CN115047012A - Glass defect detection system and method - Google Patents

Glass defect detection system and method Download PDF

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Publication number
CN115047012A
CN115047012A CN202210798828.0A CN202210798828A CN115047012A CN 115047012 A CN115047012 A CN 115047012A CN 202210798828 A CN202210798828 A CN 202210798828A CN 115047012 A CN115047012 A CN 115047012A
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CN
China
Prior art keywords
light intensity
detected
light source
glass
defect detection
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CN202210798828.0A
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Chinese (zh)
Inventor
刘忠
朱培源
侯康
刘刚华
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Shenzhen Han Industrial Technologies Co ltd
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Shenzhen Han Industrial Technologies Co ltd
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Priority to CN202210798828.0A priority Critical patent/CN115047012A/en
Publication of CN115047012A publication Critical patent/CN115047012A/en
Pending legal-status Critical Current

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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
    • G01N21/958—Inspecting transparent materials or objects, e.g. windscreens
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques

Abstract

The invention discloses a glass defect detection system and method, and relates to the technical field of defect detection. The glass defect detection system specifically comprises: the first developing assembly is used for displaying surface defects and foreign matters of the material to be detected; the second developing assembly is used for displaying foreign matters on the surface of the material to be detected; the image acquisition part is used for acquiring a first light intensity image of the surface of the material to be detected when the first developing assembly works and acquiring a second light intensity image of the surface of the material to be detected when the second developing assembly works; and the processing unit is used for carrying out difference comparison on the first light intensity diagram and the second light intensity diagram and judging whether the surface of the material to be detected has defects or not. The method aims to accurately distinguish foreign matters and actual defects on the glass surface and avoid misjudgment on the glass.

Description

Glass defect detection system and method
Technical Field
The invention relates to the technical field of defect detection, in particular to a glass defect detection system and a glass defect detection method.
Background
With the rapid increase of the demand of the international and domestic markets on glass products, the quality, the variety and the production process of the glass products are qualitatively changed. Particularly, the continuous development of the existing production technology leads high-end products to have higher and higher requirements on the quality of the glass raw plate, so that the glass quality is comprehensively ensured, and the improvement of the grade is particularly important. The appearance defects of the glass are classified into scratch, edge breakage, crack, foreign matter, concave-convex point, puncture, poor light shadow and the like.
The traditional online detection of the glass quality mainly adopts a manual detection method. The manual detection is large in workload, is easily influenced by subjective factors of detection personnel, easily causes omission detection on glass defects, particularly mix-up defects with small deformation and small distortion, greatly reduces the quality of glass, and cannot ensure the detection efficiency and precision. Therefore, the detection method for manually detecting the glass quality on line cannot meet the requirements of the current glass production. However, in the optical imaging, there is no method for distinguishing the foreign matter from the actual defect of the glass, and a large amount of misjudgment is easily caused in the detection process.
Therefore, how to accurately distinguish the foreign matters and the actual defects on the glass surface and avoid the misjudgment of the glass becomes a technical problem to be solved urgently.
Disclosure of Invention
The invention mainly aims to provide a glass defect detection system and method, aiming at accurately distinguishing foreign matters and actual defects on a glass surface and avoiding misjudgment of glass.
In order to achieve the above object, the present invention provides a glass defect detecting system comprising:
the first developing assembly is used for displaying surface defects and foreign matters of the material to be detected;
the second developing assembly is used for displaying foreign matters on the surface of the material to be detected;
the image acquisition part is used for acquiring a first light intensity image of the surface of the material to be detected when the first developing assembly works and acquiring a second light intensity image of the surface of the material to be detected when the second developing assembly works; and
and the processing unit is used for carrying out difference comparison on the first light intensity diagram and the second light intensity diagram and judging whether the surface of the material to be detected has defects or not.
In an embodiment of the present application, a dark field angle is formed between the first developing device, the second developing device, and the image capturing unit.
In an embodiment of the present application, the first developing assembly includes:
the cross line that can shine and be used for showing on waiting to examine material surface defect and foreign matter sweeps the light source, cross line sweep the light source with the cross line that waits to examine material surface is located image acquisition spare's field of vision center department.
In an embodiment of the present application, the first developing assembly further includes:
can shine in wait to examine the parallel lines that material surface is used for showing and waits to examine material surface defect and foreign matter and sweep the light source, the intersection line of parallel lines sweep the light source and wait to examine material surface with the intersection line that light source and wait to examine material surface is located same straight line and is located the vision center department of image acquisition spare.
In an embodiment of the application, the vertical distance between the image acquisition part and the surface of the material to be detected is alpha, and alpha is more than or equal to 170mm and less than or equal to 190 mm.
In an embodiment of this application, use the centre of field of vision of image acquisition spare and wait to examine the nodical conduct perpendicular to of material upper surface for the summit the ray of examining the perpendicular to of material upper surface, the camera lens daylighting direction of image acquisition spare with the contained angle between the extending direction of ray is 15.
In an embodiment of this application, use the vision center of image acquisition spare and wait to examine and to do the perpendicular to for the summit between the material intersect the ray of examining the material upper surface, the line of crossing sweep light source's contrary light-emitting direction with the contained angle is 45 between the extending direction of ray.
In an embodiment of this application, use the vision center of image acquisition spare and wait to examine and to do the perpendicular to for the summit between the material intersect the ray of examining the material upper surface, parallel lines sweep light source's contrary light-emitting direction with contained angle between the extending direction of ray is 25.
In an embodiment of the present application, the second developing assembly includes:
can shine in waiting to examine the monochromatic three-dimensional line of material surface and sweep the light source to the crossing point between the vision center of image acquisition spare and the waiting to examine the material is the summit and is done the perpendicular to wait the ray of examining the material upper surface, three-dimensional line sweep the light source the contrary light-emitting direction with the angle between the extending direction of ray is 80.
The invention also discloses a glass defect detection method, which comprises the steps of constructing an identification model according to a deep learning algorithm, and obtaining a first light intensity map and a second light intensity map of a material to be detected;
recognizing defects and foreign matters on the first light intensity graph through the recognition model, recording the defects and the foreign matters as first recognition points, and training the recognition model; recognizing the foreign matters on the second light intensity graph through the recognition model, recording the foreign matters as second recognition points and training the recognition model; and eliminating first identification points corresponding to the second identification points on the first light intensity graph, judging whether the first identification points remain on the first light intensity graph, and judging that the material to be detected has defects if the first identification points remain on the first light intensity graph.
By adopting the technical scheme, the surface defects and foreign matters of the material to be detected are displayed through the first developing assembly; and displaying the foreign matters on the surface of the material to be detected through the second developing assembly. Then, a first light intensity diagram of the material to be detected when the first developing assembly works and a second light intensity diagram of the material to be detected when the second developing assembly works are obtained through the image obtaining part, after the first light intensity diagram and the second light intensity diagram are obtained through the processing unit, difference comparison is carried out, and after the position of the foreign matter on the second light intensity diagram is removed from the first light intensity diagram, if the first light intensity diagram still has defect position information, the defect of the glass is represented; if there is no defect location information remaining on the first intensity map, it indicates that the glass is defect-free. Simple structure, the implementation of being convenient for realizes simultaneously accurate foreign matter and the reagent defect on the differentiation glass face, very big reduction the possibility of judging to glass mistake.
Drawings
The invention is described in detail below with reference to specific embodiments and the attached drawing figures, wherein:
fig. 1 is a schematic view of an installation structure of a first embodiment of the present invention.
Fig. 2 is a schematic view of the installation angles of the cross-line scanning light source and the parallel-line scanning light source according to the present invention.
FIG. 3 is a schematic view of the installation angle of the monochromatic stereo line scanning light source according to the present invention.
Detailed Description
In order to make the objects, technical solutions and advantages of the present invention more apparent, the present invention will be described in detail with reference to the accompanying drawings and examples. It should be understood that the following specific examples are only for illustrating the present invention and are not to be construed as limiting the present invention.
As shown in fig. 1 to 3, in order to achieve the above object, the present invention provides a glass defect detecting system, including:
the first developing assembly is used for displaying surface defects and foreign matters of the material 10 to be detected;
the second developing assembly is used for displaying foreign matters on the surface of the material to be detected 10;
the image acquisition part 20 is used for acquiring a first light intensity image of the surface of the material to be detected 10 when the first developing assembly works and acquiring a second light intensity image of the surface of the material to be detected 10 when the second developing assembly works; and
and the processing unit is used for carrying out difference comparison on the first light intensity diagram and the second light intensity diagram and judging whether the surface of the material 10 to be detected has defects or not.
Specifically, the glass defect detection system comprises a first developing assembly, a second developing assembly, an image acquisition part 20 and a processing unit.
Wherein, the first development subassembly can produce visible light, and the visible light that the first development subassembly produced shines on the surface of examining material 10 for show the defect and the foreign matter of examining material 10 surface, and the defect includes crackle, mar etc. and the foreign matter includes dust particle etc..
The second develops the subassembly and can produces visible light, and the visible light that the second developed the subassembly and produced shines on examining the surface of examining material 10 for the foreign matter on the material 10 surface is examined in the demonstration, and the foreign matter is the dust particle on examining material 10 and so on. The second developing assembly and the first developing assembly are different in irradiation angle.
The image acquisition part 20 is used for acquiring a first light intensity graph of the surface of the material 10 to be detected when the first developing component works, and the first light intensity graph can display defects and foreign matters of the material 10 to be detected. For ease of understanding, the material to be inspected 10 in the present application is illustrated by taking glass as an example.
When the visible light generated by the first developing assembly is irradiated on the surface of the glass, scratches, cracks, foreign matters and the like on the glass are shown, and the image obtaining member 20 obtains a first light intensity map of the glass. The first light intensity map is picture information including traces of defects such as scratches and cracks on the glass and traces of foreign substances.
When the visible light generated by the second developing assembly is irradiated on the surface of the glass through different angles, the foreign matter on the glass is displayed, and at this time, the image obtaining member 20 obtains a second light intensity diagram of the glass. The second light intensity map is picture information containing foreign matter traces.
The image acquisition part 20 adopts a time-sharing line camera commonly used in the prior art, and a line lens is installed on the time-sharing line camera, so that the image acquisition part 20 can conveniently acquire the first light intensity image and the second light intensity image. Because the image acquisition part 20 acquires the first light intensity diagram and the second light intensity diagram in the movement process of the material 10 to be detected, the image acquisition part 20 adopts a scanning mode to perform, and in order to ensure that the positions of the material 10 to be detected on the first light intensity diagram and the second light intensity diagram are consistent, the first light intensity diagram and the second light intensity diagram are obtained by synchronously scanning the image acquisition part 20, and at the moment, in order to achieve the purpose, the first developing component and the second developing component need high-frequency alternating stroboflash.
After the first light intensity graph and the second light intensity graph are obtained, the processing unit obtains the first light intensity graph and the second light intensity graph, and the first light intensity graph and the second light intensity graph are subjected to difference comparison to judge whether the glass surface has defects or not.
The working principle is as follows:
the processing unit identifies defects and foreign objects of the glass on the first light intensity map and records corresponding position information.
The processing unit identifies the foreign matter on the glass on the second light intensity diagram and records the corresponding position information.
And the processing unit finds out the foreign matters at the corresponding positions on the first light intensity diagram according to the position information of the foreign matters on the second light intensity diagram, eliminates the point information, judges whether the first light intensity diagram further has defect position information, and indicates that the glass has defects if the first light intensity diagram further has the defect position information. If no other defect position information exists on the first light intensity map, the glass is indicated to be free of defects.
By adopting the technical scheme, the surface defects and foreign matters of the material to be detected 10 are displayed through the first developing assembly; and displaying the foreign matters on the surface of the material to be detected 10 by the second developing component. Then, a first light intensity diagram of the material to be detected 10 when the first developing assembly works and a second light intensity diagram of the material to be detected 10 when the second developing assembly works are obtained through the image obtaining part 20, after the first light intensity diagram and the second light intensity diagram are obtained by the processing unit, difference comparison is carried out, and after the position of the foreign matter on the second light intensity diagram is removed from the first light intensity diagram, if the position information of the defect remains on the first light intensity diagram, the defect exists in the glass; if there is no defect location information remaining on the first intensity map, it indicates that the glass is defect-free. Simple structure, the implementation of being convenient for realizes simultaneously accurate foreign matter and the reagent defect on the differentiation glass face, very big reduction the possibility of judging to glass mistake.
In an embodiment of the present application, a dark field angle is formed between the first developing device, the second developing device, and the image capturing unit.
Specifically, a dark field angle is formed among the first developing assembly, the second developing assembly and the image capturing element 20, and the dark field angle in this application is: the field area in the center of the field of view of the image capturing unit presents a dark background, the light in the dark field is irradiated by the oblique light source to irradiate the material to be detected 10, the scratch part on the material to be detected 10 can scatter or reflect the irradiated light, and the light scattered or reflected by the scratch part enters the image capturing element 20 for imaging.
By adopting the technical scheme, a dark field angle is formed among the first developing assembly, the second developing assembly and the image acquisition unit, so that the scratch on the surface of the glass can be conveniently observed.
In an embodiment of the present application, the first developing assembly includes:
the cross line scanning light source 40 can be irradiated on the surface of the material 10 to be detected and is used for displaying the surface defects and foreign matters of the material 10 to be detected, and the cross line of the cross line scanning light source 40 and the surface of the material 10 to be detected is positioned at the center of the visual field of the image acquisition part 20.
Specifically, the first developing assembly comprises a cross line scanning light source 40, and the cross line scanning light source 40 realizes cross illumination on two sides of a light path of a light outlet of the light source and can highlight defect traces parallel to the moving direction of the material 10 to be detected. The position of the intersection line of the crossline scanning light source 40 and the surface of the material to be inspected 10 is located at the center of the visual field of the image obtaining member 20, so that the image obtaining member 20 can obtain a first light intensity map of the material to be inspected 10.
By adopting the technical scheme, the defect trace parallel to the movement direction of the material to be detected 10 can be conveniently obtained by scanning the light source 40 through the crossed line, the structure is simple, and the implementation is convenient.
In an embodiment of the present application, the first developing assembly further includes:
the parallel line scanning light source 30 can be irradiated on the surface of the material 10 to be detected and is used for displaying the surface defects and foreign matters of the material 10 to be detected, and the intersection line of the parallel line scanning light source 30 and the surface of the material 10 to be detected and the intersection line of the crossed line scanning light source 40 and the surface of the material 10 to be detected are positioned on the same straight line and positioned at the center of the visual field of the image acquisition part 20.
Specifically, the first developing assembly further comprises a parallel line scanning light source 30, the parallel line scanning light source 30 is used for displaying surface defects and foreign matters of the material 10 to be detected, and the intersection line of the parallel line scanning light source 30 and the material 10 to be detected and the intersection line of the cross line scanning light source 40 and the material 10 to be detected are located on the same straight line, so that the scanning area of the material 10 to be detected is widened. The position of the intersection line of the parallel line scanning light source 30 and the material to be inspected 10 is also located at the center of the visual field of the image acquisition part 20, so that the image acquisition part 20 can acquire a complete first light intensity image of the material to be inspected 10.
In an embodiment of the present application, the vertical distance between the image capturing element 20 and the surface of the material to be inspected 10 is α, and α is greater than or equal to 170mm and less than or equal to 190 mm.
Specifically, the vertical distance between the image acquisition part 20 and the upper surface of the material to be detected 10 is 170mm to 190mm, so that the image acquired by the image acquisition part 20 is clearer, the structure is simple, and the implementation is convenient.
In an embodiment of the present application, a ray 60 perpendicular to the upper surface of the material 10 to be inspected is made with an intersection point between the center of the field of view of the image capturing element 20 and the material 10 to be inspected as a vertex, and an included angle between a lighting direction of a lens of the image capturing element 20 and an extending direction of the ray 60 is 15 °.
Specifically, the intersection point between the center of the field of view of the image capturing member 20 and the material to be inspected 10 is used as a vertex, and the ray 60 perpendicular to the upper surface of the material to be inspected 10 is made, and the extending direction of the ray 60 does not pass through the material to be inspected 10. The light collection direction of the lens of the image capturing element 20 is at an angle of 15 degrees to the direction of extension of the rays 60. The lens of the image acquisition part 20 is set to be 15 degrees, so that the layout of a dark field is facilitated, the structure is simple, and the implementation is convenient.
In an embodiment of the present application, the ray 60 perpendicular to the upper surface of the material 10 to be inspected is made by taking the intersection point between the center of the field of view of the image acquisition part 20 and the material 10 to be inspected as a vertex, and the included angle between the reverse light direction of the crossed line scanning light source 40 and the extending direction of the ray 60 is 45 °.
Specifically, the intersection point between the center of the field of view of the image capturing member 20 and the material to be inspected 10 is used as a vertex, and the ray 60 perpendicular to the upper surface of the material to be inspected 10 is made, and the extending direction of the ray 60 does not pass through the material to be inspected 10. The angle between the direction of the light emitted from the cross-line scanning light source 40 and the direction of the ray 60 is 45 degrees. The crossline scanning light source 40 is arranged in the mode to facilitate the layout of the dark field, and the structure is simple and convenient to implement.
In an embodiment of the present application, the intersection point between the center of the field of view of the image capturing element 20 and the material 10 to be inspected is used as a vertex to make the ray 60 perpendicular to the upper surface of the material 10 to be inspected, and the included angle between the reverse light direction of the parallel line scanning light source 30 and the extending direction of the ray 60 is 25 °.
Specifically, the intersection point between the center of the field of view of the image obtaining member 20 and the material to be inspected 10 is taken as a vertex, and the ray 60 perpendicular to the upper surface of the material to be inspected 10 is made, and the extending direction of the ray 60 does not pass through the material to be inspected 10. The angle between the direction of the light emitted from the parallel line-scan light source 30 and the direction in which the rays 60 extend is 25 degrees, and the parallel line-scan light source 30 and the cross line-scan light source 40 are located on the same side. By adopting the technical scheme, the arrangement of a dark market is convenient, the structure is simple, and the implementation is convenient.
In an embodiment of the present application, the second developing assembly includes:
the monochromatic three-dimensional line scanning light source 50 capable of irradiating the surface of the material to be detected 10 is used for making rays 60 perpendicular to the upper surface of the material to be detected 10 by taking an intersection point between the center of the visual field of the image acquisition part 20 and the material to be detected 10 as a vertex, and the angle between the reverse light direction of the three-dimensional line scanning light source and the extending direction of the rays 60 is 80 degrees. The reverse light emitting direction in the present application means a direction opposite to the light emitting direction.
Specifically, the second developing assembly is a monochromatic three-dimensional line scanning light source 50, the monochromatic three-dimensional line scanning light source 50 generally adopts red light, and the monochromatic three-dimensional line scanning light source 50 adopting red light is convenient for displaying the foreign matters on the upper surface of the material to be detected 10. Certainly, according to the design requirement, the monochromatic three-dimensional line scanning light source 50 may also adopt light sources of other colors, such as yellow light, and the like, and the function is the same as that of red light, which is not described in detail herein.
The intersection point between the center of the field of view of the image acquisition member 20 and the material 10 to be inspected is taken as a vertex, a ray 60 perpendicular to the upper surface of the material 10 to be inspected is made, and the extending direction of the ray 60 does not pass through the material 10 to be inspected. The monochromatic line scan source makes an angle of 80 degrees with the direction of extension of the ray 60. Thereby facilitating the monochromatic line scanning light source to display the foreign matters on the upper surface of the material to be detected 10. Simple structure and convenient implementation.
The invention also discloses a glass defect detection method, which comprises the steps of constructing an identification model according to a deep learning algorithm, and obtaining a first light intensity map and a second light intensity map of the material 10 to be detected;
recognizing defects and foreign matters on the first light intensity graph through the recognition model, recording the defects and the foreign matters as first recognition points, and training the recognition model; recognizing the foreign matters on the second light intensity graph through the recognition model, recording the foreign matters as second recognition points and training the recognition model; and eliminating the first identification points corresponding to the second identification points on the first light intensity graph, judging whether the first identification points remain on the first light intensity graph, and judging that the material 10 to be detected has defects if the first identification points remain on the first light intensity graph.
Specifically, the glass defect detection method comprises the following working procedures:
and constructing an identification model through a deep learning algorithm to obtain a first light intensity map and a second light intensity map of the material 10 to be detected.
Defects and foreign matters on the first light intensity graph are identified through the identification model and recorded as first identification points, and meanwhile the identification model is trained through the first light intensity graph so that the identification model is more accurate. The foreign matter on the second light intensity graph is recognized through the recognition model, the foreign matter is recorded as a second recognition point, and meanwhile the recognition model is trained through the second light intensity graph, so that the model is more accurate.
And eliminating first identification points which are in one-to-one correspondence with the second identification points on the first light intensity graph, judging whether the first identification points remain on the first light intensity graph or not, judging that the material 10 to be detected has defects if the first identification points remain, and judging that the material 10 to be detected does not have defects if the first identification points do not remain.
By adopting the technical scheme, the foreign matters and the actual defects on the glass surface are accurately distinguished by an image recognition difference method, and the misjudgment of the glass is avoided.
The above description is only a preferred embodiment of the present invention, and is not intended to limit the scope of the present invention, and all modifications and equivalents of the present invention, which are made by the contents of the present specification and the accompanying drawings, or directly/indirectly applied to other related technical fields, are included in the scope of the present invention.

Claims (10)

1. A glass defect detection system, comprising:
the first developing assembly is used for displaying surface defects and foreign matters of the material to be detected;
the second developing assembly is used for displaying foreign matters on the surface of the material to be detected;
the image acquisition part is used for acquiring a first light intensity map of the surface of the material to be detected when the first developing assembly works and acquiring a second light intensity of the surface of the material to be detected when the second developing assembly works; and
and the processing unit is used for carrying out difference comparison on the first light intensity diagram and the second light intensity diagram and judging whether the surface of the material to be detected has defects or not.
2. The glass defect detection system of claim 1, wherein a dark field angle is formed between the first development assembly, the second development assembly, and the image acquisition unit.
3. The glass defect detection system of claim 2, wherein the first development assembly comprises:
the cross line that can shine and be used for showing on waiting to examine material surface defect and foreign matter sweeps the light source, cross line sweep the light source with the cross line that waits to examine material surface is located image acquisition spare's field of vision center department.
4. The glass defect detection system of claim 3, wherein the first development assembly further comprises:
can shine in wait to examine the parallel lines that material surface is used for showing and waits to examine material surface defect and foreign matter and sweep the light source, the intersection line of parallel lines sweep the light source and wait to examine material surface with the intersection line that light source and wait to examine material surface is located same straight line and is located the vision center department of image acquisition spare.
5. The glass defect detection system of claim 1, wherein the vertical distance of the image capture member from the surface of the material to be inspected is α, and 170mm α 190 mm.
6. The glass defect detecting system of claim 1, wherein a ray perpendicular to the upper surface of the material to be inspected is made with an intersection point between the center of the field of view of the image capturing member and the material to be inspected as a vertex, and an angle between a lighting direction of a lens of the image capturing member and an extending direction of the ray is 15 °.
7. The glass defect detection system of claim 3, wherein a ray perpendicular to the upper surface of the material to be inspected is made with an intersection point between the center of the field of view of the image acquisition member and the material to be inspected as a vertex, and an angle between an inverted light direction of the cross line scanning light source and an extending direction of the ray is 45 °.
8. The glass defect detection system of claim 4, wherein the ray perpendicular to the upper surface of the material to be inspected is taken with the intersection point between the center of the field of view of the image acquisition member and the material to be inspected as the vertex, and the angle between the direction of the light reflected from the parallel line scanning light source and the extending direction of the ray is 25 °.
9. The glass defect detection system of claim 1, wherein the second development assembly comprises:
can shine in waiting to examine the monochromatic three-dimensional line of material surface and sweep the light source to the crossing point between the vision center of image acquisition spare and the waiting to examine the material is the summit and is done the perpendicular to wait the ray of examining the material upper surface, three-dimensional line sweep the light source the contrary light-emitting direction with the angle between the extending direction of ray is 80.
10. A glass defect detection method is characterized in that an identification model is built according to a deep learning algorithm, and a first light intensity map and a second light intensity map of a material to be detected are obtained;
recognizing defects and foreign matters on the first light intensity graph through the recognition model, recording the defects and the foreign matters as first recognition points, and training the recognition model; recognizing the foreign matters on the second light intensity graph through the recognition model, recording the foreign matters as second recognition points and training the recognition model; and eliminating first identification points corresponding to the second identification points on the first light intensity graph, judging whether the first identification points remain on the first light intensity graph, and judging that the material to be detected has defects if the first identification points remain on the first light intensity graph.
CN202210798828.0A 2022-07-06 2022-07-06 Glass defect detection system and method Pending CN115047012A (en)

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Application Number Priority Date Filing Date Title
CN202210798828.0A CN115047012A (en) 2022-07-06 2022-07-06 Glass defect detection system and method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
CN202210798828.0A CN115047012A (en) 2022-07-06 2022-07-06 Glass defect detection system and method

Publications (1)

Publication Number Publication Date
CN115047012A true CN115047012A (en) 2022-09-13

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CN202210798828.0A Pending CN115047012A (en) 2022-07-06 2022-07-06 Glass defect detection system and method

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