CN114974470A - Method for obtaining diffuse reflection material BRDF for laser spot measurement - Google Patents
Method for obtaining diffuse reflection material BRDF for laser spot measurement Download PDFInfo
- Publication number
- CN114974470A CN114974470A CN202210470299.1A CN202210470299A CN114974470A CN 114974470 A CN114974470 A CN 114974470A CN 202210470299 A CN202210470299 A CN 202210470299A CN 114974470 A CN114974470 A CN 114974470A
- Authority
- CN
- China
- Prior art keywords
- infinitesimal
- brdf
- diffuse reflection
- expression
- obtaining
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000000463 material Substances 0.000 title claims abstract description 87
- 238000005259 measurement Methods 0.000 title claims abstract description 24
- 238000000034 method Methods 0.000 title claims abstract description 21
- 230000014509 gene expression Effects 0.000 claims abstract description 31
- 238000005315 distribution function Methods 0.000 claims abstract description 24
- 238000002310 reflectometry Methods 0.000 claims description 10
- 238000002474 experimental method Methods 0.000 claims description 7
- 239000000126 substance Substances 0.000 claims description 4
- 238000005311 autocorrelation function Methods 0.000 claims description 3
- 230000002457 bidirectional effect Effects 0.000 abstract description 7
- 238000004364 calculation method Methods 0.000 abstract description 6
- 230000010287 polarization Effects 0.000 description 4
- 238000010521 absorption reaction Methods 0.000 description 3
- 238000009795 derivation Methods 0.000 description 3
- 239000011358 absorbing material Substances 0.000 description 2
- 239000002131 composite material Substances 0.000 description 2
- 239000003989 dielectric material Substances 0.000 description 2
- 238000002329 infrared spectrum Methods 0.000 description 2
- 230000003287 optical effect Effects 0.000 description 2
- 238000011160 research Methods 0.000 description 2
- 238000012795 verification Methods 0.000 description 2
- 230000002745 absorbent Effects 0.000 description 1
- 239000002250 absorbent Substances 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 238000012512 characterization method Methods 0.000 description 1
- 238000013461 design Methods 0.000 description 1
- 238000010586 diagram Methods 0.000 description 1
- 238000003384 imaging method Methods 0.000 description 1
- 238000005457 optimization Methods 0.000 description 1
Images
Classifications
-
- G—PHYSICS
- G16—INFORMATION AND COMMUNICATION TECHNOLOGY [ICT] SPECIALLY ADAPTED FOR SPECIFIC APPLICATION FIELDS
- G16C—COMPUTATIONAL CHEMISTRY; CHEMOINFORMATICS; COMPUTATIONAL MATERIALS SCIENCE
- G16C60/00—Computational materials science, i.e. ICT specially adapted for investigating the physical or chemical properties of materials or phenomena associated with their design, synthesis, processing, characterisation or utilisation
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/47—Scattering, i.e. diffuse reflection
Landscapes
- Life Sciences & Earth Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- Health & Medical Sciences (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Computing Systems (AREA)
- Theoretical Computer Science (AREA)
- Bioinformatics & Cheminformatics (AREA)
- Bioinformatics & Computational Biology (AREA)
- Investigating Or Analysing Materials By Optical Means (AREA)
Abstract
The invention particularly relates to a method for acquiring a diffuse reflection material BRDF (bidirectional reflectance distribution function) for laser spot measurement, which is used for solving the problems that the existing BRDF scattering characteristic model and calculation method under laser irradiation have larger errors, and the process of integrating the existing model is complex and the consumed time is longer. The method for obtaining the diffuse reflection material BRDF for laser spot measurement comprises the following steps of 1, obtaining a height distribution function R and a spatial coherence function rho of a random rough surface of the diffuse reflection material according to a model; step 2, deducing and obtaining a infinitesimal orientation probability distribution R according to a height distribution function W of the random rough surface of the diffuse reflection material: step 3, based on the reflection principle, calculating theta a And phi a Substituting the expression of (A) into the infinitesimal orientation probability distribution R to obtain a probability density distribution function P of the specular reflection part of the material; step 4, substituting the probability density distribution function P of the specular reflection part of the material intoDeducing an expression of the BRDF material according to the corresponding model; and 5, fitting the test data to further obtain a BRDF specific expression of the material.
Description
Technical Field
The invention relates to a technology for measuring optical characteristics of a diffuse reflection material, in particular to a method for acquiring a diffuse reflection material BRDF for laser spot measurement.
Background
In the common optical wave band, almost all surfaces in nature such as the ground, the sea, etc. can be regarded as random rough surfaces, and the scattering property thereof is a continuous research focus. Analytical calculation models and methods for accurately obtaining a BRDF (bidirectional reflectance distribution function) are very important in the fields of remote sensing, laser radar, computer imaging, virtual reality, computer vision and the like.
In the field of laser parameter measurement application, a camera is adopted to shoot laser scattering light spots on a diffuse reflection screen, and the diffuse reflection screen surface is not an ideal lambertian body in practical application, so that scattering light intensities in different directions are different, and a larger measurement error is introduced. The description of the rough surface BRDF has a plurality of models and a plurality of obtaining methods, which can be basically divided into an empirical model, a pure theoretical model and an experimental model, but the application is complex. Although the experimental data can be fitted based on existing models, the process is complex and time consuming.
Disclosure of Invention
The invention provides a method for obtaining a diffuse reflection material BRDF (bidirectional reflectance distribution function) for laser spot measurement, which is used for solving the problems that the existing BRDF scattering characteristic model and calculation method under laser irradiation have larger errors, and the process of integrating the existing model is complex and the consumed time is longer.
The BRDF analytical model is obtained by derivation based on the surface infinitesimal slope probability distribution function and the Torrance-spark model theory, and the experimental measurement and verification model is combined to obtain the BRDF characteristics of the material, so that the acquisition precision and the cost-effectiveness ratio of the BRDF characteristics of the rough surface can be greatly improved, the process complexity is reduced, and the requirements of characteristic research and structure optimization design of the structure of the complex rough diffuse reflection material are met.
In order to achieve the purpose, the technical scheme of the invention is as follows:
the method for obtaining the diffuse reflection material BRDF for measuring the laser spots is characterized by comprising the following steps of:
step 2, obtaining the micro-element orientation probability distribution R of the diffuse reflection material according to the height distribution function W of the random rough surface of the diffuse reflection material:
step 3, based on the reflection principle, calculating theta a And phi a Is expressed by (θ) a ,φ a ) Substituting the obtained solution into the infinitesimal orientation probability distribution R to obtain a probability density distribution function P of the specular reflection part of the material;
wherein, theta a Is the included angle phi between the normal of the surface infinitesimal of the diffuse reflection material and the z axis of a vertical coordinate system a Is the included angle between the normal of the surface infinitesimal and the xy plane of the vertical coordinate system;
step 4, substituting the probability density distribution function P of the specular reflection part of the material into a Torrance-spark model to obtain an expression of the BRDF;
step 5, respectively measuring the incident light intensity E through a scattered light intensity measurement experiment platform i (θ i ,φ i ) Specific value of (2) and scattered light intensity E r (θ r ,φ r ) Obtaining a specific value of the BRDF material;
substituting the specific value of the material BRDF into the expression of the material BRDF obtained in the step 4, and carrying out the average slope r of the obtained infinitesimal surface and the value rho of the scattering part of the infinitesimal surface d Performing least square fitting on the material/pi, and performing multiple iterative fitting to obtain the diffuse reflection material in the expression of the material BRDFMean slope r of surface of infinitesimal element and value rho of scattering part of surface of infinitesimal element d And the specific value of/pi, and further obtaining a BRDF specific expression of the material.
Further, in step 1, according to the Torrance-spark model, assuming that the rough surface is composed of a series of symmetrical V-shaped grooves with a size much larger than the wavelength of the incident laser, the height of any point on the rough surface is normally distributed, and the average height is selected to be z ═ 0, at this time, the expressions of the height distribution function W and the spatial coherence function ρ of the random rough surface of the diffuse reflection material are specifically as follows:
wherein the content of the first and second substances,is the height distribution mean square error, D is the transverse dimension of the diffuse reflection material;
beta represents a spatial coherence function argument;
z represents the height value of the scattering infinitesimal and is the z coordinate of a vertical coordinate system;
and x represents the transverse dimension of the scattering infinitesimal and is the x coordinate of a vertical coordinate system.
Further, in the step 2, assuming that the distribution of the surface of the infinitesimal elements is uniform and isotropic, the expression of the infinitesimal orientation probability distribution R is as follows:
wherein r is sigma/tau is the infinitesimal surface average slope;
τ is an autocorrelation length, and a value thereof is a value β when the autocorrelation function ρ (β) is ρ (0)/e, and represents a lateral scale value of a V-groove infinitesimal.
Further, in step 3, θ a And phi a The expression of (c) is as follows:
the expression of the probability density distribution function P of the specular reflection part of the material is as follows:
wherein, theta i Is the angle between the incident ray and the z-axis of the vertical coordinate system i Is the angle between the incident ray and the xy-plane of the vertical coordinate system, theta r Is the angle between the reflected ray and the z-axis of the vertical coordinate system, phi r Is the angle between the incident ray and the xy plane of the vertical coordinate system.
Further, in step 4, it is assumed that the incident light is unpolarized, and the incident light is not polarizedReflected lightAnd the surface normal of the infinitesimal elementOn the same plane, obtaining the material BRDF expression f by the following formula r (θ i ,φ i ,θ r ,φ r The following were used:
wherein, GAF is a geometric occlusion factor of a infinitesimal element;
R s is the material surface reflectivity;
n + ik is the complex refractive index of the material surface; theta i ' is the local angle of incidence of the infinitesimal;
ρ d the/pi is a material infinitesimal surface scattering part expression;
and r is the average slope of the surface of the material element.
Further, in the step 5, according to the scattered light intensity E r (θ r ,φ r ) Specific value of (2) and incident light intensity E i (θ i ,φ i ) The following relationship between specific values of (A) to (B) yields f r (θ i ,φ i ,θ r ,φ r ) Specific values of (a):
wherein L is the distance from the measurement point to the infinitesimal;
L r is the scattered irradiance per unit area. Compared with the prior art, the invention has the following beneficial effects:
1. the invention realizes the accurate acquisition of the BRDF, the theoretical derivation is based on the probability distribution function of the surface infinitesimal slope and the Torrance-spark model, the factors such as the light source characteristic, the material specular reflection, the scattering, the absorption and the shielding are comprehensively considered, and the fitting verification is carried out by combining a large amount of experimental data, thereby realizing the acquisition of the BRDF with high fidelity.
2. The BRDF can be applied to transparent medium materials, absorption materials and multilayer transparent/absorption composite materials only by changing the reflectivity expression.
3. The BRDF is theoretically derived based on unpolarized light, and can be suitable for different polarization states by changing the reflectivity expressions of different polarization states.
4. The BRDF can be applied to the range from ultraviolet to infrared spectra only by changing the reflectivity.
5. According to the invention, the BRDF characteristic experiment data of the diffuse reflection material is fitted by adopting a least square method, and corresponding parameters are obtained through multiple iterations, so that the accuracy is high, and the application range is wide.
Drawings
FIG. 1 is a schematic diagram of the geometrical relationship of the bidirectional reflectance function BRDF of the diffuse reflection material of the present invention when laser is incident;
FIG. 2 is a graph comparing BRDF characterization and fit results at set angles for a typical absorbent material of the present invention;
fig. 3 is a graph comparing BRDF characteristics measurements and fitting results of typical transparent dielectric materials of the present invention at a set angle.
Detailed Description
The invention is further described with reference to the accompanying drawings and the detailed description.
A method for obtaining diffuse reflection material BRDF for laser spot measurement, the bidirectional reflection function BRDF describes the distribution of the reflection light intensity of the rough surface under different incidence and reflection angles.
Light is scattered as shown in FIG. 1, assuming that the light is incident on a normal lineIs reflected and incident light is reflectedIs (theta) i ,φ i ) Reflected light rayIs (theta) r ,φ r ) Surface infinitesimal elementIs (theta) a ,φ a ). Wherein, theta i Is the angle between the incident ray and the z-axis of the vertical coordinate system, phi i Is the angle between the incident ray and the xy plane of the vertical coordinate system, theta r Is the angle between the reflected ray and the z-axis of the vertical coordinate system, phi r Is the angle between the incident ray and the xy-plane of the vertical coordinate system, theta a Is the angle between the normal of the surface infinitesimal and the z-axis of the vertical coordinate system, phi a Is the angle between the normal of the surface infinitesimal and the xy plane of the vertical coordinate system, the BRDF can be defined as
Φ i and phi r The incident laser power and the outgoing laser power are respectively on the area dA.
The calculation steps of the bidirectional reflection function BRDF when laser is incident on the surface of the diffuse reflection material are as follows:
wherein the content of the first and second substances,is the height distribution mean square error, and D is the transverse dimension of the diffuse reflection material;
z represents the height value of the scattering infinitesimal and is the z coordinate of a vertical coordinate system;
and x represents the transverse dimension of the scattering infinitesimal and is the x coordinate of a vertical coordinate system.
Step 2, assuming uniform and isotropic distribution of the surface of the infinitesimal, deducing a formula 1 to obtain the infinitesimal orientation probability distribution R:
where r ═ σ/τ is the mean slope of the surface of the infinitesimal, and the autocorrelation length τ is the value β when the autocorrelation function ρ (β) ═ ρ (0)/e, and represents the transverse scale value of the V-groove infinitesimal.
Step 3, based on the reflection principle, obtaining theta according to calculation a And phi a Expression of (a), the local infinitesimal angle (θ) a ,φ a ) Substituting into formula 3 and obtaining the probability density distribution function P of the specular reflection part of the material:
and 4, substituting the formula 4 into a Torrance-spark model, assuming that the incident light is unpolarized and the incident light is not polarizedReflected lightAnd the surface normal of the infinitesimal elementIn the same plane, the BRDF distribution of the material is obtained by theoretical derivation:
wherein the content of the first and second substances,
is the geometric occlusion factor of the infinitesimal;
is the material surface reflectivity;
n + ik is the complex refractive index of the material surface;
ρ d the/pi is a material infinitesimal surface scattering part expression;
and r is the average slope of the surface of the material element.
Step 5, fitting experiment
Establishing a scattered light intensity measurement experiment platform for respectively measuring incident light intensity E i (θ i ,φ i ) And intensity of scattered light E r (θ r ,φ r ) Relation, and calculating according to equation 6 to obtain f r (θ i ,φ i ,θ r ,φ r )
Where L is the distance of the measurement point from the infinitesimal dA.
In the experiment, the laser source irradiates the surface of the diffuse reflection material at different incidence angles, the scattering measurement system is utilized to obtain the intensity data of the scattering light in different angle directions, and the incident light and the measuring scattering light are in the same plane and perpendicular to the sample in the experiment.
F is obtained from equation 6 r (θ i ,φ i ,θ r ,φ r ) Based on the formula 5, least square fitting is carried out on the measurement result, and the average slope r of the material infinitesimal surface and the numerical value rho of the scattering part of the infinitesimal surface are obtained through multiple iterative fitting d Phi, and further obtaining BRDF characteristic parameter f of the material r (θ i ,φ i ,θ r ,φ r )。
Fig. 2 and fig. 3 show the BRDF characteristic theory and experimental results of typical absorbing materials and transparent dielectric materials under a set angle, and verify that the data obtained by the reflection function has a good fit with the experimental results.
In the diffuse reflection material BRDF for laser spot measurement, the reflectivity expression corresponding to the material is replaced, the BRDF can also be suitable for the calculation of the corresponding material, for example, the reflectivity expression is changed into a transparent medium material, and the BRDF is a bidirectional reflection distribution function of the transparent medium material. Similarly, the absorbing material and the multi-layer transparent/absorbing composite material can be directly replaced for use.
The diffuse reflection material BRDF for measuring the laser spots can be suitable for the ultraviolet to infrared spectrum range or the situations of different polarization states only by changing the reflectivity expression or the reflectivity expressions of the situations of different polarization states.
Claims (6)
1. The method for obtaining the diffuse reflection material BRDF for measuring the laser spots is characterized by comprising the following steps of:
step 1, obtaining a height distribution function W and a spatial coherence function rho of a random rough surface of a diffuse reflection material according to a Torrance-spark model;
step 2, obtaining the infinitesimal orientation probability distribution R of the diffuse reflection material according to the height distribution function W of the random rough surface of the diffuse reflection material:
step 3, based on the reflection principle, calculating theta a And phi a Is expressed by (θ) a ,φ a ) Substituting the obtained solution into the infinitesimal orientation probability distribution R to obtain a probability density distribution function P of the specular reflection part of the material;
wherein, theta a Is the included angle phi between the normal of the surface infinitesimal of the diffuse reflection material and the z axis of a vertical coordinate system a Is the included angle between the normal of the surface infinitesimal and the xy plane of the vertical coordinate system;
step 4, substituting the probability density distribution function P of the specular reflection part of the material into a Torrance-spark model to obtain an expression of the BRDF;
step 5, respectively measuring the incident light intensity E through a scattered light intensity measurement experiment platform i (θ i ,φ i ) Specific value of (2) and scattered light intensity E r (θ r ,φ r ) Obtaining a specific value of the BRDF material;
substituting the specific value of the material BRDF into the expression of the material BRDF obtained in the step 4, and carrying out the average slope r of the obtained infinitesimal surface and the value rho of the scattering part of the infinitesimal surface d Performing least square fitting on the/pi, and performing multiple iterative fitting to obtain the average slope r of the surface of the diffuse reflection material infinitesimal element and the value rho of the scattering part of the surface of the infinitesimal element in the expression of the material BRDF d And the specific value of/pi, and further obtaining a BRDF specific expression of the material.
2. The method according to claim 1, wherein in step 1, according to a torance-spark model, it is assumed that the rough surface is composed of a series of symmetrical V-shaped grooves whose dimensions are much larger than the wavelength of the incident laser, the height of any point on the rough surface is normally distributed, and the average height is selected to be z-0, and at this time, the expressions of the height distribution function W and the spatial coherence function ρ of the random rough surface of the diffuse reflection material are specifically as follows:
wherein the content of the first and second substances,is the height distribution mean square error, D is the transverse dimension of the diffuse reflection material;
beta represents a spatial coherence function argument;
z represents the height value of the scattering infinitesimal and is the z coordinate of a vertical coordinate system;
and x represents the transverse dimension of the scattering infinitesimal and is the x coordinate of a vertical coordinate system.
3. The method for acquiring the diffuse reflection material BRDF for laser spot measurement according to claim 1 or 2, wherein in the step 2, assuming that a surface distribution of the infinitesimal elements is uniform and isotropic, an expression of the infinitesimal element orientation probability distribution R is as follows:
wherein, r ═ σ/τ is the infinitesimal surface average slope;
τ is an autocorrelation length, and a value thereof is a value β when the autocorrelation function ρ (β) is ρ (0)/e, and represents a lateral scale value of a V-groove infinitesimal.
4. The diffuse reflection for laser spot measurement according to claim 3The method for obtaining the BRDF material is characterized in that in the step 3, the theta is a And phi a The expression of (a) is as follows:
the expression of the probability density distribution function P of the specular reflection part of the material is as follows:
wherein, theta i Is the angle between the incident ray and the z-axis of the vertical coordinate system i Is the angle between the incident ray and the xy-plane of the vertical coordinate system, theta r Is the angle between the reflected ray and the z-axis of the vertical coordinate system, phi r Is the angle between the incident ray and the xy plane of the vertical coordinate system.
5. The method for acquiring the diffuse reflection material BRDF for laser spot measurement according to claim 4, wherein in step 4, the incident light is assumed to be unpolarized, and the incident light is assumed to be unpolarizedReflected lightAnd infinitesimal surface normalsOn the same plane, obtaining the material BRDF expression f by the following formula r (θ i ,φ i ,θ r ,φ r ) The following were used:
wherein, GAF is a geometrical shielding factor of a infinitesimal element;
R s is the material surface reflectivity;
n + ik is the complex refractive index of the material surface; theta' i Is a local angle of incidence of the infinitesimal;
ρ d the/pi is a material infinitesimal surface scattering part expression;
and r is the average slope of the surface of the material element.
6. The method for acquiring the diffuse reflection material BRDF for laser spot measurement according to claim 5, wherein in step 5, the intensity E of the scattered light is determined according to the intensity of the scattered light r (θ r ,φ r ) Specific value of (2) and incident light intensity E i (θ i ,φ i ) The following relationship between specific values of (a) to (b) yields f r (θ i ,φ i ,θ r ,φ r ) Specific values of (a):
wherein L is the distance from the measurement point to the infinitesimal;
L r is a unit surfaceThe product scatter irradiance.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202210470299.1A CN114974470A (en) | 2022-04-28 | 2022-04-28 | Method for obtaining diffuse reflection material BRDF for laser spot measurement |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
CN202210470299.1A CN114974470A (en) | 2022-04-28 | 2022-04-28 | Method for obtaining diffuse reflection material BRDF for laser spot measurement |
Publications (1)
Publication Number | Publication Date |
---|---|
CN114974470A true CN114974470A (en) | 2022-08-30 |
Family
ID=82978700
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
CN202210470299.1A Pending CN114974470A (en) | 2022-04-28 | 2022-04-28 | Method for obtaining diffuse reflection material BRDF for laser spot measurement |
Country Status (1)
Country | Link |
---|---|
CN (1) | CN114974470A (en) |
Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101901302A (en) * | 2010-07-16 | 2010-12-01 | 中国人民解放军信息工程大学 | Light scattering modeling method for complex spatial object |
EP2505987A1 (en) * | 2011-03-30 | 2012-10-03 | C.R.F. Società Consortile per Azioni | Method for determining the bidirectional reflectance distribution function (BRDF) of a surface |
WO2017063236A1 (en) * | 2015-10-15 | 2017-04-20 | 温州医科大学 | Method of acquiring tissue optical parameters over wide field and performing light reflectance imaging of microstructure |
CN106770045A (en) * | 2016-11-28 | 2017-05-31 | 北京理工大学 | The simple calculating method of target laser scattering properties under a kind of local irradiation |
CN108226051A (en) * | 2018-01-15 | 2018-06-29 | 西京学院 | A kind of light polarization reflection characteristic simulator and its application method |
CN109298407A (en) * | 2018-11-21 | 2019-02-01 | 北京理工大学 | A kind of non-uniform beam of light irradiates the calculation method of lower target laser scattering properties |
-
2022
- 2022-04-28 CN CN202210470299.1A patent/CN114974470A/en active Pending
Patent Citations (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN101901302A (en) * | 2010-07-16 | 2010-12-01 | 中国人民解放军信息工程大学 | Light scattering modeling method for complex spatial object |
EP2505987A1 (en) * | 2011-03-30 | 2012-10-03 | C.R.F. Società Consortile per Azioni | Method for determining the bidirectional reflectance distribution function (BRDF) of a surface |
WO2017063236A1 (en) * | 2015-10-15 | 2017-04-20 | 温州医科大学 | Method of acquiring tissue optical parameters over wide field and performing light reflectance imaging of microstructure |
CN106770045A (en) * | 2016-11-28 | 2017-05-31 | 北京理工大学 | The simple calculating method of target laser scattering properties under a kind of local irradiation |
CN108226051A (en) * | 2018-01-15 | 2018-06-29 | 西京学院 | A kind of light polarization reflection characteristic simulator and its application method |
CN109298407A (en) * | 2018-11-21 | 2019-02-01 | 北京理工大学 | A kind of non-uniform beam of light irradiates the calculation method of lower target laser scattering properties |
Non-Patent Citations (2)
Title |
---|
朱达荣;冯康康;汪方斌;刘涛;孙凡;王雪;: "粗糙表面六参量偏振双向反射分布函数模型", 激光与光电子学进展, no. 09 * |
李红松;: "弱散射体的宽谱BRDF测量与分析", 北京理工大学学报, no. 04, 15 April 2010 (2010-04-15) * |
Similar Documents
Publication | Publication Date | Title |
---|---|---|
Frisvad et al. | Directional dipole model for subsurface scattering | |
WO2021088376A1 (en) | Method and system for measuring refractive index of particle by using polarization difference of scattered light | |
CN101140222A (en) | Spectrometer system and method for measuring whole optical parameter including turbidity dielectric materials | |
CN109932341B (en) | Bidirectional reflection distribution function measuring method of typical target in field environment | |
JP2009229239A (en) | Particle size measuring device and method | |
Labunets et al. | Regularized parametric model of the angular distribution of the brightness factor of a rough surface | |
CN105092444B (en) | The measuring method of concentrations of nanoparticles and geometric feature Joint Distribution | |
Fu et al. | Analysis of target surface polarization characteristics and inversion of complex refractive index based on three-component model optimization | |
CN114216559A (en) | Partial aperture factor measuring method and device of on-satellite calibration mechanism | |
CN107561008A (en) | A kind of device for VUV diffusing reflection plate BRDF feature measurements | |
Butler et al. | Experimental measurement and analysis of wavelength-dependent properties of the BRDF | |
CN114974470A (en) | Method for obtaining diffuse reflection material BRDF for laser spot measurement | |
CN114660037B (en) | Oil film measuring device and method based on differential Raman composite fluorescence spectrum | |
Li et al. | Polarization characteristics motivating target detection in different polarization spaces | |
Gautam et al. | A wide range (0.32°–177.6°), multi-angle light scattering setup and concomitant analysis method | |
CN108872152B (en) | Particle refractive index measuring method, computer device and computer readable storage medium | |
Wang et al. | Effects of diffuse and specular reflections on detecting embedded defects of foams with a bifocal active imaging system at 0.22 THz | |
Egan et al. | Coherence-polarization phenomena in remote sensing | |
Makarenko et al. | Ellipsometric diagnostics of a transient surface layer in optical glass | |
CN111912785B (en) | Optical constant measuring method and optical constant measuring equipment | |
Stover et al. | Estimating hemispherical scatter from incident plane measurements of isotropic samples | |
Lu et al. | Establishment and verification of diffraction BRDF model for scratched material surface | |
Ceolato et al. | Probing optical properties of nanomaterials | |
Stover | Scatter from optical components: An overview | |
Sokolov et al. | Comparison of BSDF reconstruction methods for rough surfaces |
Legal Events
Date | Code | Title | Description |
---|---|---|---|
PB01 | Publication | ||
PB01 | Publication | ||
SE01 | Entry into force of request for substantive examination | ||
SE01 | Entry into force of request for substantive examination |