CN115226144A

CN115226144A - Cell capacity determination method and device, electronic equipment and storage medium

Info

Publication number: CN115226144A
Application number: CN202210675335.8A
Authority: CN
Inventors: 陈永红
Original assignee: China Telecom Corp Ltd
Current assignee: China Telecom Corp Ltd
Priority date: 2022-06-15
Filing date: 2022-06-15
Publication date: 2022-10-21

Abstract

The application provides a cell capacity determination method, a cell capacity determination device, electronic equipment and a storage medium. The method comprises the following steps: acquiring SINR sample test data of a target service cell under a target base station; the target base station is N-flow base station equipment, and N is an even number greater than 2; determining beam distribution positions of M beams in the target service cell and an SINR distribution diagram corresponding to each beam distribution position according to the SINR sample test data; m is one half of N; determining a reference test position corresponding to each wave beam according to the SINR distribution graph; placing M2-flow test terminals at the reference test positions of the M beams for throughput rate test to obtain the throughput rates of the M beams; and determining the cell capacity of the target serving cell according to the throughput rates of the M wave beams. The method and the device can improve the accuracy of cell capacity evaluation and reduce the test cost.

Description

Cell capacity determination method and device, electronic equipment and storage medium

Technical Field

The present application relates to the field of communications technologies, and in particular, to a method and an apparatus for determining a cell capacity, an electronic device, and a storage medium.

Background

A 5G (5 th Generation Mobile Communication Technology, fifth Generation Mobile Communication Technology) network is capable of providing high-rate, ultra-low latency, mass-connected enhanced Mobile broadband services. With the rapid development of 5G networks, the size of the 5G networks and the number of users rapidly increase. As market competition has increased, mobile communication network capacity has become a key factor in determining operator competitiveness. Improving network capacity and rational utilization of network capacity are one of the important goals of network operation. The FDD-MM (32 TR) equipment is the latest 4/5G 1.8G/2.1G double-frequency equipment, is not commercially available at present, and has no mature accurate capacity evaluation method. The device is a 16-flow test terminal but has no 16-flow test terminal, and the current latest terminal is only 2T4R, so that the single terminal cannot meet the test requirement.

There are two main types of prior art network evaluation: one is single-terminal testing and the other is traffic model capacity estimation. The first approach fails to test FDD-MM32TR devices since there is currently no 16-stream termination. The second abstract model based on the service model and the traffic model is generally based on a single service model, considers that the service data reaches the actual rate requirement of a physical transmission layer after passing through each transmission protocol layer, combines the average throughput of an air interface to obtain the user capacity of the single service, and obtains the user capacity of the comprehensive service according to the traffic model distribution characteristics of the user. Such conventional capacity evaluation methods mainly have the following disadvantages:

1. a partial capacity evaluation method is used for evaluating through service types, various mobile application services develop at a high speed at present, the types and the number of the mobile application services are far higher than those of the conventional empirical model, and the actual limit capacity of actual (FDD-MM 32 TR) equipment cannot be accurately reflected by using the empirical model. The method for evaluating the capacity by using the method is not accurate enough;

2. the partial capacity evaluation method analyzes the service data, and calculates the capacity from the application layer through the overhead of each protocol layer, because the processing process of each protocol layer can only simplify the model analysis, because of more service types, more models exist, the accuracy is reduced, the analysis process is more complex, and the test cost is higher;

3. the traditional capacity evaluation method aims at fuzzy evaluation of the initial stage of network construction (small network frequency interference), the field situation is complex after the network construction is accessed, and the traditional method cannot effectively predict the network capacity.

Disclosure of Invention

The technical problem to be solved by the embodiments of the present application is to provide a cell capacity determining method, a cell capacity determining device, an electronic device, and a storage medium, so as to solve the technical problems that a network capacity evaluating method in the prior art is low in accuracy, high in test cost, and incapable of effectively predicting network capacity.

In a first aspect, an embodiment of the present application provides a method for determining a cell capacity, including:

acquiring SINR (Signal to Interference plus Noise Ratio) sample test data of a target service cell under a target base station; the target base station is N-flow base station equipment, and N is an even number greater than 2;

determining beam distribution positions of M beams in the target service cell and an SINR distribution diagram corresponding to each beam distribution position according to the SINR sample test data; m is one half of N;

determining a reference test position corresponding to each wave beam according to the SINR distribution graph;

placing M2-stream test terminals at the reference test positions of the M beams to perform throughput rate test to obtain the throughput rates of the M beams;

and determining the cell capacity of the target serving cell according to the throughput rates of the M wave beams.

Optionally, the acquiring SINR (Signal to Interference plus Noise Ratio) sample test data of the target serving cell under the target base station includes:

determining an initial coverage area of the target serving cell according to the deployment position of the target base station;

randomly adjusting the position of the 2-flow test terminal in the initial coverage area, and acquiring initial SINR test data of the 2-flow test terminal at different positions;

and screening out the SINR sample test data which belongs to the target service cell from the initial SINR test data.

Optionally, the determining, according to the SINR sample test data, beam distribution positions of M beams in the target serving cell and an SINR distribution map corresponding to each beam distribution position includes:

determining the beam distribution positions of M beams in the target service cell according to the beam identification information and the test longitude and latitude information in the SINR sample test data;

and generating an SINR distribution diagram corresponding to each beam distribution position according to the SINR information corresponding to each beam in the SINR sample test data.

Optionally, the generating, according to the SINR information corresponding to each beam in the SINR sample test data, an SINR distribution map corresponding to each beam distribution position includes:

and performing geographical graphic representation on the SINR information of each beam by adopting preset coverage simulation software to obtain an SINR distribution diagram corresponding to the distribution position of each beam.

Optionally, the determining, according to the SINR distribution map, a reference test position corresponding to each beam includes:

determining a first SINR interval, a second SINR interval and a third SINR interval corresponding to each beam according to the SINR value in the SINR sample test data; the first SINR interval is an interval in which an SINR value is greater than a first threshold, the second SINR interval is an interval in which an SINR value is less than or equal to the first threshold and greater than or equal to a second threshold, the third SINR interval is an interval in which an SINR value is less than the second threshold, and the first threshold is greater than the second threshold;

according to the SINR values in the SINR sample test data, determining a first SINR distribution map corresponding to the first SINR interval, a second SINR distribution map corresponding to the second SINR interval and a third SINR distribution map corresponding to the third SINR interval in the SINR distribution maps;

determining a first reference test position corresponding to the first SINR interval, a second reference test position corresponding to the second SINR interval and a third reference test position corresponding to the third SINR interval of each beam according to the first SINR distribution map, the second SINR distribution map and the third SINR distribution map corresponding to each beam;

the first, second and third benchmarking positions of each beam are taken as the benchmarking positions of each beam.

Optionally, the determining, according to the first SINR distribution map, the second SINR distribution map, and the third SINR distribution map corresponding to each beam, a first reference test position corresponding to the first SINR interval, a second reference test position corresponding to the second SINR interval, and a third reference test position corresponding to the third SINR interval of each beam includes:

according to the first SINR distribution map corresponding to each wave beam, calculating to obtain a first gravity center longitude and latitude of the first SINR interval of each wave beam;

calculating to obtain a second centroid longitude and latitude of a second SINR interval of each beam according to the second SINR distribution map corresponding to each beam;

calculating a third longitude latitude of the third SINR interval of each beam according to the third SINR distribution map corresponding to each beam;

performing SINR test processing on the first gravity center longitude and latitude of each beam to obtain a first reference test position corresponding to a first SINR interval of each beam;

performing SINR test processing on the second barycentric longitude and latitude of each beam to obtain a second reference test position corresponding to a second SINR interval of each beam;

and performing SINR test processing on the third longitude and latitude of the center of each beam to obtain a third reference test position corresponding to a third SINR interval of each beam.

Optionally, the placing the M2-stream test terminals at the reference test positions of the M beams for performing throughput rate test to obtain the throughput rates of the M beams includes:

respectively arranging the M2-stream test terminals at a first reference test position of a first SINR interval of each beam;

acquiring a plurality of first SINR values reported by the M2-stream test terminals;

acquiring a first throughput rate of each beam in a tested first SINR interval according to the plurality of first SINR values;

the determining the cell capacity of the target serving cell according to the throughput rates of the M beams includes:

and acquiring the sum of M first throughput rates, and determining the maximum cell capacity of the target serving cell according to the sum.

Optionally, the placing the M2-stream test terminals at the reference test positions of the M beams for throughput rate testing to obtain the throughput rates of the M beams includes:

respectively arranging the M2-stream test terminals at second reference test positions of a second SINR interval of each beam;

acquiring a plurality of second SINR values reported by the M2-stream test terminals;

acquiring a second throughput rate of each beam in a tested second SINR interval according to the plurality of second SINR values;

and acquiring the sum of the M second throughput rates, and determining the average cell capacity of the target serving cell according to the sum.

respectively arranging the M2-stream test terminals at a third reference test position of a third SINR interval of each beam;

obtaining a plurality of third SINR values reported by the M2-stream test terminals;

acquiring a third throughput rate of each beam in a tested third SINR interval according to the plurality of third SINR values;

and acquiring the sum of the M third throughput rates, and determining the edge cell capacity of the target service cell according to the sum.

In a second aspect, an embodiment of the present application provides a cell capacity determining apparatus, including:

a sample test data obtaining module, configured to obtain SINR (Signal to Interference plus Noise Ratio) sample test data of a target serving cell under a target base station; the target base station is N-flow base station equipment, and N is an even number greater than 2;

an SINR distribution map determining module, configured to determine, according to the SINR sample test data, beam distribution positions of M beams in the target serving cell and an SINR distribution map corresponding to each beam distribution position; m is one half of N;

a reference test position determining module, configured to determine a reference test position corresponding to each beam according to the SINR distribution map;

a beam throughput rate obtaining module, configured to place M2-stream test terminals at reference test positions of the M beams to perform throughput rate test, so as to obtain throughput rates of the M beams;

a cell capacity determining module, configured to determine the cell capacity of the target serving cell according to the throughput rates of the M beams.

Optionally, the sample test data acquiring module includes:

an initial coverage area determining unit, configured to determine an initial coverage area of the target serving cell according to the deployment location of the target base station;

an initial test data obtaining unit, configured to randomly adjust a position of a 2-stream test terminal in the initial coverage area, and obtain initial SINR test data of the 2-stream test terminal at different positions;

and the sample test data screening unit is used for screening the SINR sample test data which belongs to the target service cell from the initial SINR test data.

Optionally, the SINR distribution determining module includes:

a beam distribution position determining unit, configured to determine beam distribution positions of M beams in the target serving cell according to the beam identification information and the test longitude and latitude information in the SINR sample test data;

and an SINR profile generation unit, configured to generate an SINR profile corresponding to each beam distribution position according to SINR information corresponding to each beam in the SINR sample test data.

Optionally, the SINR distribution map generating unit includes:

and the SINR distribution map acquisition subunit is used for performing geographic graphic representation on the SINR information of each beam by adopting preset coverage simulation software to obtain an SINR distribution map corresponding to the distribution position of each beam.

Optionally, the benchmark location determination module includes:

an SINR interval determining unit, configured to determine, according to the SINR value in the SINR sample test data, a first SINR interval, a second SINR interval, and a third SINR interval corresponding to each beam; the first SINR interval is an interval in which an SINR value is greater than a first threshold, the second SINR interval is an interval in which an SINR value is less than or equal to the first threshold and greater than or equal to a second threshold, the third SINR interval is an interval in which an SINR value is less than the second threshold, and the first threshold is greater than the second threshold;

an SINR profile determining unit, configured to determine, according to SINR values in the SINR sample test data, a first SINR profile corresponding to the first SINR interval, a second SINR profile corresponding to the second SINR interval, and a third SINR profile corresponding to the third SINR interval in the SINR profiles;

an interval reference position determining unit, configured to determine, according to a first SINR distribution map, the second SINR distribution map, and the third SINR distribution map corresponding to each beam, a first reference test position corresponding to the first SINR interval, a second reference test position corresponding to the second SINR interval, and a third reference test position corresponding to the third SINR interval for each beam;

a reference test position acquisition unit configured to use the first reference test position, the second reference test position, and the third reference test position of each beam as a reference test position of each beam.

Optionally, the section reference position determination unit includes:

the first gravity center longitude and latitude calculation operator unit is used for calculating and obtaining first gravity center longitude and latitude of the first SINR interval of each wave beam according to the first SINR distribution map corresponding to each wave beam;

the second centroid longitude and latitude calculating subunit is used for calculating a second centroid longitude and latitude of a second SINR interval of each beam according to the second SINR distribution map corresponding to each beam;

a third longitude and latitude calculating subunit, configured to calculate, according to a third SINR distribution map corresponding to each beam, a third longitude and latitude of the third SINR interval of each beam;

a first reference test position obtaining subunit, configured to perform SINR test processing on the first barycentric longitude and latitude of each beam, to obtain a first reference test position corresponding to a first SINR interval of each beam;

a second reference test position obtaining subunit, configured to perform SINR test processing on the second barycenter longitude and latitude of each beam, to obtain a second reference test position corresponding to a second SINR interval of each beam;

and the third reference test position acquisition subunit is configured to perform SINR test processing on the third barycentric longitude and latitude of each beam, and obtain a third reference test position corresponding to a third SINR interval of each beam.

Optionally, the beam throughput rate obtaining module includes:

a first test terminal arranging unit configured to arrange the M2-stream test terminals at first reference test positions of a first SINR interval of each beam, respectively;

a first SINR value obtaining unit, configured to obtain a plurality of first SINR values reported by the M2-stream test terminals;

a first throughput rate obtaining unit, configured to obtain, according to the plurality of first SINR values, a first throughput rate of each beam in a first SINR interval of a test;

the cell capacity determining module includes:

and a maximum cell capacity determining unit, configured to obtain a sum of the M first throughput rates, and determine a maximum cell capacity of the target serving cell according to the sum.

Optionally, the beam throughput rate obtaining module includes:

a second test terminal arranging unit configured to arrange the M2-stream test terminals at second reference test positions of a second SINR interval of each beam, respectively;

a second SINR value obtaining unit, configured to obtain a plurality of second SINR values reported by the M2-stream test terminals;

a second throughput rate obtaining unit, configured to obtain, according to the plurality of second SINR values, a second throughput rate of each beam in a second SINR interval under test;

the cell capacity determination module includes:

and an average cell capacity determining unit, configured to obtain a sum of the M second throughput rates, and determine an average cell capacity of the target serving cell according to the sum.

Optionally, the beam throughput rate obtaining module includes:

a third test terminal arranging unit configured to arrange the M2-stream test terminals at a third reference test position of a third SINR interval of each beam, respectively;

a third SINR value obtaining unit, configured to obtain a plurality of third SINR values reported by the M2-stream test terminals;

a third throughput rate obtaining unit, configured to obtain, according to the plurality of third SINR values, a third throughput rate of each beam in a tested third SINR interval;

the cell capacity determining module includes:

and the edge cell capacity determining unit is used for acquiring the sum of the M third throughput rates and determining the edge cell capacity of the target serving cell according to the sum.

In a third aspect, an embodiment of the present application provides an electronic device, including:

a processor, a memory and a computer program stored on the memory and executable on the processor, the processor implementing the cell capacity determination method as described in any above when executing the program.

In a fourth aspect, the present application provides a computer-readable storage medium, where instructions, when executed by a processor of an electronic device, enable the electronic device to perform any one of the cell capacity determination methods described above.

Compared with the prior art, the embodiment of the application has the following advantages:

in the embodiment of the application, by obtaining SINR sample test data of a target serving cell under a target base station, where the target base station is an N-stream base station device, and N is an even number greater than 2, according to the SINR sample test data, beam distribution positions of M beams in the target serving cell and an SINR distribution map corresponding to each beam distribution position are determined, where M is one half of N, according to the SINR distribution map, a reference test position corresponding to each beam is determined, and M2-stream test terminals are adopted to perform throughput rate test on the M beams to obtain throughput rates of the M beams, and according to the throughput rates of the M beams, cell capacity of the target serving cell is determined. According to the embodiment of the application, the capacity test of the multi-flow base station equipment can be realized through the 2-flow test terminal by adopting a multi-point combination and convergence test mode, in addition, the scheme refers to the signal coverage condition of the existing network and the real experience of a user, the obtained capacity evaluation result is more accurate, various models are not required to be arranged, the test cost is reduced, and the effective prediction of the network capacity after the network construction is connected into the network can be realized.

It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the application.

Drawings

Fig. 1 is a flowchart illustrating steps of a method for determining a cell capacity according to an embodiment of the present application;

FIG. 2 is a flowchart illustrating steps of a method for obtaining sample test data according to an embodiment of the present disclosure;

fig. 3 is a flowchart illustrating steps of a method for determining an SINR profile according to an embodiment of the present application;

FIG. 4 is a flowchart illustrating steps of a method for determining a benchmark location according to an embodiment of the present application;

FIG. 5 is a flow chart illustrating steps of another method for benchmarking locations provided in an embodiment of the present application;

fig. 6 is a flowchart illustrating steps of a method for determining a maximum cell capacity according to an embodiment of the present application;

fig. 7 is a flowchart illustrating steps of a method for determining an average cell capacity according to an embodiment of the present application;

fig. 8 is a flowchart illustrating steps of a method for determining capacity of an edge cell according to an embodiment of the present application;

fig. 9 is a schematic structural diagram of a cell capacity determining apparatus according to an embodiment of the present application;

fig. 10 is a schematic structural diagram of an electronic device according to an embodiment of the present application.

Detailed Description

In order to make the aforementioned objects, features and advantages of the present application more comprehensible, the present application is described in further detail with reference to the accompanying drawings and the detailed description.

The terminology used in the embodiments of the present application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. As used in the examples of this application and the appended claims, the singular forms "a", "an", and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise.

Referring to fig. 1, a flowchart illustrating steps of a cell capacity determining method provided in an embodiment of the present application is shown, and as shown in fig. 1, the cell capacity determining method may include the following steps:

step 101: and acquiring SINR (Signal to Interference plus Noise Ratio) sample test data of a target serving cell under the target base station.

The embodiment of the application can be applied to a scenario that a plurality of 2-stream test terminals are adopted to test the cell capacity of each service cell of N (N is an even number greater than 2) stream base station equipment.

The embodiment of the application can be applied to the target base station, namely, the execution subject is the target base station. The target base station is an N-stream base station device, where N is an even number greater than 2, and N may be 16 or 32, and specifically, the value of N may be determined according to a service requirement, which is not limited in this embodiment.

The target serving cell refers to one or more serving cells under the target base station, and capacity evaluation is needed.

The SINR sample test data refers to SINR test data within the coverage of the target serving cell collected by the test terminal.

When the cell capacity of the target serving cell under the target base station is predicted, SINR sample test data of the target serving cell under the target base station can be obtained.

In a specific implementation, the SINR sample test data in the coverage area of the target serving cell may be obtained in a traversal manner, and specifically, the following detailed description may be performed in conjunction with fig. 2.

Referring to fig. 2, a flowchart illustrating steps of a sample test data obtaining method provided in an embodiment of the present application is shown, and as shown in fig. 2, the sample test data obtaining method may include: step 201, step 202 and step 203.

Step 201: and determining the initial coverage area of the target service cell according to the deployment position of the target base station.

In this embodiment, the initial coverage area refers to an area covered by the estimated target serving cell.

When the cell capacity of the target serving cell is evaluated, the deployment position of the target base station can be obtained, and then the initial coverage area of the target serving cell is estimated according to the deployment position of the target base station.

After determining the initial coverage area of the target serving cell according to the deployment location of the target base station, step 202 is performed.

Step 202: and randomly adjusting the position of the 2-flow test terminal in the initial coverage area, and acquiring initial SINR test data of the 2-flow test terminal at different positions.

After determining the initial coverage area of the target serving cell, the 2-stream test terminal (e.g., a 2T4R terminal, etc.) may be disposed in the initial coverage area, and the position of the 2-stream test terminal in the initial coverage area is randomly adjusted, so that the 2-stream test terminal reports measured SINR test data, that is, initial SINR test data, at different positions.

After acquiring the initial SINR test data of the 2-stream test terminal at different positions, step 203 is executed.

Step 203: and screening out the SINR sample test data belonging to the target service cell from the initial SINR test data.

After the initial SINR test data of the 2-stream test terminal at different positions are obtained, the SINR test data belonging to the target serving cell may be screened out from the initial SINR test data, and the SINR test data is used as SINR sample test data. Namely, the SINR test data which does not belong to the target service cell in the initial SINR test data is excluded, and the rest SINR test data is used as SINR sample test data.

In this practical application, the 2T4R terminal may be used to perform traversal test on the target serving cell in the target base station, so as to obtain test data under all beams in the target serving cell. In the testing process, under a target service cell, testing (traversing) is carried out on multiple point positions as much as possible, the testing result needs to contain data of good points, middle points and difference points as much as possible, and the data of different SINR point positions as much as possible are selected for testing. To improve the accuracy of subsequent cell capacity evaluations.

After the SINR sample test data of the target serving cell under the target base station is obtained, step 102 is executed.

Step 102: according to the SINR sample test data, determining beam distribution positions of M beams in the target service cell and an SINR distribution graph corresponding to each beam distribution position; m is one half of N.

The beam distribution location refers to the location distribution covered by each beam in the target cell.

The SINR profile refers to a graph formed by SINR distribution within the distribution of positions covered by each beam.

In this example, the number of beams in the target serving cell is M, M is half of N, for example, when the target base station is a 16-flow base station, then the number of beams in each serving cell in the 16-flow base station is 8, and so on.

After the SINR sample test data of the target serving cell is obtained, the beam distribution positions of M beams in the target serving cell and an SINR distribution map corresponding to the beam distribution position of each beam may be determined according to the SINR sample test data. This process can be described in detail below in conjunction with fig. 3.

Referring to fig. 3, a flowchart illustrating steps of a method for determining an SINR profile according to an embodiment of the present application is shown, where as shown in fig. 3, the method for determining an SINR profile may include: step 301 and step 302.

Step 301: and determining the beam distribution positions of M beams in the target service cell according to the beam identification information and the testing longitude and latitude information in the SINR sample testing data.

In this embodiment, the obtained SINR sample test data includes Beam identification information (i.e., beam ID) and test longitude and latitude information.

Wherein the beam identification information may be used to indicate an identification of a beam transmitting a signal to the 2-stream test terminal.

The test longitude and latitude information refers to longitude and latitude information corresponding to the position of the 2-stream test terminal.

After the SINR sample test data is obtained, the beam distribution positions of M beams in the target serving cell, that is, the coverage position range of each beam in the M beams, may be determined according to the beam identification information and the test longitude and latitude information in the SINR sample test data.

Step 302: and generating an SINR distribution graph corresponding to each beam distribution position according to the SINR information corresponding to each beam in the SINR sample test data.

After the SINR sample test data is acquired, an SINR distribution map corresponding to each beam distribution position may be generated according to SINR information corresponding to each beam in the SINR sample test data.

In practical application, SINR distribution simulation can be completed by signal lobe characteristics according to a coverage scene of a target service cell, an SINR distribution simulation model under the target service cell is output, and geographical graphical representation is performed on SINR information of each beam through preset coverage simulation software, so as to obtain an SINR distribution map corresponding to each beam distribution position.

According to the embodiment of the application, the calculation of the subsequent benchmark test position can be facilitated through the SINR distribution graph.

After obtaining the beam distribution positions of the M beams in the target serving cell and the SINR distribution map corresponding to each beam distribution position according to the SINR sample test data, step 103 is executed.

Step 103: and determining a reference test position corresponding to each beam according to the SINR distribution map.

The reference test position refers to a standard position where the test terminal is arranged when testing the throughput of each beam.

After the SINR distribution map corresponding to the beam distribution position of each beam is obtained, a reference test position corresponding to each beam may be determined according to the SINR distribution map corresponding to each beam.

In a specific implementation, good point, middle point, and bad point intervals corresponding to each beam may be determined according to an SINR value in SINR sample test data, and then a distribution map corresponding to each interval is determined, so as to calculate a reference test position of each interval, which may be specifically described in detail below with reference to fig. 4.

Referring to fig. 4, a flowchart illustrating steps of a method for determining a benchmark position provided in an embodiment of the present application is shown, and as shown in fig. 4, the method for determining a benchmark position may include: step 401, step 402, step 403 and step 404.

Step 401: and determining a first SINR interval, a second SINR interval and a third SINR interval corresponding to each beam according to the SINR value in the SINR sample test data.

In this embodiment, the SINR value is a signal-to-noise ratio value.

After the SINR sample test data is obtained, an SINR value corresponding to each beam may be obtained according to the beam identification information in the SINR sample test data, and then a first SINR interval, a second SINR interval, and a third SINR interval corresponding to each beam are determined according to the SINR value of each beam.

The first SINR interval is an interval in which the SINR value is greater than a first threshold, the second SINR interval is an interval in which the SINR value is less than or equal to the first threshold and greater than or equal to a second threshold, the third SINR interval is an interval in which the SINR value is less than the second threshold, and the first threshold is greater than the second threshold. For example, the first threshold may be set at 25, the second threshold may be set at 3, and the sweet spot interval (i.e., the first SINR interval) is SINR >25; the middle point interval (namely the second SINR interval) is more than or equal to 25 and less than or equal to 3 SINR; the difference interval (i.e., the third SINR interval) is SINR <3.

After determining the first, second and third SINR intervals corresponding to each beam according to the SINR values in the SINR sample test data, step 402 is performed.

Step 402: and determining a first SINR distribution map corresponding to the first SINR interval, a second SINR distribution map corresponding to the second SINR interval and a third SINR distribution map corresponding to the third SINR interval in the SINR distribution maps according to the SINR values in the SINR sample test data.

After the first SINR interval, the second SINR interval, and the third SINR interval corresponding to each beam are obtained, a first SINR profile corresponding to the first SINR interval, a second SINR profile corresponding to the second SINR interval, and a third SINR profile corresponding to the third SINR interval in the SINR profiles may be determined according to the SINR values in the SINR sample test data. That is, for each beam, SINR profiles corresponding to the first SINR interval, the second SINR interval, and the third SINR interval of the beam may be sequentially obtained.

Step 403: and determining a first reference test position corresponding to the first SINR interval, a second reference test position corresponding to the second SINR interval and a third reference test position corresponding to the third SINR interval of each beam according to the first SINR distribution map, the second SINR distribution map and the third SINR distribution map corresponding to each beam.

After obtaining the SINR profiles corresponding to the three SINR intervals of each beam, a first reference test position corresponding to the first SINR interval, a second reference test position corresponding to the second SINR interval, and a third reference test position corresponding to the third SINR interval of each beam may be determined according to the first SINR profile, the second SINR profile, and the third SINR profile corresponding to each beam.

In specific implementation, the center of gravity longitude and latitude corresponding to each SINR interval can be obtained through calculation according to the SINR distribution map corresponding to each SINR interval, and the reference test position of each SINR interval is determined according to the center of gravity longitude and latitude. The implementation can be described in detail as follows in conjunction with fig. 5.

Referring to fig. 5, which is a flowchart illustrating steps of another benchmark location determination method provided in the embodiment of the present application, as shown in fig. 5, the benchmark location determination may include: step 501, step 502, step 503, step 504, step 505 and step 506.

Step 501: and calculating to obtain a first gravity center longitude and latitude of the first SINR interval of each beam according to the first SINR distribution map corresponding to each beam.

Step 502: and calculating to obtain a second barycentric longitude and latitude of a second SINR interval of each beam according to the second SINR distribution map corresponding to each beam.

Step 503: and calculating to obtain a third longitude latitude of the third SINR interval of each beam according to the third SINR distribution map corresponding to each beam.

In this embodiment, the first center of gravity longitude and latitude refers to the center of gravity longitude and latitude corresponding to the first SINR interval of each beam.

The second center of gravity longitude and latitude refers to the longitude and latitude of the center of gravity corresponding to the second SINR interval of each beam.

The third longitude and latitude of the center of gravity is the longitude and latitude of the center of gravity corresponding to the third SINR interval of each beam.

After the first SINR distribution map of each beam is obtained, a first barycentric longitude and latitude corresponding to the first SINR interval of each beam may be calculated and obtained according to the first SINR distribution map. Specifically, the center of gravity point position of the first SINR distribution map may be determined by using machine small sample model training, and the "center of gravity" longitude and latitude, that is, the first center of gravity longitude and latitude, of the corresponding first SINR interval is output.

After the second SINR distribution map of each beam is obtained, a second longitude and latitude corresponding to the second SINR interval of each beam may be calculated and obtained according to the second SINR distribution map. Specifically, the center of gravity point position of the second SINR distribution map may be determined by using machine small sample model training, and the longitude and latitude of the "center of gravity" of the corresponding second SINR interval, that is, the longitude and latitude of the second center of gravity, are output.

After the third SINR profile of each beam is obtained, a third longitude and latitude corresponding to the third SINR interval of each beam can be calculated and obtained according to the third SINR profile. Specifically, the center of gravity point position of the third SINR distribution map may be determined by training using a small sample model of the machine, and the longitude and latitude of the "center of gravity" of the corresponding third SINR interval, that is, the third longitude and latitude of the center of gravity, may be output.

Step 504: and performing SINR test processing on the first gravity center longitude and latitude of each beam to obtain a first reference test position corresponding to a first SINR interval of each beam.

Step 505: and performing SINR test processing on the second longitude and latitude of the center of gravity of each beam to obtain a second reference test position corresponding to a second SINR interval of each beam.

Step 506: and performing SINR test processing on the third longitude and latitude of the center of each beam to obtain a third reference test position corresponding to a third SINR interval of each beam.

The first reference test position is a reference test position corresponding to the first SINR interval of each beam, that is, when the throughput rate of each beam is tested, the 2-stream test terminal may be simultaneously placed at the first reference test position of the first SINR interval of each beam.

The second reference test position is a reference test position corresponding to the second SINR interval of each beam, that is, when the throughput rate of each beam is tested, the 2-stream test terminal may be simultaneously placed at the second reference test position of the second SINR interval of each beam.

The third reference test position is a reference test position corresponding to the third SINR interval of each beam, that is, when the throughput of each beam is tested, the 2-stream test terminal may be simultaneously placed at the third reference test position of the third SINR interval of each beam.

After the first barycentric longitude and latitude, the second barycentric longitude and latitude and the third barycentric longitude and latitude corresponding to each beam are obtained, SINR test verification can be performed on the three barycentric longitude and latitude, so that the tested SINR value is ensured to be stabilized within three SINR intervals, and a rotation test verification mode can be adopted for each beam to finally determine the reference test positions corresponding to the three SINR intervals of each beam, namely, the first reference test position of the first SINR interval of each beam, the second reference test position of the second SINR interval of each beam, and the third reference test position of the third SINR interval of each beam are finally obtained.

Step 404: the first, second and third benchmarking positions of each beam are taken as the benchmarking positions of each beam.

After the first reference test position, the second reference test position and the third reference test position of each beam are obtained, the first reference test position, the second reference test position and the third reference test position of each beam can be used as the reference test position of each beam.

After the reference test position corresponding to each beam is determined according to the SINR distribution map, step 104 is performed.

Step 104: and placing the M2-flow test terminals at the reference test positions of the M beams for throughput rate test to obtain the throughput rates of the M beams.

After the reference test position corresponding to each beam is determined according to the SINR distribution map, the M2-stream test terminals may be placed at the reference test positions of the M beams to perform throughput rate test, so as to obtain throughput rates of the M beams, that is, the throughput rate of each beam. In this example, the throughput is proportional to the SINR, and when performing the throughput test, the SINR value of the reference test position point of each beam may be obtained, and then the SINR value corresponding to each beam is converted to obtain the throughput of each beam.

In a specific implementation, when performing throughput rate testing of M beams, the M2-stream test terminals may be respectively placed at a first reference test position in a first SINR interval of the M beams, or at a second reference test position in a second SINR interval, or at a third reference test position in a third SINR interval, so as to perform testing respectively. For example, the target terminal takes a 16-stream terminal as an example, the number of beams is 8, and when testing the maximum throughput of each beam, 8 2-stream test terminals may be respectively placed at the first reference test position of 8 beams to perform throughput testing, that is, the first 2-stream test terminal is placed at the first reference test position of the first beam, the second 2-stream test terminal is placed at the first reference test position of the second beam.

It should be understood that the above examples are only examples for better understanding of the technical solutions of the embodiments of the present application, and are not intended to limit the present embodiment.

After placing the M2-stream test terminals at the reference test positions of the M beams for throughput rate test to obtain the throughput rates of the M beams, step 105 is executed.

Step 105: and determining the cell capacity of the target serving cell according to the throughput rates of the M wave beams.

After placing the M2-stream test terminals at the reference test positions of the M beams to perform throughput rate test to obtain the throughput rates of the M beams, the cell capacity of the target serving cell may be determined according to the throughput rates of the M beams. Specifically, a sum of throughput rates of M beams may be calculated, and the sum may be used as the cell capacity of the target serving cell.

In a specific implementation, the first SINR interval, the second SINR interval, and the third SINR interval may be respectively tested to obtain the maximum cell capacity, the average cell capacity, and the edge cell capacity of the target serving cell, and the process of testing and obtaining different cell capacities may be respectively described in detail below with reference to fig. 6, fig. 7, and fig. 8.

Referring to fig. 6, a flowchart illustrating steps of a maximum cell capacity determining method provided in an embodiment of the present application is shown, and as shown in fig. 6, the maximum cell capacity determining method may include: step 601, step 602, step 603, and step 604.

Step 601: and respectively arranging the M2-stream test terminals at a first reference test position of a first SINR interval of each beam.

In this embodiment, when testing the maximum cell capacity of the target serving cell, M2-stream test terminals may be respectively arranged at the first reference test position of the first SINR interval of each beam, for example, M =8, and the M2-stream test terminals are respectively: terminal 1, terminal 2,. Terminal 8,8 beams are: beam 1, beam 2,.. Beam 8, when performing a test of the maximum cell capacity, terminal 1 may be placed at a first reference test position in the first SINR interval of beam 1, terminal 2 may be placed at a first reference test position in the first SINR interval of beam 2,. And terminal 8 may be placed at a first reference test position in the first SINR interval of beam 8.

It should be understood that the above examples are only examples for better understanding of the technical solutions of the embodiments of the present application, and are not to be taken as the only limitation to the embodiments.

After arranging the M2-stream test terminals at the first reference test positions of the first SINR interval of each beam, respectively, step 602 is performed.

Step 602: and acquiring a plurality of first SINR values reported by the M2-stream test terminals.

When the 2-stream test terminal performs testing, SINR test data may be reported, and a plurality of first SINR values reported by M2-stream test terminals may be obtained. That is, each 2-stream test terminal performs multiple tests to report multiple SINR test data, and then obtains multiple first SINR values.

After obtaining a plurality of first SINR values reported by M2-stream test terminals, respectively, step 603 is executed.

Step 603: and acquiring a first throughput rate of each beam in a first SINR interval to be tested according to the plurality of first SINR values.

After obtaining the plurality of first SINR values, the first throughput rate of each beam in the tested first SINR interval may be obtained according to the plurality of first SINR values.

In a specific implementation, after the plurality of first SINR values corresponding to each beam are acquired, the plurality of first SINR values may be preprocessed to reject SINR values that do not satisfy the condition, for example, if the set first threshold is 25, reject SINR values that are less than 25 among the plurality of first SINR values, and the like. An average of the remaining first SINR values is then calculated, and from this average, a first throughput rate for each beam in the first SINR interval of the test may be determined.

Step 604: and acquiring the sum of M first throughput rates, and determining the maximum cell capacity of the target serving cell according to the sum.

After the first throughput rate of each of the M beams is obtained, a sum of the M first throughput rates may be calculated, and the maximum cell capacity of the target serving cell may be determined according to the sum.

Referring to fig. 7, a flowchart illustrating steps of a method for determining an average cell capacity according to an embodiment of the present application is shown, and as shown in fig. 7, the method for determining an average cell capacity may include: step 701, step 702, step 703 and step 704.

Step 701: and respectively arranging the M2-stream test terminals at second reference test positions of a second SINR interval of each beam.

In this embodiment, when testing the average cell capacity of the target serving cell, M2-stream test terminals may be respectively arranged at the second reference test position of the second SINR interval of each beam, for example, M =8, where the M2-stream test terminals are respectively: terminal 1, terminal 2,. Terminal 8,8 beams are: beam 1, beam 2,.. Beam 8, when testing the average cell capacity, terminal 1 may be placed at the second reference test position in the second SINR interval of beam 1, terminal 2 may be placed at the second reference test position in the second SINR interval of beam 2,. And terminal 8 may be placed at the second reference test position in the second SINR interval of beam 8.

Step 702 is performed after the M2-stream test terminals are respectively arranged at the second reference test position of the second SINR interval of each beam.

Step 702: and acquiring a plurality of second SINR values reported by the M2-stream test terminals.

When the 2-stream test terminal performs testing, the SINR test data may be reported, and a plurality of second SINR values reported by the M2-stream test terminals may be obtained. That is, each 2-stream test terminal performs multiple tests to report multiple SINR test data, and then obtains multiple second SINR values.

After obtaining a plurality of second SINR values reported by the M2-stream test terminals, step 703 is executed.

Step 703: and acquiring a second throughput rate of each beam in a second SINR interval to be tested according to the plurality of second SINR values.

After obtaining the plurality of second SINR values, a second throughput rate of each beam in the tested second SINR interval may be obtained according to the plurality of second SINR values.

In a specific implementation, after the plurality of second SINR values corresponding to each beam are acquired, the plurality of second SINR values may be preprocessed to eliminate SINR values that do not satisfy the condition from the plurality of second SINR values, for example, if the set first threshold is 25 and the second threshold is 3, SINR values that are greater than or equal to 3 and less than or equal to 25 and are less than or equal to 3 from the plurality of second SINR values are eliminated. An average of the remaining second SINR values is then calculated, and a second throughput rate for each beam during the second SINR interval under test may then be determined from the average.

Step 704: and acquiring the sum of the M second throughput rates, and determining the average cell capacity of the target serving cell according to the sum.

After obtaining the second throughput rate for each of the M beams, a sum of the M second throughput rates may be calculated, and an average cell capacity of the target serving cell may be determined based on the sum.

Referring to fig. 8, a flowchart illustrating steps of a method for determining a capacity of an edge cell provided in an embodiment of the present application is shown, and as shown in fig. 8, the method for determining a capacity of an edge cell may include: step 801, step 802, step 803 and step 804.

Step 801: and respectively arranging the M2-stream test terminals at a third reference test position of a third SINR interval of each beam.

In this embodiment, when testing the edge cell capacity of the target serving cell, M2-stream test terminals may be respectively arranged at the third reference test position of the third SINR interval of each beam, for example, M =8, and M2-stream test terminals are respectively: terminal 1, terminal 2,. Terminal 8,8 beams are: beam 1, beam 2,.. Beam 8, when testing the edge cell capacity, terminal 1 may be placed at a third reference test position in a third SINR interval of beam 1, terminal 2 may be placed at a third reference test position in a third SINR interval of beam 2,. And terminal 8 may be placed at a third reference test position in a third SINR interval of beam 8.

Step 802: and acquiring a plurality of third SINR values reported by the M2-stream test terminals.

When the 2-stream test terminal performs testing, SINR test data may be reported, and a plurality of third SINR values reported by M2-stream test terminals may be obtained. That is, each 2-stream test terminal performs multiple tests to report multiple SINR test data, and then obtains multiple third SINR values.

After obtaining a plurality of third SINR values reported by M2-stream test terminals, step 803 is executed.

Step 803: and acquiring a third throughput rate of each beam in a tested third SINR interval according to the plurality of third SINR values.

After obtaining the plurality of third SINR values, a third throughput rate of each beam in the tested third SINR interval may be obtained according to the plurality of third SINR values.

In a specific implementation, after the plurality of third SINR values corresponding to each beam are acquired, the plurality of third SINR values may be preprocessed to reject SINR values that do not satisfy the condition, for example, if the set second threshold is 3, reject SINR values that are greater than 3 in the plurality of third SINR values, and the like. An average of the remaining third SINR values is then calculated, and a third throughput rate for each beam in the tested third SINR interval may be determined from the average.

Step 804: and acquiring the sum of the M third throughput rates, and determining the edge cell capacity of the target service cell according to the sum.

After the third throughput rate of each of the M beams is obtained, a sum of the M third throughput rates may be calculated, and the edge cell capacity of the target serving cell may be determined according to the sum.

According to the embodiment of the application, a latest small sample training method can be adopted at the same time, the SINR distribution graph is obtained in a simulation mode, the maximum cell capacity value, the average cell capacity value and the edge cell capacity value are obtained according to the sum of all beams of the throughput relation, the accuracy is improved, and the testing cost is reduced.

According to the cell capacity determining method provided by the embodiment of the application, by obtaining SINR sample test data of a target service cell under a target base station, the target base station is N-stream base station equipment, N is an even number greater than 2, beam distribution positions of M beams in the target service cell and an SINR distribution map corresponding to each beam distribution position are determined according to the SINR sample test data, M is one half of N, a reference test position corresponding to each beam is determined according to the SINR distribution map, throughput rate testing is performed on the M beams by adopting the M2-stream test terminals, throughput rates of the M beams are obtained, and the cell capacity of the target service cell is determined according to the throughput rates of the M beams. According to the embodiment of the application, the capacity test of the multi-flow base station equipment can be realized through the 2-flow test terminal by adopting a multi-point combination and convergence test mode, in addition, the scheme refers to the signal coverage condition of the existing network and the real experience of a user, the obtained capacity evaluation result is more accurate, various models are not required to be arranged, the test cost is reduced, and the effective prediction of the network capacity after the network construction is connected into the network can be realized.

Referring to fig. 9, which shows a schematic structural diagram of a cell capacity determining apparatus provided in an embodiment of the present application, as shown in fig. 9, the cell capacity determining apparatus 900 may include the following modules:

a sample test data obtaining module 910, configured to obtain SINR (Signal to Interference plus Noise Ratio) sample test data of a target serving cell in a target base station; the target base station is N-flow base station equipment, and N is an even number greater than 2;

an SINR distribution determining module 920, configured to determine, according to the SINR sample test data, beam distribution positions of M beams in the target serving cell and an SINR distribution map corresponding to each beam distribution position; m is one half of N;

a benchmark position determining module 930, configured to determine, according to the SINR distribution map, a benchmark position corresponding to each beam;

a beam throughput rate obtaining module 940, configured to place M2-stream test terminals at the reference test positions of the M beams to perform throughput rate test, so as to obtain throughput rates of the M beams;

a cell capacity determining module 950, configured to determine the cell capacity of the target serving cell according to the throughput rates of the M beams.

Optionally, the sample test data acquiring module includes:

Optionally, the SINR distribution determining module includes:

and an SINR distribution map generating unit, configured to generate an SINR distribution map corresponding to each beam distribution position according to the SINR information corresponding to each beam in the SINR sample test data.

Optionally, the SINR distribution map generating unit includes:

Optionally, the benchmark location determination module includes:

Optionally, the section reference position determination unit includes:

the first barycentric longitude and latitude calculation operator unit is used for calculating and obtaining first barycentric longitude and latitude of the first SINR interval of each wave beam according to the first SINR distribution map corresponding to each wave beam;

a first reference test position obtaining subunit, configured to perform SINR test processing on the first centroid longitude and latitude of each beam, to obtain a first reference test position corresponding to a first SINR interval of each beam;

Optionally, the beam throughput rate obtaining module includes:

a first throughput rate obtaining unit, configured to obtain, according to the multiple first SINR values, a first throughput rate of each beam in a first SINR interval of a test;

the cell capacity determination module includes:

Optionally, the beam throughput rate obtaining module includes:

a second throughput rate obtaining unit, configured to obtain, according to the plurality of second SINR values, a second throughput rate of each beam in a second SINR interval of the test;

the cell capacity determination module includes:

and the average cell capacity determining unit is used for acquiring a sum value of the M second throughput rates and determining the average cell capacity of the target serving cell according to the sum value.

Optionally, the beam throughput rate obtaining module includes:

the cell capacity determination module includes:

and an edge cell capacity determining unit, configured to obtain a sum of the M third throughput rates, and determine an edge cell capacity of the target serving cell according to the sum.

The cell capacity determining apparatus provided in the embodiment of the present application, by obtaining SINR sample test data of a target serving cell under a target base station, where the target base station is an N-stream base station device and N is an even number greater than 2, determines, according to the SINR sample test data, beam distribution positions of M beams in the target serving cell and an SINR distribution map corresponding to each beam distribution position, where M is half of N, determines, according to the SINR distribution map, a reference test position corresponding to each beam, performs throughput rate test on the M beams by using the M2-stream test terminals, obtains throughput rates of the M beams, and determines, according to the throughput rates of the M beams, cell capacity of the target serving cell. According to the embodiment of the application, the capacity test of the multi-flow base station equipment can be realized through the 2-flow test terminal by adopting a multi-point combination and convergence test mode, in addition, the scheme refers to the signal coverage condition of the existing network and the real experience of a user, the obtained capacity evaluation result is more accurate, various models are not required to be arranged, the test cost is reduced, and the effective prediction of the network capacity after the network construction and the network access can be realized.

An embodiment of the present application further provides an electronic device, including: a memory, a processor and a computer program stored on the memory and executable on the processor, the computer program, when executed by the processor, implementing the above cell capacity determination method.

Fig. 10 shows a schematic structural diagram of an electronic device 1000 according to an embodiment of the present invention. As shown in fig. 10, the electronic device 1000 includes a Central Processing Unit (CPU) 1001 that can perform various appropriate actions and processes according to computer program instructions stored in a Read Only Memory (ROM) 1002 or computer program instructions loaded from a storage unit 1008 into a Random Access Memory (RAM) 1003. In the RAM1003, various programs and data necessary for the operation of the electronic apparatus 1000 can also be stored. The CPU1001, ROM1002, and RAM1003 are connected to each other via a bus 1004. An input/output (I/O) interface 1005 is also connected to bus 1004.

A number of components in the electronic device 1000 are connected to the I/O interface 1005, including: an input unit 1006 such as a keyboard, a mouse, a microphone, and the like; an output unit 1007 such as various types of displays, speakers, and the like; a storage unit 1008 such as a magnetic disk, optical disk, or the like; and a communication unit 1009 such as a network card, a modem, a wireless communication transceiver, or the like. The communication unit 1009 allows the electronic device 1000 to exchange information/data with other devices through a computer network such as the internet and/or various telecommunication networks.

The various processes and processes described above may be performed by processing unit 1001. For example, the methods of any of the above embodiments may be implemented as a computer software program tangibly embodied on a computer-readable medium, such as storage unit 1008. In some embodiments, part or all of the computer program may be loaded and/or installed onto electronic device 1000 via ROM1002 and/or communications unit 1009. When the computer program is loaded into RAM1003 and executed by CPU1001, one or more acts of the methods described above may be performed.

An embodiment of the present application provides a computer-readable storage medium, on which a computer program is stored, which when executed by a processor, implements a cell capacity determination method.

The embodiments in the present specification are described in a progressive manner, each embodiment focuses on differences from other embodiments, and the same and similar parts among the embodiments are referred to each other.

As will be appreciated by one of skill in the art, embodiments of the present application may be provided as a method, apparatus, or computer program product. Accordingly, embodiments of the present application may take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, embodiments of the present application may take the form of a computer program product embodied on one or more computer-usable storage media (including, but not limited to, disk storage, CD-ROM, optical storage, and so forth) having computer-usable program code embodied therein.

Embodiments of the present application are described with reference to flowchart illustrations and/or block diagrams of methods, terminals (systems), and computer program products according to embodiments of the application. It will be understood that each flow and/or block of the flowchart illustrations and/or block diagrams, and combinations of flows and/or blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, embedded processor, or other programmable data processing terminal to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing terminal, create means for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.

These computer program instructions may also be stored in a computer-readable memory that can direct a computer or other programmable data processing terminal to function in a particular manner, such that the instructions stored in the computer-readable memory produce an article of manufacture including instruction means which implement the function specified in the flowchart flow or flows and/or block diagram block or blocks.

These computer program instructions may also be loaded onto a computer or other programmable data processing apparatus to cause a series of operational steps to be performed on the computer or other programmable apparatus to produce a computer implemented process such that the instructions which execute on the computer or other programmable apparatus provide steps for implementing the functions specified in the flowchart flow or flows and/or block diagram block or blocks.

While preferred embodiments of the present application have been described, additional variations and modifications of these embodiments may occur to those skilled in the art once they learn of the basic inventive concepts. Therefore, it is intended that the appended claims be interpreted as including the preferred embodiment and all changes and modifications that fall within the true scope of the embodiments of the present application.

Finally, it should also be noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "include", "including" or any other variations thereof are intended to cover non-exclusive inclusions, such that a process, method, article, or terminal that includes a list of elements does not include only those elements but also other elements not expressly listed or inherent to such process, method, article, or terminal. Without further limitation, an element defined by the phrases "comprising a" \8230; "does not exclude the presence of additional like elements in a process, method, article, or terminal that comprises the element.

The above detailed description is provided for a cell capacity determining method, a cell capacity determining apparatus, an electronic device and a computer-readable storage medium, and specific examples are applied herein to explain the principles and embodiments of the present application, and the descriptions of the above embodiments are only used to help understand the method and the core ideas of the present application; meanwhile, for a person skilled in the art, according to the idea of the present application, there may be variations in the specific embodiments and the application scope, and in summary, the content of the present specification should not be construed as a limitation to the present application.

Claims

1. A method for determining cell capacity, comprising:

determining a reference test position corresponding to each wave beam according to the SINR distribution map;

placing M2-flow test terminals at the reference test positions of the M beams for throughput rate test to obtain the throughput rates of the M beams;

2. The method of claim 1, wherein the obtaining SINR (Signal to Interference plus Noise Ratio) sample test data of a target serving cell under a target base station comprises:

3. The method of claim 1, wherein determining beam distribution positions of the M beams in the target serving cell and an SINR profile corresponding to each of the beam distribution positions according to the SINR sample test data comprises:

4. The method of claim 3, wherein generating the SINR profile corresponding to each beam profile location according to the SINR information corresponding to each beam in the SINR sample test data comprises:

5. The method of claim 1, wherein the determining the reference test position corresponding to each beam according to the SINR profile comprises:

6. The method of claim 5, wherein determining a first reference test position corresponding to the first SINR interval, a second reference test position corresponding to the second SINR interval, and a third reference test position corresponding to the third SINR interval for each beam according to the first SINR profile, the second SINR profile, and the third SINR profile corresponding to each beam comprises:

calculating to obtain a first gravity center longitude and latitude of the first SINR interval of each wave beam according to the first SINR distribution map corresponding to each wave beam;

calculating a second centroid longitude and latitude of a second SINR interval of each wave beam according to the second SINR distribution map corresponding to each wave beam;

calculating a third longitude latitude of the third SINR interval of each beam according to a third SINR distribution map corresponding to each beam;

7. The method of claim 6, wherein the placing the M2-stream test terminals at the reference test positions of the M beams for throughput rate testing to obtain the throughput rates of the M beams comprises:

acquiring a first throughput rate of each wave beam in a first SINR interval to be tested according to the plurality of first SINR values;

8. The method of claim 6, wherein the placing the M2-stream test terminals at the benchmark test positions of the M beams for throughput rate testing to obtain the throughput rates of the M beams comprises:

9. The method of claim 6, wherein the placing the M2-stream test terminals at the reference test positions of the M beams for throughput rate testing to obtain the throughput rates of the M beams comprises:

10. A cell capacity determination apparatus, comprising:

a reference test position determining module, configured to determine, according to the SINR distribution map, a reference test position corresponding to each beam;

and a cell capacity determining module, configured to determine the cell capacity of the target serving cell according to the throughput rates of the M beams.

11. An electronic device, comprising:

a processor, a memory and a computer program stored on the memory and executable on the processor, the processor implementing the cell capacity determination method of any of claims 1 to 9 when executing the program.

12. A computer readable storage medium, wherein instructions in the storage medium, when executed by a processor of an electronic device, enable the electronic device to perform the cell capacity determination method of any of claims 1 to 9.