CN115240755A - BIT high temperature test cabinet - Google Patents
BIT high temperature test cabinet Download PDFInfo
- Publication number
- CN115240755A CN115240755A CN202210820672.1A CN202210820672A CN115240755A CN 115240755 A CN115240755 A CN 115240755A CN 202210820672 A CN202210820672 A CN 202210820672A CN 115240755 A CN115240755 A CN 115240755A
- Authority
- CN
- China
- Prior art keywords
- ssd
- cabinet
- ssd test
- bottom plate
- mainboard
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 238000012360 testing method Methods 0.000 title claims abstract description 111
- 238000009434 installation Methods 0.000 claims abstract description 17
- 238000012423 maintenance Methods 0.000 abstract description 5
- 230000002349 favourable effect Effects 0.000 abstract description 4
- 150000001875 compounds Chemical class 0.000 abstract 1
- 230000002035 prolonged effect Effects 0.000 description 6
- 238000013016 damping Methods 0.000 description 3
- 230000017525 heat dissipation Effects 0.000 description 3
- 238000009825 accumulation Methods 0.000 description 2
- 230000009286 beneficial effect Effects 0.000 description 2
- 230000007547 defect Effects 0.000 description 2
- 239000000463 material Substances 0.000 description 2
- 241000272165 Charadriidae Species 0.000 description 1
- 230000004075 alteration Effects 0.000 description 1
- 239000003153 chemical reaction reagent Substances 0.000 description 1
- 238000002474 experimental method Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 239000007787 solid Substances 0.000 description 1
- 238000006467 substitution reaction Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
- G11C29/56—External testing equipment for static stores, e.g. automatic test equipment [ATE]; Interfaces therefor
-
- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K7/00—Constructional details common to different types of electric apparatus
- H05K7/14—Mounting supporting structure in casing or on frame or rack
- H05K7/1401—Mounting supporting structure in casing or on frame or rack comprising clamping or extracting means
- H05K7/1402—Mounting supporting structure in casing or on frame or rack comprising clamping or extracting means for securing or extracting printed circuit boards
- H05K7/1405—Mounting supporting structure in casing or on frame or rack comprising clamping or extracting means for securing or extracting printed circuit boards by clips or resilient members, e.g. hooks
Landscapes
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
Abstract
The invention discloses a BIT high-temperature test cabinet, which comprises a cabinet body, wherein a bottom plate for mounting an SSD test mainboard is arranged in the cabinet body, a cushion seat is arranged at the top of the bottom plate corresponding to an SSD test mainboard mounting hole, a rubber column is connected and arranged at the center of the top of the cushion seat, the rubber column penetrates through the SSD test mainboard mounting hole and is connected and provided with a limiting sleeve, the upper end surface of the limiting sleeve is smaller than the mounting aperture of the SSD test mainboard, the lower end surface of the limiting sleeve is larger than the mounting aperture of the SSD test mainboard, the limiting sleeve is in a circular truncated cone shape, and a shape variable hole is formed in the inner wall of the limiting sleeve; pressing down the stop collar and making it take place deformation and pierce through in the mounting hole of SSD test mainboard, loosening the stop collar and make its self compound principle avoid SSD test mainboard to deviate from along the rubber column with the mounting hole, SSD test mainboard is stable firm in the installation on the bottom plate, otherwise can lift SSD test mainboard to the bottom plate off, the dismouting is convenient between SSD test mainboard and the bottom plate and need not with the help of the instrument, is favorable to later maintenance.
Description
Technical Field
The invention relates to the technical field of test cabinets, in particular to a BIT high-temperature test cabinet.
Background
The solid state disk needs to simulate a normal-temperature environment before a manufacturer leaves a factory, stable DC5V voltage is provided for reading and writing tests on the SSD, the SSD is tested through the high-temperature environment and the stable voltage, and products with defects and instability are screened out, so that the performance and parameters of products leaving the factory meet the industrial use requirements;
at present, the mainboard for the SSD test is generally fixed inside the test cabinet by bolts, the test cabinet needs a large amount of SSD test mainboards, the disassembly and the assembly of the SSD test mainboards are tedious and time-consuming, and the later maintenance or the replacement is not facilitated, so that a BIT high-temperature test cabinet is provided.
Disclosure of Invention
In order to overcome the defects of the prior art, the invention provides the BIT high-temperature test cabinet, the limiting sleeve is pressed to deform and penetrate through the mounting hole of the SSD test main board, the limiting sleeve is loosened to avoid the SSD test main board from being separated from the mounting hole along the rubber column in a self-resetting principle, the SSD test main board is stably and firmly mounted on the bottom plate, otherwise, the SSD test main board can be dismounted from the bottom plate, the SSD test main board and the bottom plate are convenient to dismount without the help of tools, and later maintenance is facilitated.
In order to solve the technical problems, the invention provides the following technical scheme: the utility model provides a BIT high temperature test cabinet, includes the cabinet body, the inside of the cabinet body is provided with the bottom plate that is used for installing SSD test mainboard, the top of bottom plate is provided with the pad seat corresponding to the position of SSD test mainboard mounting hole, the top center connection of pad seat is provided with the rubber post, the rubber post pierces through and is provided with the stop collar in the mounting hole connection of SSD test mainboard, the up end of stop collar is less than the installation aperture of SSD test mainboard, and just the terminal surface is greater than the installation aperture of SSD test mainboard down, the appearance of stop collar is the round platform form, tangible variable hole is seted up to the inner wall inside of stop collar.
Preferably, the bottom below of bottom plate is provided with puts the thing board, the top of putting the thing board is provided with the power that is used for SSD test mainboard power supply, the both sides bottom of bottom plate and put and be connected between the thing board and be provided with the support frame, the support frame is built on stilts bottom plate support and is avoided oppressing the power.
Preferably, the calibration voltage of the power supply is 12V, and the voltage of the power supply is reduced to 5V to directly supply power to the SSD test motherboard.
Preferably, the internal installation of the cabinet body is provided with a mounting rack, the mounting rack is connected with a slide rail, and the bottom of the object placing plate is connected with the slide rail in a sliding manner.
Preferably, the SSD test mainboard is clamped between the top of the pad seat and the bottom of the limiting sleeve, the tangent plane of the pad seat is in an I-shaped outline, and the edge of the limiting sleeve is an arc surface.
Preferably, the top of bottom plate is located the both sides of SSD test mainboard and is provided with the guard plate, the side of guard plate has seted up the through-hole towards SSD test mainboard, the inside of through-hole is provided with the fan, circuit connection between fan and the power.
Preferably, the outside of the both sides of the cabinet body all is connected and is provided with the fan, the inside intercommunication each other of fan and the cabinet body, the air intake cover of fan is provided with the filter screen.
Preferably, cabinet doors are arranged at the front end and the rear end of the cabinet body, and transparent observation windows are arranged in the middle of the cabinet doors in a hollow-out embedded mode.
Preferably, a touch screen display is arranged at the top of the front end of the cabinet body, and a USB interface and a VGA video screen switcher remote control receiver are arranged on the equipment operation surface of the cabinet body.
Preferably, the bottom of the cabinet body is provided with universal wheels in a connecting manner.
Compared with the prior art, the invention can achieve the following beneficial effects:
the gasket is used for supporting the SSD test main board and the bottom board to be separated by a certain distance, so that air can circulate around the SSD test main board, heat accumulation caused by long-time use can be avoided by facilitating heat dissipation, the service life of the SSD test main board is prolonged, the rubber column matching gasket is favorable for damping the SSD test main board on the bottom board, a rubber column can absorb shaking force generated by vibration of the SSD test main board due to certain deformation of the rubber column, the service life of the SSD test main board is prolonged, the limit sleeve clamps and fixes the SSD test main board through the rubber column matching gasket, the limit sleeve is pressed to deform towards the deformation hole inside the limit sleeve, so that the limit sleeve deforms outside the limit sleeve, the lower end face of the limit sleeve is smaller than the installation aperture of the SSD test main board under deformation, the limit sleeve can penetrate through the installation aperture of the SSD test main board, the lower end face of the limit sleeve is larger than the installation aperture of the SSD test main board according to a principle after being loosened, the limit sleeve is prevented from being separated from the installation aperture along the rubber column, the SSD test main board is stably and firmly installed on the bottom board, otherwise, the SSD test main board can be conveniently dismounted to the bottom board without the help of tools, and later maintenance.
Drawings
Fig. 1 is a front view of the present invention.
Fig. 2 is a rear view of the present invention.
Fig. 3 is a side view of the present invention.
Fig. 4 is a schematic view of a mount of the present invention.
Fig. 5 is a schematic view of the base plate of the present invention.
Fig. 6 is a schematic view of a guard plate of the present invention.
Wherein: 1. a cabinet body; 2. a touch screen display; 3. a cabinet door; 4. a universal wheel; 5. a mounting frame; 6. a fan; 7. a slide rail; 8. a base plate; 9. a power source; 10. a placement plate; 11. a support frame; 12. a cushion seat; 13. a rubber column; 14. a protection plate; 15. a limiting sleeve; 16. a deformation hole; 17. a fan; 18. and a through hole.
Detailed Description
The present invention will be further described with reference to specific examples, but the following examples are only preferred embodiments of the present invention, and not all embodiments of the present invention are intended to be included in the scope of the present invention. Other embodiments obtained by persons skilled in the art without making creative efforts based on the embodiments in the implementation belong to the protection scope of the invention. The experimental procedures in the following examples were carried out in a conventional manner unless otherwise specified, and materials, reagents and the like used in the following examples were commercially available unless otherwise specified.
Examples
Referring to fig. 2, 4 and 5, the invention provides a bt high temperature test cabinet, which comprises a cabinet body 1, a bottom plate 8 for mounting an SSD test mainboard is arranged inside the cabinet body 1, a pad 12 is arranged at a position of the top of the bottom plate 8 corresponding to an SSD test mainboard mounting hole, a rubber column 13 is connected to the top center of the pad 12, the rubber column 13 penetrates through the SSD test mainboard mounting hole and is connected to a position limiting sleeve 15, the upper end surface of the position limiting sleeve 15 is smaller than the SSD test mainboard mounting hole, the lower end surface is larger than the SSD test mainboard mounting hole, the position limiting sleeve 15 is in a circular truncated cone shape, a shape changing hole 16 is arranged inside the inner wall of the position limiting sleeve 15, the SSD test mainboard is clamped between the top of the pad 12 and the bottom of the position limiting sleeve 15, the pad 12 has an I-shaped profile, edges of the position limiting sleeve 15 are arc surfaces, the pad 12 spans a certain distance between the SSD test mainboard and the bottom plate 8, the air circulation around the SSD test mainboard is facilitated, the heat dissipation is facilitated, the accumulated heat caused by long-time use is avoided, the service life of the SSD test mainboard is prolonged, the rubber column 13 and the pad 12 are favorable for damping the SSD test mainboard on the bottom plate 8, the rubber column 13 has a certain deformation amount due to the material of the rubber column to absorb the shaking force generated by the SSD test mainboard due to vibration, the service life of the SSD test mainboard is prolonged, the SSD test mainboard is clamped and fixed by the limiting sleeve 15 through the rubber column 13 and the pad 12, the limiting sleeve 15 is pressed to deform the inner part of the limiting sleeve to the deformation hole 16 so as to deform along with the outer part of the limiting sleeve, the lower end face of the limiting sleeve 15 is smaller than the mounting aperture of the SSD test mainboard under the deformation, the limiting sleeve 15 can penetrate through the mounting hole of the SSD test mainboard, the limiting sleeve 15 is loosened to restore the limiting sleeve, and the lower end face of the limiting sleeve 15 is larger than the mounting aperture of the SSD test mainboard, stop collar 15 avoids SSD test mainboard to deviate from along rubber column 13 with the mounting hole, and the installation of SSD test mainboard is stable firm on bottom plate 8, otherwise can lift SSD test mainboard off to bottom plate 8, and the dismouting is convenient and need not with the help of the instrument between SSD test mainboard and the bottom plate 8, is favorable to later maintenance.
As shown in fig. 2 and 4, the invention discloses that an object placing plate 10 is arranged below the bottom of a bottom plate 8, a power supply 9 for supplying power to an SSD test main board is arranged at the top of the object placing plate 10, a support frame 11 is connected between the bottoms of two sides of the bottom plate 8 and the object placing plate 10, the support frame 11 supports the bottom plate 8 to avoid pressing the bottom plate 8 to the power supply 9, the calibration voltage of the power supply 9 is 12V, the voltage of the power supply 9 is reduced to 5V to directly supply power to the SSD test main board, an installation frame 5 is arranged inside a cabinet body 1, a slide rail 7 is connected to the installation frame 5, and the bottom of the object placing plate 10 is slidably connected to the slide rail 7.
As shown in fig. 3, 5 and 6, the invention discloses that the top of the bottom plate 8 is provided with protection plates 14 at two sides of the SSD test main board, the side surfaces of the protection plates 14 facing the SSD test main board are provided with through holes 18, fans 17 are arranged inside the through holes 18, the fans 17 are in circuit connection with the power supply 9, the fans 6 are connected and arranged at the outer parts of two sides of the cabinet body 1, the fans 6 are mutually communicated with the inner part of the cabinet body 1, and air inlets of the fans 6 are covered with filter screens.
As shown in fig. 1 and 2, the invention discloses that the front end and the rear end of a cabinet body 1 are both provided with cabinet doors 3, the middle parts of the cabinet doors 3 are both provided with transparent observation windows in a hollowed-out embedded manner, the top of the front end of the cabinet body 1 is provided with a touch screen display 2, the equipment operation surface of the cabinet body 1 is provided with a USB interface and a VGA video screen switcher remote control receiver, and the bottom of the cabinet body 1 is connected with universal wheels 4.
According to the BIT high-temperature test cabinet provided by the invention, the pad 12 is used for spacing a certain distance between the SSD test main board and the bottom board 8, so that air can conveniently circulate around the SSD test main board, heat dissipation is facilitated, heat accumulation caused by long-time use is avoided, the service life of the SSD test main board is prolonged, the rubber column 13 is matched with the pad 12 to be beneficial to damping the SSD test main board on the bottom board 8, the rubber column 13 can absorb vibration force generated by vibration of the SSD test main board due to certain deformation of the rubber column 13, the service life of the SSD test main board is prolonged, the limiting sleeve 15 is clamped and fixed on the SSD test main board through the rubber column 13 and the pad 12, the limiting sleeve 15 is pressed to deform towards the deformation hole 16 so that deformation is carried out outside, the lower end face of the limiting sleeve 15 is smaller than the installation aperture of the SSD test main board under the deformation, the limiting sleeve 15 can penetrate through the installation hole of the SSD test main board, the lower end face of the limiting sleeve 15 is larger than the installation aperture of the SSD test main board when the limiting sleeve 15 is loosened to restore, the SSD test main board is stably installed on the SSD test main board 8, otherwise, and the SSD test main board can be conveniently disassembled and the SSD 8 at a later period.
Although embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions and alterations can be made in these embodiments without departing from the principles and spirit of the invention, the scope of which is defined in the appended claims and their equivalents.
Claims (10)
1. The utility model provides a BIT high temperature test cabinet, includes the cabinet body (1), its characterized in that: the inside of the cabinet body (1) is provided with bottom plate (8) that is used for installing SSD test mainboard, the position that the top of bottom plate (8) is corresponding to SSD test mainboard mounting hole is provided with base (12), the top center connection of base (12) is provided with rubber column (13), rubber column (13) pierce through and are provided with stop collar (15) in the mounting hole connection of SSD test mainboard, the up end of stop collar (15) is less than the installation aperture of SSD test mainboard, and the lower terminal surface is greater than the installation aperture of SSD test mainboard, the appearance of stop collar (15) is the round platform form, tangible variable hole (16) are seted up to the inner wall inside of stop collar (15).
2. The BIT high temperature test cabinet of claim 1, wherein: the SSD testing device is characterized in that a storage plate (10) is arranged below the bottom of the bottom plate (8), a power supply (9) used for supplying power to the SSD testing main board is arranged at the top of the storage plate (10), supporting frames (11) are connected between the bottoms of the two sides of the bottom plate (8) and the storage plate (10), and the supporting frames (11) support the bottom plate (8) in an overhead mode to avoid pressing the power supply (9).
3. The BIT high temperature test cabinet of claim 2, wherein: the calibration voltage of the power supply (9) is 12V, and the voltage of the power supply (9) is reduced to 5V to directly supply power for the SSD test mainboard.
4. The BIT high temperature test cabinet of claim 2, wherein: the interior installation of the cabinet body (1) is provided with a mounting rack (5), the mounting rack (5) is connected with a slide rail (7), and the bottom of the object placing plate (10) is connected with the slide rail (7) in a sliding manner.
5. The BIT high temperature test cabinet of claim 1, wherein: the SSD test mainboard centre gripping is between the top of base (12) and the bottom of stop collar (15), the tangent plane appearance of base (12) is "worker" font profile, the edge of stop collar (15) is the arc surface.
6. The BIT high temperature test cabinet of claim 2, wherein: the protection plate (14) is arranged on two sides, located on the SSD test main board, of the top of the bottom plate (8), a through hole (18) is formed in the side face of the protection plate (14) towards the SSD test main board, a fan (17) is arranged inside the through hole (18), and the fan (17) is connected with a power supply (9) through a circuit.
7. The BIT high temperature test cabinet of claim 1, wherein: the outside of both sides of the cabinet body (1) all is connected and is provided with fan (6), fan (6) and the inside intercommunication each other of the cabinet body (1), the air intake cover of fan (6) is provided with the filter screen.
8. The BIT high temperature test cabinet of claim 1, wherein: the front end and the rear end of the cabinet body (1) are both provided with cabinet doors (3), and the middle parts of the cabinet doors (3) are all provided with transparent observation windows in a hollow-out embedded mode.
9. The BIT high temperature test cabinet of claim 1, wherein: the front end top of the cabinet body (1) is provided with a touch screen display (2), and the equipment operation surface of the cabinet body (1) is provided with a USB interface and a VGA video screen switcher remote control receiver.
10. The BIT high temperature test cabinet of claim 1, wherein: the bottom of the cabinet body (1) is connected with universal wheels (4).
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210820672.1A CN115240755A (en) | 2022-07-12 | 2022-07-12 | BIT high temperature test cabinet |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202210820672.1A CN115240755A (en) | 2022-07-12 | 2022-07-12 | BIT high temperature test cabinet |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN115240755A true CN115240755A (en) | 2022-10-25 |
Family
ID=83673910
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN202210820672.1A Pending CN115240755A (en) | 2022-07-12 | 2022-07-12 | BIT high temperature test cabinet |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN115240755A (en) |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007078576A (en) * | 2005-09-15 | 2007-03-29 | Nippon Eng Kk | Burn-in board and semiconductor testing device |
| JP2014105996A (en) * | 2012-11-22 | 2014-06-09 | Fujitsu Semiconductor Ltd | Semiconductor device tester and test method |
| CN208113078U (en) * | 2018-05-14 | 2018-11-16 | 东莞玉成电路板有限公司 | A kind of electronic equipment circuit board facilitating installation |
| CN208314139U (en) * | 2018-06-04 | 2019-01-01 | 深圳华德电子有限公司 | A kind of PCBA board burn-in test ageing rack |
| CN216816819U (en) * | 2021-11-28 | 2022-06-24 | 苏州博英电子科技有限公司 | High-low temperature aging cabinet for electronic products |
-
2022
- 2022-07-12 CN CN202210820672.1A patent/CN115240755A/en active Pending
Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2007078576A (en) * | 2005-09-15 | 2007-03-29 | Nippon Eng Kk | Burn-in board and semiconductor testing device |
| JP2014105996A (en) * | 2012-11-22 | 2014-06-09 | Fujitsu Semiconductor Ltd | Semiconductor device tester and test method |
| CN208113078U (en) * | 2018-05-14 | 2018-11-16 | 东莞玉成电路板有限公司 | A kind of electronic equipment circuit board facilitating installation |
| CN208314139U (en) * | 2018-06-04 | 2019-01-01 | 深圳华德电子有限公司 | A kind of PCBA board burn-in test ageing rack |
| CN216816819U (en) * | 2021-11-28 | 2022-06-24 | 苏州博英电子科技有限公司 | High-low temperature aging cabinet for electronic products |
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| PB01 | Publication | ||
| PB01 | Publication | ||
| SE01 | Entry into force of request for substantive examination | ||
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| RJ01 | Rejection of invention patent application after publication | ||
| RJ01 | Rejection of invention patent application after publication |
Application publication date: 20221025 |