CN115266623A - Optical performance simulation method of multilayer semitransparent system based on different spectrums - Google Patents

Optical performance simulation method of multilayer semitransparent system based on different spectrums Download PDF

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CN115266623A
CN115266623A CN202210908159.8A CN202210908159A CN115266623A CN 115266623 A CN115266623 A CN 115266623A CN 202210908159 A CN202210908159 A CN 202210908159A CN 115266623 A CN115266623 A CN 115266623A
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刘洋
胡张保
严佳敏
遆曙光
王浩鹏
高柯
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Zhengzhou University of Light Industry
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Abstract

The invention relates to the technical field of optical performance simulation analysis in the building industry, in particular to an optical performance simulation method of a multilayer semitransparent system based on different spectrums, which comprises the following steps: step 1: acquiring experimental data, and measuring the transmittance tau and the reflectivity sigma of a single-layer material by using a spectrophotometer; step 2: establishing an optical model of the single-layer material by using a ray tracing method, and calculating the single reflectivity r and the single absorptivity a of the single-layer material; and step 3: calculating the spectral extinction coefficient and the spectral refractive index of the single-layer material according to the single reflectivity and the single absorptivity of the single-layer material calculated in the step 2; and 4, step 4: establishing an optical model of the multilayer semitransparent system, and calculating the total transmittance and the total absorption rate of the multilayer semitransparent system; the invention provides conditions for researching the calculation and analysis of the optical performance and the heat transfer performance of the semitransparent door and window, and can conveniently provide accurate reference for the building load calculation and the model selection work of the air conditioning unit.

Description

Optical performance simulation method of multilayer semitransparent system based on different spectrums
Technical Field
The invention relates to the technical field of optical performance simulation analysis in the building industry, in particular to an optical performance simulation method of a multilayer semitransparent system based on different spectrums.
Background
The solar radiation refers to energy transmitted to the outside by the sun in the form of electromagnetic waves, and is mainly divided into ultraviolet rays, visible light and infrared rays according to different wavelengths, the energy carried by different wave bands is different, and the solar radiation is mainly concentrated on the visible light and near infrared ray wave bands. The solar radiation with wavelength of 0.3-2.5 μm accounts for over 97.7% of the total radiation energy, and the solar constant is 1368W/m2。
The semitransparent door and window is an important device in the building industry, the solar radiation transmittance and absorptivity of the semitransparent door and window directly influence building load calculation and air conditioning unit model selection work, and before construction, optical performance analysis is often carried out on door and window materials; with the development of scientific technology and the pursuit of people for energy conservation and environmental protection, the door and window is not formed by single glass, but formed by the combination of multiple materials, such as a privacy film and a heat insulation film, wherein the functions of the various films are different, and the radiation transmittances of the various films to different wavelengths of light are different, wherein the transmittance of the privacy film to the visible light part is lower, and the transmittance of the heat insulation film to the infrared light part is lower.
When the doors and windows are formed by the different materials to form a light-transmitting multi-layer semitransparent system, if a traditional method is still used, the solar radiation transmittance of the semitransparent system is directly calculated by utilizing the solar radiation characteristics of the different materials, and the calculation result is obviously deviated due to the fact that the wavelength influence is not considered, so that a result with good light transmittance can be obtained. The experimental data can not bring valuable reference for simulating the building load and determining the equipment capacity, and the building load calculation and the model selection work of the air conditioning unit are seriously influenced.
Therefore, how to accurately simulate the optical performance of a multilayer semitransparent system in modern doors and windows and provide accurate reference for building load calculation and model selection work of air conditioning units becomes a technical problem to be urgently solved by technical personnel in the field
Disclosure of Invention
In view of the above, the present invention provides a method for simulating optical performance of a multi-layer translucent system based on different spectra, so as to solve the technical problem that the simulation result of the optical performance of the multi-layer translucent system in the prior art is not accurate and cannot provide accurate reference for building load calculation and model selection work of an air conditioning unit.
In order to achieve the purpose, the optical performance simulation method of the multilayer semitransparent system based on different spectrums adopts the following technical scheme:
the optical performance simulation method of the multilayer semitransparent system based on different spectrums comprises the following steps:
step 1: acquiring experimental data, and measuring the transmittance tau and the reflectance sigma of a single-layer material by using a spectrophotometer;
step 2: establishing an optical model of the single-layer material by using a ray tracing method, and calculating the single reflectivity r and the single absorptivity a of the single-layer material;
and step 3: calculating the spectral extinction coefficient and the spectral refractive index of the single-layer material according to the single reflectivity and the single absorptivity of the single-layer material calculated in the step 2;
and 4, step 4: and establishing an optical model of the multilayer semitransparent system, and calculating the total transmittance and the total absorption rate of the multilayer semitransparent system.
Further, in step 2, the formula of the transmittance τ and the reflectance σ of the single-layer material obtained according to the mathematical induction method is shown in formula (1) and formula (2):
Figure BDA0003773173460000021
Figure BDA0003773173460000022
and (2) substituting the transmittance tau and the reflectance sigma of the single-layer material in the step (1) into the single-layer material with the single reflectance and the single absorbance of the single-layer material, and combining the definitions of the interface single reflectance and the absorbance (0 & ltr & lt 1,0 & lta & lt 1) to obtain the single reflectance r and the single absorbance a of the single-layer material.
Further, calculating a spectral extinction coefficient and a spectral refractive index, and calculating the single-layer reflectivity r and the single-time absorptivity a according to the step 2, and meanwhile, calculating the single-layer reflectivity r and the single-time absorptivity a according to the Bouger law dI = I × kλThe equation for the single absorption of a single layer material integrated by xdl is shown in equation (3):
Figure BDA0003773173460000023
wherein tau is the single transmittance of the single-layer material, theta is the light incidence angle, and d is the thickness of the single-layer material and the unit is mm; k is a radical of formulaλIs the extinction coefficient of a single-layer material at the wavelength of lambda and has the unit of mm-1(ii) a When the incident light is vertically incident, the incident angle is 0 °, and the spectral extinction coefficient of the single-layer material at the wavelength λ is obtained as shown in (4):
Figure BDA0003773173460000031
according to Snell's law, when the incident angle is 0 degrees, the spectral refractive index of the single-layer material is shown as formula (5):
Figure BDA0003773173460000032
wherein n is1Is the refractive index of air; n is a radical of an alkyl radical2λIs the spectral refractive index of a single layer of material at a wavelength λ.
Further, a multilayer translucent system was establishedThe multilayer translucent system comprising at least an incident interface k and an adjacent section k +1; suppose energy G is radiated from the k side of the interfacekA portion of the radiant energy is reflected by the interface k, and the remainder of the radiant energy passes through the interface k; radiating energy F from the other side of the interface kk′Wherein a portion of the radiation is reflected by the interface k, and the remainder of the radiation energy passes through the interface k; then G iskOf radiant energy and F passing through the interface kk′Wherein the radiant energy reflected by the interface k jointly constitutes Gk′；GkOf radiant energy F reflected by the interface kk′In which the radiant energy passing through the interface k jointly constitutes Fk；
If the single-pass reflectivity of the interface k is rkObtaining formula (a) and formula (b) according to the energy balance principle:
Gk+Fk′＝Gk′+Fk (a)
Gk′＝(1-rk)Gk+rkFk′ (b)
the equivalent transmittance alpha of the k-th interface can be obtained according to the deformation of (a) and (b)kAnd equivalent forward reflectivity betakAs shown in equations (c) and (d):
Figure BDA0003773173460000033
Figure BDA0003773173460000034
wherein, betak' is the reciprocal of the equivalent retroreflectivity, multiplying the transmittance from the interface k to the k +1 layer by the transmittance from the k +1 to the k layer, i.e.
Figure BDA0003773173460000041
And
Figure BDA0003773173460000042
multiplying and then deforming to obtain the reciprocal beta of the equivalent backward reflectivityk', as shown in formula (e):
Figure BDA0003773173460000043
when the equivalent forward reflectivity beta of the last layerk+1When known, the equivalent transmittance α of each interface can be obtainedkIf the inside of the translucent system is a large space and there is no reflected light beta5=0, the total transmittance of the resulting multilayer translucent system is shown in equation (6):
Figure BDA0003773173460000044
the phenomenon of absorption in the material from the k layer to the k +1 layer occurs in two processes: i) Energy directed from the k layer interface to the k +1 layer interface; ii) energy reflected from the k +1 layer interface towards the k layer interface;
Figure BDA0003773173460000045
absorbed energy Q for materials between k and k +1 interfacesk→k+1As shown in the formula (g),
Figure BDA0003773173460000046
the total absorption of the multilayer translucent system is shown in equation (7):
Figure BDA0003773173460000047
wherein, tauλ，θIs the total transmittance of the multilayer semitransparent system, N is the number of interface layers in the multilayer semitransparent system, M is the number of material layers in the multilayer semitransparent system, and M is 1 less than N, alphanThe equivalent transmittance of the Nth layer interface; in equation (7) above, the subscript 3 part represents the total energy across the k-th layer interface, the subscript 1 part represents the energy absorbed by the i-process,the subscript 2 section indicates the energy absorbed by the ii process.
Further, a solar radiation incident angle is obtained, wherein the solar radiation incident angle is determined by a solar altitude angle, a wall surface solar azimuth angle and a wall surface inclination angle, the solar altitude angle has three factors, the hour angle h represents the change of the day time, the declination delta represents the change of the date, and the geographical latitude phi represents the change of different geographical positions;
calculating the declination δ according to equation (8):
Figure BDA0003773173460000051
wherein t represents the number of dates in the year for the calculation day;
the hour angle h is calculated according to equation (9):
Figure BDA0003773173460000052
where Lo denotes the longitude of the local meridian LomLongitude representing the median meridian of the time zone, and e representing the time difference;
calculating the solar altitude according to the formula (10)
Figure BDA0003773173460000053
Figure BDA0003773173460000054
Since the wall solar azimuth is determined by the solar azimuth and the wall azimuth, the solar azimuth is calculated according to the formula (11):
Figure BDA0003773173460000055
the wall surface sun azimuth is the difference value of the sun azimuth and the wall surface azimuth;
the solar radiation incidence angle is calculated according to equation (12):
Figure BDA0003773173460000056
wherein i is the incident angle of solar radiation,
Figure BDA0003773173460000057
the sun elevation is, epsilon is the wall sun azimuth, upsilon is the wall inclination angle, and upsilon =90 ° for the vertical wall.
Further, calculating the single-time reflectivity of the interface according to the incident angle i of solar radiation and the refractive index n of the material and according to Snell's law (n)1sini1＝n2sini2) Calculating to obtain a refraction angle, and calculating to obtain the single reflectivity r of the interface according to a formula (13)kR is tokSubstituting the formula (c) to obtain the interface equivalent transmittance alphak：
Figure BDA0003773173460000058
Further, according to the calculated interface equivalent transmittance alphakThe transmittance of the multilayer semitransparent system can be obtained after the formula (6) is substituted, and the solar radiation transmittance tau under different incidence angles under the multilayer semitransparent system can be obtainedθAnd absorptivity xi of solar radiationθAs shown in equations (14) and (15), respectively,
Figure BDA0003773173460000061
Figure BDA0003773173460000062
wherein, EλIs the intensity of solar radiation at wavelength lambda.
The method for simulating the optical performance of the multilayer semitransparent system based on different spectrums has the advantages that: firstly, establishing a model according to the spectral optical properties (transmittance and reflectivity) of materials of each layer, calculating the spectral extinction coefficient and the spectral refractive index of a single-layer material reversely, simulating the optical properties of a semitransparent system under a multilayer structure by combining an optical model of the semitransparent system and a hourly solar altitude, and finally calculating the solar radiation transmittance of the semitransparent system with the multilayer structure by combining the solar radiation spectral distribution; conditions are provided for researching the optical performance and the heat transfer performance calculation and analysis of the semitransparent door and window, and accurate reference can be conveniently provided for building load calculation and air conditioning unit model selection work.
Drawings
FIG. 1 is a schematic view of an optical model of a single layer material according to the present invention;
FIG. 2 is a schematic view of an optical model of the k interface and the k +1 interface;
FIG. 3 is a schematic diagram of the relationship between reflection angle and refraction angle for different materials;
FIG. 4 is a schematic representation of the spectral transmittance and solar radiation transmittance of aerogel glass;
FIG. 5 is a schematic diagram of indoor solar radiation of aerogel glass obtained by different model simulations.
Detailed Description
In order to make the objects, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the drawings of the embodiments of the present invention. It is to be understood that the embodiments described are only a few embodiments of the present invention, and not all embodiments. All other embodiments, which can be derived by a person skilled in the art from the described embodiments of the invention, are within the scope of the invention.
At present, glass windows are various in structure, spectral optical performance difference of materials of each layer is large, large errors are easily caused by a traditional method for simulating solar radiation transmittance and absorptivity of semitransparent doors and windows, building load calculation and air conditioner unit selection are further influenced, and therefore a simulation method for fully considering the material performance difference of each layer is urgently needed. The present application is based on the following considerations:
the optical performance simulation method of the multilayer semitransparent system based on different spectrums comprises the following steps:
step 1: acquiring experimental data, and measuring the transmittance tau and the reflectance sigma of a single-layer material by using a spectrophotometer;
step 2: establishing an optical model of the single-layer material by using a ray tracing method, and calculating the single reflectivity r and the single absorptivity a of the single-layer material;
and 3, step 3: calculating the spectral extinction coefficient and the spectral refractive index of the single-layer material according to the single reflectivity and the single absorptivity of the single-layer material calculated in the step 2;
and 4, step 4: and establishing an optical model of the multilayer semitransparent system, and calculating the total transmittance and the total absorption rate of the multilayer semitransparent system.
In the step 2, the formula of the transmittance tau and the reflectivity sigma of the single-layer material obtained according to the mathematical induction method is shown as the formula (1) and the formula (2):
Figure BDA0003773173460000071
Figure BDA0003773173460000072
the optical model of the single-layer material is schematically shown in fig. 1, wherein r is the desired single-reflection rate of the single-layer material, a is the desired single-absorption rate of the single-layer material, the transmittance τ and the reflectance σ of the single-layer material in step 1 are substituted, and the single-reflection rate r and the single-absorption rate a of the single-layer material can be obtained by combining the definitions of the interface single-reflection rate and the interface single-absorption rate (0 < r < 1,0 < a < 1).
Calculating a spectral extinction coefficient and a spectral refraction coefficient, obtaining a single-layer reflectivity r and a single-time absorptivity a according to the step 2, and meanwhile, obtaining the single-layer reflectivity r and the single-time absorptivity a according to the Bouger law dI = I multiplied by kλThe equation for the single absorption of a single layer material integrated by xdl is shown in equation (3):
Figure BDA0003773173460000073
wherein tau is the single transmittance of the single-layer material, theta is the light incidence angle, and d is the thickness of the single-layer material and the unit is mm; k is a radical ofλIs the extinction coefficient of a single-layer material at the wavelength of lambda and has the unit of mm-1(ii) a When the incident light is vertically incident, the incident angle is 0 °, and the spectral extinction coefficient of the single-layer material at the wavelength λ is obtained as shown in (4):
Figure BDA0003773173460000081
according to Snell's law, when the incident angle is 0 degrees, the spectral refractive index of the single-layer material is shown as formula (5):
Figure BDA0003773173460000082
wherein n is1Is the refractive index of air; n is2λIs the spectral refractive index of a single layer of material at a wavelength λ.
Establishing an optical model of a multilayer semitransparent system, wherein the multilayer semitransparent system at least comprises an incident interface k and an adjacent section k +1; as shown in FIG. 2, assume that energy G is radiated from the k-side of the interfacekA portion of the radiant energy is reflected by the interface k, and the remainder of the radiant energy passes through the interface k; radiating energy F from the other side of the interface kk′Wherein a portion of the radiation is reflected by the interface k and the remainder of the radiant energy passes through the interface k; then G iskOf radiant energy and F passing through the interface kk′Wherein the radiant energy reflected by the interface k jointly constitutes Gk′；GkOf radiant energy F reflected by the interface kk′In which the radiant energy passing through the interface k jointly constitutes Fk；
If the single pass reflectivity of the interface k is rkObtaining formula (a) and formula (b) according to the energy balance principle:
Gk+Fk′＝Gk′+Fk (a)
Gk′＝(1-rk)Gk+rkFk′ (b)
the equivalent transmittance alpha of the k-th interface can be obtained by the modifications of (a) and (b)kAnd equivalent forward reflectivity betakAs shown in equations (c) and (d):
Figure BDA0003773173460000083
Figure BDA0003773173460000091
wherein, betak' is the reciprocal of the equivalent retroreflectance, multiplying the transmittance from the interface k to the k +1 layer by the transmittance from the k +1 to the k layer, i.e.
Figure BDA0003773173460000092
And
Figure BDA0003773173460000093
multiplying and then deforming to obtain the reciprocal beta of the equivalent backward reflectivityk', as shown in formula (e):
Figure BDA0003773173460000094
when the equivalent forward reflectivity of the last layer is betak+1When known, the equivalent transmittance α of each interface can be obtainedkBeta in the case of a translucent system having a large internal space and no reflected light5=0, the total transmittance of the resulting multilayer translucent system is shown in equation (6):
Figure BDA0003773173460000095
the phenomenon of absorption in the material from the k layer to the k +1 layer occurs in two processes: i) Energy directed from the k layer interface to the k +1 layer interface; ii) energy reflected from the k +1 layer interface towards the k layer interface;
Figure BDA0003773173460000096
absorbed energy Q for materials between k and k +1 interfacesk→k+1As shown in the formula (g),
Figure BDA0003773173460000097
the total absorption of the multilayer translucent system is shown in equation (7):
Figure BDA0003773173460000098
wherein, tauλ，θIs the total transmittance of the multilayer semitransparent system, N is the number of interface layers in the multilayer semitransparent system, M is the number of material layers in the multilayer semitransparent system, and M is 1 less than N, alphanThe equivalent transmittance of the Nth layer interface; in equation (7) above, the subscript 3 part represents the total energy passing through the k-th layer interface, the subscript 1 part represents the energy absorbed by the i process, and the subscript 2 part represents the energy absorbed by the ii process.
Calculating a solar radiation incident angle, wherein the solar radiation incident angle is determined by a solar altitude angle, a wall surface solar azimuth angle and a wall surface inclination angle, the solar altitude angle has three factors, the hour angle h represents the change of the day time, the declination delta represents the change of the date and the geographical latitude phi represents the change of different geographical positions;
calculating the declination δ according to equation (8):
Figure BDA0003773173460000101
wherein t represents the number of dates in the year for the calculation day;
the hour angle h is calculated according to equation (9):
Figure BDA0003773173460000102
where Lo denotes the longitude of the local meridian LomLongitude representing the median meridian of the time zone, and e representing the time difference;
calculating the solar altitude according to the formula (10)
Figure BDA0003773173460000103
Figure BDA0003773173460000104
Since the wall solar azimuth is determined by the solar azimuth and the wall azimuth, the solar azimuth is calculated according to the formula (11):
Figure BDA0003773173460000105
the wall surface sun azimuth is the difference between the sun azimuth and the wall surface azimuth;
the solar radiation incident angle is calculated according to equation (12):
Figure BDA0003773173460000106
wherein i is the incident angle of solar radiation,
Figure BDA0003773173460000107
the sun elevation is, epsilon is the wall sun azimuth, upsilon is the wall inclination angle, and upsilon =90 ° for the vertical wall.
Calculating the single reflectivity of the interface according to the incident angle i of the solar radiation and the refractive index n of the material, wherein the relation between the reflection angle and the refraction angle between different media can be referred to as shown in figure 3 according to Snell's law (n)1sini1＝n2sini2) Calculating to obtain a refraction angle, and calculating to obtain the single reflectivity r of the interface according to a formula (13)kR is tokSubstitution formula(c) Obtaining the interface equivalent transmittance alphak：
Figure BDA0003773173460000111
According to the calculated interface equivalent transmittance alphakThe transmittance of the multilayer semitransparent system can be obtained after the formula (6) is substituted, and the solar radiation transmittance tau under different incidence angles under the multilayer semitransparent system can be obtainedθAnd absorptivity of solar radiation xiθAs shown in equations (14) and (15), respectively,
Figure BDA0003773173460000112
Figure BDA0003773173460000113
wherein, EλIs the intensity of solar radiation at wavelength lambda.
In order to verify the reliability of the method, experiments are carried out by taking aerogel glass (4 mm glass, 8mm aerogel and 4mm glass) as an example, and the difference between the chemical properties of the glass and the aerogel material is large, so that the optical performance is poor, the difference between visible light and near infrared rays is particularly obvious, and the difference between the radiation transmittance is 20%, so that the correctness of the method can be better reflected.
Verifying the result under laboratory conditions, and comparing the result with a test result of a spectrophotometer, wherein the radiation incidence angle of the part is 0 degree, namely the part is vertically incident;
calculating the transmittance of the aerogel glass under different wavelengths by adopting the method in the patent, and then integrating to obtain the solar radiation transmittance of the aerogel glass;
meanwhile, the solar radiation transmittance of the aerogel glass is directly calculated by using the solar radiation characteristics of different layer materials by adopting a traditional method (without considering the wavelength influence).
The calculation result is shown in fig. 4, and it can be seen that the calculation result of the conventional calculation model is high, mainly because the conventional calculation model does not consider the performance difference between different layers of materials, which results in a large difference between the calculation result and the actual situation; therefore, if the translucent maintenance structure with large difference of material performance of each layer is simulated by using the conventional method, a large error will be caused.
Finally, verifying by using real working conditions, selecting the dust removal building roof of the university of Hunan at the Yuenu area of the Changsha city in Hunan province, 8-month and 4-day, performing experiments by using the traditional calculation model and the simulation method of the invention to simulate the indoor total solar radiation condition and considering the optical performance difference caused by different solar radiation incidence angles, wherein the simulation result is shown in FIG. 5, and it can be seen that the spectrum model simulation result and the experiment result have high goodness of fit, the Nash coefficient of the two is 0.989, and the root mean square error is 11.14W/m < 2 >. The error between the simulation result and the experimental result of the traditional model is large, the Nash coefficient between the simulation result and the experimental result is 0.763, and the root mean square error is 51.23W/m < 2 >.
In conclusion, the optical performance simulation method of the multilayer semitransparent system based on different spectrums is suitable for simulating the optical performance of the semitransparent system with different material performances of each layer;
the solar radiation transmittance and the solar radiation absorptivity of the semitransparent system are calculated by combining the solar radiation incidence angle and the solar radiation spectral distribution, conditions are provided for researching the calculation and analysis of the optical performance and the heat transfer performance of the semitransparent door and window, and accurate reference can be conveniently provided for the building load calculation and the model selection work of the air conditioning unit.
In the present invention, unless otherwise explicitly specified or limited, for example, it may be fixedly attached, detachably attached, or integrated; can be mechanically or electrically connected; the terms may be directly connected or indirectly connected through an intermediate agent, and may be used for communicating the inside of two elements or interacting relation of two elements, unless otherwise specifically defined, and the specific meaning of the terms in the present invention can be understood by those skilled in the art according to specific situations.
While the foregoing is directed to the preferred embodiment of the present invention, it will be appreciated by those skilled in the art that various changes and modifications may be made therein without departing from the principles of the invention as set forth in the appended claims.

Claims (7)

1. The optical performance simulation method of the multilayer semitransparent system based on different spectrums is characterized by comprising the following steps of:
step 1: acquiring experimental data, and measuring the transmittance tau and the reflectivity sigma of a single-layer material by using a spectrophotometer;
and 2, step: establishing an optical model of the single-layer material by using a ray tracing method, and calculating the single reflectivity r and the single absorptivity a of the single-layer material;
and step 3: calculating the spectral extinction coefficient and the spectral refractive index of the single-layer material according to the single reflectivity and the single absorptivity of the single-layer material calculated in the step 2;
and 4, step 4: and establishing an optical model of the multilayer semitransparent system, and calculating the total transmittance and the total absorption rate of the multilayer semitransparent system.
2. The method for simulating the optical performance of the multilayer semitransparent system based on different optical spectrums according to claim 1, wherein in the step 2, the formula of the transmittance τ and the reflectance σ of the single-layer material obtained according to the mathematical induction method is shown as the following formula (1) and formula (2):
Figure FDA0003773173450000011
Figure FDA0003773173450000012
and (2) obtaining the single reflectivity r and the single absorptivity a of the single-layer material by substituting the transmittance tau and the reflectance sigma of the single-layer material in the step (1) into the single reflectivity r and the single absorptivity a of the single-layer material, wherein r is the required single reflectivity of the single-layer material, and a is the required single absorptivity of the single-layer material.
3. Method for simulating the optical properties of a multilayer translucent system based on different spectra according to claim 2, characterized in that: according to the single reflectivity r and the single absorptivity a of the single-layer material obtained in the step 2, and according to the Bouger law dI = I multiplied by kλThe equation for the single absorption rate of a single layer material by the integral of x dL is shown in equation (3):
Figure FDA0003773173450000013
wherein tau is the single transmittance of the single-layer material, theta is the light incidence angle, and d is the thickness of the single-layer material and the unit is mm; k is a radical of formulaλIs the extinction coefficient of a single-layer material at the wavelength of lambda and has the unit of mm-1(ii) a When the incident light is vertical incidence, the incidence angle is 0 °, and then the spectral extinction coefficient of the single-layer material at the wavelength of λ is obtained as shown in formula (4):
Figure FDA0003773173450000021
according to Snell's law, when the incident angle is 0 degrees, the spectral refractive index of a single-layer material is shown as formula (5):
Figure FDA0003773173450000022
wherein n is1Is the refractive index of air; n is a radical of an alkyl radical2λIs the spectral refractive index of a single layer of material at a wavelength lambda.
4. A method for simulating the optical properties of a multilayer translucent system according to claim 3, characterized in that: the multilayer translucent system comprises at least an incident interface k and an adjacent interface k +1; suppose energy G is radiated from the k side of the interfacekA portion of the radiant energy is inverted by the interface kProjecting the residual radiant energy through an interface k; radiating energy F from the other side of the interface kk′Wherein a portion of the radiation is reflected by the interface k, and the remainder of the radiation energy passes through the interface k; then G iskOf radiant energy and F passing through the interface kk′Wherein the radiant energy reflected by the interface k jointly constitutes Gk′；GkOf radiant energy reflected by the interface k and Fk′In which the radiant energy passing through the interface k jointly constitutes Fk；
If the single-pass reflectivity of the interface k is rkObtaining formula (a) and formula (b) according to the energy balance principle:
Gk+Fk′＝Gk′+Fk (a)
Gk′＝(1-rk)Gk+rkFk′ (b)
the equivalent transmittance alpha of the k-th interface can be obtained according to the deformation of (a) and (b)kAnd equivalent forward reflectivity betakAs shown in equations (c) and (d):
Figure FDA0003773173450000023
Figure FDA0003773173450000024
wherein, betak' is the reciprocal of the equivalent retroreflectivity, multiplying the transmittance from the interface k to the k +1 layer by the transmittance from the k +1 to the k layer, i.e.
Figure FDA0003773173450000031
And with
Figure FDA0003773173450000032
Multiplying and then deforming to obtain the reciprocal beta of the equivalent backward reflectivityk', as shown in equation (e):
Figure FDA0003773173450000033
when the equivalent forward reflectivity beta of the last layerk+1When it is known, the equivalent transmittance α of each interface can be obtainedkBeta in the case of a translucent system having a large internal space and no reflected light5=0, and the total transmittance of the resulting multilayer translucent system is shown in equation (6):
Figure FDA0003773173450000034
the total absorption of the multilayer translucent system is shown in equation (7):
Figure FDA0003773173450000035
wherein, tauλ，θIs the total transmittance of the multilayer semitransparent system, N is the number of interface layers in the multilayer semitransparent system, M is the number of material layers in the multilayer semitransparent system, and M is 1 less than N, alphanThe equivalent transmittance of the Nth layer interface; the phenomenon of absorption in the material from the k layer to the k +1 layer occurs in two processes: i) Energy directed from the k layer interface to the k +1 layer interface; ii) energy reflected from the k +1 layer interface towards the k layer interface; in equation (7) above, the subscript 3 part represents the total energy passing through the k-th layer interface, the subscript 1 part represents the energy absorbed by the i process, and the subscript 2 part represents the energy absorbed by the ii process.
5. Method for simulating the optical properties of a multilayer translucent system based on different spectra according to claim 4, characterized in that:
calculating the declination δ according to equation (8):
Figure FDA0003773173450000036
wherein t represents the number of dates in the year for the calculation day;
the time angle h is calculated according to equation (9):
Figure FDA0003773173450000037
where Lo denotes the longitude of the local meridian LomLongitude representing the median meridian of the time zone, and e representing the time difference;
calculating the solar altitude according to the formula (10)
Figure FDA0003773173450000041
Figure FDA0003773173450000042
The solar azimuth is calculated according to equation (11):
Figure FDA0003773173450000043
the solar radiation incidence angle is calculated according to equation (12):
Figure FDA0003773173450000044
wherein i is the incident angle of solar radiation,
Figure FDA0003773173450000045
is the solar elevation, epsilon is the wall solar azimuth, upsilon is the wall inclination angle, and upsilon =90 ° for the vertical wall.
6. Method of simulating the optical properties of a multilayer translucent system based on different spectra according to claim 5, characterized in that: according to the incident angle i of the solar radiation and the refractive index n of the material, according to Snell's law (n)1sini1＝n2sini2) Calculating to obtain a refraction angle, and calculating to obtain the interface single reflectivity r according to a formula (13)kR is tokSubstituting the formula (c) to obtain the interface equivalent transmittance alphak：
Figure FDA0003773173450000046
7. Method for simulating the optical properties of a multilayer translucent system based on different spectra according to claim 6, characterized in that: according to the calculated interface equivalent transmittance alphakThe transmittance of the multilayer semitransparent system can be obtained after the formula (6) is substituted, and the solar radiation transmittance tau under different incidence angles under the multilayer semitransparent system can be obtainedθAnd absorptivity xi of solar radiationθAs shown in equations (14) and (15), respectively,
Figure FDA0003773173450000047
Figure FDA0003773173450000051
wherein E isλIs the intensity of solar radiation at a wavelength λ.
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN117633408A (en) * 2024-01-08 2024-03-01 华南理工大学 Photo-thermal physical property calculation method for large public building photoelectric enclosure structure

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