CN115128113A - Self-reference X-ray free electron laser pulse arrival time diagnostic device - Google Patents
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- 239000003574 free electron Substances 0.000 title claims abstract description 66
- 238000001228 spectrum Methods 0.000 claims abstract description 38
- 238000003384 imaging method Methods 0.000 claims abstract description 31
- 239000006185 dispersion Substances 0.000 claims abstract description 17
- 238000002834 transmittance Methods 0.000 claims abstract description 12
- 230000035772 mutation Effects 0.000 claims abstract description 5
- 230000003287 optical effect Effects 0.000 claims description 26
- 238000002474 experimental method Methods 0.000 claims description 9
- 239000005304 optical glass Substances 0.000 claims description 9
- 238000005086 pumping Methods 0.000 claims description 8
- 238000000034 method Methods 0.000 claims description 5
- 230000001360 synchronised effect Effects 0.000 claims description 3
- 230000001678 irradiating effect Effects 0.000 claims description 2
- 238000005259 measurement Methods 0.000 abstract description 2
- 239000000523 sample Substances 0.000 description 19
- 230000003595 spectral effect Effects 0.000 description 6
- 239000000463 material Substances 0.000 description 4
- 238000003745 diagnosis Methods 0.000 description 2
- 230000010287 polarization Effects 0.000 description 2
- 229910052581 Si3N4 Inorganic materials 0.000 description 1
- 239000013078 crystal Substances 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 229910003460 diamond Inorganic materials 0.000 description 1
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- 230000004048 modification Effects 0.000 description 1
- 238000011160 research Methods 0.000 description 1
- 229910052594 sapphire Inorganic materials 0.000 description 1
- 239000010980 sapphire Substances 0.000 description 1
- HQVNEWCFYHHQES-UHFFFAOYSA-N silicon nitride Chemical compound N12[Si]34N5[Si]62N3[Si]51N64 HQVNEWCFYHHQES-UHFFFAOYSA-N 0.000 description 1
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- G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
- G01N23/227—Measuring photoelectric effect, e.g. photoelectron emission microscopy [PEEM]
- G01N23/2273—Measuring photoelectron spectrum, e.g. electron spectroscopy for chemical analysis [ESCA] or X-ray photoelectron spectroscopy [XPS]
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
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Abstract
The invention relates to a self-reference X-ray free electron laser pulse arrival time diagnostic device which is characterized by comprising a super-continuous white light generation module; a spatiotemporal dispersion module; vacuum cavity: x-ray free electron laser is emitted into the vacuum cavity from a direction different from the incident direction of the focused supercontinuum white light pulse; an imaging spectrometer: imaging a line focused on the sample by the supercontinuum white light pulse on an entrance slit of an imaging spectrometer; the spectrum of the overlapped part of the X-ray free electron laser and the supercontinuum white light pulse is a signal spectrum with abrupt transmittance change, the spectrum of the non-overlapped part of the X-ray free electron laser and the supercontinuum white light pulse is a reference spectrum, and the signal spectrum with abrupt transmittance change and the reference spectrum are divided to obtain the required information. The invention focuses the super-continuous white light pulse into a line, and simultaneously performs spectrum measurement on the line, thereby simultaneously obtaining the spectrum and the reference spectrum which have the transmittance mutation and pass through the same light path for the same pulse, and greatly improving the signal-to-noise ratio of the spectrum.
Description
Technical Field
The invention relates to a self-reference X-ray free electron laser pulse arrival time diagnosis device based on an imaging spectrometer.
Background
The X-ray free electron laser (XSEL) has the characteristics of high brightness, high coherence, ultrashort pulse and high repetition frequency, and is a tool for basic scientific research, so that the developed countries in Europe and America build the high repetition frequency X-ray free electron laser. Due to the characteristic of the femtosecond level ultrashort pulse length of the free electron laser, a femtosecond level time-resolved pumping experiment (Pump-probe) can be realized together with the optical laser. However, at present, because the X-ray free electron laser device is very huge, when a pumping experiment is performed, after the X-ray free electron laser and the optical laser are synchronized, a large relative time jitter exists, and the jitter is from tens to hundreds of femtoseconds, so that the time resolution of the time resolution experiment is greatly influenced, and therefore, several devices for measuring the pulse arrival time are internationally developed. For example, the device based on the pulse arrival time of spectral coding makes the material have the refractive index mutation within the femtosecond time through the action of the X-ray free electron laser and the material. Meanwhile, the other beam of pulse laser dispersed in time and the X-ray free electron laser are incident at the same position, and the refractive index of the material changes suddenly, so that the transmittance of a certain wavelength of the pulse laser dispersed in time begins to change. And then measuring the spectrum of the pulse laser through a spectrometer, and comparing the spectrum with a reference spectrum to obtain the spectrum position with the changed transmittance. The spectral positions of the different pulses where the transmittance changes are different, and the relative jitter of the pulse arrival time can be obtained through spectrum-time decoding. But the spectral instability results from the fact that the pulsed laser generation process, which is spectrally dispersed in time, is a nonlinear process. If the spectral transmittance change is calculated using reference spectra measured from different pulses, significant noise is generated. For this purpose, for example, a polarization modulation method is used internationally to prevent a part of the light from passing through the position where the X-ray free electron laser is acted upon as a reference light, but polarization still affects the signal-to-noise ratio.
Disclosure of Invention
The purpose of the invention is: the problem of the signal-to-noise ratio of X-ray free electron laser pulse arrival time diagnosis influenced by reference light is solved.
In order to achieve the above object, according to an aspect of the present invention, there is provided a self-reference X-ray free electron laser pulse arrival time diagnostic apparatus, comprising:
the super-continuous white light generation module: focusing the optical pulse laser synchronized with the X-ray free electron laser to a super-continuous white light generation module to form a super-continuous white light pulse;
a space-time dispersion module: the super-continuous white light pulse is collimated and then enters a space-time dispersion module, the space-time dispersion module disperses the super-continuous white light pulse on a time dimension, the super-continuous white light pulse after space-time broadening is focused into a line and then enters a vacuum cavity, and the focus of the super-continuous white light pulse is positioned on a sample in the vacuum cavity; the sample can generate refractive index mutation under the action of X-ray free electron laser;
vacuum cavity: the X-ray free electron laser is emitted into the vacuum cavity from a direction different from the incident direction of the focused super-continuous white light pulse, and in the spatial dimension, the X-ray free electron laser is emitted on a line irradiation area formed by irradiating the super-continuous white light pulse on a sample, and in the time dimension, the X-ray free electron laser is in the range of a time expansion window of the super-continuous white light pulse;
an imaging spectrometer: the method comprises the following steps of imaging a line focusing a supercontinuum light pulse on a sample on an entrance slit of an imaging spectrometer, superposing the line focusing the supercontinuum light pulse on the sample and the entrance slit of the imaging spectrometer in the length direction of the slit, and imaging an overlapped part and a non-overlapped part of X-ray free electron laser and the supercontinuum light pulse on the entrance slit, wherein: the spectrum of the overlapped part of the supercontinuum white light pulse and the X-ray free electron laser is a signal spectrum with abrupt transmittance change, and the spectrum of the non-overlapped part of the X-ray free electron laser and the supercontinuum white light pulse is a reference spectrum; the imaging spectrometer can simultaneously measure the spectrums of different positions in the length direction of the entrance slit, and divides the signal spectrum with the abrupt change of the transmissivity with the reference spectrum to obtain the required information.
Preferably, the optical path of the optical pulse laser is adjusted by a time delay line to be aligned with the X-ray free electron laser in time, and then the optical pulse laser is focused to the super-continuous white light generation module by a focusing mirror.
Preferably, the optical pulse laser is a partial beam separated from the pump light of the X-ray free electron laser pumping experiment, and is homologous with the pump light of the X-ray free electron laser pumping experiment.
Preferably, the spatiotemporal dispersion module is an optical glass with a determined refractive index variation curve with wavelength, and the refractive index variation and the thickness of the optical glass determine a time broadening window of the spatiotemporal dispersion of the supercontinuum white light pulse, and the time broadening window is required to be not less than 3ps within a wavelength range of 100 nm.
Preferably, different time broadening windows are realized by replacing said optical glass of different thickness.
Preferably, the temporally and spatially broadened supercontinuum light pulses are focused into a line by a unidirectional focusing optical element.
Preferably, the supercontinuum white light pulse focused by the unidirectional focusing optical element penetrates through a first vacuum window and then is emitted into the vacuum cavity, and is emitted onto a first perforated reflector in the vacuum cavity; reflecting the supercontinuum white light pulse to the sample through a first reflector with a hole; the X-ray free electron laser injected into the vacuum cavity passes through the hole of the first perforated reflector, and the supercontinuum white light pulse avoids the hole of the first perforated reflector.
Preferably, after the supercontinuum white light pulse passing through the sample is reflected by a second reflector with holes in the vacuum cavity, the supercontinuum white light pulse is emitted from the vacuum window to the outside of the vacuum cavity and is incident to the imaging lens, and the line of the supercontinuum white light pulse focused on the sample by the imaging lens is imaged on an incident slit of the imaging spectrometer; and the X-ray free electron laser injected into the vacuum cavity passes through the hole of the second perforated reflector, and the supercontinuum white light pulse avoids the hole of the second perforated reflector.
Preferably, the first vacuum window and the second vacuum window are used for isolating the atmosphere from the vacuum and allowing the supercontinuum white light pulse to pass through.
Preferably, the entrance slit length and the length of the line on the sample on which the supercontinuum white light pulses are focused are uniform or non-uniform.
The invention focuses the supercontinuum white light pulse into a line through the cylindrical mirror, and performs spectral measurement on the line through the imaging spectrometer, so that the spectrum and the reference spectrum which are subjected to the transmittance mutation and pass through the same light path and the same material are obtained for the same pulse, and the spectral signal-to-noise ratio is greatly improved.
Drawings
Fig. 1 is a schematic structural diagram of a self-reference X-ray free electron laser pulse arrival time diagnostic apparatus according to an embodiment of the disclosure.
Detailed Description
The invention is further illustrated by the following examples. It should be understood that these examples are for illustrative purposes only and are not intended to limit the scope of the present invention. Further, it should be understood that various changes or modifications of the present invention can be made by those skilled in the art after reading the teaching of the present invention, and these equivalents also fall within the scope of the claims appended to the present application.
As shown in fig. 1, the present embodiment discloses a self-reference X-ray free electron laser pulse arrival time diagnostic apparatus based on an imaging spectrometer, which includes an optical pulse laser 1, an X-ray free electron laser 2, a time delay line 3, a focusing mirror 4, a super-continuous white light generation module 5, a super-continuous white light pulse 6, a collimating mirror 7, a time-space dispersion module 8, a cylindrical focusing mirror 9, a first vacuum window 10, a first perforated mirror 11, a sample 12, a second perforated mirror 13, a second vacuum window 14, a vacuum chamber 15, an imaging lens 16, an imaging spectrometer entrance slit 17, and an imaging spectrometer 18.
The optical pulse laser 1 is a partial beam separated from the pump light of the X-ray free electron laser pumping experiment, and the optical pulse laser 1 is homologous with the pump light of the X-ray free electron laser pumping experiment. The wavelength of the optical pulse laser 1 can be 800nm, and the pulse width needs to be less than 30 fs.
The time delay line 3 is used to adjust the optical path length of the optically pulsed laser 1 to be temporally aligned with the X-ray free electron laser 2. The time delay line 3 has a delay time adjustment capability of 1 nanosecond or more.
The optical pulse laser 1 with the optical path adjusted by the time delay line 3 is focused to the super-continuous white light generation module 5 through the focusing lens 4. The focusing mirror 4 is a strong laser focusing mirror. The super-continuum white light generating module 5 may employ a C-cut sapphire sheet. The optical pulse laser 1 forms a super-continuous white light pulse 6 after passing through the super-continuous white light generation module 5, and the wavelength range of the super-continuous white light pulse 6 is larger than 200 nm.
The supercontinuum white light pulse 6 is incident on a collimator 7, and the collimator 7 is used for collimating the supercontinuum white light pulse 6.
The collimated supercontinuum white light pulse 6 enters a space-time dispersion module 8, and the space-time dispersion module 8 disperses the supercontinuum white light pulse 6 in the time dimension. The time-space dispersion module 8 is optical glass with a curve that the refractive index changes along with the wavelength, the refractive index change and the thickness of the optical glass determine a time window of the time-space dispersion of the super-continuous white light pulse 6, and the time window is not less than 3ps within the wavelength range of 100 nm. The space-time dispersion module 8 can realize different time broadening windows by replacing optical glass with different thicknesses.
The temporally and spatially broadened supercontinuum white light pulses 6 are focused into a line by means of a cylindrical focusing mirror 9 and have their focus on the sample 12. The cylindrical focusing lens 9 is an optical element for unidirectional focusing.
The supercontinuum white light pulse 6 focused by the cylindrical focusing mirror 9 passes through a vacuum window I10 and is incident on a perforated mirror I11. The supercontinuum white light pulse 6 is reflected via a perforated mirror 11 onto a sample 12. The first perforated reflector 11 is a plane mirror, holes of the first perforated reflector 11 are used for allowing the X-ray free electron laser 2 to pass through, and the supercontinuum white light pulse 6 needs to avoid the holes of the first perforated reflector 11. Vacuum window one 10 is used to isolate the atmosphere from the vacuum and can allow the supercontinuum white light pulses 6 to pass through.
The sample 12 may be a jag crystal, silicon nitride, diamond, etc. which is capable of reacting with the X-ray free electron laser 2 to produce a refractive index jump.
In the spatial dimension, the X-ray free electron laser 2 is incident on a line irradiation area of the supercontinuum white light pulse 6; in the time dimension, the X-ray free electron laser 2 is within the super-continuous white light pulse 6 time range.
The second perforated mirror 13 is used to reflect the supercontinuum white light pulses 6 that pass through the sample. The second perforated reflector 13 is a plane mirror, and the holes of the second perforated reflector 13 are used for allowing the X-ray free electron laser 2 to pass through. The supercontinuum white light pulse 6 needs to avoid the aperture of the apertured mirror two 13. The second perforated mirror 13 reflects the supercontinuum white light pulse 6 through the second vacuum window 14.
The second vacuum window 14 is used to isolate the atmosphere from the vacuum and can allow the supercontinuum white light pulses 6 to pass through.
The first perforated mirror 11, the sample 12 and the second perforated mirror 13 are in the vacuum chamber 15.
The line of the supercontinuum white light pulse 6 focused on the sample is imaged by an imaging lens 16 onto an entrance slit 17 of an imaging spectrometer. The line of the supercontinuum white light pulse 6 focused on the sample and the entrance slit 17 of the imaging spectrometer need to coincide in the slit length direction, the length of the entrance slit 17 and the line of the supercontinuum white light pulse 6 focused on the sample may not be consistent, but the part of the X-ray free electron laser 2 overlapped with the supercontinuum white light pulse 6 must be imaged on the entrance slit 17.
The imaging spectrometer 18 can simultaneously measure the spectra at different positions along the length of the entrance slit 17.
The spectrum of the overlapped part of the X-ray free electron laser 2 and the super-continuous white light pulse 6 is a signal spectrum with abrupt transmittance change, and the spectrum of the non-overlapped part of the X-ray free electron laser 2 and the super-continuous white light pulse 6 is a reference spectrum.
The signal spectrum in which the transmittance jump occurred was divided by the reference spectrum to obtain the desired information.
Claims (10)
1. A self-referencing X-ray free electron laser pulse arrival time diagnostic apparatus, comprising:
the super-continuous white light generation module: focusing the optical pulse laser synchronized with the X-ray free electron laser to a super-continuous white light generation module to form a super-continuous white light pulse;
a space-time dispersion module: the super-continuous white light pulse is collimated and then enters a space-time dispersion module, the space-time dispersion module disperses the super-continuous white light pulse on a time dimension, the super-continuous white light pulse after space-time broadening is focused into a line and then enters a vacuum cavity, and the focus of the super-continuous white light pulse is positioned on a sample in the vacuum cavity; the sample can generate refractive index mutation under the action of X-ray free electron laser;
vacuum cavity: the X-ray free electron laser is emitted into the vacuum cavity from a direction different from the incident direction of the focused super-continuous white light pulse, and in the spatial dimension, the X-ray free electron laser is emitted on a line irradiation area formed by irradiating the super-continuous white light pulse on a sample, and in the time dimension, the X-ray free electron laser is in the range of a time expansion window of the super-continuous white light pulse;
an imaging spectrometer: the method comprises the following steps of imaging a line of a supercontinuum light pulse focused on a sample on an entrance slit of an imaging spectrometer, coinciding the line of the supercontinuum light pulse focused on the sample with the entrance slit of the imaging spectrometer in the length direction of the slit, and imaging an overlapped part and a non-overlapped part of X-ray free electron laser and the supercontinuum light pulse on the entrance slit, wherein: the spectrum of the overlapped part of the supercontinuum white light pulse and the X-ray free electron laser is a signal spectrum with abrupt transmittance change, and the spectrum of the non-overlapped part of the X-ray free electron laser and the supercontinuum white light pulse is a reference spectrum; the imaging spectrometer can simultaneously measure the spectrums of different positions in the length direction of the entrance slit, and divides the signal spectrum with the abrupt change of the transmissivity with the reference spectrum to obtain the required information.
2. The self-referencing X-ray free electron laser pulse arrival time diagnostic apparatus according to claim 1, wherein said optical pulsed laser light is time aligned with said X-ray free electron laser light by adjusting an optical path length of said optical pulsed laser light with a time delay line, and then said optical pulsed laser light is focused by a focusing mirror onto said super-continuum white light generating module.
3. The apparatus according to claim 1, wherein the optical pulse laser is a partial beam separated from the pump light of the X-ray free electron laser pumping experiment, and is homologous to the pump light of the X-ray free electron laser pumping experiment.
4. The self-referencing X-ray free electron laser pulse arrival time diagnostic apparatus according to claim 1, wherein said spatiotemporal dispersion module is an optical glass having a defined refractive index as a function of wavelength, the refractive index variation and thickness of said optical glass defining a time spread window of the spatiotemporal dispersion of said supercontinuum white light pulses, said time spread window being required to be no less than 3ps over a wavelength range of 100 nm.
5. The self-referencing X-ray free electron laser pulse arrival time diagnostic apparatus according to claim 4, wherein different time broadening windows are achieved by replacing said optical glass of different thicknesses.
6. The self-referenced X-ray free electron laser pulse arrival time diagnostic apparatus as claimed in claim 1, wherein said temporally and spatially broadened supercontinuum pulses are focused into a line by a unidirectional focusing optical element.
7. The self-referencing X-ray free electron laser pulse arrival time diagnostic apparatus according to claim 6, wherein said super-continuum white light pulses focused by said unidirectional focusing optical element pass through a first vacuum window and are incident into said vacuum chamber and are incident on a first perforated mirror in said vacuum chamber; reflecting the supercontinuum white light pulse to the sample through a first reflector with a hole; the X-ray free electron laser injected into the vacuum cavity passes through the hole of the first perforated reflector, and the supercontinuum white light pulse avoids the hole of the first perforated reflector.
8. The self-reference X-ray free electron laser pulse arrival time diagnostic apparatus as claimed in claim 7, wherein the supercontinuum white light pulse passing through the sample is reflected by a second perforated mirror located inside said vacuum chamber, exits from the vacuum window to outside said vacuum chamber and is incident on the imaging lens, and the line of the supercontinuum white light pulse focused on the sample by the imaging lens is imaged on the entrance slit of the imaging spectrometer; and the X-ray free electron laser injected into the vacuum cavity passes through the hole of the second perforated reflector, and the supercontinuum white light pulse avoids the hole of the second perforated reflector.
9. The self-referencing X-ray free electron laser pulse arrival time diagnostic apparatus according to claim 8, wherein said first vacuum window and said second vacuum window are adapted to isolate the atmosphere from the vacuum and to allow said supercontinuum white light pulses to pass therethrough.
10. The self-referencing X-ray free electron laser pulse arrival time diagnostic apparatus according to claim 1 wherein the entrance slit length is coincident or non-coincident with the length of the line of the supercontinuum white light pulse focused on the sample.
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