CN115372803B - Motherboard test system, method, device and storage medium - Google Patents
Motherboard test system, method, device and storage medium Download PDFInfo
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- CN115372803B CN115372803B CN202211306365.8A CN202211306365A CN115372803B CN 115372803 B CN115372803 B CN 115372803B CN 202211306365 A CN202211306365 A CN 202211306365A CN 115372803 B CN115372803 B CN 115372803B
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
- G01R31/2806—Apparatus therefor, e.g. test stations, drivers, analysers, conveyors
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/2289—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing by configuration test
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06F—ELECTRIC DIGITAL DATA PROCESSING
- G06F11/00—Error detection; Error correction; Monitoring
- G06F11/22—Detection or location of defective computer hardware by testing during standby operation or during idle time, e.g. start-up testing
- G06F11/26—Functional testing
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L43/00—Arrangements for monitoring or testing data switching networks
- H04L43/50—Testing arrangements
Abstract
The embodiment of the application discloses a mainboard test system, a mainboard test method, a mainboard test device and a mainboard test device; the system comprises an ATE server, an ATE client and an ATE main server; the ATE server is used for loading an INI test template associated with a production work order number of a mainboard to be tested and generating an ATE resource file; an ATE resource file is imported to a mainboard to be tested on which an ATE client is mounted; the ATE client is used for receiving a test instruction from the ATE server or the ATE main server, carrying out mainboard test according to the test instruction and the ATE resource file, and returning a corresponding test result to the ATE server or the ATE main server; the ATE host server is also configured to store all test results of the motherboard test. According to the embodiment of the application, the server side manages the test program, loads the resource file, imports the test program to the main board to be tested for testing, and realizes the compatibility and convenience of testing.
Description
Technical Field
The present application relates to the field of motherboard testing, and in particular, to a motherboard testing system, method, apparatus, and storage medium.
Background
With the rapid development of microelectronic technology, the product types and systems of the main board are various. Testing boards of different systems and CPU architectures often requires testing programs compiled using different cross-compilation chains. The existing motherboard test software is directly connected with a motherboard test server, and the method has the problems of poor universality and poor compatibility on the motherboards of different series of CPUs and systems. If the software is limited to the motherboard test software of a single CPU model, the software cannot be generally and quickly built on the motherboard of other CPU architectures, and certain difficulty is brought to migration and migration to other series of motherboards.
At present, the motherboard test program is often directly added into the motherboard system, which results in that the motherboard system is often required to be updated when the test program needs to be updated. The system is usually a starting step after the motherboard is disconnected, and when the motherboard test program is found to be abnormal and needs to be updated in the test process, the system needs to be waited for updating and refreshing again.
When the motherboard is shipped, the customer often does not agree that the test software is still retained on the motherboard system, so the test system and the shipment system of the motherboard are often separated. Therefore, the procedure of the burning test system is increased during the production of the main board, and the normal adaptation and use of the main board and the shipment system cannot be ensured.
Disclosure of Invention
In view of the above, the present application provides a motherboard testing system, method, device and storage medium for solving the problems of the prior art.
In a first aspect, the present application provides a motherboard test system, including an ATE server, an ATE client, and an ATE host server;
the ATE server is used for loading an INI test template associated with a production work order number of a mainboard to be tested and generating an ATE resource file; importing the ATE resource file to a mainboard to be tested on which the ATE client is mounted;
the ATE client is used for receiving a test instruction from the ATE server or the ATE main server, carrying out mainboard test according to the test instruction and the ATE resource file, and returning a corresponding test result to the ATE server or the ATE main server;
the ATE main server is also used for storing all test results of the mainboard test.
In an alternative embodiment, the loading the INI test template associated with the production work order number of the motherboard to be tested, and generating the ATE resource file include:
and loading configuration information of an INI test template associated with the production work order number of the mainboard to be tested, and selecting and packaging a test program compiled by the cross compiling chain to obtain an ATE resource file.
In an alternative embodiment, the performing the motherboard test according to the test instruction and the ATE resource file includes:
triggering the mainboard to be tested to execute mainboard test items corresponding to test programs in the ATE resource file according to the test instruction; the main board test items comprise a main board on-off test, an aging test and a hardware function test.
In an alternative embodiment, the ATE server is configured to:
sending a hardware function test instruction to the ATE client, wherein the hardware function test instruction is used for triggering the mainboard to be tested to perform hardware function test;
receiving a test result of the hardware function test returned by the ATE client, and uploading the test result of the hardware function test to the ATE main server;
and when the hardware function test is successfully executed, sending a factory setting restoration instruction to the ATE client and deleting an ATE resource file in the ATE client, wherein the factory setting restoration instruction is used for triggering the mainboard to be tested to restore factory settings.
In an alternative embodiment, the ATE host server is configured to:
receiving and storing the motherboard switching-on and switching-off data uploaded by the ATE client, and determining whether the motherboard to be tested successfully completes a motherboard switching-on and switching-off test according to the switching-on and switching-off data;
if the on-off test of the main board is determined to be not completed, sending an on-off test in-progress instruction to the ATE client;
if the on-off test of the main board is determined to be successfully completed, sending an on-off test successful completion instruction and an aging test instruction to the ATE client, wherein the aging test instruction is used for triggering the main board to be tested to carry out aging test;
and receiving and storing the test result of the aging test uploaded by the ATE client.
In an optional embodiment, the ATE host server or the ATE server is further configured to determine that the motherboard to be tested needs to be repaired if the test result is determined to be a test failure;
and the ATE server is also used for updating the ATE resource file and importing the updated ATE resource file to the ATE client when detecting that the ATE client performs the mainboard test and the test program in the ATE resource file is abnormal in execution.
In an optional implementation manner, the importing the ATE resource file to the motherboard to be tested on which the ATE client is mounted includes:
and importing the ATE resource file to a mainboard to be tested on which the ATE client is mounted through a preset importing mode corresponding to the type of the ATE resource file, wherein the preset importing mode comprises any one of a USB flash disk, a serial port and a network mode.
In a second aspect, the present application provides a motherboard testing method, for a motherboard to be tested, where the motherboard to be tested is loaded with an ATE client, the method includes:
importing an ATE resource file generated by an ATE server; the ATE resource file is generated based on an INI test template associated with a production work order number of the mainboard to be tested;
and receiving a test instruction from the ATE server or the ATE main server, performing mainboard test according to the test instruction and the ATE resource file, and respectively returning corresponding test results to the ATE server and the ATE main server.
In a third aspect, the present application provides a motherboard testing apparatus, including:
the file importing module is used for importing an ATE resource file generated by the ATE server; the ATE resource file is generated based on an INI test template associated with a production work order number of a mainboard to be tested;
and the testing module is used for receiving the testing instruction from the ATE server or the ATE main server, testing the mainboard according to the testing instruction and the ATE resource file, and returning a corresponding testing result to the ATE server or the ATE main server.
In a fourth aspect, the present application provides a computer storage medium storing a computer program which, when executed, implements a motherboard testing method according to the foregoing.
The embodiment of the application has the following beneficial effects:
the embodiment of the application provides a mainboard test system, which manages test programs corresponding to a mainboard to be tested through an ATE server to generate an ATE resource file, and introduces the test programs to the mainboard to be tested, which is loaded with an ATE client, in a mode of loading the ATE resource file so as to start the test programs for testing, thereby realizing the universality, compatibility and convenience of mainboard test.
Drawings
In order to more clearly illustrate the technical solutions of the present application, the drawings that are required for the embodiments will be briefly described, it being understood that the following drawings only illustrate some embodiments of the present application and therefore should not be considered as limiting the scope of the present application. Like elements are numbered alike in the various figures.
FIG. 1 is a schematic diagram showing a first configuration of a motherboard testing system according to an embodiment of the present application;
FIG. 2 is a schematic diagram showing a second configuration of a motherboard testing system according to an embodiment of the present application;
FIG. 3 is a functional schematic of a motherboard test system according to an embodiment of the present application;
FIG. 4 is a schematic diagram showing a motherboard testing method according to an embodiment of the present application;
fig. 5 is a schematic structural diagram of a motherboard testing device according to an embodiment of the present application.
Detailed Description
The following description of the embodiments of the present application will be made clearly and completely with reference to the accompanying drawings, in which it is apparent that the embodiments described are only some embodiments of the present application, but not all embodiments.
The components of the embodiments of the present application generally described and illustrated in the figures herein may be arranged and designed in a wide variety of different configurations. Thus, the following detailed description of the embodiments of the application, as presented in the figures, is not intended to limit the scope of the application, as claimed, but is merely representative of selected embodiments of the application. All other embodiments, which can be made by a person skilled in the art without making any inventive effort, are intended to be within the scope of the present application.
The terms "comprises," "comprising," "including," or any other variation thereof, are intended to cover a specific feature, number, step, operation, element, component, or combination of the foregoing, which may be used in various embodiments of the present application, and are not intended to first exclude the presence of or increase the likelihood of one or more other features, numbers, steps, operations, elements, components, or combinations of the foregoing.
Furthermore, the terms "first," "second," "third," and the like are used merely to distinguish between descriptions and should not be construed as indicating or implying relative importance.
Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which various embodiments of the application belong. The terms (such as those defined in commonly used dictionaries) will be interpreted as having a meaning that is the same as the context of the relevant art and will not be interpreted in an idealized or overly formal sense unless expressly so defined herein in connection with the various embodiments of the application.
ATE (Automatic Test Equipment), an automatic test equipment that can be used in testing integrated circuits.
Example 1
The embodiment of the application provides a motherboard testing system, please refer to fig. 1, and the motherboard testing system is described in detail below.
The motherboard test system includes at least one ATE server 20, ATE client 10, and ATE main server 30 (hereinafter, referred to as server 20, client 10, and main server 30, respectively). The ATE server 20 and the ATE client 10 communicate via modbus protocols, and supported communication modes include, but are not limited to, TCP, RS232, RS485, and RS422.
Referring to fig. 2, an ATE server 20 is illustratively configured to create an ATE resource file, send a client function program execution instruction, obtain a client function program execution result, upload and query motherboard test information and results, load and modify a test configuration, obtain an MAC address allocated by a host server 30, generate an instruction, send the instruction to the client 10, and upload a running log to the host server 30. Specifically, the ATE server 20 has a gtk man-machine interface, and can perform a motherboard test, acquire and write a motherboard MAC address, generate or modify a test configuration, and query a test result through the interface; the test program compiled by the cross compiling chains is stored, and the ATE resource file can be automatically generated for loading the test main board according to the work order test configuration queried by the database. Briefly, the ATE server may be provided with database data processing, request MAC allocation, log uploading, zlog logging, creating ATE resource files, ATE upgrades, modbus communication, etc.
ATE client 10 may include an ATE branch client, an ATE execution client, and an ATE function program. The ATE branch client is used for monitoring and copying the ATE resource file and starting the ATE execution client. The ATE execution client is used for monitoring and copying the ATE resource file, receiving and analyzing the test instruction from the update ATE execution client, executing the ATE function program and returning the execution result of the ATE function program. And the ATE function program is used for writing the serial number of the main board, writing the MAC address, and executing the on-off and aging test of the main board and the functional test of the main board hardware. The motherboard test system only mounts an ATE branch client, and the ATE resource file is imported from the ATE server 20 to the ATE client 10 by any one of a usb disk, a network, and a serial port. The ATE resource file includes an ATE execution client and an ATE function program, where the ATE function program includes but is not limited to a mass production information writing program, a power on/off test program, a burn-in test program, and a motherboard hardware function test program.
The ATE main server 30 is configured to store test configuration, store on-off and burn-in test results, store motherboard hardware function test results, store an ATE server 20 running log, and provide functions such as motherboard MAC address allocation service, ATE upgrade service, on-off data processing service, and ATE log service. That is, the ATE host server 30 also has a database, which can realize the storage of the motherboard test data, results and configuration, and the allocation of the motherboard MAC address; having rsync service, the ATE server 20 may implement the acquisition and storage of the log of the operation of the ATE server, and the ATE upgrade service.
In an embodiment, as shown in fig. 2, the motherboard test system further includes a product tracing website 40, where the product tracing website 40 is used for providing database services and WEB services, and the motherboard test record can be queried through the motherboard serial number or the network card MAC address.
In one embodiment, as shown in FIG. 3, the ATE server 20, ATE host server 30, and product traceback website 40 communicate via a TCP/IP protocol. ATE server 20 is distributed at a test station of the production line, and can test a motherboard on which ATE client 10 is mounted.
The ATE client 10 and the ATE server 20 send test instructions and return test results through modbus communication; and transmitting the ATE resource file through the USB flash disk/network/serial port.
The test configuration and the uploading and the inquiry of the result are realized between the ATE server 20 and the ATE main server 30 through a database communication protocol; the request and the allocation of the MAC address are realized through socket communication; the functions of uploading log records and upgrading the ATE server 20 and the client 10 are realized through the rsync protocol;
the ATE client 10 and the ATE main server 30 realize the uploading of the mainboard aging state and the result and the acquisition of database time through a database communication protocol; the ATE client 10 realizes the functions of sending the on-off test and the burn-in test data to the ATE main server 30, receiving the on-off test instruction and the burn-in test instruction through the curl comprehensive transmission tool, and then the ATE main server 30 is used for storing all test results when the main board to be tested is subjected to main board test.
The ATE main server 30 and the product traceability website 40 realize the function of synchronizing databases at two ends through mysql communication protocol.
The ATE server 20 determines in advance whether the motherboard under test is configured with an INI test target configuration and a work order configuration. If it is determined that the INI test template configuration is not configured, an INI test template configuration is newly created, configuration data thereof is stored in a database on the ATE host server 30, and the creation of the motherboard INI test module is performed based on an ATE xml configuration template (information template that the ATE has supported motherboard function programs). If the INI test template configuration has been configured, the INI test template configuration information may be copied or modified.
If the work order configuration is not configured, newly creating work order configuration, binding the production work order number of the main board to be tested with the INI test template one by one, and configuring whether to restore delivery, serial port test service configuration and execution script after the main board is tested. If the work order configuration has been configured, the work order configuration information may be copied or modified.
The ATE resource file is generated based on an INI test template associated with a production work order number of the mainboard to be tested. Specifically, configuration information of an INI test template associated with a production work order number of a mainboard to be tested is loaded, and a test program compiled by a cross compiling chain is selected and packaged to obtain an ATE resource file.
Specifically, during loading, the configuration loading of the INI test template can be completed by inputting the corresponding production work order number through the configuration option interface of the ATE server 20 and clicking the query key.
And then selecting a test communication mode, wherein communication options between the ATE server 20 and the tested main board support TCP network communication and RTU serial port (such as RS232, RS485 and RS 422) communication based on a modbus protocol. The RTU serial communication needs to configure a master-slave communication serial port, where the slave serial port is a communication serial port of the tested motherboard, and the master serial port is a communication serial port of the ATE server 20.
Furthermore, the ATE server 20 clicks the button for creating the ATE resource file on the configuration option interface, and then selects the test program compiled by the corresponding cross-compiled chain to package according to the configuration information of the INI test template, so as to create the ATE resource file. In this embodiment, the generation of ATE resource files of the usb disk, network, and serial port types is supported, and the types of the specific ATE resource files are not limited herein. The ATE resource file includes, but is not limited to, ATE execution clients and ATE functional programs (test programs) compiled by corresponding cross-compilation chains.
In one embodiment, after querying the configuration of the INI test template for the production job ticket number, ATE server 20 clicks a confirm button of the interface to complete loading of the INI test template. After the ATE server 20 completes communication connection with the motherboard to be tested on which the ATE client 10 is mounted, the ATE server 20 uploads a master board Serial Number (SN) and a request MAC address number to the ATE main server 30, so that the ATE main server 30 allocates MAC addresses to the motherboard to be tested, so as to configure mass production information and basic information of on-off and aging of the motherboard to be tested.
Specifically, the motherboard volume production information includes a motherboard serial number and a MAC address. And the main board serial number bar code on the main board is read by the code scanning gun to obtain the main board serial number, and the MAC address of the network card can obtain the corresponding MAC address by the MAC address bar code and requesting the MAC address distribution service of the ATE main server 30. And the MAC address allocation service of the ATE main server 30 allocates the MAC addresses according to the uploaded motherboard serial numbers and the number of the requested MAC addresses.
Optionally, the ATE server 20 may further configure the motherboard to be tested on which the ATE client 10 is mounted with basic information of power on/off and burn-in of the motherboard to be tested, where the basic information includes, but is not limited to, a power on/off test flag (including a flag of whether the power on/off test is performed and a flag of whether the power on/off test is completed), burn-in time, burn-in location number, configuration of an upload database, CPU load, and upload data interval (upload period).
Further, the ATE server 20 transmits the configured basic information to the motherboard to be tested on which the ATE client 10 is mounted and the ATE main server 30, and the motherboard to be tested generates and stores a corresponding configuration file according to the basic information after receiving the basic information. When the motherboard to be tested is started, the ATE client 10 automatically and directly uploads corresponding data to the ATE main server 30 according to the content of the configuration file, where the data includes, but is not limited to, the on/off test flag, the aging time (aged duration), the aging position number, and the like of the motherboard to be tested when the motherboard to be tested is tested.
In addition, before executing the motherboard startup and shutdown test, the ATE server 20 needs to upload the configured startup and shutdown test times corresponding to the motherboard to be tested and execution instructions after the single startup and shutdown are completed to the ATE main server 30, so as to determine whether the motherboard startup and shutdown test of the motherboard to be tested is successful.
Based on this, referring to fig. 4, the embodiment of the application further provides a motherboard testing method, which is used for a motherboard to be tested, and the motherboard to be tested is loaded with the ATE client 10 to execute the motherboard testing task.
S100, importing the ATE resource file generated by the ATE server 20.
S200, receiving a test instruction from the ATE server 20 or the ATE main server 30, performing a motherboard test according to the test instruction and the ATE resource file, and returning a corresponding test result to the ATE server 20 or the ATE main server 30.
The ATE server 20 communicates with the motherboard to be tested on which the ATE client 10 is mounted through a modbus communication protocol, and the ATE resource file is imported to the motherboard to be tested through a predetermined importing method corresponding to the type of the ATE resource file, where the predetermined importing method includes any one of a usb disk, a serial port, and a network method, and the embodiment is not limited herein.
Further, the tested motherboard detects the ATE resource files of the usb disk, the network and the serial port through the ATE branch client, and if the corresponding ATE resource files exist in the usb disk or the ATE server 20, copies the ATE resource files into the motherboard file system of the ATE client 10 to realize the import of the ATE resource files.
And then, the ATE server and the ATE main server respectively send test instructions to the to-be-tested mainboard through a modbus communication protocol, wherein the test instructions are used for triggering the to-be-tested mainboard to carry out mainboard test based on test programs in an ATE resource file.
In this embodiment, after the motherboard to be tested loaded with the ATE client 10 imports the ATE resource file, if a test instruction from the ATE server 20 and/or the ATE main server 30 is received, the motherboard is tested according to the test instruction and the ATE resource file, and a corresponding test result is returned to the ATE server 20 and/or the ATE main server 30; the ATE client 10 triggers the mainboard to be tested to execute the mainboard test item corresponding to the test program in the ATE resource file according to the test instruction; the main board test items comprise a main board on-off test, an aging test and a hardware function test.
In one embodiment, the ATE main server 30 is configured to receive and store the motherboard startup and shutdown data uploaded by the ATE client 10, and determine whether the motherboard to be tested has successfully completed the startup and shutdown test according to the startup and shutdown data; if the on-off test of the main board is determined to be not completed, sending an on-off test in-progress instruction to the ATE client 10; if the on-off test of the main board is determined to be completed successfully, sending an on-off test successful completion instruction and an aging test instruction to the ATE client 10, wherein the aging test instruction is used for triggering the main board to be tested to perform aging test; test results of the burn-in test uploaded by ATE client 10 are received and stored.
The relay is arranged in the main board high-temperature ageing cabinet, so that the switching-on and switching-off time and times of the main board can be controlled regularly. And each main board is connected with a power line and a network cable only in the high-temperature aging cabinet. That is, the on-off test times of the main board to be tested are determined by the relay in the high-temperature aging cabinet, and the time and the times of the on-off test of the main board can be controlled in a timing manner through manually configuring the relay.
Whether the mainboard to be tested needs to be powered on or powered off is determined by a powering on/off test mark corresponding to the mainboard to be tested in the configuration file, and whether the mainboard to be tested is triggered to be powered on or powered off is determined according to the powering on/off test mark when the mainboard to be tested is started each time.
Specifically, if the sign of whether the on-off test is performed in the on-off test sign corresponding to the to-be-tested main board in the configuration file is displayed as the to-be-tested sign, and the sign of whether the on-off test is completed is displayed as incomplete, the to-be-tested main board is indicated to need to perform the on-off test, so as to trigger the to-be-tested main board to perform the on-off test correspondingly.
After triggering the motherboard to be tested to perform the motherboard on-off test, the ATE client 10 uploads motherboard on-off data to the ATE host server 30, where the motherboard on-off data includes, but is not limited to, a motherboard serial number, a MAC address, and a random number of the motherboard to be tested; the ATE main server 30 receives and stores the motherboard startup and shutdown data, and calculates the number of times the motherboard to be tested has completed startup and shutdown according to the motherboard startup and shutdown data, so as to determine whether the motherboard to be tested has completed startup and shutdown test. Furthermore, in the embodiment, corresponding operation can be automatically executed according to the on-off test mark when the mainboard to be tested is started every time, manual intervention is not needed, the test efficiency is improved, and the labor cost is saved.
Meanwhile, the ATE main server 30 is further configured to return an on-going message of the on-off test or an on-off test completion message to the ATE client 10 after receiving the on-off data.
Exemplarily, if the number of times of switching on and off of the main board to be tested calculated by the ATE main server 30 according to the switching on and off data uploaded by the ATE client 10 through the network is the same as the number of times of switching on and off of the production work order number configuration corresponding to the main board to be tested, the main board switching on and off test is determined to be successful (i.e. the main board switching on and off test is successfully completed); otherwise, the test fails. The incomplete motherboard startup and shutdown test comprises the situation that the motherboard startup and shutdown test fails or is not performed.
When the mainboard to be tested is tested, the mainboard on-off test is uniformly performed first, and after the mainboard on-off test is determined to be successful, the burn-in test is performed.
The ATE client 10 returns test results of the burn-in test to the ATE main server 30 so that the ATE main server 30 receives and stores the test results of the burn-in test.
If the burn-in duration of the motherboard to be tested in the burn-in test result uploaded by the ATE client 10 through the network is the same as the burn-in time in the motherboard burn-in configuration configured by the ATE server 20, determining that the motherboard burn-in test is successful; otherwise, the test fails.
Further, in the process of performing the burn-in test on the motherboard to be tested, the ATE client 10 periodically reports the burn-in data to the ATE main server 30 according to the reporting period in the configuration file, where the burn-in data includes the burn-in duration, the burn-in location number, etc. of the motherboard to be tested; until the aging time is the same as the aging time in the mainboard aging configuration configured by the ATE server 20, the ATE client 10 reports the test result of the aging test to the ATE main server 30, deletes the on-off and aging test configuration related items in the configuration file, and then does not need to perform the mainboard on-off test and the aging test when the mainboard to be tested is restarted. According to the embodiment, the ageing data can be periodically reported by setting the reporting period, so that the ageing test process of the mainboard to be tested is monitored in real time, the test abnormality in the ageing test process is timely found and processed, and the test efficiency and the test safety are improved.
In one embodiment, ATE server 20 is configured to send a hardware functional test instruction to ATE client 10, where the hardware functional test instruction is configured to trigger a motherboard under test to perform a hardware functional test. Specifically, the ATE server 20 may display the hardware function test items to be tested of the motherboard by loading the INI test template, where the hardware function test includes a plurality of function test items, and the specific function test items are not limited herein, and may click a predetermined button (such as the F3 button) to perform a one-touch test, or may manually perform a single-touch test. The test instruction corresponding to the functional test item can be generated by clicking a predetermined button in the test interface of the ATE server 20, so that the ATE client 10 executes the corresponding hardware functional test according to the test instruction.
The ATE server 20 is further configured to receive a test result of the hardware functional test returned by the ATE client 10, and upload the test result of the hardware functional test to the ATE main server 30. The test result includes, but is not limited to, a test duration, a test number, whether the test is successful, a test failure reason, a test success basis, and the like of each functional test item.
In the process of storing the test results of the hardware function test, the ATE client 10 may send the test results of the multiple functional test items in the hardware function test to the ATE server 20 one by one, and after receiving the test results of all the functional test items, the ATE server 20 uniformly uploads the test results to the ATE main server 30 for storage, so as to improve the data recording and storage efficiency. Alternatively, the ATE client 10 may directly send the test results of the multiple functional test items in the hardware functional test one by one to the ATE main server 30 for storage.
If the number of test success items of the motherboard hardware function test in the test result returned by the ATE client 10 is the same as the number of test items to be tested which are preconfigured by the ATE server 20, determining that the motherboard hardware function test is successful; otherwise, the test fails. The specific value of the number of pre-configured items to be tested is not limited herein.
It should be noted that, if the ATE main server 30 or the ATE server 20 determines that the corresponding test result is a test failure, it is determined that the motherboard to be tested needs to be repaired; that is, if any one of the motherboard startup and shutdown test, the burn-in test and the motherboard hardware function test of the motherboard to be tested fails, it is determined that the motherboard to be tested needs to be repaired.
The ATE server 20 is further configured to send a factory restoration instruction to the ATE client 10 if it is determined that the hardware function test of the motherboard to be tested is successful, where the factory restoration instruction is used to instruct the motherboard to be tested to restore the factory setting. The ATE client 10 is further configured to receive the factory restoration instruction, delete the ATE resource file imported into the motherboard to be tested, and trigger the motherboard to be tested to restore factory settings.
The ATE server 20 is further configured to update the ATE resource file when detecting that the test program in the ATE resource file is abnormal when the ATE client 10 performs the motherboard test, and import the updated ATE resource file to the ATE client 10. Specifically, when the motherboard to be tested is tested, if the ATE branch client monitors that the test program in the ATE resource file is abnormal, a feedback message is sent to the ATE server 20, the ATE server 20 updates the ATE resource file according to the feedback message, and the updated ATE resource file is imported to the ATE client 10, so that the ATE client 10 performs the motherboard test according to the updated ATE resource file. The feedback information includes, but is not limited to, motherboard test items corresponding to abnormal test programs, and the like.
The ATE server 20 is further configured to, after all the test of the to-be-tested mainboards of the batch of worksheets are successful, click a predetermined button (e.g., an F9 button) to delete the ATE resource file generated by the ATE server 20, e.g., when the ATE resource file is imported to the ATE client 10 through the usb disk, delete the ATE resource file in the usb disk by clicking the predetermined button (e.g., the F9 button), so that additional manual deletion is not required, and efficiency and quality of file management are improved.
In the first aspect of the present embodiment, by adding the form of the ATE server 20, various CPU types are managed, and the motherboard of the system uses the test program compiled by the corresponding cross compiling chain, so as to realize universality, compatibility and convenience of motherboard test; in the second aspect, only one ATE branch client is added on the main board test system, only monitoring and copying an ATE resource file are carried out, and an ATE execution client is started; if the test program is found to be abnormal in the test process, only the ATE server 20 is required to update and issue an ATE resource file, and system upgrading on the ATE client 10 is not required; in the third aspect, a test program is imported in a mode of loading an ATE resource file, and the ATE resource file is deleted after the test is finished, so that the subsequent test of a main board can be conveniently and directly carried out on a shipment system, and the stability of carrying the shipment system on the main board is ensured; in the fourth aspect, by adding the product tracing website 40, the customer can learn the condition of the delivery test of the delivery main board at any time, so as to improve the acceptance and trust of the customer on the product.
Example 2
Referring to fig. 5, the present embodiment provides a motherboard testing apparatus, including:
the file importing module 51 is configured to import an ATE resource file generated by the ATE server; the ATE resource file is generated based on an INI test template associated with a production work order number of a mainboard to be tested;
and the test module 52 is configured to receive a test instruction from the ATE server or the ATE main server, perform a motherboard test according to the test instruction and the ATE resource file, and return a corresponding test result to the ATE server or the ATE main server.
The above-described main board test apparatus corresponds to the main board test method of embodiment 1; any of the alternatives in embodiment 1 are also applicable to this embodiment and will not be described in detail here.
Embodiments of the present application also provide a computer readable storage medium storing machine executable instructions that, when invoked and executed by a processor, cause the processor to perform the steps of the motherboard testing method of the above embodiments.
In the several embodiments provided in the present application, it should be understood that the disclosed apparatus and method may be implemented in other manners. The apparatus embodiments described above are merely illustrative, for example, of the flow diagrams and block diagrams in the figures, which illustrate the architecture, functionality, and operation of possible implementations of apparatus, methods and computer program products according to various embodiments of the present application. In this regard, each block in the flowchart or block diagrams may represent a module, segment, or portion of code, which comprises one or more executable instructions for implementing the specified logical function(s). It should also be noted that, in alternative implementations, the functions noted in the block may occur out of the order noted in the figures. For example, two blocks shown in succession may, in fact, be executed substantially concurrently, or the blocks may sometimes be executed in the reverse order, depending upon the functionality involved. It will also be noted that each block of the block diagrams and/or flowchart illustration, and combinations of blocks in the block diagrams and/or flowchart illustration, can be implemented by special purpose hardware-based systems which perform the specified functions or acts, or combinations of special purpose hardware and computer instructions.
In addition, functional modules or units in various embodiments of the application may be integrated together to form a single part, or the modules may exist alone, or two or more modules may be integrated to form a single part.
The functions, if implemented in the form of software functional modules and sold or used as a stand-alone product, may be stored in a computer-readable storage medium. Based on such understanding, the technical solution of the present application may be embodied essentially or in a part contributing to the prior art or in a part of the technical solution in the form of a software product stored in a storage medium, comprising several instructions for causing a computer device (which may be a smart phone, a personal computer, a server, a network device, etc.) to perform all or part of the steps of the method according to the embodiments of the present application. And the aforementioned storage medium includes: a U-disk, a removable hard disk, a Read-Only Memory (ROM), a random access Memory (RAM, random Access Memory), a magnetic disk, or an optical disk, or other various media capable of storing program codes.
The foregoing is merely illustrative of the present application, and the present application is not limited thereto, and any person skilled in the art will readily recognize that variations or substitutions are within the scope of the present application.
Claims (6)
1. The motherboard test system is characterized by comprising an ATE server, an ATE client, an ATE main server and a product tracing website;
the ATE server is provided with a human-computer interaction interface, and is used for loading an INI test template associated with a production work order number of a mainboard to be tested through the human-computer interaction interface, generating an ATE resource file, and importing the ATE resource file to the mainboard to be tested on which the ATE client is mounted;
the ATE client is used for receiving a test instruction from the ATE server or the ATE main server, triggering the mainboard to be tested to execute a mainboard test item corresponding to the test program in the ATE resource file according to the test instruction, and returning a corresponding test result to the ATE server or the ATE main server; the main board test items comprise a main board on-off test, an aging test and a hardware function test;
the ATE main server is used for receiving and storing the motherboard switching-on and switching-off data uploaded by the ATE client, and determining whether the motherboard to be tested successfully completes a motherboard switching-on and switching-off test according to the switching-on and switching-off data; if the on-off test of the main board is determined to be not completed, sending an on-off test in-progress instruction to the ATE client; if the on-off test of the main board is determined to be successfully completed, sending an on-off test successful completion instruction and an aging test instruction to the ATE client, wherein the aging test instruction is used for triggering the main board to be tested to carry out aging test; receiving and storing a test result of the aging test uploaded by the ATE client;
the ATE server is also used for sending a hardware function test instruction to the ATE client, and the hardware function test instruction is used for triggering the mainboard to be tested to carry out hardware function test; receiving a test result of the hardware function test returned by the ATE client, and uploading the test result of the hardware function test to the ATE main server; when the hardware function test is determined to be successfully executed, sending a factory setting restoration instruction to the ATE client and deleting an ATE resource file in the ATE client, wherein the factory setting restoration instruction is used for triggering the mainboard to be tested to restore factory settings;
the ATE main server is also used for storing all test results of the mainboard test;
the ATE main server or the ATE server is also used for determining that the mainboard to be tested needs to be repaired if the test result is determined to be failed;
the ATE server is also used for updating the ATE resource file when detecting that the ATE client performs the mainboard test and the test program in the ATE resource file is abnormal, and importing the updated ATE resource file to the ATE client;
the product tracing website is used for displaying the test record of the main board.
2. The motherboard testing system of claim 1, wherein loading the INI test templates associated with the production job ticket numbers of the motherboard under test to generate the ATE resource file comprises:
and loading configuration information of an INI test template associated with the production work order number of the mainboard to be tested, and selecting and packaging a test program compiled by the cross compiling chain to obtain an ATE resource file.
3. The motherboard testing system according to claim 1, wherein importing the ATE resource file into the motherboard under test on which the ATE client is mounted comprises:
and importing the ATE resource file to a mainboard to be tested on which the ATE client is mounted through a preset importing mode corresponding to the type of the ATE resource file, wherein the preset importing mode comprises any one of a USB flash disk, a serial port and a network mode.
4. A motherboard testing method, applied to the motherboard testing system according to any one of claims 1-3, wherein a motherboard to be tested is mounted with an ATE client in the motherboard testing system, the method comprising:
importing an ATE resource file generated by an ATE server; the ATE resource file is generated based on an INI test template associated with a production work order number of the mainboard to be tested;
receiving a test instruction from the ATE server or an ATE main server, triggering and executing a mainboard test item corresponding to a test program in the ATE resource file according to the test instruction, and returning a corresponding test result to the ATE server or the ATE main server; the main board test items comprise a main board on-off test, an aging test and a hardware function test; further, uploading main board on-off data to the ATE main server, so that the ATE main server is used for receiving and storing the main board on-off data, and determining whether the main board to be tested successfully completes a main board on-off test according to the on-off data; if the fact that the on-off test of the mainboard is not completed is determined, receiving an on-off test in-process instruction from the ATE main server; if the on-off test of the mainboard is determined to be completed successfully, receiving an on-off test successful completion instruction and an aging test instruction from the ATE main server, wherein the aging test instruction is used for triggering the mainboard to be tested to perform aging test; furthermore, the main board test record is used for displaying through a product tracing website;
if the test result is that the test fails, receiving the main board repair information from the ATE main server or the ATE server;
when the ATE client performs the mainboard test, the updated ATE resource file from the ATE server is imported if the test program in the ATE resource file is abnormal in execution.
5. A motherboard testing device applied to the motherboard testing system according to any one of claims 1 to 3, said device comprising:
the file importing module is used for importing an ATE resource file generated by the ATE server; the ATE resource file is generated based on an INI test template associated with a production work order number of a mainboard to be tested;
the test module is used for receiving a test instruction from the ATE server or the ATE main server, triggering and executing a mainboard test item corresponding to a test program in the ATE resource file according to the test instruction, and returning a corresponding test result to the ATE server or the ATE main server; the main board test items comprise a main board on-off test, an aging test and a hardware function test; further, uploading main board on-off data to the ATE main server, so that the ATE main server is used for receiving and storing the main board on-off data, and determining whether the main board to be tested successfully completes a main board on-off test according to the on-off data; if the fact that the on-off test of the mainboard is not completed is determined, receiving an on-off test in-process instruction from the ATE main server; if the on-off test of the mainboard is determined to be completed successfully, receiving an on-off test successful completion instruction and an aging test instruction from the ATE main server, wherein the aging test instruction is used for triggering the mainboard to be tested to perform aging test; furthermore, the main board test record is used for displaying through a product tracing website;
the repair module is used for receiving the mainboard repair information from the ATE main server or the ATE server if the test result is test failure;
and the file updating module is used for importing the updated ATE resource file from the ATE server when the ATE client performs the mainboard test and the test program in the ATE resource file is abnormal in execution.
6. A computer storage medium, characterized in that it stores a computer program which, when executed, implements the motherboard testing method according to claim 4.
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Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1605029A (en) * | 2001-12-18 | 2005-04-06 | 皇家飞利浦电子股份有限公司 | Microprocessor-based probe for integrated circuit testing |
| CN202008657U (en) * | 2011-01-31 | 2011-10-12 | 杭州士兰微电子股份有限公司 | Vector generation device for simulation test of integrated circuit |
| CN104133168A (en) * | 2013-04-30 | 2014-11-05 | 鸿富锦精密工业（深圳）有限公司 | Motherboard test system and method |
| CN104459515A (en) * | 2014-11-14 | 2015-03-25 | 深圳市金锐显数码科技有限公司 | Mainboard production testing method |
| CN105978977A (en) * | 2016-05-16 | 2016-09-28 | 浪潮电子信息产业股份有限公司 | Resource sharing and data backup method based on linux server |
| CN107273249A (en) * | 2016-04-06 | 2017-10-20 | 龙芯中科技术有限公司 | Motherboard test method, processor and main board testing system |
| CN113781873A (en) * | 2021-09-17 | 2021-12-10 | 泰顺县华工启明星培训学校有限公司 | Artificial intelligence teaching remote wireless programming mainboard |
| CN114089165A (en) * | 2021-11-19 | 2022-02-25 | 西安太乙电子有限公司 | ATE-based C8051F chip online test method |
| KR20220059783A (en) * | 2020-11-03 | 2022-05-10 | 에스케이텔레콤 주식회사 | Method and apparatus for testing performance of cloud |
| CN114996069A (en) * | 2022-06-24 | 2022-09-02 | 浪潮商用机器有限公司 | Mainboard test method, device and medium |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102054412B (en) * | 2009-11-09 | 2013-03-13 | 纬创资通股份有限公司 | Device for detecting different motherboard circuits by commonly using power supply and display, and switching device |
| US9009676B2 (en) * | 2010-04-02 | 2015-04-14 | International Business Machines Corporation | Common recording and replaying performance test tool for a client-server environment |
| US10481206B2 (en) * | 2016-09-08 | 2019-11-19 | Texas Instruments Incorporated | Automatic test equipment (ATE) platform translation |
-
2022
- 2022-10-25 CN CN202211306365.8A patent/CN115372803B/en active Active
Patent Citations (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1605029A (en) * | 2001-12-18 | 2005-04-06 | 皇家飞利浦电子股份有限公司 | Microprocessor-based probe for integrated circuit testing |
| CN202008657U (en) * | 2011-01-31 | 2011-10-12 | 杭州士兰微电子股份有限公司 | Vector generation device for simulation test of integrated circuit |
| CN104133168A (en) * | 2013-04-30 | 2014-11-05 | 鸿富锦精密工业（深圳）有限公司 | Motherboard test system and method |
| CN104459515A (en) * | 2014-11-14 | 2015-03-25 | 深圳市金锐显数码科技有限公司 | Mainboard production testing method |
| CN107273249A (en) * | 2016-04-06 | 2017-10-20 | 龙芯中科技术有限公司 | Motherboard test method, processor and main board testing system |
| CN105978977A (en) * | 2016-05-16 | 2016-09-28 | 浪潮电子信息产业股份有限公司 | Resource sharing and data backup method based on linux server |
| KR20220059783A (en) * | 2020-11-03 | 2022-05-10 | 에스케이텔레콤 주식회사 | Method and apparatus for testing performance of cloud |
| CN113781873A (en) * | 2021-09-17 | 2021-12-10 | 泰顺县华工启明星培训学校有限公司 | Artificial intelligence teaching remote wireless programming mainboard |
| CN114089165A (en) * | 2021-11-19 | 2022-02-25 | 西安太乙电子有限公司 | ATE-based C8051F chip online test method |
| CN114996069A (en) * | 2022-06-24 | 2022-09-02 | 浪潮商用机器有限公司 | Mainboard test method, device and medium |
Non-Patent Citations (1)
| Title |
|---|
| 机载设备综合ATE通用软件平台;唐大全;宇航计测技术(第01期);50-54 * |
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