CN115113949A - Method for improving chip starting reliability and solid state disk thereof - Google Patents

Method for improving chip starting reliability and solid state disk thereof Download PDF

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Publication number
CN115113949A
CN115113949A CN202210762245.2A CN202210762245A CN115113949A CN 115113949 A CN115113949 A CN 115113949A CN 202210762245 A CN202210762245 A CN 202210762245A CN 115113949 A CN115113949 A CN 115113949A
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data
bootloader
compiled data
codes
compiled
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郭亚飞
臧鑫
叶佳鹏
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Suzhou Yilian Information System Co Ltd
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Suzhou Yilian Information System Co Ltd
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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F9/00Arrangements for program control, e.g. control units
    • G06F9/06Arrangements for program control, e.g. control units using stored programs, i.e. using an internal store of processing equipment to receive or retain programs
    • G06F9/44Arrangements for executing specific programs
    • G06F9/445Program loading or initiating
    • G06F9/44505Configuring for program initiating, e.g. using registry, configuration files
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/008Reliability or availability analysis
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00Error detection; Error correction; Monitoring
    • G06F11/07Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1012Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using codes or arrangements adapted for a specific type of error
    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F8/00Arrangements for software engineering
    • G06F8/40Transformation of program code
    • G06F8/41Compilation

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  • Theoretical Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Software Systems (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • Retry When Errors Occur (AREA)

Abstract

The invention provides a method for improving chip starting reliability and a solid state disk thereof, wherein the method comprises the steps of compiling a Bootloader code and a FW code, backing up a plurality of parts, generating a corresponding check code and writing the check code into a nonvolatile storage medium, so that in the starting process of a chip, if read Bootloader compiled data and FW compiled data are abnormal, the data are read again through the backup data, and if all the backup data are read abnormally, the data are recovered through the corresponding check code. The invention has the beneficial effects that: the problem of chip starting failure caused by data reading errors is avoided, and the reliability of chip starting is improved.

Description

Method for improving chip starting reliability and solid state disk thereof
Technical Field
The invention relates to the technical field of solid state disks, in particular to a method for improving chip starting reliability and a solid state disk thereof.
Background
The storage distribution of codes in the chip is as follows: BootRom is stored in ROM of the chip; bootloader and FW are stored in a nonvolatile storage medium NAND Flash. When the chip is powered on, BootRom operates firstly, then Bootloader is read from a nonvolatile storage medium NAND Flash, if the reading is successful, the Bootloader operates, then the Bootloader reads FW firmware from the NAND Flash, and if the reading is successful, the FW firmware is operated, so that the chip works normally.
If BootRom fails to read Bootloader or FW firmware from the non-volatile storage medium NAND, the chip cannot work normally, and the hard disk cannot be used.
Disclosure of Invention
The technical problem to be solved by the invention is as follows: a method for improving chip starting reliability and a solid state disk thereof are provided.
In order to solve the technical problems, the invention adopts the technical scheme that: a method for improving the starting reliability of a chip comprises the following steps,
compiling the Bootloader codes and the FW codes, backing up a plurality of backups of compiled data of the Bootloader codes and the FW codes, and respectively calculating corresponding check codes and writing the check codes into a nonvolatile storage medium;
after the chip is powered on, BootBoom runs;
reading Bootloader compiled data from a nonvolatile storage medium, and if the read Bootloader compiled data is normal, operating the Bootloader;
if the read Bootloader compiled data is abnormal, reading the residual data from the backed-up Bootloader compiled data, and if the read backed-up Bootloader compiled data is abnormal, restoring the Bootloader compiled data through a check code;
after the Bootloader runs, reading FW compiled data from a nonvolatile storage medium, and running FW firmware if the read FW compiled data are normal;
and if the read FW compiled data is abnormal, reading the residual data from the backup FW compiled data, and if the read backup FW compiled data is abnormal, restoring the FW compiled data through the check code.
Further, compiling the Bootloader codes and the FW codes, backing up a plurality of backups of compiled data of the Bootloader codes and the FW codes, respectively calculating corresponding check codes, and writing the check codes into a nonvolatile storage medium specifically includes,
after compiling the Bootloader codes, dividing compiled data of the Bootloader codes into N1 parts;
compiling M1 parts of data backup for Bootloader codes divided into N1 parts;
compiling data for the backed-up Bootloader codes and calculating corresponding check codes;
writing all Bootloader code compiling data and corresponding check codes into a nonvolatile storage medium;
after the FW codes are compiled and compiled, dividing the compiled data of the FW codes into N2 parts;
compiling M2 parts of data backup for the FW codes divided into N2 parts;
compiling data for the backup FW codes and calculating corresponding check codes;
and writing all the FW code compiled data and corresponding check codes into a nonvolatile storage medium.
Furthermore, the check code corresponding to the Bootloader code compiled data is N1 parts; the FW code compiled data corresponds to N2 check codes.
Further, if the read Bootloader compiled data is abnormal, reading the rest data from the backed-up Bootloader compiled data, and if the read backed-up Bootloader compiled data is abnormal, restoring the Bootloader compiled data through the check code specifically includes,
if the read Bootloader compiled data is abnormal, reading the rest Bootloader compiled data from the M1 backup Bootloader compiled data;
and if the read Bootloader compiled data of all the backups is abnormal, restoring the Bootloader compiled data according to the check code corresponding to each abnormal Bootloader compiled data.
Further, the reading of the remaining data from the backed-up FW compiled data if the read FW compiled data is abnormal, and the restoring of the FW compiled data by the check code if the read backed-up FW compiled data is abnormal specifically includes,
if the read FW compiled data are abnormal, reading the residual FW compiled data from the M2 backup FW compiled data;
and if all the read backup FW compiled data are abnormal, recovering the FW compiled data according to the check code corresponding to each abnormal FW compiled data.
The invention also provides a solid state disk for improving the starting reliability of a chip, which comprises,
the data backup module is used for compiling the Bootloader codes and the FW codes, backing up a plurality of backups of compiled data of the Bootloader codes and the FW codes, and respectively calculating corresponding check codes and writing the check codes into a nonvolatile storage medium;
the BootBooom running module is used for running BootBooom after the chip is electrified;
the bootrom module is used for reading Bootloader compiled data from a nonvolatile storage medium, and if the read Bootloader compiled data is normal, the Bootloader is operated;
the Bootloader compiled data recovery module is used for reading the residual data from the backed-up Bootloader compiled data if the read Bootloader compiled data is abnormal, and recovering the Bootloader compiled data through check codes if the read backed-up Bootloader compiled data is abnormal;
the Bootloader module is used for reading FW compiled data from a nonvolatile storage medium after the Bootloader is operated, and operating FW firmware if the read FW compiled data is normal;
and the FW compiled data recovery module is used for reading the residual data from the backup FW compiled data if the read FW compiled data are abnormal, and recovering the FW compiled data through the check code if the read backup FW compiled data are abnormal.
Further, the data backup module includes,
the first data splitting unit is used for splitting the compiled data of the Bootloader codes into N1 parts after the Bootloader codes are compiled;
the first data backup unit is used for compiling data backup M1 parts to the Bootloader codes divided into N1 parts;
the first check code calculation unit is used for compiling data for the backed-up Bootloader codes and calculating corresponding check codes;
the first data writing unit is used for writing all Bootloader code compiled data and corresponding check codes into a nonvolatile storage medium;
the second data cutting unit is used for cutting the FW code compiled data into N2 parts after the FW code is compiled and compiled;
a second data backup unit compiling M2 parts of data backup to the FW code divided into N2 parts;
the second check code calculation unit is used for calculating corresponding check codes for the backup FW code compiled data;
and a second data writing unit for writing all the FW code compiled data and corresponding check codes into the nonvolatile storage medium.
Furthermore, in the first check code calculation unit, N1 check codes corresponding to Bootloader code compiled data are included; in the second check code calculation unit, there are N2 check codes corresponding to the FW code compiled data.
Further, the Bootloader compiling data recovery module specifically comprises,
the first backup data reading unit is used for reading the rest Bootloader compiled data from the M1 backup Bootloader compiled data if the read Bootloader compiled data is abnormal;
and the first data check recovery unit is used for recovering the Bootloader compiled data according to the check code corresponding to each abnormal Bootloader compiled data if all the read backed Bootloader compiled data are abnormal.
Further, the FW compiled data restoring module specifically includes,
a second backup data reading unit configured to read remaining FW compiled data from the M2 backed-up FW compiled data if the read FW compiled data is abnormal;
and the second data check and recovery unit is used for recovering the FW compiled data according to the check code corresponding to each abnormal FW compiled data if all the read backup FW compiled data are abnormal.
The invention has the beneficial effects that: after compiling the Bootloader code and the FW code, backing up a plurality of copies, generating corresponding check codes and writing the check codes into a nonvolatile storage medium, so that in the starting process of the chip, if read Bootloader compiled data and FW compiled data are abnormal, the data are read again through the backup data, and if all the backup data are abnormal, the data are recovered through the corresponding check codes, thereby avoiding the problem of chip starting failure caused by data reading errors and improving the reliability of chip starting.
Drawings
In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings used in the description of the embodiments or the prior art will be briefly described below, it is obvious that the drawings in the following description are only some embodiments of the present invention, and for those skilled in the art, other drawings can be obtained according to the mechanisms shown in the drawings without creative efforts.
FIG. 1 is a flowchart of a method for improving chip start reliability according to an embodiment of the present invention;
FIG. 2 is a flowchart of a data backup process according to an embodiment of the present invention;
fig. 3 is a flowchart of the Bootloader compiling data recovery according to the embodiment of the present invention;
fig. 4 is a flow chart of FW compiled data recovery according to an embodiment of the present invention;
fig. 5 is a block diagram of a solid state disk for improving chip start reliability according to an embodiment of the present invention;
FIG. 6 is a block diagram of a data backup module according to an embodiment of the present invention;
fig. 7 is a block diagram of a Bootloader compiled data recovery module according to an embodiment of the present invention;
fig. 8 is a block diagram of a FW compiled data recovery module according to an embodiment of the present invention;
fig. 9 is a storage format diagram of Bootloader compiled data according to the embodiment of the present invention;
fig. 10 is a storage format diagram of FW compiled data according to the embodiment of the present invention.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be obtained by a person skilled in the art without inventive step based on the embodiments of the present invention, are within the scope of protection of the present invention.
It should be noted that the description of the invention relating to "first", "second", etc. is for descriptive purposes only and is not to be construed as indicating or implying any relative importance or implicit indication of the number of technical features indicated. Thus, a feature defined as "first" or "second" may explicitly or implicitly include at least one such feature. In addition, technical solutions between the embodiments may be combined with each other, but must be based on the realization of the technical solutions by a person skilled in the art, and when the technical solutions are contradictory to each other or cannot be realized, such a combination should not be considered to exist, and is not within the protection scope of the present invention.
As shown in fig. 1, the first embodiment of the present invention is: a method for improving the starting reliability of a chip comprises the following steps,
s10, compiling the Bootloader codes and the FW codes, backing up a plurality of backups of compiled data of the Bootloader codes and the FW codes, and respectively calculating corresponding check codes to write the check codes into a nonvolatile storage medium;
s20, after the chip is powered on, BootBoom runs;
s30, reading Bootloader compiled data from the nonvolatile storage medium, and if the read Bootloader compiled data is normal, operating the Bootloader;
s40, if the read Bootloader compiled data is abnormal, reading the rest data from the backed-up Bootloader compiled data, and if the read backed-up Bootloader compiled data is abnormal, restoring the Bootloader compiled data through check codes;
s50, after the Boot loader runs, reading FW compiled data from the nonvolatile storage medium, and running FW firmware if the read FW compiled data are normal;
and S60, if the read FW compiled data are abnormal, reading the rest data from the backup FW compiled data, and if the read backup FW compiled data are abnormal, restoring the FW compiled data through the check code.
As shown in fig. 2, in step S10, after compiling the Bootloader code and the FW code, backing up a plurality of backups of compiled data of the Bootloader code and the FW code, respectively calculating corresponding check codes and writing the check codes into the nonvolatile storage medium,
s11, after compiling the Bootloader codes, dividing the Bootloader code compilation data into N1 parts;
s12, compiling data backup M1 parts by Boot loader codes divided into N1 parts;
s13, compiling data for the backed-up Bootloader codes and calculating corresponding check codes;
s14, writing all Bootloader code compiled data and corresponding check codes into a nonvolatile storage medium;
s15, compiling and compiling the FW codes, and dividing the compiled data of the FW codes into N2 parts;
s16, compiling M2 shares of data backup for the FW code divided into N2 shares;
s17, compiling data for the backup FW codes and calculating corresponding check codes;
and S18, writing all the FW code compiled data and corresponding check codes into a nonvolatile storage medium.
In step S13, as shown in fig. 9, N1 parts of check codes corresponding to Bootloader code compiled data are included; in step S17, as shown in fig. 10, the FW code compiled data includes N2 parts of check codes.
As shown in fig. 3, in step S40, if the read Bootloader compiled data is abnormal, reading the remaining data from the backed-up Bootloader compiled data, and if the read backed-up Bootloader compiled data is abnormal, restoring the Bootloader compiled data by using the check code specifically includes,
s41, if the read Bootloader compiled data is abnormal, reading the rest Bootloader compiled data from the Boot loader compiled data backed up by the M1;
and S42, if all the read backup Bootloader compiled data are abnormal, restoring the Bootloader compiled data according to the check code corresponding to each abnormal Bootloader compiled data.
As shown in fig. 4, in step S60, reading the remaining data from the backed-up FW compiled data if the read FW compiled data is abnormal, and restoring the FW compiled data by using the check code if the read backed-up FW compiled data is abnormal,
s61, if the read FW compiled data are abnormal, reading the residual FW compiled data from the FW compiled data backed up by the M2 copies;
and S62, if all the read backup FW compiled data are abnormal, recovering the FW compiled data according to the check code corresponding to each abnormal FW compiled data.
The beneficial effect of this embodiment lies in: after compiling the Bootloader codes and the FW codes, backing up a plurality of parts, generating corresponding check codes and writing the check codes into a nonvolatile storage medium, so that in the starting process of the chip, if read Bootloader compiled data and FW compiled data are abnormal, the data are read again through the backup data, and if all the backup data are abnormal, the data are recovered through the corresponding check codes, thereby avoiding the problem of chip starting failure caused by data reading errors and improving the reliability of chip starting.
As shown in fig. 5, the present invention further provides a solid state disk for improving the start-up reliability of a chip, including,
the data backup module 10 is configured to compile Boot loader codes and FW codes, backup a plurality of backups of compiled data of the Boot loader codes and the FW codes, and calculate corresponding check codes respectively and write the check codes into a nonvolatile storage medium;
a BootBooom operation module 20, configured to operate BootBooom after the chip is powered on;
the BootBoom module 30 is used for reading Boot loader compiled data from a nonvolatile storage medium, and if the read Boot loader compiled data is normal, operating the Boot loader;
the Bootloader compiled data recovery module 40 is configured to, if the read Bootloader compiled data is abnormal, read the remaining data from the backed-up Bootloader compiled data, and if the read backed-up Bootloader compiled data is abnormal, recover the Bootloader compiled data by using a check code;
the Bootloader module 50 is used for reading the FW compiled data from the nonvolatile storage medium after the Bootloader is operated, and operating the FW firmware if the read FW compiled data is normal;
and an FW compiled data restoring module 60, configured to, if the read FW compiled data is abnormal, read the remaining data from the backed-up FW compiled data, and if the read backed-up FW compiled data is abnormal, restore the FW compiled data by using the check code.
As shown in fig. 6, the data backup module 10 includes,
the first data splitting unit 11 is configured to partition Bootloader code compiled data into N1 parts after compiling Bootloader codes;
the first data backup unit 12 is used for compiling M1 copies of Boot loader codes divided into N1 copies of data;
the first check code calculation unit 13 is configured to calculate a corresponding check code for the Boot loader code compiled data of the backup;
a first data writing unit 14, configured to write all Bootloader code compiled data and corresponding check codes into a nonvolatile storage medium;
the second data splitting unit 15 is configured to compile and compile the FW code, and then divide the FW code compiled data into N2 parts;
a second data backup unit 16 compiling M2 parts of data backup for the FW code divided into N2 parts;
a second check code calculation unit 17 for calculating a corresponding check code for the backed-up FW code compiled data;
the second data writing unit 18 writes all of the FW code compiled data and the corresponding check code in the nonvolatile storage medium.
In the first check code calculation unit 13, there are N1 check codes corresponding to Boot loader code compiled data; in the second check code calculation unit 17, N2 parts of check codes corresponding to the FW code compiled data are included.
As shown in fig. 7, the Bootloader compiled data recovery module 40 specifically includes,
a first backup data reading unit 41, configured to read, if the read Bootloader compiled data is abnormal, the remaining Bootloader compiled data from M1 copies of backed-up Bootloader compiled data;
and the first data check and recovery unit 42 is configured to, if all read Boot loader compiled data of the backup are abnormal, recover the Boot loader compiled data according to check codes corresponding to each abnormal Boot loader compiled data.
As shown in fig. 8, the FW compiled data restoring module 60 specifically includes,
a second backup data reading unit 61, configured to read, if the read FW compiled data is abnormal, remaining FW compiled data from the M2 backup FW compiled data;
and a second data check and recovery unit 62, configured to, if all the read backed-up FW compiled data are abnormal, recover the FW compiled data according to the check code corresponding to each abnormal FW compiled data.
The above description is only an embodiment of the present invention, and not intended to limit the scope of the present invention, and all modifications of equivalent structures and equivalent processes performed by the present specification and drawings, or directly or indirectly applied to other related technical fields, are included in the scope of the present invention.

Claims (10)

1. A method for improving the starting reliability of a chip is characterized in that: comprises the steps of (a) carrying out,
compiling the Bootloader codes and the FW codes, backing up a plurality of backups of compiled data of the Bootloader codes and the FW codes, and respectively calculating corresponding check codes and writing the check codes into a nonvolatile storage medium;
after the chip is powered on, BootBoom runs;
reading Bootloader compiled data from a nonvolatile storage medium, and if the read Bootloader compiled data is normal, operating the Bootloader;
if the read Bootloader compiled data is abnormal, reading the residual data from the backed-up Bootloader compiled data, and if the read backed-up Bootloader compiled data is abnormal, restoring the Bootloader compiled data through a check code;
after the Bootloader runs, reading FW compiled data from a nonvolatile storage medium, and running FW firmware if the read FW compiled data are normal;
and if the read FW compiled data is abnormal, reading the residual data from the backup FW compiled data, and if the read backup FW compiled data is abnormal, restoring the FW compiled data through the check code.
2. The method for improving the start-up reliability of a chip as claimed in claim 1, wherein: compiling the Bootloader codes and the FW codes, backing up a plurality of backups of compiled data of the Bootloader codes and the FW codes, respectively calculating corresponding check codes, and writing the check codes into a nonvolatile storage medium,
compiling the Bootloader codes, and dividing the compiled data of the Bootloader codes into N1 parts;
compiling M1 copies of Bootloader code compiled data divided into N1 copies;
compiling data for the backed-up Bootloader codes and calculating corresponding check codes;
writing all Bootloader code compiling data and corresponding check codes into a nonvolatile storage medium;
after compiling and compiling the FW codes, dividing the compiled data of the FW codes into N2 parts;
compiling M2 parts of data backup for the FW codes divided into N2 parts;
compiling data for the backup FW codes and calculating corresponding check codes;
and writing all the FW code compiled data and corresponding check codes into a nonvolatile storage medium.
3. The method for improving chip start-up reliability of claim 2, wherein: the check code corresponding to the compiled data of the Bootloader code is N1 parts; the FW code compiled data corresponds to N2 check codes.
4. The method for improving the start-up reliability of a chip according to claim 3, wherein: if the read Bootloader compiled data is abnormal, reading the residual data from the backed-up Bootloader compiled data, if the read backed-up Bootloader compiled data is abnormal, restoring the Bootloader compiled data by check codes,
if the read Bootloader compiled data is abnormal, reading the rest Bootloader compiled data from the M1 backup Bootloader compiled data;
and if all read backup Bootloader compiled data are abnormal, restoring the Bootloader compiled data according to the check code corresponding to each abnormal Bootloader compiled data.
5. The method for improving the start-up reliability of a chip according to claim 4, wherein: the step of reading the remaining data from the backed-up FW compiled data if the read FW compiled data is abnormal, and the step of restoring the FW compiled data by using the check code if the read backed-up FW compiled data is abnormal,
if the read FW compiled data are abnormal, reading the residual FW compiled data from the M2 backup FW compiled data;
and if all the read backup FW compiled data are abnormal, recovering the FW compiled data according to the check code corresponding to each abnormal FW compiled data.
6. The utility model provides a promote solid state hard drives of chip start-up reliability which characterized in that: comprises the steps of (a) preparing a mixture of a plurality of raw materials,
the data backup module is used for compiling the Bootloader codes and the FW codes, backing up a plurality of backups of compiled data of the Bootloader codes and the FW codes, and respectively calculating corresponding check codes and writing the check codes into a nonvolatile storage medium;
the BootBooom running module is used for running BootBooom after the chip is electrified;
the bootrom module is used for reading Bootloader compiled data from a nonvolatile storage medium, and if the read Bootloader compiled data is normal, the Bootloader is operated;
the Bootloader compiled data recovery module is used for reading the residual data from the backed-up Bootloader compiled data if the read Bootloader compiled data is abnormal, and recovering the Bootloader compiled data through check codes if the read backed-up Bootloader compiled data is abnormal;
the Bootloader module is used for reading FW compiled data from a nonvolatile storage medium after the Bootloader is operated, and operating FW firmware if the read FW compiled data is normal;
and the FW compiled data recovery module is used for reading the residual data from the backup FW compiled data if the read FW compiled data are abnormal, and recovering the FW compiled data through the check code if the read backup FW compiled data are abnormal.
7. The solid state disk for improving the chip start-up reliability as claimed in claim 6, wherein: the data backup module comprises a data backup module and a data backup module,
the first data splitting unit is used for splitting the compiled data of the Bootloader codes into N1 parts after the Bootloader codes are compiled;
the first data backup unit is used for compiling M1 copies of Bootloader codes divided into N1 copies;
the first check code calculation unit is used for compiling data for the backed-up Bootloader codes and calculating corresponding check codes;
the first data writing unit is used for writing all Bootloader code compiled data and corresponding check codes into a nonvolatile storage medium;
the second data cutting unit is used for cutting the FW code compiled data into N2 parts after the FW code is compiled and compiled;
a second data backup unit compiling M2 parts of data backup to the FW code divided into N2 parts;
the second check code calculation unit is used for calculating corresponding check codes for the backup FW code compiled data;
and a second data writing unit for writing all the FW code compiled data and corresponding check codes into the nonvolatile storage medium.
8. The solid state disk for improving chip startup reliability of claim 7, wherein: in the first check code calculation unit, the number of check codes corresponding to Bootloader code compiled data is N1; in the second check code calculation unit, the check code corresponding to the FW code compiled data is N2 parts.
9. The solid state disk for improving chip startup reliability of claim 8, wherein: the Bootloader compiled data recovery module specifically comprises,
the first backup data reading unit is used for reading the rest Bootloader compiled data from the M1 backup Bootloader compiled data if the read Bootloader compiled data is abnormal;
and the first data check recovery unit is used for recovering the Bootloader compiled data according to the check code corresponding to each abnormal Bootloader compiled data if all the read backed Bootloader compiled data are abnormal.
10. The solid state disk for improving the chip start-up reliability of claim 9, wherein: the FW compiled data recovery module specifically includes,
a second backup data reading unit configured to read remaining FW compiled data from the M2 backed-up FW compiled data if the read FW compiled data is abnormal;
and the second data check and recovery unit is used for recovering the FW compiled data according to the check code corresponding to each abnormal FW compiled data if all the read backup FW compiled data are abnormal.
CN202210762245.2A 2022-06-29 2022-06-29 Method for improving chip starting reliability and solid state disk thereof Pending CN115113949A (en)

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