CN115060355B - Harmonic oscillator quality factor measurement method based on linear frequency modulation pulse - Google Patents

Harmonic oscillator quality factor measurement method based on linear frequency modulation pulse Download PDF

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CN115060355B
CN115060355B CN202210380357.1A CN202210380357A CN115060355B CN 115060355 B CN115060355 B CN 115060355B CN 202210380357 A CN202210380357 A CN 202210380357A CN 115060355 B CN115060355 B CN 115060355B
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quality factor
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CN115060355A (en
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李宏生
刘蓉
丁徐锴
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Southeast University
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    • G01MEASURING; TESTING
    • G01HMEASUREMENT OF MECHANICAL VIBRATIONS OR ULTRASONIC, SONIC OR INFRASONIC WAVES
    • G01H13/00Measuring resonant frequency
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    • GPHYSICS
    • G06COMPUTING; CALCULATING OR COUNTING
    • G06FELECTRIC DIGITAL DATA PROCESSING
    • G06F17/00Digital computing or data processing equipment or methods, specially adapted for specific functions
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    • G06F17/18Complex mathematical operations for evaluating statistical data, e.g. average values, frequency distributions, probability functions, regression analysis

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Abstract

The invention provides a method for measuring quality factor of harmonic oscillator based on linear frequency modulation pulse signal, which comprises the steps of firstly using the linear frequency modulation pulse signal to carry out sweep frequency excitation on the harmonic oscillator to obtain a response signalThe method comprises the steps of carrying out a first treatment on the surface of the Responsive to a response signalSampling, FFT, modulo, normalizing to obtain frequency spectrumThe method comprises the steps of carrying out a first treatment on the surface of the Frequency spectrum of frequency sweeping range is cut offCalculating to obtain the estimated value of the vibration frequencyThe method comprises the steps of carrying out a first treatment on the surface of the Establishing a Lorentz curve model, and fitting the frequency range of the first LorentzQ value range 1 Q M,Performing first estimation on the quality factor; combining the first estimateIn the whole domain of sweep frequencyQ value rangeAnd (5) performing second Lorentz fitting to obtain a final quality factor estimated value. The method not only improves larger errors of the half-power bandwidth method in a low signal-to-noise ratio environment, but also saves operation time through a two-step fitting process, and particularly has obvious advantages for some high-Q-value resonators.

Description

Harmonic oscillator quality factor measurement method based on linear frequency modulation pulse
Technical Field
The invention relates to the field of parameter measurement of resonant devices, in particular to a harmonic oscillator quality factor measurement method based on linear frequency modulation pulses.
Background
The quality factor is an important parameter of the vibration characteristics of the resonant device, and plays an important role in driving control and error mechanism analysis. The quality factor measurement method is mainly divided into a time domain method and a frequency domain method. The time domain method is based on the amplitude attenuation characteristic during free oscillation, and is calculated by utilizing the attenuation degree of the oscillation amplitude in a specific time and the corresponding relation between the oscillation amplitude and the Q value, and the peak value or the amplitude envelope of the transient response needs to be detected, so that the time domain method is relatively complex. The frequency domain method is more commonly used, and is generally calculated based on an amplitude-frequency characteristic curve by using a resonance frequency and a passband bandwidth, and is called a half-power bandwidth method. However, when the signal-to-noise ratio is low, the reliability of the half-power bandwidth method is low and the error is large.
Disclosure of Invention
In order to solve the problems, the invention discloses a harmonic oscillator quality factor measurement method based on linear frequency modulation pulses, which aims to solve the problem of larger quality factor measurement error under the condition of low signal to noise ratio.
In order to achieve the above object, the present invention adopts the following scheme:
a harmonic oscillator quality factor measuring method based on linear frequency modulation pulse comprises the following steps:
step 1: using chirp signals to carry out sweep frequency excitation on the harmonic oscillator to obtain response signals s (t);
step 2: sampling, FFT (fast Fourier transform), modulo, and normalizing the response signal S (t) to obtain a frequency spectrum |S' (n) |; cut off frequency spectrum |S of sweep frequency range 1 'n' is calculated to obtain the estimated value of the vibration frequency
Step 3: and (3) establishing a Lorentz curve model, successively carrying out Lorentz fitting twice according to different frequency ranges, and obtaining a quality factor by combining the resonance frequency values obtained in the previous step.
The step 3 comprises the following steps:
step 3.1: establishing Lorentz curve model Is the estimated resonant frequency, Q is the quality factor, and the Q maximum is set to M. If q=m, draw L (f) | Q=m And normalized to obtain L' (f) | Q=m
Step 3.2: first Lorentz fitting frequency rangeQ value is more than or equal to 1 and less than or equal to M. The frequency corresponding to each data point in the actual frequency range and the fitting curve is calculatedThe magnitudes of the points are subjected to point-by-point difference and accumulated to obtain residual error (m);
step 3.3: indexing the point with the minimum value in the residual error sequence error (i), and marking the sequence number as index0 to obtain the quality factor value estimated for the first time
Step 3.4: the second Lorentz fit f ranges over the whole sweep domain interval f 1 ≤f≤f 2 Selecting the Q value range asRepeating the step 3.3 to obtain a residual sequence error (i);
step 3.5: indexing the point with the minimum value in the residual error sequence error (i), and marking the sequence number as index1 to obtain the final estimated value of the quality factor
The invention has the beneficial effects that: the method improves larger errors of the half-power bandwidth method in a low signal-to-noise ratio environment, saves operation time through a two-step fitting process, and has obvious advantages especially for some high-Q-value resonators.
Drawings
FIG. 1 is a flow chart of a method for measuring the quality factor of a harmonic oscillator based on a chirp pulse;
FIG. 2 is a comparison of the relative error between the simulation results of the half-power bandwidth method and the method of the present invention.
Detailed Description
The present invention is further illustrated in the following drawings and detailed description, which are to be understood as being merely illustrative of the invention and not limiting the scope of the invention. It should be noted that the words "front", "rear", "left", "right", "upper" and "lower" used in the following description refer to directions in the drawings, and the words "inner" and "outer" refer to directions toward or away from, respectively, the geometric center of a particular component.
As shown in fig. 1-2, in the method for measuring quality factor of harmonic oscillator based on chirp, parameters of the chirp signal are set: initial frequency f 1 Termination frequency f 2 Generating a chirp signal x (T):
wherein the method comprises the steps of
Sweeping excitation is carried out on the harmonic oscillator by using a chirp signal, so as to obtain a response signal s (t);
by sampling rate f s The response signal S (T) is sampled, then the FFT is performed and modulo is performed to obtain a frequency spectrum |S (N) |, the length is N, the resolution Deltaf=1/T of the frequency spectrum is normalized to obtain |S' (N) |.
|S(n)|=|X(n)|·|G(n)| (2)
Where |x (n) | is the spectrum of chirp in the frequency domain; the I G (n) I is a mode of amplitude-frequency characteristics of the harmonic oscillator; n=1, 2, …, N;
cut off the sweep frequency range in |S' (n) | to be f 1 ≤f≤f 2 Spectrum |S in 1 ′(n)|,f 1 Corresponding spectral line number N 1 、f 2 Corresponding spectral line number N 2 I.e. |S 1 ′(n)|=|S′(n)|,N 1 ≤n≤N 2
For |S 1 ' (n) | carrying out spectrum peak index, wherein the spectral line serial number corresponding to the spectrum peak is k 0 Spectral peak amplitude is |S 1 ′(k 0 ) I, obtain an estimate of the resonant frequency
Establishing a Lorentzian curve model L (f):
is the estimated resonant frequency, and the Q maximum is set to M.
If q=m, draw L (f) | Q=m And normalized to obtain L' (f) | Q=m
The first Lorentz fitting frequency f ranges fromQ value is more than or equal to 1 and less than or equal to M.
The frequency spectrum sequence corresponding to the frequency range is to make the difference between each data point in the actual frequency range and the amplitude of the frequency point corresponding to the fitting curve point by point and accumulate the difference to obtain a residual error (m):
indexing the point with the minimum value in the residual error sequence error (i), and marking the sequence number as index0 to obtain the quality factor value estimated for the first time
The second Lorentz fit f ranges over the whole sweep domain interval f 1 ≤f≤f 2 Selecting the Q value range asRepeating the step 3.3 to obtain a residual sequence error (i):
indexing the point with the minimum value in the residual error sequence error (i), and marking the sequence number as index1 to obtain the final estimated value of the quality factor
The half-power bandwidth method only uses three points of the response signal spectrum for calculation, and Lorentz fitting uses all points in the effective frequency range, so that errors can be reduced for signals with low signal-to-noise ratio; compared with the method for performing Lorentz fitting only once, the two-step fitting can save more operation time, especially for some high-Q-value resonators.
The technical means disclosed by the scheme of the invention is not limited to the technical means disclosed by the embodiment, and also comprises the technical scheme formed by any combination of the technical features.

Claims (1)

1. A method for measuring a quality factor of a harmonic oscillator based on a chirp pulse, the method comprising the steps of:
step 1: using chirp signals to carry out sweep frequency excitation on the harmonic oscillator to obtain response signals s (t);
step 2: sampling, FFT (fast Fourier transform), modulo, and normalizing the response signal S (t) to obtain a frequency spectrum |S' (n) |; cut off frequency spectrum |S of sweep frequency range 1 'n' is calculated to obtain the estimated value of the vibration frequency
Step 3: establishing a Lorentz curve model, and obtaining a frequency range of a first Lorentz fitting by using a half-power bandwidth methodPerforming first estimation on the quality factor; combining the first estimateIn the sweep frequency domain f 1 ≤f≤f 2 ,/>Performing second Lorentz fitting to obtain a final quality factor estimated value; setting parameters of the chirp signal in the step 1: initial frequency f 1 Termination frequency f 2 Generating a chirp signal x (T):
wherein the method comprises the steps ofSweeping excitation is carried out on the harmonic oscillator by using a chirp signal, so as to obtain a response signal s (t); the step 2: by sampling rate f s Sampling a response signal S (T), performing FFT (fast Fourier transform) and taking a modulus to obtain a frequency spectrum |S (N) |, wherein the length is N, the resolution Deltaf=1/T of the frequency spectrum, and normalizing the frequency spectrum to obtain |S' (N) |;
|S(n)|=|X(n)|·|G(n)| (2)
where |x (n) | is the spectrum of chirp in the frequency domain; the I G (n) I is a mode of amplitude-frequency characteristics of the harmonic oscillator; n=1, 2, …, N;
cut off the sweep frequency range in |S' (n) | to be f 1 ≤f≤f 2 Spectrum |S in 1 ′(n)|,f 1 Corresponding spectral line number N 1 、f 2 Corresponding spectral line number N 2 I.e. |S 1 ′(n)|=|S′(n)|,N 1 ≤n≤N 2
For |S 1 ' (n) | carrying out spectrum peak index, wherein the spectral line serial number corresponding to the spectrum peak is k 0 Spectral peak amplitude is |S 1 ′(k 0 ) I, obtain an estimate of the resonant frequencyThe step 3 comprises the following steps:
step 3.1:
establishing Lorentz curve model Is the estimated resonant frequency, Q is the quality factor, and the maximum value of Q is set to M; if q=m, draw L (f) | Q=m And normalized to obtain L' (f) | Q=m
Step 3.2: the first Lorentz fitting frequency f ranges fromQ is more than or equal to 1 and less than or equal to M; the amplitude of each data point in the actual frequency range and the frequency point corresponding to the fitting curve are subjected to point-by-point difference and accumulated to obtain a residual sequence error (m);
step 3.3: indexing the point with the minimum value in the residual error sequence error (m), and marking the sequence number as index0 to obtain the quality factor value estimated for the first time
Step 3.4: the second Lorentz fitting f range is in the whole sweep frequency domain interval, and the Q value range is selected asRepeating the step 3.3 to obtain a residual sequence error (i); error (i):
step 3.5: indexing the point with the minimum value in the residual error sequence error (i), and marking the sequence number as index1 to obtain the final estimated value of the quality factor
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