CN115047311A - Card full life cycle management method, system, computer product and storage medium - Google Patents

Abstract

The invention relates to a method, a system, a computer product and a storage medium for managing the whole life cycle of a card, wherein the method comprises the following steps in the current detection window period of the whole life cycle of the card: inputting excitation signals to a plurality of input pins of the card by a test signal source, acquiring response signals from a plurality of output pins of the card by an acquisition control device, and respectively calculating the deviation of the response signals of the output pins and corresponding standard signals; respectively calculating the average deviation corresponding to each output pin; calculating the integral average deviation of the clamping piece; and determining an auxiliary strategy of the card and the next detection window period according to the overall average deviation. By implementing the technical scheme of the invention, the loss condition of components inside the clamping piece is reduced, the timeliness of daily maintenance work is improved, the reliability of the whole nuclear power station circuit protection system is ensured, and the safety of the whole nuclear power station power grid system and the stability of the operation of electrical equipment are maintained.

Description

Card full life cycle management method, system, computer product and storage medium

Technical Field

The invention relates to the field of nuclear power, in particular to a method and a system for managing the whole life cycle of a card, a computer product and a storage medium.

Background

For a long time, the electric power industry adopts a regular maintenance system for electrical equipment, and is characterized in that equipment maintenance is arranged on the basis of a simple time period. The maintenance method is lack of scientificity in theory, the influence of different maintenance moments on the reliability, safety and economy of equipment operation is different, and the unreasonable maintenance period causes low economic benefit. In addition, the mode generally only focuses on the whole life cycle reliability management of equipment-level products, but ignores the whole life cycle process management of the fine card, and if only one card in the equipment is damaged or fails, the whole equipment can be maintained or replaced, so that the service life of the electrical equipment is greatly shortened, and the cost is also saved.

Disclosure of Invention

The invention aims to solve the technical problem of providing a method and a system for managing the whole life cycle of a card, a computer product and a storage medium aiming at the defect of regular maintenance of the whole electrical equipment in the prior art.

The technical scheme adopted by the invention for solving the technical problem is as follows: the method for managing the whole life cycle of the card of the electrical equipment is constructed, and the following steps are carried out in the current detection window period of the whole life cycle of the card:

inputting excitation signals to a plurality of input pins of the card by a test signal source, acquiring response signals from a plurality of output pins of the card by an acquisition control device, and respectively calculating the deviation of the response signals of the output pins and corresponding standard signals;

respectively calculating the average deviation corresponding to each output pin according to the deviation corresponding to each output pin in the current detection window period and the deviation corresponding to each detection window period before the current detection window period;

calculating the integral average deviation of the clamping piece according to the average deviation corresponding to each output pin;

and determining an auxiliary strategy of the card and the next detection window period according to the overall average deviation.

Preferably, the method further comprises the following steps:

and estimating the service life of the clamping piece according to the integral average deviation of the clamping piece and the clamping pieces of the same type.

Preferably, the method further comprises the following steps:

the method comprises the steps of obtaining operation information of the electrical equipment under an operation condition, stopping the operation of the electrical equipment if the electrical equipment is judged to be abnormal according to the operation information, and temporarily increasing a detection window period of the clamping piece in the whole life cycle of the clamping piece.

Preferably, the determining an auxiliary strategy of the cartridge according to the overall average deviation comprises:

determining a deviation range corresponding to the integral average deviation according to a preset corresponding relation between a plurality of groups of deviation ranges and corresponding auxiliary strategies, and searching the corresponding auxiliary strategies according to the determined deviation ranges, wherein the auxiliary strategies comprise: normal use; maintenance; and (4) replacing.

The invention also provides a computer product comprising a processor which, when executing a computer program, carries out the steps of the method for managing the full life cycle of a card of an electrical apparatus described above.

The invention also constitutes a storage medium storing a computer program which, when executed by a processor, implements the steps of the method for managing the full life cycle of a card of an electrical apparatus as described above.

The invention also constructs a whole life cycle management system of the clamping piece of the electrical equipment, which is characterized by comprising a background host, a front-end processor, a test signal source and an acquisition control device which are arranged in the cabinet, wherein the test signal source and the acquisition control device are respectively connected with the background host through the front-end processor, the background host comprises a processor, and the processor realizes the steps of the whole life cycle management method of the clamping piece of the electrical equipment when executing a computer program.

Preferably, the background host is further configured to generate a test case of the card, and issue the test case to the front-end processor;

the front-end processor is used for analyzing the received test case into a plurality of control commands and sending the control commands to the test signal source and the acquisition control device;

the test signal source is used for configuring the output voltage according to the received corresponding control command so as to provide an excitation signal for the card member;

and the acquisition control device is used for acquiring a response signal from the card according to the received corresponding control command and sending the response signal to the background host through the front-end processor.

Preferably, further comprising an adapter device disposed within the cabinet, and,

the adapting device is used for conditioning an excitation signal input to the card and/or a response signal output by the card.

Preferably, the acquisition control device comprises a main control board, and a switching value output board, a switching value input board and an analog input board which are respectively connected with the main control board, and the switching value output board, the switching value input board and the analog input board are also respectively connected with corresponding pins of the card through corresponding ports, wherein,

the main control board is used for receiving a corresponding control command from the front-end processor and configuring the on-off of corresponding channels in the switching value output board and the switching value input board according to the corresponding control command; and the analog quantity input board is used for acquiring switching quantity response signals from the switching quantity input board, acquiring analog quantity response signals from the analog quantity input board and processing the switching quantity response signals and the analog quantity response signals.

Preferably, the switching value input board includes an optocoupler array, a positive input end of each optocoupler is connected to an input end of a corresponding relay switch, an output end of the corresponding relay switch is connected to a power supply, a negative input end and a negative output end of each optocoupler are grounded together, and a positive output end of each optocoupler is connected to a corresponding input end of the main control board.

Preferably, the test signal source includes:

the relay protection tester is used for configuring corresponding alternating current voltage or current according to the received corresponding control command;

and the direct current adjustable power supply is used for configuring corresponding direct current voltage or current according to the received corresponding control command.

According to the technical scheme provided by the invention, the test data of the clamping piece at different stages in the whole life cycle of the clamping piece are collected and compared with the standard signal data established before the clamping piece is put into use, the deviation of each test item of the clamping piece during each test can be obtained, the integral average deviation of the clamping piece is calculated by combining historical test data, the reliability of the clamping piece can be finally determined, meanwhile, a corresponding auxiliary strategy is provided according to the reliability of the clamping piece, the detection window period in the whole life cycle is adjusted, the loss condition of components in the clamping piece is reduced, the timeliness of daily maintenance work is improved, the reliability of the whole nuclear power station circuit protection system is ensured, and the safety of the whole nuclear power station power grid system and the running stability of electrical equipment are maintained.

Drawings

In order to illustrate the embodiments of the invention more clearly, the drawings that are needed in the description of the embodiments will be briefly described below, it being apparent that the drawings in the following description are only some embodiments of the invention, and that other drawings may be derived from those drawings by a person skilled in the art without inventive effort. In the drawings:

FIG. 1 is a flowchart of a first embodiment of a method for managing a life cycle of a card of an electrical device according to the present invention;

FIG. 2 is a logic structure diagram of a first embodiment of a life cycle management system for cards of an electrical device according to the present invention;

fig. 3 is a partial logic structure diagram of a second embodiment of the life cycle management system of the card of the electrical equipment of the present invention.

Detailed Description

The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.

Firstly, it is explained that, for the fastener of the electrical equipment of the nuclear power station, the fastener can go through a plurality of task stages of design, manufacture, storage, installation, in-place operation, repair and the like in the whole life cycle, and the process has the following characteristics:

1) the storage, installation and on-site running task stages of the clamping pieces are continuous and do not overlap;

2) the complex structure and the severe working condition of the clamping piece determine that the clamping piece cannot be repaired immediately when the clamping piece fails in a task stage, wherein the failure mode comprises manufacturing defects, environmental factors and non-specific design;

3) the failure of the task at any stage can cause the failure of the whole task, for example, the performance of components and materials can be reduced along with the time when the clamping piece runs in place. Exposure to thermal cycling, ultraviolet light, and mechanical stresses can lead to degradation and premature failure of the circuit board.

In a plurality of stages in the whole life cycle of the card, because failure data in the design and manufacture stage is not verified and failure problems in the storage and installation stages are not obvious, the technical scheme of the invention mainly analyzes the reliability of the on-site operation stage with obvious failure problems. During this in-place operation phase, for example, vibration or movement of the circuit board subjected to mechanical stress may cause the solder joint assembly to be disconnected at one end, the clip may generate heat, and is also often exposed to heat during operation, and the temperature change of the PCB board may crack the solder joint, the substrate material, and even the housing. If the card runs in a very humid environment with rapid temperature change, moisture can condense from the air onto the circuit, thus causing card failure; as the service life increases, the card will gradually start to fail, the old parts always need to be replaced with new ones, and aging can lead to capacitor failure, leading to problems with the electrical equipment.

According to the technical scheme, reliability management of the whole life cycle of the clamping piece of the electrical equipment is carried out, data detected by the clamping piece in different detection window periods are analyzed and compared with standard data in an initial database established before the equipment is put into use, the reliability of the clamping piece equipment or components is determined according to the analysis result, an auxiliary strategy is further determined, loss of the components in the clamping piece is found and reduced in time, the reliability of a circuit protection system of the whole nuclear power station is guaranteed, and the safety of a power grid system of the whole nuclear power station and the running stability of the electrical equipment are maintained. In addition, the detection window period of the clamping piece is dynamically adjusted according to the analysis result, the timeliness of daily maintenance work is improved, and meanwhile, the normal operation of the clamping piece is guaranteed to the maximum extent.

Fig. 1 is a flowchart of a first embodiment of a method for managing a full life cycle of a card of an electrical device according to the present invention, where the method for managing a full life cycle of a card of an electrical device is applied to a background host, and it should be noted that, in the full life cycle of a card of an electrical device, a plurality of detection window periods initially set for a certain card correspond to each other, for example, the plurality of detection window periods initially set for a certain card are respectively the fifth year, the tenth year, and the fifteenth year, and so on. In the method for managing the full life cycle of the embodiment, in the current detection window period of the full life cycle of the card, the following steps are carried out:

step S10, inputting excitation signals to a plurality of input pins of the card by a test signal source, collecting response signals from a plurality of output pins of the card by a collection control device, and respectively calculating the deviation of the response signals of each output pin and corresponding standard signals;

in this step, it should be noted that, before the card is put into use, initial database data of the card may be established, including standard signal values corresponding to a plurality of test items (output pins), respectively.

Step S20, calculating the average deviation corresponding to each output pin according to the deviation corresponding to each output pin in the current detection window period and the deviation corresponding to each detection window period before the current detection window period;

step S30, calculating the integral average deviation of the card according to the average deviation corresponding to each output pin;

and step S40, determining an auxiliary strategy and a next detection window period of the card according to the overall average deviation.

The technical scheme of this embodiment is to the test data of fastener in its different stages of life cycle gather, and will compare with the standard signal data that establish before putting into service, can obtain the deviation of every test item of fastener when testing at every turn, combine historical test data to calculate the whole average deviation of this fastener again, can confirm the degree of reliability of fastener finally, provide corresponding supplementary strategy and adjust the detection window period in life cycle according to the degree of reliability of fastener simultaneously, reduce the loss condition of fastener internal components and parts, promote the timeliness of routine maintenance work, guarantee the reliability of whole nuclear power station circuit protection system, maintain the security of whole nuclear power station electric wire netting system and the stability of electrical equipment operation.

In one embodiment, it is assumed that n (n is a natural number greater than 1) parameters need to be tested on the card, and response signals corresponding to m output pins need to be collected, and meanwhile, it is assumed that the current detection window period is the m-th (m is a natural number greater than 1) detection window period of the card in its full life cycle. Moreover, after the card is tested within the current detection window period of the full life cycle of the card, the test results are shown in table 1.

TABLE 1

Moreover, for each detected deviation corresponding to each output pin, the deviation can be calculated by the following method: and subtracting the corresponding standard signal value from the response signal value of the output pin during the detection, and dividing the subtraction result by the standard signal value corresponding to the output pin. For example, for the first output pin, the first detection (the first detection window period) corresponds to a deviation of (V) ₁₁ -V ₁₀ )/V ₁₀ The deviation corresponding to the second detection (second detection window period) is: (V ₁₂ -V ₁₀ )/V ₁₀ The deviation corresponding to the third detection (third detection window period) is (V) ₁₃ -V ₁₀ )/V ₁₀ The deviation corresponding to the m-th detection (m-th detection window period) is (V) _1m -V ₁₀ )/V ₁₀ . … … is added. For the nth output pin, the deviation corresponding to the mth detection (mth detection window period) is (V) _nm -V _n0 )/V _n0 。

The average deviation corresponding to each output pin in multiple detections can be calculated by the following method: and calculating the average value of the deviations respectively corresponding to the output pins during multiple detections. For example, for the first output pin, the average deviation after three detections is

The overall average deviation of the clamping piece can be calculated by the following method: and calculating the average value of the average deviation corresponding to the output pins respectively. For example, the overall average deviation of the card is:

further, in an optional embodiment, the determining the auxiliary strategy of the card member according to the overall average deviation in step S40 includes:

determining a deviation range corresponding to the integral average deviation according to a preset corresponding relation between a plurality of groups of deviation ranges and corresponding auxiliary strategies, and searching the corresponding auxiliary strategies according to the determined deviation ranges, wherein the auxiliary strategies comprise: normal use; maintaining; and (4) replacing.

In one embodiment, five sets of deviation ranges and the auxiliary strategies corresponding to each set of deviation ranges may be preset, as shown in table 2,

deviation range (V0 standard value)	Description and assistance strategy
		(1-20％)V 0 ≤δ≤(1+20％)V 0	Normal range, normal use
(1-50％)V 0 ≤δ≤(1-20％)V 0	When a fault occurs, the maintenance is required in time
		(1+20％)V 0 ＜δ≤(1+50％)	When a fault occurs, the maintenance is required in time
δ＞(1+50％)	Serious failure, replacement
		δ＜(1-50％)	Serious failure, replacement

TABLE 2

Taking an output pin with a standard (voltage) signal value of 12V as an example, if the overall average deviation of the card is 9.6V-14.4V, the card can still be normally used; if the integral average deviation of the clamping piece is between 6 and 9.6V or between 14.4 and 18V, the clamping piece is indicated to have a fault and needs to be maintained, and the parameter change needs to be observed regularly after the maintenance is finished; if the integral average deviation of the card is less than 6V or more than 18V, the card is seriously failed and needs to be replaced, and the detection period is properly shortened in the following detection, namely, the next detection window period is advanced, or a detection window period is added.

Further, in an optional embodiment, batch detection can be performed on cards of the same type, and the method for managing the full life cycle of the cards of the electrical equipment of the present invention further includes: and estimating the service life of the clamping piece according to the integral average deviation of the clamping piece and the clamping pieces of the same type. For example, if a certain type of cartridge fails substantially ten years, the life of that type of cartridge can be estimated to be ten years.

Further, in an optional embodiment, the method for managing the full life cycle of the cartridge of the electrical device of the present invention further comprises: the method comprises the steps of obtaining operation information of the electrical equipment under an operation condition, stopping the operation of the electrical equipment if the electrical equipment is judged to be abnormal according to the operation information, and temporarily increasing a detection window period of the clamping piece in the whole life cycle of the clamping piece. In the embodiment, the time of the next detection window period can be dynamically adjusted according to the detection result in the previous detection window period, and the time of the next detection window period can be dynamically determined according to the operation information of the card under the operation condition, namely, if the card fails under the operation condition, even if the time of the next detection window period does not reach, the next detection window period can be temporarily increased to immediately detect, so that the reliability of the card is timely evaluated and a proper auxiliary strategy is determined.

The invention also constitutes a computer product comprising a processor implementing the steps of the method for full-life cycle management of a cartridge of an electrical apparatus as described in any one of the preceding when executing a computer program.

The present invention also constructs a storage medium storing a computer program which, when executed by a processor, implements the above-described method of managing a full life cycle of a card of an electrical apparatus.

Fig. 2 is a logic structure diagram of a first embodiment of a life cycle management system of a card of an electrical device according to the present invention, the life cycle management system of the embodiment includes a background host 107, a cabinet 101, a front-end processor 102, a test signal source 103, and an acquisition control device 104, which are disposed in the cabinet 101, and the test signal source 103 and the acquisition control device 104 are respectively connected to the background host 107 through the front-end processor 102. The background host 107 comprises a processor which, when executing a computer program, implements the steps of the above-described method of full life cycle management of a cartridge of an electrical device.

In a specific embodiment, the background host 107 is further configured to generate a test case of the card 106, and issue the test case to the front-end processor 102; the front-end processor 102 is configured to analyze the received test case into a plurality of control commands (including an ac signal control command, a dc signal control command, and a test control command), and issue the control commands to the test signal source 103 and the acquisition control device 104; the test signal source 103 is configured to configure the output voltage according to the received corresponding control command, so as to provide an excitation signal for the card 106; the acquisition control device 104 is used for acquiring a response signal from the card 106 according to the received corresponding control command, and sending the response signal to the background host 107 through the front-end processor 102.

Further, the system for analyzing the aging state of the card media of this embodiment further includes an infrared thermal imaging device 108, an environmental sensor 110, a switching power supply 109 and an adapting device 105 which are arranged in the cabinet 102, wherein the infrared thermal imaging device 108 is configured to acquire an infrared image of the card media 106 during operation and transmit the infrared image to the background host 107 through the front-end processor 102, so that the background host 107 determines an infrared detection result of the card media 106 according to the infrared image; the environment sensor 110 is configured to acquire environment information (e.g., temperature and humidity information) of the cabinet 101, and determine an environment detection result of the card 106 according to the environment information; the switching power supply 109 is used for providing a power supply signal for the card member 106; in adapter 105 was fixed in the draw-in groove of rack 101, for example, can be equipped with 6 adapters in a rack, the outer high 18cm of rack, outer wide 48cm, the draw-in groove is installed in rack 101, and draw-in groove width 6cm, high 12cm to realize a plurality of fasteners and test simultaneously, and put preset distance between draw-in groove and draw-in groove, ensure not influencing each other between the fastener. The adapting means 105 is adapted to condition the excitation signal input to the escapement 106 and/or the response signal output by the escapement 106. The circuit board of the adapter 105 includes a signal input terminal row, a signal output terminal row and an intermediate circuit, wherein the signal input terminal row is connected with the signal input pins of the acquisition control device 104 and the card 106, and the signal output terminal row is connected with the response input pins of the card 106.

Further, the test signal source 103 includes a relay protection tester 1031 and a dc adjustable power supply 1032, where the relay protection tester 1031 is configured to configure corresponding ac voltages or currents according to the received corresponding control commands, for example, to provide ac and dc voltages or currents that vary according to set steps; the dc adjustable power supply 1032 is operable to configure a corresponding dc voltage or current to provide a varying dc voltage or current in accordance with the received corresponding control command.

Further, the acquisition control device 104 includes a main control board 1041, and a switching value output board 1042, a switching value input board 1044, and an analog input board 1043 respectively connected to the main control board 1041, and the switching value output board 1042, the switching value input board 1044, and the analog input board 1043 are further connected to corresponding pins of the to-be-tested card through corresponding ports, respectively, where the main control board 1041 is configured to receive a corresponding control command from the front-end processor 102, and configure on/off of corresponding channels in the switching value output board 1042 and the switching value input board 1044 according to the corresponding control command; and is also used to collect the switching value response signal from switching value input board 1044 and the analog quantity response signal from analog quantity input board 1043, and process the switching value response signal and the analog quantity response signal. In addition, the main control board 1041 can also realize functions of data acquisition control, calculation processing, communication, recording, and the like. The switching value output board 1042 is connected with the test signal source 103 and is used for controlling an excitation signal (test signal) input into the card to be tested; the switching value input board 1044 and the analog value input board 1043 are connected with the card 106 to be tested through the adapter 105, and are used for acquiring the switching value and the analog value of the output pin of the card to be tested. Additionally, the model of each plate includes, but is not limited to, the following: the model of the main control board is RP7001, the model of the switching value input board is RP7301, the model of the switching value output board is RP7321 and the model of the analog value input board is RP 7105.

In a specific embodiment, the background host 107 is configured to perform test setup, test case configuration, test process monitoring, test result display, and history query, and specifically, may provide functions such as modification of the test configuration and the test case (the test case is a structured test process document used for defining information such as types, sizes, timing sequences, durations, and collected objects of various test signals in a test), real-time monitoring of the test process, and real-time waveform display of voltage signals of sensitive devices through a human-computer interface, and may further complete functions such as storage of the test case and test data, test result analysis, and test report generation, and therefore, the background host 107 has high-level functions such as test process backtracking, report generation, and history record query, and thus provides a reliable and comprehensive basis for protection control tests. The background host 107 is connected with the front-end processor 102 through the ethernet, so as to implement functions of issuing test cases and uploading test data. The front-end processor 102 communicates with the acquisition control device 104 and the test signal source 103 to perform analysis and issuing of test commands and transmission of real-time test data. The acquisition control device 104 is connected with the test signal source 103, the switching power supply 109 and the adapter device 105 in a hard wiring mode, and controls the access sequence of the test power supply or the excitation signal and the acquisition and uploading of the response signals of the card component. The relay protection tester 1031 and the dc adjustable power supply 1032 have communication modules, communicate with the front-end processor 102 via the ethernet protocol, and issue commands in an agreed message format.

Further, in the cabinet 101, from top to bottom: a switching power supply 109 (such as a 24V switching power supply), a dc adjustable power supply 1032, an acquisition control device 104, an environmental sensor 110, an infrared thermal imaging device 108, and a front-end processor 102, and a plurality of power switches are installed on the cabinet 101. The working power supplies of the cabinet 101, the front-end processor 102, the test signal source 103, the acquisition control device 104 and the switching power supply 109 are all alternating current 220V, and 220V commercial power is uniformly adopted in the system. The adapting device 105 of the clamping piece 106 is fixed in the clamping groove, and a preset distance is arranged between adjacent interlayers in the cabinet 101, so that the clamping pieces are prevented from being influenced mutually and can be cooled normally.

The following describes the testing process of the card 106 with reference to fig. 2: firstly, a tester configures a test case through a human-computer interaction interface of the background host 107, including: configuring parameters such as A-phase, B-phase and C-phase output signal types, starting time, stopping time and the like of the relay protection tester 1031; configuring parameters such as the output voltage of the direct current adjustable power supply 1032, the starting time, the stopping time and the like; the configuration of parameters such as the start time and stop time of the switching power supply 109, and the configuration of parameters such as the input and output of the card 106, the pin signal type of the component, and the input and output channels. Then, the user is reminded to insert the card 106 into the corresponding card slot according to the test setting of the user and the selected use case, and a corresponding power switch on the cabinet 101 is turned on and the inspection work before the test is done. After the preparation before the test is completed, the tester clicks a case configuration button on the human-computer interaction interface, and the background host 107 issues the test case to the front-end processor 102. The front-end processor 102 analyzes the test case into a plurality of control commands, and correspondingly issues the control commands to the main control board 1041 of the test signal source 103 and the acquisition control device 104, wherein the configuration information of the power excitation signal is sent to the relay protection tester 1031 and the dc adjustable power source 1032, the power excitation signal is input to the switching value output board 1042 and the card pins, and the components respond to the configuration of the acquisition channel and send to the analog input board 1043 and the switching value input board 1044 of the acquisition control device 104. The dc adjustable power source 1032 outputs a dc voltage according to the power setting command, and the switching value input board 1044 of the acquisition control device 104 controls the dc voltage to be output to the corresponding input terminal row of the adapter device 105. The user sets the overload time setting value of the card to be 0 according to the system prompt, the relay protection tester 1031 outputs A, B, C three-phase alternating current with the amplitude value of 1A according to the power supply setting command, and the switching value input board 1044 of the acquisition control device 104 controls the three-phase current to be output to the corresponding input terminal row on the adapter device 105. The intermediate circuit on the adapter 105 conditions the input power signal and transmits it to the card 106 via the output terminal array. The switching value response signal and the analog value response signal of the card are sent to the switching value input board 1044 and the analog value input board 1043 of the acquisition control device 104 through corresponding terminals on the adapter device 105. The switching value input board 1044 and the analog value input board 1043 of the acquisition control device 104 send the acquired response signals to the main control board 1041 for processing, the main control board 1041 sends the processed response data to the front-end processor 102, and the front-end processor 102 stores the data. The background host 107 can further process the response data, read the response data into a waveform file, call the standard waveform obtained under the standard working condition of each pin and component stored in the case library, compare and analyze the standard waveform with the waveform obtained by testing, judge the functions of the clamping piece and the aging state of the component, and display the function on a human-computer interaction interface.

Fig. 3 is a partial logic structure diagram of a second embodiment of the life cycle management system of the card of the electrical equipment according to the present invention, in which the specific components (sensitive components) of the card 106 include a relay, an electrolytic capacitor, and the like. The switching power supply 109 is a 24V switching power supply, the dc adjustable power supply 1032 is a 125V dc power supply, and the acquisition control device 104 includes a main control board, a switching value output board 1042, a switching value input board 1044, and an analog input board 1043. Furthermore, the switching value input board 1044 includes an optical coupler array including a plurality of optical couplers, and a positive input terminal of each optical coupler is connected to a first terminal of a corresponding relay switch, a second terminal of the corresponding relay switch is connected to a positive terminal of the switching power supply 109, a negative input terminal and a negative output terminal of each optical coupler and a negative terminal of the switching power supply 109 are grounded together, and a positive output terminal of each optical coupler is connected to a corresponding input terminal of the main control board.

Specifically, the relay protection tester 1031 outputs a three-phase alternating current with an amplitude of 1A, and the dc adjustable power supply 1032 outputs a dc voltage with an amplitude of 125V. The switching value output board 1042 of the acquisition control device 104 connects 125V dc voltage to pins 13 and 14 of the card 106 through channel switches CJ22 and CJ25, respectively, and the ac current output by the relay protection tester 1031 is connected to pins 2, 3 and 8 of the card 106, respectively. The positive pole of the switching power supply 109 is connected to pins 26, 32, 35, 38, 81 and 49 of the card 106, and pins 25, 31, 34, 37, 41 and 48 of the card 106 are connected to the positive input ends of the optical couplers KI36, KI37, KI38, KI39, KI40 and KI41 of the switching value input board 1044. The optocouplers KI36, KI37, KI38, KI39, KI40 and KI41 are connected in a common cathode mode, once a relay switch on the clamping piece 106 acts, the optocouplers connected with the clamping piece can generate output signals, and then corresponding response signals can be collected. The relay coil K1, the electrolytic capacitor C5, the electrolytic capacitor C6 and the electrolytic capacitor C7 are respectively connected to channels AD11, AD9, AD10 and AD12 of an analog quantity acquisition board 1043 of the acquisition control device 104 through corresponding probes.

After a test experiment begins, a tester can configure a test process executed in sequence on a background host, test data in the test process is displayed in a human-computer interaction interface in real time, specifically, switching value signals are displayed through signal lamps of different colors, for example, green represents closed, and red represents open; and the analog quantity signal is displayed through real-time waveform after waveform processing. In addition, the human-computer interaction interface can also display various prompt messages of the card testing process, such as the use condition of the cabinet, the testing process information, the testing state of the card, the fault alarm message of the card to be tested and the like, wherein the testing state of the card is distinguished by signal lamps with different colors, for example, green indicates that the test is free of abnormal conditions, red indicates that the test result is abnormal, and the prompt is carried out through the literal fault alarm message. When the alarm is given in the test process, the tester can remotely terminate the test, so that the safety of the whole system is ensured. Therefore, the automatic test of the whole unattended process is realized, the humanized display and reminding are carried out on the test result, and the aging analysis of the card is realized.

In conclusion, the whole process of the reliability test of the whole service life cycle of the electrical equipment clamping piece does not need to be attended by personnel, long-term online monitoring can be realized, the test result can be displayed and reminded in a humanized manner, and the automatic and batch test and analysis of the overcurrent protection fixed value action function and the element performance of the clamping piece are realized.

The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the scope of the claims of the present invention.

Claims (12)

1. A method for managing the whole life cycle of a card of electrical equipment is characterized in that the following steps are carried out in the current detection window period of the whole life cycle of the card:

inputting excitation signals to a plurality of input pins of the card through a test signal source, acquiring response signals from a plurality of output pins of the card through an acquisition control device, and respectively calculating the deviation of the response signals of the output pins and corresponding standard signals;

respectively calculating the average deviation corresponding to each output pin according to the deviation corresponding to each output pin in the current detection window period and the deviation corresponding to each detection window period before the current detection window period;

calculating the integral average deviation of the clamping piece according to the average deviation corresponding to each output pin;

and determining an auxiliary strategy of the card and the next detection window period according to the overall average deviation.

2. The method for managing a life cycle of a card of an electric device according to claim 1, further comprising:

and estimating the service life of the clamping piece according to the integral average deviation of the clamping piece and the clamping pieces of the same type.

3. The method for managing a life cycle of a card of an electric device according to claim 1, further comprising:

the method comprises the steps of obtaining operation information of the electrical equipment under an operation condition, stopping the operation of the electrical equipment if the electrical equipment is judged to be abnormal according to the operation information, and temporarily increasing a detection window period of the clamping piece in the whole life cycle of the clamping piece.

4. The method for managing the life cycle of a card of an electrical device according to claim 1, wherein determining an auxiliary strategy of the card according to the ensemble average deviation comprises:

determining a deviation range corresponding to the integral average deviation according to a preset corresponding relation between a plurality of groups of deviation ranges and corresponding auxiliary strategies, and searching the corresponding auxiliary strategies according to the determined deviation ranges, wherein the auxiliary strategies comprise: normal use; maintenance; and (4) replacing.

5. A computer product comprising a processor, characterized in that said processor, when executing a computer program, implements the steps of a method for the full-life cycle management of a cartridge of an electrical apparatus according to any one of claims 1 to 4.

6. A storage medium storing a computer program characterized in that it implements, when executed by a processor, the steps of the method for managing the full life cycle of a cartridge of an electrical apparatus according to any one of claims 1 to 4.

7. A life cycle management system of a card of electrical equipment is characterized by comprising a background host, a front-end processor, a test signal source and an acquisition control device which are arranged in a cabinet, wherein the test signal source and the acquisition control device are respectively connected with the background host through the front-end processor, the background host comprises a processor, and the processor realizes the steps of the life cycle management method of the card of the electrical equipment according to any one of claims 1 to 4 when executing a computer program.

8. The system for managing the life cycle of a card of an electric device according to claim 7,

the background host is also used for generating a test case of the card and sending the test case to the front-end processor;

the front-end processor is used for analyzing the received test case into a plurality of control commands and sending the control commands to the test signal source and the acquisition control device;

the test signal source is used for configuring the output voltage according to the received corresponding control command so as to provide an excitation signal for the card member;

and the acquisition control device is used for acquiring a response signal from the card according to the received corresponding control command and sending the response signal to the background host through the front-end processor.

9. The system for full-life cycle management of a cartridge of an electrical device of claim 8, further comprising an adapter device disposed within the cabinet and,

the adapting device is used for conditioning an excitation signal input to the card and/or a response signal output by the card.

10. The life cycle management system of a card of an electric device according to claim 8, wherein said collection control means comprises a main control board, and a switching quantity output board, a switching quantity input board, and an analog quantity input board connected to said main control board, respectively, and said switching quantity output board, said switching quantity input board, and said analog quantity input board are further connected to corresponding pins of said card through corresponding ports, respectively, wherein,

the main control board is used for receiving a corresponding control command from the front-end processor and configuring the on-off of corresponding channels in the switching value output board and the switching value input board according to the corresponding control command; and the analog quantity input board is used for acquiring switching quantity response signals from the switching quantity input board, acquiring analog quantity response signals from the analog quantity input board and processing the switching quantity response signals and the analog quantity response signals.

11. The system of claim 10, wherein the switching value input board comprises an array of optocouplers, and wherein a positive input of each optocoupler is connected to an input of a corresponding relay switch, an output of the corresponding relay switch is connected to a power supply, a negative input and a negative output of each optocoupler are connected to ground, and a positive output of each optocoupler is connected to a corresponding input of the main control board.

12. The system of claim 8, wherein the test signal source comprises:

the relay protection tester is used for configuring corresponding alternating current voltage or current according to the received corresponding control command;

and the direct current adjustable power supply is used for configuring corresponding direct current voltage or current according to the received corresponding control command.

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