CN115131286A - Method for adjusting parallelism of motion coordinate system and camera coordinate system of micro-scanning platform - Google Patents
Method for adjusting parallelism of motion coordinate system and camera coordinate system of micro-scanning platform Download PDFInfo
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Abstract
The invention discloses a parallelism adjusting method of a micro-scanning platform moving coordinate system and a camera coordinate system, which can help an instrument assembler conveniently and intuitively adjust and install the parallelism of the scanning platform moving coordinate system and the camera coordinate system, reduce the working difficulty and the intensity of technicians and simultaneously ensure the efficiency and the precision, so that the scanning platform moving coordinate system is basically parallel to the camera coordinate system, the spliced images keep the edges in the horizontal direction or the vertical direction to be flush when the images are spliced, thereby saving the edge cutting work of the spliced images, avoiding the reduction of visual field contents of the spliced images caused by the edge cutting, solving the problem of the installation parallelism of the micro-scanning platform moving coordinate system, ensuring the parallelism adjustment of the moving coordinate system and the camera coordinate system to meet the precision requirement, ensuring the accuracy of the later-stage image splicing and the stability of a moving multi-visual field acquisition image, has wide application prospect in the medical pathological slide microscopic vision automatic detection industry.
Description
Technical Field
The invention relates to the technical field of medical information acquisition and detection and clinical medicine, in particular to a method for adjusting parallelism between a motion coordinate system and a camera coordinate system of a micro-scanning platform.
Background
With the development of science and technology, the advance of intelligent medical treatment will bring huge promotion. The inspectors do not need to perform high-intensity and tedious manual microscopic examination work any more, and can complete all work by regularly auditing the informationized result and assisting diagnosis. Compared with the traditional microscope, the automatic microscopic scanning platform has the characteristics of convenience, accuracy and high efficiency, and is widely applied in various aspects. The traditional microscope microscopic examination is no longer suitable for the conditions of large number of samples to be examined and tight microscopic examination result obtaining time, the microscopic examination result is influenced by the conditions of visual fatigue and the like easily caused by manual long-time microscopic examination operation, and the time and the labor are consumed and the efficiency is low caused by repeated focusing operation of the manual microscopic examination, so that the automatic microscopic scanner is born. With the rapid development of digital image technology, images can be easily captured, edited and stored through various ways, and the automatic microscopic scanner can complete automatic focusing, so that microscopic examination is more efficient and accurate, the use cost is greatly reduced, and the microscopic examination result time is shortened.
The automatic micro scanner is mainly influenced by the installation precision of the scanning platform, the installation precision plays a key role in the working performance, efficiency, accuracy and the like of the scanner, and the imaging principle requires that the moving coordinate system of the scanning platform and the adjustment of the camera coordinate system have higher parallelism requirement, so the requirement on installation and debugging is higher.
However, there is no special instrument and method for measuring the installation parallelism of the moving direction, and only rough leveling installation is used. Therefore, the requirement on the parallelism precision of the motion coordinate system and the camera coordinate system in the motion process of the scanning platform is difficult to guarantee, and meanwhile, installation personnel are required to have higher technical level. In the case shown in fig. 1, the thick solid line represents the calibration line on the calibration slide, the thin solid line represents the field of view of the slide in the parallel case, and the thick dotted line represents the actual acquisition (non-parallel) of the calibration line in the camera. In addition, as shown in fig. 2, the calibration slide with the specially-made calibration line, which is actually sampled, is subjected to image acquisition to obtain a plurality of visual field images, and then the acquired images are spliced. The splicing method mainly comprises the following two methods: geometrically stitched images, image recognition stitched images, as shown in fig. 3. The acquired images are directly geometrically spliced, so that the final spliced image has a larger difference with the view field image under the parallel condition regardless of the actual content in the images; the image identification and splicing can obtain the image content by the image identification fusion splicing method, and the view image content is consistent with that under the parallel condition, but the spliced image still needs to be cut so as to obtain the complete view image.
Therefore, in the actual scanning process, due to the problems of installation accuracy and the like, the problems of inconsistent image content, overlarge image region dislocation and the like often occur in the collected view images in the splicing process, and finally the spliced images fail, the automatic scanning and collecting work cannot be continued, or the spliced images cannot meet the requirements of subsequent work.
Disclosure of Invention
Aiming at the technical problems, the invention provides a method for adjusting the parallelism between a motion coordinate system of a microscopic scanning platform and a camera coordinate system, which keeps the motion coordinate system of the scanning platform basically parallel to the camera coordinate system, namely keeps the running direction basically parallel to the X direction and the Y direction of the camera coordinate system when the scanning platform moves along the X axis and the Y axis, so that a complete view field image under the condition that the coordinate systems are parallel can be well obtained no matter geometric splicing or image recognition fusion splicing is adopted during image splicing.
In order to achieve the above purpose, the invention provides the following technical scheme:
the invention provides a method for adjusting parallelism of a motion coordinate system and a camera coordinate system of a microscopic scanning platform, which comprises the following steps:
the method comprises the following steps: placing a calibration slide on a scanning platform and ensuring clear image collection;
step two: setting a coordinate system: setting the long side direction of the slide as an X direction, the short side direction of the slide as a Y direction and the upper left corner of the slide as an origin O by taking a camera coordinate system as a reference coordinate system and keeping the camera coordinate system fixed;
step three: collecting an image containing a calibration line head field of view and fitting an equation: firstly, finding a slide head view field containing a calibration line, acquiring an image under the head view field, carrying out weighted least square fitting on the calibration line in the image of the head view field, and then obtaining coordinates (x ') of two end points' 0 ，y′ 0 ) And (x' 1 ，y′ 1 ) And then determining an equation of the calibration line under the head field of view: k is 1 x+b 1 ，k 1 Calibrating line slope for first field of view, b 1 Calibrating a line intercept for the first field of view;
step four: fields of view are collected along the X direction and a line equation is fitted to each field of view calibration: collecting a plurality of fields of view along the X direction, obtaining coordinates of two end points by a calibration line under each field of view through linear fitting, and expressing the equations of the calibration lines of the plurality of fields of view by using the coordinates of the two end points;
step five: obtaining the angle and the direction to be adjusted of the scanning platform: averaging the calibration line slopes across all fields of view
Obtaining the angle theta to be adjusted and the adjusting direction of the scanning platform
When the scanning platform is in the normal state, clockwise adjusting the angle theta of the scanning platform; when in use
When the scanning platform is in use, the scanning platform is adjusted counterclockwise by an angle of (180-theta);
step six: verifying an adjustment effect circulation adjustment platform according to the spliced image: repeating the third step and the fourth step, carrying out image recognition fusion splicing on all the fields of vision, and if the upper and lower edges of all the fields of vision are not parallel and level or the slopes of the calibration lines in all the fields of vision are not equal to each other, continuing to adjust according to the fifth step;
step seven: and judging the adjustment condition, judging whether the parallelism of the two coordinate systems meets the requirement, if so, ending, otherwise, repeating the step six until the upper edges and the lower edges of all the spliced vision field images are flush, the slope of the calibration lines in all the vision fields are equal, the intercept is equal, and the mean value of the slope of the calibration lines in all the vision fields is also used as the reference of the adjustment angle in the adjustment process.
Compared with the prior art, the invention has the beneficial effects that:
the invention provides a parallelism adjusting method of a motion coordinate system of a micro-scanning platform and a camera coordinate system, which can help an instrument assembler conveniently and intuitively adjust and install the parallelism of the motion coordinate system of the scanning platform and the camera coordinate system, reduce the working difficulty and the intensity of technicians and simultaneously ensure the efficiency and the precision, so that the motion coordinate system of the scanning platform is basically parallel to the camera coordinate system, namely, when the scanning platform moves along two directions of an X axis and a Y axis, the running direction is kept to be basically parallel to the X direction and the Y direction of the camera coordinate system, thus the edges of the spliced images in the horizontal direction or the vertical direction are kept to be flush when the images are spliced so as to save the edge cutting work of the spliced images, the reduction of the visual field content of the spliced images caused by the edge cutting is avoided, the problem of the installation parallelism of the motion coordinate system of the micro-scanning platform is solved, and the method has important significance for maintaining the stable image acquisition of an automatic micro-scanner, the parallelism adjustment of the motion coordinate system and the camera coordinate system meets the precision requirement, the accuracy of later image splicing and the stability of motion multi-view acquisition images are ensured, and the method has wide application prospect in the medical pathological slide micro-vision automatic detection industry.
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In order to more clearly illustrate the embodiments of the present application or technical solutions in the prior art, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments described in the present invention, and other drawings can be obtained by those skilled in the art according to the drawings.
FIG. 1 shows the parallelism correspondence between the slide field camera coordinate system and the motion coordinate system.
FIG. 2 is a calibration slide with a specially prepared calibration line.
FIG. 3 is an illustration of an example scanning platform adjustment based on the image method.
Fig. 4 is a comparison diagram of image geometric stitching and recognition fusion stitching when the camera coordinate system and the motion coordinate system are not parallel according to the embodiment of the present invention.
Fig. 5 is a flowchart of a method for fitting a calibration line by weighted least squares according to an embodiment of the present invention.
Fig. 6 is a schematic view of identifying, fusing and splicing XY two-directional actual view images in a camera coordinate system according to an embodiment of the present invention.
Fig. 7 is a flowchart illustrating parallelism adjustment of a motion coordinate system and a camera coordinate system of a micro-scanning platform according to an embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention are clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are some, not all, embodiments of the present invention. The embodiments of the present invention, and all other embodiments obtained by those skilled in the art without making any creative efforts, belong to the protection scope of the present invention.
The invention provides a method for adjusting parallelism between a motion coordinate system of a microscopic scanning platform and a camera coordinate system, which is established on the basis that the camera coordinate system is fixed and is a reference coordinate system, and can judge the parallel relation between the motion coordinate system of the current scanning platform and the camera coordinate system based on a geometric method or an image recognition method.
The motion coordinate system of the scanning platform and the coordinate system of the camera in an ideal state are nearly parallel, the edges of images of different visual fields shot by the step motion of the scanning platform along the X direction or the Y direction after the images are spliced are flush, and the image content is consistent with that of an actual slide specimen.
Firstly, assuming that the direction of a long edge of a slide is X direction, the direction of a short edge is Y direction and the upper left corner of the slide is an original point O, calibrating and adjusting a scanning platform of a calibration slide with a specially-made calibration line to enable a motion coordinate system of the calibration slide to be parallel to a camera coordinate system, wherein the calibration line is parallel to the edge of the slide where the calibration line is located. The slope of the calibration line on the calibration slide in the motion coordinate system of the scanning platform is 0, and the equation can be expressed as follows:
y＝b o
b 0 the intercept of the calibration line in the scanning platform motion coordinate system is shown.
And collecting a plurality of visual fields for the calibration slide, wherein the number of the visual fields is specified by an adjusting person, and is preferably more than 3 visual fields. The first field of view containing the calibration line is preferentially found in the acquired fields of view and is taken as the first field of view, and then the acquisition fields of view are performed along the X direction, as shown in FIG. 4.
Taking the first view img1 as an example, the collected view image includes a calibration line, and the image recognition straight line fitting algorithm can perform straight line fitting on the calibration line in the view to obtain coordinate expressions (x ') of two end points in the camera coordinate system' 0 ，y′ 0 ) And (x' 1 ，y′ 1 ) And obtaining a calibration line equation under the view according to the two-point linear equation:
simplifying to obtain:
k 1 calibrating line slope for first field of view, b 1 The line intercept is calibrated for the first field of view.
The method comprises the steps of firstly extracting edge contours by utilizing a Sobel algorithm, determining the number of contour points participating in fitting, aiming at improving fitting efficiency, randomly selecting points from all contour point sets according to the number of the selected contour points to approximately fit a straight line, then calculating the distance from each point on the original contour to the fitted straight line, determining an abnormal distance range according to a standard deviation mode in statistics and a set parameter threshold, and if the distance from a certain point to the fitted straight line is within the abnormal distance range, regarding the point as an abnormal point and removing the abnormal point. If 100 points are assumed to participate in fitting the straight line, wherein 20 points are abnormal points deviating from the straight line, 100 points correspond to 100 statistical values in a standard deviation mode, and the abnormal points are removed after being sorted from large to small according to the distance from the straight line. If all the abnormal points participate in the fitting of the straight line, the fitted straight line and the actual straight line have deviation because abnormal values are mixed, so in order to ensure the accuracy of the fitting, the method can control the number of the abnormal points to be eliminated by setting a parameter threshold, and the smaller the value, the more the abnormal points appear when the abnormal points participate in the fitting, and the lower the accuracy of the fitting. Because the distance value distribution from each contour point to the fitting straight line approximately follows normal distribution, the parameter threshold value is generally set to 1-3 according to the 3 sigma criterion of the normal distribution. In order to effectively improve the fitting precision, the iteration times need to be reasonably controlled, and the iteration times are selected as 5 times by default. The more the iteration times, the fewer the points participating in the fitting, and the lower the fitting accuracy; the fewer the number of iterations, the more outliers that participate in the fit, and the lower the accuracy of the fit. The calibration line fitting process flow is shown in fig. 5.
Similarly, in each field of view, the equation of the calibration line in the current field of view can be expressed by using the coordinates of the two endpoints after the calibration line is fitted by the calibration line in the camera coordinate system, that is, the equation of the calibration line in each field of view of img1 to img n can be expressed as follows:
where k is the slope of the calibrated line equation in the field of view and b is the intercept of the calibrated line equation in the field of view.
After all the fields of view are obtained, the slope of the calibration line equation in all the fields of view is averaged, and the average value is used as an adjustment reference, so that errors caused by factors such as pixel points, light sources and the like in the process of acquiring images or identifying end points are reduced. Thus, the average of the slopes:
so as to obtain the angle θ that the scanning platform needs to be adjusted:
in the formula, theta belongs to [0, pi ]). When the temperature is higher than the set temperature
When the scanning platform is in the normal state, clockwise adjusting the angle theta of the scanning platform; when in use
And when the scanning platform is adjusted by an angle (180 degrees-theta) anticlockwise, the X-axis direction of the motion coordinate system of the scanning platform can be adjusted, so that the X-axis of the motion coordinate system is approximately parallel to the X-axis of the camera coordinate system.
After the adjustment is finished, collecting a plurality of visual fields for the calibration slide again, obtaining calibration line equations in all the visual fields simultaneously, and performing image recognition, fusion and splicing on all the visual fields, as shown in fig. 6. And if the upper edge and the lower edge of each visual field image in the spliced images are not level, calculating the average slope of the calibration line equation of each visual field again according to the steps to obtain the angle theta to be adjusted and finishing the adjustment of the scanning platform.
Until the slope of the calibrated line equation in each field of view is equal, the intercept is also equal, i.e., the calibrated lines in the image stitched by each field of view are collinear and the top and bottom edges of all fields of view are level. And the slope in the actual calibration line equation is 0, the collection is completed again after the scanning platform is adjusted, and if the slopes of the calibration line in all the fields of view are equal to the slope of the actual calibration line, namely the slopes of the calibration line in all the fields of view are equal to the slope of the actual calibration line
Then the calibration lines in all the fields of view coincide with the actual calibration line, and the equation of the calibration line in the camera coordinate system is:
y＝b (7)
however, in the actual process, the influence caused by the error cannot be completely eliminated, so that the angle θ to be adjusted obtained before the final adjustment in the adjustment process is less than 0.5 ° or θ meets the requirements of the application scenario, and it can be approximately considered that the calibration lines in all the fields of view coincide with the actual calibration lines.
The actual calibration line in the camera coordinate system is parallel to the X direction, and the long side and the short side of the slide are respectively parallel to the X, Y direction of the camera coordinate system according to the fact that the calibration line is parallel to the edge of the slide. Additionally, the slide is in the coordinate system of the surface, namely the motion coordinate system of the scanning platform, so that the X, Y direction of the camera coordinate system and the X, Y direction of the motion coordinate system of the scanning platform are respectively parallel. In short, the representation of the calibration line under the two coordinate systems is similar, and the slopes are equal, so that the two coordinate systems are parallel, i.e. the parallelism of the camera coordinate system and the motion coordinate system of the scanning platform meets the adjustment requirement.
The invention provides a method for adjusting parallelism between a motion coordinate system of a microscopic scanning platform and a camera coordinate system through the analysis process, which adjusts the scanning platform to enable the motion coordinate system to be parallel to the camera coordinate system, is convenient for stable acquisition of each view image of the scanning platform and splicing display of subsequent view images, and has the flow shown in fig. 7, and specifically comprises the following steps:
the method comprises the following steps: and placing a calibration slide on the scanning platform and ensuring clear image collection. And placing the calibration slide with the specially-made calibration line on a microscopic scanning platform, and finding out a focal plane image of the current field of view of the slide through automatic focusing to ensure that the contour of the calibration line in the acquired field of view image is clear and visible.
Step two: a coordinate system is set. The camera coordinate system is used as a reference coordinate system, the camera coordinate system is kept fixed, the long side direction of the slide is set to be an X direction, the short side direction is set to be a Y direction, and the upper left corner of the slide is set to be an origin O.
Step three: an image containing the calibration line head field of view is acquired and an equation is fitted. Firstly, finding a slide head view field containing a calibration line, acquiring an image under the head view field, carrying out weighted least square fitting on the calibration line in the view field image, and then obtaining coordinates (x ') of two end points' 0 ，y′ 0 ) And (x' 1 ，y′ 1 ) And then determining an equation for a calibration line under the field of view: k 1 x+b 1 。
Step four: the fields of view are collected along the X direction and a line equation is fit to each field of view. And a plurality of visual fields are collected along the X direction, the number of the visual fields is set by an adjusting person, and preferably more than 3 visual fields are selected. The calibration line under each field of view is fitted by a straight line to obtain an end point, and the equation can be expressed by coordinates of the two end points.
Step five: and acquiring the angle and the direction to be adjusted of the scanning platform. Averaging the calibration line slopes across all fields of view
Obtaining the angle theta to be adjusted and the adjusting direction of the scanning platform
When the scanning platform is in the normal state, clockwise adjusting the angle theta of the scanning platform; when the temperature is higher than the set temperature
And when the scanning platform is adjusted counterclockwise by an angle (180 degrees to theta), the motion coordinate system of the scanning platform can be adjusted to enable the marked line to coincide with the actual marked line in the field of view.
Step six: and verifying the adjustment effect cycle adjustment platform according to the spliced image. And repeating the third step and the fourth step, carrying out image recognition fusion splicing on all the fields of vision, and if the upper and lower edges of all the fields of vision are not parallel and level or the slopes of the calibration lines in all the fields of vision are not equal to each other, continuing to adjust according to the fifth step.
Step seven: and judging the adjustment condition, wherein the parallelism of the two coordinate systems meets the requirement. And repeating the sixth step until the upper edges and the lower edges of all the spliced visual field images are flush, the slope of the calibration lines in all the visual fields is equal, the intercept is equal, and the mean value of the slope of the calibration lines in all the visual fields is also used as the reference for adjusting the angle in the adjusting process.
If the angle theta to be adjusted in the last adjustment process is smaller than 0.5 degrees or theta meets the specified requirements of the application scene, the adjustment operation can be considered to be finished. The calibration line equations for all views at this time are: and y is b, namely the calibration line in the visual field is coincident with the actual calibration line, and the actual calibration line is parallel to the edge of the slide, namely the calibration line in the visual field is parallel to the edge of the slide. According to the selection of the motion coordinate system of the scanning platform, the calibration line in the visual field is parallel to the X direction of the coordinate system of the scanning platform, and the calibration line in the visual field is determined according to the camera coordinate system, so that the X axis of the motion coordinate system of the scanning platform is parallel to the X axis of the camera coordinate system. Both are Cartesian coordinate systems, namely the included angle between the X axis and the Y axis is 90 degrees and conforms to the rule of right hand, so that the camera coordinate system can be obtained to be parallel to the motion coordinate system of the scanning platform, namely the parallelism of the camera coordinate system and the motion coordinate system of the scanning platform meets the adjustment requirement.
The invention provides a method for adjusting parallelism between a camera coordinate system formed by a moving coordinate system and a fixed camera of a microscopic automatic scanning platform of a medical pathological slide during installation, and provides a new idea for reasonable installation and adjustment of the microscopic automatic scanning platform, so that the problem that the scanning platform cannot accurately finish high-efficiency splicing of acquired visual field images due to unqualified parallelism is solved, the processing efficiency of the automatic scanning process can be effectively improved, the difficulty in realizing later-stage geometric splicing or image recognition fusion splicing processes is reduced, and the method has wide application prospect in the automatic microscopic vision detection industry of the medical pathological slide.
The results show that: the method for adjusting the parallelism of the moving coordinate system and the camera coordinate system of the microscopic scanning platform provides a basis for a reference installation method when the acquisition requirement of the slide field image information is subsequently and practically applied, the difficulty of stable acquisition and splicing of images is simplified, the speed is more efficient, the requirements of rapid image acquisition, splicing and display of microscopic visual inspection of medical pathological slide samples can be met, and the installation, adjustment and use scenes of most medical pathological slide scanning platforms can be basically met.
The above-mentioned embodiments are only specific embodiments of the present application, and are used for illustrating the technical solutions of the present application, but not limiting the same, and the scope of the present application is not limited thereto, and although the present application is described in detail with reference to the foregoing embodiments, those skilled in the art should understand that: those skilled in the art can still make modifications or easily conceive of changes to the technical solutions described in the foregoing embodiments, or make equivalents to some of them, within the technical scope of the present disclosure; such modifications, changes or substitutions do not depart from the spirit and scope of the embodiments of the present application. Are intended to be covered by the scope of the present application. Therefore, the protection scope of the present application shall be subject to the protection scope of the claims.
Claims (4)
1. A method for adjusting parallelism of a motion coordinate system and a camera coordinate system of a micro-scanning platform is characterized by comprising the following steps:
the method comprises the following steps: placing a calibration slide on a scanning platform and ensuring clear image collection;
step two: setting a coordinate system: setting the long side direction of the slide as an X direction, the short side direction of the slide as a Y direction and the upper left corner of the slide as an origin O by taking a camera coordinate system as a reference coordinate system and keeping the camera coordinate system fixed;
step three: collecting an image containing a calibration line head field of view and fitting an equation: firstly, finding a slide head view field containing a calibration line, acquiring an image under the head view field, carrying out weighted least square fitting on the calibration line in the image of the head view field, and then obtaining coordinates (x ') of two end points' 0 ，y′ 0 ) And (x' 1 ，y′ 1 ) And then determining an equation of the calibration line under the head field of view: k is 1 x+b 1 ，k 1 Line slope is calibrated for the first field of view, b 1 Calibrating a line intercept for the first field of view;
step four: fields of view are collected along the X direction and a line equation is fitted to each field of view calibration: collecting a plurality of fields of view along the X direction, obtaining coordinates of two end points by a calibration line under each field of view through linear fitting, and expressing the equations of the calibration lines of the plurality of fields of view by using the coordinates of the two end points;
step five: acquisition broomTracing the angle and direction to be adjusted of the platform: averaging the calibration line slopes across all fields of view
Obtaining the angle theta to be adjusted and the adjusting direction of the scanning platform
When the scanning platform is in the normal state, clockwise adjusting the angle theta of the scanning platform; when in use
When in use, the scanning platform is adjusted counterclockwise by an angle of (180-theta);
step six: verifying the adjustment effect circulation adjustment platform according to the spliced image: repeating the third step and the fourth step, performing image recognition fusion splicing on all the fields of vision, and if the upper and lower edges of all the fields of vision are not parallel or the slopes of the calibration lines in all the fields of vision are not equal to each other, continuing to adjust according to the fifth step;
step seven: and judging the adjustment condition, judging whether the parallelism of the two coordinate systems meets the requirement, if so, ending, otherwise, repeating the step six until the upper edges and the lower edges of all the spliced vision field images are flush, the slope of the calibration lines in all the vision fields are equal, the intercept is equal, and the mean value of the slope of the calibration lines in all the vision fields is also used as the reference of the adjustment angle in the adjustment process.
2. The method for adjusting the parallelism of a motion coordinate system and a camera coordinate system of a microscopic scanning platform according to claim 1, wherein the three-step equation fitting process comprises: the method comprises the steps of firstly, extracting an edge contour by utilizing a Sobel algorithm, determining the number of contour points participating in fitting, determining fitting iteration times, randomly selecting points from a contour point set according to the selected number of contour points to approximately fit a straight line, then calculating the distance from each point on the original contour to the fitted straight line, and determining an abnormal distance range according to standard deviation and a parameter threshold mode in statistics to remove abnormal points.
3. The method for adjusting the parallelism of a motion coordinate system and a camera coordinate system of a micro-scanning platform of claim 1, wherein four acquisitions are performed for more than 3 fields of view.
4. The method for adjusting the parallelism of a motion coordinate system and a camera coordinate system of a micro-scanning platform according to claim 1, wherein the formula of the angle θ to be adjusted of the scanning platform in the fifth step is as follows:
in the formula, theta belongs to [0, pi ]).
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