CN115018766A - Detection method for film material evenness - Google Patents
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- CN115018766A CN115018766A CN202210468879.7A CN202210468879A CN115018766A CN 115018766 A CN115018766 A CN 115018766A CN 202210468879 A CN202210468879 A CN 202210468879A CN 115018766 A CN115018766 A CN 115018766A
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- G—PHYSICS
- G06—COMPUTING; CALCULATING OR COUNTING
- G06T—IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- G06T7/00—Image analysis
- G06T7/0002—Inspection of images, e.g. flaw detection
- G06T7/0004—Industrial image inspection
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
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- Y02E—REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION
- Y02E60/00—Enabling technologies; Technologies with a potential or indirect contribution to GHG emissions mitigation
- Y02E60/10—Energy storage using batteries
Abstract
The invention provides a detection method for the evenness of a film material. The detection method comprises the following steps: exposing the film material to be detected by using a parallel light source, and acquiring an exposure image of the film material by using a CCD (charge coupled device) image sensor to obtain an exposure image of the film material; carrying out gray level processing on the exposure image to obtain a gray value array consisting of gray values of all pixel points; calculating the mean of the gray value array
And standard deviation of the gray value array
Using the formula (1)
And (4) calculating the uniformity characteristic value of the film material. The detection method is free of radioactivityThe detection device is safe for operators, relatively simple in detection equipment, short in sampling and testing process time and fast in response, and can be applied to online uniformity detection and offline laboratory detection. Meanwhile, the exposure image obtained by the method is a 3D image, and the 3D image can be used for obtaining the sample evenness data according to the processing process, so that the evenness condition of the sample can be more vividly and accurately represented on the image and the numerical value.
Description
Technical Field
The invention relates to the technical field of film material evenness detection, in particular to a film material evenness detection method.
Background
Thin film material refers to a material with a small thickness (<300 μm) that appears film-like in appearance. Various film materials are widely applied to industries such as electronic appliances, display, decoration, filtration, lithium batteries and the like, are indispensable materials at present, and have great development prospects.
Various film materials need to have various properties due to different application industries and scenes, for example, the film materials applied to the filtration industry need to have certain air permeability. One property, however, is that it is desired that all of the film material be uniform, also referred to as homogeneous. Uniformity refers to whether the individual components or structures in such film materials remain uniform in the MD and CD directions, and whether all of the components are uniformly distributed in various regions. The formation of a film material can be analyzed by sampling at different areas, then performing performance tests and calculating the average value and deviation, the deviation represents the formation of the film material, and the smaller the deviation is, the larger the formation is. The testing method is direct, can well feed back the evenness of a film material, and has the defect of needing to spend long time and cost.
In the prior art, the uniformity of a sample is analyzed by mainly analyzing an equivalent black area on the surface of a film sample in a transmittance and threshold mode and then analyzing the size of the black area. This approach is more suitable for analyzing the degree of dirt, i.e., the size of impurities, in a sample, and does not provide a good indication of the intrinsic uniformity of the sample.
Disclosure of Invention
The invention mainly aims to provide a method for detecting the evenness of a film material, which aims to solve the problems of complexity and long time consumption of the method for detecting the evenness of the film material in the prior art.
In order to achieve the above object, according to one aspect of the present invention, there is provided a detection method of film material formation, the detection method comprising: exposing the film material to be detected by using a parallel light source, and acquiring an exposure image of the film material by using a CCD (charge coupled device) image sensor to obtain an exposure image of the film material; carrying out gray level processing on the exposure image to obtain a gray value array consisting of gray values of all pixel points; calculating the mean of the gray value array
And the standard deviation σ of the gray value array; using the formula (1)
And (4) calculating the uniformity characteristic value of the film material.
Further, the gray value array of the pixel point is:
wherein M is ij Representing a pixel in row i and column j, M ij Has a gray value of a, 0<a<255; m × n is b, b represents the total number of pixel points, i is more than or equal to 1 and less than or equal to m, and j is more than or equal to 1 and less than or equal to n; preferably m.gtoreq.2, preferably n.gtoreq.2.
Further, b is 5000000 or more.
Further, an average value of the gray value array is calculated using formula (2),
further, the standard deviation of the gray value array is calculated using formula (3),
furthermore, the illumination range of the parallel light source is 10-30000 Lux.
Further, the number of pixels of the CCD image sensor is more than 500 ten thousand, and preferably 1000 ten thousand.
Further, the test area of the membrane material is less than 0.5m 2 Preferably, the test area of the membrane material is 0.0001-0.5 m 2 。
Further, the area of the pixel point is not more than 0.1mm 2 Preferably, the area of the pixel points is not more than 0.01mm 2 。
Further, the length of the pixel point is not more than 0.3mm, and the width of the pixel point is not more than 0.3 mm.
By applying the technical scheme of the invention, for the light-transmitting thin film material, the light transmittance of each part can reflect the difference of components, structures, processing conditions and the like of different areas. The difference of the distribution ratio of each component in different areas and the difference of conditions such as processing temperature or pressure are reflected in the light transmittance of the film material. The method for directly detecting the light transmittance takes less time, the light transmittance result is collected after the material passes through the light source, the light transmittance result is converted into a numerical value through software to be represented as a gray value array, and the gray value array is used for calculating to obtain data representing the uniformity. Therefore, the detection method is a rapid test method for detecting the evenness of the transparent film material.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this application, illustrate embodiments of the invention and, together with the description, serve to explain the invention and not to limit the invention. In the drawings:
FIG. 1 shows a schematic view of a measurement module of one embodiment of the invention;
fig. 2 shows a detection flow diagram of an embodiment of the invention.
Wherein the figures include the following reference numerals:
101. the device comprises a CCD image sensor 102, a film sample to be measured 103, parallel light 104, a parallel light source 201, a measuring module 202, an environment module 203, a support module 204, a data collecting and calculating storage module 205 and a display module.
Detailed Description
It should be noted that, in the present application, the embodiments and features of the embodiments may be combined with each other without conflict. The present invention will be described in detail below with reference to the embodiments with reference to the attached drawings.
As analyzed by the background art, the prior art has the problems of complex and long-time consuming method for detecting the evenness of the membrane material. In order to solve the problem, the application provides a detection method of film material evenness.
In an exemplary embodiment of the present application, there is provided a method for detecting formation of a film material, the method comprising: exposing the film material to be detected by using a parallel light source, and acquiring an exposure image of the film material by using a CCD (charge coupled device) image sensor to obtain an exposure image of the film material; carrying out gray level processing on the exposure image to obtain a gray value array consisting of gray values of all pixel points; calculating the mean of the gray value array
And the standard deviation σ of the gray value array; using the formula (1)
And (4) calculating the uniformity characteristic value of the film material.
For a light-transmitting thin film material, the light transmittance of each part can reflect the difference of components, structures, processing conditions and the like of different areas. The difference of the distribution ratio of each component in different areas and the difference of conditions such as processing temperature or pressure are reflected in the light transmittance of the film material. The method for directly detecting the light transmittance takes less time, the light transmittance result is collected after the material passes through the light source, the light transmittance result is converted into a numerical value through software to be represented as a gray value array, and the gray value array is used for calculating to obtain data representing the uniformity. Therefore, the detection method is a rapid test method for detecting the evenness of the transparent film material.
The method for testing and analyzing the evenness of the thin film material is provided by testing the light transmittance of each area of a film material sample, the detection method is free of radioactive elements and safe for operators, detection equipment is relatively simple, the sampling and testing process time is short, the response is quick, and the method can be applied to online evenness detection and can also be used for offline laboratory detection. Meanwhile, the exposure image obtained by the method is a 3D image, and the 3D image can be used for obtaining the sample evenness data according to the processing process of the application, so that the evenness condition of the sample can be more vividly and accurately represented on the image and the numerical value. The larger the value of U obtained by the above method, the worse the formation, and the smaller the formation, the better the formation.
Moreover, the detection result obtained by the detection method is compared with the detection result of the detection method utilizing the performance characterization uniformity at present, the consistency of the detection result and the detection result is found to be high, and the feasibility and the accuracy of the detection method are proved.
There are several ways to realize the parallel light source, for example, a single bulb point light source can be selected and one or more scattering sheets can be applied to make the light source parallel to the film material; or a point light source is used for adding a lens, so that light rays are emitted into the film material in parallel; or a scattering sheet is added by using an LED, OLED or other surface light source to enable the light source to be emitted into the film material in parallel. Preferably, a planar light source and a scattering sheet are added to obtain a parallel light source. It should be understood by those skilled in the art that the collimated light source of the present application is a light source with uniform illumination, for example, the uniform illumination value of the collimated light source after blank testing is not more than 0.5.
In some embodiments, after the data of each pixel is subjected to gray processing, a gray-scale digital array with a point value range of 0 to 255 is generated, and the gray-scale array of the pixel is:
wherein M is ij Is shown at the firsti rows and j columns of pixels, M ij Has a gray value of a, 0<a<255; m is n and b represents the total number of pixel points, i is more than or equal to 1 and less than or equal to m, j is more than or equal to 1 and less than or equal to n, preferably m is more than or equal to 2, and preferably n is more than or equal to 2. Similar to the conventional statistical principle, the more the selected pixel points are, the more the obtained processing result has statistical significance, but the larger the workload of data processing is, the more preferably b is equal to or greater than 5000000 after test comparison; the uniformity characterization value obtained through the statistical results of the number of the pixel points can sufficiently meet the industrial detection application, and is suitable for the data processing capacity requirement of the conventional gray processing equipment at present.
According to the difference of the light transmittance of the film material and the intensity of the light source, M ij The value will change, but when M is ij When the value is 0, the intensity of light transmitted through the film material is not enough to be recognized by the photosensitive element of the CCD, and when M is less than M ij When the value is 255, the intensity of the light after penetrating the film material is too high and exceeds the detection limit of the CCD photosensitive element. The data and results obtained in both cases are unreliable. Therefore, 0 is preferable<a<255。
In some embodiments, the average of the gray value array is calculated using equation (2),
in some embodiments, the standard deviation of the gray value array is calculated using equation (3),
parallel light source in this application is adjustable, can carry out corresponding adjustment according to the printing opacity condition of actual film material sample, and parallel light source's illuminance scope is 10 ~ 30000Lux, can satisfy the exposure demand of present film material, and the grey level value of avoiding too much pixel is 0 or surpasss 255.
In order to better analyze the uniformity of the surface of the test sample, theoretically, the larger the pixel of the CCD is, the better the image is, the smaller the shooting range of the film sample to be tested is, the better the image is, the smaller the area corresponding to each pixel point is, and the higher the precision is. The uniformity requirements of different performances or different industries are inconsistent, and the pixel of the CCD and the test area of the sample can be selected according to specific requirements. In some embodiments, the pixels of the CCD image sensor are greater than 500 ten thousand, preferably 1000 ten thousand.
In some embodiments, the test area of the membrane material is less than 0.5m 2 Preferably, the test area of the membrane material is 0.0001-0.5 m 2 More preferably 0.01 to 0.5m 2 So as to ensure that the measured area has more than 5000000 pixel points. In some embodiments, the area of the pixel points is not greater than 0.1mm 2 Preferably, the area of the pixel points is not more than 0.01mm 2 . Further, preferably, the length of the pixel point is not more than 0.3mm, and the width of the pixel point is not more than 0.3 mm.
The detection method of the present application can be implemented by using a combination of a light source device, an imaging device, and a gray-level processing device in the field, and fig. 2 below shows a block diagram of a device structure that can implement the detection method of the present application.
The above structural block diagram shows 5 modules, which are a measurement module 201, an environment module 202, a support module 203, a data collection and calculation storage module 204, and a display module 205.
The structure of the measurement module 201 is shown in fig. 1, where 101 is a CCD image sensor, 102 is a film to be measured, 103 is parallel light, and 104 is a parallel light source.
The environment module 202 mainly provides a measuring environment for the measuring module 201, such as a black shade cloth, a light shield, and the like. The influence of ambient light is mainly reduced by shielding ambient light or ambient light directly entering the CCD. The measurement module 201 and the holder module 203 are preferably tested in a completely dark environment to reduce the effect of ambient light on the test results.
The support module 203 provides support for the measurement module 201 and the environment module 202, such as a support for a platform, an O-gantry, a C-gantry, etc. Wherein the O-type and C-type scanning frames are used for measuring the uniformity of the film material on line.
The data collection and calculation storage module 204 is generally a computer device for collecting data output by the measurement module and performing corresponding calculation and data storage. Including but not limited to control chips, personal computers, commercial computers, industrial computers, laptops, smartphones, tablets, and portable wearable devices. Software such as Java, Matlab, Phyton, Photoshop and the like are loaded in the data collection and calculation storage module 204 to realize the conversion from the image to the gray value, and the software belongs to the existing software and is not described in detail in the application.
The display module 205 is used to display the uniformity data obtained from the raw data obtained from the measurement module by the data collection and calculation storage module 204 and the 2-dimensional or 3-dimensional image. Including but not limited to liquid crystal displays, mini-LED displays, micro-LED displays, OLED displays, QLED displays, electronic ink displays.
The present application is described in further detail below with reference to specific examples, which should not be construed as limiting the scope of the invention as claimed.
The first film material to be detected is made of PET fibers with the diameter of 0.7D and the length of 7 mm. The second film material to be measured is made of PET fibers with the diameter of 0.5D and the length of 3 mm. The two film materials are both prepared into base paper by a wet papermaking method and are subjected to calendaring through a subsequent calendaring process so as to eliminate the fibers with warped surfaces and influence the accuracy of test results. Because the first film material to be tested is thicker and longer in used fiber and larger in length-diameter ratio, the uniformity of the first film material formed by the same process is relatively poorer in the wet papermaking process, and the flocculation condition of the fiber to a certain degree is easily generated. Meanwhile, the diameter of the fiber is relatively larger, the length of the fiber is longer, the number of the fibers is smaller under the condition of the same weight, and the uniformity of coverage is reduced to a certain extent when the fibers are spread in the same area. The uniformity of the first film material to be detected is also uniformity, and the film material to be detected is inferior to the film material to be detected by naked eyes.
To ensure the reliability of the results obtained by the present invention, a paper formation tester (LAD17, Paprican dust formation tester, op test) available in the market is selected to test the samples and to verify the test results. The selected LAD17 tester calculates the uniformity of the sample mainly by analyzing fiber piled flocks on the surface of the test sample, and the larger the value is, the better the uniformity is.
Example 1
0.01m using LED screen as parallel backlight source 2 Exposing a first film material to be detected and a second film material to be detected at the illumination intensity of 8000Lux, and acquiring an exposure image of the film materials by a square (2236 multiplied by 2236) CCD image sensor with 500 ten thousand pixels to obtain the exposure image of the film materials to be detected; and carrying out gray processing on the exposure image by a Matlab compiling program to obtain a gray value array consisting of the gray values of all the pixel points, and calculating the uniformity value.
The uniformity data U of the first film material to be tested is 8.63, the uniformity data U of the second film material to be tested is 4.62, the larger the U value obtained by the method is, the worse the uniformity is, and the smaller the uniformity is, the better the uniformity is. The evenness data of the second film material to be tested is smaller than the evenness data of the first film material to be tested, which shows that the second film material to be tested has better evenness than the first film material to be tested.
The LAD17 tester is used for testing the evenness of the first film material to be tested and the second film material to be tested, the results are 82.7 (the first film material to be tested) and 88.1 (the second film material to be tested), the higher the value measured by the LAD17 tester is, the better the evenness is, the higher the evenness value of the second film material to be tested is, the better the evenness of the second film material to be tested is than the first film material to be tested, the better the evenness of the second film material to be tested is, and the testing result is consistent with the method disclosed by the invention.
The LAD17 tester is used for testing surface cloud spots, the size of the cloud spots in the material is circled according to the light transmittance, and then the uniformity is calculated according to the proportion and the distribution of the size; the LAD17 tester has longer detection time, which is equivalent to performing secondary processing on the data of the light transmittance. And the LAD17 tester is relatively costly. The application directly converts the data of the light transmittance into the gray scale for calculation, can effectively reduce the detection time, and simultaneously effectively reduces the cost.
The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention, and various modifications and changes may be made by those skilled in the art. Any modification, equivalent replacement, or improvement made within the spirit and principle of the present invention should be included in the protection scope of the present invention.
Claims (10)
1. A method for detecting formation of a film material, the method comprising:
exposing a film material to be detected by using a parallel light source, and acquiring an exposure image of the film material by using a CCD (charge coupled device) image sensor to obtain an exposure image of the film material;
performing gray level processing on the exposure image to obtain a gray value array consisting of gray values of all pixel points;
calculating an average of the gray value array
And the standard deviation σ of the gray value array;
using the formula (1)
And calculating the uniformity characteristic value of the film material.
2. The detection method according to claim 1, wherein the gray value array of the pixel points is:
wherein, M ij Representing a pixel in row i and column j, M ij Has a gray value of a, 0<a<255; m × n is b, b represents the total number of pixel points, i is more than or equal to 1 and less than or equal to m, and j is more than or equal to 1 and less than or equal to n;
preferably m.gtoreq.2, preferably n.gtoreq.2.
3. The detection method according to claim 2, wherein b is 5000000 or more.
4. The detection method according to claim 2, wherein the average value of the gray value array is calculated using formula (2),
5. the detection method according to claim 4, wherein the standard deviation of the gray value array is calculated using formula (3),
6. the detection method according to claim 1, wherein the illuminance of the collimated light source is in a range of 10 to 30000 Lux.
7. The detection method according to claim 1, wherein the pixels of the CCD image sensor are greater than 500 ten thousand, preferably 1000 ten thousand.
8. The detection method according to claim 2, wherein the test area of the membrane material is less than 0.5m 2 Preferably, the test area of the membrane material is 0.0001-0.5 m 2 。
9. The detection method according to claim 7, wherein the area of the pixel point is less than or equal to 0.1mm 2 Preferably, the area of the pixel point is less than or equal to 0.01mm 2 。
10. The method according to claim 9, wherein the pixel points have a length of 0.3mm or less and a width of 0.3mm or less.
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Effective date of registration: 20240119 Address after: 311300, Building 14, 201, No. 8 Foster Street, Jinbei Street, Lin'an District, Hangzhou City, Zhejiang Province (self declared) Applicant after: Hangzhou Foster Functional Membrane Materials Co.,Ltd. Address before: No.8, foster street, Jinbei street, Lin'an District, Hangzhou City, Zhejiang Province Applicant before: HANGZHOU FIRST APPLIED MATERIAL Co.,Ltd. |