CN115372380A - Identification system for extremely-short wave optical detection method of plastic film wrapped outside - Google Patents
Identification system for extremely-short wave optical detection method of plastic film wrapped outside Download PDFInfo
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- CN115372380A CN115372380A CN202111196612.9A CN202111196612A CN115372380A CN 115372380 A CN115372380 A CN 115372380A CN 202111196612 A CN202111196612 A CN 202111196612A CN 115372380 A CN115372380 A CN 115372380A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/01—Arrangements or apparatus for facilitating the optical investigation
- G01N2021/0106—General arrangement of respective parts
- G01N2021/0112—Apparatus in one mechanical, optical or electronic block
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- Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)
Abstract
The invention belongs to the field of film detection, and particularly relates to an identification system of an outsourcing plastic film ultra-short wave optical detection method. The identification system comprises an extremely short wave light source module, an image acquisition module, an image filtering preprocessing module and an image algorithm processing module, is used for detecting the defects of the externally-coated plastic film and transmitting the detection result to a result output module. The light source outline is detected by using the ultra-short wave light source, the light source grouping module for accurately measuring and calculating time is established, so that light rays are prevented from being refracted and reflected, the mutual interference of the light sources is prevented, and meanwhile, the quality of a product oil seal with a plastic film is better detected by using a film recognition algorithm and detecting and tracking creases.
Description
Technical Field
The invention belongs to the field of film detection, and particularly relates to an identification system of an outsourcing plastic film ultra-short wave optical detection method.
Background
At present, plastic films are widely applied to the fields of food, medicine, chemical industry and the like, wherein the proportion of food packages is the largest, such as beverage packages, quick-frozen food packages, steamed and cooked food packages, fast food packages and the like, and the products bring great convenience to the life of people.
However, in the film-based appearance detection, the defects of the product cannot be accurately judged by being close to human eyes, and the machine vision system detection is carried out accordingly, and the vision detection system can quickly screen out the product with the defects by detecting and analyzing the common surface defects of the film product, such as dirty spots, stripes, damage, edge cracks, wrinkles, dark spots, bright spots, edge damage, black spot defects, hair, mosquitoes and the like, thereby greatly saving manpower and material resources.
However, in the actual production process of the outer packaging plastic film, due to the influence of various factors, defects such as holes, mosquitoes, black spots, crystal spots, scratches, spots and the like can appear on the surface of the film, the quality of the film is seriously influenced, and unnecessary loss is brought to manufacturers.
Disclosure of Invention
Aiming at some problems in the prior art, the invention provides an identification system of an outsourcing plastic film ultrashort wave optical detection method, which specifically comprises an ultrashort wave light source module, a light source switch and light source brightness time control module, an image acquisition module, an image filtering preprocessing module, an image algorithm processing module and a result output module, wherein the image acquisition module is used for acquiring film outline data, transmitting the acquired film outline data to the image filtering preprocessing module, filtering and correcting distortion of the acquired film outline data, transmitting the processed data to the image algorithm processing module, detecting the defects of the outsourcing plastic film and transmitting the detection result to the result output module.
Preferably, the position of the product with the plastic film is positioned by adopting an infrared sensor, so that the light source camera is triggered to shoot and recognize after the product with the plastic film is carried to a specified position through a production line.
Preferably, the ultrashort wave light source module comprises a light source time controller and an ultrashort wave light source.
Preferably, the light source time controller is used for processing refraction, reflection and mutual interference after the ultra-short wave light irradiates the plastic outer packaging film by measuring and calculating the light source time and grouping the light source time.
Preferably, the image filtering preprocessing module comprises image acquisition, brightness contrast preprocessing, distortion correction and rotation transformation processing.
Preferably, the detecting the defects of the outsourcing plastic film comprises wrinkling intensive detection, crease detection and tracking, damage detection, crease unreasonable shape and style screening, detection of the difference of the lateral film exceeding edge positions, and transparent film image edge crease bending degree detection.
Preferably, the detection of the bending degree of the edge crease of the transparent film image uses an RTU capture measurement technology.
Preferably, the image algorithm processing module comprises a thin film recognition algorithm, edge feature extraction and shape matching based on deep learning.
Preferably, the EDGE feature extraction includes extracting a preliminary EDGE feature by using a canny operator, and performing laplace operation, sobel operation and MID-EDGE operation to extract an EDGE depth feature.
Preferably, the canny operator extracts the preliminary edge features, the preliminary edge features are used for filtering out areas with violent changes of the edge gray values of the outer wrapping film through denoising, then the obtained gradient values are derived to express the change degree of the edge gray values of the outer wrapping film, and the initial edge features are used for fitting edge lines and optimizing the edge features of the outer wrapping film through non-maximum suppression and threshold setting processing.
Compared with the prior art, the invention has the following beneficial effects:
(1) The invention uses the ultra-short wave light source to detect the light source profile, and establishes the light source grouping module for accurately measuring and calculating the time so as to prevent the light from being interfered with each other through refraction and reflection.
(2) The invention uses a film recognition algorithm to extract the deep characteristics of the edge of the film by detecting and tracking the crease, detecting the damage, screening the unreasonable shape and style set of the crease and the like, thereby better detecting the quality of the product oil seal with the plastic film.
During outline detection of the outer packaging film, an extremely short wave light source is used
Drawings
FIG. 1 is a detection flow chart of the method for detecting the ultra-short wave light of the plastic film coated outside.
Detailed Description
The invention provides a multi-dimensional data acquisition and detection method combined with real sensory simulation, and in order to make the purpose, technical scheme and effect of the invention clearer and clearer, the invention is further described in detail by referring to the attached drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.
An identification system of an outsourcing plastic film ultra-short wave optical detection method specifically comprises an ultra-short wave light source module, an image acquisition module, an image filtering preprocessing module and an image algorithm processing module, wherein the ultra-short wave light source module is used for controlling light source switch and light source brightness time, acquiring film outline data through the image acquisition module, transmitting the acquired film outline data to the image filtering preprocessing module, filtering and distortion correcting the acquired film outline data, transmitting the processed data to the image algorithm processing module, detecting the defects of an outsourcing plastic film and transmitting the detection result to a result output module.
In one embodiment, an infrared sensor is used for positioning the position of the product with the plastic film, so that the light source camera is triggered to perform photographing identification after the product with the plastic film is carried to a specified position through a production line.
In one embodiment, the ultrashort wave light source module comprises a light source time controller and an ultrashort wave light source.
In one embodiment, the light source time controller is used for processing refraction, reflection and mutual interference of the ultra-short wave light irradiating the plastic outer packaging film by measuring and calculating the light source time and grouping the light source time to determine the bright and dark sequence.
In one embodiment, the image filtering preprocessing module comprises image acquisition, brightness contrast preprocessing, distortion correction and rotation transformation processing.
In one embodiment, the detecting defects of the plastic film wrapped outside the container comprises wrinkling intensive detection, crease detection tracking, breakage detection, crease unreasonable shape and pattern screening, side film out-of-edge position and section difference detection and transparent film image edge crease bending degree detection.
In one embodiment, the transparent film image edge crease bending degree detection uses an RTU capture metrology technique.
In one embodiment, the image algorithm processing module comprises a thin film recognition algorithm, edge feature extraction and deep learning-based shape matching.
In one embodiment, the EDGE feature extraction first uses the canny operator to extract preliminary EDGE features, and performs laplacian operation, sobel operation and MID-EDGE operation to extract EDGE depth features.
In one embodiment, the canny operator extracts the preliminary edge feature, the preliminary edge feature is used for filtering an area with severe change of the edge gray value of the outer packaging film through denoising, the obtained gradient value is derived to express the change degree of the edge gray value of the outer packaging film, and the preliminary edge feature is used for fitting the edge line and optimizing the edge feature of the outer packaging film through non-maximum value suppression and threshold value setting processing.
The above description is only a preferred embodiment of the present invention, and is not intended to limit the present invention in other forms, and any person skilled in the art may modify or change the technical content disclosed above into an equivalent embodiment with equivalent modifications, but all simple modifications, equivalent changes and modifications made on the above embodiment according to the technical spirit of the present invention still belong to the protection scope of the present invention.
Claims (10)
1. An identification system of an extremely short wave optical detection method of an outsourcing plastic film specifically comprises an extremely short wave light source module, an image acquisition module, an image filtering and preprocessing module, an image algorithm processing module, a result output module and a data processing module, wherein the extremely short wave light source module is used for controlling light source switch and light source brightness time, acquiring film outline data through the image acquisition module, transmitting the acquired film outline data to the image filtering and preprocessing module, carrying out filtering and distortion correction processing on the acquired film outline data, transmitting the processed data to the image algorithm processing module, detecting the defect of the outsourcing plastic film and transmitting the detection result to the result output module.
2. The system for identifying the extremely short wave optical detection method of the outsourcing plastic film as recited in claim 1, wherein an infrared sensor is used for positioning the position of the product with the plastic film, so as to trigger a light source camera to take a picture for identification after the product with the plastic film is carried to a specified position through a production line.
3. The system for identifying an ultrashort wave light detection method of an outsourcing plastic film as claimed in claim 1, wherein the ultrashort wave light source module comprises a light source time controller and an ultrashort wave light source.
4. The system for identifying the ultra-short wave light detection method of the externally-coated plastic film as claimed in claim 3, wherein the light source time controller is used for processing refraction, reflection and mutual interference of the ultra-short wave light irradiating the plastic externally-coated film by measuring and calculating the light source time and grouping the light source time.
5. The system for identifying an ultrashort wave light detection method of an outsourcing plastic film as claimed in claim 1, wherein the image filtering preprocessing module comprises image acquisition, brightness contrast preprocessing, distortion correction and rotation transformation processing.
6. The outsourcing plastic film ultrashort wave optical detection method identification system of claim 1, wherein the detecting of the outsourcing plastic film defects comprises wrinkling intensive detection, crease detection tracking, breakage detection, crease unreasonable shape and pattern screening, side film out-of-edge position and section difference detection, transparent film image edge crease bending degree detection.
7. The system as claimed in claim 6, wherein the detection of the degree of bending of the transparent film image edge creases is performed by using RTU capture measurement technique.
8. The outsourcing plastic film ultrashort wave light detection method identification system of claim 1, wherein the image algorithm processing module comprises a film identification algorithm, edge feature extraction and deep learning-based shape matching.
9. The system for identifying outsourcing plastic film ultrashort wave optical detection method as claimed in claim 8, wherein the EDGE feature extraction is performed by firstly extracting preliminary EDGE features using canny operator and performing laplace operation, sobel operation and MID-EDGE operation to extract EDGE depth features.
10. The outsourcing plastic film ultrashort wave light detection method identification system as claimed in claim 1, wherein the canny operator extracts preliminary edge features, removes noise to filter out regions with drastic changes of the grey values of the edges of the outsourcing film, derives the obtained gradient values to represent the degree of changes of the grey values of the edges of the outsourcing film, suppresses and sets threshold values through non-maximal values to fit the edge lines, and optimizes the edge features of the outsourcing film.
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| Application Number | Priority Date | Filing Date | Title |
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| CN202111196612.9A CN115372380A (en) | 2021-10-14 | 2021-10-14 | Identification system for extremely-short wave optical detection method of plastic film wrapped outside |
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| CN202111196612.9A CN115372380A (en) | 2021-10-14 | 2021-10-14 | Identification system for extremely-short wave optical detection method of plastic film wrapped outside |
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| CN202111196612.9A Pending CN115372380A (en) | 2021-10-14 | 2021-10-14 | Identification system for extremely-short wave optical detection method of plastic film wrapped outside |
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Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117870546A (en) * | 2024-03-11 | 2024-04-12 | 张掖市西龙产业用纺织品有限公司 | Electrode diaphragm detection method and system |
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2021
- 2021-10-14 CN CN202111196612.9A patent/CN115372380A/en active Pending
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN117870546A (en) * | 2024-03-11 | 2024-04-12 | 张掖市西龙产业用纺织品有限公司 | Electrode diaphragm detection method and system |
| CN117870546B (en) * | 2024-03-11 | 2024-05-10 | 张掖市西龙产业用纺织品有限公司 | Electrode diaphragm detection method and system |
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