CN115165089B - Rectangular uniform sheet light source debugging method and device - Google Patents
Rectangular uniform sheet light source debugging method and device Download PDFInfo
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- G01—MEASURING; TESTING
- G01J—MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY
- G01J1/00—Photometry, e.g. photographic exposure meter
- G01J1/42—Photometry, e.g. photographic exposure meter using electric radiation detectors
- G01J1/4257—Photometry, e.g. photographic exposure meter using electric radiation detectors applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam
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Abstract
The invention provides a method and a device for debugging a rectangular uniform sheet light source, which are characterized in that the optical power of sub lasers is detected by densely distributing the detection surface of a sensor unit, an elliptical area illuminated by a single or a plurality of sub lasers on the detection surface is converted into a corresponding rectangle with relative width and length, a plurality of sub power areas are divided according to the heat absorbed by the illuminated area, each sub power area displays average power, the average power is represented by a number and a blocky area with different colors, and the sub lasers and an optical system are regulated by the displayed number and colors. The invention can humanize the relative width, length and power of single or multiple sub lasers in the illuminated area of the detection surface, improves the convenience of operators in the light source adjusting process, and realizes the rapid adjustment of the uniformity of the rectangular light source.
Description
Technical Field
The invention relates to the technical field of optics, in particular to a rectangular uniform sheet light source debugging method and device.
Background
Plane laser induced fluorescence (Planar Laser Induced Fluorescence, PLIF) is an optical detection technique widely used for scalar field measurement in fluids, and its principle is that some components in the fluid are excited by laser to emit fluorescence, and the characteristic scalar field (concentration field, temperature field or ph value field) in the range to be measured is obtained by detecting the distribution of fluorescence intensity.
PLIF measurement requires a planar laser as an induction laser sheet light source, and a cylindrical mirror is generally used to expand a single laser beam in the conventional technology. However, since the energy distribution of the cross section of the laser beam itself is not uniform, the laser beam can be spatially expanded into a sheet light source only by using a cylindrical mirror beam expansion, and the light intensity distribution cannot be changed. Although the Bawilt prism can improve the light intensity distribution of the sheet light source to a certain extent, the center light intensity of the sheet light source obtained by the Bawilt prism is less than two sides, the light intensity uniformity is generally not more than 70%, and the high-uniformity optical path is shorter. Therefore, the above method still has a problem of uneven light intensity distribution.
Patent CN111579485a proposes a uniform sheet light source system composed of a plurality of (more than 5) sub lasers side by side, which provides a better idea for developing a uniform sheet light source. However, when the number of the sub lasers is large (more than 10), the adjustment of the light intensity uniformity of the rectangular laser sheet light source is a time-consuming and labor-consuming task in practical application, because the adjustment of the laser uniformity needs to rely on a laser power meter to detect the uniformity of the sheet light source, but most of the current laser power meters are in a single-point test mode, if the measurement points are too dense, the debugging process is too long, and if the measurement points are too few, the uniformity of the sheet light source cannot be ensured.
Disclosure of Invention
The purpose of the invention is that: aiming at the defects in the background technology, a scheme capable of rapidly adjusting the uniformity of the light source of the sheet is provided.
In order to achieve the above purpose, the invention provides a method for debugging a rectangular uniform sheet light source, which is characterized in that the optical power of sub lasers is detected through the detection surface of a densely distributed sensor unit, an elliptical area illuminated by a single or a plurality of sub lasers on the detection surface is converted into a corresponding rectangle with relative width and length, a plurality of sub power areas are divided according to the heat absorbed by the illuminated area, each sub power area displays average power, the average power is represented by different colors and/or numbers, and the sub lasers and an optical system are regulated through the displayed power.
Further, the darker the block area color is represented when the power is larger.
Further, the detection surface is also arranged rectangular.
Further, the area of the sub-power region is adjustable.
Further, the minimum area of the sub-power region includes at least one sensor unit.
Further, adjusting the sub-lasers and the optical system includes adjusting power of the sub-lasers and adjusting a position of the optical system.
The invention also provides a rectangular uniform sheet light source debugging device, which adopts the method as described above and comprises a rectangular laser power detector, a power display and a signal transmission line, wherein the rectangular laser power detector is connected with the power display through the signal transmission line;
the rectangular laser power detector is provided with a rectangular detection surface, a plurality of sensor units are densely distributed on the detection surface, the sensor units transmit detected optical power signals to a power display, the power display can display the relative width and length of a single or a plurality of sub lasers in an illuminated area of the detection surface, the rectangular schematic diagram is divided into a plurality of sub power areas according to the power absorbed by the illuminated area, and the sub power areas are represented by different colors and/or numbers according to the average power.
The scheme of the invention has the following beneficial effects:
the method and the device for debugging the rectangular uniform sheet light source can display the relative width and the length of a single or a plurality of sub lasers in a detection surface illumination area, divide a rectangular schematic diagram on a power display into a plurality of sub power areas according to the heat absorbed by the illumination area, and represent the average power of the areas by different colors and numbers, so that operators can adjust the power of the plurality of sub lasers, the position of an optical system and the like according to the position and the color of the rectangular schematic diagram on the power display, the convenience of light source adjustment is improved, and the quick adjustment of the uniformity of the rectangular sheet light source is realized;
other advantageous effects of the present invention will be described in detail in the detailed description section which follows.
Drawings
FIG. 1 is a schematic view of a rectangular light source structure according to the present invention;
FIG. 2 is a schematic diagram of Gaussian distribution of the light intensity of a single laser light source in the invention;
FIG. 3 is a schematic view of a single laser source in accordance with the present invention;
FIG. 4 is a schematic diagram of a single laser power conversion in accordance with the present invention;
fig. 5 is a schematic diagram of a rectangular light source adjusting process in the present invention.
Detailed Description
In order to make the technical problems, technical solutions and advantages to be solved more apparent, the following detailed description will be given with reference to the accompanying drawings and specific embodiments. It will be apparent that the described embodiments are some, but not all, embodiments of the invention. All other embodiments, which can be made by those skilled in the art based on the embodiments of the invention without making any inventive effort, are intended to be within the scope of the invention. In addition, the technical features of the different embodiments of the present invention described below may be combined with each other as long as they do not collide with each other.
In the description of the present invention, it should be noted that the directions or positional relationships indicated by the terms "center", "upper", "lower", "left", "right", "vertical", "horizontal", "inner", "outer", etc. are based on the directions or positional relationships shown in the drawings, are merely for convenience of describing the present invention and simplifying the description, and do not indicate or imply that the devices or elements referred to must have a specific orientation, be configured and operated in a specific orientation, and thus should not be construed as limiting the present invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and are not to be construed as indicating or implying relative importance.
In the description of the present invention, for the sake of simplicity of explanation, the methodologies or rules are depicted and described as a series of acts, and are not intended to be exhaustive or limiting of the order of acts. For example, the experimental operations may be performed in various orders and/or concurrently, and include other experimental operations not described again. Furthermore, the described steps are not all necessary for the methods and algorithms described herein. Those skilled in the art will recognize and appreciate that the methodologies and algorithms can be represented by a state diagram or item as a series of interrelated states.
The embodiment of the invention provides a debugging method of a rectangular uniform sheet light source, wherein the rectangular sheet light source consists of a plurality of sub lasers, as shown in fig. 1. Comprising a plurality of sub-lasers and a plurality of optical systems. The sub lasers are used for generating and emitting laser beams, the wavelengths of the laser beams are the same, the energy distribution of the cross sections is Gaussian or quasi-Gaussian, the light outlets of the sub lasers are located in the same plane and are arranged at equal intervals, and the connecting lines of the light outlets are perpendicular to the emitting direction of the laser beams. The plurality of optical systems are in one-to-one correspondence with the plurality of sub lasers, each optical system is arranged on the light path of the laser beam emitted by the corresponding sub laser and used for shaping the laser beam to form a sub-fan-shaped piece beam, the sub-fan-shaped piece beams are overlapped in a preset area to form planar laser, and the beam expansion angles and the thicknesses of the sub-fan-shaped piece beams are the same.
It can be understood that the multiple sub-lasers generate and emit laser beams with the same wavelength under the ideal state, that is, the wavelengths of the laser beams emitted by the multiple sub-lasers are the same, so that the frequency of the sub-fan-shaped piece beams corresponding to each sub-laser is ensured to be the same, and the uniformity of the finally formed planar laser is ensured.
However, in practical application, the primary laser beam parameters of the sub-lasers have deviation, and the positions of the sub-lasers and the optical systems also have deviation, especially when the sub-lasers and the corresponding optical systems are more, the generated rectangular light sources are not uniform any more, and the corresponding purpose cannot be achieved, so that the sub-lasers and the optical systems need to be debugged.
For the rectangular sheet light source, the debugging device comprises a rectangular laser power detector, a power display and a signal transmission line, wherein the rectangular laser power detector is connected with the power display through the signal transmission line.
The rectangular laser power detector is provided with a rectangular detection surface, after the detection surface of the rectangular laser power detector is irradiated by a single or a plurality of sub lasers, sensor units distributed on the detection surface transmit signals to a power display (the principle is the same as that of a conventional power meter and the photoelectric conversion principle is not repeated), the relative width and the length of the single or the plurality of sub lasers on the detection surface can be displayed on the power display, a rectangular schematic diagram on the power display is divided into a plurality of sub power areas according to the heat absorbed by the illumination areas, and the average power of the areas is represented by different colors and numbers. An operator can adjust the power of the multiple sub lasers, the position of the optical system and the like according to the position and the color of the rectangular schematic diagram on the power display, so that the uniformity of the rectangular sheet light source is quickly adjusted.
Compared with the traditional single-point detection and debugging mode, the method not only can display the power on the rectangular detection surface and represent the power in each partitioned area, but also can calculate the standard deviation of the laser power of each partitioned area and the like, and helps operators to quickly modulate the uniform rectangular sheet light source.
By way of further illustration, the effect of each sub-laser irradiation may be as shown in fig. 5-a before the laser light sources are not tuned. According to the light source characteristics of the prior known single laser, such as the Gaussian distribution of the light intensity of the single laser light source (shown in fig. 2) and the irradiation effect of the single laser light source (shown in fig. 3), and the measurement principle of a laser power meter, the method provides a rectangular laser power detector, when a plurality of laser light sources irradiate the detection surface of the rectangular laser power detector, a sensor unit of the detection surface converts a certain irradiation area into an equivalent rectangle and displays the equivalent rectangle on a power display (shown in fig. 5-b), the rectangle divides a plurality of subareas according to the detected heat, each subarea displays the average power of the area, the subareas are symmetrical about the axis of the laser according to the light intensity distribution characteristics of the single laser light source (shown in fig. 4), the power distribution of the subareas is p-n, p-2, p-1, p1, p2 and pn, and the subareas are divided into colors with different depths according to the power sizes, so that operators can observe the difference of the power more easily. Then, an operator can adjust the optical system of the sub-laser according to the relative positions of the rectangular areas in fig. 5-b, and can adjust the power of the sub-laser according to the color shades of the areas, and the like, when the rectangle on the display is adjusted to 5-c from fig. 5-b, the adjustment of the rectangular light source can be completed, and finally the rectangular light source with better uniformity is shown in fig. 5-d.
Preferably, a darker color display may be used when the power is greater, facilitating operator observation of the power distribution.
The more the number of the rectangular subareas on the power display is, the more the display of the power is refined and clear. As the minimum area of the sub-power area at least comprises one sensor unit, it can be understood that when the sensor units on the detection surface of the rectangular laser power detector are densely distributed, the detection precision of the rectangular laser power detector is higher, and the rectangular sheet light source can be more conveniently and rapidly debugged uniformly by an operator.
After the method provided by the embodiment is adopted to finish the debugging of the rectangular uniform sheet light source, the rectangular uniform sheet light source can be packaged in a box-type structure and used as a planar laser source for PLIF measurement and the like.
Based on the same inventive concept, the embodiment also provides a rectangular uniform sheet light source debugging device, which comprises a rectangular laser power detector, a power display and a signal transmission line, wherein the rectangular laser power detector is connected with the power display through the signal transmission line.
The rectangular laser power detector is provided with a rectangular detection surface, a plurality of sensor units are densely distributed on the detection surface, the sensor units transmit detected optical power signals to a power display, the power display can display the relative width and length of a single or a plurality of sub lasers in an illuminated area of the detection surface, the rectangular schematic diagram is divided into a plurality of sub power areas according to the heat absorbed by the illuminated area, and the sub power areas are represented by different colors according to the average power.
The area of the sub-power area which can be displayed by the power display is adjustable, and at least one sensor unit is included in the minimum area of the sub-power area to ensure the display rationality. When the sub-power region includes only one sensor unit, the power displayed by the sub-power region is the optical power detected by the sensor unit. The minimum area of the sub-power region preferably includes four sensor units, and the power displayed in the region can be averaged by the measured values of the plurality of sensor units, so that accuracy is improved.
Of course, the number of the sensor units is not as large as possible, and the processing and manufacturing difficulties, heat dissipation reliability and the like of the rectangular laser power detector are improved by the excessive sensor units.
While the foregoing is directed to the preferred embodiments of the present invention, it will be appreciated by those skilled in the art that various modifications and adaptations can be made without departing from the principles of the present invention, and such modifications and adaptations are intended to be comprehended within the scope of the present invention.
Claims (6)
1. A rectangular uniform sheet light source debugging method is characterized in that the optical power of sub lasers is detected by densely distributing the detection surface of a sensor unit, a plurality of oval areas illuminated by the sub lasers on the detection surface are converted into corresponding rectangles with relative widths and lengths, a plurality of sub power areas are divided according to the heat absorbed by the illuminated areas, each sub power area displays average power, the average power is represented by numbers and/or blocky areas with different colors, and the sub lasers and an optical system are regulated by the displayed power;
the adjustment of the sub-lasers and the optical system comprises power adjustment of the sub-lasers and position adjustment of the optical system, when a plurality of laser light sources irradiate the detection surface of the rectangular laser power detector, a sensor unit of the detection surface converts a certain irradiation area into an equivalent rectangle and displays the equivalent rectangle on a power display, an operator adjusts the optical system of the sub-lasers according to the relative positions of the rectangular areas, and adjusts the power of the sub-lasers according to the color depth of the rectangular areas until the rectangular sheet light sources are uniform.
2. The method of claim 1, wherein the darker the color of the block area is indicated as the power is greater.
3. The method of claim 1, wherein the detection surface is also rectangular.
4. The method for adjusting a rectangular uniform sheet light source according to claim 1, wherein the area of the sub-power region is adjustable.
5. The method of claim 1, wherein the minimum area of the sub-power region comprises at least one sensor unit.
6. A rectangular uniform sheet light source debugging device adopting the method as claimed in any one of claims 1-5, and comprising a rectangular laser power detector, a power display and a signal transmission line, wherein the rectangular laser power detector is connected with the power display through the signal transmission line;
the rectangular laser power detector is provided with a rectangular detection surface, a plurality of sensor units are densely distributed on the detection surface, the sensor units transmit detected optical power signals to a power display, the power display can convert an elliptical area illuminated by a single or a plurality of sub lasers on the detection surface into a corresponding rectangle with relative width and length, the rectangular schematic diagram is divided into a plurality of sub power areas according to the heat absorbed by the illuminated area, and the sub power areas are represented by different colors and/or numbers according to the average power.
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Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101581770A (en) * | 2009-06-30 | 2009-11-18 | 上海半导体照明工程技术研究中心 | Method for testing lumen efficiency of LED lamps |
CN103196554A (en) * | 2013-03-14 | 2013-07-10 | 合肥京东方光电科技有限公司 | System and method for testing and adjusting light intensity uniformity of light source |
CN105530498A (en) * | 2015-12-15 | 2016-04-27 | 深圳市时代华影科技股份有限公司 | 3D projection system capable of compensating uniformity of metal curtain and compensation method thereof |
JP2017054772A (en) * | 2015-09-11 | 2017-03-16 | 東芝ライテック株式会社 | Lighting method and lighting system |
CN109696240A (en) * | 2018-12-26 | 2019-04-30 | 信利光电股份有限公司 | Detection method, device and the readable storage medium storing program for executing of the semiconductor laser overall situation uniformity |
CN111579485A (en) * | 2020-05-27 | 2020-08-25 | 叶冠中 | Uniform sheet light source |
CN112649090A (en) * | 2020-12-25 | 2021-04-13 | 西安隆基绿能建筑科技有限公司 | Irradiation correction method and device and computer storage medium |
Family Cites Families (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
EP2210143B1 (en) * | 2007-10-26 | 2018-08-15 | Dolby Laboratories Licensing Corporation | Laser illuminated backlight for flat panel displays |
JP2014053286A (en) * | 2012-08-09 | 2014-03-20 | Canon Inc | Brightness calculation device, brightness calculation device controlling method, and display device |
-
2022
- 2022-08-03 CN CN202210926363.2A patent/CN115165089B/en active Active
Patent Citations (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101581770A (en) * | 2009-06-30 | 2009-11-18 | 上海半导体照明工程技术研究中心 | Method for testing lumen efficiency of LED lamps |
CN103196554A (en) * | 2013-03-14 | 2013-07-10 | 合肥京东方光电科技有限公司 | System and method for testing and adjusting light intensity uniformity of light source |
JP2017054772A (en) * | 2015-09-11 | 2017-03-16 | 東芝ライテック株式会社 | Lighting method and lighting system |
CN105530498A (en) * | 2015-12-15 | 2016-04-27 | 深圳市时代华影科技股份有限公司 | 3D projection system capable of compensating uniformity of metal curtain and compensation method thereof |
CN109696240A (en) * | 2018-12-26 | 2019-04-30 | 信利光电股份有限公司 | Detection method, device and the readable storage medium storing program for executing of the semiconductor laser overall situation uniformity |
CN111579485A (en) * | 2020-05-27 | 2020-08-25 | 叶冠中 | Uniform sheet light source |
CN112649090A (en) * | 2020-12-25 | 2021-04-13 | 西安隆基绿能建筑科技有限公司 | Irradiation correction method and device and computer storage medium |
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