CN115061605A - Test curve marking method, device, equipment and storage medium - Google Patents

Test curve marking method, device, equipment and storage medium Download PDF

Info

Publication number
CN115061605A
CN115061605A CN202210989894.6A CN202210989894A CN115061605A CN 115061605 A CN115061605 A CN 115061605A CN 202210989894 A CN202210989894 A CN 202210989894A CN 115061605 A CN115061605 A CN 115061605A
Authority
CN
China
Prior art keywords
test curve
marked
marking
amplitude
determining
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
CN202210989894.6A
Other languages
Chinese (zh)
Inventor
邹仁其
陆馗枢
戴林军
张进库
郭星星
许畅
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Shenzhen Dongsheng Rf Technology Co ltd
Original Assignee
Shenzhen Dongsheng Rf Technology Co ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Shenzhen Dongsheng Rf Technology Co ltd filed Critical Shenzhen Dongsheng Rf Technology Co ltd
Priority to CN202210989894.6A priority Critical patent/CN115061605A/en
Publication of CN115061605A publication Critical patent/CN115061605A/en
Pending legal-status Critical Current

Links

Images

Classifications

    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F3/00Input arrangements for transferring data to be processed into a form capable of being handled by the computer; Output arrangements for transferring data from processing unit to output unit, e.g. interface arrangements
    • G06F3/01Input arrangements or combined input and output arrangements for interaction between user and computer
    • G06F3/048Interaction techniques based on graphical user interfaces [GUI]
    • G06F3/0481Interaction techniques based on graphical user interfaces [GUI] based on specific properties of the displayed interaction object or a metaphor-based environment, e.g. interaction with desktop elements like windows or icons, or assisted by a cursor's changing behaviour or appearance
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/001Measuring interference from external sources to, or emission from, the device under test, e.g. EMC, EMI, EMP or ESD testing

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Electromagnetism (AREA)
  • Human Computer Interaction (AREA)
  • Tests Of Electronic Circuits (AREA)

Abstract

The invention discloses a marking method, a marking device, marking equipment and a storage medium of a test curve. The method comprises the following steps: if a marking trigger event is detected, determining a target position of a test curve to be marked; generating at least two reference lines of the test curve to be marked according to the target position and preset segmentation parameters; and determining the marking position of the test curve to be marked according to at least two reference lines so as to mark according to the marking position. The technical scheme solves the problems that the amplification marking mode is low in efficiency, the accuracy is difficult to guarantee and the like, can reduce marking deviation while improving the marking efficiency, and further achieves a good marking effect.

Description

Test curve marking method, device, equipment and storage medium
Technical Field
The invention relates to the technical field of electromagnetic compatibility testing, in particular to a method, a device, equipment and a storage medium for marking a test curve.
Background
An electromagnetic compatibility test refers to the ability of a test device or system to perform satisfactorily in its electromagnetic environment and not to generate intolerable electromagnetic interference with any device in the electromagnetic environment. The electromagnetic compatibility test usually places the receiver in a control room, and if the shielding effect of the control room is not ideal, external interference signals, such as base station signals, WIFI signals or bluetooth signals, may enter a radio frequency input port of the receiver, and then spectrum interference signals are generated on the spectrum of the receiver.
Currently, in the process of electromagnetic compatibility testing, a tester is usually relied on to mark risk frequency points caused by interference signals and the like on a test curve. The tester needs to frequently amplify the test curve to mark the frequency points of the maximum amplitude value within a certain range. The marking mode of marking by amplifying the test curve by a tester is easy to cause marking deviation, and the marking efficiency is low.
Disclosure of Invention
The invention provides a marking method, a marking device, marking equipment and a storage medium of a test curve, which are used for solving the problems of low efficiency, difficult guarantee of accuracy and the like of an amplification marking mode, and can reduce marking deviation while improving marking efficiency so as to achieve good marking effect.
According to an aspect of the present invention, there is provided a method of labeling a test curve, the method including:
if a marking trigger event is detected, determining a target position of a test curve to be marked;
generating at least two reference lines of the test curve to be marked according to the target position and preset segmentation parameters;
and determining the marking position of the test curve to be marked according to at least two reference lines so as to mark according to the marking position.
According to another aspect of the present invention, there is provided a marking apparatus for a test curve, the apparatus comprising:
the target position determining module is used for determining the target position of the test curve to be marked if the marking trigger event is detected;
the reference line generating module is used for generating at least two reference lines of the test curve to be marked according to the target position and preset segmentation parameters;
and the marking position determining position is used for determining the marking position of the test curve to be marked according to at least two reference lines so as to mark according to the marking position.
According to another aspect of the present invention, there is provided an electronic apparatus including:
at least one processor; and
a memory communicatively coupled to the at least one processor; wherein,
the memory stores a computer program executable by the at least one processor, the computer program being executable by the at least one processor to enable the at least one processor to perform a method of marking a test curve according to any of the embodiments of the invention.
According to another aspect of the present invention, there is provided a computer-readable storage medium storing computer instructions for causing a processor to implement a method for labeling a test curve according to any one of the embodiments of the present invention when the computer instructions are executed.
According to the technical scheme of the embodiment of the invention, when a marking trigger event is detected, the target position of the test curve to be marked is determined, and at least two reference lines of the test curve to be marked are generated according to the target position and the preset segmentation parameters; and determining the marking position of the test curve to be marked according to the at least two reference lines so as to mark according to the marking position. The scheme solves the problems that the amplification marking mode is low in efficiency, the accuracy is difficult to guarantee and the like, can reduce the marking deviation while improving the marking efficiency, and further achieves a good marking effect.
It should be understood that the statements in this section do not necessarily identify key or critical features of the embodiments of the present invention, nor do they necessarily limit the scope of the invention. Other features of the present invention will become apparent from the following description.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the drawings needed to be used in the description of the embodiments will be briefly introduced below, and it is obvious that the drawings in the following description are only some embodiments of the present invention, and it is obvious for those skilled in the art to obtain other drawings based on these drawings without creative efforts.
FIG. 1A is a flowchart of a method for marking a test curve according to an embodiment of the present invention;
FIG. 1B is a labeled schematic diagram of a spectral curve provided in accordance with an embodiment of the present invention;
FIG. 2 is a flowchart of a method for marking a test curve according to a second embodiment of the present invention;
FIG. 3 is a schematic structural diagram of a marking apparatus for testing curves according to a third embodiment of the present invention;
fig. 4 is a schematic structural diagram of an electronic device implementing the method for marking a test curve according to the embodiment of the present invention.
Detailed Description
In order to make the technical solutions of the present invention better understood, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
It should be noted that the terms "first," "second," and the like in the description and claims of the present invention and in the drawings described above are used for distinguishing between similar elements and not necessarily for describing a particular sequential or chronological order. It is to be understood that the data so used is interchangeable under appropriate circumstances such that the embodiments of the invention described herein are capable of operation in sequences other than those illustrated or described herein. Furthermore, the terms "comprises," "comprising," and "having," and any variations thereof, are intended to cover a non-exclusive inclusion, such that a process, method, system, article, or apparatus that comprises a list of steps or elements is not necessarily limited to those steps or elements expressly listed, but may include other steps or elements not expressly listed or inherent to such process, method, article, or apparatus. According to the technical scheme, the data acquisition, storage, use, processing and the like meet relevant regulations of national laws and regulations.
Example one
Fig. 1A is a flowchart of a method for marking a test curve according to an embodiment of the present invention, where the method is applicable to a scenario where a test curve is marked during an electromagnetic compatibility test, and the method may be executed by a device for marking a test curve, where the device may be implemented in a form of hardware and/or software, and the device may be configured in an electronic device. As shown in fig. 1A, the method includes:
and S110, if the marking trigger event is detected, determining the target position of the test curve to be marked.
The scheme can be executed by a test system, and the test system can generate a frequency spectrum curve after the electromagnetic compatibility test. It will be appreciated that the test curve to be marked may comprise a spectral curve. By detecting the marker trigger event, the test system can mark the test curve to be marked. The marking trigger event may be the completion of the electromagnetic compatibility test, or the reaching of a preset test curve marking time. The tester can process the test curve by operating the test system, and the marking trigger event can also be detecting operations such as mouse click, key press and the like, for example, pressing a test curve marking shortcut key.
If a marking trigger event is detected, the test system can determine the target position of the test curve to be marked according to the current pointer, the cursor and other position indication marks, and can also determine the target position of the test curve to be marked according to a preset position coordinate list file. The target position may be a position where the test curve to be marked needs to be marked.
And S120, generating at least two reference lines of the test curve to be marked according to the target position and preset segmentation parameters.
Fig. 1B is a labeled schematic diagram of a spectral curve provided according to an embodiment of the invention. As shown in FIG. 1B, the spectral curves generated by the EMC test typically relate to a range of frequencies, such as 30MHz-1 GHz. The test system is difficult to mark on the whole spectrum curve, so the spectrum curve can be divided, and each divided curve segment can be marked. The test system can divide the test curve to be marked into curve segments according to equal or unequal frequency ranges according to the dividing parameters. It will be readily appreciated that the segmentation parameter may include the number of segments, for example, a segmentation parameter of 10. According to the segmentation parameters, the test system can divide the frequency range such as the test curve to be marked into 10 sections. The test system can mark curve segments in the mark range by taking the frequency range matched with the target position as the mark range, and can also determine a mark range by taking the target position as the center according to the frequency range obtained by dividing the segmentation parameters, and mark the test curve to be marked in the mark range. The test system can generate a reference line on the boundary of the marking range and can also generate a reference line on the target position so as to visually observe the change of the target position. The reference line may be a straight line or a curved line, and may further have a symbol mark to distinguish the marking task.
It should be noted that the segmentation parameters may include one or more segmentation parameters, and the test system may display the target position and the marker ranges determined by the segmentation parameters, respectively, and display different reference lines differently. For example, the segmentation parameters may include 10 and 8, the test system may divide the frequency range of the test curve to be marked into 10 segments, divide the frequency range of the test curve to be marked into 8 segments, determine two marking ranges according to the target position and the frequency ranges determined by the two segmentation parameters, and further generate 4 reference lines perpendicular to the abscissa of the test curve to be marked.
S130, determining the marking position of the test curve to be marked according to the at least two reference lines, and marking according to the marking position.
It will be readily appreciated that the test system may determine at least one marker range, which may be a frequency range, for example, from at least two reference lines. The test system can determine the marking position on the test curve to be marked in the marking range, wherein the marking position can comprise the position of the test curve to be marked, which takes the maximum value in the marking range, can also comprise the position of the test curve to be marked, which takes the minimum value, and can also comprise the position of the test curve to be marked, which takes the abnormal value. Depending on the marking location, the test system may be marked with the same or different markings, for example diamond markings for the maximum location and circular markings for the minimum location.
According to the technical scheme, when a marking trigger event is detected, the target position of a test curve to be marked is determined, and at least two reference lines of the test curve to be marked are generated according to the target position and preset segmentation parameters; and determining the marking position of the test curve to be marked according to the at least two reference lines so as to mark according to the marking position. The scheme solves the problems that the amplification marking mode is low in efficiency, the accuracy is difficult to guarantee and the like, can reduce the marking deviation while improving the marking efficiency, and further achieves a good marking effect.
Example two
Fig. 2 is a flowchart of a method for marking a test curve according to a second embodiment of the present invention, which is detailed based on the second embodiment. As shown in fig. 2, the method includes:
s210, if the marking trigger event is detected, determining the target position of the test curve to be marked.
In this scheme, the test curve to be marked may be a spectrum curve as shown in fig. 1B, the mark triggering event may be a shortcut key press indicating a mark, the target position may be a position of the test curve to be marked indicated by a cursor, and the segmentation parameter may be the number of segments.
And S220, calculating a segmentation average value according to the preset segmentation parameters and the frequency range related to the test curve to be marked.
According to the frequency range and the segmentation parameters related to the test curve to be marked, the test system can calculate to obtain the segmentation average value. Wherein the segmentation average value represents the frequency interval involved by each segmentation segment after the frequency range involved by the test curve to be marked is equally divided. Specifically, the calculation formula of the segmentation average value is as follows:
Figure 100002_DEST_PATH_IMAGE001
wherein,
Figure 355084DEST_PATH_IMAGE002
representing the maximum frequency to which the test curve to be marked relates,
Figure 100002_DEST_PATH_IMAGE003
representing the minimum frequency to which the test curve to be marked relates,
Figure 368170DEST_PATH_IMAGE004
representing preset segmentation parameters.
And S230, determining a first reference position and a second reference position according to the target position and the segmentation average value.
As shown in FIG. 1B, the circular marker location may be a target location, which may be represented as coordinates
Figure 100002_DEST_PATH_IMAGE005
. It will be readily appreciated that the test system may maintain the ordinate of the target position constant and determine two reference positions, such as the triangle marker positions of FIG. 1B, based on the abscissa of the target position and the segmentation average. It will be appreciated that the abscissa of the spectral curve can be directly represented by a linear axis. In order to conveniently and clearly show the change condition of the curve, the frequency spectrum curve logarithmically converts the linear abscissa so as to stretch the small coordinate value and compress the large coordinate value.
In one possible embodiment, the first reference position is transverse to the test curve to be marked if it is displayed in a semilogarithmic coordinate systemThe coordinate calculation formula is as follows:
Figure 204277DEST_PATH_IMAGE006
the abscissa calculation formula of the second reference position is as follows:
Figure 100002_DEST_PATH_IMAGE007
;
in another possible solution, if the test curve to be marked is displayed in a linear coordinate system, the abscissa calculation formula of the first reference position is:
Figure 20923DEST_PATH_IMAGE008
the abscissa calculation formula of the second reference position is as follows:
Figure 100002_DEST_PATH_IMAGE009
wherein,
Figure 898881DEST_PATH_IMAGE010
the abscissa representing the position of the target is,
Figure DEST_PATH_IMAGE011
the division average value is shown.
S240, generating a first reference line perpendicular to the abscissa of the test curve to be marked at the first reference position, and generating a second reference line perpendicular to the abscissa of the test curve to be marked at the second reference position.
As shown in fig. 1B, the test system may generate a first reference line perpendicular to the abscissa of the test curve to be marked according to the first reference position, a second reference line perpendicular to the abscissa of the test curve to be marked according to the second reference position, and a center reference line perpendicular to the abscissa of the test curve to be marked according to the target position.
The scheme uses a target position as a center, determines a frequency range according to a segmentation average value, and marks a test curve to be marked in the frequency range. According to the scheme, a reasonable marking range can be set for marking the target position, so that regional marking of the test curve to be marked is facilitated, and the marking accuracy and efficiency are improved.
S250, determining a first frequency of the test curve to be marked according to the first reference line, and determining a second frequency of the test curve to be marked according to the second reference line.
It will be readily appreciated that the first reference line and the second reference line correspond to two frequencies on the test curve to be marked, respectively. For example, the first frequency corresponding to the first reference line shown in fig. 1B may be the abscissa of the first reference position in the linear coordinate system, and the second frequency corresponding to the second reference line may be the abscissa of the second reference position in the linear coordinate system.
S260, determining a frequency interval according to the first frequency and the second frequency, and determining the maximum amplitude value of the test curve to be marked in the frequency interval.
Assuming that the first frequency is
Figure 265009DEST_PATH_IMAGE012
The second frequency is
Figure DEST_PATH_IMAGE013
The frequency interval may be
Figure 242323DEST_PATH_IMAGE014
. The test system can screen out amplitude data in a frequency range on the test curve to be marked and determine the maximum value in the amplitude data. It can be understood that the frequency point with the maximum amplitude in each frequency interval is usually a risk point concerned in the electromagnetic compatibility test process, and the read point test can be conveniently performed by marking the risk point.
S270, determining the marking position of the test curve to be marked according to the maximum amplitude value, and marking according to the marking position.
After the amplitude maximum value in the frequency interval is determined, the test system can determine the marking position according to the amplitude maximum value and the frequency point corresponding to the amplitude maximum value, and further mark the marking position. Mark position 1, mark position 2 and mark position 3 as indicated by the diamond symbols in fig. 1B.
In this embodiment, optionally, after determining the frequency interval according to the first frequency and the second frequency, the method further includes:
if a correction trigger event is detected, determining the amplitude average value of the test curve to be marked in the frequency interval;
and correcting the amplitude of the test curve to be marked in the frequency interval according to the comparison result of the amplitude of each frequency point in the frequency interval and the amplitude average value and a preset correction principle.
The test system can also identify and correct abnormal interference signals appearing in the test curve to be marked. Specifically, if the test system detects a correction trigger event such as pressing of a correction shortcut key, inputting of a correction command, and the like, the average amplitude value may be calculated according to the amplitude data within the frequency interval range on the test curve to be marked. According to the comparison result of the amplitude of each frequency point in the frequency interval and the average value of the amplitude, the test system can determine whether the amplitude value of the frequency point is abnormal or not, and then the abnormal amplitude value is corrected.
On the basis of the above scheme, the correcting the amplitude of the test curve to be marked in the frequency interval according to the comparison result between the amplitude of each frequency point in the frequency interval and the amplitude average value and according to a preset correction principle includes:
if the amplitude of the frequency points in the frequency interval is larger than the amplitude average value, the amplitude value is reduced at least once according to a preset amplitude adjustment value until the amplitude is lower than a preset amplitude limit value.
If the amplitude of the frequency point in the frequency interval is larger than the amplitude average value, the amplitude of the frequency point is indicated to be at risk, and the test system can reduce the amplitude value of the amplitude of the frequency point at least once according to a preset amplitude adjustment value, such as 1dB, until the amplitude limit value is met. For example, the amplitude of the frequency point at the mark position 3 in fig. 1B is much higher than the amplitude limit value, the test system can correct the amplitude value by successive fine adjustment to keep the amplitude value within a reasonable amplitude range, thereby correcting the abnormal amplitude value caused by the interference signal in the test process.
According to the technical scheme, when a marking trigger event is detected, a target position of a test curve to be marked is determined, and at least two reference lines of the test curve to be marked are generated according to the target position and preset segmentation parameters; and determining the marking position of the test curve to be marked according to the at least two reference lines so as to mark according to the marking position. The scheme solves the problems that the amplification marking mode is low in efficiency, the accuracy is difficult to guarantee and the like, can reduce the marking deviation while improving the marking efficiency, and further achieves a good marking effect.
EXAMPLE III
Fig. 3 is a schematic structural diagram of a marking apparatus for testing a curve according to a third embodiment of the present invention. As shown in fig. 3, the apparatus includes:
a target position determining module 310, configured to determine a target position of the test curve to be marked if a mark triggering event is detected;
a reference line generating module 320, configured to generate at least two reference lines of the test curve to be marked according to the target position and preset segmentation parameters;
a marking position determining module 330, configured to determine, according to at least two reference lines, a marking position of the test curve to be marked, so as to mark according to the marking position.
In this embodiment, optionally, the reference line generating module 320 includes:
the segmentation average value determining unit is used for calculating a segmentation average value according to the preset segmentation parameters and the frequency range related to the test curve to be marked;
a reference position determining unit, configured to determine a first reference position and a second reference position according to the target position and the segmentation average;
and the reference line generating unit is used for generating a first reference line which is perpendicular to the abscissa of the test curve to be marked at the first reference position, and generating a second reference line which is perpendicular to the abscissa of the test curve to be marked at the second reference position.
On the basis of the above scheme, optionally, the calculation formula of the segmentation average value is as follows:
Figure 15107DEST_PATH_IMAGE001
;
wherein,
Figure DEST_PATH_IMAGE015
representing the maximum frequency to which the test curve to be marked relates,
Figure 234490DEST_PATH_IMAGE003
representing the minimum frequency to which the test curve to be marked relates,
Figure 143541DEST_PATH_IMAGE016
representing preset segmentation parameters.
In a possible solution, if the test curve to be marked is displayed in a semi-logarithmic coordinate system, the abscissa calculation formula of the first reference position is:
Figure DEST_PATH_IMAGE017
the abscissa calculation formula of the second reference position is as follows:
Figure 541024DEST_PATH_IMAGE018
;
if the test curve to be marked is displayed by a linear coordinate system, the abscissa calculation formula of the first reference position is as follows:
Figure DEST_PATH_IMAGE019
the abscissa calculation formula of the second reference position is as follows:
Figure 410891DEST_PATH_IMAGE020
wherein,
Figure DEST_PATH_IMAGE021
to show the eyesThe abscissa of the position of the target is,
Figure 332448DEST_PATH_IMAGE022
the division average value is shown.
Optionally, the mark position determining module 330 includes:
the frequency determining unit is used for determining a first frequency of the test curve to be marked according to the first reference line and determining a second frequency of the test curve to be marked according to the second reference line;
the amplitude maximum value determining unit is used for determining a frequency interval according to the first frequency and the second frequency and determining the amplitude maximum value of a test curve to be marked in the frequency interval;
and the marking position determining unit is used for determining the marking position of the test curve to be marked according to the maximum amplitude value so as to mark according to the marking position.
In a preferred embodiment, the mark position determining module 330 further includes:
the amplitude average value determining unit is used for determining the amplitude average value of the test curve to be marked in the frequency interval if a correction trigger event is detected;
and the amplitude correction unit is used for correcting the amplitude of the test curve to be marked in the frequency interval according to a preset correction principle and a comparison result of the amplitude of each frequency point in the frequency interval and the amplitude average value.
On the basis of the above scheme, optionally, the amplitude correction unit is specifically configured to:
if the amplitude of the frequency points in the frequency interval is larger than the amplitude average value, the amplitude value is reduced at least once according to a preset amplitude adjustment value until the amplitude is lower than a preset amplitude limit value.
The marking device of the test curve provided by the embodiment of the invention can execute the marking method of the test curve provided by any embodiment of the invention, and has corresponding functional modules and beneficial effects of the execution method.
Example four
FIG. 4 shows a schematic block diagram of an electronic device 410 that may be used to implement an embodiment of the invention. Electronic devices are intended to represent various forms of digital computers, such as laptops, desktops, workstations, personal digital assistants, servers, blade servers, mainframes, and other appropriate computers. The electronic device may also represent various forms of mobile devices, such as personal digital assistants, cellular phones, smart phones, wearable devices (e.g., helmets, glasses, watches, etc.), and other similar computing devices. The components shown herein, their connections and relationships, and their functions, are meant to be exemplary only, and are not meant to limit implementations of the inventions described and/or claimed herein.
As shown in fig. 4, the electronic device 410 includes at least one processor 411, and a memory communicatively connected to the at least one processor 411, such as a Read Only Memory (ROM) 412, a Random Access Memory (RAM) 413, and the like, wherein the memory stores computer programs executable by the at least one processor, and the processor 411 may perform various appropriate actions and processes according to the computer programs stored in the Read Only Memory (ROM) 412 or the computer programs loaded from the storage unit 418 into the Random Access Memory (RAM) 413. In the RAM 413, various programs and data required for the operation of the electronic device 410 can also be stored. The processor 411, the ROM 412, and the RAM 413 are connected to each other through a bus 414. An input/output (I/O) interface 415 is also connected to bus 414.
Various components in the electronic device 410 are connected to the I/O interface 415, including: an input unit 416 such as a keyboard, a mouse, or the like; an output unit 417 such as various types of displays, speakers, and the like; a storage unit 418, such as a magnetic disk, optical disk, or the like; and a communication unit 419 such as a network card, modem, wireless communication transceiver, or the like. The communication unit 419 allows the electronic device 410 to exchange information/data with other devices through a computer network such as the internet and/or various telecommunication networks.
Processor 411 may be a variety of general and/or special purpose processing components with processing and computing capabilities. Some examples of processor 411 include, but are not limited to, a Central Processing Unit (CPU), a Graphics Processing Unit (GPU), various specialized Artificial Intelligence (AI) computing chips, various processors running machine learning model algorithms, a Digital Signal Processor (DSP), and any suitable processor, controller, microcontroller, and so forth. The processor 411 performs the various methods and processes described above, such as the labeling method of the test curve.
In some embodiments, the labeling method of the test curve may be implemented as a computer program tangibly embodied in a computer-readable storage medium, such as storage unit 418. In some embodiments, part or all of the computer program may be loaded and/or installed onto electronic device 410 via ROM 412 and/or communications unit 419. When the computer program is loaded into RAM 413 and executed by processor 411, one or more steps of the marking method of the test curve described above may be performed. Alternatively, in other embodiments, the processor 411 may be configured by any other suitable means (e.g., by means of firmware) to perform the labeling method of the test curve.
Various implementations of the systems and techniques described here above may be implemented in digital electronic circuitry, integrated circuitry, Field Programmable Gate Arrays (FPGAs), Application Specific Integrated Circuits (ASICs), Application Specific Standard Products (ASSPs), system on a chip (SOCs), load programmable logic devices (CPLDs), computer hardware, firmware, software, and/or combinations thereof. These various embodiments may include: implemented in one or more computer programs that are executable and/or interpretable on a programmable system including at least one programmable processor, which may be special or general purpose, receiving data and instructions from, and transmitting data and instructions to, a storage system, at least one input device, and at least one output device.
A computer program for implementing the methods of the present invention may be written in any combination of one or more programming languages. These computer programs may be provided to a processor of a general purpose computer, special purpose computer, or other programmable data processing apparatus, such that the computer programs, when executed by the processor, cause the functions/acts specified in the flowchart and/or block diagram block or blocks to be performed. A computer program can execute entirely on a machine, partly on the machine, as a stand-alone software package, partly on the machine and partly on a remote machine or entirely on the remote machine or server.
In the context of the present invention, a computer-readable storage medium may be a tangible medium that can contain, or store a computer program for use by or in connection with an instruction execution system, apparatus, or device. A computer readable storage medium may include, but is not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any suitable combination of the foregoing. Alternatively, the computer readable storage medium may be a machine readable signal medium. More specific examples of a machine-readable storage medium would include an electrical connection based on one or more wires, a portable computer diskette, a hard disk, a Random Access Memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.
To provide for interaction with a user, the systems and techniques described here can be implemented on an electronic device having: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to a user; and a keyboard and a pointing device (e.g., a mouse or a trackball) by which a user can provide input to the electronic device. Other kinds of devices may also be used to provide for interaction with a user; for example, feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user may be received in any form, including acoustic, speech, or tactile input.
The systems and techniques described here can be implemented in a computing system that includes a back-end component (e.g., as a data server), or that includes a middleware component (e.g., an application server), or that includes a front-end component (e.g., a user computer having a graphical user interface or a web browser through which a user can interact with an implementation of the systems and techniques described here), or any combination of such back-end, middleware, or front-end components. The components of the system can be interconnected by any form or medium of digital data communication (e.g., a communication network). Examples of communication networks include: local Area Networks (LANs), Wide Area Networks (WANs), blockchain networks, and the internet.
The computing system may include clients and servers. A client and server are generally remote from each other and typically interact through a communication network. The relationship of client and server arises by virtue of computer programs running on the respective computers and having a client-server relationship to each other. The server can be a cloud server, also called a cloud computing server or a cloud host, and is a host product in a cloud computing service system, so that the defects of high management difficulty and weak service expansibility in the traditional physical host and VPS service are overcome.
It should be understood that various forms of the flows shown above may be used, with steps reordered, added, or deleted. For example, the steps described in the present invention may be executed in parallel, sequentially, or in different orders, and are not limited herein as long as the desired result of the technical solution of the present invention can be achieved.
The above-described embodiments should not be construed as limiting the scope of the invention. It should be understood by those skilled in the art that various modifications, combinations, sub-combinations and substitutions may be made in accordance with design requirements and other factors. Any modification, equivalent replacement, and improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.

Claims (10)

1. A method of labeling a test curve, the method comprising:
if a marking trigger event is detected, determining a target position of a test curve to be marked;
generating at least two reference lines of the test curve to be marked according to the target position and preset segmentation parameters;
and determining the marking position of the test curve to be marked according to at least two reference lines so as to mark according to the marking position.
2. The method according to claim 1, wherein the generating at least two reference lines of the test curve to be marked according to the target position and preset segmentation parameters comprises:
calculating a segmentation average value according to the preset segmentation parameters and the frequency range related to the test curve to be marked;
determining a first reference position and a second reference position according to the target position and the segmentation average value;
and generating a first reference line perpendicular to the abscissa of the test curve to be marked at the first reference position, and generating a second reference line perpendicular to the abscissa of the test curve to be marked at the second reference position.
3. The method of claim 2, wherein the segmentation average is calculated by:
Figure DEST_PATH_IMAGE001
;
wherein,
Figure 756383DEST_PATH_IMAGE002
representing the maximum frequency to which the test curve to be marked relates,
Figure DEST_PATH_IMAGE003
representing the minimum frequency to which the test curve to be marked relates,
Figure 259915DEST_PATH_IMAGE004
representing preset segmentation parameters.
4. The method according to claim 2, wherein if the test curve to be marked is displayed in a semi-logarithmic coordinate system, the abscissa calculation formula of the first reference position is:
Figure DEST_PATH_IMAGE005
the abscissa calculation formula of the second reference position is as follows:
Figure 949653DEST_PATH_IMAGE006
;
if the test curve to be marked is displayed by a linear coordinate system, the abscissa calculation formula of the first reference position is as follows:
Figure DEST_PATH_IMAGE007
the abscissa calculation formula of the second reference position is as follows:
Figure 146017DEST_PATH_IMAGE008
wherein,
Figure DEST_PATH_IMAGE009
the abscissa representing the position of the target is,
Figure 288416DEST_PATH_IMAGE010
the division average value is shown.
5. The method according to claim 2, wherein the determining the marking position of the test curve to be marked according to the at least two reference lines for marking according to the marking position comprises:
determining a first frequency of the test curve to be marked according to the first reference line, and determining a second frequency of the test curve to be marked according to the second reference line;
determining a frequency interval according to the first frequency and the second frequency, and determining the maximum amplitude value of the test curve to be marked in the frequency interval;
and determining the marking position of the test curve to be marked according to the maximum amplitude value so as to mark according to the marking position.
6. The method of claim 5, wherein after determining a frequency interval based on the first and second frequencies, the method further comprises:
if a correction trigger event is detected, determining the amplitude average value of the test curve to be marked in the frequency interval;
and correcting the amplitude of the test curve to be marked in the frequency interval according to the comparison result of the amplitude of each frequency point in the frequency interval and the amplitude average value and a preset correction principle.
7. The method according to claim 6, wherein the modifying the amplitude of the test curve to be marked in the frequency interval according to the comparison result between the amplitude of each frequency point in the frequency interval and the average value of the amplitudes according to a preset modification rule comprises:
if the amplitude of the frequency points in the frequency interval is larger than the amplitude average value, the amplitude value is reduced at least once according to a preset amplitude adjustment value until the amplitude is lower than a preset amplitude limit value.
8. A marking device for a test curve, comprising:
the target position determining module is used for determining the target position of the test curve to be marked if the marking trigger event is detected;
the reference line generating module is used for generating at least two reference lines of the test curve to be marked according to the target position and preset segmentation parameters;
and the marking position determining module is used for determining the marking position of the test curve to be marked according to at least two reference lines so as to mark according to the marking position.
9. An electronic device, characterized in that the electronic device comprises:
at least one processor; and
a memory communicatively coupled to the at least one processor; wherein,
the memory stores a computer program executable by the at least one processor to enable the at least one processor to perform the method of marking a test curve of any one of claims 1-7.
10. A computer-readable storage medium storing computer instructions for causing a processor to perform the method of labeling a test curve of any one of claims 1-7 when executed.
CN202210989894.6A 2022-08-18 2022-08-18 Test curve marking method, device, equipment and storage medium Pending CN115061605A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
CN202210989894.6A CN115061605A (en) 2022-08-18 2022-08-18 Test curve marking method, device, equipment and storage medium

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202210989894.6A CN115061605A (en) 2022-08-18 2022-08-18 Test curve marking method, device, equipment and storage medium

Publications (1)

Publication Number Publication Date
CN115061605A true CN115061605A (en) 2022-09-16

Family

ID=83207631

Family Applications (1)

Application Number Title Priority Date Filing Date
CN202210989894.6A Pending CN115061605A (en) 2022-08-18 2022-08-18 Test curve marking method, device, equipment and storage medium

Country Status (1)

Country Link
CN (1) CN115061605A (en)

Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5610827A (en) * 1994-09-02 1997-03-11 Ssi Technologies, Inc. Method of and apparatus for peak amplitude detection
JP2012018192A (en) * 2011-10-26 2012-01-26 Anritsu Corp Measuring device
JP2012018194A (en) * 2011-10-26 2012-01-26 Anritsu Corp Measuring device
JP2012042482A (en) * 2011-10-26 2012-03-01 Anritsu Corp Measuring apparatus
JP6777335B1 (en) * 2019-07-11 2020-10-28 Necプラットフォームズ株式会社 Video / audio control device, video / audio processing device, video / audio control method, and video / audio control program
CN112801223A (en) * 2020-12-21 2021-05-14 深圳市音润科技有限公司 Three-axis acceleration training data labeling method for step counting and readable storage medium
CN113918433A (en) * 2021-09-27 2022-01-11 中盈优创资讯科技有限公司 Adaptive intelligent network equipment performance index abnormity detection device and method
CN114548843A (en) * 2022-04-25 2022-05-27 北京寄云鼎城科技有限公司 Processing method of wind driven generator power data, computer equipment and medium

Patent Citations (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5610827A (en) * 1994-09-02 1997-03-11 Ssi Technologies, Inc. Method of and apparatus for peak amplitude detection
JP2012018192A (en) * 2011-10-26 2012-01-26 Anritsu Corp Measuring device
JP2012018194A (en) * 2011-10-26 2012-01-26 Anritsu Corp Measuring device
JP2012042482A (en) * 2011-10-26 2012-03-01 Anritsu Corp Measuring apparatus
JP6777335B1 (en) * 2019-07-11 2020-10-28 Necプラットフォームズ株式会社 Video / audio control device, video / audio processing device, video / audio control method, and video / audio control program
CN112801223A (en) * 2020-12-21 2021-05-14 深圳市音润科技有限公司 Three-axis acceleration training data labeling method for step counting and readable storage medium
CN113918433A (en) * 2021-09-27 2022-01-11 中盈优创资讯科技有限公司 Adaptive intelligent network equipment performance index abnormity detection device and method
CN114548843A (en) * 2022-04-25 2022-05-27 北京寄云鼎城科技有限公司 Processing method of wind driven generator power data, computer equipment and medium

Similar Documents

Publication Publication Date Title
CN112218306B (en) Method and device for predicting coverage performance of base station and computer equipment
US20230177326A1 (en) Method and apparatus for compressing neural network model
CN113795039A (en) Operator network switching method, device, equipment and computer readable storage medium
CN115685109A (en) Method, device and equipment for testing millimeter wave radar and storage medium
CN112818387A (en) Method, apparatus, storage medium, and program product for model parameter adjustment
CN114445682A (en) Method, device, electronic equipment, storage medium and product for training model
CN115061605A (en) Test curve marking method, device, equipment and storage medium
CN110446256B (en) Method and equipment for realizing positioning of base station based on ultra wide band
CN115374499A (en) Dimension marking method and device, electronic equipment and storage medium
CN115408034A (en) Vehicle-mounted controller upgrading method and device, electronic equipment and storage medium
CN115407150A (en) System, method, meter and medium for determining use condition of protective pressing plate
CN115103024A (en) Serial number generation method and device, electronic equipment and storage medium
CN103813354A (en) Method and device for evaluating performance of terminal
CN112948517A (en) Area position calibration method and device and electronic equipment
CN114599054B (en) Equipment abnormality detection method and device, electronic equipment, medium and product
CN106547979B (en) Station abnormity detection method and system
CN116302897B (en) Data set establishing method and device, electronic equipment and storage medium
CN117471211A (en) Method, device, equipment and storage medium for determining reference neutral point
CN114694138B (en) Road surface detection method, device and equipment applied to intelligent driving
CN115237289B (en) Hot zone range determining method, device, equipment and storage medium
EP4180968A1 (en) Regression test method and apparatus, electronic device and storage medium
CN114429509B (en) Method and device for finding newly added road and electronic equipment
CN113986112B (en) Soft keyboard display method, related device and computer program product
CN118300745A (en) Message adjustment method, device, equipment and storage medium
CN114820770A (en) Scanning triggering method and device, electronic equipment and storage medium

Legal Events

Date Code Title Description
PB01 Publication
PB01 Publication
SE01 Entry into force of request for substantive examination
SE01 Entry into force of request for substantive examination
RJ01 Rejection of invention patent application after publication

Application publication date: 20220916

RJ01 Rejection of invention patent application after publication