CN115360388A

CN115360388A - Method and device for processing bounce fault of fuel cell inspection system and electronic equipment

Info

Publication number: CN115360388A
Application number: CN202211009251.7A
Authority: CN
Inventors: 张岩; 徐云飞; 李飞强; 方川
Original assignee: Beijing Sinohytec Co Ltd
Current assignee: Beijing Sinohytec Co Ltd
Priority date: 2022-08-23
Filing date: 2022-08-23
Publication date: 2022-11-18

Abstract

The invention provides a fuel cell inspection system bounce fault processing method and device and electronic equipment. The method for processing the bounce fault of the fuel cell inspection system comprises the following steps: acquiring the voltage of each fuel cell to obtain a plurality of single-chip voltages; comparing each single-chip voltage with the average voltage, and judging whether a first condition is met; acquiring multiple voltage values of the single chip meeting the first condition, and judging whether at least one voltage value in the multiple voltage values meets a second condition; if at least one voltage value in the multiple voltage values meets a second condition, judging that the routing inspection jumping fault occurs; and shielding the single chip with the routing inspection jumping fault, and assigning the average single chip voltage of the fuel cell to the single chip with the routing inspection jumping fault as the voltage of the single chip with the routing inspection jumping fault, wherein the average single chip voltage is the average value of the voltages of other single chips except the single chip with the fault. The purposes of reducing the maintenance period and reducing the maintenance cost are achieved.

Description

Method and device for processing bounce fault of fuel cell inspection system and electronic equipment

Technical Field

The invention belongs to the technical field of new energy, and particularly relates to a method and a device for processing a bounce fault of a fuel cell inspection system and electronic equipment.

Background

One of common faults of the conventional hydrogen fuel cell vehicle is a voltage inspection system fault of the fuel cell, wherein the common voltage inspection system fault is a jumping fault, so that the system reports a low fault by mistake, the power output of an engine is influenced, the performance of the engine is reduced, the fault rate of the whole vehicle is increased, and the reliability of the vehicle is reduced. The prior art adopts the technical scheme of replacing a voltage inspection system module aiming at the misinformation list low fault caused by the jump fault, so that the problems of long period and high cost exist.

Disclosure of Invention

Aiming at the problems in the prior art, the invention provides a method and a device for processing the bounce fault of a fuel cell inspection system and electronic equipment, and at least partially solves the problems of long maintenance period and high cost in the prior art.

In a first aspect, an embodiment of the present disclosure provides a method for handling a bounce fault of a fuel cell inspection system, including:

acquiring the voltage of each fuel cell to obtain a plurality of single-chip voltages;

comparing each single-chip voltage with the average voltage, and judging whether the first condition is met, wherein the average voltage is the average value of all single-chip voltages of the fuel cell;

obtaining multiple voltage values of a single chip meeting a first condition, and judging whether at least one voltage value in the multiple voltage values meets a second condition;

if at least one voltage value in the multiple voltage values meets a second condition, judging that the routing inspection jumping fault occurs;

and shielding the single chip for inspecting the jumping fault, and assigning the average single chip voltage of the fuel cell to the single chip for inspecting the jumping fault as the voltage of the single chip for inspecting the jumping fault, wherein the average single chip voltage is the average value of voltages of other single chips except the single chip with the fault.

Optionally, the first condition is Vave-V _N >A, vave is the average voltage of the fuel cell, V _N A is a set value for the fuel cell monolithic voltage.

Optionally, 50mv cloth A cloth 150mv.

Optionally, the second condition is Vave-V _i < B，V _i For monolithic units satisfying the first condition, B is a set value.

Alternatively, 0 mv-P-B-P-30mv.

Optionally, the obtaining multiple voltage values of a single chip meeting the first condition includes:

checking a plurality of rounds of detection values of the fuel cell inspection system to obtain a plurality of rounds of inspection voltages;

and acquiring multiple voltage values of the single chip meeting the first condition from the multiple rounds of inspection voltages.

Optionally, the multi-round detection value is any five-round detection value.

In a second aspect, an embodiment of the present disclosure further provides a processing apparatus for a bounce fault of a fuel cell inspection system, including:

the voltage acquisition module is used for acquiring the voltage of each fuel cell to obtain a plurality of single-chip voltages;

the voltage comparison module is used for comparing each single-chip voltage with the average voltage to judge whether a first condition is met, wherein the average voltage is the average value of all single-chip voltages of the fuel cell;

the inspection module is used for acquiring multiple voltage values of the single chip meeting the first condition and judging whether at least one voltage value in the multiple voltage values meets a second condition;

the judging module is used for judging that the routing inspection jumping fault is detected if at least one voltage value in the multiple voltage values meets a second condition;

and the inspection jumping fault processing module is used for shielding the single chip with the inspection jumping fault, assigning the average single chip voltage of the fuel cell to the single chip with the inspection jumping fault as the voltage of the single chip with the inspection jumping fault, and the average single chip voltage is the average value of the voltages of other single chips except the single chip with the fault.

In a third aspect, an embodiment of the present disclosure further provides an electronic device, where the electronic device includes:

at least one processor; and (c) a second step of,

a memory communicatively coupled to the at least one processor; wherein, the first and the second end of the pipe are connected with each other,

the memory stores instructions executable by the at least one processor to enable the at least one processor to perform the method for handling fuel cell routing inspection system bounce failures of the first aspect.

In a fourth aspect, the disclosed embodiments also provide a computer-readable storage medium storing computer instructions for causing a computer to execute the processing method for routing inspection system jump fault of a fuel cell according to any one of the first aspect.

The invention provides a method and a device for processing a bounce fault of a fuel cell inspection system and electronic equipment, wherein the method for processing the bounce fault of the fuel cell inspection system is used for shielding a single chip with the fault by judging whether the fault of the voltage inspection system is the bounce fault or not, assigning the average single chip voltage of a fuel cell to the single chip with the fault as the voltage of the single chip with the fault and shielding false single chips caused by the fault of the voltage inspection system per se, so that an engine and a voltage inspection system module are prevented from being replaced, and the aims of reducing the maintenance period and reducing the maintenance cost are fulfilled.

Drawings

The foregoing and other objects, features and advantages of the disclosure will be apparent from the following more particular descriptions of exemplary embodiments of the disclosure as illustrated in the accompanying drawings wherein like reference numbers generally represent like parts throughout the exemplary embodiments of the disclosure.

Fig. 1 is a flowchart of a method for handling bounce faults of a fuel cell inspection system according to an embodiment of the present disclosure;

fig. 2 is a schematic block diagram of a processing device for a bounce fault of a fuel cell inspection system according to an embodiment of the present disclosure;

fig. 3 is a schematic block diagram of an electronic device according to an embodiment of the present disclosure.

Detailed Description

The embodiments of the present disclosure are described in detail below with reference to the accompanying drawings.

It is to be understood that the embodiments of the present disclosure are described below by way of specific examples, and that other advantages and effects of the present disclosure will be readily apparent to those skilled in the art from the disclosure herein. It is to be understood that the embodiments described are only a few embodiments of the present disclosure, and not all embodiments. The disclosure may be embodied or carried out in various other specific embodiments, and various modifications and changes may be made in the details within the description without departing from the spirit of the disclosure. It is to be noted that the features in the following embodiments and examples may be combined with each other without conflict. All other embodiments, which can be derived by a person skilled in the art from the embodiments disclosed herein without inventive step, are intended to be within the scope of the present disclosure.

It is noted that various aspects of the embodiments are described below within the scope of the appended claims. It should be apparent that the aspects described herein may be embodied in a wide variety of forms and that any specific structure and/or function described herein is merely illustrative. Based on the disclosure, one skilled in the art should appreciate that one aspect described herein may be implemented independently of any other aspects and that two or more of these aspects may be combined in various ways. For example, an apparatus may be implemented and/or a method practiced using any number of the aspects set forth herein. Additionally, such an apparatus may be implemented and/or such a method may be practiced using other structure and/or functionality in addition to one or more of the aspects set forth herein.

It should be further noted that the drawings provided in the following embodiments are only schematic illustrations of the basic concepts of the present disclosure, and the drawings only show the components related to the present disclosure rather than the numbers, shapes and dimensions of the components in actual implementation, and the types, the numbers and the proportions of the components in actual implementation may be arbitrarily changed, and the layout of the components may be more complicated.

In addition, in the following description, specific details are provided to facilitate a thorough understanding of the examples. However, it will be understood by those skilled in the art that the aspects may be practiced without these specific details.

Average voltage: the fuel cell stack averages the individual sheet voltage.

Jumping failure: the voltage of a certain single battery or a plurality of single batteries fluctuates back and forth.

Single low: the phenomenon that the voltage of one or each sheet in the fuel cell stack is obviously lower than the average voltage.

Single height: the phenomenon that the voltage of one or each sheet in the fuel cell stack is obviously higher than the average voltage.

For easy understanding, as shown in fig. 1, the present embodiment discloses a method for handling bounce failure of a fuel cell inspection system, which includes:

the fuel cell includes a plurality of individual sheets.

optionally, the first condition is Vave-V _N >A, vave is the average voltage of the fuel cell, V _N A is a set value for the fuel cell single-chip voltage. 50mv<A<150mv。

Optionally, the multi-round detection value is any five-round detection value.

Optionally, the second condition is Vave-V _i < B，V _i For monolithic units satisfying the first condition, B is a set value. 0mv<B<30mv。

If at least one of the multiple voltage values meets a second condition, judging that the routing inspection jumping fault occurs;

and shielding the single chip with the routing inspection jumping fault, and assigning the average single chip voltage of the fuel cell to the single chip with the routing inspection jumping fault as the voltage of the single chip with the routing inspection jumping fault, wherein the average single chip voltage is the average value of the voltages of other single chips except the single chip with the fault.

If the above conditions are not met, the failure reason of the fuel cell inspection system needs to be further checked.

As shown in fig. 2, the present embodiment further discloses a processing apparatus for bounce fault of fuel cell inspection system, including:

the voltage comparison module is used for comparing each single-chip voltage with the average voltage to judge whether the first condition is met, wherein the average voltage is the average value of all single-chip voltages of the fuel cell;

the judging module is used for judging that the routing inspection jumping fault exists if at least one voltage value in the multiple voltage values meets a second condition;

and the inspection jumping fault processing module is used for shielding the single chip for inspecting jumping faults and assigning the average single chip voltage of the fuel cell to the single chip for inspecting jumping faults as the voltage of the single chip for inspecting jumping faults, and the average single chip voltage is the average value of voltages of other single chips except the single chip with faults.

The electronic device disclosed by the embodiment comprises a memory and a processor. The memory is to store non-transitory computer readable instructions. In particular, the memory may include one or more computer program products that may include various forms of computer-readable storage media, such as volatile memory and/or non-volatile memory. The volatile memory may include, for example, random Access Memory (RAM), cache memory (cache), and/or the like. The non-volatile memory may include, for example, read Only Memory (ROM), hard disk, flash memory, etc.

The processor may be a Central Processing Unit (CPU) or other form of processing unit having data processing capabilities and/or instruction execution capabilities, and may control other components in the electronic device to perform desired functions. In one embodiment of the present disclosure, the processor is configured to execute the computer readable instructions stored in the memory, so that the electronic device performs all or part of the foregoing steps of the processing method for the fuel cell routing inspection system bounce fault according to the embodiments of the present disclosure.

Those skilled in the art should understand that, in order to solve the technical problem of how to obtain a good user experience, the present embodiment may also include well-known structures such as a communication bus, an interface, and the like, and these well-known structures should also be included in the protection scope of the present disclosure.

Fig. 3 is a schematic structural diagram of an electronic device according to an embodiment of the present disclosure. There is shown a schematic diagram of a structure suitable for implementing an electronic device in an embodiment of the present disclosure. The electronic device shown in fig. 3 is only an example, and should not bring any limitation to the functions and the scope of use of the embodiments of the present disclosure.

As shown in fig. 3, the electronic device may include a processing means (e.g., a central processing unit, a graphic processor, etc.) that can perform various appropriate actions and processes according to a program stored in a Read Only Memory (ROM) or a program loaded from a storage means into a Random Access Memory (RAM). In the RAM, various programs and data necessary for the operation of the electronic apparatus are also stored. The processing device, the ROM, and the RAM are connected to each other by a bus. An input/output (I/O) interface is also connected to the bus.

Generally, the following devices may be connected to the I/O interface: input means including, for example, a sensor or a visual information acquisition device; output devices including, for example, display screens and the like; storage devices including, for example, magnetic tape, hard disk, etc.; and a communication device. The communication means may allow the electronic device to communicate wirelessly or by wire with other devices, such as edge computing devices, to exchange data. While fig. 3 illustrates an electronic device having various means, it is to be understood that not all illustrated means are required to be implemented or provided. More or fewer devices may be alternatively implemented or provided.

In particular, the processes described above with reference to the flow diagrams may be implemented as computer software programs, according to embodiments of the present disclosure. For example, embodiments of the present disclosure include a computer program product comprising a computer program carried on a non-transitory computer readable medium, the computer program containing program code for performing the method illustrated by the flow chart. In such an embodiment, the computer program may be downloaded and installed from a network via the communication means, or installed from a storage means, or installed from a ROM. When the computer program is executed by the processing device, all or part of the steps of the processing method for the fuel cell polling system bounce fault of the embodiment of the disclosure are executed.

For the detailed description of the present embodiment, reference may be made to the corresponding descriptions in the foregoing embodiments, which are not repeated herein.

A computer-readable storage medium according to an embodiment of the present disclosure has non-transitory computer-readable instructions stored thereon. When the non-transitory computer readable instructions are executed by the processor, all or part of the steps of the processing method for the fuel cell routing inspection system bounce fault of the embodiments of the present disclosure are executed.

The computer-readable storage media include, but are not limited to: optical storage media (e.g., CD-ROMs and DVDs), magneto-optical storage media (e.g., MOs), magnetic storage media (e.g., magnetic tapes or removable disks), media with built-in rewritable non-volatile memory (e.g., memory cards), and media with built-in ROMs (e.g., ROM cartridges).

The basic principles of the present disclosure have been described above in connection with specific embodiments, but it should be noted that advantages, effects, and the like, mentioned in the present disclosure are only examples and not limitations, and should not be considered essential to the various embodiments of the present disclosure. Furthermore, the foregoing disclosure of specific details is for the purpose of illustration and description and is not intended to be limiting, since the disclosure is not intended to be limited to the specific details so described.

In the present disclosure, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions, and the block diagrams of devices, apparatuses, devices, systems, and apparatuses herein referred to are used merely as illustrative examples and are not intended to require or imply that the connections, arrangements, configurations, etc. must be made in the manner shown in the block diagrams. These devices, apparatuses, devices, systems may be connected, arranged, configured in any manner, as will be appreciated by those skilled in the art. Words such as "including," "comprising," "having," and the like are open-ended words that mean "including, but not limited to," and are used interchangeably therewith. The words "or" and "as used herein mean, and are used interchangeably with, the word" and/or, "unless the context clearly dictates otherwise. The word "such as" is used herein to mean, and is used interchangeably with, the phrase "such as but not limited to".

Also, as used herein, "or" as used in a list of items beginning with "at least one" indicates a separate list, such that, for example, a list of "at least one of a, B, or C" means a or B or C, or AB or AC or BC, or ABC (i.e., a and B and C). Furthermore, the phrase "exemplary" does not mean that the described example is preferred or better than other examples.

It is also noted that in the systems and methods of the present disclosure, components or steps may be decomposed and/or re-combined. These decompositions and/or recombinations are to be considered equivalents of the present disclosure.

Various changes, substitutions and alterations to the techniques described herein may be made without departing from the techniques of the teachings as defined by the appended claims. Moreover, the scope of the claims of the present disclosure is not limited to the particular aspects of the process, machine, manufacture, composition of matter, means, methods and acts described above. Processes, machines, manufacture, compositions of matter, means, methods, or acts, presently existing or later to be developed that perform substantially the same function or achieve substantially the same result as the corresponding aspects described herein may be utilized. Accordingly, the appended claims are intended to include within their scope such processes, machines, manufacture, compositions of matter, means, methods, or acts.

The previous description of the disclosed aspects is provided to enable any person skilled in the art to make or use the present disclosure. Various modifications to these aspects will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other aspects without departing from the scope of the disclosure. Thus, the present disclosure is not intended to be limited to the aspects shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

The foregoing description has been presented for purposes of illustration and description. Furthermore, the description is not intended to limit embodiments of the disclosure to the form disclosed herein. While a number of example aspects and embodiments have been discussed above, those of skill in the art will recognize certain variations, modifications, alterations, additions and sub-combinations thereof.

Claims

1. A method for processing bounce faults of a fuel cell routing inspection system is characterized by comprising the following steps:

acquiring multiple voltage values of the single chip meeting the first condition, and judging whether at least one voltage value in the multiple voltage values meets a second condition;

2. The method for handling the bounce fault of the fuel cell inspection system according to claim 1, wherein the first condition is Vave-V _N >A, vave is the average voltage of the fuel cell, V _N A is a set value for the fuel cell monolithic voltage.

3. The method for handling bounce faults in a fuel cell inspection system according to claim 2, wherein 50mv layers a are woven 150mv.

4. The method for handling the bounce fault of the fuel cell inspection system according to claim 1, wherein the second condition is Vave-V _i < B，V _i For monolithic units satisfying the first condition, B is a set value.

5. The fuel cell routing inspection system bounce failure handling method according to claim 4, wherein 0mv < -B < -30mv.

6. The method for processing the bounce fault of the fuel cell inspection system according to claim 1, wherein the obtaining of the multiple voltage values of the single sheet satisfying the first condition includes:

7. The method for handling the bounce fault of the fuel cell inspection system according to claim 6, wherein the multi-round detection values are any five-round detection values.

8. The utility model provides a processing apparatus of fuel cell system of patrolling and examining jumping trouble which characterized in that includes:

9. An electronic device, characterized in that the electronic device comprises:

at least one processor; and the number of the first and second groups,

a memory communicatively coupled to the at least one processor; wherein the content of the first and second substances,

the memory stores instructions executable by the at least one processor to enable the at least one processor to perform the method of handling fuel cell routing inspection system bounce failures of any of claims 1-7.

10. A computer-readable storage medium storing computer instructions for causing a computer to execute the method for handling a bounce fault of a fuel cell inspection system according to any one of claims 1 to 7.