instrument 210 is controlled to acquire first working data of each test object on the test bed, so as to determine an initial working state of each test object according to the first working data, which can be understood as determining a current working state of each test object.
And S102, sending a fault test instruction according to the first working data through the upper computer.
Wherein the fault test instructions are for controlling the power supply and/or the at least one wire breaker to make a fault to the fault test system.
In the actual running process of the vehicle, the situation of power supply abnormality may occur, and because the output voltages of the DCDC and 12V storage batteries in the vehicle system cannot be changed, when a fault test is performed, the power supply 230 capable of adjusting the output voltage is adopted to replace the DCDC and 12V storage batteries to supply power to the vehicle system. The upper computer 220 truly simulates the situation of abnormal power supply which may occur in the running process of the vehicle by adjusting the output voltage of the power supply 230, so that the vehicle system can be optimized according to the response of each controller of the vehicle under the situation of abnormal power supply, and the safety of passengers and the vehicle is guaranteed.
In addition, in addition to the power supply abnormality during the actual running of the vehicle, a failure of any controller may occur, for example, the DCDC voltage conversion is unstable, the air conditioner compressor is not operated, and the transmission is not shifted, and a failure of the controller alone or a failure of a plurality of controllers together may occur, which is complicated. Therefore, a plurality of wire breakers 240 are introduced into the fault simulation device, each wire breaker 240 corresponds to one controller, and the wire breakers 240 can control the working state of the corresponding controller. The upper computer 220 controls the working state of the controller corresponding to the wire breaker 240 by controlling the conduction state of the wire breaker, and controls the controller to work normally or break down, so as to truly simulate the fault condition of the vehicle which may occur in the running process, thereby optimizing the vehicle system according to the response of each controller of the vehicle under various fault conditions, and ensuring the safety of passengers and the vehicle.
Since the response of each controller to a fault in different operating states may be different, it can be understood that a controller has the same fault in both operating states of sudden power-on and sudden power-off, and the controller has different response to the same fault. Therefore, the fault test instruction is sent according to the initial working state of each controller, and the fault condition which may occur in the running process of the vehicle can be simulated really.
Illustratively, the upper computer 220 determines an initial working state of each test object according to the first working data of each test object acquired by the data acquisition instrument 210, so as to send a fault test instruction to the power supply 230 and/or the wire breaker 240 according to the initial working state, and control the power supply 230 and/or the wire breaker 240 to make a fault on the fault test system, thereby truly simulating various fault conditions that may occur in the running process of the vehicle.
And S103, responding to the power supply and/or the at least one wire breaker to execute a fault test instruction, and acquiring second working data of at least one test object through the data acquisition instrument.
The second working data is used for representing the target working state of at least one test object.
After the upper computer 220 sends the fault test instruction and is executed by the power supply 230 and/or the at least one wire breaker 240, the working state of each test object on the test bench is correspondingly changed in response to the occurrence of the fault, second working data of each test object on the test bench after the fault occurs is obtained through the data acquisition instrument 210, and the target working state of the test object after the fault occurs is determined.
For example, after the power supply 230 and/or the at least one wire breaker 240 receives and executes the fault test instruction sent by the upper computer 220, the upper computer 220 sends a control instruction to the data acquisition instrument 210, and the data acquisition instrument 210 is controlled to acquire the working data of each test object on the test bed again, so as to determine the working state of each test object after the fault occurs.
And step S104, determining the fault test response of at least one test object according to the second working data.
Wherein the failure test response is used for representing the execution measures of the at least one test object when the failure test system fails.
According to the obtained second working data used for representing the target working state of the test object, the fault test response generated by the test object after the fault can occur can be determined, namely, the execution measures to be taken by the test object to deal with the fault situation can be determined. The resulting failure test response can be used to optimize the test subject and vehicle system to further ensure passenger and vehicle safety.
Through the steps, first working data of at least one test object are obtained through the data acquisition instrument, wherein the first working data are used for representing the initial working state of the at least one test object; sending a fault test instruction according to the first working data through the upper computer, wherein the fault test instruction is used for controlling a power supply and/or at least one wire breaker to make a fault on a fault test system; responding to a power supply and/or at least one wire breaker to execute a fault test instruction, and acquiring second working data of at least one test object through a data acquisition instrument, wherein the second working data is used for representing a target working state of the at least one test object; and determining a fault test response of the at least one test object according to the second working data, wherein the fault test response is used for indicating the execution measures of the at least one test object when the fault test system fails. By adopting the method, a fault test system is provided, so that each wire breaker can control the working state of the corresponding test object, fault test instructions are sent to the power supply and/or the wire breakers through the upper computer according to the initial working state of the test object, various fault conditions are manufactured, fault tests are carried out on the test object, and the response of the test object when various faults occur is determined. The purpose of checking various fault conditions which may occur during the actual running of the vehicle and testing the response of each test object when various faults occur is achieved, so that the test objects and the vehicle system can be optimized under various fault conditions and the response of each test object under various fault conditions, the safety of passengers and the vehicle is ensured, and the technical problem that the test result is inaccurate because only a single device is tested in the related technology and all fault conditions which may occur during the actual running of the vehicle cannot be simulated is solved.
Optionally, in step S102, sending, by the upper computer, the fault test instruction according to the first working data may include the following steps:
and S102a, sending a first fault test instruction according to the first working data through the upper computer.
The first fault test instruction is used for controlling the power supply to adjust the output voltage according to a first preset rule, and the power supply is used for supplying power to at least one test object.
The control power supply adjusts the output voltage according to the first preset rule, so that the working voltage test can be conducted on each test object. The upper computer 220 determines the initial working state of each test object according to the first working data acquired by the data acquisition instrument 210, and determines to perform a working voltage test on each test object according to the initial working state, that is, to perform a fault test on each test object by adjusting the output voltage of the power supply 230.
Illustratively, the upper computer 220 sends a first fault test instruction to the power supply 230, which controls the power supply 230 to adjust the output voltage according to a first preset rule. Specifically, when the fault test is performed, the low-voltage battery 415 in the test bed needs to be disconnected, the DCDC 414 is prohibited from performing low-voltage power supply, it is determined that each test object is in a normal working state in which the power supply is turned on, and then the upper computer 220 sends a first fault test instruction to the power supply 230.
Optionally, the first preset rule includes increasing the output voltage by a first value every first time interval, or decreasing the output voltage by a second value every second time interval.
Increasing the output voltage by a first value every first time interval may be understood as increasing the output voltage of the power supply 230 in a stepwise manner, thereby creating a fault to the test rig. Reducing the output voltage by the second value every second time interval may be understood as reducing the output voltage of the power supply 230 in a stepwise manner, thereby creating a fault to the test rig.
Illustratively, the upper computer 220 controls the power supply 230 to increase the output voltage of the power supply 230 in a stepwise manner until all test objects respond in a feedback manner, and then the data acquisition instrument 210 acquires second working data of each test object to complete the power-on voltage test of the test object. Similarly, the upper computer 220 controls the power supply 230 to reduce the output voltage of the power supply 230 in a stepwise manner until all test objects respond in a feedback manner, and then the data acquisition instrument 210 acquires second working data of each test object to complete the power-off voltage test of the test object.
Optionally, in step S102, sending, by the upper computer, the fault test instruction according to the first working data may include the following steps:
and S102b, sending a second fault test instruction according to the first working data through the upper computer.
And the second fault test instruction is used for controlling the power supply to adjust the power-off duration of the power supply according to a second preset rule.
The control power supply adjusts the power-off duration of the power supply according to the second preset rule, so that short-time power-off test can be conducted on each test object. The upper computer 220 determines the initial working state of each current test object according to the first working data acquired by the data acquisition instrument 210, and determines to perform short-time power-off test on each test object according to the initial working state, that is, to perform fault test on each test object by adjusting the power-off duration of the power supply 230. The short time power down may be a millisecond short time power down used to simulate an instantaneous power down of a vehicle system.
Illustratively, the upper computer 220 sends a second fault test instruction to the power supply 230, which controls the power supply 230 to adjust the power-off duration of the power supply according to a second preset rule. Specifically, when the fault test is performed, the low-voltage battery 415 in the test bed needs to be disconnected, the DCDC 414 is prohibited from performing low-voltage power supply, it is determined that each test object is in a normal working state where the power supply is turned on, and then the upper computer 220 sends a second fault test instruction to the power supply 230.
Optionally, the second preset rule is used to indicate that the power-off duration is increased by a third value every third time interval.
Increasing the power-off duration by the third value every third time interval may be understood as increasing the power-off duration of the power supply 230 in a stepwise manner, thereby creating a fault to the test rig.
Illustratively, the upper computer 220 controls the power supply 230 to increase the power-off duration of the power supply 230 in a stepwise manner until all test objects respond back, and then the data acquisition instrument 210 acquires the second working data of each test object to complete the short-time power-off test on the test objects.
Optionally, in step S102, sending, by the upper computer, the fault test instruction according to the first working data may include the following steps:
and S102c, sending a third fault test instruction according to the first working data through the upper computer.
And the third fault test instruction is used for controlling at least one wire breaker to break down.
Controlling the at least one wire breaker 240 to fail may be understood as making a failure to the at least one test object, i.e. performing a test object failure response test. The upper computer 220 determines the initial working state of each current test object according to the first working data acquired by the data acquisition instrument 210, determines to perform a test object fault response test according to the initial working state, namely, controls the working state of the test object corresponding to the wire breaker 240 by controlling the conduction state of the wire breaker 240, so that one or more test objects are subjected to short-term fault or permanent fault, and thus, which execution measures can be taken when the one or more test objects are in fault, and which changes can be performed on the working states of the other normally-working test objects are determined.
Illustratively, the upper computer 220 sends a third failure test instruction to the at least one wire breaker 240 to control the at least one wire breaker 240 to fail. Specifically, when the fault test is performed, the normal operation of the test bed is ensured, it is determined that each test object is in the normal working state of power connection, the upper computer 220 sends a third fault test instruction to the power supply 230 until all test objects feedback responses, and the data acquisition instrument 210 acquires second working data of each test object to complete the fault response test on the test object.
Optionally, in step S102, sending, by the upper computer, the fault test instruction according to the first working data may include the following steps:
and S102d, determining a first moment according to the first working data through the upper computer.
And step S102e, sending a fault test instruction at the first time.
When sending the fault test instruction, the upper computer 220 selects corresponding test contents for testing according to the current initial working state of the test object, and similarly, selects reasonable test time for testing according to the current initial working state of the test object, for example, for the power-on voltage test and the power-off voltage test of the test object, the test needs to be performed under the condition that the working state and the test time of the test object are both satisfied. It is understood that the fault injection times are selected according to the test requirements and the response of the individual controllers under specific conditions is tested.
Illustratively, the upper computer 220 determines test contents for performing the fault test according to the first working data, and determines a first moment for performing the fault injection according to the test requirement, so as to send a fault test instruction at the first moment, inject the fault into the test bench, and perform the fault test on the test object.
In the embodiment of the invention, besides the manufacturing fault of each controller, the manufacturing fault of the sensor or the actuator can be tested by connecting the wire breaker 240 into a sensor or actuator loop and simulating the fault of the sensor or the actuator through the on-off.
In addition, in the fault testing method, the output voltage of the power supply is adjusted, the power-off duration of the power supply is adjusted, the on-off of the wire breaker is controlled, the fault manufacture of the controller and the like can be set into an automatic testing program for testing, so that errors and workload caused by manual setting are avoided, and automatic testing is required.
Through the description of the foregoing embodiments, it is clear to those skilled in the art that the method according to the foregoing embodiments may be implemented by software plus a necessary general hardware platform, and certainly may also be implemented by hardware, but the former is a better implementation mode in many cases. Based on such understanding, the technical solutions of the present invention may be embodied in the form of a software product, which is stored in a storage medium (e.g., ROM/RAM, magnetic disk, optical disk) and includes instructions for enabling a terminal device (e.g., a mobile phone, a computer, a server, or a network device) to execute the method according to the embodiments of the present invention.
In this embodiment, a fault testing apparatus is further provided, which is used to implement the foregoing embodiments and preferred embodiments, and the description of which is already given is omitted. As used below, the term "module" may be a combination of software and/or hardware that implements a predetermined function. Although the means described in the embodiments below are preferably implemented in software, an implementation in hardware, or a combination of software and hardware is also possible and contemplated.
Fig. 7 is a block diagram of a fault testing apparatus according to an embodiment of the present invention, which is illustrated in fig. 7 as a fault testing apparatus 700, and includes: the acquisition module 701 is used for acquiring first working data of at least one test object through the data acquisition instrument, wherein the first working data is used for representing an initial working state of the at least one test object; the testing module 702 is used for sending a fault testing instruction according to the first working data through the upper computer, wherein the fault testing instruction is used for controlling a power supply and/or at least one wire breaker to make a fault on the fault testing system; the acquisition module 701 is further configured to, in response to the power supply and/or the at least one wire breaker executing the fault test instruction, acquire, by the data acquisition instrument, second working data of the at least one test object, where the second working data is used to indicate a target working state of the at least one test object; and a determining module 703, where the determining module 703 is configured to determine a fault test response of the at least one test object according to the second working data, where the fault test response is used to indicate an execution measure of the at least one test object when the fault test system fails.
Optionally, the testing module 702 is further configured to send a first fault testing instruction according to the first working data through the upper computer, where the first fault testing instruction is used to control the power supply to adjust the output voltage according to a first preset rule, and the power supply is used to supply power to at least one test object.
Optionally, the first preset rule includes increasing the output voltage by a first value every first time interval, or decreasing the output voltage by a second value every second time interval.
Optionally, the testing module 702 is further configured to send a second fault testing instruction according to the first working data through the upper computer, where the second fault testing instruction is used to control the power supply to adjust the power-off duration of the power supply according to a second preset rule.
Optionally, the second preset rule is used to indicate that the power-off duration is increased by a third value every third time interval.
Optionally, the testing module 702 is further configured to send a third fault testing instruction according to the first working data through the upper computer, where the third fault testing instruction is used to control the at least one wire breaker to malfunction.
Optionally, the testing module 702 is further configured to determine a first time according to the first working data through the upper computer; a failure test instruction is sent at a first time.
It should be noted that, the above modules may be implemented by software or hardware, and for the latter, the following may be implemented, but not limited to: the modules are all positioned in the same processor; alternatively, the modules are respectively located in different processors in any combination.
Embodiments of the present invention also provide a computer-readable storage medium having a computer program stored thereon, wherein the computer program is arranged to perform the steps of any of the above-described method embodiments when run on a computer or processor.
Alternatively, in the present embodiment, the above-mentioned computer-readable storage medium may be configured to store a computer program for executing the steps of:
s1, acquiring first working data of at least one test object through a data acquisition instrument;
s2, sending a fault test instruction according to the first working data through the upper computer;
s3, responding to a power supply and/or at least one wire breaker to execute a fault test instruction, and acquiring second working data of at least one test object through a data acquisition instrument;
and S4, determining the fault test response of at least one test object according to the second working data.
Optionally, in this embodiment, the computer-readable storage medium may include, but is not limited to: various media capable of storing computer programs, such as a usb disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a removable hard disk, a magnetic disk, or an optical disk.
Embodiments of the present invention also provide an electronic device, comprising a memory and a processor, wherein the memory stores a computer program, and the processor is configured to execute the computer program to perform the steps of any of the above method embodiments.
Optionally, in this embodiment, the processor in the electronic device may be configured to execute a computer program to perform the following steps:
s1, acquiring first working data of at least one test object through a data acquisition instrument;
s2, sending a fault test instruction according to the first working data through the upper computer;
s3, responding to a power supply and/or at least one wire breaker to execute a fault test instruction, and acquiring second working data of at least one test object through a data acquisition instrument;
and S4, determining the fault test response of at least one test object according to the second working data.
Optionally, for a specific example in this embodiment, reference may be made to the examples described in the above embodiment and optional implementation, and this embodiment is not described herein again.
The above-mentioned serial numbers of the embodiments of the present invention are merely for description and do not represent the merits of the embodiments.
In the above embodiments of the present invention, the descriptions of the respective embodiments have respective emphasis, and for parts that are not described in detail in a certain embodiment, reference may be made to related descriptions of other embodiments.
In the embodiments provided in the present application, it should be understood that the disclosed technology can be implemented in other ways. The above-described embodiments of the apparatus are merely illustrative, and for example, the division of the units may be a logical division, and in actual implementation, there may be another division, for example, multiple units or components may be combined or integrated into another system, or some features may be omitted, or not executed. In addition, the shown or discussed mutual coupling or direct coupling or communication connection may be an indirect coupling or communication connection through some interfaces, units or modules, and may be in an electrical or other form.
The units described as separate parts may or may not be physically separate, and parts displayed as units may or may not be physical units, may be located in one position, or may be distributed on a plurality of units. Some or all of the units can be selected according to actual needs to achieve the purpose of the solution of the embodiment.
In addition, functional units in the embodiments of the present invention may be integrated into one processing unit, or each unit may exist alone physically, or two or more units are integrated into one unit. The integrated unit may be implemented in the form of hardware, or may also be implemented in the form of a software functional unit.
The integrated unit, if implemented in the form of a software functional unit and sold or used as a stand-alone product, may be stored in a computer readable storage medium. Based on such understanding, the technical solution of the present invention may be embodied in the form of a software product, which is stored in a storage medium and includes instructions for causing a computer device (which may be a personal computer, a server, or a network device) to execute all or part of the steps of the method according to the embodiments of the present invention. And the aforementioned storage medium includes: various media capable of storing program codes, such as a usb disk, a Read-Only Memory (ROM), a Random Access Memory (RAM), a removable hard disk, a magnetic disk, or an optical disk.
The foregoing is only a preferred embodiment of the present invention, and it should be noted that, for those skilled in the art, various modifications and amendments can be made without departing from the principle of the present invention, and these modifications and amendments should also be considered as the protection scope of the present invention.
Claims (10)
1. A fault testing method is characterized by being applied to a fault testing system, wherein the fault testing system comprises an upper computer, a power supply, a data acquisition instrument, at least one wire breaker and at least one testing object, each wire breaker is used for controlling the working state of the corresponding testing object, and the method comprises the following steps:
acquiring first working data of the at least one test object through the data acquisition instrument, wherein the first working data is used for representing an initial working state of the at least one test object;
sending a fault test instruction according to the first working data through the upper computer, wherein the fault test instruction is used for controlling the power supply and/or the at least one wire breaker to make a fault on the fault test system;
responding to the power supply and/or the at least one wire breaker to execute the fault test instruction, and acquiring second working data of the at least one test object through the data acquisition instrument, wherein the second working data is used for representing a target working state of the at least one test object;
and determining a fault test response of the at least one test object according to the second working data, wherein the fault test response is used for representing the execution measures of the at least one test object when the fault test system fails.
2. The method according to claim 1, wherein the sending, by the upper computer, a fault test instruction according to the first working data comprises:
and sending a first fault test instruction according to the first working data through the upper computer, wherein the first fault test instruction is used for controlling the power supply to adjust the output voltage according to a first preset rule, and the power supply is used for supplying power to the at least one test object.
3. The method of claim 2, wherein the first predetermined rule comprises increasing the output voltage by a first amount every first time interval or decreasing the output voltage by a second amount every second time interval.
4. The method of claim 1, wherein sending, by the upper computer, a fault test instruction according to the first working data comprises:
and sending a second fault test instruction according to the first working data through the upper computer, wherein the second fault test instruction is used for controlling the power supply to adjust the power-off duration of the power supply according to a second preset rule.
5. The method according to claim 4, wherein the second predetermined rule is used to indicate that the power-off duration is increased by a third value every third time interval.
6. The method of claim 1, wherein sending, by the upper computer, a fault test instruction according to the first working data comprises:
and sending a third fault test instruction according to the first working data through the upper computer, wherein the third fault test instruction is used for controlling the at least one wire breaker to break down.
7. The method according to any one of claims 1-6, wherein the sending, by the upper computer, a fault test instruction according to the first working data comprises:
determining a first moment according to the first working data through the upper computer;
and sending the fault test instruction at the first time.
8. The utility model provides a fault testing device, its characterized in that is applied to the fault testing system, the fault testing system includes host computer, power, data acquisition appearance, at least one broken wire ware and at least one test object, and every broken wire ware is used for control to correspond the operating condition of test object, the device includes:
the acquisition module is used for acquiring first working data of the at least one test object through the data acquisition instrument, wherein the first working data is used for representing an initial working state of the at least one test object;
the test module is used for sending a fault test instruction according to the first working data through the upper computer, wherein the fault test instruction is used for controlling the power supply and/or the at least one wire breaker to make a fault on the fault test system;
the acquisition module is further used for responding to the power supply and/or the at least one wire breaker to execute the fault test instruction, and acquiring second working data of the at least one test object through the data acquisition instrument, wherein the second working data is used for representing a target working state of the at least one test object;
a determining module, configured to determine a fault test response of the at least one test object according to the second working data, where the fault test response is used to indicate an execution measure of the at least one test object when the fault test system fails.
9. A computer-readable storage medium, in which a computer program is stored, wherein the computer program is arranged to perform a fault testing method as claimed in any one of the preceding claims 1 to 7 when run on a computer or a processor.
10. An electronic device comprising a memory and a processor, wherein the memory has stored therein a computer program, and the processor is configured to run the computer program to perform the fault testing method as claimed in any one of the preceding claims 1 to 7.
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