CN115015654A - Signal measurement circuit and device - Google Patents
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- CN115015654A CN115015654A CN202210456668.1A CN202210456668A CN115015654A CN 115015654 A CN115015654 A CN 115015654A CN 202210456668 A CN202210456668 A CN 202210456668A CN 115015654 A CN115015654 A CN 115015654A
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Abstract
The invention relates to a signal measuring circuit, which comprises a reference resistance network module, a first signal amplification module, a bias test module, a second signal amplification module and a frequency spectrum reconstruction module, wherein the reference resistance network module is used for generating a first reference noise signal and a second reference noise signal which are mutually differential signals; the first signal amplification module is connected with the reference resistance network module and used for generating a reference loop noise signal with a preset amplification factor according to the first reference noise signal and the second reference noise signal; the bias test module is used for generating a noise signal to be tested and a reference noise signal which are mutually differential signals; the second signal amplification module is connected with the bias test module and used for generating a test loop noise signal with a preset amplification factor according to the noise signal to be tested and the reference noise signal; the frequency spectrum reconstruction module is connected with the first signal amplification module and the second signal amplification module and is used for acquiring a power spectrum of the electronic device noise signal for eliminating the measurement noise signal.
Description
Technical Field
The invention relates to the technical field of electronic testing, in particular to a signal measuring circuit and a signal measuring device.
Background
With the continuous shrinking of the device size, the requirements for the reliability and consistency of the device are continuously raised. Low frequency noise is an important measurement means to determine the internal defects. Therefore, the device noise test analysis is one of the key indicators for evaluating the device quality. In addition, the low-frequency noise characteristics and the reliability of the device have close relation, and the device can be used as an important characterization means of the reliability of the device.
However, as the size of the device to be tested is continuously reduced, the noise signal of the device is also smaller and smaller, so that higher and higher requirements are provided for the measurement of the noise signal, and particularly for the acquisition of the extremely low frequency noise signal, the system must be further optimized, and the test accuracy is improved.
Disclosure of Invention
Accordingly, there is a need for a signal measurement circuit and device to improve the measurement accuracy of the noise of the tiny electronic components.
The signal measuring circuit comprises a reference resistance network module, a first signal amplification module, a bias test module, a second signal amplification module and a frequency spectrum reconstruction module, wherein the reference resistance network module is used for generating a first reference noise signal and a second reference noise signal which are differential signals with each other; the first signal amplification module is connected with the reference resistance network module and used for generating a reference loop noise signal with a preset amplification factor according to the first reference noise signal and the second reference noise signal; the reference loop noise signal comprises a reference resistance network noise signal and a measurement noise signal; the bias test module is used for generating a noise signal to be tested and a reference noise signal which are mutually differential signals; the second signal amplification module is connected with the bias test module and used for generating a test loop noise signal with a preset amplification factor according to the noise signal to be tested and the reference noise signal; the test loop noise signal comprises an offset test module noise signal and the measurement noise signal; the frequency spectrum reconstruction module is connected with the first signal amplification module and the second signal amplification module and is used for acquiring a reference loop noise signal power spectrum according to the reference loop noise signal, acquiring a test loop noise signal power spectrum according to the test loop noise signal and acquiring an electronic device noise signal power spectrum for eliminating the measurement noise signal according to the reference loop noise signal power spectrum, the test loop noise signal power spectrum and a reference resistance network noise signal power spectrum.
In the signal measuring circuit described in the above embodiment, two symmetric noise measuring circuits are provided, which are a reference circuit composed of a reference resistance network module and a first signal amplification module, and a test circuit composed of a bias measuring module and a second signal amplification module, respectively, where in the reference circuit, the reference resistance network module makes a noise signal emitted by the reference resistance network module keep relatively stable by selecting a relatively ideal resistance element, and performs signal amplification by the first signal amplification module, and outputs a reference circuit noise signal of a preset amplification factor, where the signal includes a reference resistance network noise signal and a measurement noise signal, so that a noise signal of a measuring circuit system, that is, a measurement noise signal, can be obtained by subtracting the measured reference circuit noise signal from the reference resistance network noise signal; in the same way, in the test loop, the test loop noise signal including the bias test module noise signal and the measurement noise signal can be finally obtained, because the reference loop and the test loop are symmetrically arranged, the measurement noise signals of the reference loop and the test loop are equal, and the test loop noise signal and the measurement noise signal are differentiated to obtain the bias test module noise signal, namely the noise of the electronic device to be tested, on one hand, the test system eliminates the common mode noise in the test process through the first signal amplification module and the second signal amplification module, so that the noise interference of the bias power supply to the test circuit is eliminated through the reference resistance network module and the bias test module at the front end, the clean electronic device to be tested and the low-frequency noise signal of the ideal resistance are obtained, on the other hand, the noise interference signal generated by the power supply in the rear-end amplification module can be measured and obtained through the reference loop, and then eliminate it in the test loop, finally obtain the clean electronic component noise signal to be tested, the above-mentioned embodiment does not adopt the traditional way of shielding or weakening various interference noises, but allows the interference noise to exist, through the way of measuring and calculating, it is ingenious to eliminate it, therefore can obtain higher measurement accuracy.
In one embodiment, the reference resistance network module comprises a first resistor, a second resistor, a third resistor and a fourth resistor; wherein the first resistance is configured to: the first end is connected with a power supply, and the second end is grounded through the second resistor; the third resistance is configured to: the first end is connected with a power supply, and the second end is grounded through the fourth resistor; wherein the reference resistor network module outputs the first reference noise signal through a second end of the first resistor; the reference resistor network module outputs the second reference noise signal through a second end of the third resistor.
In one embodiment, the first signal amplifying module includes a first differential amplifier and a first adjustable gain amplifier, wherein the first differential amplifier is configured to generate a differentially amplified reference loop noise signal according to the first reference noise signal and the second reference noise signal, and the first differential amplifier is configured to: the positive input end is connected with the second end of the first resistor, and the negative input end is connected with the second end of the third resistor; the first adjustable gain amplifier is connected with the first differential amplifier and used for generating the reference loop noise signal with the preset amplification factor according to the reference loop noise signal subjected to differential amplification.
In one embodiment, the bias test module comprises a fifth resistor, a sixth resistor and a seventh resistor; wherein the fifth resistance is configured to: the first end is connected with a power supply, and the second end is grounded through the electronic device; the sixth resistance is configured to: the first end is connected with a power supply, and the second end is grounded through the seventh resistor; the bias test module outputs the noise signal to be tested through a second end of the fifth resistor; the bias test module outputs the reference noise signal through a second end of the sixth resistor.
In one embodiment, the second signal amplifying module includes a second differential amplifier and a second adjustable gain amplifier, where the second differential amplifier is configured to generate a differentially amplified test loop noise signal according to the noise signal to be tested and the reference noise signal, and the second differential amplifier is configured to: a positive input end is connected with the second end of the fifth resistor, and a negative input end is connected with the second end of the sixth resistor; the second adjustable gain amplifier is connected with the second differential amplifier and used for generating the test loop noise signal with the preset amplification factor according to the test loop noise signal subjected to differential amplification.
In one embodiment, the resistance of the electronic device is equal to the resistance of the first resistor, the resistance of the second resistor, the resistance of the third resistor, the resistance of the fourth resistor, the resistance of the fifth resistor, the resistance of the sixth resistor, and the resistance of the seventh resistor.
In one embodiment, the amplification factor of the first differential amplifier is equal to the amplification factor of the second differential amplifier, and the amplification factor of the first adjustable gain amplifier is equal to the amplification factor of the second adjustable gain amplifier.
In one embodiment, the spectrum reconstruction module includes a first sampling unit, a second sampling unit, and a spectrum reconstruction unit, where the first sampling unit is connected to the first adjustable gain amplifier and is configured to convert a reference loop noise analog signal into a reference loop noise digital signal; the second sampling unit is connected with the second adjustable gain amplifier and is used for converting the test loop noise analog signal into a test loop noise digital signal; the frequency spectrum reconstruction unit is connected with the first sampling unit and the second sampling unit and is used for acquiring the power spectrum of the reference loop noise signal according to the reference loop noise digital signal, acquiring the power spectrum of the test loop noise signal according to the test loop noise digital signal, and acquiring the power spectrum of the electronic device noise signal for eliminating the measurement noise signal according to the power spectrum of the reference loop noise signal, the power spectrum of the test loop noise signal and the power spectrum of the reference resistance network noise signal.
In one embodiment, the electronic device noise signal power spectrum F (ω) is calculated according to the following formula:
wherein F (omega) is the power spectrum of the electronic device noise signal, R DUT Is the resistance value, R, of the electronic device 7 Is the resistance value, S, of the seventh resistor t (ω) is the test loop noise signal power spectrum, S f (ω) is the power spectrum, S, of the reference loop noise signal f-0 And (omega) is the power spectrum of the noise signal of the reference resistance network.
A second aspect of the present application provides a signal measuring apparatus comprising a signal measuring circuit as described in any one of the preceding embodiments.
Drawings
In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed to be used in the embodiments will be briefly described below, and it is obvious that the drawings in the following description are only some embodiments of the present application, and it is obvious for those skilled in the art to obtain other drawings without creative efforts.
FIG. 1 is a schematic diagram of a signal measurement circuit according to an embodiment of the present disclosure;
FIG. 2 is a schematic circuit diagram of a reference resistor network module and a bias test module according to an embodiment of the present disclosure;
fig. 3 is a schematic diagram of a signal measurement circuit according to another embodiment of the present disclosure.
Detailed Description
To facilitate an understanding of the present application, the present application will now be described more fully with reference to the accompanying drawings. Embodiments of the present application are set forth in the accompanying drawings. This application may, however, be embodied in many different forms and should not be construed as limited to the embodiments set forth herein. Rather, these embodiments are provided so that this disclosure will be thorough and complete.
Unless defined otherwise, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used herein in the description of the present application is for the purpose of describing particular embodiments only and is not intended to be limiting of the application.
It will be understood that, as used herein, the terms "first," "second," and the like may be used herein to describe various elements, but these elements are not limited by these terms. These terms are only used to distinguish one element from another. For example, a first resistance may be referred to as a second resistance, and similarly, a second resistance may be referred to as a first resistance, without departing from the scope of the present application. The first resistance and the second resistance are both resistances, but they are not the same resistance.
It is to be understood that "connection" in the following embodiments is to be understood as "electrical connection", "communication connection", and the like if the connected circuits, modules, units, and the like have communication of electrical signals or data with each other.
As used herein, the singular forms "a", "an" and "the" may include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms "comprises/comprising," "includes" or "including," etc., specify the presence of stated features, integers, steps, operations, components, parts, or combinations thereof, but do not preclude the presence or addition of one or more other features, integers, steps, operations, components, parts, or combinations thereof. Also, as used in this specification, the term "and/or" includes any and all combinations of the associated listed items.
With the continuous reduction of the size of electronic components, the low-frequency noise test level of the devices also continuously decreases, and a better low-frequency noise test system must be designed for realization. Especially, in order to measure a noise signal with lower power, the system must be further optimized to improve sensitivity. At present, a high-precision test system usually adopts a discrete device to build a test system model, so that the system background noise is reduced, and meanwhile, some methods on a circuit structure are adopted to improve the system measurement precision. However, for the very low frequency noise signal acquisition, the noise characteristics in a long period need further optimization processing to improve the test accuracy.
Accordingly, there is a need for a signal measurement circuit and device to improve the measurement accuracy of the noise of the tiny electronic components.
In an embodiment of the present application, as shown in fig. 1, a signal measurement circuit is provided for measuring a low-frequency noise signal emitted by an electronic device, the signal measurement circuit includes a reference resistance network module 100, a first signal amplification module 200, a bias test module 300, a second signal amplification module 400, and a spectrum reconstruction module 500, where the reference resistance network module 100 is configured to generate a first reference noise signal and a second reference noise signal that are differential signals with each other; the first signal amplification module 200 is connected to the reference resistor network module 100, and configured to generate a reference loop noise signal with a preset amplification factor according to the first reference noise signal and the second reference noise signal; the reference loop noise signal comprises a reference resistance network noise signal and a measurement noise signal; the bias test module 300 is configured to generate a to-be-tested noise signal and a reference noise signal that are differential signals with each other; the second signal amplification module 400 is connected to the bias test module 300, and configured to generate a test loop noise signal with a preset amplification factor according to the noise signal to be tested and the reference noise signal; the test loop noise signal comprises an offset test module noise signal and a measurement noise signal; the spectrum reconstruction module 500 is connected to both the first signal amplification module 200 and the second signal amplification module 400, and is configured to obtain a power spectrum of a reference loop noise signal according to the reference loop noise signal, obtain a power spectrum of a test loop noise signal according to the test loop noise signal, and obtain a power spectrum of an electronic device noise signal for eliminating a measurement noise signal according to the power spectrum of the reference loop noise signal, the power spectrum of the test loop noise signal, and the power spectrum of the reference resistance network noise signal.
In the signal measurement circuit described in the above embodiment, two symmetrical noise measurement circuits are provided, which are a reference circuit composed of the reference resistor network module 100 and the first signal amplification module 200, and a test circuit composed of the offset measurement module 300 and the second signal amplification module 400, in the reference loop, the reference resistance network module 100 selects a relatively ideal resistance element to keep the noise signal emitted by the reference resistance network module 100 relatively stable, and performs signal amplification through the first signal amplification module 200, outputs a reference loop noise signal with a preset amplification factor, the signal comprises a reference resistance network noise signal and a measurement noise signal, so that the noise signal of the measurement circuit system, namely the measurement noise signal, can be obtained by subtracting the measured reference loop noise signal and the reference resistance network noise signal; similarly, in the test loop, the test loop noise signal including the bias test module noise signal and the measurement noise signal can be finally obtained, since the reference loop and the test loop are symmetrically arranged, the measurement noise signals of the reference loop and the test loop are equal, and the test loop noise signal and the measurement noise signal are subtracted to obtain the bias test module noise signal, that is, the noise of the electronic device to be tested, on one hand, the test circuit eliminates the common mode noise in the test process through the first signal amplification module 200 and the second signal amplification module 400, so that the front-end reference resistance network module 100 and the bias test module 300 eliminate the noise interference of the bias power supply to the measurement circuit, and obtain the clean electronic device to be tested and the low-frequency noise signal of the ideal resistance, on the other hand, the test loop noise interference signal generated by the power supply in the rear-end amplification module can be measured and obtained through the reference loop, and then eliminate it in the test loop, finally obtain the clean electronic component noise signal to be tested, the above-mentioned embodiment does not adopt the traditional way of shielding or weakening various interference noises, but allows the interference noise to exist, through the way of measuring and calculating, it is ingenious to eliminate it, therefore can obtain higher measurement accuracy.
As an example, as shown in (a) of fig. 2, the reference resistance network module 100 includes a first resistor R 1 A second resistor R 2 A third resistor R 3 And a fourth resistor R 4 (ii) a Wherein, the first resistor R 1 Is configured to: the first end is connected with a bias power supply, and the second end passes through a second resistor R 2 Grounding; third resistor R 3 Is configured to: the first end is connected with a bias power supply, and the second end passes through a fourth resistor R 4 Grounding; wherein, the reference resistor network module 100 passes through the first resistor R 1 Outputs a first reference noise signal; the reference resistor network module 100 passes through a third resistor R 3 Outputs a second reference noise signal.
Specifically, the reference resistor network module 100 is configured to generate two standard differential signals for monitoring the noise signal of the measurement circuit itself, and therefore, in order to not introduce additional noise, the reference resistor network module 100 needs to have an ideal output characteristic to minimize noise interference caused by unbalanced configuration inside the reference resistor network module 100, in some embodiments, the first resistor R is configured to generate two standard differential signals for monitoring the noise signal of the measurement circuit itself 1 A second resistor R 2 A third resistor R 3 And a fourth resistor R 4 All can choose the metal film resistor, the metal film resistor has high precision, stable performance, simple and light structure, and wide application in the electronic industry under the requirement of high precision, and is an ideal choice for the resistor element in the embodiment, and the resistance value of each resistor should satisfy the formula
In order to obtain more desirable technical effects, the resistance element configured in the present embodiment satisfies R 1 ＝R 2 ＝R 3 ＝R 4 ＝R DUT Wherein R is DUT Is the resistance value of the electronic device to be tested.
As an example, as shown in (b) of FIG. 2, the bias test module 300 includes a fifth resistor R 5 A sixth resistor R 6 And a seventh resistor R 7 (ii) a Wherein, the fifth resistor R 5 Is configured to: the first end is connected with a power supply, and the second end is grounded through an electronic device to be tested DUT; a sixth resistor R 6 Is configured to: the first end is connected with a power supply, and the second end is connected with a seventh resistor R 7 Grounding; wherein, the bias test module 300 passes through the fifth resistor R 5 The second end of the signal processing circuit outputs a noise signal to be detected; biasingThe test module 300 passes through the sixth resistor R 6 Outputs a reference noise signal.
Specifically, the same criteria are used for selecting the resistor elements in the reference resistor network module 100, and in order to obtain better technical effect, the fifth resistor R is used 5 A sixth resistor R 6 And a seventh resistor R 7 All use metal film resistors, and the resistance of each resistor satisfies R 5 ＝R 6 ＝R 7 ＝R DUT 。
As an example, referring to fig. 3, the first signal amplifying module 200 includes a first differential amplifier 210 and a first adjustable gain amplifier 220, wherein the first differential amplifier 210 is configured to generate a differentially amplified reference loop noise signal according to a first reference noise signal and a second reference noise signal, and the first differential amplifier 210 is configured to: a positive input terminal and a first resistor R 1 Is connected with the negative input end of the third resistor R 3 Is connected with the second end of the first end; the first adjustable gain amplifier 220 is connected to the first differential amplifier 210, and is configured to generate a reference loop noise signal with a preset amplification factor according to the reference loop noise signal subjected to differential amplification.
Specifically, the first differential amplifier 210 differentially amplifies a first reference noise signal and a second reference noise signal sent by the reference resistor network module 100, and simultaneously filters a common mode noise signal generated by the reference resistor network module 100, so as to eliminate interference generated by the bias power supply, in order to further amplify the reference resistor network noise signal output by the first differential amplifier 210, so that the signal can be sampled and received by a post-stage circuit, in this embodiment, a first adjustable gain amplifier 220 is further configured, which can amplify the output signal of the first differential amplifier 210 in an adjustable proportion according to a requirement of a post-stage sampling circuit, so that the amplitude of the final output signal is adaptive to a post-stage sampling requirement, and meanwhile, the first differential amplifier 210 and the first adjustable gain amplifier 220 are both powered by an external power supply, and inevitably introduce an interference noise signal, that is, the measurement noise signal and the reference resistance network noise signal are amplified in the same ratio by the first adjustable gain amplifier 220, and the output reference loop noise signal is equal to the sum of the measurement noise signal and the reference resistance network noise signal.
As an example, continuing to refer to fig. 3, the second signal amplifying module 400 includes a second differential amplifier 410 and a second adjustable gain amplifier 420, wherein the second differential amplifier 410 is configured to generate a differentially amplified test loop noise signal according to a noise signal to be tested and a reference noise signal, and the second differential amplifier 410 is configured to: a positive input terminal and a fifth resistor R 5 Is connected with the negative input end of the sixth resistor R 6 Is connected with the second end of the first end; the second adjustable gain amplifier 420 is connected to the second differential amplifier 410, and is configured to generate a test loop noise signal with a preset amplification factor according to the differentially amplified test loop noise signal.
Specifically, the second signal amplification module 400 and the first signal amplification module 200 adopt the same configuration, that is, the second differential amplifier 410 and the first differential amplifier 210 have the same circuit configuration, and the second adjustable gain amplifier 420 and the first adjustable gain amplifier 220 have the same circuit configuration, so that the amplification factor of the first differential amplifier 210 is equal to that of the second differential amplifier 410, and the amplification factor of the first adjustable gain amplifier 220 is equal to that of the second adjustable gain amplifier 420, and therefore, the test loop noise signal finally output by the second adjustable gain amplifier 420 and the reference loop noise signal output by the first adjustable gain amplifier 220 have the same amplification factor, and are equal to the sum of the measurement noise signal and the offset test noise signal.
As an example, referring to fig. 3 continuously, the spectrum reconstruction module 500 includes a first sampling unit 510, a second sampling unit 520, and a spectrum reconstruction unit 530, wherein the first sampling unit 510 is connected to the first adjustable gain amplifier 220 for converting the reference loop noise analog signal into a reference loop noise digital signal; the second sampling unit 520 is connected to the second adjustable gain amplifier 420, and is configured to convert the test loop noise analog signal into a test loop noise digital signal; the spectrum reconstruction unit 530 is connected to both the first sampling unit 510 and the second sampling unit 520, and is configured to obtain a power spectrum of a reference loop noise signal according to the reference loop noise digital signal, obtain a power spectrum of a test loop noise signal according to the test loop noise digital signal, and obtain a power spectrum of an electronic device noise signal for eliminating a measurement noise signal according to the power spectrum of the reference loop noise signal, the power spectrum of the test loop noise signal, and the power spectrum of the reference resistance network noise signal.
Specifically, the power spectrum is an abbreviation of power spectral density function, which is defined as the signal power within a unit frequency band. It shows the variation of signal power with power, i.e. the distribution of signal power in frequency domain. The power spectrum represents the variation of the signal power with the power, and the square of the amplitude of the Fourier transform of the power signal is usually used as the measure of the signal power, and the power spectrum expression of the power signal is that in a time period T
Wherein, F T And (omega) is the Fourier transform of the power signal. In this embodiment, according to the calculation formula of the power spectral density function, the power spectrum of the reference loop noise signal can be obtained as follows:
wherein S is f (omega) is the power spectrum, V, of the reference loop noise signal f FFT (V) as a function of the reference loop noise signal f ) Fourier transform of the noise signal of the reference loop, A 1 Is the product of the amplification of first differential amplifier 210 and the amplification of first adjustable gain amplifier 220;
similarly, the power spectrum S of the loop noise signal is tested t (ω) is:
wherein S is t (omega) is the power spectrum, V, of the noise signal of the test loop t FFT (V) as a function of the test loop noise signal t ) For Fourier transform of loop noise signal, T is time period, A 2 Is the product of the amplification of the second differential amplifier 410 and the amplification of the first adjustable gain amplifier 420, and A 1 ＝A 2 。
By way of example, continuing with reference to fig. 2 (a), the thermal noise of each resistor in the reference resistor network module is fixed and can be generally calculated by the following formula:
S V ＝4kTR；
wherein S is V K is the boltzmann constant, T is the temperature, and R is the resistance value of the resistor, which is the power density of the resistive thermal noise.
Therefore, the thermal noise of the ideal resistor is a linear function of the resistance values of the resistors, and in this embodiment, the resistance values of the resistors in the reference resistor network module are equal to the resistance value of the electronic device to be tested, so that the power spectrum of the noise signal of the reference resistor network is only related to the resistance value of the electronic device to be tested and is a fixed value, and S is used as f-0 (ω) then, according to the analysis in the previous embodiment, in the reference loop, the measurement noise signal is equal to the difference between the reference loop noise signal and the reference resistance network noise signal, and therefore, the power spectrum of the measurement noise signal can be expressed as:
S noise (ω)＝S f (ω)-S f-0 (ω)；
wherein S is noise And (omega) is a power spectrum of the measurement noise signal.
By way of example, please continue to refer to fig. 2 (b), ignoring the fifth resistor R 5 And a sixth resistor R 6 Thermal noise of (2), electronic device under test DUT and seventh resistor R 7 Based on the resistance voltage division principle, the power spectrum of the noise signal of the electronic device to be tested DUT is obtained as follows:
wherein S is DUT (ω) is the noise signal power spectrum of the electronic device under test DUT which, according to the explanation in the previous embodiment,the noise signal is subjected to signal amplification by the second signal amplification module 400, so that a measurement noise signal is introduced, and the measurement noise signal needs to be eliminated, so that the power spectrum of the true noise signal of the electronic device to be measured is obtained as follows:
F(ω)＝S DUT (ω)-S noise (ω)；
wherein F (ω) is the electronics noise signal power spectrum.
Substituting the formula in the foregoing embodiment into the above formula, the final power spectrum F (ω) of the noise signal of the electronic device can be obtained as:
a second aspect of the present application provides a signal measuring apparatus comprising the signal measuring circuit of any one of the preceding embodiments.
In the description herein, references to the description of "some embodiments," "other embodiments," "desired embodiments," etc., mean that a particular feature, structure, material, or characteristic described in connection with the embodiment or example is included in at least one embodiment or example of the invention. In this specification, a schematic description of the above terminology may not necessarily refer to the same embodiment or example.
The technical features of the embodiments described above may be arbitrarily combined, and for the sake of brevity, all possible combinations of the technical features in the embodiments described above are not described, but should be considered as being within the scope of the present specification as long as there is no contradiction between the combinations of the technical features.
The above-mentioned embodiments only express several embodiments of the present invention, and the description thereof is more specific and detailed, but not construed as limiting the scope of the invention. It should be noted that, for a person skilled in the art, several variations and modifications can be made without departing from the inventive concept, which falls within the scope of the present invention. Therefore, the protection scope of the present patent shall be subject to the appended claims.
Claims (10)
1. A signal measurement circuit for measuring a low frequency noise signal emitted by an electronic device, the signal measurement circuit comprising:
the reference resistance network module is used for generating a first reference noise signal and a second reference noise signal which are mutually differential signals;
the first signal amplification module is connected with the reference resistance network module and used for generating a reference loop noise signal with a preset amplification factor according to the first reference noise signal and the second reference noise signal; the reference loop noise signal comprises a reference resistance network noise signal and a measurement noise signal;
the bias test module is used for generating a noise signal to be tested and a reference noise signal which are mutually differential signals;
the second signal amplification module is connected with the bias test module and used for generating a test loop noise signal with a preset amplification factor according to the noise signal to be tested and the reference noise signal; the test loop noise signal comprises an offset test module noise signal and the measurement noise signal;
and the frequency spectrum reconstruction module is connected with the first signal amplification module and the second signal amplification module and is used for acquiring a reference loop noise signal power spectrum according to the reference loop noise signal, acquiring a test loop noise signal power spectrum according to the test loop noise signal and acquiring an electronic device noise signal power spectrum for eliminating the measurement noise signal according to the reference loop noise signal power spectrum, the test loop noise signal power spectrum and the reference resistance network noise signal power spectrum.
2. The signal measurement circuit of claim 1, wherein the reference resistance network module comprises a first resistance, a second resistance, a third resistance, and a fourth resistance;
the first resistance is configured to: the first end is connected with a power supply, and the second end is grounded through the second resistor;
the third resistance is configured to: the first end is connected with a power supply, and the second end is grounded through the fourth resistor;
wherein the reference resistor network module outputs the first reference noise signal through a second end of the first resistor;
the reference resistor network module outputs the second reference noise signal through a second end of the third resistor.
3. The signal measurement circuit of claim 2, wherein the first signal amplification module comprises:
a first differential amplifier for generating a differentially amplified reference loop noise signal from the first reference noise signal and the second reference noise signal, configured to: the positive input end is connected with the second end of the first resistor, and the negative input end is connected with the second end of the third resistor;
and the first adjustable gain amplifier is connected with the first differential amplifier and used for generating the reference loop noise signal with the preset amplification factor according to the reference loop noise signal subjected to differential amplification.
4. The signal measurement circuit of claim 3, wherein the bias test module comprises a fifth resistor, a sixth resistor, and a seventh resistor;
the fifth resistance is configured to: the first end is connected with a power supply, and the second end is grounded through the electronic device;
the sixth resistance is configured to: the first end of the resistor is connected with a power supply, and the second end of the resistor is grounded through the seventh resistor;
the bias test module outputs the noise signal to be tested through a second end of the fifth resistor;
the bias test module outputs the reference noise signal through a second end of the sixth resistor.
5. The signal measurement circuit of claim 4, wherein the second signal amplification module comprises:
a second differential amplifier for generating a differentially amplified test loop noise signal from the noise signal under test and the reference noise signal, configured to: a positive input end is connected with the second end of the fifth resistor, and a negative input end is connected with the second end of the sixth resistor;
and the second adjustable gain amplifier is connected with the second differential amplifier and is used for generating the test loop noise signal with the preset amplification factor according to the test loop noise signal subjected to differential amplification.
6. The signal measuring circuit according to claim 4 or 5, wherein the resistance of the electronic device is equal to the resistance of the first resistor, the resistance of the second resistor, the resistance of the third resistor, the resistance of the fourth resistor, the resistance of the fifth resistor, the resistance of the sixth resistor, and the resistance of the seventh resistor.
7. The signal measurement circuit of claim 5, wherein the amplification of the first differential amplifier is equal to the amplification of the second differential amplifier, and wherein the amplification of the first adjustable gain amplifier is equal to the amplification of the second adjustable gain amplifier.
8. The signal measurement circuit of claim 7, wherein the spectral reconstruction module comprises:
the first sampling unit is connected with the first adjustable gain amplifier and is used for converting the reference loop noise analog signal into a reference loop noise digital signal;
the second sampling unit is connected with the second adjustable gain amplifier and used for converting the test loop noise analog signal into a test loop noise digital signal;
and the frequency spectrum reconstruction unit is connected with the first sampling unit and the second sampling unit and is used for acquiring a power spectrum of the reference loop noise signal according to the reference loop noise digital signal, acquiring a power spectrum of the test loop noise signal according to the test loop noise digital signal and acquiring a power spectrum of the electronic device noise signal for eliminating the measurement noise signal according to the power spectrum of the reference loop noise signal, the power spectrum of the test loop noise signal and the power spectrum of the reference resistance network noise signal.
9. The signal measurement circuit of claim 8, wherein the electronics noise signal power spectrum F (ω) is calculated according to the formula:
wherein F (omega) is the power spectrum of the noise signal of the electronic device, R DUT Is the resistance value, R, of the electronic device 7 Is the resistance value of the seventh resistor, S t (ω) is the test loop noise signal power spectrum, S f (ω) is the power spectrum, S, of the reference loop noise signal f-0 And (omega) is the power spectrum of the noise signal of the reference resistance network.
10. A signal measuring device, characterized in that it comprises a signal measuring circuit according to any one of claims 1-9.
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