CN115203025A - Test defect analysis method and device - Google Patents
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- CN115203025A CN115203025A CN202210723149.7A CN202210723149A CN115203025A CN 115203025 A CN115203025 A CN 115203025A CN 202210723149 A CN202210723149 A CN 202210723149A CN 115203025 A CN115203025 A CN 115203025A
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- G06F11/36—Preventing errors by testing or debugging software
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Abstract
The application discloses a test defect analysis method and device, which can be applied to the field of big data or the field of finance. The method comprises the following steps: recording each test data of each test case tested in each area of the system, determining a first data quantity of each test data, determining each defect data by defect tracking of each test data, analyzing each defect data to determine a plurality of target defect data and a second data quantity of each target defect data, determining a ratio of each target defect data in each test data according to the first data quantity and the second data quantity, reading a third data quantity corresponding to each previous defect data in a previous defect database, comparing the second data quantity with the third data quantity to obtain a comparison result, and analyzing the system for test defects based on the ratio and the comparison result to obtain a defect analysis result of the system. By applying the method disclosed by the invention, the accuracy of testing defect analysis can be improved.
Description
Technical Field
The invention relates to the field of big data processing, in particular to a test defect analysis method and device.
Background
With the development of big data technology, the business requirements of the current enterprise are more and more complex, the system in the current enterprise cannot meet the business requirements, and in order to meet the business requirements, a plurality of corresponding systems need to be modified with larger workload or new systems need to be developed. Each modified system or each newly developed system needs to correspondingly design a plurality of test cases, the test cases are used for testing the defects of the systems, the defects obtained by testing are analyzed according to the testing process to obtain the defect analysis result of the system, and the system can be practically applied only if the defect analysis result meets the requirement.
At present, in the process of analyzing the tested defects, the tested defects are often analyzed only under the condition of one-dimensional data information, for example, the number of the tested defects is small under only one test standard. Although the defects existing in the system can be quickly analyzed according to the data information of one dimension, and the defect analysis result of the system can be quickly obtained, the analysis mode has one-sidedness, and meanwhile, as the complexity of the system increases, the accuracy of analyzing the test defects existing in the system is lower, and the accuracy of the corresponding obtained defect analysis result of the system is lower.
Disclosure of Invention
In view of this, the present invention provides a method for analyzing test defects, by which the test defects can be comprehensively analyzed, and the accuracy of the test defect analysis can be improved.
The invention also provides a test defect analysis device which is used for ensuring the realization and the application of the method in practice.
A test defect analysis method, comprising:
under the condition that each test case is tested in each area of the system, recording each test data of each test case tested in each area of the system, and determining the first data quantity corresponding to each test data;
performing defect tracking on each test data, and determining each defect data with test defects in each test data;
analyzing each defect data based on each preset test standard so as to analyze a plurality of target defect data from each defect data and determine a second data quantity corresponding to each target defect data;
determining the proportion value of each target defect data in each test data according to the first data quantity and the second data quantity;
calling a preset previous defect database, reading a third data quantity corresponding to each previous defect data in the previous defect database, and comparing the second data quantity with the third data quantity to obtain a comparison result;
and performing test defect analysis on the system based on the ratio and the comparison result to obtain a defect analysis result of the system.
Optionally, the determining a first data quantity corresponding to each test data includes:
reading each test data of each input test case tested in each area of the system to determine a first data quantity corresponding to each test data.
Optionally, in the method, the performing defect tracking on each piece of test data, and determining each piece of defect data with a test defect in each piece of test data includes:
analyzing each test data to determine a first test condition of a test case corresponding to each test data;
and when the first test condition of the test case corresponding to the test data is tracked as test failure, determining the test data as defect data with test defects.
In the foregoing method, optionally, the analyzing each of the defect data based on each preset test criterion to analyze a plurality of target defect data from each of the defect data includes:
analyzing each piece of defect data based on each test standard to determine each second test condition when the test case corresponding to each piece of defect data is tested under each test standard;
and when all the second test conditions of the test cases corresponding to the defect data are test failures under all the test standards, determining the defect data as the target defect data.
The above method, optionally, further includes:
and storing each target defect data into the past defect database.
A test defect analysis apparatus comprising:
the recording unit is used for recording each test data of each test case tested in each area of the system under the condition that each test case is tested in each area of the system, and determining the first data quantity corresponding to each test data;
the tracking unit is used for tracking the defects of the test data and determining each piece of defect data with the test defects in the test data;
the first analysis unit is used for analyzing each piece of defect data based on each preset test standard so as to analyze a plurality of pieces of target defect data from each piece of defect data and determine a second data quantity corresponding to each piece of target defect data;
a determining unit, configured to determine a ratio of each target defect data in each test data according to the first data amount and the second data amount;
the comparison unit is used for calling a preset existing defect database, reading a third data quantity corresponding to each existing defect data in the existing defect database, and comparing the second data quantity with the third data quantity to obtain a comparison result;
and the second analysis unit is used for carrying out test defect analysis on the system based on the ratio and the comparison result to obtain a defect analysis result of the system.
The above apparatus, optionally, the recording unit includes:
the reading subunit is configured to read each test data of each entered test case tested in each area of the system, so as to determine a first data quantity corresponding to each test data.
The above apparatus, optionally, the tracking unit, includes:
the analysis subunit is used for analyzing each test data to determine a first test condition of a test case corresponding to each test data;
and the first determining subunit is used for determining the test data as the defect data with the test defect when the first test condition of the test case corresponding to the test data is tracked as the test failure.
The above apparatus, optionally, the first analysis unit includes:
the analysis subunit is configured to analyze each piece of defect data based on each piece of test standard to determine each second test condition when the test case corresponding to each piece of defect data is tested under each piece of test standard;
and the second determining subunit is configured to determine the defect data as the target defect data when all of the second test cases of the test cases corresponding to the defect data tested under all of the test standards are test failures.
The above apparatus, optionally, further comprises:
and the storage subunit is used for storing each target defect data into the past defect database.
Compared with the prior art, the invention has the following advantages: in the method provided by the embodiment of the invention, under the condition that each test case is tested in each area of the system, each test data of each test case tested in each area of the system is recorded, and the first data quantity corresponding to each test data is determined; performing defect tracking on each test data, and determining each defect data with test defects in each test data; analyzing each piece of defect data based on each preset test standard so as to analyze a plurality of pieces of target defect data from each piece of defect data and determine a second data quantity corresponding to each piece of target defect data; determining the proportion value of each target defect data in each test data according to the first data quantity and the second data quantity; calling a preset previous defect database, reading a third data quantity corresponding to each previous defect data in the previous defect database, and comparing the second data quantity with the third data quantity to obtain a comparison result; and performing test defect analysis on the system based on the ratio and the comparison result to obtain a defect analysis result of the system. The method of the invention is used for comprehensively analyzing the test defects, and the accuracy of the test defect analysis can be improved.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the provided drawings without creative efforts.
FIG. 1 is a flowchart illustrating a method for analyzing a test defect according to an embodiment of the present invention;
FIG. 2 is a block diagram of an apparatus for testing a defect analyzer according to an embodiment of the present invention;
fig. 3 is a block diagram of another apparatus for testing a defect analyzer according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
In this application, relational terms such as first and second, and the like are used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions, and the terms "comprises", "comprising", or any other variation thereof are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising a … …" does not exclude the presence of another identical element in a process, method, article, or apparatus that comprises the element.
Each system needs to perform multiple rounds of tests, and regression tests are needed after test defects discovered in the test process are developed and repaired. It can be known from the background art that, when analyzing a test defect, the test defect is often analyzed on the basis of one dimension, and the analysis mode has one-sidedness, and as the current system is more and more complex, the accuracy of the analysis mode for determining the test is lower and lower, which leads to the failure of accurately and effectively guiding the subsequent regression test of the system.
Therefore, the test defect analysis method can be realized by presetting the test case tracking module, the test defect tracking module, the previous test defect module and the test defect analysis module in the test defect analysis system, comprehensively analyzing the test defects by integrating the large data information of multiple dimensions such as test progress, system, functional modules/interfaces, turns, test defects, previous defects and the like, so as to evaluate the overall quality of the system project and effectively guide the subsequent test process.
In the method provided by the embodiment of the invention, the regression test is a process that after a developer repairs a test defect, whether the test defect is repaired needs to be verified again, and meanwhile, the test is performed in a new version to detect whether the developer introduces a new test defect in the process of repairing a code.
The invention is operational with numerous general purpose or special purpose computing device environments or configurations. For example: personal computers, server computers, hand-held or portable devices, tablet-type devices, multi-processor apparatus, distributed computing environments that include any of the above devices or equipment, and the like.
The embodiment of the invention provides a test defect analysis method, which can be applied to various system platforms, wherein the execution main body of the method can be a computer terminal or a processor of various mobile devices, and the flow chart of the method is shown in figure 1, and the method specifically comprises the following steps:
s101: under the condition that each test case is tested in each area of the system, recording each test data of each test case tested in each area of the system, and determining the first data quantity corresponding to each test data;
in the method provided by the embodiment of the invention, each system starts to enter the testing stage after the development is finished, and each test case needs to be correspondingly designed for each area in the system before entering the testing stage of each stage so as to test the overall project quality of the system. Each test case is tested in a region corresponding to each system implementing the test, where the region of the system is, for example, a functional module/interface of the system, and one system includes a plurality of different functional modules/interfaces.
In the method provided by the embodiment of the invention, the test cases are tested under the test standard of the development environment, before the test cases are tested, the distribution conditions of all the test cases at different functional modules/interfaces of each system for implementing the test can be determined and summarized, when the test cases are executed, the test conditions of the test cases are tracked and recorded by a test case tracking module preset in the system, the test condition of each test case refers to each test data, and the defect tracking can be performed on the test data subsequently to determine the defect data with each test defect. In the process of tracking the test cases, the execution conditions of the test cases of different functional modules/interfaces of each system in different time periods and different test rounds are tracked according to dates, after the test data of the test cases during testing are tracked, the test data are recorded, and the quantity (first data quantity) of the test data is determined to be used as standby data so as to perform test defect analysis on the system subsequently.
S102: performing defect tracking on each test data, and determining each defect data with test defects in each test data;
in the method provided by the embodiment of the invention, in the process of executing the test of the test cases, some test cases with test/execution failures may exist under the test standard of the current development environment, the test data corresponding to the test cases with test/execution failures is defect data, and the defect data corresponding to the test cases with test/execution failures can be tracked by using a test defect tracking module preset in the system. For example, the defect data corresponding to the test cases is tracked, 1000 test cases are designed, 1000 test cases are executed to obtain corresponding 1000 test data, the 1000 test data are subjected to defect tracking, the test condition that 100 test data show is tracked as test/execution failure, and then 100 test data are tracked as defect data, and the 100 defect data are recorded.
In the method provided by the embodiment of the present invention, the test defect tracking module includes processes of tracking and recording each proposed test defect, each positioned target test defect, analyzing each test condition, and repairing each target test defect in each test data, and these processes are closed-loop management processes.
It should be noted that if one test case is correspondingly designed for the entire system, a plurality of defect data may exist in the test case.
S103: analyzing each piece of defect data based on each preset test standard so as to analyze a plurality of pieces of target defect data from each piece of defect data and determine a second data quantity corresponding to each piece of target defect data;
in the method provided by the embodiment of the invention, if each test case is subjected to test defect analysis based on only one test standard, the defect analysis result of the system obtained by analyzing the test cases is inaccurate. Although the test data corresponding to the test executed by the test case under the test standard of the current development environment is determined as the defective data, the condition that the test data corresponding to the test executed by the test case is determined as the non-defective data under other test standards is not excluded, wherein the condition that the test data is determined as the defective data is that the test condition of the test data shows that the test/execution fails or cannot be tested/executed successfully, and otherwise, the condition that the test data is determined as the non-defective data is that the test condition of the test data shows that the test/execution succeeds. Therefore, if it is determined that the defect data is inaccurate only by giving the test data under the test standard of the current development environment, each defect data should be analyzed separately according to a plurality of test standards.
In the method provided by the embodiment of the invention, related personnel consider various factors which can influence the corresponding test conditions of the test cases, each factor is responded by presetting each test standard, and the test cases corresponding to each defect data are respectively tested based on each preset test standard so as to analyze whether the defect data are the target defect data. When the test case corresponding to the defect data fails to test/execute in each of the preset test standards, the defect data is target defect data, and when the test case corresponding to the defect data succeeds to test/execute in any one of the preset test standards, the defect data is non-target defect data. The process of analyzing a plurality of target defect data in each defect data includes, for example, executing tests on test cases corresponding to the aforementioned 100 defect data based on each preset test standard, and when the test cases of the test cases corresponding to 10 defect data in all the preset test standards are test/execution failures, the 10 defect data are the target defect data, and the remaining 90 defect data are non-target defect data. The reason why the test case corresponding to the non-target defect data under some test standards fails in the test/execution is caused by some uncertain factors, such as: the test standard of the development environment corresponds to the reasons of incorrect configuration of the computer for executing the test, poor network signal and the like. And recording the process of executing the test under all preset test standards by the test case corresponding to each piece of defect data.
In the method provided by the embodiment of the invention, the determined target defect data needs to be read first to obtain the second data quantity corresponding to the target defect data, and the second data quantity is used as spare data to facilitate the subsequent test defect analysis of the system.
S104: determining the proportion value of each target defect data in each test data according to the first data quantity and the second data quantity;
in the method provided by the embodiment of the invention, the first data quantity and the second data quantity are compared to obtain the ratio of all target defect data in all test data, the size of the ratio can influence the result of the subsequent analysis of the system, the smaller the ratio is, the less the test defects exist in the system is, the better the corresponding quality of the system is, and on the contrary, the more the test defects exist in the system is, the worse the corresponding quality of the system is.
S105: calling a preset previous defect database, reading a third data quantity corresponding to each previous defect data in the previous defect database, and comparing the second data quantity with the third data quantity to obtain a comparison result;
in the method provided by the embodiment of the invention, each target defect data obtained when the system executes the test in each stage of the test is recorded into a preset existing defect database corresponding to the system in real time, and is sorted according to the recorded time, for example, each first-stage target defect data obtained when the system executes the test in the first-stage test stage is recorded into the existing defect database, and each second-stage target defect data obtained when the system executes the test in the second-stage test stage is recorded into the existing defect database until the defect analysis result of the system executing the test and performing the corresponding analysis meets the requirement. And the corresponding target defect data in a certain period of test stage recorded in the previous defect database can reflect the test defect condition of the period of test stage.
In the method provided by the embodiment of the present invention, when reading each previous defect data in the previous defect database, each target defect data corresponding to the previous test stage of the system is mainly read, for example, the current test stage is the third test stage, and at this time, each second-stage target defect data of the previous test stage, that is, the second test stage, is mainly read in the previous defect database. Reading a third data quantity of the previous defect data (previous defect data), comparing the target defect data quantity with the previous defect data quantity to obtain a comparison value, wherein the comparison value can also influence the result of analyzing the test defects in the follow-up process, and the smaller the comparison value is, the fewer the test defects exist in the system, and the better the quality of the corresponding system is.
S106: and performing test defect analysis on the system based on the ratio and the comparison result to obtain a defect analysis result of the system.
In the method provided by the embodiment of the present invention, the proportion value of each target defect data in each test data and the comparison result between each target defect data and each previous defect data in the previous period are obtained based on multiple dimensions, such as each functional module/interface, defect data, target defect data, previous defect data, and the like.
In the method provided by the embodiment of the invention, the proportion value of each target defect data in each test data and the comparison result of each target defect data and each previous defect data in the previous period are analyzed, that is, the test defect analysis is performed on the system to obtain the defect analysis result of the system. The comparison result of analyzing each target defect data and each previous defect data in the previous period is, for example: under the condition that the data quantity corresponding to each previous defect data based on the previous period is less, comparing the data quantity corresponding to each target defect data with the data quantity corresponding to each previous defect data, wherein the comparison result is that the data quantity corresponding to each target defect data is less than the data quantity corresponding to each previous defect data, and each function of the current system is better and better in quality according to the comparison result.
In the method provided by the embodiment of the present invention, the executed analysis process may be implemented by presetting a test defect analysis module, defining the weight of each test case corresponding to different function modules/interfaces of the system in the regression test and the influence factor of the different functions/interfaces of the system on the overall quality of the system project according to the defect analysis result obtained by analyzing the test defect of the system, and formulating the regression test strategy of the system according to the defined weight and influence factor. The definition is based on the development requirement, and is related to each functional area which does not meet the requirement in the testing process of the system, and the functional area which does not meet the requirement is the functional area with the testing defect. The defined influence factors related to each function/interface in the system are, for example: when the function of a certain module of the system is the floricornit, the defect analysis result shows that the function of the floricornit of the module still has a test defect, the influence factor corresponding to the floricornit is determined to be the exquisite factor, and the exquisite factor is defined.
In the method provided by the embodiment of the invention, relevant personnel can repair the test defects in a targeted manner according to the defect analysis result of the system, and the system is tested again after the repair is finished, because some new defects are likely to be generated due to various reasons in the repair process of the relevant personnel. According to the defect analysis result of the system, risk prompt can be given to the system when the next testing stage is carried out, specifically, a regression testing strategy is formulated according to the defined weight and the influence factor, the regression testing strategy is used for guiding the testing process of the next testing stage, and which functional modules/interfaces need to be supplemented with test cases, multiple rounds of regression testing and the like can be determined, so that the overall quality of the system project is ensured.
In the method provided by the embodiment of the invention, under the condition that each test case executes the test in each area of the system, each test data of each test case in each area of the system is recorded, and the first data quantity corresponding to each test data is determined; performing defect tracking on each test data, and determining each defect data with test defects in each test data; analyzing each defect data based on each preset test standard so as to analyze a plurality of target defect data from each defect data and determine a second data quantity corresponding to each target defect data; determining the proportion value of each target defect data in each test data according to the first data quantity and the second data quantity; calling a preset previous defect database, reading a third data quantity corresponding to each previous defect data in the previous defect database, and comparing the second data quantity with the third data quantity to obtain a comparison result; and performing test defect analysis on the system based on the ratio and the comparison result to obtain a defect analysis result of the system. The method of the invention is applied to comprehensively analyze the test defects and improve the accuracy of the test defect analysis.
Further, on the basis of the method provided by the above embodiment, in the method provided by the embodiment of the present invention, determining the first data quantity corresponding to each piece of test data in step S101 includes:
reading each test data of each recorded test case tested in each area of the system to determine a first data quantity corresponding to each test data.
Further, on the basis of the method provided by the foregoing embodiment, in the method provided by the embodiment of the present invention, in step S102, performing defect tracking on each piece of test data, and determining each piece of defect data with a test defect in each piece of test data, the method includes:
analyzing each test data to determine a first test condition of a test case corresponding to each test data;
and when the first test condition of the test case corresponding to the test data is tracked as test failure, determining the test data as defect data with test defects.
In the method provided by the embodiment of the invention, the defect data is data provided from each test data during development and test, and the test standard of the defect data during test in a development environment is limited or the defect data cannot be determined to be data with real defects because of generating some influence factors.
Further, on the basis of the method provided in the foregoing embodiment, in the method provided in this embodiment of the present invention, in step S103, analyzing each of the defect data based on each preset test criterion to analyze a plurality of target defect data from each of the defect data includes:
analyzing each piece of defect data based on each test standard to determine each second test condition when the test case corresponding to each piece of defect data is tested under each test standard;
and when all the second test conditions of the test cases corresponding to the defect data are test failures under all the test standards, determining the defect data as the target defect data.
In the method provided by the embodiment of the invention, the test standards corresponding to different environments are preset, so that each piece of defect data is retested on the test standards, and the defect data with defects is effectively determined. In fact, these test standards play a role in backup, and when the test case is determined as defect data under the test standards of the development environment, the test is executed again by using these test standards prepared in advance to determine whether the test case is determined as defect data under the test standards of the development environment, or determined as defect data due to other factors.
Further, on the basis of the method provided by the above embodiment, the method provided by the embodiment of the present invention further includes:
and storing each target defect data into the past defect database.
In the method provided by the embodiment of the present invention, after a plurality of target defect data are analyzed from each defect data, the target defect data need to be stored in a preset previous defect database, which may also be a previous test defect module.
Corresponding to the test defect analysis method shown in fig. 1, an embodiment of the present invention further provides a test defect analysis apparatus, which is used for implementing the method shown in fig. 1 specifically, and a schematic structural diagram of the apparatus is shown in fig. 2, where the apparatus includes:
a recording unit 201, configured to record each test data of each test case tested in each area of the system and determine a first data quantity corresponding to each test data when each test case is tested in each area of the system;
a tracking unit 202, configured to perform defect tracking on each piece of test data, and determine each piece of defect data with a test defect in each piece of test data;
a first analyzing unit 203, configured to analyze each piece of defect data based on each preset test standard, so as to analyze a plurality of pieces of target defect data from each piece of defect data, and determine a second data quantity corresponding to each piece of target defect data;
a determining unit 204, configured to determine, according to the first data amount and the second data amount, a ratio of each target defect data in each test data;
a comparing unit 205, configured to call a preset previous defect database, read a third data quantity corresponding to each previous defect data in the previous defect database, and compare the second data quantity with the third data quantity to obtain a comparison result;
a second analysis unit 206, configured to perform test defect analysis on the system based on the ratio and the comparison result, so as to obtain a defect analysis result of the system.
In the device provided by the embodiment of the invention, under the condition that each test case is tested in each area of the system, each test data of each test case tested in each area of the system is recorded, and the first data quantity corresponding to each test data is determined; performing defect tracking on each piece of test data, and determining each piece of defect data with a test defect in each piece of test data; analyzing each defect data based on each preset test standard so as to analyze a plurality of target defect data from each defect data and determine a second data quantity corresponding to each target defect data; determining the proportion value of each target defect data in each test data according to the first data quantity and the second data quantity; calling a preset previous defect database, reading a third data quantity corresponding to each previous defect data in the previous defect database, and comparing the second data quantity with the third data quantity to obtain a comparison result; and performing test defect analysis on the system based on the ratio and the comparison result to obtain a defect analysis result of the system. The device provided by the invention is used for comprehensively analyzing the test defects, and the accuracy of the test defect analysis is improved.
On the basis of fig. 2, referring to fig. 3, a further apparatus structure diagram of a test defect analysis apparatus is shown, which specifically includes:
on the basis of the apparatus provided in the above embodiment, in the apparatus provided in the embodiment of the present invention, the recording unit 201 includes:
the reading subunit 207 is configured to read each test data of each entered test case tested in each region of the system, so as to determine a first data quantity corresponding to each test data.
On the basis of the apparatus provided in the foregoing embodiment, in the apparatus provided in the embodiment of the present invention, the tracking unit 202 includes:
the analysis subunit 208 is configured to analyze each piece of test data to determine a first test condition of a test case corresponding to each piece of test data;
a first determining subunit 209, configured to determine, when the first test condition of the test case corresponding to the test data is tracked as a test failure, the test data as defect data with a test defect.
On the basis of the apparatus provided in the foregoing embodiment, in the apparatus provided in the embodiment of the present invention, the first analyzing unit 203 includes:
an analyzing subunit 210, configured to analyze each piece of defect data based on each piece of test standard, so as to determine each second test condition when the test case corresponding to each piece of defect data is tested under each piece of test standard;
a second determining subunit 211, configured to determine the defect data as the target defect data when all the second test cases of the test cases corresponding to the defect data tested under all the test standards are test failures.
On the basis of the device provided by the above embodiment, the device provided by the embodiment of the present invention further includes:
a storage subunit 212, configured to store each of the target defect data in the past defect database.
It should be noted that the test defect analysis method and apparatus provided by the present invention can be used in the field of big data or the financial field. The above description is only an example, and does not limit the application field of the test defect analysis method and apparatus provided by the present invention.
The embodiments in the present specification are described in a progressive manner, and the same and similar parts among the embodiments are referred to each other, and each embodiment focuses on the differences from the other embodiments. In particular, the system or system embodiments, which are substantially similar to the method embodiments, are described in a relatively simple manner, and reference may be made to some descriptions of the method embodiments for relevant points. The above-described system and system embodiments are only illustrative, wherein the units described as separate parts may or may not be physically separate, and the parts displayed as units may or may not be physical units, may be located in one place, or may be distributed on a plurality of network units. Some or all of the modules may be selected according to actual needs to achieve the purpose of the solution of the present embodiment. One of ordinary skill in the art can understand and implement it without inventive effort.
Those of skill would further appreciate that the various illustrative elements and algorithm steps described in connection with the embodiments disclosed herein may be implemented as electronic hardware, computer software, or combinations of both.
To clearly illustrate this interchangeability of hardware and software, various illustrative components and steps have been described above generally in terms of their functionality. Whether such functionality is implemented as hardware or software depends upon the particular application and design constraints imposed on the implementation. Skilled artisans may implement the described functionality in varying ways for each particular application, but such implementation decisions should not be interpreted as causing a departure from the scope of the present invention.
The previous description of the disclosed embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (10)
1. A method for analyzing test defects, comprising:
under the condition that each test case is tested in each area of the system, recording each test data of each test case tested in each area of the system, and determining the first data quantity corresponding to each test data;
performing defect tracking on each test data, and determining each defect data with test defects in each test data;
analyzing each piece of defect data based on each preset test standard so as to analyze a plurality of pieces of target defect data from each piece of defect data and determine a second data quantity corresponding to each piece of target defect data;
determining the proportion value of each target defect data in each test data according to the first data quantity and the second data quantity;
calling a preset previous defect database, reading a third data quantity corresponding to each previous defect data in the previous defect database, and comparing the second data quantity with the third data quantity to obtain a comparison result;
and performing test defect analysis on the system based on the ratio and the comparison result to obtain a defect analysis result of the system.
2. The method of claim 1, wherein the determining the first amount of data corresponding to each of the test data comprises:
reading each test data of each recorded test case tested in each area of the system to determine a first data quantity corresponding to each test data.
3. The method of claim 1, wherein performing defect tracking on each of the test data to determine each of the defect data with test defects in each of the test data comprises:
analyzing each test data to determine a first test condition of a test case corresponding to each test data;
and when the first test condition of the test case corresponding to the test data is tracked as test failure, determining the test data as defect data with test defects.
4. The method of claim 1, wherein analyzing each of the defect data based on respective predetermined test criteria to separate a plurality of target defect data from the respective defect data comprises:
analyzing each piece of defect data based on each test standard to determine each second test condition when the test case corresponding to each piece of defect data is tested under each test standard;
and when all the second test conditions of the test cases corresponding to the defect data are test failures under all the test standards, determining the defect data as the target defect data.
5. The method of claim 1, further comprising:
and storing each target defect data into the past defect database.
6. A test defect analysis apparatus, comprising:
the recording unit is used for recording each test data of each test case tested in each area of the system under the condition that each test case is tested in each area of the system, and determining the first data quantity corresponding to each test data;
the tracking unit is used for tracking the defects of the test data and determining each piece of defect data with test defects in the test data;
the first analysis unit is used for analyzing each piece of defect data based on each preset test standard so as to analyze a plurality of pieces of target defect data from each piece of defect data and determine the second data quantity corresponding to each piece of target defect data;
a determining unit, configured to determine, according to the first data amount and the second data amount, a ratio of each target defect data in each test data;
the comparison unit is used for calling a preset existing defect database, reading a third data quantity corresponding to each existing defect data in the existing defect database, and comparing the second data quantity with the third data quantity to obtain a comparison result;
and the second analysis unit is used for carrying out test defect analysis on the system based on the ratio and the comparison result to obtain a defect analysis result of the system.
7. The apparatus of claim 6, wherein the recording unit comprises:
the reading subunit is configured to read each piece of test data obtained by testing each entered test case in each area of the system, so as to determine a first data quantity corresponding to each piece of test data.
8. The apparatus of claim 6, wherein the tracking unit comprises:
the analysis subunit is used for analyzing each test data to determine a first test condition of a test case corresponding to each test data;
and the first determining subunit is used for determining the test data as the defect data with the test defect when the first test condition of the test case corresponding to the test data is tracked as the test failure.
9. The apparatus of claim 6, wherein the first analysis unit comprises:
the analysis subunit is configured to analyze each piece of defect data based on each piece of test standard to determine each second test condition when the test case corresponding to each piece of defect data is tested under each piece of test standard;
and a second determining subunit, configured to determine the defect data as the target defect data when all of the second test conditions of the test cases corresponding to the defect data tested under all of the test standards are test failures.
10. The apparatus of claim 6, further comprising:
and the storage subunit is used for storing each target defect data into the previous defect database.
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| CN116626574A (en) * | 2023-07-19 | 2023-08-22 | 深圳市华测半导体设备有限公司 | Reliability test method, system and storage medium of signal tester |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| CN116626574A (en) * | 2023-07-19 | 2023-08-22 | 深圳市华测半导体设备有限公司 | Reliability test method, system and storage medium of signal tester |
| CN116626574B (en) * | 2023-07-19 | 2023-09-19 | 深圳市华测半导体设备有限公司 | Reliability test method, system and storage medium of signal tester |
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