CN114944127A - Display panel alignment method, display panel gamma debugging method and device - Google Patents

Display panel alignment method, display panel gamma debugging method and device Download PDF

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Publication number
CN114944127A
CN114944127A CN202210757406.9A CN202210757406A CN114944127A CN 114944127 A CN114944127 A CN 114944127A CN 202210757406 A CN202210757406 A CN 202210757406A CN 114944127 A CN114944127 A CN 114944127A
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probe
brightness value
value corresponding
coordinate
display panel
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陈�峰
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Kunshan Govisionox Optoelectronics Co Ltd
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Kunshan Govisionox Optoelectronics Co Ltd
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Priority to CN202210757406.9A priority Critical patent/CN114944127A/en
Publication of CN114944127A publication Critical patent/CN114944127A/en
Priority to PCT/CN2022/122861 priority patent/WO2024000898A1/en
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    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01MTESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR
    • G01M11/00Testing of optical apparatus; Testing structures by optical methods not otherwise provided for
    • G01M11/02Testing optical properties
    • G01M11/0242Testing optical properties by measuring geometrical properties or aberrations
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G2320/00Control of display operating conditions
    • G09G2320/06Adjustment of display parameters
    • G09G2320/0673Adjustment of display parameters for control of gamma adjustment, e.g. selecting another gamma curve

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  • Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Theoretical Computer Science (AREA)
  • Geometry (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Liquid Crystal (AREA)
  • Testing, Inspecting, Measuring Of Stereoscopic Televisions And Televisions (AREA)

Abstract

The embodiment of the application provides a contraposition method of a display panel, a gamma debugging method and a gamma debugging device of the display panel, wherein a preset area of the display panel is controlled to display a contraposition pattern matched with the size of a probe, and the brightness value of the contraposition pattern is smaller than that of other areas around the preset area; controlling the probe to move along a first direction from an initial position, and acquiring a plurality of first brightness values at different positions on a first moving path along the first direction to obtain a first coordinate corresponding to a minimum first brightness value on the first moving path; controlling the probe to move along a second direction, and acquiring a plurality of second brightness values at different positions on a second moving path along the second direction to obtain a second coordinate corresponding to the minimum second brightness value on the second moving path; and determining the alignment position according to the first coordinate and the second coordinate. The embodiment of the application is favorable for realizing accurate alignment and automatic alignment of the center of the probe and the center of the alignment pattern.

Description

Display panel alignment method, display panel gamma debugging method and device
Technical Field
The application belongs to the technical field of display, and particularly relates to a display panel alignment method, a display panel gamma debugging method and a display panel gamma debugging device.
Background
With the rapid development of electronic devices, the requirements of users on screen occupation ratio are higher and higher. In order to improve the screen occupation ratio, the design of a camera under a screen is currently available, in which a display area of a display panel is divided into a secondary screen area and a main screen area, and photosensitive elements such as the camera are correspondingly arranged in the secondary screen area.
In order to ensure that the brightness of the secondary screen area is consistent with that of the primary screen area, gamma adjustment may be performed on the secondary screen area and the primary screen area, respectively. And whether the result of gamma debugging (especially gamma debugging to the auxiliary screen district) is accurate, the main factor is whether the counterpoint of the probe of optical measurement equipment and auxiliary screen district or main screen district is accurate. However, at present, there is a problem that the alignment between the probe of the optical measurement device and the display panel is not accurate.
Disclosure of Invention
The embodiment of the application provides a display panel alignment method, a display panel gamma debugging method and a display panel gamma debugging device, and can solve the problem that a probe of an optical measurement device is not accurately aligned with a display panel.
In a first aspect, an embodiment of the present application provides a method for aligning a display panel, where the method for aligning the display panel includes: controlling a set area of a display panel to display an alignment pattern matched with the size of the probe, wherein the brightness value of the alignment pattern is smaller than that of other areas around the set area; controlling the probe to move along a first direction from an initial position, and acquiring a plurality of first brightness values at different positions on a first moving path along the first direction to obtain a first coordinate corresponding to a minimum first brightness value on the first moving path; controlling the probe to move along a second direction, and acquiring a plurality of second brightness values at different positions on a second moving path along the second direction to obtain a second coordinate corresponding to the minimum second brightness value on the second moving path, wherein the second direction is crossed with the first direction; and determining the alignment position according to the first coordinate and the second coordinate.
According to an embodiment of the first aspect of the present application, acquiring a plurality of first luminance values at different positions on a first moving path along a first direction to obtain a first coordinate corresponding to a minimum first luminance value on the first moving path may specifically include: judging whether a first brightness value corresponding to the ith position on the first moving path is larger than a first brightness value corresponding to the (i-1) th position on the first moving path, wherein the (i-1) th position is a previous position of the ith position, and i is a positive integer; when the first brightness value corresponding to the ith position is larger than the first brightness value corresponding to the (i-1) th position, determining the coordinate of the (i-1) th position as a first coordinate; acquiring a plurality of second luminance values at different positions on a second moving path along a second direction to obtain a second coordinate corresponding to a minimum second luminance value on the second moving path, which may specifically include: judging whether a second brightness value corresponding to a jth position on a second moving path is larger than a second brightness value corresponding to a jth position on the second moving path, wherein the jth-1 position is a previous position of the jth position, and j is a positive integer; and when the second brightness value corresponding to the j-th position is larger than the second brightness value corresponding to the j-1-th position, determining the coordinate of the j-1-th position as a second coordinate.
Since the overlapping area of the probe and the alignment pattern is larger as the center of the probe is closer to the center of the alignment pattern, the brightness value acquired by the probe at a position closer to the center of the alignment pattern is smaller. Therefore, when the brightness value of the current position acquired by the probe is greater than the brightness value of the previous position, it indicates that the center of the probe is shifted to be away from the center of the alignment pattern, i.e., the previous position of the current position is closest to (e.g., coincides with) the center of the alignment pattern. Therefore, the center coordinates of the alignment patterns can be accurately determined based on the inflection points with the brightness values acquired by the probe changing from small to large.
According to any one of the foregoing embodiments of the first aspect of the present application, before determining the coordinates of the i-1 th position as the first coordinates, the method for aligning a display panel may further include: under the condition that a first brightness value corresponding to the ith position is larger than a first brightness value corresponding to the (i-1) th position, judging whether first brightness values corresponding to the (i + 1) th position to the (i + n) th position on a first moving path are all larger than the first brightness value corresponding to the (i-1) th position on the first moving path, wherein the (i + 1) th position is a position behind the ith position, the (i + n) th position is a position n behind the ith position, and n is a positive integer; determining the coordinates of the i-1 th position as first coordinates may specifically include: and when the first brightness values corresponding to the (i + 1) th position to the (i + n) th position are all larger than the first brightness value corresponding to the (i-1) th position, determining the coordinate of the (i-1) th position as a first coordinate.
Therefore, when the first brightness value corresponding to the ith position is larger than the first brightness value corresponding to the (i-1) th position, the accuracy of the determined first coordinate can be improved through the verification of the first brightness values corresponding to the (i + 1) th position to the (i + n) th position, so that the accuracy of the finally determined center coordinate of the alignment pattern is improved, and the misjudgment is effectively avoided.
According to any one of the foregoing embodiments of the first aspect of the present application, before controlling the probe to move in the second direction, the method for aligning the display panel may further include: controlling the probe to return to the (i-1) th position; after obtaining the second coordinate corresponding to the minimum second brightness value on the second moving path, the method for aligning the display panel may further include: the probe is controlled to return to the j-1 th position.
Therefore, the first coordinate and the second coordinate are determined on one side, and the probe is subjected to step-by-step alignment on the other side, so that the alignment time of the probe can be shortened, and the rate of the alignment process is improved.
According to any one of the embodiments of the first aspect of the present application, the method for aligning a display panel may further include: controlling the probe to move reversely along the first direction, and acquiring a plurality of third brightness values at different positions on a first reverse moving path, wherein the first reverse moving path is a path moving reversely along the first direction; judging whether a third brightness value corresponding to a p-th position on the first reverse moving path is larger than a third brightness value corresponding to a p-1-th position on the first reverse moving path, wherein the p-1-th position is a previous position of the p-th position, and p is a positive integer; when the third brightness value corresponding to the p-th position is larger than the third brightness value corresponding to the p-1-th position, judging whether the p-1-th position is the same as the i-1-th position; when the first brightness value corresponding to the ith position is greater than the first brightness value corresponding to the i-1 st position, determining the coordinate of the i-1 st position as a first coordinate, specifically including: determining the coordinates of the (i-1) th position as first coordinates under the condition that the (p-1) th position is the same as the (i-1) th position; and under the condition that the p-1 th position is different from the i-1 th position, determining the average value of the coordinates of the p-1 st position and the coordinates of the i-1 st position as a first coordinate.
Therefore, the p-1 position is obtained by controlling the probe to reversely move along the first direction, and the i-1 position is calibrated and verified by utilizing the p-1 position, so that the accuracy of the determined first coordinate can be improved, the accuracy of the finally determined center coordinate of the alignment pattern is improved, and the misjudgment is effectively avoided.
According to any one of the preceding embodiments of the first aspect of the present application, controlling the probe to move in the first direction from the starting position specifically includes: judging the magnitude relation between a first brightness value corresponding to the x-th position on the first moving path and a first brightness value corresponding to the x-1-th position on the first moving path, wherein the x-1-th position is the previous position of the x-th position, and x is a positive integer; when the first brightness value corresponding to the x-th position is equal to the first brightness value corresponding to the x-1 th position, controlling the probe to move along the first direction at a first step value and/or a first moving speed until the first brightness value corresponding to the x-th position is smaller than the first brightness value corresponding to the x-1 th position; when the first brightness value corresponding to the x-th position is smaller than the first brightness value corresponding to the x-1-th position, controlling the probe to move along the first direction at a second stepping value and/or a second moving speed until a first coordinate corresponding to the minimum first brightness value on the first moving path is obtained; the first step value is larger than the second step value, and the first moving speed is larger than the second moving speed.
When the first brightness value corresponding to the x-th position is equal to the first brightness value corresponding to the x-1-th position, it indicates that the probe is not overlapped with the alignment pattern, i.e. the probe is further away from the center of the alignment pattern. When the first brightness value corresponding to the x-th position is smaller than the first brightness value corresponding to the x-1-th position, the probe is indicated to start to overlap the alignment pattern, namely the probe is close to the center of the alignment pattern. Therefore, on one hand, when the probe is far away from the center of the alignment pattern, the probe is controlled to move at a larger first stepping value and/or a first moving speed, so that the alignment speed can be increased, and the alignment time can be shortened; on the other hand, when the probe is closer to the center of the alignment pattern, the probe is controlled to move at a smaller second step value and/or second moving speed, so that the alignment accuracy can be improved, and the center of the alignment pattern can be accurately found.
According to any one of the embodiments of the first aspect of the present application, the display panel includes a first display region and a second display region, and the light transmittance of the second display region is greater than the light transmittance of the first display region; when the size of the probe is larger than that of the second display area, taking the center of the second display area as the center of the alignment pattern, and displaying the alignment pattern based on the second display area and a part of the first display area close to the second display area; and when the size of the probe is smaller than or equal to the size of the second display area, the center of the second display area is used as the center of the alignment pattern, and the alignment pattern is displayed based on the second display area.
In this way, the embodiments of the present application can adapt to probes of different sizes and to second display areas of different shapes/different sizes, i.e. to a variety of application scenarios.
According to any one of the previous embodiments of the first aspect of the present application, the second display region comprises a light transmissive region, the first display region comprises a transition region surrounding the light transmissive region, the transition region is provided with a driving device, and the light transmissive region is not provided with a driving device; and when the size of the probe is smaller than or equal to the size of the light-transmitting area, taking the center of the light-transmitting area as the center of the alignment pattern, and displaying the alignment pattern based on the light-transmitting area.
Therefore, the center of the probe can be aligned with the center of the light transmission area, and the brightness values acquired by the probe are all the brightness values of the light transmission area, so that the accuracy of the brightness values acquired by the probe is improved, and the accuracy of the subsequent gamma debugging result of the second display area is improved.
In a second aspect, an embodiment of the present application provides a gamma debugging method for a display panel, where the display panel includes a first display area and a second display area, and the gamma debugging method for the display panel includes: controlling the probe to move to the first display area, and carrying out gamma debugging on the first display area; based on the alignment method of the display panel provided by the first aspect, the probe is moved to an alignment position, and the alignment pattern is at least partially located in the second display area; and carrying out gamma debugging on the second display area.
In a third aspect, an embodiment of the present application provides a gamma debugging apparatus for a display panel, configured to perform the gamma debugging method for the display panel provided in the second aspect, where the gamma debugging apparatus includes: the workbench is used for bearing the display panel; a first conveying part which is positioned on at least one side of the workbench and extends along a first direction; the second conveying part extends along the second direction and is suspended above the workbench, the second conveying part is connected with the first conveying part, and the second conveying part can move relative to the first conveying part along the first direction; the clamping part is connected with the second conveying part and can move along a second direction relative to the second conveying part; the probe is fixedly arranged on the clamping part; and the controller is electrically connected with the first transmission part, the second transmission part and the probe.
According to any one of the embodiments of the third aspect of the present application, a first groove and a second groove are formed in the workbench, the first groove is used for placing the display panel, and the second groove is located on one side of the first groove along the first direction; the gamma debugging device still includes the illuminating part, and the illuminating part is located the second recess, the illuminating part is the strip and extends the setting along the second direction.
Therefore, the display panel can be positioned by arranging the first groove to place the display panel, and the alignment accuracy is ensured; the second groove is formed in one side, close to the second display area, of the first groove, and can provide enough moving space for the movement of the probe, so that the probe is prevented from colliding with the edge of the first groove during alignment; through set up the illuminating part in the second recess, can guarantee even if some of probe removes the second recess, the luminance value that the probe gathered also can appear by the change of little grow, guarantees going on smoothly of counterpointing.
According to any one of the preceding embodiments of the third aspect of the present application, the first recess communicates with the second recess.
Therefore, the first groove and the second groove can be integrally formed through the same process, so that the production process is simplified, and the production cost of the gamma debugging device of the display panel is reduced.
The alignment method of the display panel, the gamma debugging method of the display panel and the device thereof control the set area of the display panel to display the alignment pattern matched with the size of the probe, and the brightness value of the alignment pattern is smaller than that of other areas around the set area; controlling the probe to move along a first direction from an initial position, and acquiring a plurality of first brightness values at different positions on a first moving path along the first direction to obtain a first coordinate corresponding to a minimum first brightness value on the first moving path; controlling the probe to move along a second direction, and acquiring a plurality of second brightness values at different positions on a second moving path along the second direction to obtain a second coordinate corresponding to the minimum second brightness value on the second moving path, wherein the second direction is crossed with the first direction; and determining the alignment position according to the first coordinate and the second coordinate. According to the embodiment of the application, the center coordinates of the alignment patterns can be accurately determined according to the first coordinates corresponding to the minimum first brightness values on the first moving path and the second coordinates corresponding to the minimum second brightness values on the second moving path, so that accurate alignment of the probe and the alignment patterns can be realized, and the alignment accuracy is improved. In addition, in the alignment process, the automatic alignment of the probe and the alignment pattern can be realized without human intervention.
Drawings
In order to more clearly illustrate the technical solutions of the embodiments of the present application, the drawings needed to be used in the embodiments of the present application will be briefly described below, and for those skilled in the art, other drawings can be obtained according to the drawings without creative efforts.
FIG. 1 is a schematic structural diagram of a display panel;
fig. 2 is a schematic top view illustrating an alignment pattern in the alignment method of a display panel according to an embodiment of the present disclosure;
fig. 3 is another schematic top view illustrating an alignment pattern in the alignment method of a display panel according to an embodiment of the present disclosure;
fig. 4 is a schematic flowchart illustrating an alignment method of a display panel according to an embodiment of the present disclosure;
fig. 5 is an operation schematic diagram of an alignment method of a display panel according to an embodiment of the present disclosure;
fig. 6 is another operation diagram of the alignment method for a display panel according to the embodiment of the present disclosure;
fig. 7 is a schematic operation diagram of a method for aligning a display panel according to an embodiment of the present disclosure;
fig. 8 is another schematic flow chart illustrating an alignment method of a display panel according to an embodiment of the present disclosure;
fig. 9 is a schematic flowchart illustrating a method for aligning a display panel according to an embodiment of the present disclosure;
fig. 10 is a schematic flowchart illustrating a method for aligning a display panel according to an embodiment of the present disclosure;
fig. 11 is a schematic flowchart illustrating a method for aligning a display panel according to an embodiment of the present disclosure;
fig. 12 is a schematic flowchart illustrating a method for aligning a display panel according to an embodiment of the present disclosure;
fig. 13 is a schematic flowchart illustrating a method for aligning a display panel according to an embodiment of the present disclosure;
fig. 14 is a schematic operation diagram of a method for aligning a display panel according to an embodiment of the present disclosure;
fig. 15 is a schematic flowchart illustrating a method for aligning a display panel according to an embodiment of the present disclosure;
fig. 16 is a schematic operation diagram of a method for aligning a display panel according to an embodiment of the present disclosure;
fig. 17 is a schematic flowchart illustrating a method for aligning a display panel according to an embodiment of the present disclosure;
fig. 18 is a schematic operational diagram of a method for aligning a display panel according to an embodiment of the present disclosure;
fig. 19 is a schematic flowchart illustrating a method for aligning a display panel according to an embodiment of the present disclosure;
fig. 20 is a schematic top view of a display panel according to an embodiment of the present disclosure;
fig. 21 is another schematic top view of a display panel according to an embodiment of the present disclosure;
FIG. 22 is a schematic diagram illustrating an operation of a gamma debugging method for a display panel according to an embodiment of the present disclosure;
FIG. 23 is a flowchart illustrating a gamma adjustment method for a display panel according to an embodiment of the present disclosure;
FIG. 24 is a schematic diagram illustrating another operation of a gamma debugging method for a display panel according to an embodiment of the present disclosure;
FIG. 25 is a schematic structural diagram of a gamma adjustment apparatus for a display panel according to an embodiment of the present disclosure;
FIG. 26 is a schematic structural diagram of another gamma adjustment apparatus for a display panel according to an embodiment of the present disclosure;
fig. 27 shows a hardware structure diagram of an electronic device provided in an embodiment of the present application.
Detailed Description
Features of various aspects and exemplary embodiments of the present application will be described in detail below, and in order to make objects, technical solutions and advantages of the present application more apparent, the present application will be further described in detail below with reference to the accompanying drawings and specific embodiments. It should be understood that the specific embodiments described herein are intended to be illustrative only and are not intended to be limiting. It will be apparent to one skilled in the art that the present application may be practiced without some of these specific details. The following description of the embodiments is merely intended to provide a better understanding of the present application by illustrating examples thereof.
It is noted that, herein, relational terms such as first and second, and the like may be used solely to distinguish one entity or action from another entity or action without necessarily requiring or implying any actual such relationship or order between such entities or actions. Also, the terms "comprises," "comprising," or any other variation thereof, are intended to cover a non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements does not include only those elements but may include other elements not expressly listed or inherent to such process, method, article, or apparatus. Without further limitation, an element defined by the phrase "comprising … …" does not exclude the presence of other identical elements in a process, method, article, or apparatus that comprises the element.
It should be understood that the term "and/or" as used herein is merely one type of association that describes an associated object, meaning that three relationships may exist, e.g., a and/or B may mean: a exists alone, A and B exist simultaneously, and B exists alone. In addition, the character "/" herein generally indicates that the former and latter related objects are in an "or" relationship.
Before explaining the technical solutions provided by the embodiments of the present application, in order to facilitate understanding of the embodiments of the present application, the present application first specifically explains the problems existing in the prior art:
as shown in fig. 1, the display panel includes a main screen area 01 ' and a sub-screen area 02 ', and the sub-screen area 02 ' may be provided with a photosensitive element such as an off-screen camera. In order to improve the light transmittance of the sub-screen region 02 ', the pixel area and/or the pixel density of the sub-screen region 02 ' may be smaller than the pixel area and/or the pixel density of the main screen region 01 '. Therefore, since the pixel areas and/or pixel densities of the main screen area 01 'and the sub screen area 02' are different, the gamma adjustment result of the main screen area 01 'is not suitable for the sub screen area 02'.
Therefore, in order to ensure that the brightness of the sub-screen area is consistent with that of the main screen area, gamma adjustment can be performed on the sub-screen area and the main screen area respectively. And whether the result of gamma debugging (especially gamma debugging to the auxiliary screen area) is accurate or not is the main factor whether the counterpoint of the probe of the optical measurement equipment and the auxiliary screen area or the main screen area is accurate or not.
For ease of understanding, the secondary screen area is not taken as an example. The sub-screen area comprises a plurality of sub-pixels, and the driving chip (driving IC) provides driving signals for the sub-pixels at different positions in the sub-screen area through signal lines so as to drive the sub-pixels in the sub-screen area to emit light. Due to the fact that the sub-pixels at different positions in the auxiliary screen area are different in distance from the driving chip, the brightness of different positions in the auxiliary screen area is different under the influence of an IR-drop (IR-drop) on the signal line, for example, one of the near IC end and the far IC end is brighter, and the other is darker. And the brightness in the center of the auxiliary screen area can be regarded as the average value of the brightness of the near IC end in the auxiliary screen area and the brightness of the far IC end in the auxiliary screen area, so that the brightness in the center of the auxiliary screen area can reflect the average brightness of the auxiliary screen area most objectively. Therefore, when the gamma debugging is carried out on the auxiliary screen area, the center of the probe is preferably aligned with the center of the auxiliary screen area, so that the acquired brightness value can objectively reflect the average brightness of the auxiliary screen area, and the gamma debugging accuracy is improved.
However, the inventor of the present application finds that at present, there is a problem that the alignment between the probe of the optical measurement apparatus and the display panel is not accurate. For example, when gamma debugging is performed on the secondary screen area, the center of the probe cannot be accurately aligned with the center of the secondary screen area, so that the accuracy of the final gamma debugging is poor. For example, in some related technologies, a debugging person is required to manually adjust the position of the probe to perform manual alignment, which results in poor alignment accuracy between the probe and the display panel and long alignment time.
In view of the above research of the inventor, the embodiments of the present application provide a method for aligning a display panel, a method for gamma debugging of a display panel, and a device, which can solve the technical problem existing in the related art that the alignment between a probe of an optical measurement device and the display panel is not accurate.
The technical idea of the embodiment of the application is as follows: controlling a set area of a display panel to display a contraposition pattern matched with the size of the probe, wherein the brightness value of the contraposition pattern is smaller than that of other areas around the set area; controlling the probe to move along a first direction from an initial position, and acquiring a plurality of first brightness values at different positions on a first moving path along the first direction to obtain a first coordinate corresponding to a minimum first brightness value on the first moving path; controlling the probe to move along a second direction, and acquiring a plurality of second brightness values at different positions on a second moving path along the second direction to obtain a second coordinate corresponding to the minimum second brightness value on the second moving path, wherein the second direction is crossed with the first direction; and determining the alignment position according to the first coordinate and the second coordinate. Therefore, according to the first coordinate corresponding to the minimum first brightness value on the first moving path and the second coordinate corresponding to the minimum second brightness value on the second moving path, the center coordinate of the alignment pattern can be accurately determined, accurate alignment of the center of the probe and the center of the alignment pattern can be achieved, and alignment accuracy is improved.
First, a method for aligning a display panel according to an embodiment of the present invention will be described.
Fig. 2 is a schematic top view illustrating an alignment pattern in the alignment method of a display panel according to an embodiment of the present disclosure. Fig. 3 is another schematic top view illustrating an alignment pattern in the alignment method of a display panel according to an embodiment of the present disclosure. Fig. 4 is a schematic flowchart of an alignment method of a display panel according to an embodiment of the present disclosure.
As shown in fig. 4, the alignment method of the display panel provided in the embodiment of the present application may include the following steps S101 to S104.
S101, controlling a preset area of a display panel to display a contraposition pattern matched with the size of the probe, wherein the brightness value of the contraposition pattern is smaller than that of other areas around the preset area.
As shown in fig. 2, in the embodiment of the present invention, in S101, the predetermined area of the display panel 10 may be controlled to display the alignment pattern 100 adapted to the size of the probe. The size of the probe can be understood as the size of a lens (cross section or lighting surface) of the probe, and the probe is a probe of an optical measurement device (such as a color analyzer). The alignment pattern 100 is adapted to the probe size by: the size of the alignment pattern 100 displayed on the predetermined area of the display panel 10 may be identical to the size of the probe, or the size of the alignment pattern 100 displayed on the predetermined area of the display panel 10 may be identical to a part of the size of the lens of the probe. For example, taking the lens of the probe as a circle as an example, in the embodiment shown in fig. 2, the size of the alignment pattern 100 displayed on the predetermined area of the display panel 10 is completely the same as the probe size, that is, the alignment pattern 100 may be a circle having the same size as the probe. In the embodiment shown in fig. 3, the size of the alignment pattern 100 displayed in the predetermined area of the display panel 10 may be completely the same as a part of the size of the lens of the probe, that is, the alignment pattern 100 may be a part of a circle having the same size as the probe. The predetermined area may be a predetermined partial area of the display panel 10, such as a sub-screen of the display panel 10, or partial areas of the sub-screen and the main screen of the display panel 10, which is not limited in the embodiment of the present application.
It should be noted that the size of the alignment pattern 100 is the same as the probe size, and it is understood that the size of the alignment pattern 100 is the same as the probe size within an allowable error. That is, the difference between the size of the alignment pattern 100 and the size of the probe may be within an allowable error, and the size of the error may be flexibly adjusted according to the actual situation, which is not limited in this embodiment of the present application.
With reference to fig. 2 or fig. 3, the brightness value of the alignment pattern 100 is smaller than the brightness values of other areas around the predetermined area, that is, the brightness value of the alignment pattern 100 is smaller than the brightness values of other areas around the alignment pattern 100 on the display panel 10, so as to determine the center coordinates of the alignment pattern 100 according to the brightness variation. For example, in some embodiments, the alignment pattern 100 may be displayed in a predetermined area of the display panel 10, the background image 200 may be displayed in other areas of the display panel 10 except the predetermined area, and the luminance value of the alignment pattern 100 is smaller than that of the background image 200. Illustratively, for example, the background screen 200 is a white screen or other light-colored screen, and the alignment pattern 100 is a black pattern, a gray pattern or other dark-colored pattern.
S102, controlling the probe to move along a first direction from an initial position, and acquiring a plurality of first brightness values at different positions on a first moving path along the first direction to obtain a first coordinate corresponding to the minimum first brightness value on the first moving path.
Fig. 5 is an operation schematic diagram of an alignment method of a display panel according to an embodiment of the present disclosure. As shown in fig. 5, the first direction may be a column direction Y of the display panel 10, or the first direction may be a row direction X of the display panel 10, but the present embodiment is not limited thereto. Taking the first direction as the column direction Y of the display panel 10 as an example, in S101, the probe 500 may be controlled to move from the start position P in the first direction (e.g., the column direction Y), i.e., along the first moving path S1 shown in fig. 5. It is easily understood that at least a portion of the alignment pattern 100 is located on the first moving path s1, so that the probe 500 can acquire the brightness value of the alignment pattern 100 when moving along the first moving path s 1. In some specific examples, for example, the minimum distance L between the start position P and the center O of the alignment pattern 100 in the second direction (e.g., the row direction X) may be smaller than a preset first distance threshold, so that at least a part of the alignment pattern 100 can be located on the first moving path s 1. The first distance threshold may be flexibly set according to actual conditions, for example, the first distance threshold may be smaller than the radius of the alignment pattern 100. In practice, the starting position can be determined simply by the human eye.
During the movement of the probe 500 in the first direction, the probe 500 may acquire a plurality of brightness values at different positions on the first movement path s1 along the first direction, and for convenience of distinction, the brightness values acquired by the probe 500 along the first movement path s1 are referred to herein as first brightness values. Illustratively, the brightness value and the coordinate value of the center of the probe 500 are collected every time the probe 500 moves a distance on the first moving path s1, for example, to obtain a plurality of first brightness values at different positions on the first moving path s 1.
Fig. 6 is another operation diagram of the alignment method for a display panel according to the embodiment of the present application. As shown in fig. 6, assuming that the coordinates of the center O of the alignment pattern 100 are (x1, Y1), the first direction may be the column direction Y of the display panel 10. Then, when the center O ' of the probe 500 is moved in the first direction to a position where the ordinate is equal to the ordinate of the center O of the alignment pattern 100, that is, the center O ' of the probe 500 is located on the straight line where y is y1, the overlapping area of the probe 500 and the alignment pattern 100 is the largest, the brightness value acquired by the probe is the smallest, and the first coordinate (that is, the coordinate of the center O ' of the probe 500) is (x2, y 1). That is, after obtaining the first coordinate corresponding to the minimum first brightness value on the first moving path s1, at least one coordinate (e.g., the ordinate y1) of the center O of the alignment pattern 100 can be determined.
S103, controlling the probe to move along a second direction, and acquiring a plurality of second brightness values at different positions on a second moving path along the second direction to obtain a second coordinate corresponding to the minimum second brightness value on the second moving path, wherein the second direction is crossed with the first direction.
With reference to fig. 6, the second direction may be a row direction X of the display panel 10, or the first direction may also be a column direction Y of the display panel 10, which is not limited by the embodiment of the present application. Taking the first direction as the column direction Y of the display panel 10 and the second direction as the row direction X of the display panel 10 as an example, in S102, the probe 500 may be controlled to move along a straight line (i.e., the second direction) where Y1 is Y or Y1 ± Δ Y, where Y1 is the ordinate Y1 in the first coordinate, Δ Y may be flexibly adjusted according to actual situations, and Δ Y may be smaller than the radius of the alignment pattern 100.
During the movement of the probe 500 in the second direction, the probe 500 may acquire a plurality of brightness values at different positions on the second movement path s2 along the second direction, and for convenience of distinction, the brightness values acquired by the probe 500 along the second movement path s2 are referred to as second brightness values herein. Illustratively, for example, the brightness value and the coordinate value of the center of the probe 500 are collected once every time the probe 500 moves a distance on the second moving path s2, so as to obtain a plurality of second brightness values at different positions on the second moving path s 2.
Fig. 7 is a schematic operation diagram of a method for aligning a display panel according to an embodiment of the present disclosure. As shown in fig. 7, assuming that the coordinates of the center O of the alignment pattern 100 are (X1, Y1), the first direction may be the column direction Y of the display panel 10, and the second direction may be the row direction X of the display panel 10. Then, when the center O ' of the probe 500 is moved in the second direction to have the abscissa equal to the abscissa of the center O of the alignment pattern 100, that is, the center O ' of the probe 500 is located on the straight line of x — x1, the overlapping area of the probe 500 and the alignment pattern 100 is the largest, and the brightness value acquired by the probe is the smallest, and the second coordinate (that is, the coordinate of the center O ' of the probe 500) is (x1, y1) or (x1, y1 ± Δ y). That is, after obtaining the second coordinate corresponding to the minimum second brightness value on the second moving path s2, at least another coordinate (e.g., x1) of the center O of the alignment mark 100 can be determined.
And S104, determining the alignment position according to the first coordinate and the second coordinate.
Illustratively, after obtaining the first coordinate (x2, y1) and the second coordinate (x1, y1) or (x1, y1 ± Δ y), the alignment position (x1, y1) may be obtained, for example, according to the ordinate y1 in the first coordinate and the abscissa x1 in the second coordinate. Wherein, the alignment position is the center O of the alignment pattern 100.
According to the embodiment of the application, the center coordinates of the alignment patterns can be accurately determined according to the first coordinates corresponding to the minimum first brightness values on the first moving path and the second coordinates corresponding to the minimum second brightness values on the second moving path, so that accurate alignment of the probe and the alignment patterns can be realized, and the alignment accuracy is improved.
Fig. 8 is another schematic flow chart illustrating an alignment method of a display panel according to an embodiment of the present disclosure. As shown in fig. 8, according to some embodiments of the application, optionally, in S102, acquiring a plurality of first luminance values at different positions on a first moving path along the first direction to obtain a first coordinate corresponding to a minimum first luminance value on the first moving path, which may specifically include the following steps S801 and S802.
S801, judging whether a first brightness value corresponding to the ith position on the first moving path is larger than a first brightness value corresponding to the (i-1) th position on the first moving path. Wherein, the i-1 th position is a position (or referred to as a last position) before the ith position, and i is a positive integer greater than 1.
S802, when the first brightness value corresponding to the ith position is larger than the first brightness value corresponding to the ith-1 position, determining the coordinate of the ith-1 position as a first coordinate.
The ith position is an arbitrary position on the first movement path. That is, every time the center of the probe is moved to a position, the position can be set as the ith position, and the above steps S801 and S802 are performed.
As shown in fig. 6, since the overlapping area of the probe 500 and the alignment pattern 100 is larger as the center O' of the probe 500 is closer to the center O of the alignment pattern 100, the brightness value acquired by the probe 500 at the position closer to the center O of the alignment pattern 100 is smaller. Therefore, when the brightness value of the current position acquired by the probe 500 is greater than the brightness value of the previous position, it means that the center O' of the probe 500 moves from the position closest to the center O of the alignment pattern 100 to the position away from the center O of the alignment pattern 100, that is, the position previous to the current position is closest to the center O of the alignment pattern 100 (e.g., coincides with the center O of the alignment pattern 100). Therefore, based on the inflection point of the brightness value acquired by the probe from small to large, the first coordinate corresponding to the minimum first brightness value on the first moving path can be accurately determined, and further the center coordinate of the alignment pattern can be accurately determined.
Similarly, as shown in fig. 9, according to some embodiments of the present application, optionally, in S103, a plurality of second luminance values at different positions on a second moving path along the second direction are collected, and a second coordinate corresponding to a minimum second luminance value on the second moving path is obtained, which may specifically include the following steps S901 and S902.
S901, judging whether a second brightness value corresponding to the jth position on the second moving path is larger than a second brightness value corresponding to the jth-1 position on the second moving path. Wherein, the j-1 th position is a position (or referred to as a last position) before the jth position, and j is a positive integer greater than 1.
S902, when the second brightness value corresponding to the jth position is larger than the second brightness value corresponding to the jth-1 position, determining the coordinate of the jth-1 position as a second coordinate.
The jth position is an arbitrary position on the second movement path. That is, every time the center of the probe is moved to a position, the position can be regarded as the jth position described above, and the above steps S901 and S902 are performed.
As shown in fig. 7, the closer the center O' of the probe 500 is to the center O of the alignment pattern 100, the larger the overlapping area between the probe 500 and the alignment pattern 100 is, so that the brightness value acquired by the probe 500 is smaller at the position closer to the center O of the alignment pattern 100. Therefore, when the brightness value of the current position acquired by the probe 500 is greater than the brightness value of the previous position, it means that the center O' of the probe 500 moves from the position closest to the center O of the alignment pattern 100 to the position away from the center O of the alignment pattern 100, that is, the position previous to the current position is closest to the center O of the alignment pattern 100 (e.g., coincides with the center O of the alignment pattern 100). Therefore, based on the inflection point of the brightness value acquired by the probe from small to large, the second coordinate corresponding to the minimum first brightness value on the second moving path can be accurately determined, and further the center coordinate of the alignment pattern can be accurately determined by combining the first coordinate.
Fig. 10 is a schematic flowchart of another alignment method for a display panel according to an embodiment of the present disclosure. As shown in fig. 10, according to some embodiments of the present application, optionally, in S802, before determining the coordinate of the i-1 th position as the first coordinate when the first brightness value corresponding to the i-th position is greater than the first brightness value corresponding to the i-1 th position, the alignment method of the display panel may further include the following steps:
s1001, under the condition that the first brightness value corresponding to the ith position is larger than the first brightness value corresponding to the (i-1) th position, judging whether the first brightness values corresponding to the (i + 1) th position to the (i + n) th position on the first moving path are all larger than the first brightness value corresponding to the (i-1) th position on the first moving path. The (i + 1) th position is a position after the ith position, the (i + n) th position is a position n after the ith position, and n is a positive integer. Illustratively, n may be equal to 1, or greater than 1.
Accordingly, S802 may specifically include the following steps: and when the first brightness values corresponding to the (i + 1) th position to the (i + n) th position are all larger than the first brightness value corresponding to the (i-1) th position, determining the coordinate of the (i-1) th position as a first coordinate.
Therefore, under the condition that the first brightness value corresponding to the ith position is larger than the first brightness value corresponding to the (i-1) th position, the first brightness values corresponding to the (i + 1) th position to the (i + n) th position are verified, namely the first brightness value corresponding to the (i-1) th position is verified through the first brightness values of at least two continuous positions, so that the accuracy of the determined first coordinate can be improved, the accuracy of the finally determined center coordinate of the alignment pattern is improved, and the misjudgment is effectively avoided.
Similarly, according to some embodiments of the present application, optionally, in S902, before determining the coordinate of the j-1 th position as the second coordinate when the second brightness value corresponding to the j-th position is greater than the second brightness value corresponding to the j-1 th position, the alignment method of the display panel may further include the following steps:
and judging whether the second brightness values corresponding to the j +1 th position to the j + n th position on the second moving path are all larger than the second brightness value corresponding to the j-1 th position on the second moving path or not under the condition that the second brightness value corresponding to the j position is larger than the second brightness value corresponding to the j-1 th position on the second moving path. Wherein, the j +1 th position is a position after the j position, the j + n th position is a position n after the j position, and n is a positive integer. Illustratively, n may be equal to 1, or may be equal to 1.
Correspondingly, S902 may specifically include the following steps: and when the second brightness values corresponding to the j +1 th position to the j + n th position are all larger than the second brightness value corresponding to the j-1 th position, determining the coordinate of the j-1 th position as a second coordinate.
Therefore, when the second brightness value corresponding to the jth position is larger than the second brightness value corresponding to the jth-1 position, the second brightness values corresponding to the jth +1 position to the jth + n position are verified, that is, the second brightness value corresponding to the jth-1 position is verified through the second brightness values of at least two continuous positions, so that the accuracy of the determined second coordinate can be improved, the accuracy of the finally determined center coordinate of the alignment pattern is improved, and the misjudgment is effectively avoided.
Fig. 11 is a schematic flowchart of another alignment method for a display panel according to an embodiment of the present disclosure. As shown in fig. 11, according to some embodiments of the present application, optionally, after determining the alignment position according to the first coordinate and the second coordinate at S104, the alignment method of the display panel may further include the following steps: and S105, controlling the probe to move to the alignment position. And e.g. controlling the center of the probe to move to the center of the alignment pattern, thereby realizing alignment.
Fig. 12 is a schematic flowchart of another alignment method for a display panel according to an embodiment of the present disclosure. As shown in fig. 12, unlike the embodiment shown in fig. 11, according to other embodiments of the present application, the probe may alternatively perform step alignment while determining the first and second coordinates.
Specifically, after determining the coordinates of the i-1 th position as the first coordinates, before controlling the probe to move in the second direction in S103, the method for aligning the display panel may further include:
and S121, controlling the probe to return to the (i-1) th position.
As mentioned above, the position corresponding to the minimum first brightness value on the first moving path is the (i-1) th position, and the coordinate of the (i-1) th position is the first coordinate. And the probe has been moved to the i-th position, the probe can be controlled to return to the i-1-th position again, for example, such that the center O 'of the probe is located on a straight line where y is y1, i.e., such that the ordinate of the center O' of the probe coincides with the ordinate of the center O of the registration pattern 100.
Correspondingly, after obtaining the second coordinate corresponding to the minimum second brightness value on the second moving path, the method for aligning the display panel may further include the following steps:
and S122, controlling the probe to return to the j-1 th position.
As mentioned above, the position corresponding to the smallest second brightness value on the second moving path is the j-1 th position, and the coordinate of the j-1 th position is the second coordinate. And the probe has been moved to the j-th position, so that the probe can be controlled to return to the j-1-th position again. In S121, since the center O' of the probe has been moved to the line y-1, the coordinates of the j-1 th position are the coordinates (x1, y1) of the center O of the alignment pattern 100. Then, the center of the probe is moved to the j-1 th position, that is, the alignment of the center O' of the probe with the center O of the alignment pattern 100 is achieved.
Therefore, the first coordinate and the second coordinate are determined on one side, and the probe is subjected to step-by-step alignment on the other side, so that the alignment time of the probe can be shortened, and the rate of the alignment process is improved.
Fig. 13 is a schematic flowchart of another alignment method for a display panel according to an embodiment of the present disclosure. As shown in fig. 13, according to some embodiments of the present application, optionally, the alignment method for a display panel provided in the embodiments of the present application may further include the following steps S131 to S133.
S131, controlling the probe to reversely move along the first direction, and acquiring a plurality of third brightness values at different positions on a first reverse moving path, wherein the first reverse moving path is a path reversely moving along the first direction.
During the reverse movement in the first direction, the probe 500 may acquire a plurality of brightness values at different positions on the first reverse movement path s1 ', and the brightness value acquired by the probe 500 along the first reverse movement path s 1' is referred to as a third brightness value herein for convenience of distinction. Illustratively, for example, each time the probe 500 moves a distance along the first reverse movement path s1 ', a brightness value and a coordinate value of the center of the probe 500 are collected, so as to obtain a plurality of third brightness values at different positions along the first reverse movement path s 1'.
S132, judging whether a third brightness value corresponding to the p-th position on the first reverse moving path is larger than a third brightness value corresponding to the p-1-th position on the first reverse moving path. Wherein, the p-1 position is a position before the p position, and p is a positive integer greater than 1.
S133, when the third brightness value corresponding to the p-th position is larger than the third brightness value corresponding to the p-1-th position, judging whether the p-1-th position is the same as the i-1-th position.
It should be noted that the p-1 th position and the i-1 th position should be the same theoretically, but there may be a deviation between the p-1 th position and the i-1 th position in practice.
Accordingly, S802, when the first brightness value corresponding to the ith position is greater than the first brightness value corresponding to the ith-1 position, determining the coordinate of the ith-1 position as the first coordinate may specifically include the following steps S134 and S135.
S134, under the condition that the p-1 th position is the same as the i-1 th position, determining the coordinates of the i-1 th position as first coordinates.
S135, under the condition that the p-1 th position is different from the i-1 th position, determining the average value of the coordinates of the p-1 th position and the coordinates of the i-1 th position as a first coordinate.
Therefore, the p-1 position is obtained by controlling the probe to reversely move along the first direction, and the i-1 position is calibrated and verified by utilizing the p-1 position, so that the accuracy of the determined first coordinate can be improved, the accuracy of the finally determined center coordinate of the alignment pattern is improved, and the misjudgment is effectively avoided.
According to some embodiments of the present application, optionally, in S131, it may be that the first direction is reversely moved immediately when the brightness rising inflection point is found. Fig. 14 is a schematic operation diagram of a method for aligning a display panel according to an embodiment of the present application. As shown in fig. 14, taking the first direction as the column direction Y of the display panel 10 as an example, for example, when the first brightness value corresponding to the ith position is greater than the first brightness value corresponding to the (i-1) th position, the probe 500 may be controlled to move in the reverse direction along the first direction (i.e., the ith position points to the (i-1) th position, and the dotted arrow indicates the direction). That is, when a knee point of increasing luminance is found, the direction is reversed in the first direction.
Therefore, when a brightness rising inflection point is found, the brightness rising inflection point moves reversely along the first direction immediately without continuously moving along the forward direction of the first direction, so that the time used in the alignment process can be reduced, and the alignment efficiency is improved.
According to some embodiments of the present application, optionally, in S131, the probe may move reversely in the first direction when reaching the preset end point. For example, in some examples, the coordinates of the endpoint may be preset to (xm, ym), and when the probe reaches the endpoint (xm, ym), the probe is controlled to move in the first direction in the reverse direction. For example, in other examples, a first distance between the start position and the end point may be preset, and when the probe moves a first distance in the first direction from the start position, the probe is considered to reach the preset end point, and the probe is controlled to move in the reverse direction in the first direction. Therefore, the brightness values of a plurality of adjacent positions between the starting position and the end point can be compared, the accuracy of the determined alignment pattern center is ensured, and the alignment accuracy is further ensured.
Fig. 15 is a schematic flowchart of another alignment method for a display panel according to an embodiment of the present disclosure. As shown in fig. 15, according to some embodiments of the present application, optionally, the alignment method of the display panel provided in the embodiments of the present application may further include the following steps S151 to S153.
And S151, controlling the probe to reversely move along the second direction, and acquiring a plurality of fourth brightness values at different positions on a second reverse moving path, wherein the second reverse moving path is a path reversely moving along the second direction.
Similarly, in S151, for example, the direction may be reversed in the second direction immediately after the inflection point of the increase in luminance is found. For example, the probe may move in the reverse direction along the second direction when reaching the preset end point, which is not limited in the embodiment of the present application, and for a specific implementation process, reference is made to the above, which is not described herein again.
Fig. 16 is a schematic operation diagram of a method for aligning a display panel according to an embodiment of the present application. As shown in fig. 16, taking the second direction as the row direction X of the display panel 10 as an example, when the second brightness value corresponding to the jth position is greater than the second brightness value corresponding to the jth-1 position, the probe 500 can be controlled to move in the reverse direction along the second direction (i.e. the jth position points to the direction of the jth-1 position, and the dotted arrow indicates the direction).
During the reverse movement in the second direction, the probe 500 may acquire a plurality of brightness values at different positions on the second reverse movement path s2 ', and for convenience of distinction, the brightness value acquired by the probe 500 along the second reverse movement path s 2' is referred to as a fourth brightness value. Illustratively, for example, each time the probe 500 moves a distance along the second reverse movement path s2 ', the brightness value and the coordinate value of the center of the probe 500 are collected, so as to obtain a plurality of fourth brightness values at different positions along the second reverse movement path s 2'.
S152, judging whether a fourth brightness value corresponding to the q-th position on the second reverse moving path is larger than a fourth brightness value corresponding to the q-1-th position on the second reverse moving path. Wherein the q-1 position is a position before the q-th position, and q is a positive integer greater than 1.
S153, when the fourth brightness value corresponding to the q-th position is larger than the fourth brightness value corresponding to the q-1-th position, judging whether the q-1-th position is the same as the j-1-th position.
It should be noted that the q-1 th position and the j-1 th position should be the same theoretically, but there may be some deviation between the q-1 th position and the j-1 th position in practice.
Accordingly, S902, when the second brightness value corresponding to the j-th position is greater than the second brightness value corresponding to the j-1-th position, determining the coordinate of the j-1-th position as the second coordinate may specifically include the following steps S154 and S155.
S154, under the condition that the q-1 th position is the same as the j-1 th position, determining the coordinates of the j-1 th position as second coordinates.
S155, under the condition that the q-1 th position is different from the j-1 th position, determining the average value of the coordinates of the q-1 th position and the coordinates of the j-1 th position as a second coordinate.
Therefore, under the condition that the second brightness value corresponding to the jth position is larger than the second brightness value corresponding to the jth position, the probe is controlled to move reversely along the second direction to obtain a q-1 th position, and the q-1 th position is used for carrying out calibration verification on the jth-1 th position, so that the accuracy of the determined second coordinate can be improved, the accuracy of the finally determined center coordinate of the alignment pattern is improved, and misjudgment is effectively avoided.
Fig. 17 is a schematic flowchart illustrating a method for aligning a display panel according to an embodiment of the present disclosure. As shown in fig. 17, according to some embodiments of the present application, optionally, S101, controlling the probe to move from the start position along the first direction may specifically include the following steps:
s171, judging the magnitude relation between the first brightness value corresponding to the x-th position on the first moving path and the first brightness value corresponding to the x-1-th position on the first moving path. Wherein, the x-1 position is the position before the x position, and x is a positive integer.
As shown in fig. 18, when the probe 500 is not overlapped with the alignment pattern 100, the brightness values acquired by the probe 500 at different positions are almost unchanged when the probe 500 is in the region a. That is, when the first brightness value corresponding to the x-th position is equal to the first brightness value corresponding to the x-1-th position, it indicates that the probe is not overlapped with the alignment pattern, that is, the probe 500 is further away from the center of the alignment pattern 100. When the probe 500 starts to overlap the alignment pattern 100, the brightness value acquired by the probe 500 is reduced. That is, when the first brightness value corresponding to the x-th position is smaller than the first brightness value corresponding to the x-1 th position, it is indicated that the probe 500 starts to overlap the alignment pattern 100, i.e., the probe is already close to the center of the alignment pattern.
And S172, when the first brightness value corresponding to the x-th position is equal to the first brightness value corresponding to the x-1-th position, controlling the probe to move along the first direction at the first step value and/or the first moving speed until the first brightness value corresponding to the x-th position is smaller than the first brightness value corresponding to the x-1-th position.
And S173, when the first brightness value corresponding to the x-th position is smaller than the first brightness value corresponding to the x-1-th position, controlling the probe to move along the first direction at the second step value and/or the second moving speed until the first coordinate corresponding to the minimum first brightness value on the first moving path is obtained.
The first step value is larger than the second step value, and the first moving speed is larger than the second moving speed.
Therefore, on one hand, when the probe is far away from the center of the alignment pattern, the probe is controlled to move at a larger first step value and/or a first moving speed, so that the alignment speed can be increased, and the alignment time can be shortened; on the other hand, when the probe is closer to the center of the alignment pattern, the probe is controlled to move at a smaller second step value and/or second moving speed, so that the alignment accuracy can be improved, and the center of the alignment pattern can be accurately found.
In some specific examples, optionally, the second step value may decrease with increasing time, and/or the second movement speed may decrease with increasing time. That is, the closer the center of the probe is to the center of the alignment pattern, the smaller the step value for controlling the movement of the probe and/or the slower the movement speed of the probe.
Therefore, the closer the center of the probe is to the center of the alignment pattern, the smaller the step value for controlling the movement of the probe and/or the slower the movement speed of the probe, so that the accuracy of finding the center of the alignment pattern can be further improved, and the center of the probe can be effectively prevented from jumping over/crossing over the center of the alignment pattern due to the larger step value or the too fast movement speed.
It should be noted that in other examples of the present application, the second step value may also be kept constant with the increase of time, and/or the second moving speed may also be kept constant with the increase of time.
Fig. 19 is a schematic flowchart of another alignment method for a display panel according to an embodiment of the present disclosure. As shown in fig. 19, similar to the embodiment shown in fig. 17, according to some embodiments of the present application, optionally, S102, controlling the probe to move in the second direction according to the first coordinate may specifically include the following steps S191 to S193.
S191, judging the magnitude relation between a second brightness value corresponding to the y-th position on the second moving path and a second brightness value corresponding to the y-1-th position on the second moving path. Wherein the y-1 position is a position before the y position, and y is a positive integer.
And S192, when the second brightness value corresponding to the y position is equal to the second brightness value corresponding to the y-1 position, controlling the probe to move along the second direction at a third step value and/or a third moving speed until the second brightness value corresponding to the y position is smaller than the second brightness value corresponding to the y-1 position.
And S193, when the second brightness value corresponding to the y-th position is smaller than the second brightness value corresponding to the y-1-th position, controlling the probe to move along the second direction at a fourth step value and/or a fourth moving speed until a second coordinate corresponding to the minimum second brightness value on the second moving path is obtained.
And the third stepping value is greater than the fourth stepping value, and the third moving speed is greater than the fourth moving speed.
Therefore, on one hand, when the probe is far away from the center of the alignment pattern, the probe is controlled to move at a larger third step value and/or a third moving speed, so that the alignment speed can be increased, and the alignment time can be shortened; on the other hand, when the probe is closer to the center of the alignment pattern, the probe is controlled to move at a smaller fourth step value and/or fourth moving speed, so that the alignment accuracy can be improved, and the center of the alignment pattern can be accurately found.
In some specific examples, optionally, the fourth step value may decrease with increasing time, and/or the fourth movement speed may decrease with increasing time. That is, the closer the center of the probe is to the center of the alignment pattern, the smaller the step value for controlling the movement of the probe and/or the slower the movement speed of the probe.
Therefore, the closer the center of the probe is to the center of the alignment pattern, the smaller the step value for controlling the movement of the probe and/or the slower the movement speed of the probe, so that the accuracy of finding the center of the alignment pattern can be further improved, and the center of the probe can be effectively prevented from jumping over/crossing over the center of the alignment pattern due to the larger step value or the too fast movement speed.
It should be noted that in other examples of the present application, the fourth step value may also be kept constant with the increase of time, and/or the fourth moving speed may also be kept constant with the increase of time.
Fig. 20 is a schematic top view of a display panel according to an embodiment of the present disclosure. As shown in fig. 20, according to some embodiments of the present application, the display panel 10 may optionally include a first display region a1 and a second display region a2, and the light transmittance of the second display region a2 is greater than that of the first display region a 1. That is, the first display region a1 is the above-described main screen region, and the second display region a2 is the above-described sub screen region. When the size of the probe is larger than that of the second display area a2, for example, when a probe with a 10mm aperture is used, the alignment pattern 100 may be displayed based on the second display area a2 and a portion of the first display area a1 adjacent to the second display area a2 with the center O of the second display area a2 as the center O of the alignment pattern 100. For example, the alignment pattern 100 may be a circle having the same size as the probe, or may be a part of a circle having the same size as the probe (e.g., a semicircle, a three-quarter circle).
Fig. 21 is another schematic top view of a display panel according to an embodiment of the present disclosure. As shown in fig. 21, according to some embodiments of the present application, optionally, when the size of the probe is smaller than or equal to the size of the second display area a2, such as when a 2mm caliber probe is used, the alignment pattern 100 may be displayed based on the second display area a2 with the center O of the second display area a2 as the center O of the alignment pattern 100. For example, the alignment pattern 100 may be a circle having the same size as the probe, or may be a part of a circle having the same size as the probe (e.g., a semicircle, a three-quarter circle).
Therefore, the embodiment of the application can adapt to probes with different sizes and second display areas with different shapes/sizes, namely, adapt to various application scenes.
With continued reference to fig. 21, according to some embodiments of the present application, optionally, the second display region a2 may include a light-transmitting region 210, the first display region a1 may include a transition region 220 surrounding the light-transmitting region 210, and both the light-transmitting region 210 and the transition region 220 may be provided with sub-pixels. The transition region 220 is provided with a driving device (e.g., a transistor), and the light-transmitting region 210 is not provided with a driving device. The center of the light-transmitting region 210 may coincide with the center of the second display region a2, the transition region 220 may be disposed around the light-transmitting region 210, and when the probe size is smaller than or equal to the size of the light-transmitting region 210, the alignment pattern 100 may be displayed based on the light-transmitting region 210 with the center O of the light-transmitting region 210 as the center O of the alignment pattern 100.
Therefore, the center of the probe can be aligned with the center of the light transmission area, and the brightness values acquired by the probe are all the brightness values of the light transmission area, so that the accuracy of the brightness values acquired by the probe is improved, and the accuracy of the subsequent gamma debugging result of the second display area is improved.
As shown in fig. 21, alternatively, the shape of the light-transmitting region 210 may be a rectangle, and the shape of the second display region a2 may also be a rectangle. In other embodiments, the shape of the light-transmitting region 210 may be a circle, and the shape of the second display region a2 may also be a circle. Of course, the shapes of the light-transmitting area 210 and the second display area a2 may be other shapes, which is not limited in the embodiments of the present application.
Based on the alignment method of the display panel provided by the above embodiment, correspondingly, the embodiment of the application further provides a gamma debugging method of the display panel.
Fig. 22 is an operation schematic diagram of a gamma debugging method of a display panel according to an embodiment of the present application. Fig. 23 is a flowchart illustrating a gamma adjustment method for a display panel according to an embodiment of the present disclosure. As shown in fig. 22 and 23, the display panel 10 includes a first display area a1 and a second display area a 2. The light transmittance of the second display region a2 may be greater than that of the first display region a 1. That is, the first display region a1 is the above-described main screen region, and the second display region a2 is the above-described sub screen region.
The gamma debugging method for the display panel provided by the embodiment of the application can comprise the following steps S221 to S223.
S221, controlling the probe to move to the first display area, and performing gamma debugging on the first display area.
The first display area a1 can display the picture of the target gray scale. The target gray scale can be any preset gray scale. In S221, the probe may be controlled to move to the first display area a1, and the actual brightness value of the first display area a1 is acquired. Then, according to the comparison result between the actual luminance value of the first display area a1 and the target luminance value corresponding to the target gray scale, at least one of the data voltage value corresponding to the red sub-pixel, the data voltage value corresponding to the green sub-pixel, and the data voltage value corresponding to the blue sub-pixel in the first display area a1 is adjusted until the difference between the actual luminance value of the first display area a1 and the target luminance value corresponding to the target gray scale is smaller than the preset first error threshold. Finally, the adjusted data voltage value corresponding to the red sub-pixel, the adjusted data voltage value corresponding to the green sub-pixel and the adjusted data voltage value corresponding to the blue sub-pixel in the first display area a1 are obtained, so that the gamma adjustment of the first display area a1 is completed.
It should be noted that, when the gamma adjustment is performed on the first display area a1, after the gamma adjustment of one gray level is completed, the first display area a1 may switch to display a picture of another gray level, and repeat the above process, thereby completing the gamma adjustment of another gray level. Moreover, during gamma debugging, a plurality of gray levels may be selected as the tie points, and for gray levels other than the tie points, the data voltage value corresponding to the red sub-pixel, the data voltage value corresponding to the green sub-pixel, and the data voltage value corresponding to the blue sub-pixel in the first display area a1 corresponding to other gray levels may be obtained based on a linear interpolation algorithm.
S222, moving the probe to the alignment position based on the alignment method of the display panel provided in the above embodiment, and the alignment pattern is at least partially located in the second display area.
As shown in fig. 20, when the probe size is larger than the size of the second display area a2, the align pattern 100 may be displayed based on the second display area a2 and a portion of the first display area a1 adjacent to the second display area a2 with the center O of the second display area a2 as the center O of the align pattern 100. As shown in fig. 21, when the probe size is less than or equal to the size of the second display area a2, the align pattern 100 may be displayed based on the second display area a2 with the center O of the second display area a2 as the center O of the align pattern 100. The alignment position is the center O of the alignment pattern 100 and is located in the second display area a 2.
In S222, the center of the probe is moved to the center O of the alignment pattern 100 based on the alignment method of the display panel provided in the above embodiment, so as to complete alignment.
And S223, carrying out gamma debugging on the second display area.
As shown in fig. 24, in some embodiments, when the probe size is larger than the size of the second display area a2, the second display area a2 is controlled to display the picture of the target gray scale, and the portion of the first display area a1 near the second display area a2 is written black. For example, a portion of the first display region a1 adjacent to the second display region a2 still displays the alignment mark 100. Therefore, the brightness value of the first display area A1 collected by the probe can be effectively avoided, the accuracy of the collected brightness value of the second display area A2 is improved, and the accuracy of a gamma debugging result is further ensured.
In other embodiments, when the size of the probe is smaller than the size of the second display area a2, the second display area a2 can be controlled to display the image of the target gray scale, and the portion of the first display area a1 near the second display area a2 does not need to be written with black.
In S223, after the alignment is completed, the actual brightness value of the first display area a2 may be collected. Then, according to the comparison result between the actual luminance value of the second display area a2 and the target luminance value corresponding to the target gray scale, at least one of the data voltage value corresponding to the red sub-pixel, the data voltage value corresponding to the green sub-pixel, and the data voltage value corresponding to the blue sub-pixel in the second display area a2 is adjusted until the difference between the actual luminance value of the second display area a2 and the target luminance value corresponding to the target gray scale is smaller than the preset first error threshold. Finally, the adjusted data voltage value corresponding to the red sub-pixel, the adjusted data voltage value corresponding to the green sub-pixel and the adjusted data voltage value corresponding to the blue sub-pixel in the second display area a2 are obtained, so that the gamma adjustment of the second display area a2 is completed.
It should be noted that, when the gamma adjustment is performed on the second display area a2, after the gamma adjustment for one gray level is completed, the second display area a2 may switch to display a picture of another gray level, and repeat the above process, thereby completing the gamma adjustment for another gray level. Moreover, during gamma debugging, a plurality of gray levels may be selected as the tie points, and for gray levels other than the tie points, the data voltage value corresponding to the red sub-pixel, the data voltage value corresponding to the green sub-pixel, and the data voltage value corresponding to the blue sub-pixel in the second display area a2 corresponding to other gray levels may be obtained based on a linear interpolation algorithm.
According to the gamma debugging method of the display panel, the center of the second display area is used as the center of the alignment pattern of the display panel to display the alignment pattern, the center coordinate of the alignment pattern can be accurately determined according to the first coordinate corresponding to the minimum first brightness value on the first moving path and the second coordinate corresponding to the minimum second brightness value on the second moving path, accurate alignment of the probe and the second display area is achieved, the alignment accuracy of the probe and the second display area is improved, and further the gamma debugging accuracy of the second display area is improved. In addition, in the alignment process, the automatic alignment of the probe and the alignment pattern can be realized without human intervention.
Based on the gamma debugging method of the display panel provided by the embodiment, correspondingly, the embodiment of the application further provides a specific implementation mode of the gamma debugging device of the display panel.
Fig. 25 is a schematic structural diagram of a gamma adjustment apparatus of a display panel according to an embodiment of the present disclosure. The gamma debugging device of the display panel provided by the embodiment of the application can be used for executing the gamma debugging method of the display panel provided by the embodiment. As shown in fig. 25, a gamma adjustment device 2500 for a display panel according to an embodiment of the present disclosure may include a table 251, a first transfer unit 252, a second transfer unit 253, a clamping unit 254, a controller (not shown), and a probe 500. The table 251 is used for carrying the display panel 10. The first conveying portion 252 is disposed on at least one side of the table 251 and extends along a first direction (e.g., the column direction Y). Illustratively, the first conveying parts 252 are located on two sides of the table 251 opposite in the second direction (e.g., the row direction X). The second conveying portion 253 extends in the second direction and is suspended above the table 251, the second conveying portion 253 is connected to the first conveying portion 252, and the second conveying portion 253 is movable in the first direction with respect to the first conveying portion 252, and the second conveying portion 253 is driven to move in the first direction, that is, up and down as shown in fig. 25, when the first conveying portion 252 is operated. The clamping portion 254 is connected to the second conveying portion 253, and the clamping portion 254 is movable relative to the second conveying portion 253 in a second direction, i.e., the clamping portion 254 is driven to move in the second direction, i.e., to move left and right as shown in fig. 25, when the second conveying portion 253 operates. The probe 500 is fixedly mounted to the clamping portion 254, i.e., the clamping portion 254 clamps the probe 500. The controller is electrically connected to the first and second transfer portions 252 and 253 and the probe.
Specifically, the probe 500 may be placed in the clamping portion 254 at an angle perpendicular to the plane of the display panel, and the clamping portion 254 may clamp the probe 500. Then, the controller may control the first and second transfer parts 252 and 253 so that the grip part 254 and the probe 500 may move up, down, left, and right. During the movement of the probe 500, the probe 500 may be controlled to acquire brightness values of different positions of the display panel 10, and acquire coordinate values of the probe 500. Then, the alignment of the display panel is completed by the alignment method of the display panel provided by the above embodiment. Or, the gamma debugging method of the display panel provided by the above embodiment is used to complete the gamma debugging method of the display panel.
The utility model provides a display panel's gamma debugging device, display panel uses the center of second display area to show the counterpoint pattern as the center of counterpoint pattern, according to the first coordinate that the first brightness value that minimums corresponds on the first moving path and the second coordinate that the second brightness value that minimums on the second moving path corresponds, can accurately determine the central coordinate of counterpoint pattern, realize the accurate counterpoint of probe and second display area, improve the precision of probe and second display area counterpoint, and then improve the degree of accuracy of the gamma debugging of second display area. In addition, in the alignment process, the automatic alignment of the center of the probe and the alignment pattern can be realized without human intervention.
Fig. 26 is a schematic structural diagram of another gamma debugging apparatus for a display panel according to an embodiment of the present application. As shown in fig. 26, according to some embodiments of the present application, optionally, the workbench 251 is provided with a first groove 261 and a second groove 262. The first groove 261 is used for placing the display panel 10, and the second groove 262 is located at one side of the first groove 261 along the first direction. The gamma adjustment device 2500 of the display panel according to the embodiment of the present application can further include a light emitting portion 263, where the light emitting portion 263 is located in the second groove 262, and the light emitting portion 263 is in a shape of a strip and extends along the second direction. Illustratively, the light emitting portion 263 includes, but is not limited to, a light fixture, such as an LED lamp.
For easy understanding, the following description is made with reference to the gamma debugging apparatus of the display panel shown in fig. 26 and the gamma debugging method of the display panel provided in the above embodiment.
Step one, controlling the probe to move to the first display area, and carrying out gamma debugging on the first display area.
And step two, the display panel displays the alignment pattern by taking the center of the second display area as the center of the alignment pattern.
And step three, the light emitting part emits light, the probe is controlled to move along the first direction from the initial position, a plurality of first brightness values at different positions on a first moving path along the first direction are collected, and a first coordinate corresponding to the minimum first brightness value on the first moving path is obtained.
And fourthly, controlling the probe to move along the second direction, and acquiring a plurality of second brightness values at different positions on a second moving path along the second direction to obtain a second coordinate corresponding to the minimum second brightness value on the second moving path.
And fifthly, controlling the probe to move to the alignment position determined based on the first coordinate and the second coordinate, extinguishing the light emitting part, displaying a picture of the target gray scale in the second display area, and performing gamma debugging on the second display area.
And step six, after the gamma debugging of the second display area is completed, controlling the probe to return to the initial position again.
Therefore, the display panel can be positioned by arranging the first groove to place the display panel, and the alignment accuracy is ensured; the second groove is formed in one side, close to the second display area, of the first groove, and can provide enough moving space for the movement of the probe, so that the probe is prevented from colliding with the edge of the first groove during alignment; through set up the illuminating part in the second recess, can guarantee even if some of probe removes the second recess, the luminance value that the probe gathered also can appear by the change of little grow, guarantees going on smoothly of counterpointing.
According to some embodiments of the present application, optionally, the first groove 261 and the second groove 262 are in communication.
Therefore, the first groove and the second groove can be integrally formed through the same process, so that the production process is simplified, and the production cost of the gamma debugging device of the display panel is reduced.
With continued reference to fig. 26, according to some embodiments of the present disclosure, optionally, the workbench 251 may further be provided with a third groove 264 and a fourth groove 265, which are opposite to each other. The third groove 264 and the fourth groove 265 may facilitate a debugging person to place the display panel 10 in the first groove 261, or facilitate the debugging person to take the display panel 10 out of the first groove 261.
According to some embodiments of the present application, optionally, the first conveying portion 252 includes, but is not limited to, a combination of a motor (e.g., a stepper motor) and a conveying mechanism, or a combination of a guide rail and a movable member (e.g., a cart). The second transfer portion 253 includes, but is not limited to, a combination of a motor (e.g., a stepping motor) and a transfer mechanism, or a combination of a guide rail and a movable member (e.g., a carriage).
Based on the alignment method of the display panel or the gamma debugging method of the display panel provided by the above embodiment, correspondingly, the application further provides a specific implementation manner of the electronic device. Please see the examples below.
Fig. 27 shows a hardware structure diagram of an electronic device provided in an embodiment of the present application.
The electronic device may include a processor 2701 and memory 2702 that store computer program instructions.
Specifically, the processor 2701 may include a Central Processing Unit (CPU), an Application Specific Integrated Circuit (ASIC), or one or more Integrated circuits configured to implement the embodiments of the present Application.
Memory 2702 may include mass storage for data or instructions. By way of example, and not limitation, memory 2702 may include a Hard Disk Drive (HDD), a floppy Disk Drive, flash memory, an optical Disk, a magneto-optical Disk, magnetic tape, or a Universal Serial Bus (USB) Drive or a combination of two or more of these. In one example, memory 2702 may include removable or non-removable (or fixed) media, or memory 2702 is non-volatile solid-state memory. The memory 2702 may be internal or external to the integrated gateway disaster recovery device.
In one example, the Memory 2702 may be a Read Only Memory (ROM). In one example, the ROM may be mask programmed ROM, programmable ROM (prom), erasable prom (eprom), electrically erasable prom (eeprom), electrically alterable ROM (earom), or flash memory, or a combination of two or more of these.
Memory 2702 may include Read Only Memory (ROM), Random Access Memory (RAM), magnetic disk storage media devices, optical storage media devices, flash memory devices, electrical, optical, or other physical/tangible memory storage devices. Thus, in general, the memory includes one or more tangible (non-transitory) computer-readable storage media (e.g., memory devices) encoded with software comprising computer-executable instructions and when the software is executed (e.g., by one or more processors), it is operable to perform operations described with reference to the methods according to an aspect of the application.
The processor 2701 reads and executes the computer program instructions stored in the memory 2702 to implement the alignment method of the display panel or the method/step of the gamma debugging method of the display panel, and achieve the corresponding technical effects achieved by the alignment method of the display panel or the gamma debugging method of the display panel executing the method/step, which are not described herein again for brevity.
In one example, the electronic device can also include a communication interface 2703 and bus 2710. As shown in fig. 27, the processor 2701, the memory 2702, and the communication interface 2703 are connected to each other via a bus 2710 to complete communication therebetween.
The communication interface 2703 is mainly used to implement communication between modules, apparatuses, units and/or devices in this embodiment.
The bus 2710 includes hardware, software, or both to couple the components of the electronic device to one another. By way of example, and not limitation, a Bus may include an Accelerated Graphics Port (AGP) or other Graphics Bus, an Enhanced Industry Standard Architecture (EISA) Bus, a Front-Side Bus (Front Side Bus, FSB), a Hyper Transport (HT) interconnect, an Industry Standard Architecture (ISA) Bus, an infiniband interconnect, a Low Pin Count (LPC) Bus, a memory Bus, a Micro Channel Architecture (MCA) Bus, a Peripheral Component Interconnect (PCI) Bus, a PCI-Express (PCI-X) Bus, a Serial Advanced Technology Attachment (SATA) Bus, a video electronics standards association local (VLB) Bus, or other suitable Bus or a combination of two or more of these. The bus 2710 may include one or more buses, where appropriate. Although specific buses are described and shown in the embodiments of the application, any suitable buses or interconnects are contemplated by the application.
In addition, in combination with the alignment method of the display panel or the gamma debugging method of the display panel in the above embodiments, the embodiments of the present application can provide a computer readable storage medium to implement the method. The computer readable storage medium having stored thereon computer program instructions; when executed by a processor, the computer program instructions implement any one of the above embodiments of the method for aligning a display panel or the method for gamma debugging a display panel. Examples of computer-readable storage media include non-transitory computer-readable storage media such as electronic circuits, semiconductor memory devices, ROMs, random access memories, flash memories, erasable ROMs (eroms), floppy disks, CD-ROMs, optical disks, and hard disks.
The functional blocks shown in the above-described structural block diagrams may be implemented as hardware, software, firmware, or a combination thereof. When implemented in hardware, it may be, for example, an electronic Circuit, an Application Specific Integrated Circuit (ASIC), suitable firmware, plug-in, function card, or the like. When implemented in software, the elements of the present application are the programs or code segments used to perform the required tasks. The program or code segments can be stored in a machine-readable medium or transmitted by a data signal carried in a carrier wave over a transmission medium or a communication link. A "machine-readable medium" may include any medium that can store or transfer information. Examples of a machine-readable medium include electronic circuits, semiconductor memory devices, ROM, flash memory, Erasable ROM (EROM), floppy disks, CD-ROMs, optical disks, hard disks, fiber optic media, Radio Frequency (RF) links, and so forth. The code segments may be downloaded via computer networks such as the internet, intranets, etc.
It should also be noted that the exemplary embodiments mentioned in this application describe some methods or systems based on a series of steps or devices. However, the present application is not limited to the order of the above-described steps, that is, the steps may be performed in the order mentioned in the embodiments, may be performed in an order different from the order in the embodiments, or may be performed simultaneously.
Aspects of the present application are described above with reference to flowchart illustrations and/or block diagrams of methods, apparatus (systems) and computer program products according to embodiments of the application. It will be understood that each block of the flowchart illustrations and/or block diagrams, and combinations of blocks in the flowchart illustrations and/or block diagrams, can be implemented by computer program instructions. These computer program instructions may be provided to a processor of a general purpose computer, special purpose computer, or other programmable data processing apparatus to produce a machine, such that the instructions, which execute via the processor of the computer or other programmable data processing apparatus, enable the implementation of the functions/acts specified in the flowchart and/or block diagram block or blocks. Such a processor may be, but is not limited to, a general purpose processor, a special purpose processor, an application specific processor, or a field programmable logic circuit. It will also be understood that each block of the block diagrams and/or flowchart illustration, and combinations of blocks in the block diagrams and/or flowchart illustration, can be implemented by special purpose hardware for performing the specified functions or acts, or combinations of special purpose hardware and computer instructions.
As described above, only the specific embodiments of the present application are provided, and it can be clearly understood by those skilled in the art that, for convenience and brevity of description, the specific working processes of the system, the module and the unit described above may refer to the corresponding processes in the foregoing method embodiments, and are not described herein again. It should be understood that the scope of the present application is not limited thereto, and any person skilled in the art can easily conceive various equivalent modifications or substitutions within the technical scope of the present application, and these modifications or substitutions should be covered within the scope of the present application.

Claims (10)

1. A method for aligning a display panel includes: controlling a set area of a display panel to display a counterpoint pattern matched with the size of the probe, wherein the brightness value of the counterpoint pattern is smaller than that of other areas around the set area;
controlling the probe to move along a first direction from an initial position, and acquiring a plurality of first brightness values at different positions on a first moving path along the first direction to obtain a first coordinate corresponding to a minimum first brightness value on the first moving path;
controlling the probe to move along a second direction, and acquiring a plurality of second brightness values at different positions on a second moving path along the second direction to obtain a second coordinate corresponding to the minimum second brightness value on the second moving path, wherein the second direction is crossed with the first direction;
and determining the alignment position according to the first coordinate and the second coordinate.
2. The alignment method according to claim 1, wherein the acquiring a plurality of first luminance values at different positions on a first moving path along the first direction to obtain a first coordinate corresponding to a minimum first luminance value on the first moving path includes:
judging whether a first brightness value corresponding to an ith position on the first moving path is larger than a first brightness value corresponding to an ith-1 position on the first moving path, wherein the ith-1 position is a previous position of the ith position, and i is a positive integer;
when the first brightness value corresponding to the ith position is larger than the first brightness value corresponding to the ith-1 position, determining the coordinate of the ith-1 position as the first coordinate;
the acquiring a plurality of second brightness values at different positions on a second moving path along the second direction to obtain a second coordinate corresponding to a minimum second brightness value on the second moving path specifically includes:
judging whether a second brightness value corresponding to a jth position on the second moving path is larger than a second brightness value corresponding to a jth position on the second moving path, wherein the jth-1 position is a previous position of the jth position, and j is a positive integer;
and when the second brightness value corresponding to the j-th position is larger than the second brightness value corresponding to the j-1-th position, determining the coordinate of the j-1-th position as the second coordinate.
3. The alignment method according to claim 2, wherein before determining the coordinates of the i-1 th position as the first coordinates, the alignment method further comprises:
when the first brightness value corresponding to the ith position is larger than the first brightness value corresponding to the i-1 st position, judging whether the first brightness values corresponding to the (i + 1) th to the (i + n) th positions on the first moving path are all larger than the first brightness value corresponding to the i-1 st position on the first moving path, wherein the (i + 1) th position is a position next to the ith position, the (i + n) th position is an n-th position next to the ith position, and n is a positive integer;
the determining the coordinate of the i-1 th position as the first coordinate specifically includes:
when the first brightness value corresponding to the (i + 1) th position to the (i + n) th position is larger than the first brightness value corresponding to the (i-1) th position, determining the coordinate of the (i-1) th position as the first coordinate.
4. The alignment method according to claim 2 or 3, further comprising, before controlling the probe to move in the second direction:
controlling the probe to return to the (i-1) th position;
after the obtaining of the second coordinate corresponding to the minimum second brightness value on the second moving path, the method further includes:
and controlling the probe to return to the j-1 th position.
5. The alignment method according to claim 2, further comprising:
controlling the probe to move reversely along the first direction, and acquiring a plurality of third brightness values at different positions on a first reverse moving path, wherein the first reverse moving path is a path moving reversely along the first direction;
judging whether a third brightness value corresponding to a p-th position on the first reverse moving path is larger than a third brightness value corresponding to a p-1-th position on the first reverse moving path, wherein the p-1-th position is a previous position of the p-th position, and p is a positive integer;
when the third brightness value corresponding to the p-th position is larger than the third brightness value corresponding to the p-1-th position, judging whether the p-1-th position is the same as the i-1-th position;
when the first brightness value corresponding to the ith position is greater than the first brightness value corresponding to the i-1 st position, determining the coordinate of the i-1 st position as the first coordinate specifically includes:
determining the coordinates of the (i-1) th position as the first coordinates in the case that the (p-1) th position is the same as the (i-1) th position;
and under the condition that the p-1 th position is different from the i-1 th position, determining the average value of the coordinates of the p-1 th position and the i-1 th position as the first coordinate.
6. The alignment method according to claim 1, wherein the controlling the probe to move from the start position in the first direction comprises:
judging the magnitude relation between a first brightness value corresponding to the x-th position on the first moving path and a first brightness value corresponding to the x-1-th position on the first moving path, wherein the x-1-th position is the previous position of the x-th position, and x is a positive integer;
when the first brightness value corresponding to the x-th position is equal to the first brightness value corresponding to the x-1 th position, controlling the probe to move along the first direction at a first step value and/or a first moving speed until the first brightness value corresponding to the x-th position is smaller than the first brightness value corresponding to the x-1 th position;
when the first brightness value corresponding to the x-th position is smaller than the first brightness value corresponding to the x-1 th position, controlling the probe to move along the first direction at a second step value and/or a second moving speed until a first coordinate corresponding to the minimum first brightness value on the first moving path is obtained; wherein the first step value is greater than the second step value, and the first moving speed is greater than the second moving speed.
7. The alignment method according to claim 1, wherein the display panel comprises a first display area and a second display area, and the light transmittance of the second display area is greater than that of the first display area;
when the size of the probe is larger than that of the second display area, taking the center of the second display area as the center of the alignment pattern, and displaying the alignment pattern based on the second display area and a part of the first display area close to the second display area;
when the size of the probe is smaller than or equal to the size of the second display area, taking the center of the second display area as the center of the alignment pattern, and displaying the alignment pattern based on the second display area;
preferably, the second display region includes a light-transmitting region, the first display region includes a transition region surrounding the light-transmitting region, the transition region is provided with a driving device, and the light-transmitting region is not provided with the driving device; and when the size of the probe is smaller than or equal to that of the light-transmitting area, the center of the light-transmitting area is used as the center of the alignment pattern, and the alignment pattern is displayed based on the light-transmitting area.
8. A gamma debugging method for a display panel, the display panel comprising a first display area and a second display area, the method comprising:
controlling the probe to move to the first display area, and performing gamma debugging on the first display area;
moving the probe to the alignment position based on the alignment method of the display panel according to any one of claims 1 to 7, wherein the alignment pattern is at least partially located in the second display region;
and carrying out gamma debugging on the second display area.
9. A gamma debugging apparatus of a display panel for performing the gamma debugging method of the display panel according to claim 8, comprising:
the workbench is used for bearing the display panel;
a first conveying part which is positioned on at least one side of the workbench and extends along a first direction;
the second conveying part extends along a second direction and is suspended above the workbench, the second conveying part is connected with the first conveying part, and the second conveying part can move relative to the first conveying part along the first direction;
the clamping part is connected with the second conveying part and can move along a second direction relative to the second conveying part;
the probe is fixedly arranged on the clamping part;
and a controller connected to the first and second transfer units and the probe.
10. The apparatus of claim 9,
a first groove and a second groove are formed in the workbench, the first groove is used for placing the display panel, and the second groove is located on one side of the first groove along the first direction;
the gamma debugging device further comprises a light emitting part, the light emitting part is located in the second groove, and the light emitting part is strip-shaped and extends along the second direction;
preferably, the first groove communicates with the second groove.
CN202210757406.9A 2022-06-30 2022-06-30 Display panel alignment method, display panel gamma debugging method and device Pending CN114944127A (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
CN202210757406.9A CN114944127A (en) 2022-06-30 2022-06-30 Display panel alignment method, display panel gamma debugging method and device
PCT/CN2022/122861 WO2024000898A1 (en) 2022-06-30 2022-09-29 Alignment method for display panel, and gamma debugging method and apparatus for display panel

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